CN108196179A - Printed circuit board, terminal and the circuit testing method based on shared test point - Google Patents
Printed circuit board, terminal and the circuit testing method based on shared test point Download PDFInfo
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- CN108196179A CN108196179A CN201711270509.8A CN201711270509A CN108196179A CN 108196179 A CN108196179 A CN 108196179A CN 201711270509 A CN201711270509 A CN 201711270509A CN 108196179 A CN108196179 A CN 108196179A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
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- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
Abstract
The invention discloses a kind of printed circuit board, terminal and circuit testing method based on shared test point, wherein, which includes：Printed circuit board ontology, test point, switching switch and the N number of functional circuit being arranged on the printed circuit board ontology；Wherein, the test point is connect with the common end of the switching switch, and i-th of connecting pin of the switching switch is connect with the tested point of i-th of functional circuit；N is the positive integer more than 1, and i is the positive integer more than or equal to 1, and less than or equal to N.Thus, by using switching switch, the tested point of multiple functional circuits is connect respectively with same test point, it can realize through a test point, the working condition of multiple functional circuits is tested respectively, the space of printed circuit board is saved, the manufacture cost of printed circuit board has been saved, has been conducive to the miniaturization of terminal.
Description
Technical field
The present invention relates to electronic technology field more particularly to a kind of printed circuit board, terminal and based on shared test point
Circuit testing method.
Background technology
In recent years, with the rapid development of electronic technology, electronic product constantly develops towards the direction of miniaturization, and electronics
Realize the electrical connection of electronic component in product using printed circuit board mostly, this requires printed circuit board also will be towards small-sized
The direction of change is developed.
The prior art in hardware debugging and production process, needs that test point is stayed to carry out commissioning hardware on a printed circuit board
Function and performance, and many test points would generally be stayed on existing printed circuit board to meet to different functional circuits or
The function of different location and performance test, this just occupies the big quantity space of printed circuit board, in order to be reserved more to test point
Space, printed circuit board needs make larger, thus it is higher to manufacture cost, and is unfavorable for the miniaturization of terminal.
Invention content
The present invention is directed to solve one of the technical issues of above-mentioned at least to a certain extent.
The application proposes a kind of printed circuit board, and by using switching switch, the tested point of multiple functional circuits is distinguished
It is connect with same test point, can realize through a test point, test the working condition of multiple functional circuits respectively, save
The space of printed circuit board has saved the manufacture cost of printed circuit board, has been conducive to the miniaturization of terminal.
The application also proposes a kind of terminal.
The application also proposes a kind of circuit testing method based on shared test point.
The application also proposes a kind of test equipment.
The application also proposes a kind of computer readable storage medium.
On the one hand the application proposes a kind of printed circuit board, including：Printed circuit board ontology is arranged on the printed circuit
Test point, switching switch and N number of functional circuit on plate ontology；Wherein, the common end of the test point and the switching switch
Connection, i-th of connecting pin of the switching switch is connect with the tested point of i-th of functional circuit；N is positive integer more than 1, i
To be greater than or equal to 1, and the positive integer less than or equal to N.
The application second aspect proposes a kind of terminal, including printed circuit board as described in relation to the first aspect.
The application third aspect proposes a kind of circuit testing method based on shared test point, including：Determine current time
The connection status of the common end of switching switch and each connecting pin, wherein the common end is connect with test point；According to the switching
The connection status of switch determines objective function circuit；The test data at current time is obtained by the test point；According to described
Test data determines the working condition of the objective function circuit.
The application fourth aspect proposes a kind of test equipment, including：Memory, processor and communication interface；The storage
Device is used to store executable program code；The communication interface is with setting test point on a printed circuit board to connect, for leading to
It crosses the test point and obtains test data；The processor by read the executable program code stored in the memory come
Corresponding with the executable program code program of operation, for execution as described in the third aspect based on shared test point
Circuit testing method.
The 5th aspect of the application proposes a kind of computer readable storage medium, is stored thereon with computer program, the program
The circuit testing method based on shared test point as described in the third aspect is realized when being executed by processor.
Technical solution provided by the embodiments of the present application can include the following benefits：
By using switching switch, the tested point of multiple functional circuits with same test point is connect respectively, can be realized
By a test point, the working condition of multiple functional circuits is tested respectively, is saved the space of printed circuit board, has been saved print
The manufacture cost of circuit board processed, is conducive to the miniaturization of terminal.
