CN108052428A - A kind of test method for testing PCIe card warm connection function - Google Patents
A kind of test method for testing PCIe card warm connection function Download PDFInfo
- Publication number
- CN108052428A CN108052428A CN201711302963.7A CN201711302963A CN108052428A CN 108052428 A CN108052428 A CN 108052428A CN 201711302963 A CN201711302963 A CN 201711302963A CN 108052428 A CN108052428 A CN 108052428A
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- CN
- China
- Prior art keywords
- connection function
- flow
- pcie card
- hot plug
- warm connection
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Classifications
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2205—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested
- G06F11/221—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using arrangements specific to the hardware being tested to test buses, lines or interfaces, e.g. stuck-at or open line faults
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Stored Programmes (AREA)
Abstract
The present invention relates to computer realm, more particularly to a kind of test method of PCIe card warm connection function, the test method tests hot plug flow by software simulation, reduces physics and plugs the injury brought to connector.Hot plug register related register can be collected by the testing scheme, hot plug test is carried out using script, can complete to test at any time, physics plug is not required, improves testing efficiency.
Description
Technical field
The present invention relates to computer realm, more particularly to a kind of method for testing PCIe card warm connection function.
Background technology
PCI-Express (peripheral component interconnect express) is a kind of high speed serialization
Computer expansion bus standard, its original entitled " 3GIO " are to be proposed by Intel in 2001, it is intended to substitute old
PCI, PCI-X and AGP bus standard.PCIE belongs to the point-to-point binary channels high bandwidth transmission of high speed serialization, the equipment connected point
With bandwidth chahnel is exclusively enjoyed, bus bandwidth is not shared, mainly supports active power management, error reporting, end-to-end reliability passes
It is defeated, the functions such as hot plug and service quality (QOS).PCIE transfers to ability after PCI-SIG (PCI particular interests tissue) certification issue
It is renamed as " PCI-Express ", referred to as " PCI-E ".Its main advantage is exactly message transmission rate height, highest at present
16X2.0 versions can reach 10GB/s, and also sizable development potentiality.
In server architecture system, PCIE is the external apparatus interface of standard, and net can be expanded by PCIE interfaces
Card, video card, storage card multiple standards PCIE device.PCI Express support the characteristic of hot plug and heat exchange, that is to say, that
You can replace the version card of PCI Express slots and various hardware devices in the case where that need not close system and power supply.
And hot plug measuring technology mainly relies on the progress of hot plug testing scheme, supports the module of hot plug, to test
For plug repeatedly be test pain spot, how to carry out fast and effectively testing scheme, to the shortening Time To Market of product,
Ensure that product quality plays a crucial role.
The content of the invention
The present invention is achieved through the following technical solutions, and a kind of test method of PCIe card warm connection function utilizes master
BMC module in plate gives system transmitting order to lower levels, hot plug testing process is simulated by software, to test warm connection function.
Preferably, buffer status in each Plug Action PLX chips is also collected in this method.
The present invention also provides a kind of test methods of PCIe card warm connection function, include the following steps, 1) basis first
BDF where the corresponding PCIE switch chips in PCIe card slot position checks the state of corresponding groove position hot plug related register;2)
Cmd interfaces, which are provided, according to bmc realizes that single step works in hot plug flow.
Further, step 2) further comprises being inserted into flow and extracts flow.
Further, the insertion flow in step 2) includes the control release of insertion button, BMC.
Further, the extraction flow in step 2) includes deleting the control release of button, deletion MRL and prsnt, BMC.
The present invention provides a kind of computer-readable medium, is stored thereon with computer program, which is executed by processor
To realize the method.
The present invention also provides a kind of computer equipment, on a memory and can locate including memory, processor and storage
The computer program run on reason device, the processor perform described program to realize the method.
The present invention is to test hot plug flow by software simulation, reduce object compared with the advantageous effect of the prior art
The injury that reason plug is brought to connector.Hot plug register related register can be collected by the testing scheme, utilize foot
This progress hot plug test can be completed to test at any time, and physics plug is not required, improves testing efficiency.
