CN108051414B - Zoom optical tweezer two-photon microscopic imaging device and method - Google Patents
Zoom optical tweezer two-photon microscopic imaging device and method Download PDFInfo
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- CN108051414B CN108051414B CN201711242277.5A CN201711242277A CN108051414B CN 108051414 B CN108051414 B CN 108051414B CN 201711242277 A CN201711242277 A CN 201711242277A CN 108051414 B CN108051414 B CN 108051414B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N21/6456—Spatial resolved fluorescence measurements; Imaging
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/32—Micromanipulators structurally combined with microscopes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/645—Specially adapted constructive features of fluorimeters
- G01N2021/6463—Optics
Abstract
Zoom optical tweezer two-photon microscopic imaging device and method, belong to optical microscopy imaging and optical control technical field.The device that is technically characterized by comprising the steps as follows: of the invention patent includes: two-photon lighting module, two-photon scan module, two photon probing module, optical tweezer focus module and optical tweezer axial direction focusing module.The present invention increases the axial focus control being made of polarization spectroscope, quarter-wave plate, low aperture objective, Guan Jing and plane mirror in conventional optical tweezer microscopic system, realize the axial movement of optical tweezer focal plane in optical path optical tweezer Two Photon Fluorescence altogether, axial movement is realized to grab suspended sample, completes the imaging of double photon three dimension computed tomography scanning.The invention has adjustment simple, and zoom and axial Tomography Velocity are fast, and the advantage that observation is at low cost.
Description
Technical field
The present invention relates to a kind of microscopic imaging device and methods, and in particular to a kind of zoom optical tweezer two-photon micro-imaging dress
It sets with method, it can be achieved that optical path optical tweezer microscopic system separates focusing altogether, the three-dimensional two-photon scanning microscopy of completion belongs to optical microphotograph
Imaging and optical control technical field.
Background technique
In conventional objective lens formula optical tweezer microscope, light forceps device and imaging device are usually located at sample two sides, facilitate progress
Individually focusing, however (be such as added and radiate in sample side in certain microscopic observation applications for needing to be introduced into other environmental variances
Device is for studying living cells to the response mechanism of radiation), it is desirable that it is ipsilateral that optical tweezer and imaging device are located at sample, at this point, due to
Optical tweezer and three-dimensional microscopy device share same object lens, and focal plane is difficult to separate, and cannot achieve 3-D scanning imaging.In light
Zoom lens is added in tweezers system or DMD can change the focal position of optical tweezer, solves the above problems, however modulating speed is slower
Or it is expensive.
Summary of the invention
It has been given below about brief overview of the invention, in order to provide about the basic of certain aspects of the invention
Understand.It should be appreciated that this summary is not an exhaustive overview of the invention.It is not intended to determine pass of the invention
Key or pith, nor is it intended to limit the scope of the present invention.Its purpose only provides certain concepts in simplified form,
Taking this as a prelude to a more detailed description discussed later.
In consideration of it, in order to overcome the above technical problems, the present invention provides a kind of zoom optical tweezer two-photon micro-imaging dresses
It sets and method, zoom and axial Tomography Velocity not only can be improved, but also observation cost can be reduced.
Scheme one: the present invention provides a kind of zoom optical tweezer two-photon microscopic imaging device, including two-photon lighting module,
Two-photon scan module, two photon probing module, optical tweezer focus module and optical tweezer axial direction focusing module:
The two-photon lighting module according to the light direction of propagation successively are as follows: laser one, beam expanding lens;
The two-photon scan module according to the light direction of propagation successively are as follows: scanning galvanometer, scanning lens, Guan Jingyi, two
To Look mirror one, dichroscope two, object lens one;
The two photon probing module according to the light direction of propagation successively are as follows: object lens one, dichroscope two, optical filter and
PMT;
The optical tweezer focus module according to the light direction of propagation successively are as follows: Guan Jingsan, pipe mirror two, dichroscope one, two to
Look mirror two, object lens one;
The optical tweezer axial direction focusing module according to the light direction of propagation successively are as follows: laser two, conduction optical fiber, collimating mirror,
Polarization spectroscope, quarter-wave plate, object lens two and plane mirror;
The two-photon scan module, optical tweezer focus module share dichroscope one, dichroscope two and object lens one;
The optical tweezer focus module, optical tweezer axial direction focusing module share polarization spectroscope;
Sample is arranged in the lower section of object lens one.
