CN108181277A - A kind of polarization device test fixture - Google Patents
A kind of polarization device test fixture Download PDFInfo
- Publication number
- CN108181277A CN108181277A CN201711444803.6A CN201711444803A CN108181277A CN 108181277 A CN108181277 A CN 108181277A CN 201711444803 A CN201711444803 A CN 201711444803A CN 108181277 A CN108181277 A CN 108181277A
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- liner
- babinet
- copper sheet
- electrode
- polarization device
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
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- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Physics & Mathematics (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Abstract
The invention discloses a kind of polarization device test fixtures, and including support construction and test structure, test structure is detachable, is rotationally connected with the top of support construction, and test structure includes：Babinet；Liner；Liner is fixedly installed in the inner wall of babinet visualization window opposite side；Copper sheet；Copper sheet is fixedly installed in liner central area for placing sample；Electrode；Electrode has two electrodes up and down, and upper/lower electrode level is through babinet and liner and is arranged in parallel up and down；PORT COM；PORT COM is made of two radio-frequency joints, and radio-frequency joint extends vertically through babinet and liner and left and right is arranged in parallel, and radio-frequency joint is corresponded by conducting wire close to one end of copper sheet and is electrically connected with upper and lower electrode.Test structure and support construction are detachable, the connection of rotation, and test structure can carry out vertical rotating or lie low, and Fluorescence Spectrometer or Raman spectrometer can easily be coordinated to carry out fluorescence property detection and Characterization for Microstructure under electric field in situ.
Description
Technical field
The invention belongs to photoelectric material technical field of performance test, and in particular to a kind of polarization device test fixture.
Background technology
Piezoelectric material is a kind of functional material that can mutually convert mechanical energy and electric energy, is widely used in mobile logical
The high-technology fields such as letter, satellite broadcasting, electronic equipment, instrument and meter and aerospace become indispensable modernization
Critical material and element.Find that there is strong power in Pr3+ doping BaTiO3-CaTiO3 monophase materials from Wang in 2005 et al.
Since the coupling of the light-power-electricity such as photoluminescence, electroluminescent and high electric field induced strain, rare earth ion doped ferroelectric material because
Its Multifunctional Conversion effect has important application in terms of opto-mechanical-be electrically integrated coupled apparatus, becomes the focus of extensive concern.
Many researchers have found that polarization can induce rare earth ion doped ferroelectric material luminescence enhancement effect, but due to existing test clip
Tool mostly can not flexibly carry out angle adjustment, cause also to have luminescent properties detection, Characterization for Microstructure under electric field in situ and owe
It lacks, therefore it provides one kind is conveniently adjusted sample angle, can effectively carry out luminescent properties detection, Characterization for Microstructure under electric field in situ
Polarization device test fixture become those skilled in the art's urgent need to resolve a problem.
Invention content
In view of this, can visualization window knot be utilized with vertical rotating, the test fixture to lie low the present invention provides a kind of
Close Fluorescence Spectrometer, Raman spectrometer can realize fluorescence property detection and Characterization for Microstructure under power plant in situ.
To achieve these goals, the present invention adopts the following technical scheme that：A kind of polarization device test fixture, feature exist
In including support construction and test structure, the test structure is detachable, is rotationally connected with the top of the support construction, institute
Test structure is stated to include：
Babinet；The babinet side is provided with visualization window；
Liner；The liner is fixedly installed in the inner wall of the babinet visualization window opposite side；
Copper sheet；The copper sheet is fixedly installed in the liner central area for placing sample；
Electrode；Electrode has two electrodes up and down, and the upper/lower electrode level is simultaneously parallel up and down through the babinet and liner
Setting, the top electrode are in the same horizontal position with the copper sheet upper end, and the lower electrode is in same with the copper sheet lower end
One horizontal position；
PORT COM；The PORT COM is made of two radio-frequency joints, and the radio-frequency joint extends vertically through the babinet
And liner and left and right be arranged in parallel, the radio-frequency joint close to one end of copper sheet pass through conducting wire correspond with the upper and lower electricity
Pole is electrically connected.
It is using the advantageous effect of above-mentioned technical proposal：The connection that test structure and support construction are detachable, rotate, test
Structure can carry out vertical rotating or lie low, and Fluorescence Spectrometer or Raman spectrometer can easily be coordinated to carry out fluorescence under electric field in situ
Performance detection and Characterization for Microstructure.
