CN108091299A - 显示设备 - Google Patents
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- CN108091299A CN108091299A CN201711077700.0A CN201711077700A CN108091299A CN 108091299 A CN108091299 A CN 108091299A CN 201711077700 A CN201711077700 A CN 201711077700A CN 108091299 A CN108091299 A CN 108091299A
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Abstract
根据本发明的显示设备可包括:装配有多个像素的显示面板,多个像素连接至数据线和感测线;源极驱动IC,其被配置成经由感测线将数据电压提供至像素且装配有感测组块,感测组块使用经由感测线输入的信号获得与像素的驱动特性相关的感测数据;开关,其被配置成控制像素和感测组块之间经由感测线的连接;和电源,其被配置成提供测试电压或测试电流至感测组块。在开关断开像素和感测组块的连接的状态下,通过使用测试电压或测试电流,源极驱动IC可获得用于感测组块的校准数据。
Description
技术领域
本发明涉及一种显示设备,和更特别地,涉及一种校准用于实时感测显示面板特性的感测电路的显示设备。
背景技术
有源矩阵型有机发光显示器覆盖有机发光二极管(以下,称作“OLED”),其自身发光,且优势在于快响应速度、高发光效率、高亮度和宽视角。
自身发光的OLED包括阳极、阴极和形成于其间的有机化合物层。有机化合物层包括空穴注入层HIL、空穴传输层HTL、发射层EML、电子传输层ETL、和电子注入层EIL。当将驱动电压施加到阳极和阴极时,穿过HTL的空穴和穿过ETL的电子被传送到EML以形成激子。结果,发光层EML发出可见光。
在有机发光二极管显示设备中,每一个都包括OLED的像素被设置成矩阵形式,且根据图像数据等级,通过控制OLED发出的光量控制亮度。每个像素都包括驱动元件,也就是驱动薄膜晶体管TFT,其根据在其栅极和源极之间施加的电压控制流过OLED的像素电流。OLED和驱动TFT的电特性随着时间变劣且会引起像素差。在像素之间的电偏移是图像质量变差的主要因素。
公知的外部补偿技术是测量与像素电特性(驱动TFT的阈值电压和电子迁移率以及OLED的阈值电压)对应的感测信息和基于感测信息调制外部电路中的图像数据,以补偿像素之间的电特性偏差。
在该外部补偿技术中,通过使用嵌入到源极驱动IC(集成电路)中的感测组块感测像素的电特性。以电流形式接收像素特性信号的感测组块包括具有电流积分器和采样/保持器(holder)的多个感测单元,和模数转换器ADC。电流积分器通过感测通路进行像素电流输入的积分以生成感测电压。该感测电压经由采样/保持器通过ADC,且通过ADC被转换成数字感测数据。时序控制器基于自ADC的数字感测数据计算像素补偿值用于补偿像素电特性变化,并基于像素补偿值校正输入图像数据。
由于有机发光显示器包括用于以分段方式在区域基础(area basis)上驱动显示面板的多个源极驱动IC,因此每一个都被嵌入到每个源极驱动IC中的多个感测组块以分段方式基于区域感测显示面板区域上的像素。当通过多个感测组块以分段方式感测像素时,由于在感测组块之间的偏移(offset)变化会导致感测精确度较低。尤其,在ADC内部,源极驱动IC特性依赖于温度或者周围环境变化,因此ADC的输出一定程度上在一定范围室温下保持恒定值,但是在室温以外的高温下,其改变为明显不同于室温下的值。ADC的该输出特性影响面板的像素感测数据,引起当显示图像时,在源极驱动IC负责的区域之间显示亮度差的组块模糊现象。