The additional aspect of the present invention and advantage will be set forth in part in the description, and will partly become from the following description
It obtains significantly or is recognized by the practice of the present invention.
Description of the drawings
Above-mentioned and/or additional aspect and advantage of the invention will become from the following description of the accompanying drawings of embodiments
Significantly and it is readily appreciated that, wherein：
Fig. 1 is the structure diagram of the printed circuit board of the application one embodiment；
Fig. 2 is the structure diagram of the printed circuit board of the application another embodiment；
Fig. 3 is the structure diagram of the terminal of the application one embodiment；
Fig. 4 is the flow chart of the circuit testing method based on shared test point of the application one embodiment；
Fig. 5 is the structure chart of the test equipment of the application one embodiment.
Specific embodiment
The embodiment of the present invention is described below in detail, the example of the embodiment is shown in the drawings, wherein from beginning to end
Same or similar label represents same or similar element or the element with same or like function.Below with reference to attached
The embodiment of figure description is exemplary, it is intended to for explaining the present invention, and is not considered as limiting the invention.
Below with reference to the accompanying drawings printed circuit board, terminal and the circuit based on shared test point for describing the embodiment of the present invention are surveyed
Method for testing.
Various embodiments of the present invention are directed to the prior art, in hardware debugging and production process, need on a printed circuit board
Test point is stayed to come commissioning hardware capability and performance, and many test points would generally be stayed on existing printed circuit board to meet pair
Different functional circuits or the function of different location and performance test, this just occupies the big quantity space of printed circuit board, is
More spaces are reserved to test point, and printed circuit board needs make larger, thus it is higher to manufacture cost, and is unfavorable for terminal
Miniaturization the problem of, propose a kind of printed circuit board.
Printed circuit board provided in an embodiment of the present invention including printed circuit board ontology, is arranged on printed circuit board ontology
On test point, switching switch and N number of functional circuit, wherein, the connection of the common end of test point and switching switch, switching switch
I-th of connecting pin is connect with the tested point of i-th of functional circuit, and N is positive integer more than 1, and i is more than or equal to 1, and is less than
Or the positive integer equal to N, by using switching switch, the tested point of multiple functional circuits is connect respectively with same test point,
It can realize the working condition for by a test point, testing multiple functional circuits respectively, save the space of printed circuit board,
The manufacture cost of printed circuit board has been saved, has been conducive to the miniaturization of terminal.
First with reference to attached drawing, printed circuit board provided in an embodiment of the present invention is specifically described.
Fig. 1 is the structure diagram of the printed circuit board of the application one embodiment.
As shown in Figure 1, the printed circuit board, including printed circuit board ontology 1, is arranged on printed circuit board ontology 1
Test point 2, switching switch 3 and N number of functional circuit；
Wherein, test point 2 is connect with the common end of switching switch 3, i-th of connecting pin and i-th of the function of switching switch 3
The tested point connection of circuit；
N is the positive integer more than 1, and i is the positive integer more than or equal to 1, and less than or equal to N.Fig. 1 is printed with N=3
Circuit board includes being illustrated for 43 3 functional circuit 41, functional circuit 42 and functional circuit functional circuits.
Wherein, switching switch can be existing any type of switch, not be restricted herein.
Functional circuit can be that by the circuit of arbitrary function, for example provide specific currents, voltage etc..
It should be noted that in N number of functional circuit of the embodiment of the present invention, any two functional circuit is does not need to simultaneously
The functional circuit of test.
It is understood that the tested point of functional circuit 41 shown in FIG. 1, functional circuit 42 and functional circuit 43, respectively
It is connect with the 1st connecting pin, the 2nd connecting pin and the 3rd connecting pin of switching switch 3.When needing test function circuit 41
During working condition, the common end of switching switch 3 can be controlled to be connect with the 1st of switching switch 3 the connecting pin；When need test work(
During the working condition of energy circuit 42, the common end of switching switch 3 can be controlled to be connect with the 2nd of switching switch 3 the connecting pin；When
When needing the working condition of test function circuit 43, the common end of switching switch 3 and the 3rd company of switching switch 3 can be controlled
End connection is connect, so as to fulfill by a test point, the working condition of multiple functional circuits is tested respectively, saves printed circuit
The space of plate has saved the manufacture cost of printed circuit board, has been conducive to the miniaturization of terminal.
Further, in order to control the connection status of the common end of switching switch 3 and each connecting pin, to realize to each function
The test of the working condition of circuit as shown in Fig. 2, in printed circuit board provided in an embodiment of the present invention, can also include control
Circuit 5 processed.