Further: the sample (9) is that micron order or nanoscale are slender to be suspended in maximum gauge in culture dish
The sample to be tested of the almost sphericals such as born of the same parents, cell mass or particle.
Further: the optical tweezer axial direction focusing module emits one-wavelength laser wavelength between 750nm-900nm,
Two-photon lighting module emits monochromatic femtosecond laser wavelength between 950nm-1100nm, and laser pulse width is less than
150fs synthesizes optical path by dichroscope one, shares the clamping of object lens one and observation sample.
Further: the polarization spectroscope reflection light polarization direction is identical with collimating mirror outgoing light polarization direction.
Further: the plane mirror maximum axial moving range is equal to the depth of focus of object lens two.
Scheme two: a kind of zoom optical tweezer two-photon micro imaging method proposed by the present invention, this method are based on scheme one
What the zoom optical tweezer two-photon microscopic imaging device was realized, specific steps:
Step a, laser one issues pulsed femtosecond laser, and by forming wide beam directional light after beam expanding lens, wide beam is parallel
Light, which is scanned after galvanometer, scanning lens, Guan Jing, dichroscope one, dichroscope two, object lens one to be formed on sample, to be gathered
Burnt hot spot, the focal beam spot excitation sample issue fluorescence;
Step b, laser two issues laser, forms directional light by conduction optical fiber and collimating mirror, directional light is through polarization point
Light microscopic crosses quarter-wave plate and object lens two are emitted to plane mirror and generate reflection laser, and reflection laser is through quarter-wave
Piece, polarization spectroscope, Guan Jingsan, pipe mirror two, dichroscope one, dichroscope two and object lens one form focal beam spot, clamp by
Sample;
Step c, 2. setting plane mirror initial position is located at object lens two quasi- focal planes, then optical tweezer focal position is located at object
The quasi- focal plane of mirror one is 2. ', plane mirror axial scan range D is set1+D2, then corresponding to the axial scanning range of optical tweezer focusing is
D1’+D2', plane mirror position and optical tweezer focal position corresponding relationship are D1/D1'=D2/D2'=(M1M2)2;The D1It is flat
The remote burnt displacement of face reflecting mirror, D1' it is the nearly burnt displacement of optical tweezer focal position, D2For the nearly burnt displacement of plane mirror, D2' gather for optical tweezer
The remote burnt displacement in burnt position, M1For the focal length ratio of object lens two and Guan Jingsan, M2For the focal length ratio of pipe mirror two and object lens one;
Step d, the setting scanning number of plies is N, then plane mirror (18) scanning stepping is (D1+D2)/N, optical tweezer focal beam spot
Scanning stepping is (D1’+D2')/N, to realize quick three-dimensional computed tomography scanning.
The utility model has the advantages that
Optical tweezer is carried out usually using the approach before varifocal mirror or DMD modulating wave in the total optical path optical tweezer micro imaging system of tradition
System is separated with the focal plane of micro imaging system, is used for three-dimensional imaging, however has adjustment complexity, modulating speed limited and cost
Expensive drawback.The present invention is utilized by polarization spectroscope, quarter-wave plate, low aperture objective, caliber and plane mirror group
At optical tweezer focusing module, it can be achieved that in the case where objective table and motionless object lens, only seemingly by axial movement plane mirror
Optical tweezer focal plane moves axially, and completes the quick three-dimensional scanning imagery to optical tweezer crawl sample;Adjustment of the present invention is simple, can be with
Zoom and axial Tomography Velocity are improved, but also observation cost can be reduced.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of zoom optical tweezer two-photon microscopic imaging device of the invention.
Fig. 2 is zoom optical tweezer two-photon micro imaging method flow chart of the invention.