图1在概念上示出了用于执行校准的技术,以消除由于装运之后ADC特性变化引起的组块模糊现象。
由于包括在感测组块中的ADC特性偏移,导致源极驱动IC(或感测组块)之间的偏移不同。在装运显示设备之前,经由分开的工艺测量偏差且通过补偿减小偏移,因此当显示相同亮度数据时,在源极驱动IC负责的区域之间不会发生亮度差。但是,在装运之后,ADC特性改变且在感测组块的偏移之间产生偏差,因此,当显示相同亮度的数据时,会发生其中在源极驱动IC负责的区域之间亮度不均匀的现象,且在水平方向上亮度会变化。
为了解决组块模糊现象,必须首先经由校准工艺补偿感测组块之间的偏移差。在校准工艺中,将测试电流或者测试电压V_reference施加到每个感测组块,获得反映ADC特性变化的用于校准的感测数据,且基于用于校准的感测数据计算感测组块当中能补偿偏移差的用于校准的补偿值。当校正输入图像数据时,通过参考用于校准的补偿值以及用于像素的补偿值,时序控制器增加了补偿精度。
图2示出了其中驱动单元执行显示驱动期间的周期和感测单元执行校准操作和感测驱动期间的周期分开的现有技术。在显示器驱动停止其操作的显示器关闭期间校正感测组块当中的偏移差,该操作在空闲周期或者断电序列中执行,且主要在断电序列中执行。
如上所述,由于校准操作在断电序列中进行,因此难以适当反映出显示器驱动期间由环境变化引起的感测组块的特性变化,且存在断电序列所需时间变长的问题。
发明内容
考虑到上述情况作出本发明。本发明的目的在于提供一种能够进行校准操作的显示设备,同时其实时反映显示驱动期间发生的环境变化。
根据本发明实施例的显示设备可包括:装配有连接到数据线和感测线的多个像素的显示面板;被配置成经由感测线提供数据电压至像素且装配有感测组块的源极驱动IC,所述感测组块使用经由感测线输入的信号获得与像素的驱动特性相关的感测数据;被配置成控制像素和感测组块之间经由感测线的连接的开关;和被配置成提供测试电压或者测试电流至感测组块的电源,且在开关断开像素和感测组块的状态下,电源驱动IC可通过使用测试电压或测试电流获得对于感测组块的校准数据。
在一实施例中,源极驱动IC可在显示驱动周期中执行获得校准数据的校准操作,在该显示驱动周期期间,通过提供数据电压而在显示面板上显示图像。
在一实施例中,在一部分显示驱动周期中,参考电压被与电源分开的源经由感测线提供至像素。
在一实施例中,开关可连接像素和感测组块,且在除了显示驱动周期之外的断电序列周期的垂直空闲周期中感测组块通过使用感测线的电压或电流而获得感测数据。
在一实施例中,在电源提供测试电压至感测组块的情况下,感测组块可包括用于采样和保持感测线的电压的采样单元,和用于将采样的电压转换成数字值的模数转换器。
在一实施例中,在电源提供测试电流至感测组块的情况下,感测组块可包括用于积分电流的积分器、用于采样和保持自积分器输出的电压的采样单元,和用于将采样值转换成数字值的模数转换器。
在一实施例中,显示设备还包括控制器,其被配置成基于校准数据和感测数据补偿输入图像数据,并且将补偿数据提供至源极驱动IC。
根据本发明的另一实施例,用于在显示设备中校准数据的方法可包括在显示驱动周期期间通过将数据电压施加至连接到数据线和感测线的多个像素而显示图像;获得用于感测组块的校准数据,感测组块通过将测试电压或测试电流提供至感测组块获得与像素的驱动特性相关的感测数据,同时断开像素和感测组块之间的连接;在除了显示驱动周期之外的周期期间,通过使用感测线的电压或电流获得感测数据同时连接像素和感测组块;和基于校准数据和感测数据补偿输入图像数据。
在一实施例中,获得校准数据可在显示驱动周期中执行。
在一实施例中,显示图像可包括在一部分显示驱动周期中经由感测线将与测试电压分离的参考电压提供至像素。
在一实施例中,获得感测数据可在垂直空闲周期或者断电序列周期中执行。
因此,可与显示驱动同时进行校准操作,使得由于显示驱动引起的环境变化导致的感测组块的变化被实时校准且补偿,且可以实时减小源极驱动IC之间的偏差,从而改善组块模糊现象和改善图像质量。