Wherein, the input terminal of control circuit 5 is connect with host computer, and signal is controlled for receiving；
The output terminal of control circuit 5 is connect with the control terminal of switching switch 3, for the control signal according to reception, control
The common end of switching switch 3 and the connection status of connecting pin.
Specifically, when the working condition for needing i-th of functional circuit of test, host computer can be sent to control circuit 5
After signal, control circuit 5 is controlled to receive control signal, can the common end and the of switching switch 3 be controlled according to control signal
I connecting pin connection, so as to which test equipment can determine functional circuit to be tested according to the test data obtained from test point
Whether working condition is normal.
In addition, in practice, electrostatic, surge may enter printed circuit by the test point on printed circuit board
The pin of each semiconductor components and devices on plate causes the electric injury of semiconductor components and devices, each on printed circuit board in order to reduce
The damage failure risk of a component in embodiments of the present invention, is protected as shown in Fig. 2, printed circuit board can also include electrostatic
Protection circuit 6 and surge protection circuit 7.
Wherein, electrostatic discharge protective circuit 6 and surge protection circuit 7 are connect with test point.
Specifically, electrostatic discharge protective circuit 6 can be by the arbitrary electrostatic protection device structure such as electrostatic protection chip, discharge diode
Into.Surge protection circuit 7 can be by arbitrary device of surge protector such as gas-discharge tube, varistor, TVS Transient Suppression Diodes
It forms.
It should be noted that in order to ensure being connect respectively with each connecting pin in the common end of switching switch 3, to test respectively
When whether the working condition of each functional circuit normal, electrostatic discharge protective circuit 6 and surge protection circuit 7 can to each functional circuit into
Row effective protection, in embodiments of the present invention, frequency-splitting is equal between can setting the N number of signal for respectively flowing through N number of functional circuit
Less than first threshold, i.e., the frequency between N number of signal is same or similar.
Wherein, first threshold, can be according to the performance of electrostatic discharge protective circuit 6, surge protection circuit 7 and each functional circuit etc.
Parameter determines.
Printed circuit board provided in an embodiment of the present invention including printed circuit board ontology, is arranged on printed circuit board ontology
On test point, switching switch and N number of functional circuit, by using switching switch, the tested point of multiple functional circuits is distinguished
It is connect with same test point, can realize through a test point, test the working condition of multiple functional circuits respectively, save
The space of printed circuit board has saved the manufacture cost of printed circuit board, has been conducive to the miniaturization of terminal.
Based on above-described embodiment, the embodiment of the present invention also proposes a kind of terminal.
Fig. 3 is the structure diagram of terminal according to an embodiment of the invention.
As shown in figure 3, terminal 30 includes the printed circuit board 31 as described in above-described embodiment.
Wherein, there are many type of terminal, can be selected according to application, such as：Mobile phone, IPAD, computer, wearing
Equipment etc..Fig. 3 is illustrated by mobile phone of terminal.
Further, terminal can also include：Housing 32, memory 33, processor 34, power circuit 35.
Wherein, printed circuit board 31 is placed in the space interior that housing 32 surrounds, and processor 34 and memory 33 are arranged on
On printed circuit board 31；Power circuit 35, for powering for each circuit or device of terminal；Memory 33 is used to store and can hold
Line program code；Processor 34 is by reading the executable program code stored in memory 33, to run and executable program
The corresponding program of code.
It should be noted that the above-mentioned explanation to printed circuit board embodiment, is also applied for terminal provided in this embodiment,
Details are not described herein again.
In terminal provided in an embodiment of the present invention, printed circuit board includes printed circuit board ontology, is arranged on printed circuit
Test point, switching switch and N number of functional circuit on plate ontology, by using switching switch, by the to be measured of multiple functional circuits
Point is connect respectively with same test point, can be realized through a test point, be tested the working condition of multiple functional circuits respectively,
The space of printed circuit board is saved, the manufacture cost of printed circuit board has been saved, has been conducive to the miniaturization of terminal.
Based on above-described embodiment, the embodiment of the present invention also proposes a kind of circuit testing method based on shared test point.Under
Face combines Fig. 4, and the circuit testing method based on shared test point provided the application is described in detail.
Fig. 4 is the flow chart of the circuit testing method according to an embodiment of the invention based on shared test point.
As shown in figure 4, this method, including：
Step 401, determine the common end of current time switching switch and the connection status of each connecting pin, wherein common end with
Test point connects.
