CN108133733A - Flash memory particle test classification workbench - Google Patents
Flash memory particle test classification workbench Download PDFInfo
- Publication number
- CN108133733A CN108133733A CN201810166000.7A CN201810166000A CN108133733A CN 108133733 A CN108133733 A CN 108133733A CN 201810166000 A CN201810166000 A CN 201810166000A CN 108133733 A CN108133733 A CN 108133733A
- Authority
- CN
- China
- Prior art keywords
- flash memory
- test
- ladder
- workbench
- memory particle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 69
- 239000002245 particle Substances 0.000 title claims abstract description 25
- 238000005259 measurement Methods 0.000 claims abstract description 15
- 206010016256 fatigue Diseases 0.000 description 3
- 238000013024 troubleshooting Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Abstract
The invention discloses a kind of flash memory particle test classify workbench, including：Surface goes to upper and lower the test desk of two layers of ladder；At least one testing jig being removably attached on lower floor's ladder of the test desk；It is removably attached on the testing jig, and at least one measurement jig for loading multiple flash memory particles.The present invention effectively improves testing efficiency.
Description
Technical field
The present invention relates to flash memory particles（NAND Flash）Testing field more particularly to the classification work of flash memory particle test
Platform.
Background technology
Flash memory particle, generally using the testing classification workbench arbitrarily made, is only closed when needing to do category filter
Whether note can tested, and degree of convenience/exception is picked and placeed without working efficiency/fatigue strength/product from tester
Timeliness of troubleshooting etc. is considered.Flow of personnel rate height/fatiguability/product access position is bad and causes can be caused in this way
The unusual conditions such as pin deforms and the time of troubleshooting is longer.
Invention content
The purpose of the present invention is to provide a kind of flash memory particle test classification workbench, effectively improve testing efficiency.
Realizing the technical solution of above-mentioned purpose is：
A kind of flash memory particle test classification workbench, including：
Surface goes to upper and lower the test desk of two layers of ladder；
At least one testing jig being removably attached on lower floor's ladder of the test desk；And
It is removably attached on the testing jig, and at least one measurement jig for loading multiple flash memory particles.
Preferably, the surface of the testing jig is in three layers of ladder of upper, middle and lower-ranking, and one is removably secured on each ladder
The measurement jig.
Preferably, the test desk includes：
Go to upper and lower the desktop of two layers of ladder；
Support four test desk stents of desktop bottom surface quadrangle；And
The rear baffle being fixed on vertically on rear side of the desktop.
Preferably, it further includes：It is fixed on the upper strata ladder of the test desk, is electrically connected measurement jig, and for testing
An at least test computer for each flash memory particle；
The test computer includes：
The host being placed in below the test desk；
It is fixed on above the rear baffle, and is electrically connected the display screen of the host；
The rear baffle front is closely fixed on, and is electrically connected the keyboard of the host；And
The upper strata stepped surfaces of the test desk are placed in, and are electrically connected the mouse of the host.
Preferably, the power supply to the test computer and measurement jig power supply is further included.
The beneficial effects of the invention are as follows：The present invention is designed by stepped test desk and testing jig, coupled computer position
The reasonable Arrangement put can effectively reduce the fatigue strength of personnel, facilitate particle access, avoid batch mixing, so as to effectively improve test
Efficiency and accuracy.
Description of the drawings
Fig. 1 is the stereogram of the flash memory particle test classification workbench of the present invention；
Fig. 2 is the connection structure diagram of the flash memory particle test classification workbench of the present invention.
Specific embodiment
The present invention will be further described with reference to the accompanying drawings.
It please refers to Fig.1 and Fig. 2, flash memory particle test of the invention classification workbench, including test desk 1, at least one survey
Try frame 2, at least one measurement jig 3 and an at least test computer 4.
Test desk 1 includes：Go to upper and lower the desktop of two layers of ladder；Four test desk stents 11 of supporting desktop bottom surface quadrangle；
The vertical rear baffle 12 being fixed on rear side of desktop.
Testing jig 2 is removably attached on lower floor's ladder of test desk 1.The surface of testing jig 2 is in three layers of upper, middle and lower-ranking
Ladder is removably secured a measurement jig 3 on each ladder.Measurement jig 3 is used to load multiple flash memory particles.Tester
Calculation machine 4 is fixed on the upper strata ladder of test desk 1, is electrically connected measurement jig 3, is loaded with the calculating for testing each flash memory particle
Machine program.Measurement jig 3 and test computer 4 connect power supply.