而且,通过在显示驱动周期期间进行校准操作,可以减小断电序列所需的时间。
附图说明
包括附图以提供本发明的进一步理解,且附图结合到说明书中并构成说明书的一部分,附图示出了本发明的实施例且与该描述一起用于解释本发明的原理。附图中:
图1在概念上示出了用于执行校准以消除由装运之后ADC特性变化引起的组块模糊现象的技术。
图2示出了现有技术,其中驱动单元执行显示驱动的周期和感测单元执行校准操作及感测操作的周期分开。
图3示出了提供参考电压至感测组块的电路,将该参考电压提供至像素用于校准感测电路。
图4在概念上示出了根据本发明实施例通过将面板和源极驱动IC分开提供参考电压。
图5在概念上示出根据本发明实施例并行执行显示驱动和校准操作。
图6示出了根据本发明实施例作为组块的显示设备驱动电路。
图7示出了根据本发明实施例使用电压源作为外部电源用于执行校准操作的电路结构。
图8示出了根据本发明另一实施例使用电流源作为外部电源用于执行校准操作的电路结构。
具体实施方式
以下,将参考附图具体描述本发明的优选实施例。贯穿说明书,相同参考数字表示基本相同部件。在以下描述中,当本文中结合的公知功能和结构的具体描述会使得本发明的主题相当不清楚时,将省略其描述。
图3示出了电路,其为了校准感测电路而将提供至像素的参考电压提供至感测组块。
构成显示面板的多个像素中的每一个像素都连接至用于施加数据电压的数据线和用于传送反映像素特性的信号的感测线。OLED的像素包括用于控制驱动OLED的电流的驱动TFT DT、用于控制驱动TFT操作的第一和第二TFT ST1和ST2、和用于存储将要施加至驱动TFT的数据电压的存储电容器Cst。扫描信号SCAN和感测信号SEN控制第一和第二TFT ST1和ST2的操作。源极驱动IC包括经由感测线连接至像素的感测电路(或者感测组块)以感测像素的驱动特性。参考电压源Vref经由感测线将参考电压施加至像素,并将用于校准感测电路的测试电压提供至感测线。
在经由数据线施加数据电压且驱动TFT开启以使电流流经OLED因此OLED发光的显示驱动周期当中的一部分期间,即,将数据电压施加至驱动TFT的栅极之前和/或期间,参考电压源经由感测线将参考电压施加至驱动TFT的源极。
在显示驱动周期期间,参考电压源经由感测线连接至至少一条像素线的像素,且一部分流经像素的驱动TFT的电流被经由感测线施加至参考电压源以引起参考电压的变化。如此,在显示驱动周期期间,参考电压源的输出电压由于流经感测线的像素电流而波动。
通过使用参考电压源的输出电压作为测试电压,进行感测组块的校准操作。但是,由于测试电压不是恒定的,且在显示驱动周期期间波动,因此在显示驱动周期期间不能进行校准操作,而是可在除了显示驱动周期之外的垂直空闲周期或者断电周期中进行。
当仅补偿驱动TFT的迁移率时,由于参考电压源不受像素电流影响而没有问题,即使在显示驱动周期期间进行校准操作也是如此。但是,当补偿驱动TFT的所有的阈值电压和迁移率时,由于在显示驱动周期期间参考电压源受到像素电流影响因此不能进行校准操作。如果进行校准操作,则不会发生源极驱动IC当中的偏移差和组块模糊现象。
因此,在本发明中,在显示驱动周期期间,源极驱动IC的感测组块与包括像素的面板是分离的,且使用与在显示驱动周期期间将参考电压施加至感测组块的参考电压源分开的电源执行用于感测组块的校准操作,从而可同时进行用于显示输入图像数据的显示操作和用于测量感测组块偏移差的校准操作。
图4在概念上示出根据本发明实施例通过分开面板和源极驱动IC提供参考电压,图5在概念上示出根据本发明实施例并行进行显示驱动和校准操作。
如图4中所示,包括像素和参考电压源Vref的面板部分与源极驱动IC通过开关分开,且与参考电压源分开的测试电压源Vref2连接到感测组块,因此可利用不受像素电流Ipixel和施加到像素的参考电压影响的独立的电源执行用于感测组块的校准操作,其中参考电压源Vref提供的参考电压用于初始化包括在像素中的驱动TFT的源极节点,源极驱动IC包括的感测组块ADC用于感测反映像素驱动特性的像素电流Ipixel。
