CN108121626A - A kind of server high/low temperature reliability automatization test system and method - Google Patents

A kind of server high/low temperature reliability automatization test system and method Download PDF

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Publication number
CN108121626A
CN108121626A CN201711318187.XA CN201711318187A CN108121626A CN 108121626 A CN108121626 A CN 108121626A CN 201711318187 A CN201711318187 A CN 201711318187A CN 108121626 A CN108121626 A CN 108121626A
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CN
China
Prior art keywords
server
temperature
tested
reliability
low temperature
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711318187.XA
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Chinese (zh)
Inventor
马壮
高鹏
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Zhengzhou Yunhai Information Technology Co Ltd
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Zhengzhou Yunhai Information Technology Co Ltd
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Priority to CN201711318187.XA priority Critical patent/CN108121626A/en
Publication of CN108121626A publication Critical patent/CN108121626A/en
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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2273—Test methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268—Logging of test results

Abstract

The invention discloses a kind of server high/low temperature reliability automatization test system and methods, belong to server technical field of measurement and test.The server high/low temperature reliability automatization test system of the present invention includes high-temperature cabinet and compression module, further includes thermograph module and sensor temperature logging modle；High-temperature cabinet realizes automation heating and cooling；Compression module realizes automation pressurization；Thermograph module is used to record the temperature information of critical piece in server to be tested, and compared with critical piece specification temperature；Sensor temperature logging modle is used to record the temperature information of critical piece sensor in server to be tested, and compared with the specification temperature of critical piece sensor.The server high/low temperature reliability automatization test system of the invention can periodically carry out system applied voltage test, and record test data automatically, accelerate reliability temperature validation test progress, so as to greatly improve work efficiency, have good application value.