Description of the drawings
What Fig. 1 one embodiment of the invention provided provides related command schematic diagram by bmc
The flow diagram for the test PCIe card warm connection function that Fig. 2 one embodiment of the invention provides
Specific embodiment
Presently preferred embodiments of the present invention is described in detail below in conjunction with the accompanying drawings.Following embodiment is only used for clearer
Ground illustrates technical scheme, and is not intended to limit the protection scope of the present invention and limits the scope of the invention.
In the embodiment of the present invention, as shown in Figure 1, providing the order of related command PCIE Hot-Plug control interfaces such as by bmc
Under:
1. it is powered on to PCIE slots, the order of lower electricity;2nd, set, remove the order of MRL;3rd, the insertion of software simulation heat and heat
The order of extraction;4th, software can be pressed operation with analog buttons;5th, software can set and remove the signal in place of IO cards.
As shown in Fig. 2, flow is as follows in one embodiment of the invention:
1) BDF first according to where the corresponding PCIE switch chips in PCIe card slot position, can check corresponding groove position heat
Plug the state of related register.Mainly it is embodied as code below:
It is posted for example, test script reads 1 slot position slot status register command completed bit20
Storage value (test result 0, the state update of expression are completed)
2) cmd interfaces are provided according to bmc and realizes that single step works in hot plug flow.
Flow is inserted into be completed by two orders:
1.Insertion Button:
./ipmitool-H 127.0.0.1-U admin-P admin raw 0x30 0x34 0x00 0xf4
2.Release BMC control:
./ipmitool-H 127.0.0.1-U admin-P admin raw 0x30 0x34 0x00 0x00
Flow is extracted to be completed by three orders
Remove:
1.Remove Button:
./ipmitool-H 127.0.0.1-U admin-P admin raw 0x30 0x34 0x00 0xf8
wait for Data link down.
2.Remove MRL&&prsnt:
./ipmitool-H 127.0.0.1-U admin-P admin raw 0x30 0x34 0x00 0xc8
3.Release BMC control:
./ipmitool-H 127.0.0.1-U admin-P admin raw 0x30 0x34 0x00 0x00
3) two above part is combined, entire plug flow testing is completed and each hot plug related register state is looked into
It is as follows to ask main script realization:
In one embodiment of the invention, it is as follows that remove is carried out to 1 slot position card:
./hot_plug.sh_r1|
[1053.443316]pciehp 0000:82:09.0:pcie24:Button pressed on Slot(41)
[1053.449511]pciehp 0000:82:09.0:pcie24:PCI slot#41-powering off due
to button press
[1058.677929]pciehp 0000:82:09.0:pcie24:slot(41):Link Down event
[1058.684035]pciehp 0000:82:09.0:pcie24:Link Down event ignored on
slot(41):already powering off
One of ordinary skill in the art will appreciate that:Realizing all or part of step of above method embodiment can pass through
Program or the relevant hardware of program instruction are completed, and foregoing program can be stored in computer-readable storage medium
In, the program upon execution, execution the step of including above method embodiment;And foregoing storage medium includes:ROM、RAM、
In the various media that can store program code such as magnetic disc or CD.
The present invention also provides a kind of computer equipment, on a memory and can locate including memory, processor and storage
The computer program run on reason device, the processor perform described program to realize the step.
The foregoing is merely illustrative of the preferred embodiments of the present invention, is not intended to limit the invention, all essences in the present invention
All any modification, equivalent and improvement made within refreshing and principle etc., should all be included in the protection scope of the present invention.
Claims (8)
1. a kind of test method of PCIe card warm connection function, it is characterised in that:It is issued using the BMC module in mainboard to system
Order simulates hot plug testing process, to test warm connection function by software.
2. a kind of test method of PCIe card warm connection function according to claim 1, it is characterised in that:It is also received in this method
Collect buffer status in each Plug Action PLX chips.
3. a kind of test method of PCIe card warm connection function, it is characterised in that:Include the following steps, 1) first according to PCIe card
BDF where the corresponding PCIE switch chips in slot position checks the state of corresponding groove position hot plug related register;2) according to bmc
Cmd interfaces are provided and realize that single step works in hot plug flow.