由于如图5中所示,在显示器开启的时间间隔内,通过并行地独立进行将与图像数据对应的数据电压施加至像素的显示驱动和使用分离的测试电压源感测感测组块特性的校准操作,包括像素和参考电压源的显示面板和包括感测组块和测试电压源的源极驱动IC彼此分开,因此可以在不进行校准操作的情况下,在断电之后立即进行用于检测像素驱动特性的感测驱动,并且,可以降低执行断电序列所需的时间。
图6示出了根据本发明一实施例作为组块的显示设备的驱动电路。
根据本发明的显示设备包括显示面板10、时序控制器11、数据驱动电路12和栅极驱动电路13。
多条数据线14和多条感测线以及多条栅极线(或者扫描线)15在显示面板10上彼此交叉,且像素P被设置成矩阵形式以构成像素阵列。多条栅极线15可包括多条第一栅极线15A和多条第二栅极线15B,第一扫描信号SCAN被提供至所述多条第一栅极线15A,第二扫描信号SEN被提供至所述多条第二栅极线15B。
像素P连接至任一条数据线14A、任一条感测线14B、任一条第一栅极线15A以及任一条第二栅极线15B,以构成像素线。响应于经由第一栅极线15A输入的第一扫描脉冲,像素P电连接至数据线14A,并且接收数据电压。响应于经由第二栅极线15B输入的第二扫描脉冲,像素P可经由感测线14B输出感测信号。设置在相同像素线中的像素根据自相同的第一栅极线15A提供的第一扫描脉冲而同时操作。
自未示出的电源向像素P提供高电势驱动电压EVDD和低电势驱动电压EVSS,且像素P可包括OLED、驱动TFT、存储电容器、第一开关TFT和第二开关TFT。构成像素P的TFT可被实施为p型或n型,或者被实施为其中混合了P型和N型的混合型。此外,TFT的半导体层可包括非晶硅、多晶硅或氧化物。
在本发明的驱动电路或像素中,可通过n型金属氧化物半导体场效应晶体管MOSFET或p型MOSFET的晶体管实施开关元件。以下实施例以n型晶体管示出,但是本发明不限于此。晶体管是包括栅极、源极和漏极三个电极的元件。源极是用于将载流子提供至晶体管的电极。在晶体管内,载流子从源极开始流动。漏极是载流子自其离开晶体管的电极。也就是,在MOSFET中的载流子的流动是从源极到漏极的。在N型MOSFET(NMOS)的情况下,由于载流子是电子,因此源极电压具有低于漏极电压的电压,使得电子从源极向漏极流动。在N型MOSFET中,由于电子从源极流向漏极,因此电流方向是从漏极向源极的。在P型MOSFET(PMOS)的情况下,由于载流子是空穴,因此源极电压高于漏极电压,从而空穴可从源极流向漏极。应当注意,MOSFET的源极和漏极不是固定的。例如,MOSFET的源极和漏极可根据所施加的电压而改变。在以下实施例中,本发明不应由于晶体管的源极和漏极而受限。
本发明的显示设备采用外部补偿机制。外部补偿机制感测装配在像素中的驱动TFT的电特性且基于感测值校正输入图像的数字数据DATA。驱动TFT的电特性可包括驱动TFT的阈值电压和电子迁移率。
根据预定的控制序列,时序控制器11可在时间上分离感测驱动和显示操作,感测驱动感测像素驱动特性并与感测值对应地更新补偿值,显示操作将图像数据RGB写入到显示面板10上以显示反映出补偿值的输入图像。也就是,可在写入图像数据停止的周期中执行感测驱动。
在时序控制器11的控制下,可在垂直空闲周期期间或者在显示操作开始之前的通电序列周期(非显示周期,直到其中在施加系统电源之后立即显示图像的图像显示周期)期间,或者在显示操作结束之后的断电序列(非显示周期,直到在结束图像显示之后立即关闭系统电源)期间,执行感测驱动。
垂直空白周期是不写入输入图像数据DATA的周期,且被设置在写入1帧输入图像数据的垂直有效周期(vertical active period)期间。通电序列周期是指从系统电源开启直到显示输入图像的过渡周期(transient period)。断电序列周期是指从输入图像显示结束直到系统电源关闭的过渡周期。