In figure: 1 laser one, 2 beam expanding lens, 3 scanning galvanometers, 4 scanning lenses, 5 pipe mirrors one, 6 dichroscopes one, 7 two to
Look mirror two, 8 object lens one, 9 samples, 10 optical filters, 11, which are collected, throws lens, 12PMT, 13 pipe mirrors two, 14 pipe mirrors three, 15 polarization
Spectroscope, 16 quarter-wave plates, 17 object lens two, 18 plane mirrors, 19 collimating mirrors, 20 conduction optical fiber, 21 lasers two.
Specific embodiment
Exemplary embodiment of the invention is described hereinafter in connection with attached drawing.For clarity and conciseness,
All features of actual implementation mode are not described in the description.It should be understood, however, that developing any this actual implementation
Much decisions specific to embodiment must be made during example, to realize the objectives of developer, for example, symbol
Restrictive condition those of related to system and business is closed, and these restrictive conditions may have with the difference of embodiment
Changed.In addition, it will also be appreciated that although development is likely to be extremely complex and time-consuming, to having benefited from the present invention
For those skilled in the art of disclosure, this development is only routine task.
Here, and also it should be noted is that, in order to avoid having obscured the present invention because of unnecessary details, in the accompanying drawings
Illustrate only with closely related apparatus structure and/or processing step according to the solution of the present invention, and be omitted and the present invention
The little other details of relationship.
Embodiment 1: a kind of zoom optical tweezer two-photon microscopic imaging device is present embodiments provided as shown in Fig. 1, is used for
It is switched fast axial position and realizes three-dimensional computed tomography scanning.
A kind of zoom optical tweezer two-photon microscopic imaging device, including including two-photon lighting module, two-photon scan module,
Two photon probing module, optical tweezer focus module and optical tweezer axial direction focusing module:
The two-photon lighting module according to the light direction of propagation successively are as follows: laser 1, beam expanding lens 2;
The two-photon scan module according to the light direction of propagation successively are as follows: scanning galvanometer 3, scanning lens 4, Guan Jingyi 5,
Dichroscope 1, dichroscope 27, object lens 1;
The two photon probing module according to the light direction of propagation successively are as follows: object lens 1, dichroscope 27, optical filter
10, collecting lens 11 and PMT12;
The optical tweezer focus module according to the light direction of propagation successively are as follows: Guan Jingsan 14, pipe mirror 2 13, dichroscope 1,
Dichroscope 27, object lens 1;
The optical tweezer axial direction focusing module according to the light direction of propagation successively are as follows: laser 2 21, conduction optical fiber 20, collimation
Mirror 19, polarization spectroscope 15, quarter-wave plate 16, object lens 2 17 and plane mirror 18;
The two-photon scan module, optical tweezer focus module share dichroscope 1, dichroscope 27 and object lens 1;
The optical tweezer focus module, optical tweezer axial direction focusing module share polarization spectroscope 15;
Sample 9 is arranged in the lower section of object lens 1.
More specifically: the object lens 2 17 are low aperture objective, and aperture is less than 0.4.
More specifically: the sample 9 is that micron order or nanoscale are slender to be suspended in maximum gauge in culture dish
The sample to be tested of the almost sphericals such as born of the same parents, cell mass or particle.
More specifically: the optical tweezer axial direction focusing module, transmitting one-wavelength laser wavelength between 750nm-900nm it
Between, two-photon lighting module emits monochromatic femtosecond laser wavelength between 950nm-1100nm, and laser pulse width is less than
150fs synthesizes optical path by dichroscope 1, shares the clamping of object lens 1 and observation sample 9.
More specifically: the polarization spectroscope 15 reflects light polarization direction and is emitted light polarization direction phase with collimating mirror 19
Together.
More specifically: the axial maximum moving range of plane mirror 18 is equal to the depth of focus of object lens 2 17.
Embodiment 2: present embodiments providing a kind of zoom optical tweezer two-photon micro imaging method as shown in Figure 1 and Figure 2,
Three-dimensional computed tomography scanning is realized for being switched fast axial position.