4. according to the method described in claim 1, it is characterized in that:Step 2) further comprises being inserted into flow and extracts flow.
5. according to the method described in claim 2, it is characterized in that:Insertion flow in step 2) includes insertion button, BMC
Control release.
6. according to the method described in claim 2, it is characterized in that:Extraction flow in step 2) includes deleting button, delete
The control release of MRL and prsnt, BMC.
7. a kind of computer-readable medium, is stored thereon with computer program, which is executed by processor to realize the power
Profit requires 1-6 any one of them methods.
8. a kind of computer equipment including memory, processor and stores the meter that can be run on a memory and on a processor
Calculation machine program, the processor perform described program to realize claim 1-6 any one of them methods.
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CN201711302963.7A CN108052428A (en) | 2017-12-08 | 2017-12-08 | A kind of test method for testing PCIe card warm connection function |
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CN201711302963.7A CN108052428A (en) | 2017-12-08 | 2017-12-08 | A kind of test method for testing PCIe card warm connection function |
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Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109308236A (en) * | 2018-09-17 | 2019-02-05 | 郑州云海信息技术有限公司 | A kind of warm connection function test method, device and relevant device |
CN109445997A (en) * | 2018-06-29 | 2019-03-08 | 郑州云海信息技术有限公司 | A kind of production line test method, system, medium and the equipment of PCIE Switch product |
CN110502464A (en) * | 2019-07-26 | 2019-11-26 | 苏州浪潮智能科技有限公司 | A kind of hot-swappable processing method, device, equipment, system and readable storage medium storing program for executing |
CN113438470A (en) * | 2021-06-18 | 2021-09-24 | 苏州浪潮智能科技有限公司 | Video transcoder card dropping simulation test method, device, terminal and storage medium |
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CN102508659A (en) * | 2011-10-21 | 2012-06-20 | 浪潮电子信息产业股份有限公司 | Method for realizing hot plug on PCI EXPRESS (peripheral component interconnect express) in Linux |
CN103678056A (en) * | 2012-09-14 | 2014-03-26 | 成都林海电子有限责任公司 | Method for testing control function of PCIE bus equipment |
CN107203448A (en) * | 2017-05-24 | 2017-09-26 | 郑州云海信息技术有限公司 | A kind of method and system of test PCIe switch chip violence warm connection functions |
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2017
- 2017-12-08 CN CN201711302963.7A patent/CN108052428A/en active Pending
Patent Citations (3)
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CN102508659A (en) * | 2011-10-21 | 2012-06-20 | 浪潮电子信息产业股份有限公司 | Method for realizing hot plug on PCI EXPRESS (peripheral component interconnect express) in Linux |
CN103678056A (en) * | 2012-09-14 | 2014-03-26 | 成都林海电子有限责任公司 | Method for testing control function of PCIE bus equipment |
CN107203448A (en) * | 2017-05-24 | 2017-09-26 | 郑州云海信息技术有限公司 | A kind of method and system of test PCIe switch chip violence warm connection functions |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109445997A (en) * | 2018-06-29 | 2019-03-08 | 郑州云海信息技术有限公司 | A kind of production line test method, system, medium and the equipment of PCIE Switch product |
CN109445997B (en) * | 2018-06-29 | 2021-02-02 | 苏州浪潮智能科技有限公司 | Production line testing method, system, medium and equipment for PCIE Switch product |
US11604750B2 (en) | 2018-06-29 | 2023-03-14 | Zhengzhou Yunhai Information Technology Co., Ltd. | Production line test method, system and device for PCIE switch product, and medium |
CN109308236A (en) * | 2018-09-17 | 2019-02-05 | 郑州云海信息技术有限公司 | A kind of warm connection function test method, device and relevant device |
CN110502464A (en) * | 2019-07-26 | 2019-11-26 | 苏州浪潮智能科技有限公司 | A kind of hot-swappable processing method, device, equipment, system and readable storage medium storing program for executing |
CN113438470A (en) * | 2021-06-18 | 2021-09-24 | 苏州浪潮智能科技有限公司 | Video transcoder card dropping simulation test method, device, terminal and storage medium |
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