Preferably, the upper and lower electrode structure is identical, and the top electrode includes, binding post and spring probe, the wiring
Column is in ladder circle column, and the one end being relatively large in diameter is arranged on the outside of the babinet, and the other end is detachably connected the spring and visits
Needle, wiring outer surface of column are insulating layer；It improves the insulating properties of binding post and then improves the safety of device.
Preferably, the binding post is provided with the mounting hole of thread fitting and top bolt, the spring close to one end of copper sheet
Probe passes through the mounting hole and passes through and pushes up bolt and be fixed.Since the thickness of sample differs, which can make spring probe root
It is flexibly adjusted according to the thickness of sample, spring probe is made to press closer sample.
Preferably, the copper sheet is circle, and its radius is 5-8mm, test sample is enable integrally to cover copper sheet, to prevent height
The lower electric pole short circuit of voltage space electric discharge contact.
Preferably, the liner is infundibulate.
Preferably, the babinet further includes four columns, and the column is set to the same side and described in the liner
Four columns are evenly distributed in the surrounding of the liner and are abutted with the liner, which act as consolidating liner
Fixing limit improves the safety and stability of device.
Preferably, the support construction includes spiral micrometer and support baseboard, and the center of the support baseboard, which has, to be led to
Hole, the micrometric screw of the spiral micrometer pass through the through-hole and with the babinet lower end is detachable, rotation connection, the spiral shell
The junction of rotation micrometer and the support baseboard is fixed by locking nut.
Preferably, there are four groove, the support baseboard is embedded with angle scale for the quadrangle setting of the support baseboard.With
Fluorescence Spectrometer is closed in use, needing the incidence angle and angle of reflection of accurate adjustment light, by angle scale to test fixture into
The adjustment of row angle can improve the accuracy of angle adjustment and then improve the accuracy of test result.
Description of the drawings
In order to illustrate more clearly about the embodiment of the present invention or technical scheme of the prior art, to embodiment or will show below
There is attached drawing needed in technology description to be briefly described, it should be apparent that, the accompanying drawings in the following description is only this
The embodiment of invention, for those of ordinary skill in the art, without creative efforts, can also basis
The attached drawing of offer obtains other attached drawings.
Cross-sectional view of Fig. 1 attached drawings for the present invention；
Overlooking the structure diagram of Fig. 2 attached drawings for the present invention.
Wherein 1- support baseboards, 1.1- grooves, 1.2- through-holes, 1.3- angle scales；2- spiral micrometers, 2.1- locking screws
Mother, 2.2- micrometric screws；3- test structures, 3.1- babinets, 3.2- case lids, 3.3- window frames, 3.4 columns, 3.5- card slots, 3.6-
Adjusting bolt, 3.7- tapped through holes, 3.8- threaded rods；4- windows；5- liners；6- electrodes, 6.1- binding posts, 6.2- springs are visited
Needle, 6.3- tops bolt, 6.4- top electrodes, electrode under 6.5-, 7- PORT COMs, 8- copper sheets, 9- samples, 10- radio-frequency joints.
Specific embodiment
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete
Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on
Embodiment in the present invention, those of ordinary skill in the art are obtained every other without making creative work
Embodiment shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a kind of polarization device test fixture, including support construction and test structure 3, test knot
Structure 3 is detachable, is rotationally connected with the top of support construction, and test structure 3 includes：
Babinet 3.1；Babinet 3.1 is made of stainless steel, and opening is in 3.1 side of babinet and has been bolted case lid 3.2,
Babinet 3.1 and case lid 3.2 are connected by threaded rod 3.8 and screw channel 3.7, and case lid 3.2 is provided with visualization window 4,
Window 4 is made, and pass through window frame 3.3 and be fixed on case lid 3.2 of the quartz glass plate of high (light transmittance ＞ 90%) thoroughly；
Liner 5；Liner 5 is fixedly installed in the inner wall of 3.1 visualization window of babinet, 4 opposite side；Liner 5 is by polytetrafluoroethylene (PTFE)
It is made；
Copper sheet 8；Copper sheet 8 is fixedly installed in 5 central area of liner for placing sample 9；
Electrode 6；It includes upper and lower two electrodes 6, and level is through babinet 3.1 and liner 5 and is arranged in parallel up and down, powers on
Pole 6.4 is in the same horizontal position with 8 upper end of copper sheet, and lower electrode 6.5 is in the same horizontal position with 8 lower end of copper sheet；
Radio-frequency joint 10；There are two radio-frequency joints 10, extends vertically through babinet 3.1 and liner 5 and left and right is arranged in parallel, penetrate
Frequency connector 10 is corresponded by conducting wire close to one end of copper sheet 8 and is electrically connected with upper and lower electrode 6.