Description

A kind of server high/low temperature reliability automatization test system and method
Technical field
The present invention relates to server technical field of measurement and test, specifically provide a kind of server high/low temperature reliability automatic test System and method.
Background technology
It is wet to include the test of high/low temperature Alternate hot and humid, high/low temperature switching on and shutting down and alternation for the reliability temperature test of server at present Heat storage etc. has become the most important thing of reliability test work.During product test, how preferably to analyze and remember Record problem is the important content in test.Reliability temperature test is frequently necessary to manual observation and record data, and cuts manually Test pressure script is changed, so tester's Real Time Observation record test result and operation machine are frequently necessary to, when test occurs During problem, it is often necessary to carry out that manual queries are log grades pervious, but the information of log grades of records are not comprehensive, and tester can not do Go out comprehensive judgement, can only judge by experience, add the reliability test time, reduce work efficiency.
The content of the invention
The technical assignment of the present invention is that in view of the above problems, system pressurization survey can periodically be carried out by providing one kind Examination, and test data is recorded automatically, accelerate reliability temperature validation test progress, so as to greatly improve the server of work efficiency High/low temperature reliability automatization test system.
Further technical assignment of the invention is to provide a kind of server high/low temperature reliability automated testing method.
To achieve the above object, the present invention provides following technical solutions：
A kind of server high/low temperature reliability automatization test system, including high-temperature cabinet and compression module, further includes temperature Logging modle；
Wherein, the high-temperature cabinet realizes that automation heating and cooling, server to be tested are positioned in high-temperature cabinet environment；
The compression module is arranged in server to be tested, realizes that the automation of server pressurization software to be tested adds Pressure；
Thermograph module is arranged in server to be tested, for recording the temperature of critical piece in server to be tested Information, the temperature information of critical piece sensor and log information.
By the temperature information of critical piece that records in server to be tested compared with critical piece specification temperature, Reliability is judged with this.By the temperature information for recording critical piece sensor in server to be tested, and with it is main The specification temperature of component sensors compares, and judges reliability with this.Server to be tested is confirmed by the log information High/low temperature reliability.
When the temperature of any critical piece is more than critical piece specification temperature, reliability test does not pass through.
The automation applied voltage test of test software and the automation liter of high-temperature cabinet can be realized by the automatization test system Mild cooling, and then can realize the automatic test of entire reliability test, and realize high/low temperature Reliability Test Data Automation record.
Preferably, the run time of the setting each temperature of high-temperature cabinet, realizes high-temperature cabinet automation heating and cooling.
Preferably, the compression module realizes that the automation of pressurization software is pressurizeed by testtool.sh scripts, setting It is the applied voltage test time, corresponding with high-temperature cabinet temperature run time.
The follow-up pressure testing of the softwares such as ptu/FIO/nvqual can be realized in testtool.sh scripts.
The operation code of the testtool.sh scripts is as follows：
#！/bin/sh
service ipmi start
#/root/ptumon>>xx.$$ &
./root/ptugen-ct 2-p 100
sleep 18000
killall ptugen
sleep 1000
./fio.sh
sleep 18000
killall fio
sleep 1000
./root/nvqual
sleep 18000
Preferably, bonding thermocouple wire to critical piece chip, turn RS32 cables by data collector with treating using serial ports Test server is connected, and realizes that thermocouple wire records the temperature information of critical piece automatically.
Critical piece chip bonds thermocouple wire, and when maximizing test for judging to radiate, the surface of critical piece chip is real Whether border temperature meets part specification temperature, if these any test datas are more than the temperature profile of component, reliability test Do not pass through.
Reliability temperature test may be employed data collector and carry out test record when recording intake air temperature data, But automation record can not be realized by this kind of instrument, turn RS32 cables by data collector and service to be tested using serial ports Device is connected, it is ensured that the automation record of thermocouple wire data.And the drive of logging software and integral instrument is compiled by labview It is dynamic.When recording thermocouple wire data, time, such as half an hour record data can be recorded with sets itself, finally with Excel lattice Formula outputs test data.
Preferably, the thermograph module realizes automatic recording-member sensor temperature information by cat.sh scripts And log information.
The function is realized using cat.sh scripts, can finally be exported with the file of Excel forms.
The operation code of the cat.sh scripts script is as follows：
#！/bin/sh
service ipmi start
#/root/ptumon>>xx.$$ &
sleep 2
echo
Hostname,Time,CPU0_Temp,CPU1_Temp,CPU0_Power,CPU1_Power,CPU0_FREQ, CPU1_FREQ,CPU0_U-FREQ,CPU1_U-FREQ,FAN1,FAN2,FAN3,FAN4,Inlet_Temp
while true
do
Hostname=`hostname`
Time=`date`
#Inlet_Temp=`ipmitool raw 0x04 0x2d 0x03 | awk'{ print strtonum (" 0x " $ 1)}'`