在显示驱动周期中,在时序控制器11的控制下,可通过与将对应于图像数据的数据电压施加至像素并行地将分离的测试电压或测试电流施加至感测组块,执行用于测量感测组块偏移的校准操作。
基于时序信号诸如垂直同步信号Vsync、水平同步信号Hsync、点时钟信号DCLK和数据使能信号DE,时序控制器11生成用于控制数据驱动电路12的操作时序的数据控制信号DDC和用于控制栅极驱动电路13的操作时序的栅极控制信号GDC。时序控制器11可在时间上分开执行图像显示的显示驱动周期和感测像素特性的感测驱动周期,并且不同地生成用于显示驱动的控制信号和用于感测驱动的控制信号。
栅极控制信号GDC包括栅极起始脉冲GSP、栅极移位时钟GSC、栅极输出使能信号GOE等。将栅极起始脉冲(GSP)施加至生成第一扫描信号的门级(gate stage)以控制门级生成第一扫描信号。栅极移位时钟GSC是被共同输入到门级的时钟信号,且是用于移位栅极起始脉冲GSP的时钟信号。栅极输出使能信号GOE是控制门级输出的掩蔽信号(maskingsignal)。
数据控制信号DDC包括源极起始脉冲SSP、源极采样时钟SSC、源极输出使能信号SOE等。源极起始脉冲SSP控制数据驱动电路12的数据采样起始时序。源极采样时钟SSC是基于上升沿或下降沿控制各自源极驱动IC中数据的采样时序的时钟信号。源极输出使能信号SOE控制数据驱动电路12的输出时序。
在校准操作期间,时序控制器11可基于自数据驱动电路12输入并被存储在存储器中的用于校准的感测数据,计算用于校准的补偿值,其补偿感测组块当中的偏移差。
在感测驱动期间,时序控制器11可基于自数据驱动电路12输入且被存储在存储器中的数字感测值SD,计算用于像素的补偿值,其可以补偿像素驱动特性的变化。可在每次执行感测驱动时更新在存储器中存储的用于像素的补偿值,且由此可容易地补偿像素的随时间变化的特性。
在显示驱动期间,时序控制器11可自存储器读取用于像素的补偿值,基于用于像素的补偿值校正输入图像的数字数据DATA,并将其提供至显示驱动电路12。通过进一步也参考用于校准的补偿值以及用于像素的补偿值,时序控制器11可增加补偿精确度。
数据驱动电路12可包括用于基于面积划分和驱动显示面板10的一个或多个源极驱动IC。每个源极驱动IC都可包括连接至数据线14A的多个数模转换器DAC、经由感测通道连接至感测线14B的感测组块,和用于控制感测线14B和感测组块的连接的分离开关(separation switch)。测试电压或电流可自测试电源被施加到感测组块。
在显示驱动期间,DAC根据数据控制信号DDC将自时序控制器11输入的数字图像数据RGB转换成用于显示的数据电压,并将数据电压提供至数据线14A。用于显示的数据电压是根据输入图像的灰度级而变化的电压。
在感测驱动期间,DAC根据数据控制信号DDC生成用于感测的数据电压并将数据电压提供至数据线14A。用于感测的数据电压是在感测驱动期间能开启在像素中的驱动TFT的电压。对于所有像素可生成相同值的用于感测的数据电压。假设对于每种颜色像素特性是不同的,则对于每一种颜色都可生成不同值的用于感测的数据电压。例如,可生成用于感测的数据电压作为用于显示第一种颜色的第一像素的第一值,作为用于显示第二种颜色的第二像素的第二值,和作为用于显示第三种颜色的第三像素的第三值。
根据数据控制信号DDC,在显示驱动时分离开关将感测线14B和感测组块断开连接,并且在感测驱动时连接感测线14B和感测组块。
测试电源在校准操作期间(显示驱动期间)连接至感测组块以提供测试电压或者测试电流,并且在感测驱动期间与感测组块断开连接。
感测组块可包括多个感测单元和顺序连接至感测单元的ADC。多个感测单元在感测驱动期间采样反映经由感测线输入的像素驱动特性的信号,并在校准操作期间采样自测试电源输入的测试信号。
