CN204101604U - A kind of test probe - Google Patents
A kind of test probe Download PDFInfo
- Publication number
- CN204101604U CN204101604U CN201420275737.XU CN201420275737U CN204101604U CN 204101604 U CN204101604 U CN 204101604U CN 201420275737 U CN201420275737 U CN 201420275737U CN 204101604 U CN204101604 U CN 204101604U
- Authority
- CN
- China
- Prior art keywords
- probe
- accommodating cavity
- test probe
- bodies
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Landscapes
- Measuring Leads Or Probes (AREA)
Abstract
The utility model provides a kind of test probe, this test probe comprises probe bodies, elastic component and probe, wherein probe bodies is axially provided with cavity along it, the inwall of probe bodies is provided with the first support portion, cavity is separated into the first accommodating cavity and the second accommodating cavity that are communicated with the two ends of probe bodies respectively by the first support portion, first accommodating cavity is for receiving golden finger, elastic component is arranged in the second accommodating cavity and one end of elastic component is supported on the first support portion, end of probe divides and is arranged in the second accommodating cavity, and on the other end of being supported in property part.By above disclosure, it is more difficult that the utility model can solve current probe assembling, higher to the processing request of through hole, and the unstable technical matters that powers on.
Description
Technical field
The utility model relates to electronic measurement and control technical field, particularly relates to a kind of test probe.
Background technology
Need to carry out testing electrical property to printed circuit board (PCB), to judge whether the electrical parameter (such as resistance, capacitance or induction reactance etc.) of each assembly of printed circuit board (PCB) satisfies the criteria in the process of producing printed circuit board (PCB).
The test mode of common printed circuit board (PCB) arranges test point on a printed circuit, by paste solder printing in test point surface, by automated test device or on-line testing equipment, with the tin cream position of probe direct engaged test point to obtain relevant electrical parameter.
Probe assembling in current on-line testing equipment is more difficult, higher to the processing request of through hole, and the instability that powers on.
Utility model content
In view of this, the utility model embodiment provides a kind of test probe, to solve the problems of the technologies described above.
The utility model provides a kind of test probe, test probe comprises probe bodies, elastic component and probe, wherein probe bodies is axially provided with cavity along it, the inwall of probe bodies is provided with the first support portion, cavity is separated into the first accommodating cavity and the second accommodating cavity that are communicated with the two ends of probe bodies respectively by the first support portion, first accommodating cavity is for receiving golden finger, elastic component is arranged in the second accommodating cavity and one end of elastic component is supported on the first support portion, end of probe divides and is arranged in the second accommodating cavity, and is supported on the other end of elastic component.
Wherein, be provided with inside extruding probe bodies in the first accommodating cavity and at least two protuberances being formed, at least two protuberances are used for gripping golden finger.
Wherein, probe can make elastic component shrink under the thrust of its axis, thus makes the contraction in length of test probe.
Wherein, the first support portion is inwardly extrude the first flange that probe bodies is formed or the staircase structure be formed on the inwall of probe bodies.
Wherein, probe comprises shank and is arranged at the needle handle of shank one end, and wherein the sectional dimension of needle handle is greater than the sectional dimension of shank, and needle handle is arranged in the second accommodating cavity, the inwall of probe bodies is provided with the second support portion, and the second support portion is used for needle handle to be limited in the second accommodating cavity.
Wherein, the second support portion is inwardly extrude the second flange that probe bodies formed.
Wherein, elastic component is metal spring.
Wherein, the axial length of the first accommodating cavity is set to the intubating length being less than golden finger, makes one end of golden finger insert the second accommodating cavity and contacts with the metal spring in the second accommodating cavity.
Wherein, golden finger comprises insertion section and the fixed part of opposite end connection, and the sectional dimension of fixed part is greater than the sectional dimension of insertion section, and then forms cascaded surface in the junction of insertion section and fixed part, and one end of probe bodies is supported on cascaded surface.
Pass through technique scheme, the utility model embodiment provides a kind of test probe, golden finger is received by the first accommodating cavity of probe bodies, and then carry out patching coordinating with golden finger, thus more difficult to solve current probe assembling, higher to the processing request of through hole, and the unstable technical matters that powers on.
Accompanying drawing explanation
In order to be illustrated more clearly in the utility model embodiment or technical scheme of the prior art, be briefly described to the accompanying drawing used required in embodiment or description of the prior art below, apparently, accompanying drawing in the following describes is embodiments more of the present utility model, for those of ordinary skill in the art, under the prerequisite not paying creative work, other accompanying drawing can also be obtained according to these accompanying drawings.
