CN108139430A - A kind of test probe of detection device - Google Patents
A kind of test probe of detection device Download PDFInfo
- Publication number
- CN108139430A CN108139430A CN201680040155.5A CN201680040155A CN108139430A CN 108139430 A CN108139430 A CN 108139430A CN 201680040155 A CN201680040155 A CN 201680040155A CN 108139430 A CN108139430 A CN 108139430A
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- CN
- China
- Prior art keywords
- test
- probe
- connection end
- needle guard
- plugged
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
A kind of test probe (20) of detection device,It includes needle guard (10) and probe (20),Wherein,The needle guard (10) includes the first connecting pin (11),Second connection end (12) and connecting wire (13),The connecting wire (13) is flexibly connected between first connecting pin (11) and the second connection end (12),The probe (20) is plugged in the second connection end (12),First connecting pin (11) is welded on test pcb board (30),And the first signal join domain is formed in the position,Other signal join domains are provided on the test pcb board (30),Since the connecting wire (13) is flexibly connected between first connecting pin (11) and the second connection end (12),So when the probe (20) is plugged in the second connection end (12),What the probe (20) was capable of long range large span is inserted into the test pcb board (30) at other signal join domains,So as to complete the test job to function module on test board below the test pcb board (30).
Description
The present invention relates to a kind of test probes, it particularly relates to a kind of include needle guard and probe, wherein, which includes the first connecting pin, second connection end and connecting wire, which is flexibly connected the test probe between first connecting pin and the second connection end.
The very universal production for being useful in people of digital digital products various at present, life suffers, for general digital digital product, a variety of electronic functional modules are generally provided with inside it, when specific works, several electronic functional modules are powered on so that Related product can be realized specific function, such as, signal receiving module has been generally comprised in cell phone, signal emission module, control module etc., and in concrete practice, the working condition of modules in digital digital product, product quality tends to determine the product quality of integral product, being tested during the manufacturing related function module just becomes the effective means for ensureing product quality.
It generally comprises test board and test circuit board for the jig of the test function module occurred on the market at present, at work, the module that will be detected is needed to be placed in test board, fixed test probe is welded on test circuit board, the signal of detected module is transmitted in test equipment by testing circuit board to complete test after testing corresponding position on probe engaged test plate, but there is also many disadvantages to be described below now when specifically used for this test fixture: firstly, its same root test probe can not be real
It now transfers a variety of test signals, secondly, its needle guard is longer, when needle guard is first welded on pcb board, scolding tin penetrates into inside needle guard, needle guard is plugged, probe can not be caused to be uneven on earth when causing probe to be inserted into, after needle guard scolding tin is fixed, it can not be flexibly transferred to the pin mark of other positions on pcb board, that tests probe intensively results in the deficiency of pcb board locational space and the deficiency of electronics cabling space, and this is the major defect for the prior art.
Summary of the invention
The present invention provides a kind of test probe of detection device, probe portion can free long range large span it is mobile, so that the test job for supporting multiple points to be, facilitates tester to detect, and this is the main object of the present invention.
The technical solution used in the present invention is: a kind of test probe of detection device, it includes needle guard and probe, wherein, the needle guard includes the first connecting pin, second connection end and connecting wire, the connecting wire is flexibly connected between first connecting pin and the second connection end, the probe is plugged in the second connection end, when specific implementation, first connecting pin is welded on test pcb board, and the first signal join domain is formed in the position, other signal join domains are additionally provided on the test pcb board, since the connecting wire is flexibly connected between first connecting pin and the second connection end, so when the probe is plugged in the second connection end, what the probe was capable of long range large span is inserted into the test pcb board from other signal join domains, to complete to test P The test job of functional module on the test board of CB plate lower section.