ADC在感测驱动期间输出与像素驱动特性对应的感测数据,并在校准操作期间输出用于校准的与测试信号对应的感测数据。
栅极驱动电路13基于栅极控制信号GDC生成用于显示SCAN的扫描信号,并将扫描信号顺序提供至连接至像素线的第一栅极线15A。像素线是指一组水平相邻像素。扫描信号在栅极高压VGH和栅极低压VGL之间摆动。栅极高压VGH被设置成高于用于开启TFT的TFT阈值电压的电压,且栅极低压VGL低于TFT的阈值电压。
在感测驱动期间,栅极驱动电路13基于栅极控制信号GDC生成用于感测SEN的扫描脉冲,且将扫描脉冲顺序提供至与像素线连接的栅极线15B。用于感测的扫描信号可具有比用于显示的扫描脉冲更宽的导通脉冲间隔(on-pulse interval)。用于感测的栅极脉冲中的一个或多个导通脉冲间隔包括在一条线路感测导通时间内。此处,一条线路感测导通时间是指同步感测一条像素线的多个像素所用的扫描时间。
OLED显示设备主要被描述为应用了本发明的显示设备,但是本发明的显示设备不限于此。例如,本发明的显示设备可应用到需要感测像素的驱动特性以增加显示设备的可靠性和寿命的任一种显示设备,例如液晶显示LCD或者使用无机物质作为发光层的无机发光显示设备。
图7示出了根据本发明实施例用于使用电压源作为外部电源执行校准操作的电路结构。
参考图7,本发明的像素P可包括OLED、驱动TFT DT、存储电容器Cst、第一开关TFTST1和第二开关TFT ST2。
OLED包括连接至驱动TFT DT的源极节点的阳极、连接到低电势驱动电压EVSS的输入端的阴极和位于阳极和阴极之间的有机化合物层。根据栅极和源极之间的电压Vgs,驱动TFT DT控制输入到OLED的电流量。驱动TFT DT的栅极连接至栅极节点N1,驱动TFT DT的漏极连接到高电势驱动电压EVDD的输入端,驱动TFT DT的源极连接至源极节点N2。存储电容器Cst连接在栅极节点N1和源极节点N2之间。第一开关TFT SW1响应于第一扫描信号SCAN将数据线14A中的数据电压Vdata施加至栅极节点N1。第一开关TFT SW1的栅极连接至第一扫描线15A,第一开关TFT SW1的漏极连接至数据线14A,第一开关TFT SW1的源极连接至栅极节点N1。第二开关TFT SW2响应于第二扫描信号SEN开启/关闭在源极节点N2和感测线14B之间的电流。第二开关TFT SW2的栅极连接至第二栅极线15B,第二开关TFT SW2的漏极连接至感测线14B,以及第二开关TFT SW2的源极连接至源极节点N2。
构成数据驱动电路的源极驱动IC 12经由数据线14A和感测线14B连接至像素。源极驱动IC 12可包括用于将数字补偿数据MDATA转换成用于显示的数据电压Vdata的数模转换器DAC、用于采样和保持在感测驱动期间的模拟感测电压和校准操作期间的测试电压的采样/保持器、用于将采样的感测电压或者采样的测试电压转换成数字感测值或者数字测试值的ADC,以及用于在显示驱动期间断开连接和在感测驱动期间连接的第三开关SW3。
源极驱动IC 12可进一步包括用于控制在提供参考电压的参考电压源Vref和感测线14B之间的连接的第一开关SW1和用于控制在提供测试电压的测试电压源和采样/保持器之间的连接的第二开关SW2。采样/保持器、ADC、第二开关SW2和第三开关SW3可被称作感测组块,采样/保持器、第二开关SW2和第三开关SW3可被称作感测单元。
测试电压源Vtest可具有与参考电压源Vref相同的输出电压,且可被用作与根据施加至像素的数据电压波动的参考电压源Vref分离的外部电源。
第一开关SW1在显示驱动期间连接至感测线14B并向其提供参考电压,且在感测驱动期间与感测线14B断开连接。在显示驱动期间,单个像素被与第二扫描信号SEN同步地顺序连接至感测线路14B,且驱动TFT DT的源极节点N2被初始化。