Fig. 1 is the schematic perspective view of a kind of test probe embodiment of the utility model;
Fig. 2 is the cut-open view of a kind of test probe embodiment of the utility model;
Fig. 3 is the schematic perspective view of a kind of test probe Assemblies Example of the utility model before having assembled;
Fig. 4 is the cut-open view of a kind of test probe Assemblies Example of the utility model before having assembled;
Fig. 5 is a kind of test probe Assemblies Example of the utility model schematic perspective view after finishing assembly;
Fig. 6 is a kind of test probe Assemblies Example of the utility model cut-open view after finishing assembly;
Fig. 7 is the schematic perspective view of a kind of test probe Assemblies Example of the utility model after probe forced compression;
Fig. 8 is the cut-open view of a kind of test probe Assemblies Example of the utility model after probe forced compression;
Fig. 9 is the decomposing schematic representation of a kind of test probe Assemblies Example of the utility model;
Figure 10 is the structural representation of a kind of test platform first of the utility model embodiment; And
Figure 11 is the structural representation of a kind of test platform second of the utility model embodiment.
Embodiment
For making the object of the utility model embodiment, technical scheme and advantage clearly, below in conjunction with the accompanying drawing in the utility model embodiment, technical scheme in the utility model embodiment is clearly and completely described, obviously, described embodiment is the utility model part embodiment, instead of whole embodiments.Based on the embodiment in the utility model, those of ordinary skill in the art are not making the every other embodiment obtained under creative work prerequisite, all belong to the scope of the utility model protection.
The utility model embodiment provides a kind of test probe, and below please also refer to Fig. 1 and Fig. 2, wherein Fig. 1 is the schematic perspective view of a kind of test probe embodiment of the utility model, and Fig. 2 is the cut-open view of a kind of test probe embodiment of the utility model.
As depicted in figs. 1 and 2, in the utility model test probe embodiment, test probe 30 comprises probe bodies 301, elastic component 302 and probe 303, and wherein one end of probe bodies 301 is hollow design, and then carries out patching coordinating with golden finger 40 (in hereafter introducing in detail).
Specifically can see Fig. 2, probe bodies 301 is axially provided with cavity along it, the inwall of probe bodies 301 is provided with the first support portion 304, cavity is separated into the first accommodating cavity 305 and the second accommodating cavity 306 be communicated with the two ends of probe bodies 301 respectively by the first support portion 304, first accommodating cavity 305 is for receiving golden finger 40, elastic component 302 is arranged in the second accommodating cavity 306 and one end of elastic component 302 is supported on the first support portion 304, probe 303 part is arranged in the second accommodating cavity 306, and is supported on the other end of elastic component 302.
Probe 303 specifically comprises shank 3031 and is arranged at the needle handle 3032 of shank 3031 one end, wherein the sectional dimension of needle handle 3032 is greater than the sectional dimension of shank 3031, needle handle 3032 is arranged in the second accommodating cavity 306, the inwall of probe bodies 301 is provided with the second support portion 308, support portion 308, second for being limited in the second accommodating cavity 306 by needle handle 3032.
Therefore, the needle handle 3032 of probe 303 and elastic component 302 are limited in the second accommodating cavity 306, the other end of shank 3031 be subject to along probe bodies 301 axially and to the effect of the pressure in needle handle 3032 direction of probe 303 time, elastic component 302 shrinks, probe 303 is moved to the first support portion 304, thus make the contraction in length of test probe 30, simultaneously because elastic component 302 has elasticity, therefore shank 3031 the other end can with execute stressed object tight abutment.
Below please with further reference to Fig. 3 to Fig. 6, Fig. 3 is the schematic perspective view of a kind of test probe Assemblies Example of the utility model before having assembled, Fig. 4 is the cut-open view of a kind of test probe Assemblies Example of the utility model before having assembled, Fig. 5 is a kind of test probe Assemblies Example of the utility model schematic perspective view after finishing assembly, and Fig. 6 is a kind of test probe Assemblies Example of the utility model cut-open view after finishing assembly.
As shown in Figure 3 and Figure 4, in test probe Assemblies Example, test probe assembly comprises the test probe 30 and golden finger 40 that Fig. 1 and Fig. 2 disclose, golden finger 40 comprises insertion section 401 and the fixed part 402 of opposite end connection, the sectional dimension of fixed part 402 is greater than the sectional dimension of insertion section 401, and then form cascaded surface 403 in insertion section 401 and the junction of fixed part 402, first accommodating cavity 305 of probe bodies 301 can carry out grafting along the insertion section 401 of direction shown in arrow and golden finger 40 in Fig. 3 and Fig. 4, and after grafting, cascaded surface 403 can with one end of probe bodies 301 against.
