CN108181277B - Testing clamp for polarization device - Google Patents
Testing clamp for polarization device Download PDFInfo
- Publication number
- CN108181277B CN108181277B CN201711444803.6A CN201711444803A CN108181277B CN 108181277 B CN108181277 B CN 108181277B CN 201711444803 A CN201711444803 A CN 201711444803A CN 108181277 B CN108181277 B CN 108181277B
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- box body
- copper sheet
- lining
- electrode
- radio frequency
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/65—Raman scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N2021/6417—Spectrofluorimetric devices
Abstract
The invention discloses a test fixture for a polarization device, which comprises a supporting structure and a test structure, wherein the test structure is detachably and rotatably connected above the supporting structure, and comprises: a box body; a liner; the inner lining is fixedly arranged on the inner wall of the opposite side of the visual window of the box body; a copper sheet; the copper sheet is fixedly arranged in the central area of the lining and used for placing a sample; an electrode; the electrodes are provided with an upper electrode and a lower electrode which horizontally penetrate through the box body and the lining and are arranged in parallel up and down; a communication port; the communication port is composed of two radio frequency connectors, the radio frequency connectors vertically penetrate through the box body and the lining and are arranged in parallel from left to right, and one ends of the radio frequency connectors, which are close to the copper sheets, are electrically connected with the upper electrodes and the lower electrodes in a one-to-one correspondence mode through leads. The test structure is detachably and rotatably connected with the supporting structure, can be vertically rotated or horizontally laid, and can be conveniently matched with a fluorescence spectrometer or a Raman spectrometer to detect the fluorescence property and characterize the microstructure under an in-situ electric field.
Description
Technical Field
The invention belongs to the technical field of photoelectric material performance testing, and particularly relates to a testing clamp for a polarization device.
Background
The piezoelectric material is a functional material capable of converting mechanical energy and electric energy into each other, is widely applied to high and new technical fields such as mobile communication, satellite broadcasting, electronic equipment, instruments and meters, aerospace and the like, and becomes an indispensable modern key material and element. Discovery of Pr by Wang et al since 20053+Doped BaTiO3-CaTiO3Since single-phase materials have strong optical-mechanical-electrical coupling effects such as mechanoluminescence, electroluminescence and high electrostriction, the rare earth ion doped ferroelectric materials have important application in the aspect of optical-mechanical-electrical integrated coupling devices due to the multifunctional conversion effect, and become the focus of wide attention. Many researchers find that polarization can induce the luminescence enhancement effect of the rare earth ion doped ferroelectric material, but most of the existing test clamps can not flexibly adjust the angle, so that the luminescence performance detection and the microstructure characterization under the in-situ electric field are still deficient, and therefore, the problem to be solved by the researchers in the field is urgently needed to be solved by providing a test clamp of a polarization device, which is convenient for adjusting the sample angle and can effectively carry out the luminescence performance detection and the microstructure characterization under the in-situ electric field.
Disclosure of Invention
In view of the above, the invention provides a test fixture capable of rotating vertically and lying horizontally, and fluorescence performance detection and microstructure characterization under an in-situ power plant can be realized by using a visual window in combination with a fluorescence spectrometer and a raman spectrometer.
In order to achieve the purpose, the invention adopts the following technical scheme: the utility model provides a polarization device test fixture which characterized in that, includes bearing structure and test structure, test structure can dismantle, rotate connect in bearing structure's top, test structure includes:
a box body; a visual window is arranged on one side of the box body;
a liner; the inner liner is fixedly arranged on the inner wall of the opposite side of the visual window of the box body;
a copper sheet; the copper sheet is fixedly arranged in the central area of the lining and used for placing a sample;
an electrode; the upper electrode and the lower electrode horizontally penetrate through the box body and the lining and are arranged in parallel up and down, the upper electrode and the upper end of the copper sheet are in the same horizontal position, and the lower electrode and the lower end of the copper sheet are in the same horizontal position;
a communication port; the communication port is composed of two radio frequency connectors, the radio frequency connectors vertically penetrate through the box body and the lining and are arranged in parallel from left to right, and one ends of the radio frequency connectors, which are close to the copper sheets, are electrically connected with the upper electrodes and the lower electrodes in a one-to-one correspondence mode through conducting wires.