A kind of zoom optical tweezer two-photon micro imaging method, this method are based on the double light of zoom optical tweezer described in embodiment 1
What sub- microscopic imaging device was realized, specific steps:
Step a, laser 1 issues pulsed femtosecond laser, and by forming wide beam directional light after beam expanding lens 2, wide beam is flat
Row light is scanned after galvanometer 3, scanning lens 4, pipe mirror 5, dichroscope 1, dichroscope 27, object lens 1 in sample
Focal beam spot is formed on 9, the focal beam spot excitation sample 9 issues fluorescence;
Step b, laser 2 21 issues laser, forms directional light, directional light warp by conduction optical fiber 20 and collimating mirror 19
Polarization spectroscope 15 crosses quarter-wave plate 16 and object lens 2 17 are emitted to plane mirror 18 and generate reflection laser, reflection laser
Through quarter-wave plate 16, polarization spectroscope 15, Guan Jingsan 14, pipe mirror 2 13, dichroscope 1, dichroscope 27 and object lens
One 8 form focal beam spot, clamp sample;
Step c, 2. setting 18 initial position of plane mirror is located at object lens 2 17 quasi- focal planes, then optical tweezer focal position position
In object lens 1 quasi- focal plane 2. ', be arranged 18 axial scan range D of plane mirror1+D2, then correspond to optical tweezer and focus axial scan
Range is D1’+D2', 18 position of plane mirror and optical tweezer focal position corresponding relationship are D1/D1'=D2/D2'=(M1M2)2;Institute
State D1For the remote burnt displacement of plane mirror 18, D1' it is the nearly burnt displacement of optical tweezer focal position, D2It is displaced for the nearly coke of plane mirror 18,
D2' it is the remote burnt displacement of optical tweezer focal position, M1For the focal length ratio of object lens 2 17 and Guan Jingsan 14, M2For pipe mirror 2 13 and object lens
One 8 focal length ratio;
Step d, the setting scanning number of plies is N, then it is (D that plane mirror 17, which scans stepping,1+D2)/N, optical tweezer focal beam spot are swept
Retouching stepping is (D1’+D2')/N, to realize quick three-dimensional computed tomography scanning.
More specifically: two-photon lighting module issues laser and synthesizes by two-photon scan module with optical tweezer focus module
Optical path, reflected light enter two photon probing module, in optical tweezer axial direction focusing module, plane reflection after two-photon scan module
Mirror position 1. when, 1. corresponding optical tweezer focal position is ', plane mirror position 2. when, corresponding optical tweezer focal position is
2. ', plane mirror position 3. when, 3. corresponding optical tweezer focal position is '.
Plane mirror initial position is that 2., 2. optical tweezer two-photon focal plane initial position is ', move axially plane mirror
1. 2. 3. locate position into figure, corresponding to be changed in figure 1. through one 9 focal beam spot position of object lens generation corresponding position ' 2. ' 3. ' at
Position, plane mirror and focal plane moving distance corresponding relationship are D1/D1'=D2/D2'=(M1M2)2。
More specifically: the throw light of object lens 1 enters after dichroscope 27, optical filter 10 and collecting lens 11
PMT12, the PMT are photomultiplier tube.
Although disclosed embodiment is as above, its content is only to facilitate understand technical side of the invention
Case and the embodiment used, are not intended to limit the present invention.Any those skilled in the art to which this invention pertains, not
Under the premise of being detached from disclosed core technology scheme, any modification and change can be made in form and details in implementation
Change, but protection scope defined by the present invention, the range that the appended claims that must still be subject to limits.
Claims (6)
1. zoom optical tweezer two-photon microscopic imaging device, it is characterised in that: scan mould including two-photon lighting module, two-photon
Block, two photon probing module, optical tweezer focus module and optical tweezer axial direction focusing module:
The two-photon lighting module according to the light direction of propagation successively are as follows: laser one (1), beam expanding lens (2);
The two-photon scan module according to the light direction of propagation successively are as follows: scanning galvanometer (3), scanning lens (4), Guan Jingyi
(5), dichroscope one (6), dichroscope two (7) and object lens one (8);
The two photon probing module according to the light direction of propagation successively are as follows: object lens one (8), dichroscope two (7), optical filter
(10), collecting lens (11) and PMT (12);
The optical tweezer focus module according to the light direction of propagation successively are as follows: polarization spectroscope (15), Guan Jingsan (14), pipe mirror two
(13), dichroscope one (6), dichroscope two (7) and object lens one (8);
The optical tweezer axial direction focusing module according to the light direction of propagation successively are as follows: laser two (21), conduction optical fiber (20), collimation
Mirror (19), polarization spectroscope (15), quarter-wave plate (16), object lens two (17) and plane mirror (18);
The two-photon scan module, optical tweezer focus module share dichroscope one (6), dichroscope two (7) and object lens one
(8);
The optical tweezer focus module, optical tweezer axial direction focusing module share polarization spectroscope (15);
Sample (9) are arranged in the lower section of object lens one (8).