As shown in Figure 5 and Figure 6, the insertion section 401 that test probe 30 is plugged in golden finger 40 is with after completing assembling, one end of probe bodies 301 is supported on cascaded surface 403, because the fixed part 402 of golden finger 40 is fixed on circuit board, therefore, cascaded surface 403 can one end of contact probe bodies 301, thus make test probe 30 be subject to along test probe 30 axially to the effect of the power of golden finger 40 time, can keep relative with golden finger 40 and fix.Alternatively, golden finger 40 can be set to insertion first accommodating cavity 305, and contacts with the elastic component 302 in the second accommodating cavity, and elastic component 302 can be electric conductor, thus can increase test probe 30 can conductive area.
Be please the schematic perspective view of a kind of test probe Assemblies Example of the utility model after probe forced compression with further reference to Fig. 7 and Fig. 8, Fig. 7, Fig. 8 is the cut-open view of a kind of test probe Assemblies Example of the utility model after probe forced compression.After completing assembling, when probe 303 can make elastic component 302 shrink under the effect of the thrust (as shown by arrows in FIG.) along probe 303 axis, thus make the contraction in length of test probe 30, simultaneously due to elastic component 302 shrink after can produce elastic force and act on probe 303, therefore can make the top of probe 303 can with the force application object tight abutment be in contact with it.
When production test probe 30, can on the relevant position of probe bodies 301, by inwardly extruding the first flange that probe bodies 301 is formed, thus obtain the first support portion 304, in like manner, by inwardly extruding the second flange that probe bodies 301 is formed, thus the second support portion 308 is obtained.
Alternatively, also can form staircase structure on the inwall of probe bodies 301, thus obtain the first support portion 304, wherein staircase structure realizes by modes such as punching presses.
And refer to Fig. 9, Fig. 9 is the decomposing schematic representation of a kind of test probe Assemblies Example of the utility model, as shown in Figure 9, probe bodies 301, elastic component 302, probe 303 form test probe 30, test probe 30 is pluggable is fixed on golden finger 40, thus composition test probe assembly, in the utility model embodiment, probe bodies 301, elastic component 302, probe 303 and golden finger 40 are conducting metal, and elastic component 302 is preferably metal spring.
Referring again to Fig. 8, preferably, in the utility model embodiment, the axial length of the first accommodating cavity 305 is set to the intubating length being less than golden finger 40, makes one end of golden finger 40 insert the second accommodating cavity 306 and contacts with the metal spring in the second accommodating cavity 306.Now, the conductive path of test probe assembly specifically can be: " probe 303-probe bodies 301-golden finger 40 " and " probe 303-metal spring-golden finger 40 ", because one end of golden finger 40 contacts with metal spring, therefore present embodiment can increase the conductive path of extra " probe 303-metal spring-golden finger 40 ", thus can make to be increased by the electric current of test probe assembly, to improve measuring accuracy.
Further, because the first accommodating cavity 305 needs the insertion section 401 of accommodating golden finger 40, therefore the sectional dimension of probe bodies 301 is larger than the insertion section 401 of golden finger 40, the second accommodating cavity 306 in probe bodies 301 is contained in addition due to needle handle 3032 and shank 3031, when the sectional dimension of probe bodies 301 increases, the sectional dimension of needle handle 3032 and shank 3031 also can correspondingly be done greatly, thus the structural strength of test probe 30 can be improved, and increase the magnitude of current that can flow through shank 3031, thus can further improve measuring accuracy.
And please continue see Fig. 1 to Figure 10, be provided with at least two protuberances inwardly extruding probe bodies 301 and formation in the first accommodating cavity 305, at least two protuberances are used for gripping golden finger 40.Wherein this protuberance can be annular protrusion 304 and point-like protuberance 307, wherein annular protrusion 304 be the first support portion 304, support portion 304, first except play support elastic component 302 effect except can also grip the insertion section 401 of golden finger 40.
Owing to only the first accommodating cavity 306 of probe bodies 301 need be planted with golden finger 40, the assembling of test probe assembly can be completed, and after having assembled, due to the effect of cascaded surface 403 and protuberance, can test probe be gripped, the test probe assembly that therefore the utility model provides have assembling simply, firmly advantage.