The beneficial effect of adopting above-mentioned technical scheme is: the test structure is detachably and rotatably connected with the supporting structure, can be vertically rotated or horizontally laid, and can be conveniently matched with a fluorescence spectrometer or a Raman spectrometer to detect the fluorescence property and characterize the microstructure under an in-situ electric field.
Preferably, the upper electrode and the lower electrode have the same structure, the upper electrode comprises a binding post and a spring probe, the binding post is in a stepped cylindrical shape, one end with larger diameter is clamped outside the box body, the other end of the binding post is detachably connected with the spring probe, and the outer surface of the binding post is an insulating layer; the insulativity of the binding post is improved, and the safety of the device is further improved.
Preferably, one end of the binding post, which is close to the copper sheet, is provided with a mounting hole and a top bolt which are in threaded fit, and the spring probe penetrates through the mounting hole and is pressed and fixed through the top bolt. Because the thickness of sample differs, this setting can make the nimble adjustment of spring probe according to the thickness of sample, makes the spring probe tightly push up the sample.
Preferably, the copper sheet is circular, and the radius of the copper sheet is 5-8mm, so that the test sample can wholly cover the copper sheet to prevent the short circuit of the electrode under the high-voltage space discharge contact.
Preferably, the liner is funnel-shaped.
Preferably, the box still includes four stands, the stand in the inside lining sets up in same one side and four stand even distributions are in around the inside lining and with the inside lining butt, the effect of this stand is fixed spacing to the inside lining, improves the security and the stability of device.
Preferably, the supporting structure comprises a micrometer caliper and a supporting base plate, a through hole is formed in the center of the supporting base plate, a micrometer screw of the micrometer caliper penetrates through the through hole and is detachably and rotatably connected with the lower end of the box body, and the joint of the micrometer caliper and the supporting base plate is fixed through a locking nut.
Preferably, four grooves are formed in four corners of the supporting base plate, and an angle scale is embedded in the supporting base plate. When the device is used in cooperation with a fluorescence spectrometer, the incident angle and the reflection angle of light rays need to be accurately adjusted, and the accuracy of angle adjustment can be improved by adjusting the angle of the test fixture by the angle scale, so that the accuracy of a test result is improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a schematic cross-sectional view of the present invention;
fig. 2 is a schematic top view of the present invention.
Wherein, 1-supporting the bottom plate, 1.1-groove, 1.2-through hole, 1.3-angle scale; 2-micrometer screw, 2.1-locking nut, 2.2-micrometer screw; 3-test structure, 3.1-box, 3.2-box cover, 3.3-window frame, 3.4 column, 3.5-clamping groove, 3.6-adjusting bolt, 3.7-thread through hole, 3.8-threaded rod; 4-a window; 5-lining; 6-electrode, 6.1-binding post, 6.2-spring probe, 6.3-top bolt, 6.4-upper electrode, 6.5-lower electrode, 7-communication port, 8-copper sheet, 9-sample, 10-radio frequency connector.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
The embodiment of the invention discloses a test fixture for a polarization device, which comprises a supporting structure and a test structure 3, wherein the test structure 3 is detachably and rotatably connected above the supporting structure, and the test structure 3 comprises:
a box body 3.1; the box body 3.1 is made of stainless steel, one side of the box body 3.1 is provided with an opening and is connected with a box cover 3.2 through a bolt, the box body 3.1 and the box cover 3.2 are connected in a matching way through a threaded rod 3.8 and a threaded channel 3.7, the box cover 3.2 is provided with a visual window 4, the window 4 is made of a high-transparency (the light transmittance is more than 90 percent) quartz glass sheet and is fixed on the box cover 3.2 through a window frame 3.3;
an inner liner 5; the lining 5 is fixedly arranged on the inner wall of the opposite side of the visual window 4 of the box body 3.1; the liner 5 is made of polytetrafluoroethylene;
a copper sheet 8; the copper sheet 8 is fixedly arranged in the central area of the lining 5 and used for placing a sample 9;
an electrode 6; the device comprises an upper electrode 6 and a lower electrode 6, wherein the upper electrode 6 and the lower electrode horizontally penetrate through a box body 3.1 and a lining 5 and are arranged in parallel up and down, the upper electrode 6.4 and the upper end of a copper sheet 8 are in the same horizontal position, and the lower electrode 6.5 and the lower end of the copper sheet 8 are in the same horizontal position;
a radio frequency connector 10; the two radio frequency connectors 10 vertically penetrate through the box body 3.1 and the lining 5 and are arranged in parallel from left to right, and one end of each radio frequency connector 10 close to the copper sheet 8 is electrically connected with the upper electrode 6 and the lower electrode 6 in a one-to-one correspondence mode through conducting wires.