First connecting pin includes the first pillar needle and sleeve, the first pillar needle is plugged in the sleeve lower end, the connecting wire one end is plugged in the upper end of the sleeve, the second connection end is connected to the other end of the connecting wire, the second connection end is a pillar needle, the probe includes needle guard and syringe needle, wherein should
Syringe needle is plugged in the lower end of the needle guard, the second connection end is plugged in the upper end of the needle guard, when specific implementation, the link position of the first pillar needle and the sleeve, the connecting wire and the link position of the link position of the sleeve, the link position of the second connection end and the connecting wire, the second connection end and the needle guard are respectively arranged with detent, so that various pieces be made closely to connect.
The invention has the benefit that needle guard of the invention is divided into two parts, a portion band flexible cord connects, can freedom connect with another part needle guard, scolding tin location point position on pcb board can be with unrestricted choice position, same root test probe is set to can be realized a variety of test signals of switching, the present invention can prevent the problem of scolding tin leakage completely, because in the present invention, needle guard has no inner hole to avoid the occurrence of seeping tin, there is no the structure of permeability hole at needle guard and pcb board scolding tin of the invention, in addition the present invention is capable of the space of electron configuration cabling offer abundance, because in the present invention, it pcb board scolding tin position can be with unrestricted choice position, flexibly it is transferred to other positions pin mark on pcb board.
Fig. 1 is stereoscopic schematic diagram of the invention.
Fig. 2 is the stereoscopic schematic diagram of working condition of the invention.
Fig. 3 is the schematic diagram of the section structure of working condition of the invention.
As shown in Figures 1 to 3, the test probe of a kind of detection device comprising needle guard 10 and probe 20, wherein the needle guard 10 includes the first connecting pin 11, second connection end 12 and connecting wire 13, the connection
Conducting wire 13 is flexibly connected between first connecting pin 11 and the second connection end 12, which is plugged in the second connection end 12.
When specific implementation, which is welded on test pcb board 30, and forms the first signal join domain in the position.
Other signal join domains are additionally provided on the test pcb board 30, since the connecting wire 13 is flexibly connected between first connecting pin 11 and the second connection end 12, so when the probe 20 is plugged in the second connection end 12, what the probe 20 was capable of long range large span is inserted into the test pcb board 30 from other signal join domains, to complete the test job to functional module on the 30 lower section test board 40 of test pcb board.
First connecting pin 11 includes the first pillar needle 51 and sleeve 52, which is plugged in 52 lower end of sleeve.
13 one end of connecting wire is plugged in the upper end of the sleeve 52.
The second connection end 12 is connected to the other end of the connecting wire 13, which is a pillar needle.
The probe 20 includes needle guard 21 and syringe needle 22, wherein the syringe needle 22 is plugged in the lower end of the needle guard 21, which is plugged in the upper end of the needle guard 21.
When specific implementation, the link position of the first pillar needle 51 and the sleeve 52, the connecting wire 13 and the link position of the link position of the sleeve 52, the link position of the second connection end 12 and the connecting wire 13, the second connection end 12 and the needle guard 21 are respectively arranged with detent 61, so that various pieces be made closely to connect.
Claims (5)
- A kind of test probe of detection device, it is characterized by comprising needle guard and probes, wherein, the needle guard includes the first connecting pin, second connection end and connecting wire, the connecting wire is flexibly connected between first connecting pin and the second connection end, the probe is plugged in the second connection end, first connecting pin is welded on test pcb board, and the first signal join domain is formed in the position, other signal join domains are provided on the test pcb board, the second connection end is connected by the probe with second signal join domain, the second signal join domain is different from the first signal join domain.
- A kind of test probe of detection device as described in claim 1, it is characterised in that: first connecting pin includes the first pillar needle and sleeve, which is plugged in the sleeve lower end, and described connecting wire one end is plugged in the upper end of the sleeve.
- A kind of test probe of detection device as claimed in claim 1 or 2, it is characterised in that: the second connection end is the second pillar needle.