#cpu0_tmp=`cat xx. $ $ | tail-n 6 | awk'{ print $ 9 } ' | grep-v TEMP | head-n1`
#cpu1_tmp=`cat xx. $ $ | tail-n 4 | awk'{ print $ 9 } ' | grep-v TEMP | head-n 1`
#cpu0_power=`cat xx. $ $ | tail-n 6 | awk'{ print $ 11 } ' | grep-v POWER | head-n 1`
#cpu1_power=`cat xx. $ $ | tail-n 4 | awk'{ print $ 11 } ' | grep-v POWER | head-n 1`
#cpu0_freq=`cat xx. $ $ | tail-n 6 | awk'{ print $ 5 } ' | grep-v FREQ | head-n1`
#cpu1_freq=`cat xx. $ $ | tail-n 4 | awk'{ print $ 5 } ' | grep-v FREQ | head-n1`
#cpu0_u_freq=`cat xx. $ $ | tail-n 6 | awk'{ print $ 6 } ' | grep-v U-FREQ | head-n 1`
#cpu1_u_freq=`cat xx. $ $ | tail-n 4 | awk'{ print $ 6 } ' | grep-v U-FREQ | head-n 1`
Hda=`smartctl-a/dev/sda | tail-n 33 | awk'{ print $ 10 } ' | head-n 1`
Hdb=`smartctl-a/dev/sdb | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdc=`smartctl-a/dev/sdc | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdd=`smartctl-a/dev/sdd | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hde=`smartctl-a/dev/sde | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdf=`smartctl-a/dev/sdf | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdg=`smartctl-a/dev/sdg | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdh=`smartctl-a/dev/sdh | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdi=`smartctl-a/dev/sdi | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdj=`smartctl-a/dev/sdj | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdk=`smartctl-a/dev/sdk | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdl=`smartctl-a/dev/sdl | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdm=`smartctl-a/dev/sdm | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdn=`smartctl-a/dev/sdn | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdo=`smartctl-a/dev/sdo | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdp=`smartctl-a/dev/sdp | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdq=`smartctl-a/dev/sdq | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdr=`smartctl-a/dev/sdr | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hds=`smartctl-a/dev/sds | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdt=`smartctl-a/dev/sdt | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdu=`smartctl-a/dev/sdu | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdv=`smartctl-a/dev/sdv | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdw=`smartctl-a/dev/sdw | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdx=`smartctl-a/dev/sdx | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdy=`smartctl-a/dev/sdy | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdz=`smartctl-a/dev/sdz | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdaa=`smartctl-a/dev/sdaa | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdab=`smartctl-a/dev/sdab | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdac=`smartctl-a/dev/sdac | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdad=`smartctl-a/dev/sdad | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdae=`smartctl-a/dev/sdae | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdaf=`smartctl-a/dev/sdaf | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdag=`smartctl-a/dev/sdag | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdah=`smartctl-a/dev/sdah | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdai=`smartctl-a/dev/sdai | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdaj=`smartctl-a/dev/sdaj | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdak=`smartctl-a/dev/sdak | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdal=`smartctl-a/dev/sdal | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Hdam=`smartctl-a/dev/sdam | tail-n 27 | awk'{ print $ 10 } ' | head-n 1`
Inlet_Temp=`ipmitool sdr | grep Inlet_Temp | awk'{ print $ 3 } ' `
FAN0=`ipmitool sdr | grep FAN_0 | awk'{ print $ 3 } ' `
FAN1=`ipmitool sdr | grep FAN_1 | awk'{ print $ 3 } ' `
FAN2=`ipmitool sdr | grep FAN_2 | awk'{ print $ 3 } ' `
CPU0_Temp=`ipmitool sdr | grep CPU0_Temp | awk'{ print $ 3 } ' `
CPU1_Temp=`ipmitool sdr | grep CPU1_Temp | awk'{ print $ 3 } ' `
Raid_Temp=`ipmitool sdr | grep Raid_Temp | awk'{ print $ 3 } ' `
GPU_Temp=`ipmitool sdr | grep GPU_Temp | awk'{ print $ 3 } ' `
echo
$Hostname,$Time,$CPU0_tmp,,$CPU1_tmp,$FAN1,$FAN2,$FAN3,$FAN4,$Inlet_ Temp,,$hda,$hdb,$hdc,$hdd,$hde,$hdf,$hdh,$hdi,$hdj,$hdk,$hdl,$hdm,$hdn,$hdo,$ hdp,$hdq,$hdr,$hds,$hdt,$hdu,$hdv,$hdw,$hdx,$hdy,$hdz,$hdaa,$hdab,$hdac,$ hdad,$hdae,$hdaf,$hdag,$hdah,$hdai,$hdaj,$hdak,$hdal,$Raid_Temp,$GPU_Temp
sleep 2
done
Preferably, 34970A softwares are run in the data collector carries out temperature information record.
Preferably, the critical piece includes CPU, memory, raid card, hard disk, CPU VR, PCH, network interface card.
When recording the temperature information of critical piece sensor, memory, CPU and raid card sensor temperature information, Ke Yitong BMC in server to be tested is crossed to directly read, but as the temperature information of hard disk sensor etc. needs to be read with special tool command It takes, as hard disk smart temperature is read in the smartctl orders carried under linux.
A kind of server high/low temperature reliability automated testing method, in the automated testing method, using thermograph Module cooperation automation heating and the high-temperature cabinet of cooling and automation compression module, realize the automation of high/low temperature reliability test And the automation record of test data.
Preferably, the automated testing method specifically includes following steps：
S1：Prepare server to be tested, data collector and high-temperature cabinet；
S2：Serial Port Line is connected into data collector and server to be tested, ensures that connection is good；
S3：34970A softwares are opened, run data collector, check the correctness of thermocouple wire, carrying out original records ensures All passage normal recordings, and the record time of data acquisition is set, it realizes and records in real time automatically in server to be tested mainly The temperature information of component；
S4：Cat.sh scripts are copied into server to be tested, realizes and records in real time automatically in server to be tested mainly The sensor temperature information of component and log information；