Electrode 6 includes, terminal 6.1 and spring probe 6.2, and terminal 6.1 is the ladder cylindricly, and the great one end card of its diameter is located the box 3.1 outside, and the other end can be dismantled and connect spring probe 6.2.
One end of the binding post 6.1 close to the copper sheet 8 is provided with a mounting hole and a top bolt 6.3 which are matched with each other through threads, and the spring probe 6.2 penetrates through the mounting hole and is pressed and fixed through the top bolt 6.3.
In practical application, the spring probe 6.2 of the lower electrode 6.5 is tightly attached to the copper sheet 8 at the center of the lining 5, and the spring probe 6.2 of the upper electrode 6.4 is tightly pressed against the upper surface of the test sample 9
The communication port 7 is composed of two radio frequency connectors which vertically penetrate through the box body and the lining and are arranged in parallel from left to right.
The box 3.1 further comprises four columns 3.4, wherein the columns 3.4 are arranged on the same side of the lining 5, and the four columns are uniformly distributed around the lining 5 and are abutted to the lining 5.
The supporting structure comprises a micrometer caliper 2 and a supporting base plate 1, a through hole is formed in the center of the supporting base plate 1, a micrometer screw 2.2 of the micrometer caliper 2 penetrates through the through hole 1.2 and is connected with a clamping groove 3.5 at the lower end of a box body 3.1, the clamping groove 3.5 penetrates through one side wall to be provided with an adjusting through hole 1.2, an adjusting bolt 3.6 is inserted into the adjusting through hole 1.2, the whole testing structure 3 is rotated and disassembled through the structure, and the micrometer caliper 2 is fixed with the connecting part of the supporting base plate 1 through a locking nut 2.1. Four corners of the supporting base plate 1 are provided with four grooves 1.1, and an angle scale 1.3 is embedded in the supporting base plate 1.
The specific working process is as follows: the voltage of the clamp is supplied by a voltage supply source, simultaneously, monochromatic light emitted by a light source of a high-pressure mercury lamp or a xenon lamp through a light filter is irradiated on the sample 9 through the window sheet 4, the angle of the angle scale is adjusted to be 1.3, so that fluorescent substances in the sample 9 are excited to emit fluorescence, the fluorescence enters the photomultiplier to be received, and then the fluorescence is displayed in a graph or digital mode, and the fluorescence performance of the sample under an in-situ electric field can be represented.
The invention provides a test fixture capable of rotating vertically and lying horizontally, which can realize fluorescence performance detection and microstructure characterization under an in-situ power plant by using a visual window in combination with a fluorescence spectrometer and a Raman spectrometer.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. The utility model provides a polarization device test fixture, its characterized in that includes bearing structure and test structure (3), test structure (3) can be dismantled, rotate connect in bearing structure's top, test structure (3) include:
a box body (3.1); a visual window (4) is arranged on one side of the box body (3.1);
an inner liner (5); the inner liner (5) is fixedly arranged on the inner wall of the opposite side of the visual window (4) of the box body (3.1);
a copper sheet (8); the copper sheet (8) is fixedly arranged in the central area of the lining (5) and used for placing a sample (9);
an electrode (6); the electrodes (6) are two: the upper electrode (6.4) and the lower electrode (6.5) horizontally penetrate through the box body (3.1) and the lining (5) and are arranged in parallel up and down, the upper electrode (6.4) and the upper end of the copper sheet (8) are in the same horizontal position, and the lower electrode (6.5) and the lower end of the copper sheet (8) are in the same horizontal position;
a communication port (7); the communication port (7) is composed of two radio frequency connectors (10), the radio frequency connectors (10) vertically penetrate through the box body (3.1) and the lining (5) and are arranged in parallel from left to right, and one ends, close to the copper sheets (8), of the radio frequency connectors (10) are electrically connected with the electrodes (6) in a one-to-one correspondence mode through conducting wires.