第二开关SW2在显示驱动期间连接参考电压源Vref和采样/保持器以进行校准操作,且在感测驱动期间断开参考电压源Vref和采样/保持器的连接。
第三开关SW3在显示驱动期间断开感测组块和像素(或者感测线14B)之间的连接,并且感测组块使用测试电压源Vtest的电压执行校准操作以输出与感测组块特性对应的用于校准的感测数据。而且,第三开关SW3在感测驱动期间连接感测组块和像素,因此感测组块使用经由感测线14B施加的信号输出反映像素驱动特性的感测数据。
图8示出了根据本发明另一实施例使用电流源作为外部电源进行校准操作的电路结构。
图8的像素结构与图7相同,因此省略其描述。
图8中,感测组块输出自像素输入的电流或者自测试源输入的测试电流作为感测数据或用于校准的感测数据,因此与图7的感测组块不同。尤其是,在采样/保持器之前设置用于将电流转换成电压的电流积分器以及使用测试电流源Itest代替测试电压源Vtest的结构与图7不同。
电流积分器包括运算放大器AMP、反馈电容器Cfb和第四开关SW4。电流积分器积分经由感测线14B输入到感测组块的像素电流或测试电流并输出积分值。运算放大器AMP包括接收像素电流或测试电流的反相输入端(-)、接收参考电压Vref的非反相输入端(+)和输出积分值的输出端。反馈电容器Cfb连接非反相输入端(+)和输出端并积分电流。第四开关SW4连接至反馈电容器Cfb的两端,且反馈电容器Cfb在第四开关SW4打开时被初始化。
在显示驱动期间,第三开关SW3断开以分开感测组块和像素,且导通以将参考电压Vref施加到感测线路14B。在显示驱动的初始化部分期间,第四开关SW4导通,且运算放大器AMP用作增益是一的缓冲器,因此输入端(+)和(-)以及输出端全部被初始化为参考电压Vref。在初始化部分之后,第二开关SW2导通且第四开关SW4断开,因此自测试电流源Itest的测试电流被施加至运算放大器AMP的反相输入端(-)且运算放大器AMP作为电流积分器操作以积分测试电流。
也就是,在显示驱动的初始化部分之后,由于流到运算放大器AMP的反相输入端(-)的测试电流而在反馈电容器Cfb两端产生电势差,并且运算放大器AMP的输出端的电势响应于反馈电容器Cfb两端的电势差而降低。通过该原理,经由反馈电容器Cfb,电流积分器的输出值改变为积分值。电流积分器的输出值由采样&保持器采样且通过ADC将其转换成用于校准的感测值以传送到时序控制器11。通过时序控制器11,用于校准的感测值可用于计算用于校准的补偿值以补偿感测组块当中的偏移差。
同时,在感测驱动期间,第三开关SW3导通以连接感测组块和像素,且第一和第二开关SW1和SW2断开。
在感测驱动的初始化部分期间,第四开关SW4导通且运算放大器AMP作为增益为一的缓冲器操作,因此运算放大器AMP的输入端(+)和(-)以及输出端、感测线14B和节点N2可全部被初始化为参考电压Vref。在初始化部分期间,用于感测的数据电压经由源极驱动IC12的DAC被施加至像素的栅极节点N1,相应地,与栅极节点N1和源极节点N2之间的电势差(Vdata-Vref)对应的像素电流流过驱动TFT DT。但是,由于运算放大器AMP连续作为增益为一的缓冲器操作,因此电流积分器的输出值保持为参考电压Vref。
在感测驱动的初始化部分之后,第四开关SW4断开,因此自像素的像素电流被施加至运算放大器AMP的反相输入端(-),且运算放大器AMP作为电流积分器操作,以积分像素电流。由于流动到运算放大器AMP的反相输入端(-)的像素电流导致跨过反馈电容Cfb产生电势差,响应于跨过反馈电容Cfb的电势差,运算放大器AMP的输出端的电势降低,且电流积分器的输出值经由反馈电容Cfb改变为积分值。由采样&保持器采样电流积分器的输出值且通过ADC将其转换为用于像素的感测值以被传送至时序控制器11。通过时序控制器11,用于像素的感测值可用于计算阈值电压的偏移和驱动TFT DT的迁移率。