S5：Testtool.sh scripts are copied into server to be tested, confirm compression module energy follow-up pressure testing, and Set the applied voltage test time；
S6：The program of high-temperature cabinet is set, the gradient of temperature time of automatic running is set, and adds with what is set in step S4 It presses the testing time corresponding, server to be tested is positioned in high-temperature cabinet environment；
S7：Confirm it is errorless after, operation high-temperature cabinet, 34970A softwares, testtool.sh scripts and cat.sh scripts are realized Automatic test；
S8：After test, check the log information of server generation to be tested, confirm that server high/low temperature to be tested can By property.
In operation high-temperature cabinet, 34970A softwares, testtool.sh scripts and cat.sh scripts, automatic test is realized Preceding half an hour checks whether data are correct, if there is no problem, then can be with automatic running.
Compared with prior art, server high/low temperature reliability automated testing method of the invention has following prominent Advantageous effect：The server high/low temperature reliability automated testing method utilizes automatic lifting temperature, the test software of high-temperature cabinet Automation pressurization, without human intervention, not only can utilize free time in the evening realize automatic test, greatly save daily Testing time improves testing efficiency, accelerates product development cycle, and can record test data in real time, after going wrong, The basic reason to go wrong can be judged according to the log information recorded in real time, there is good application value.
Description of the drawings
Fig. 1 is the flow chart of server high/low temperature reliability automated testing method of the present invention.
Specific embodiment
Below in conjunction with drawings and examples, server high/low temperature reliability automatization test system and side to the present invention Method is described in further detail.
Embodiment 1
The server high/low temperature reliability automatization test system of the present invention, by high-temperature cabinet, compression module, thermograph mould Block is formed.
High-temperature cabinet can realize automation heating and cooling.As shown in table 1 below in test process, setting high-temperature cabinet is each warm The run time of degree realizes high-temperature cabinet automation heating and cooling.
The run time of each temperature of 1 high-temperature cabinet of table
Temperature (DEG C) Humidity Time (h)
25 50% 2
40 50% 2
40 90% 2
40 90% 16
40 10% 2
40 10% 16
0 10% 2
0 10% 16
25 10% 2
25 10% 2
Compression module realizes that the automation of server pressurization software to be tested is pressurizeed by testtool.sh scripts, setting It is the applied voltage test time, corresponding with high-temperature cabinet temperature run time.
Thermograph module is used to record the temperature information of critical piece in server to be tested, critical piece sensor Temperature information and log information.Critical piece includes CPU, memory, raid card, hard disk, CPU VR, PCH, network interface card etc..
First to critical piece bond thermocouple wire, using serial ports turn RS32 cables by 34970A data collectors with it is to be tested Server is connected, and realizes that thermocouple wire records the temperature information of critical piece automatically.Thermograph module passes through cat.sh scripts Realize automatic recording-member sensor temperature information and log information.
Embodiment 2
The server high/low temperature reliability automated testing method of the present invention, in the automated testing method, thermograph Module cooperation automation heating and the high-temperature cabinet of cooling and automation compression module, realize the automation of high/low temperature reliability test And the automation record of test data.
As shown in Figure 1, the automated testing method specifically includes following steps：
S1：Prepare server to be tested, data collector and high-temperature cabinet.
S2：Serial ports is turned into RS32 cables connection 34970A data collectors and server to be tested, ensures that connection is good.
S3：34970A softwares are opened, run data collector, check the correctness of thermocouple wire, carrying out original records ensures All passage normal recordings, and the record time of data acquisition is set, it realizes and records in real time automatically in server to be tested mainly The temperature information of component.
S4：Cat.sh scripts are copied into server to be tested, realizes and records in real time automatically in server to be tested mainly The sensor temperature information of component and log information.
S5：Testtool.sh scripts are copied into server to be tested, confirm compression module energy follow-up pressure testing, and Set the applied voltage test time.
S6：The program of high-temperature cabinet is set, the gradient of temperature time of automatic running is set, and adds with what is set in step S4 It presses the testing time corresponding, server to be tested is positioned in high-temperature cabinet environment.
S7：Confirm it is errorless after, operation high-temperature cabinet, 34970A softwares, testtool.sh scripts and cat.sh scripts are realized Automatic test checks whether data correct in preceding half an hour, if there is no problem, then can allow high-temperature cabinet, 34970A softwares, Testtool.sh scripts and cat.sh script automatic runnings realize reliability test automation function.
S8：After test, check the log information of server generation to be tested, confirm that server high/low temperature to be tested can By property.
Embodiment described above is the present invention more preferably specific embodiment, and those skilled in the art is at this The usual variations and alternatives carried out in the range of inventive technique scheme should all include within the scope of the present invention.