Specifically, the circuit testing method provided in an embodiment of the present invention based on shared test point, can be configured in this
In the test equipment that inventive embodiments provide, to carry out function and performance test to each functional circuit in printed circuit board.
Step 402, according to the connection status of switching switch, objective function circuit is determined.
Wherein, objective function circuit is functional circuit to be tested.
It is understood that when i-th of connecting pin of switching switch is connect with i-th of functional circuit, when needing test i-th
During the working condition of a functional circuit, host computer can send control signal to control circuit, so as to which control circuit can basis
Signal is controlled, the common end of switching switch is controlled to be connect with i-th of connecting pin.Correspondingly, in embodiments of the present invention, Ke Yigen
According to current time control signal corresponding with switching switch, determine that the common end of switching switch is connect with which connecting pin, and then
According to each connecting pin of switching switch and the connection relation of each functional circuit, objective function circuit is determined.That is, step 401 has
Body can include：
According to current time control signal corresponding with switching switch, the connection status of switching switch is determined.
As an example it is assumed that according to current time control signal corresponding with switching switch, the public of switching switch is determined
End is connect with the 1st connecting pin, and the 1st connecting pin is connect with the tested point of the 1st functional circuit, then can determine the 1st
Functional circuit is objective function circuit.
Step 403, the test data at current time is obtained by test point.
Wherein, test data can arbitrarily pass through survey including flowing through the electric current of test point, voltage of test point etc.
The data that pilot obtains.
Step 404, according to test data, the working condition of objective function circuit is determined.
Specifically, can be previously according in printed circuit board, the performance parameter of each functional circuit, switching switch etc. determines
When the working condition of each functional circuit is normal, the data that should be obtained by test point, and after objective function circuit is determined, obtain
The data that should be obtained corresponding with objective function circuit are taken, so as in the test data that current time is obtained by test point
Afterwards, the test data of acquisition can be carried out pair with the predetermined data that should be obtained corresponding with objective function circuit
Than.If the test data and the data that should be obtained corresponding with objective function circuit that obtain are consistent, target work(can be determined
The working condition of energy circuit is normal, otherwise, it may be determined that the working condition of objective function circuit is abnormal.
It should be noted that due to the signal frequency for flowing through objective function circuit it is larger when, the corresponding Insertion Loss of switching switch
To being affected, therefore in embodiments of the present invention for the working condition of objective function circuit, in order to flow through objective function electricity
When the signal frequency on road is larger, the working condition of accurate determining objective function circuit needs to consider the corresponding Insertion Loss of switching switch.
That is, in embodiments of the present invention, when flowing through the signal frequency of objective function circuit more than second threshold, based on shared
The circuit testing method of test point can also include：
Obtain the Insertion Loss parameter of switching switch.
Correspondingly, step 404 can be accomplished by the following way：
According to Insertion Loss parameter and test data, the working condition of objective function circuit is determined.
Wherein, second threshold can be arranged as required to.
Insertion Loss parameter can be determined according to the performance parameter of switching switch.
Specifically, if the signal frequency for flowing through objective function circuit is less than or equal to second threshold, switching switch corresponds to
Influence of the Insertion Loss to the working condition of objective function circuit it is smaller, can objective function electricity be determined according to test data at this time
The working condition on road；If the signal frequency for flowing through objective function circuit is more than second threshold, the corresponding Insertion Loss pair of switching switch
The working condition of objective function circuit is affected, and can determine objective function according to Insertion Loss parameter and test data at this time
The working condition of circuit.
Circuit testing method provided in an embodiment of the present invention based on shared test point is determining current time switching switch
Common end and each connecting pin connection status after, can objective function circuit be determined according to the connection status of switching switch, from
And after the test data at current time is obtained by test point, it according to test data, can determine the work of objective function circuit
Make state.Hereby it is achieved that by a test point, the working condition of multiple functional circuits is tested respectively, saves printing electricity
The space of road plate has saved the manufacture cost of printed circuit board, has been conducive to the miniaturization of terminal.
Further aspect of the present invention embodiment also proposes a kind of test equipment.
Fig. 5 is the structure diagram of the test equipment of the application one embodiment.Wherein, there are many type of test equipment,
For example can be computer, computer equipment etc., the present embodiment is not construed as limiting this.
As shown in figure 5, the test equipment 50 includes：Memory 51, processor 52 and communication interface 53.