The utility model embodiment also provides the kind embodiment of test platform, specifically can see Figure 10, Figure 10 is the structural representation of a kind of test platform first of the utility model embodiment, as shown in Figure 10, test platform comprises signal deteching circuit plate 50, test probe 30, golden finger 40, needle plate 60, support plate 80 and circuit board under test 70, golden finger 40 is fixed on signal deteching circuit plate 50, signal deteching circuit plate 50 is fixedly installed on needle plate 60, needle plate 60 is provided with through hole 601, test probe 30 comprises probe bodies 301 and probe 303, one end of probe bodies 301 is hollow design, and then carry out patching coordinating with golden finger 40, test probe 30 places and part protrudes from through hole 601, circuit board under test 70 is arranged on the side of relative test probe 30 on support plate 80, probe 303 is arranged on the other end of probe bodies 301, needle plate 60 moves relative to support plate 80, probe 303 is connected with the test point on circuit board under test 70, thus set up between signal deteching circuit plate 50 with circuit board under test 70 and be electrically connected.
In the present embodiment, fluid pressure drive device specifically can be adopted to drive needle plate 60 to move relative to support plate 80, certainly, in those skilled in the art's scope to understand, can adopt as other the type of drive such as stepper motor, the utility model does not do concrete restriction to this yet.
Preferably, in the utility model embodiment, cone shape can be arranged in one end that shank 3031 is contrary with needle handle 3032 direction, so that contact with the test point on circuit board under test 70, it should be noted that, in alternate embodiment of the present utility model, other shapes matched with the test point on circuit board under test 70 also can be arranged in one end that shank 3031 is contrary with needle handle 3032 direction.
Further, refer to Figure 11, Figure 11 is the structural representation of a kind of test platform second of the utility model embodiment, compared with test platform first embodiment, the test platform of the present embodiment comprises equipment and instrument 90 further, signal deteching circuit plate 50 is provided with interface 501, equipment and instrument 90 is connected with signal deteching circuit plate 50 by connecting line 902, wherein connecting line 902 is connected with the interface 502 of signal deteching circuit plate 50 with equipment and instrument interface 901 respectively, input can be carried out to the test point of circuit board under test 70 to make equipment and instrument 90, for example, equipment and instrument 90 can be oscillograph, the equipment such as terminal.
It should be noted that the test probe 30 that adopts in the utility model test platform first and second embodiment and golden finger 40 specifically can adopt Fig. 1 to Fig. 7 above and corresponding describe described in test probe 30 and golden finger 40, do not repeat in this.
The utility model golden finger that embodiment discloses 40 is fixed on signal deteching circuit plate 50 by welding manner, specifically as shown in Figure 10 and Figure 11, can the fixed part 402 of golden finger 40 be inserted on the jack 501 of signal deteching circuit plate 50, and be welded and fixed relative on the surface of test probe 30 on signal deteching circuit plate 50, the golden finger 40 disclosed due to the utility model embodiment comprises the insertion section 401 and fixed part 402 that opposite end connects, it is strip setting, therefore inner thus cause the problem of plant test probe 30 precision deficiency thereon to occur without the need to worrying that scolding tin infiltrates golden finger 40 when welding.
Therefore, by above-mentioned disclosure, the utility model embodiment provides a kind of test probe, test probe assembly and test platform, golden finger is received by the first accommodating cavity of probe bodies, and then carry out patching coordinating with golden finger, thus more difficult to solve current probe assembling, higher to the processing request of through hole, and the unstable technical matters that powers on.
The foregoing is only embodiment of the present utility model; not thereby the scope of the claims of the present utility model is limited; every utilize the utility model instructions and accompanying drawing content to do equivalent structure or equivalent flow process conversion; or be directly or indirectly used in other relevant technical fields, be all in like manner included in scope of patent protection of the present utility model.
Claims (9)
1. a test probe, it is characterized in that, described test probe comprises probe bodies, elastic component and probe, wherein said probe bodies is axially provided with cavity along it, the inwall of described probe bodies is provided with the first support portion, described cavity is separated into the first accommodating cavity and the second accommodating cavity that are communicated with the two ends of described probe bodies respectively by described first support portion, golden finger inserts described first accommodating cavity, described elastic component is arranged in described second accommodating cavity and one end of described elastic component is supported on described first support portion, described end of probe divides and is arranged in described second accommodating cavity, and be supported on the other end of described elastic component.
2. test probe according to claim 1, is characterized in that, be provided with the inside described probe bodies of extruding in described first accommodating cavity and at least two protuberances being formed, described at least two protuberances are used for gripping described golden finger.
3. test probe according to claim 1, is characterized in that, described probe can make described elastic component shrink under the thrust of its axis, thus makes the contraction in length of described test probe.