2. The polarization device test fixture of claim 1, wherein the electrode (6) comprises a binding post (6.1) and a spring probe (6.2), the binding post (6.1) is in a stepped cylindrical shape, one end with a larger diameter is clamped outside the box body (3.1), and the other end is detachably connected with the spring probe (6.2).
3. The polarization device test fixture as claimed in claim 2, wherein one end of the binding post (6.1) close to the copper sheet (8) is provided with a mounting hole and a top bolt (6.3) which are in threaded fit, and the spring probe (6.2) passes through the mounting hole and is pressed and fixed through the top bolt (6.3).
4. The fixture of claim 1, wherein the copper sheet is circular and has a radius of 5-8 mm.
5. A polarising device test fixture according to claim 1, characterised in that the inner liner (5) is funnel-shaped.
6. The jig of claim 5, wherein the box further comprises four columns, the columns are disposed on the same side of the liner (5) and the four columns are uniformly distributed around the liner (5) and abut against the liner (5).
7. The polarization device test fixture of claim 1, wherein the support structure comprises a micrometer caliper (2) and a support base plate (1), a through hole (1.2) is formed in the center of the support base plate (1), a micrometer screw (2.2) of the micrometer caliper (2) penetrates through the through hole (1.2) and is detachably and rotatably connected with the lower end of the box body (3.1), and the joint of the micrometer caliper (2) and the support base plate (1) is fixed through a locking nut (2.1).
8. The polarization device test fixture of claim 7, wherein four grooves (1.1) are arranged at four corners of the support base plate (1), and an angle scale (1.3) is embedded in the support base plate (1).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711444803.6A CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711444803.6A CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108181277A CN108181277A (en) | 2018-06-19 |
| CN108181277B true CN108181277B (en) | 2020-06-30 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711444803.6A Active CN108181277B (en) | 2017-12-27 | 2017-12-27 | Testing clamp for polarization device |
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Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108982463B (en) * | 2018-09-20 | 2023-10-03 | 韩山师范学院 | Solid surface fluorescence detection instrument and detection method thereof |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6162826A (en) * | 1984-09-05 | 1986-03-31 | Hitachi Ltd | Apparatus for measuring polarization |
| DE102004057609A1 (en) * | 2004-11-29 | 2006-06-08 | Lavision Gmbh | Method for determination of laser induced emission of electromagnetic radiation involves hollow body which has opening whereby light is induced into interior of hollow body through opening and detects electromagnetic radiation |
| CN104764780A (en) * | 2015-04-23 | 2015-07-08 | 合肥工业大学 | Battery for in-situ spectral analysis and use method and application thereof |
| CN105092459A (en) * | 2015-09-09 | 2015-11-25 | 中国计量学院 | High-temperature testing clamp of piezoelectric polarization device |
| CN205229190U (en) * | 2015-10-10 | 2016-05-11 | 中国计量学院 | High temperature test fixture of ferroelectric piezoelectricity test system |
| CN206037904U (en) * | 2016-09-26 | 2017-03-22 | 大连旭计器有限公司 | Excellent clearance detection device is gone up with signature to two metal platform up ends of temperature controller |
-
2017
- 2017-12-27 CN CN201711444803.6A patent/CN108181277B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6162826A (en) * | 1984-09-05 | 1986-03-31 | Hitachi Ltd | Apparatus for measuring polarization |
| DE102004057609A1 (en) * | 2004-11-29 | 2006-06-08 | Lavision Gmbh | Method for determination of laser induced emission of electromagnetic radiation involves hollow body which has opening whereby light is induced into interior of hollow body through opening and detects electromagnetic radiation |
| CN104764780A (en) * | 2015-04-23 | 2015-07-08 | 合肥工业大学 | Battery for in-situ spectral analysis and use method and application thereof |
| CN105092459A (en) * | 2015-09-09 | 2015-11-25 | 中国计量学院 | High-temperature testing clamp of piezoelectric polarization device |
| CN205229190U (en) * | 2015-10-10 | 2016-05-11 | 中国计量学院 | High temperature test fixture of ferroelectric piezoelectricity test system |
| CN206037904U (en) * | 2016-09-26 | 2017-03-22 | 大连旭计器有限公司 | Excellent clearance detection device is gone up with signature to two metal platform up ends of temperature controller |
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| CN108181277A (en) | 2018-06-19 |
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