2. zoom optical tweezer two-photon microscopic imaging device according to claim 1, it is characterised in that: the sample
(9) maximum gauge in culture dish is micron order or nanoscale is unicellular, cell mass or particle to be suspended in, and the sample
(9) almost spherical.
3. zoom optical tweezer two-photon microscopic imaging device according to claim 1, it is characterised in that: the optical tweezer is axially adjusted
Burnt module emits one-wavelength laser wavelength between 750nm-900nm, two-photon lighting module, emits monochromatic femtosecond and swashs
For optical wavelength between 950nm-1100nm, laser pulse width is less than 150fs, synthesizes optical path by dichroscope one (6), altogether
It is clamped with object lens one (8) and observes sample (9).
4. zoom optical tweezer two-photon microscopic imaging device according to claim 1, it is characterised in that: the polarization spectroscope
(15) reflection light polarization direction is identical with collimating mirror (19) outgoing light polarization direction.
5. zoom optical tweezer two-photon microscopic imaging device according to claim 4, it is characterised in that: the plane mirror
(18) axial maximum moving range is equal to the depth of focus of object lens two (17).
6. zoom optical tweezer two-photon micro imaging method, this method is double based on any zoom optical tweezer in Claims 1 to 5
What photon microscopic imaging device was realized, it is characterised in that: specific steps:
Step a, laser one (1) issues pulsed femtosecond laser, and by forming wide beam directional light after beam expanding lens (2), wide beam is flat
Row light is scanned galvanometer (3), scanning lens (4), Guan Jingyi (5), dichroscope one (6), dichroscope two (7), object lens one
(8) focal beam spot is formed after on sample (9), focal beam spot excitation sample (9) issues fluorescence;
Step b, laser two (21) issues laser, forms directional light, directional light by conduction optical fiber (20) and collimating mirror (19)
Quarter-wave plate (16) are crossed through polarization spectroscope (15) and object lens two (17) are emitted to plane mirror (18), through plane reflection
Laser after mirror (18) reflection is through quarter-wave plate (16), polarization spectroscope (15), Guan Jingsan (14), pipe mirror two (13), two
Focal beam spot is formed to Look mirror one (6), dichroscope two (7) and object lens one (8), clamps sample (9);
Step c, 2. setting plane mirror (18) initial position is located at object lens two (17) quasi- focal planes, then optical tweezer focal position position
In object lens one (8) quasi- focal plane 2. ', be arranged plane mirror (18) axial scan range D1+D2, then correspond to optical tweezer focus axial direction
Scanning range is D1 '+D2 ', plane mirror (18) position and optical tweezer focal position corresponding relationship be D1/D1 '=D2/D2 '=
(M1M2)2;The D1 is plane mirror (18) remote burnt displacement, and D1 ' is the nearly burnt displacement of optical tweezer focal position, and D2 is plane reflection
The nearly burnt displacement of mirror (18), D2 ' are the remote burnt displacement of optical tweezer focal position, and M1 is the focal distance ratio of object lens two (17) and Guan Jingsan (14)
Value, M2 are the focal length ratio of pipe mirror two (13) and object lens one (8);
Step d, the setting scanning number of plies is N, then plane mirror (18) scanning stepping is (D1+D2)/N, and optical tweezer focal beam spot is swept
Retouching stepping is (D1 '+D2 ')/N, to realize quick three-dimensional computed tomography scanning.
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CN111678895B (en) * | 2020-05-30 | 2021-09-21 | 华南理工大学 | Near-infrared two-photon and three-photon polychromatic light optical imaging system and method |
CN112099218B (en) * | 2020-09-18 | 2021-05-28 | 吉林大学 | Femtosecond laser system image focusing method |
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