Wherein, memory 51 is used to store executable program code；
Communication interface 53 is with setting test point on a printed circuit board to connect, for obtaining test number by test point
According to；
Processor 52 is run and executable program code by reading the executable program code stored in memory 51
Corresponding program, for performing the circuit testing method based on shared test point as in the foregoing embodiment.
It should be noted that the above-mentioned explanation to the circuit testing method embodiment based on shared test point, is also applied for
Test equipment provided in this embodiment, details are not described herein again.
Test equipment provided in an embodiment of the present invention, in the common end for determining current time switching switch and each connecting pin
After connection status, can objective function circuit be determined according to the connection status of switching switch, so as to work as by test point acquisition
After the test data at preceding moment, the working condition of objective function circuit according to test data, can be determined.It is hereby it is achieved that logical
A test point is crossed, tests the working condition of multiple functional circuits respectively, the space of printed circuit board is saved, has saved printing
The manufacture cost of circuit board, is conducive to the miniaturization of terminal.
The embodiment of the present application also proposes a kind of computer readable storage medium, is stored thereon with computer program, when the journey
It is realized when sequence is executed by processor such as the circuit testing method based on shared test point in previous embodiment.
It should be noted that herein, relational terms such as first and second and the like are used merely to a reality
Body or operation are distinguished with another entity or operation, are deposited without necessarily requiring or implying between these entities or operation
In any this practical relationship or sequence.Moreover, term " comprising ", "comprising" or its any other variant are intended to
Non-exclusive inclusion, so that process, method, article or equipment including a series of elements not only will including those
Element, but also including other elements that are not explicitly listed or further include as this process, method, article or equipment
Intrinsic element.In the absence of more restrictions, the element limited by sentence "including a ...", it is not excluded that
Also there are other identical elements in process, method, article or equipment including the element.
Expression or logic and/or step described otherwise above herein in flow charts, for example, being considered use
In the order list for the executable instruction for realizing logic function, may be embodied in any computer-readable medium, for
Instruction execution system, device or equipment (such as computer based system, including the system of processor or other can be held from instruction
The system of row system, device or equipment instruction fetch and execute instruction) it uses or combines these instruction execution systems, device or set
It is standby and use.For the purpose of this specification, " computer-readable medium " can any can be included, store, communicate, propagate or pass
Defeated program is for instruction execution system, device or equipment or the dress used with reference to these instruction execution systems, device or equipment
It puts.The more specific example (non-exhaustive list) of computer-readable medium is including following：Electricity with one or more wiring
Connecting portion (electronic device), portable computer diskette box (magnetic device), random access memory (RAM), read-only memory
(ROM), erasable edit read-only storage (EPROM or flash memory), fiber device and portable optic disk is read-only deposits
Reservoir (CDROM).In addition, computer-readable medium can even is that the paper that can print described program on it or other are suitable
Medium, because can be for example by carrying out optical scanner to paper or other media, then into edlin, interpretation or when necessary with it
His suitable method is handled electronically to obtain described program, is then stored in computer storage.
It should be appreciated that each section of the present invention can be realized with hardware, software, firmware or combination thereof.Above-mentioned
In embodiment, software that multiple steps or method can in memory and by suitable instruction execution system be performed with storage
Or firmware is realized.If for example, with hardware come realize in another embodiment, can be under well known in the art
Any one of row technology or their combination are realized：With for the logic gates to data-signal realization logic function
Discrete logic, have suitable combinational logic gate circuit application-specific integrated circuit, programmable gate array (PGA), scene
Programmable gate array (FPGA) etc..
It should be noted that in the description of this specification, reference term " one embodiment ", " is shown " some embodiments "
The description of example ", " specific example " or " some examples " etc. mean to combine the specific features of the embodiment or example description, structure,
Material or feature are contained at least one embodiment of the present invention or example.In the present specification, above-mentioned term is shown
The statement of meaning property is necessarily directed to identical embodiment or example.Moreover, specific features, structure, material or the spy of description
Point may be combined in any suitable manner in any one or more of the embodiments or examples.In addition, without conflicting with each other,
Those skilled in the art can be by the different embodiments or examples described in this specification and different embodiments or examples
Feature is combined.
In the description of this specification, reference term " one embodiment ", " example ", " is specifically shown " some embodiments "
The description of example " or " some examples " etc. means specific features, structure, material or the spy for combining the embodiment or example description
Point is contained at least one embodiment of the present invention or example.In the present specification, schematic expression of the above terms are not
It must be directed to identical embodiment or example.Moreover, particular features, structures, materials, or characteristics described can be in office
It is combined in an appropriate manner in one or more embodiments or example.In addition, without conflicting with each other, the skill of this field
Art personnel can tie the different embodiments or examples described in this specification and the feature of different embodiments or examples
It closes and combines.