- A kind of test probe of detection device as claimed in claim 3, it is characterised in that: the probe includes needle guard and syringe needle, wherein the syringe needle is plugged in the lower end of the needle guard, and the second connection end is plugged in the upper end of the needle guard.
- A kind of test probe of detection device as claimed in claim 4, it is characterised in that: the link position of the first pillar needle and the sleeve, the connecting wire and the link position of the link position of the sleeve, the link position of the second connection end and the connecting wire, the second connection end and the needle guard are respectively arranged with detent.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/CN2016/076760 WO2017156779A1 (en) | 2016-03-18 | 2016-03-18 | Test probe of detection apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108139430A true CN108139430A (en) | 2018-06-08 |
Family
ID=59851310
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201680040155.5A Pending CN108139430A (en) | 2016-03-18 | 2016-03-18 | A kind of test probe of detection device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN108139430A (en) |
| WO (1) | WO2017156779A1 (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112485565B (en) * | 2020-11-17 | 2022-05-03 | 乐凯特科技铜陵有限公司 | PCB function test device |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4414506A (en) * | 1980-12-30 | 1983-11-08 | Kelley Jack M | Electrical circuit test probe |
| WO2006002163A2 (en) * | 2004-06-21 | 2006-01-05 | William Wayne Maxwell | Method and apparatus for magnetically achieving electrical continuity |
| CN201503443U (en) * | 2009-09-30 | 2010-06-09 | 襄樊启创机电科技开发有限公司 | Low-impedance probe |
| CN102985833A (en) * | 2010-06-01 | 2013-03-20 | Nts有限公司 | Probe for inspecting electronic component |
| CN204188665U (en) * | 2014-05-27 | 2015-03-04 | 深圳市策维科技有限公司 | A kind of test probe assembly |
| CN204205177U (en) * | 2014-11-20 | 2015-03-11 | 深圳市百通先科技有限公司 | A kind of test VGA connector |
| CN204832273U (en) * | 2015-08-26 | 2015-12-02 | 钟晓华 | Test probes |
| CN105141256A (en) * | 2015-08-20 | 2015-12-09 | 浙江艾能聚光伏科技股份有限公司 | Novel test device for solar cell testing machine |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN204330832U (en) * | 2014-05-27 | 2015-05-13 | 深圳市策维科技有限公司 | A kind of test probe assembly |
| CN204101604U (en) * | 2014-05-27 | 2015-01-14 | 深圳市策维科技有限公司 | A kind of test probe |
-
2016
- 2016-03-18 WO PCT/CN2016/076760 patent/WO2017156779A1/en active Application Filing
- 2016-03-18 CN CN201680040155.5A patent/CN108139430A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4414506A (en) * | 1980-12-30 | 1983-11-08 | Kelley Jack M | Electrical circuit test probe |
| WO2006002163A2 (en) * | 2004-06-21 | 2006-01-05 | William Wayne Maxwell | Method and apparatus for magnetically achieving electrical continuity |
| CN201503443U (en) * | 2009-09-30 | 2010-06-09 | 襄樊启创机电科技开发有限公司 | Low-impedance probe |
| CN102985833A (en) * | 2010-06-01 | 2013-03-20 | Nts有限公司 | Probe for inspecting electronic component |
| CN204188665U (en) * | 2014-05-27 | 2015-03-04 | 深圳市策维科技有限公司 | A kind of test probe assembly |
| CN204205177U (en) * | 2014-11-20 | 2015-03-11 | 深圳市百通先科技有限公司 | A kind of test VGA connector |
| CN105141256A (en) * | 2015-08-20 | 2015-12-09 | 浙江艾能聚光伏科技股份有限公司 | Novel test device for solar cell testing machine |
| CN204832273U (en) * | 2015-08-26 | 2015-12-02 | 钟晓华 | Test probes |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017156779A1 (en) | 2017-09-21 |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180608 |
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| RJ01 | Rejection of invention patent application after publication |