Test computer 4 generally comprises：The host being placed in below test desk 1；12 top of rear baffle is fixed on, and is electrically connected
The display screen of host；12 front of rear baffle is closely fixed on, and is electrically connected the keyboard of host；It is placed in the upper strata rank of test desk 1
Terraced surface, and it is electrically connected the mouse of host.By this arrangement, the effectively save space of energy, while facilitate storage and flash memory of taking
Particle reduces the possibility of batch mixing.And coordinate stair-stepping test desk 1 and testing jig 2, ensure tester's to the maximum extent
Operation comfort level.
Meanwhile host, display screen, keyboard, mouse, test desk, the dimensions of testing jig and measurement jig and each
From modes of emplacement it is consistent, convenient for replace.
Above example is used for illustrative purposes only rather than limitation of the present invention, the technology people in relation to technical field
Member, without departing from the spirit and scope of the present invention, can also make various transformation or modification, therefore all equivalent
Technical solution should also belong to scope of the invention, should be limited by each claim.
Claims (5)
- The workbench 1. a kind of flash memory particle test is classified, which is characterized in that including：Surface goes to upper and lower the test desk of two layers of ladder；At least one testing jig being removably attached on lower floor's ladder of the test desk；AndIt is removably attached on the testing jig, and at least one measurement jig for loading multiple flash memory particles.
- The workbench 2. flash memory particle test according to claim 1 is classified, which is characterized in that the surface of the testing jig is in Upper, middle and lower-ranking ladder is removably secured a measurement jig on each ladder.
- The workbench 3. flash memory particle test according to claim 1 is classified, which is characterized in that the test desk includes：Go to upper and lower the desktop of two layers of ladder；Support four test desk stents of desktop bottom surface quadrangle；AndThe rear baffle being fixed on vertically on rear side of the desktop.
- The workbench 4. flash memory particle test according to claim 3 is classified, which is characterized in that further include：It is fixed on described On the upper strata ladder of test desk, it is electrically connected measurement jig, and at least test computer for testing each flash memory particle；The test computer includes：The host being placed in below the test desk；It is fixed on above the rear baffle, and is electrically connected the display screen of the host；The rear baffle front is closely fixed on, and is electrically connected the keyboard of the host；AndThe upper strata stepped surfaces of the test desk are placed in, and are electrically connected the mouse of the host.
- The workbench 5. flash memory particle test according to claim 4 is classified, which is characterized in that further include to the tester Calculation machine and the power supply of measurement jig power supply.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810166000.7A CN108133733A (en) | 2018-02-28 | 2018-02-28 | Flash memory particle test classification workbench |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810166000.7A CN108133733A (en) | 2018-02-28 | 2018-02-28 | Flash memory particle test classification workbench |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108133733A true CN108133733A (en) | 2018-06-08 |
Family
ID=62431121
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810166000.7A Pending CN108133733A (en) | 2018-02-28 | 2018-02-28 | Flash memory particle test classification workbench |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108133733A (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1641344A (en) * | 2004-01-05 | 2005-07-20 | 英业达股份有限公司 | Framework for measuring regulating tool |
| CN204065281U (en) * | 2014-08-22 | 2014-12-31 | 国电南瑞科技股份有限公司 | Transportable test panel platform |
| CN104680771A (en) * | 2015-03-20 | 2015-06-03 | 蒋海兵 | Device and method for testing infrared remote controller |
| CN204721357U (en) * | 2015-05-20 | 2015-10-21 | 深圳极智联合科技股份有限公司 | The multimachine measurement jig of optical network unit product |
| CN206161683U (en) * | 2016-10-14 | 2017-05-10 | 太仓市何氏电路板有限公司 | Strong adaptability's circuit board short circuit test platform |
| CN206930749U (en) * | 2017-07-04 | 2018-01-26 | 厦门亿加凌电子有限公司 | A kind of PCBA automatic detection systems |
-
2018
- 2018-02-28 CN CN201810166000.7A patent/CN108133733A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1641344A (en) * | 2004-01-05 | 2005-07-20 | 英业达股份有限公司 | Framework for measuring regulating tool |
| CN204065281U (en) * | 2014-08-22 | 2014-12-31 | 国电南瑞科技股份有限公司 | Transportable test panel platform |
| CN104680771A (en) * | 2015-03-20 | 2015-06-03 | 蒋海兵 | Device and method for testing infrared remote controller |
| CN204721357U (en) * | 2015-05-20 | 2015-10-21 | 深圳极智联合科技股份有限公司 | The multimachine measurement jig of optical network unit product |
| CN206161683U (en) * | 2016-10-14 | 2017-05-10 | 太仓市何氏电路板有限公司 | Strong adaptability's circuit board short circuit test platform |
| CN206930749U (en) * | 2017-07-04 | 2018-01-26 | 厦门亿加凌电子有限公司 | A kind of PCBA automatic detection systems |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180608 |