Although the embodiments of the present invention has been shown and described above, it is to be understood that above-described embodiment is example
Property, it is impossible to limitation of the present invention is interpreted as, those of ordinary skill in the art within the scope of the invention can be to above-mentioned
Embodiment is changed, changes, replacing and modification.
Claims (10)
1. a kind of printed circuit board, which is characterized in that including：Printed circuit board ontology is arranged on the printed circuit board ontology
On test point, switching switch and N number of functional circuit；
Wherein, the test point is connect with the common end of the switching switch, i-th of connecting pin and i-th of the switching switch
The tested point connection of a functional circuit；
N is the positive integer more than 1, and i is the positive integer more than or equal to 1, and less than or equal to N.
2. printed circuit board as described in claim 1, which is characterized in that further include：The electrostatic being connect with the test point is protected
Protection circuit and surge protection circuit.
3. printed circuit board as claimed in claim 2, which is characterized in that respectively flow through N number of signal of N number of functional circuit
Between frequency-splitting be respectively less than first threshold.
4. printed circuit board as described in claim 1, which is characterized in that further include：Control circuit；
The input terminal of the control circuit is connect with host computer, and signal is controlled for receiving；
The output terminal of the control circuit is connect with the control terminal of the switching switch, for the control signal according to reception, control
Make the common end of the switching switch and the connection status of connecting pin.
5. a kind of terminal, which is characterized in that including the printed circuit board as described in claim 1-4 is any.
6. a kind of circuit testing method based on shared test point, which is characterized in that including：
The common end of current time switching switch and the connection status of each connecting pin are determined, wherein the common end connects with test point
It connects；
According to the connection status of the switching switch, objective function circuit is determined；
The test data at current time is obtained by the test point；
According to the test data, the working condition of the objective function circuit is determined.
7. method as claimed in claim 6, which is characterized in that the signal frequency for flowing through the objective function circuit is more than the second threshold
Value；
The method further includes：
Obtain the corresponding Insertion Loss parameter of the switching switch；
The working condition for determining the objective function circuit, including：
According to the Insertion Loss parameter and the test data, the working condition of the objective function circuit is determined.
8. method as claimed in claims 6 or 7, which is characterized in that the common end of the determining current time switching switch with
The connection status of each connecting pin, including：
According to current time control signal corresponding with the switching switch, the connection status of the switching switch is determined.
9. a kind of test equipment, which is characterized in that including：Memory, processor and communication interface；
The memory is used to store executable program code；
The communication interface is with setting test point on a printed circuit board to connect, for obtaining test number by the test point
According to；
The processor is run and the executable program by reading the executable program code stored in the memory
The corresponding program of code, for performing the circuit test side based on shared test point as described in any in claim 6-8
Method.
10. a kind of computer readable storage medium, is stored thereon with computer program, which is characterized in that the program is by processor
The circuit testing method based on shared test point as described in any in claim 6-8 is realized during execution.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711270509.8A CN108196179A (en) | 2017-12-05 | 2017-12-05 | Printed circuit board, terminal and the circuit testing method based on shared test point |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711270509.8A CN108196179A (en) | 2017-12-05 | 2017-12-05 | Printed circuit board, terminal and the circuit testing method based on shared test point |
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| CN108196179A true CN108196179A (en) | 2018-06-22 |
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| CN201711270509.8A Pending CN108196179A (en) | 2017-12-05 | 2017-12-05 | Printed circuit board, terminal and the circuit testing method based on shared test point |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111273159A (en) * | 2020-02-28 | 2020-06-12 | 中国电子科技集团公司第五十八研究所 | Output detection circuit suitable for surge suppression chip |
| CN113970694A (en) * | 2021-10-18 | 2022-01-25 | 深圳市汇川技术股份有限公司 | Method, device, equipment and medium for obtaining coverage rate of test points of printed circuit board |
| CN115712057A (en) * | 2023-01-09 | 2023-02-24 | 北京霍里思特科技有限公司 | Method for fault detection of analog board and related product |
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| CN115712057A (en) * | 2023-01-09 | 2023-02-24 | 北京霍里思特科技有限公司 | Method for fault detection of analog board and related product |
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Application publication date: 20180622 |