Claims (9)

1. a kind of server high/low temperature reliability automatization test system, including high-temperature cabinet and compression module, it is characterised in that：Also Including thermograph module；
Wherein, the high-temperature cabinet realizes that automation heating and cooling, server to be tested are positioned in high-temperature cabinet environment；
The compression module is arranged in server to be tested, realizes the automation pressurization of server pressurization software to be tested；
Thermograph module is arranged in server to be tested, for recording the temperature of critical piece in server to be tested letter Breath, the temperature information of critical piece sensor and log information.
2. server high/low temperature reliability automatization test system according to claim 1, it is characterised in that：Set high temperature The run time of each temperature of case realizes high-temperature cabinet automation heating and cooling.
3. server high/low temperature reliability automatization test system according to claim 1 or 2, it is characterised in that：It is described Compression module realizes that the automation of pressurization software is pressurizeed by testtool.sh scripts, the applied voltage test time is set, with high-temperature cabinet Temperature run time is corresponding.
4. server high/low temperature reliability automatization test system according to claim 3, it is characterised in that：To main portion Part chip bonds thermocouple wire, turns RS32 cables using serial ports and data collector is connected with server to be tested, realizes thermocouple Line records the temperature information of critical piece automatically.
5. server high/low temperature reliability automatization test system according to claim 4, it is characterised in that：The temperature Logging modle realizes automatic recording-member sensor temperature information and log information by cat.sh scripts.
6. server high/low temperature reliability automatization test system according to claim 5, it is characterised in that：The data 34970A softwares are run in collector and carry out temperature information record.
7. server high/low temperature reliability automatization test system according to claim 6, it is characterised in that：It is described main Component includes CPU, memory, raid card, hard disk, CPU VR, PCH, network interface card.
8. a kind of server high/low temperature reliability automated testing method, it is characterised in that：In the automated testing method, use The cooperation automation heating of thermograph module and the high-temperature cabinet of cooling and automation compression module, realize high/low temperature reliability test Automation and test data automation record.
9. server high/low temperature reliability automated testing method according to claim 8, it is characterised in that：The automation Test method specifically includes following steps：
S1：Prepare server to be tested, data collector and high-temperature cabinet；
S2：Serial Port Line is connected into data collector and server to be tested, ensures that connection is good；
S3：34970A softwares are opened, run data collector, check the correctness of thermocouple wire, carrying out original records ensures own Passage normal recordings, and the record time of data acquisition is set, realization records critical piece in server to be tested in real time automatically Temperature information；
S4：Cat.sh scripts are copied into server to be tested, realization records critical piece in server to be tested in real time automatically Sensor temperature information and log information；
S5：Testtool.sh scripts are copied into server to be tested, compression module energy follow-up pressure testing is confirmed, and sets The good applied voltage test time；
S6：The program of high-temperature cabinet is set, sets the gradient of temperature time of automatic running, and the pressurization with being set in step S4 is surveyed The examination time is corresponding, and server to be tested is positioned in high-temperature cabinet environment；
S7：Confirm it is errorless after, operation high-temperature cabinet, 34970A softwares, testtool.sh scripts and cat.sh scripts are realized automatic Change test；
S8：After test, check the log information of server generation to be tested, confirm server high/low temperature reliability to be tested.
CN201711318187.XA 2017-12-12 2017-12-12 A kind of server high/low temperature reliability automatization test system and method Pending CN108121626A (en)

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CN109165128A (en) * 2018-08-31 2019-01-08 郑州云海信息技术有限公司 A kind of method, system and the equipment of heat dissipation test data record
CN109390031A (en) * 2018-10-23 2019-02-26 江苏华存电子科技有限公司 A kind of semiconductor memory product high temperature ageing test method
CN109491847A (en) * 2018-11-07 2019-03-19 郑州云海信息技术有限公司 A kind of server high/low temperature method for testing reliability and device
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CN113326167A (en) * 2021-05-13 2021-08-31 山东英信计算机技术有限公司 Constant temperature adjustable tester and test method based on communication of substrate management controller

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CN109086177A (en) * 2018-08-09 2018-12-25 郑州云海信息技术有限公司 A kind of storage server heat dissipation test method and system
CN109165128A (en) * 2018-08-31 2019-01-08 郑州云海信息技术有限公司 A kind of method, system and the equipment of heat dissipation test data record
CN109164329A (en) * 2018-10-23 2019-01-08 江苏华存电子科技有限公司 A kind of semiconductor memory product high/low temperature ageing testing method
CN109390031A (en) * 2018-10-23 2019-02-26 江苏华存电子科技有限公司 A kind of semiconductor memory product high temperature ageing test method
CN109491847A (en) * 2018-11-07 2019-03-19 郑州云海信息技术有限公司 A kind of server high/low temperature method for testing reliability and device
CN109582520A (en) * 2018-12-07 2019-04-05 郑州云海信息技术有限公司 A kind of AEP memory heat radiation automated testing method and system based on Linux environment
CN109582520B (en) * 2018-12-07 2022-02-18 郑州云海信息技术有限公司 Method and system for automatically testing AEP (external-access-point) memory heat dissipation based on Linux environment
CN113326167A (en) * 2021-05-13 2021-08-31 山东英信计算机技术有限公司 Constant temperature adjustable tester and test method based on communication of substrate management controller

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