由此,本发明通过开关将感测组块和像素分开且使用分离的用于感测组块校准操作的电源,这使得在显示驱动期间可以与显示操作并行地进行校准操作。因此,可以检测和补偿在显示驱动期间实时发生的感测组块的特性改变,从而改善组块模糊现象且改善图像质量。而且可从断电序列省略校准操作,可以减少断电序列所需的时间。
贯穿该描述,本领域技术人员应当理解,在不脱离本发明的技术原理的情况下可作出各种改变和修改。因此,本发明的技术范围不限于该说明书中的具体描述,而是应当由所附权利要求的范围限定。
Claims (11)
1.一种显示设备,包括:
显示面板,装配有连接至数据线和感测线的多个像素;
源极驱动IC,其被配置成经由所述感测线将数据电压提供至像素,且装配有使用经由所述感测线输入的信号获得与所述像素的驱动特性相关的感测数据的感测组块;
开关,其被配置成控制所述像素和所述感测组块之间经由所述感测线的连接;和
电源,其被配置成提供测试电压或测试电流至所述感测组块,
其中,在所述开关断开所述像素和所述测试组块的连接的状态下,所述源极驱动IC使用所述测试电压或所述测试电流获得用于所述感测组块的校准数据。
2.如权利要求1所述的显示设备,其中源极驱动IC进行校准操作,用于在显示面板上显示图像的显示驱动周期中通过提供数据电压获得校准数据。
3.如权利要求2所述的显示设备,其中在显示驱动周期的一部分中,通过与电源分离的源,经由感测线将参考电压提供至像素。
4.如权利要求2所述的显示设备,其中在除了显示驱动周期之外的断电序列周期的垂直空闲周期中,开关连接像素和感测组块,且感测组块通过使用感测线的电压或电流获得感测数据。
5.如权利要求1所述的显示设备,其中在电源将测试电压提供至感测组块的情况下,感测组块包括用于采样和保持感测线的电压的采样单元和用于将采样的电压转换成数字值的模数转换器。
6.如权利要求1所述的显示设备,其中,在电源将测试电流提供至感测组块的情况下,感测组块包括用于积分电流的积分器、用于采样和保持自积分器输出的电压的采样单元,以及用于将采样的值转换成数字值的模数转换器。
7.如权利要求1所述的显示设备,还包括:
控制器,其被配置成基于校准数据和感测数据补偿输入图像数据且提供补偿数据至源极驱动IC。
8.一种用于在显示设备中校准数据的方法,包括:
在显示驱动周期中,通过将数据电压施加至连接到数据线和感测线的多个像素而显示图像;
在断开所述像素和感测组块之间的连接的同时,获得用于所述感测组块的校准数据,其中通过提供测试电压或测试电流至感测组块,感测组块获得与像素的驱动特性相关的感测数据;
在除了所述显示驱动周期的周期中,在连接所述像素和所述感测组块的同时通过使用所述感测线的电压或电流获得所述感测数据;和
基于所述校准数据和所述感测数据补偿输入图像数据。
9.如权利要求8所述的方法,在显示驱动周期中执行获得校准数据的步骤。
10.如权利要求8所述的方法,其中显示图像的步骤包括在一部分所述显示驱动周期经由感测线将与测试电压分离的参考电压提供至像素。
11.如权利要求8所述的方法,其中获得感测数据的步骤是在垂直空闲周期或者断电序列号周期中执行的。
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Also Published As
Publication number | Publication date |
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EP3324395B1 (en) | 2020-01-01 |
US11107420B2 (en) | 2021-08-31 |
US20180144689A1 (en) | 2018-05-24 |
EP3324395A1 (en) | 2018-05-23 |
KR20180057752A (ko) | 2018-05-31 |
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