4. test probe according to claim 1, is characterized in that, described first support portion be inwardly the first flange of being formed of the described probe bodies of extruding or be formed at described probe bodies inwall on staircase structure.
5. test probe according to claim 1, it is characterized in that, described probe comprises shank and is arranged at the needle handle of described shank one end, the sectional dimension of wherein said needle handle is greater than the sectional dimension of described shank, described needle handle is arranged in described second accommodating cavity, the inwall of described probe bodies is provided with the second support portion, and described second support portion is used for described needle handle to be limited in described second accommodating cavity.
6. test probe according to claim 5, is characterized in that, described second support portion is the second flange that the described probe bodies of inside extruding is formed.
7. test probe according to claim 5, is characterized in that, described elastic component is metal spring.
8. test probe according to claim 7, it is characterized in that, the axial length of described first accommodating cavity is set to the intubating length being less than described golden finger, makes one end of described golden finger insert described second accommodating cavity and contact with the metal spring in described second accommodating cavity.
9. test probe according to claim 1, it is characterized in that, described golden finger comprises insertion section and the fixed part of opposite end connection, the sectional dimension of described fixed part is greater than the sectional dimension of described insertion section, and then forming cascaded surface in the junction of described insertion section and described fixed part, one end of described probe bodies is supported on described cascaded surface.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420275737.XU CN204101604U (en) | 2014-05-27 | 2014-05-27 | A kind of test probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420275737.XU CN204101604U (en) | 2014-05-27 | 2014-05-27 | A kind of test probe |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204101604U true CN204101604U (en) | 2015-01-14 |
Family
ID=52270022
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420275737.XU Expired - Fee Related CN204101604U (en) | 2014-05-27 | 2014-05-27 | A kind of test probe |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204101604U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017156779A1 (en) * | 2016-03-18 | 2017-09-21 | 深圳市艾励美特科技有限公司 | Test probe of detection apparatus |
-
2014
- 2014-05-27 CN CN201420275737.XU patent/CN204101604U/en not_active Expired - Fee Related
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2017156779A1 (en) * | 2016-03-18 | 2017-09-21 | 深圳市艾励美特科技有限公司 | Test probe of detection apparatus |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN201204261Y (en) | Thorn-holding type electronic connector | |
| US9791473B2 (en) | Test probe, test probe component and test platform | |
| CN204188665U (en) | A kind of test probe assembly | |
| CN204330832U (en) | A kind of test probe assembly | |
| DE202018104803U1 (en) | Direct connector for a lamp base and a light source driver board and LED light using the direct connector | |
| CN204101604U (en) | A kind of test probe | |
| EP2800168B1 (en) | Battery system and method for producing an electroconductive connection between a cell connector and an electronics unit of a battery system | |
| CN205104640U (en) | Terminal assembly | |
| CN203930000U (en) | A kind of test platform | |
| CN204725063U (en) | Ensure the welding tooling of cable and main body axiality | |
| TWM456602U (en) | Large-current electrical connector | |
| CN209981643U (en) | Charging detection resistor integrated structure for direct current charging socket | |
| CN207490145U (en) | A kind of combined type wiring female terminal | |
| CN203760794U (en) | Adjustable phase coaxial connector | |
| CN203423334U (en) | MICRO USB male joint with printed circuit board | |
| CN202855997U (en) | Board to board connector | |
| CN207800955U (en) | A kind of double-row terminal welding adapter of electric connector | |
| CN112164953B (en) | Crimping locator | |
| CN208690576U (en) | A kind of BMS plate terminal adapter and BMS controller | |
| CN104283024B (en) | A kind of soldering-free connector and manufacture method thereof | |
| CN208508008U (en) | A kind of termination for connection line | |
| CN114156667B (en) | Novel grounding structure of binding post | |
| CN218940056U (en) | Multi-needle collecting and inserting electric connector | |
| CN213749999U (en) | Semiconductor device testing device and bus bar structure | |
| CN216900333U (en) | Right-angle joint for material testing |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20160905 Address after: 518110 Guangdong Province, Shenzhen city Longhua District Guanlan street Zhangkeng diameter Wai Industrial Zone Road No. 14 Ai Li Emmett Industrial Park Patentee after: SHENZHEN ULMT TECHNOLOGY CO., LTD. Address before: 518000 Guangdong Province, Shenzhen city Longhua District Guanlan pit community view Yick Road No. 5 building, 1 Delux factory building 1-4 Patentee before: Shenzhen Ce-Way Technology Co., Ltd. |
|
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150114 Termination date: 20210527 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |