CN108051409A - Transmissivity measurement method in glass spectrum - Google Patents
Transmissivity measurement method in glass spectrum Download PDFInfo
- Publication number
- CN108051409A CN108051409A CN201711238029.3A CN201711238029A CN108051409A CN 108051409 A CN108051409 A CN 108051409A CN 201711238029 A CN201711238029 A CN 201711238029A CN 108051409 A CN108051409 A CN 108051409A
- Authority
- CN
- China
- Prior art keywords
- sample
- glass
- testing
- thin
- optical system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention belongs to glass technical field of measurement and test, specifically disclose a kind of Transmissivity measurement method in glass spectrum, it is intended to which how solve the problems, such as, which reduces measurement error, makes measured value closer to actual value.Transmissivity measurement method in the glass spectrum, including sampling procedure, spectroscopic step and measuring process, measuring process：Zero point and 100% point calibration are carried out by placing the equal thin sample of one piece of thickness respectively in optical system for testing and reference path during base line measurement, is measured when spectral transmittance measures by the thin sample in thick sample replacement test light path.It is measured by this method, when enabling to the reference path to make baseline and spot size that when measurement is incident upon on detector position and position does not change, and optical system for testing projection spot size on the detector and position change very little after the thin sample in optical system for testing is replaced by thick sample, essentially eliminate specimen holder placement location it is undesirable caused by error, transmitance is closer to actual value in the glass spectrum measured.
Description
Technical field
The invention belongs to glass technical field of measurement and test, and in particular to a kind of Transmissivity measurement method in glass spectrum.
Background technology
Transmitance is to weed out example interface reflection loss so as to reflect that inside glass really penetrates situation in glass spectrum
Index.At present, international measuring method is saturating transmittance spectrum method of testing in double light path, including sampling procedure, is divided
Light step and measuring process；
Sampling procedure：The two piece samples different by cutting thickness on same glass, and in same state by two pieces
Sample processing it is rectangular, depending on the length and width visual equipment specimen holder size of sample, thickness be respectively 5 ± 0.05mm and 15 ±
0.05mm；The light pass surface of two pieces of samples should be ground and polish, surface roughness Ra=0.012, flatness N=3, Δ N=with disk
0.5, the depth of parallelism is less than 2 ', remaining each face fine grinding；
Spectroscopic step：Same light source is divided by double light path, i.e. optical system for testing and reference light using double pass spectrometer
Road, this two-way light beam because from same light source so as the state of the property of light beam is, i.e., simultaneously in convergence or hair
Scattered two states, both certain states be not it is obvious that both well-done states of opticians are smaller, but
It is not absolute parallel to all optic spectrum lines；
Measuring process：First, the empty survey of baseline and zero point and 100% point school are carried out to optical system for testing and reference path respectively
Just；Then, the sample of 5mm and 15mm thickness are respectively put by specimen holder by reference path and optical system for testing, while in double light path
On tested to obtain spectral transmittance, then eliminate surface reflection loss the thickness difference meter of thin sample can be subtracted according to thick sample
Calculation obtains transmitance in the spectrum of glass.
Variation due to the de minimis energy that may occur among test can be eliminated using double light path so as to improve test
The precision of transmitance.But due to the impossible absolute ideal in position that specimen holder is in, sample after sample is placed on specimen holder
Plane is not absolute parallel with detector, therefore beats to beat when facula position on the detector and size are surveyed with baseline sky and detect
Facula position and cause not of uniform size on device, i.e., in reference path, facula position that baseline is empty to be projected on the detector when surveying with
The facula position projected on the detector during actual measurement is different, while on optical path, due to the sample of placement
It is thicker, the facula position that baseline sky projects on the detector when surveying and the hot spot position projected on the detector during actual measure
It is also different to put, and so can bring about larger measurement error.
The content of the invention
The present invention provides a kind of Transmissivity measurement methods in glass spectrum, it is intended to which how solution, which reduces measurement error, makes survey
The problem of magnitude is closer to actual value.
The technical solution adopted by the present invention to solve the technical problems is：Transmissivity measurement method in glass spectrum, including
Sampling procedure, spectroscopic step and measuring process；
Sampling procedure：Thin sample and thick sample are cut on same glass, and to thin sample and thickness under same state
Sample is handled；Wherein, the quantity of thin sample is two or more than two, and the thickness of each piece of thin sample is equal；Thick sample
At least one piece, and the thickness of thick sample is more than the thickness of thin sample；
Spectroscopic step：It is optical system for testing and reference path to be divided same light source using spectroscopic instruments, and in optical system for testing
Detector is set with the end of reference path；
Measuring process：Base line measurement is carried out first, and one is placed respectively in optical system for testing and reference path using specimen holder
After the thin sample of block, zero point and 100% point calibration are carried out to optical system for testing and reference path；Then, it will be in and surveyed by thick sample
Thin sample in examination light path replaces, while spectral transmittance measurement is carried out on optical system for testing and reference path；Finally, eliminate
Glass surface reflects and transmitance in the spectrum of glass is calculated according to the thickness difference of thick sample and thin sample.
It is further that the thickness of thin sample is 5 ± 0.05mm, and the thickness of thick sample is 15 ± 0.05mm.
It is further in sampling procedure, the light pass surface of each piece of thin sample and thick sample grind and polish with disk,
Fine grinding is carried out to remaining each face of each piece of thin sample and thick sample in addition to light pass surface.
It is further surface roughness Ra=0.012 of the light pass surface of each piece of thin sample and thick sample, flatness N=
3rd, Δ N=0.5, the depth of parallelism are less than 2 '.
It is further that in spectroscopic step, used spectroscopic instruments are double pass spectrometer.
The beneficial effects of the invention are as follows：It is thin by placing one piece respectively in optical system for testing and reference path during base line measurement
Sample carries out zero point and 100% point calibration, and when enabling to the reference path to make baseline and when measurement is incident upon on detector position
Spot size and position do not change, and the thin sample in optical system for testing by thick sample replace after optical system for testing be incident upon spy
The spot size and position surveyed on device change very little, essentially eliminate specimen holder placement location it is undesirable caused by error, survey
Glass spectrum in transmitance closer to actual value.
Description of the drawings
Working state schematic representation when Fig. 1 is base line measurement；
Working state schematic representation when Fig. 2 is spectral transmittance measurement；
In figure mark for：Thin sample 110, thick sample 120, reference path 200, optical system for testing 300, specimen holder 400.
Specific embodiment
The present invention is further illustrated with reference to the accompanying drawings and examples.
Transmissivity measurement method in glass spectrum, including sampling procedure, spectroscopic step and measuring process；
Sampling procedure：Thin sample 110 and thick sample 120 are cut on same glass, and to thin sample under same state
Product 110 and thick sample 120 are handled；Wherein, the quantity of thin sample 110 is two or more than two, and each piece thin sample 110
Thickness it is equal；Thick sample 120 is at least one piece, and the thickness of thick sample 120 is more than the thickness of thin sample 110；It it is preferred that will be thin
Thickness difference between sample 110 and thick sample 120 is controlled in 10 ± 5mm；Generally, by each piece thin sample 110 and thick sample 120 all
The rectangular cuboid of light pass surface is processed into, the length and width of sample is depending on measuring instrument and the size of specimen holder 400；It should
In step, it is preferred to use in the following manner handles thin sample 110 and thick sample 120, i.e., to each piece thin sample 110 and thick sample
The light pass surface of product 120 grind and polish with disk, each to each piece thin sample 110 and 120 remaining in addition to light pass surface of thick sample
Face carries out fine grinding；After processing, generally require the surface roughness Ra of the light pass surface for making each piece thin sample 110 and thick sample 120=
0.012, flatness N=3, Δ N=0.5, the depth of parallelism are less than 2 '；
Spectroscopic step：It is optical system for testing 300 and reference path 200 to be divided same light source using spectroscopic instruments, and is being surveyed
The end for trying light path 300 and reference path 200 sets detector；In the step, used spectroscopic instruments are preferably double light path
Spectrophotometer；
Measuring process：Base line measurement is carried out first, with reference to shown in Fig. 1, using specimen holder 400 in optical system for testing 300 and ginseng
It examines after placing one piece thin sample 110 in light path 200 respectively, zero point and 100% is carried out to optical system for testing 300 and reference path 200
Point calibration；Then, the thin sample 110 in optical system for testing 300 is replaced by thick sample 120, while in optical system for testing
300 and reference path 200 on carry out spectral transmittance measurement, with reference to shown in Fig. 2；Finally, glass surface reflection and basis are eliminated
Transmitance in the spectrum of glass is calculated in the thickness difference of thick sample 120 and thin sample 110.
Embodiment
Transmissivity measurement in spectrum is carried out to certain block glass using measuring method provided by the invention, is comprised the following steps：
Sampling procedure：Two pieces thin sample 110 and one piece thick sample 120 are cut at same position on to be measured block of glass,
The thickness of two pieces thin sample 110 is 5 ± 0.05mm, and the thickness of thick sample 120 is 15 ± 0.05mm；It is and right under same state
Thin sample 110 and thick sample 120 are handled；It is rectangular that each piece thin sample 110 and thick sample 120 are all processed into light pass surface
Cuboid, and the light pass surface of each piece thin sample 110 and thick sample 120 grind and polish with disk, make each piece thin sample 110
Reach claimed below with the light pass surface of thick sample 120：Surface roughness Ra=0.012, flatness N=3, Δ N=0.5 are parallel
Degree is less than 2 '；Fine grinding is carried out to each piece thin sample 110 and each face of 120 remaining in addition to light pass surface of thick sample；
Spectroscopic step：Same light source is divided as optical system for testing 300 and reference path using double pass spectrometer
200, and detector is set in the end of optical system for testing 300 and reference path 200；
Measuring process：Base line measurement is carried out first, is divided using specimen holder 400 in optical system for testing 300 and reference path 200
Zero point and 100% point calibration Fang Zhi not be carried out to optical system for testing 300 and reference path 200 after one piece thin sample 110；Then, lead to
Blocked up sample 120 replaces the thin sample 110 in optical system for testing 300, while in optical system for testing 300 and reference path
Spectral transmittance measurement is carried out on 200, with reference to shown in Fig. 2；Finally, eliminate watch crystal reflection and according to thick sample 120 with it is thin
Transmitance in the spectrum of glass is calculated in the thickness difference of sample 110, and measurement result see the table below 1.The spectrum that 1 embodiment of table measures
Interior Transmissivity measurement result
| Wavelength (nm) | Transmitance (%T) | Wavelength (nm) | Transmitance (%T) |
| 800 | 99.2 | 790 | 99.2 |
| 780 | 99.2 | 770 | 99.2 |
| 760 | 99.2 | 750 | 99.2 |
| 740 | 99.1 | 730 | 99.1 |
| 720 | 99.2 | 710 | 99.1 |
| 700 | 99.2 | 690 | 99.2 |
| 680 | 99.2 | 670 | 99.3 |
| 660 | 99.2 | 650 | 99.2 |
| 640 | 99.3 | 630 | 99.4 |
| 620 | 99.3 | 610 | 99.3 |
| 600 | 99.6 | 590 | 99.6 |
| 580 | 99.6 | 570 | 99.7 |
| 560 | 99.7 | 550 | 99.7 |
| 540 | 99.7 | 530 | 99.7 |
| 520 | 99.7 | 510 | 99.7 |
| 500 | 99.7 | 490 | 99.7 |
| 480 | 99.7 | 470 | 99.6 |
| 460 | 99.5 | 450 | 99.5 |
| 440 | 99.2 | 430 | 99.0 |
| 420 | 98.8 | 410 | 98.6 |
| 400 | 98.2 | 390 | 97.5 |
| 380 | 96.8 | 370 | 94.8 |
| 360 | 91.3 | 350 | 86.5 |
| 340 | 78.4 | 330 | 66.4 |
| 320 | 47.1 | 310 | 20.1 |
| 300 | 2.7 |
Comparative example
Light is carried out to the glass to be measured described in embodiment using saturating transmittance spectrum method of testing in international double light path
Transmissivity measurement in spectrum, comprises the following steps：
Sampling procedure：Cut at same position on to be measured block of glass two pieces of thickness be respectively 5 ± 0.05mm and 15 ±
The sample of 0.05mm, and it is in same state that two pieces of samples processing are rectangular, and the length and width of sample regards measuring instrument and sample
Depending on the size of product frame 400；The light pass surface of two pieces of samples is ground and is polished, surface roughness Ra=0.012, flatness N with disk
=3, Δ N=0.5, the depth of parallelism are less than 2 ', remaining each face fine grinding；
Spectroscopic step：Using the double pass spectrometer and light source used in embodiment, double pass spectrometer is utilized
It is optical system for testing 300 and reference path 200 by light source light splitting, and sets and visit in the end of optical system for testing 300 and reference path 200
Survey device；
Measuring process：First, the empty survey of baseline and zero point and 100% are carried out to optical system for testing 300 and reference path 200 respectively
Point calibration；Then, the sample of 5 ± 0.05mm and 15 ± 0.05mm thickness are respectively put by specimen holder 400 by 200 He of reference path
Optical system for testing 300, while measure on double light path to obtain spectral transmittance, then eliminate surface reflection loss can be according to 15
Transmitance in the spectrum of glass, measurement result is calculated in the thickness difference that ± 0.05mm thickness samples subtract 5 ± 0.05mm thickness samples
It see the table below 2.
Transmissivity measurement result in the spectrum that 2 comparative example of table measures
It is analyzed by software emulation, it is known that two piece glass samples of the thickness difference within ± 0.1mm, thickness difference is in glass
The influence of transmitance is on position very much；Therefore, if two piece glass sample treatment process phases of the thickness difference within ± 0.1mm
Together, then thickness difference influences can be neglected, it is believed that the optical states of the two glass samples are consistent.
Because embodiment and comparative example are measured using same double pass spectrometer and light source, it is possible to
As the state for thinking the property of 300 light beam of reference path 200 and optical system for testing of embodiment and comparative example is, and sample is thick
Degree difference is ± 0.05mm, and thickness difference influences negligible；It is therefore contemplated that the experiment condition of embodiment and comparative example is basic
Unanimously.The measurement result of comparative analysis Tables 1 and 2, it is known that 2 data of table transmitance in the spectrum of 530nm glass has been more than
100%, other points are such as：The data of 520nm, 540nm, 550nm, 570nm are 99.9%, this is unreasonable；In contrast,
It is more rationally more close with transmitance in the actual spectrum of glass from the point of view of 1 data of table.
Claims (5)
1. Transmissivity measurement method in glass spectrum, including sampling procedure, spectroscopic step and measuring process；It is characterized in that：
Sampling procedure：Thin sample (110) and thick sample (120) are cut on same glass, and to thin sample under same state
Product (110) and thick sample (120) are handled；Wherein, the quantity of thin sample (110) is two or more than two, and each piece thin
The thickness of sample (110) is equal；Thick sample (120) is at least one piece, and the thickness of thick sample (120) is more than thin sample (110)
Thickness；
Spectroscopic step：It is optical system for testing (300) and reference path (200) to be divided same light source using spectroscopic instruments, and is being surveyed
The end for trying light path (300) and reference path (200) sets detector；
Measuring process：Base line measurement is carried out first, using specimen holder (400) in optical system for testing (300) and reference path (200)
After placing one piece thin sample (110) respectively, zero point and 100% point school are carried out to optical system for testing (300) and reference path (200)
Just；Then, the thin sample (110) in optical system for testing (300) is replaced by thick sample (120), while in test light
Spectral transmittance measurement is carried out on road (300) and reference path (200)；Finally, glass surface reflection is eliminated and according to thick sample
(120) transmitance in the spectrum of glass is calculated with the thickness difference of thin sample (110).
2. Transmissivity measurement method in glass spectrum as described in claim 1, it is characterised in that：The thickness of thin sample (110)
For 5 ± 0.05mm, the thickness of thick sample (120) is 15 ± 0.05mm.
3. Transmissivity measurement method in glass spectrum as claimed in claim 1 or 2, it is characterised in that：In sampling procedure, to each
The light pass surface of the thin sample of block (110) and thick sample (120) grind and polish with disk, to each piece thin sample (110) and thick sample
Each face of remaining of product (120) in addition to light pass surface carries out fine grinding.
4. Transmissivity measurement method in glass spectrum as claimed in claim 3, it is characterised in that：Each piece thin sample (110) and
Surface roughness Ra=0.012 of the light pass surface of thick sample (120), flatness N=3, Δ N=0.5, the depth of parallelism are less than 2 '.
5. Transmissivity measurement method in glass spectrum as claimed in claim 1 or 2, it is characterised in that：In spectroscopic step, adopted
Spectroscopic instruments are double pass spectrometer.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711238029.3A CN108051409A (en) | 2017-11-30 | 2017-11-30 | Transmissivity measurement method in glass spectrum |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711238029.3A CN108051409A (en) | 2017-11-30 | 2017-11-30 | Transmissivity measurement method in glass spectrum |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108051409A true CN108051409A (en) | 2018-05-18 |
Family
ID=62120911
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711238029.3A Pending CN108051409A (en) | 2017-11-30 | 2017-11-30 | Transmissivity measurement method in glass spectrum |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108051409A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109115730A (en) * | 2018-11-02 | 2019-01-01 | 天津津航技术物理研究所 | Spectral transmittance test macro and method based on tunable laser |
| CN112229798A (en) * | 2020-10-20 | 2021-01-15 | 蚌埠中光电科技有限公司 | General sample frame of spectrophotometer |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102053080A (en) * | 2010-12-06 | 2011-05-11 | 山东大学 | Testing method for eliminating fluorescence internal filtration effects by using corrector formula |
| CN103018012A (en) * | 2012-12-07 | 2013-04-03 | 中国科学院光电研究院 | Measuring method and device for transmittance of optical element |
| CN103792169A (en) * | 2014-01-24 | 2014-05-14 | 西安科技大学 | Method for measuring concentration of pulverized coal turbid liquid |
-
2017
- 2017-11-30 CN CN201711238029.3A patent/CN108051409A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102053080A (en) * | 2010-12-06 | 2011-05-11 | 山东大学 | Testing method for eliminating fluorescence internal filtration effects by using corrector formula |
| CN103018012A (en) * | 2012-12-07 | 2013-04-03 | 中国科学院光电研究院 | Measuring method and device for transmittance of optical element |
| CN103792169A (en) * | 2014-01-24 | 2014-05-14 | 西安科技大学 | Method for measuring concentration of pulverized coal turbid liquid |
Non-Patent Citations (2)
| Title |
|---|
| 3354102: "《紫外分光光度计固体样品测定培训》", 10 June 2016 * |
| 中国国家标准化管理委员会 等: "《GB/T7962.12-2010 无色光学玻璃测试方法，第12部分：光谱内透射比》", 14 January 2011 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109115730A (en) * | 2018-11-02 | 2019-01-01 | 天津津航技术物理研究所 | Spectral transmittance test macro and method based on tunable laser |
| CN112229798A (en) * | 2020-10-20 | 2021-01-15 | 蚌埠中光电科技有限公司 | General sample frame of spectrophotometer |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4207892A (en) | Method and apparatus for the diagnosis of tissue samples | |
| WO2016131396A1 (en) | Device for detecting surface stress of glass | |
| CN109001207A (en) | The detection method and detection system of a kind of transparent material surface and internal flaw | |
| US6268914B1 (en) | Calibration Process For Birefringence Measurement System | |
| CN103575701A (en) | Transparent material refractive index and thickness measurement method and device based on frequency domain OCT (optical coherence tomography) | |
| JP5698863B2 (en) | Method and apparatus for measuring refractive index | |
| Riviere et al. | Multispectral polarized BRDF: design of a highly resolved reflectometer and development of a data inversion method. | |
| CN108051409A (en) | Transmissivity measurement method in glass spectrum | |
| Thomas et al. | Laser Raman spectroscopic measurements of water in unexposed glass inclusions | |
| CN103543129B (en) | The measurement apparatus of optical glass optical homogeneity and measuring method | |
| US10627227B2 (en) | Optical device for characterization of a sample | |
| US9194798B2 (en) | Imaging based refractometer for hyperspectral refractive index detection | |
| US9574968B2 (en) | Methods and systems for using low-emissivity slides for spectral histopathology (SHP) and spectral cytopathology (SCP) | |
| CN109001182A (en) | The Raman spectrum non-destructive determination method of alcohol content in closed container | |
| CN109115682A (en) | A kind of spectrometer and its detection method for taking into account liquid and solid content detection | |
| WO2021130757A1 (en) | Combined ocd and photoreflectance method and system | |
| Pospergelis | Spectroscopic Measurements of the Four Stokes Parameters for Light Scattered by Natural Objects. | |
| CN206557092U (en) | A kind of measurement apparatus of Refractive Index of Material | |
| CN109596036A (en) | A kind of glass sample right angle test device and its test method | |
| Theocaris et al. | Stress intensity factors from reflected caustics in birefringent plates with cracks | |
| CN108398098A (en) | A kind of optical surface spacing non-contact measurement apparatus and method | |
| Baker | Metrics for high-quality specular surfaces | |
| CN203455277U (en) | Measuring device for optical homogeneity of optical glass | |
| Pluta | Variable wavelength interferometry of birefringent retarders | |
| Weidner | Spectral reflectance |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180518 |
|
| RJ01 | Rejection of invention patent application after publication |