Electrode 6 includes, binding post 6.1 and spring probe 6.2, and binding post 6.1 is in ladder circle column, one be relatively large in diameter
End is arranged in 3.1 outside of babinet, and the other end is detachably connected spring probe 6.2.
One end of copper sheet 8 is provided with the mounting hole of thread fitting to binding post 6.1 and top bolt 6.3, spring probe 6.2 are worn
It crosses mounting hole and passes through and push up bolt 6.3 and be fixed.
During practical application, the spring probe 6.2 of lower electrode 6.5 is tightly attached to the copper sheet 8 at 5 center of liner, the bullet of top electrode 6.4
Spring probe 6.2 presses closer the upper surface of test sample 9
PORT COM 7 is made of two radio-frequency joints, and radio-frequency joint extends vertically through the babinet and liner and left and right is parallel
Setting.
Babinet 3.1 further includes four columns 3.4, and column 3.4 is set to the same side in liner 5 and four columns are uniform
It is distributed in the surrounding of liner 5 and is abutted with liner 5.
Support construction includes spiral micrometer 2 and support baseboard 1, and the center of support baseboard 1 has through-hole, spiral micrometer
2 micrometric screw 2.2 passes through through-hole 1.2 and is connect with the card slot 3.5 of 3.1 lower end of babinet, and card slot 3.5 is equipped with through side side wall
Through-hole 1.2 is adjusted, adjusts and adjusting bolt 3.6 is inserted into through-hole 1.2, realize the rotation of entire test structure 3 with this configuration, tear open
It unloads, spiral micrometer 2 and the junction of support baseboard 1 are fixed by locking nut 2.1.The quadrangle of support baseboard 1 is provided with four
A groove 1.1, support baseboard 1 are embedded with angle scale 1.3.
Specific work process is as follows：The chucking voltage is supplied by pressure source, while sent out by high-pressure sodium lamp or xenon lamp
The monochromatic light that light source comes out through optical filter is irradiated to through diaphragm 4 on sample 9, by adjusting the angle of angle scale 1.3, makes to swash
Fluorescent material in hair sample 9, which sends out fluorescence and enters photomultiplier, to be received, and is then shown in the form of scheming or is digital,
The fluorescence property under the electric field of sample original position can be symbolized.
Can visualization window combination fluorescence light be utilized with vertical rotating, the test fixture to lie low the present invention provides a kind of
Spectrometer, Raman spectrometer can realize fluorescence property detection and Characterization for Microstructure under power plant in situ.
The foregoing description of the disclosed embodiments enables professional and technical personnel in the field to realize or use the present invention.
A variety of modifications of these embodiments will be apparent for those skilled in the art, it is as defined herein
General Principle can be realized in other embodiments without departing from the spirit or scope of the present invention.Therefore, it is of the invention
The embodiments shown herein is not intended to be limited to, and is to fit to and the principles and novel features disclosed herein phase one
The most wide range caused.
Claims (8)
1. a kind of polarization device test fixture, which is characterized in that including support construction and test structure (3), the test structure
(3) top that is detachable, being rotationally connected with the support construction, the test structure (3) include：
Babinet (3.1)；Babinet (3.1) side is provided with visualization window (4)；
Liner (5)；The liner (5) is fixedly installed in the inner wall of the babinet (3.1) visualization window (4) opposite side；
Copper sheet (8)；The copper sheet (8) is fixedly installed in the liner (5) central area for placing sample (9)；
Electrode (6)；Electrode (6) has upper and lower two, and level is through the babinet (3.1) and liner (5) and parallel up and down sets
It puts, the top electrode (6.4) is in the same horizontal position, the lower electrode (6.5) and the copper sheet with the copper sheet (8) upper end
(8) lower end is in the same horizontal position；
PORT COM (7)；The PORT COM (7) is made of two radio-frequency joints (10), and radio-frequency joint (10) extends vertically through institute
It states babinet (3.1) and liner (5) and left and right is arranged in parallel, the radio-frequency joint (10) passes through conducting wire close to one end of copper sheet (8)
One-to-one correspondence is electrically connected with the electrode (6).
2. a kind of polarization device test fixture according to claim 1, which is characterized in that electrode (6) includes, binding post
(6.1) and spring probe (6.2), for the binding post (6.1) in ladder circle column, the one end being relatively large in diameter is arranged in the case
On the outside of body (3.1), the other end is detachably connected the spring probe (6.2).
3. a kind of polarization device test fixture according to claim 2, which is characterized in that the binding post (6.1) is close
One end of copper sheet (8) is provided with the mounting hole of thread fitting and top bolt (6.3), and the spring probe (6.2) is across the installation
Hole simultaneously passes through and pushes up bolt (6.3) and be fixed.
4. a kind of polarization device test fixture according to claim 1, which is characterized in that the copper sheet is circle, and its
Radius is 5-8mm.
5. a kind of polarization device test fixture according to claim 1, which is characterized in that the liner (5) is infundibulate.
6. a kind of polarization device test fixture according to claim 5, which is characterized in that the babinet further includes four and stands
Column, the column is set to the same side in the liner (5) and four columns are evenly distributed in the liner (5)
Surrounding is simultaneously abutted with the liner (5).
7. a kind of polarization device test fixture according to claim 1, which is characterized in that the support construction includes spiral
Micrometer (2) and support baseboard (1), the center of the support baseboard (1) have through-hole (1.2), the spiral micrometer (2)
Micrometric screw (2.2) across the through-hole (1.2) and with the babinet (3.1) lower end is detachable, rotation connection, the spiral is surveyed
Micro- instrument (2) and the junction of the support baseboard (1) are fixed by locking nut (2.1).
A kind of 8. polarization device test fixture according to claim 7, which is characterized in that the quadrangle of the support baseboard (1)
It sets there are four groove (1.1), the support baseboard (1) to be embedded with angle scale (1.3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711444803.6A CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711444803.6A CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108181277A true CN108181277A (en) | 2018-06-19 |
| CN108181277B CN108181277B (en) | 2020-06-30 |
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711444803.6A Active CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
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| Country | Link |
|---|---|
| CN (1) | CN108181277B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108982463A (en) * | 2018-09-20 | 2018-12-11 | 韩山师范学院 | One kind being used for Solid surface fluorescence detecting instrument and its detection method |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6162826A (en) * | 1984-09-05 | 1986-03-31 | Hitachi Ltd | Apparatus for measuring polarization |
| DE102004057609A1 (en) * | 2004-11-29 | 2006-06-08 | Lavision Gmbh | Method for determination of laser induced emission of electromagnetic radiation involves hollow body which has opening whereby light is induced into interior of hollow body through opening and detects electromagnetic radiation |
| CN104764780A (en) * | 2015-04-23 | 2015-07-08 | 合肥工业大学 | Battery for in-situ spectral analysis and use method and application thereof |
| CN105092459A (en) * | 2015-09-09 | 2015-11-25 | 中国计量学院 | High-temperature testing clamp of piezoelectric polarization device |
| CN205229190U (en) * | 2015-10-10 | 2016-05-11 | 中国计量学院 | High temperature test fixture of ferroelectric piezoelectricity test system |
| CN206037904U (en) * | 2016-09-26 | 2017-03-22 | 大连旭计器有限公司 | Excellent clearance detection device is gone up with signature to two metal platform up ends of temperature controller |
-
2017
- 2017-12-27 CN CN201711444803.6A patent/CN108181277B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6162826A (en) * | 1984-09-05 | 1986-03-31 | Hitachi Ltd | Apparatus for measuring polarization |
| DE102004057609A1 (en) * | 2004-11-29 | 2006-06-08 | Lavision Gmbh | Method for determination of laser induced emission of electromagnetic radiation involves hollow body which has opening whereby light is induced into interior of hollow body through opening and detects electromagnetic radiation |
| CN104764780A (en) * | 2015-04-23 | 2015-07-08 | 合肥工业大学 | Battery for in-situ spectral analysis and use method and application thereof |
| CN105092459A (en) * | 2015-09-09 | 2015-11-25 | 中国计量学院 | High-temperature testing clamp of piezoelectric polarization device |
| CN205229190U (en) * | 2015-10-10 | 2016-05-11 | 中国计量学院 | High temperature test fixture of ferroelectric piezoelectricity test system |
| CN206037904U (en) * | 2016-09-26 | 2017-03-22 | 大连旭计器有限公司 | Excellent clearance detection device is gone up with signature to two metal platform up ends of temperature controller |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108982463A (en) * | 2018-09-20 | 2018-12-11 | 韩山师范学院 | One kind being used for Solid surface fluorescence detecting instrument and its detection method |
| CN108982463B (en) * | 2018-09-20 | 2023-10-03 | 韩山师范学院 | Solid surface fluorescence detection instrument and detection method thereof |
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| Publication number | Publication date |
|---|---|
| CN108181277B (en) | 2020-06-30 |
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