CN108020339A - A kind of thermal resistance measuring circuit for exempting from input calibration - Google Patents

A kind of thermal resistance measuring circuit for exempting from input calibration Download PDF

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Publication number
CN108020339A
CN108020339A CN201711431799.XA CN201711431799A CN108020339A CN 108020339 A CN108020339 A CN 108020339A CN 201711431799 A CN201711431799 A CN 201711431799A CN 108020339 A CN108020339 A CN 108020339A
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CN
China
Prior art keywords
input
thermal resistance
exempting
measuring circuit
analog switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711431799.XA
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Chinese (zh)
Inventor
万驹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangzhou Xi Tai Automatic Control Equipment Co Ltd
Original Assignee
Guangzhou Xi Tai Automatic Control Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guangzhou Xi Tai Automatic Control Equipment Co Ltd filed Critical Guangzhou Xi Tai Automatic Control Equipment Co Ltd
Priority to CN201711431799.XA priority Critical patent/CN108020339A/en
Publication of CN108020339A publication Critical patent/CN108020339A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements

Abstract

The invention discloses a kind of thermal resistance measuring circuit for exempting from input calibration, including input unit, analog switch unit and microcontroller, input unit includes power supply, first resistor, second resistance and treats bolometric, and power supply is respectively with first resistor, second resistance and treating that bolometric is connected;The first input end of analog switch unit is respectively with first resistor, second resistance and treating that one end of bolometric is connected;Second input terminal of analog switch unit is respectively with first resistor, second resistance and treating that the other end of bolometric is connected;The first output terminal and the second output terminal of analog switch unit are connected with the input terminal of microcontroller respectively;The first control terminal and the second control terminal of analog switch unit are connected with the output terminal of microcontroller respectively.The thermal resistance measuring circuit provided by the invention for exempting from input calibration, it inputs without demarcating, has saved the time, improves production efficiency;Effectively avoid mistake and failure caused by artificial origin.

Description

A kind of thermal resistance measuring circuit for exempting from input calibration
Technical field
The present invention relates to a kind of thermal resistance measuring circuit for exempting from input calibration.
Background technology
Intelligent thermal resistance measuring device, such as:Various thermal resistance temperature transmitters, resistance and temperature display, are going out It is required for calibration to input before factory.Calibration input refers to precision resistance case difference zero setting resistance, full scale resistance, intelligent heat Electric resistance measuring apparatus records resistance value at this time as benchmark.Such a method is than time-consuming, to calibration facility and personnel It is it is required that high.
The content of the invention
In view of the shortcomings of the prior art, exempt to input the thermal resistance measuring circuit demarcated the object of the present invention is to provide a kind of, It is inputted without demarcating, and has been saved the time, improves production efficiency;Effectively avoid mistake and failure caused by artificial origin.
To achieve the above object, the present invention provides a kind of thermal resistance measuring circuit for exempting from input calibration, including input are single Member, analog switch unit and microcontroller, input unit include power supply, first resistor, second resistance and treat bolometric, power supply Respectively with first resistor, second resistance and treating that bolometric is connected;The first input end of analog switch unit is electric with first respectively Resistance, second resistance are connected with the one end for treating bolometric;Second input terminal of analog switch unit respectively with first resistor, second Resistance is connected with the other end for treating bolometric;The first output terminal and the second output terminal of analog switch unit respectively with microcontroller The input terminal connection of device;The first control terminal and the second control terminal of analog switch unit connect with the output terminal of microcontroller respectively Connect.
Compared with prior art, the thermal resistance measuring circuit disclosed by the invention for exempting from input calibration, passes through microcontroller Output control analog switch unit, makes the input of analog switch respectively be first resistor, second resistance and testing resistance two The voltage at end, and the voltage signal is exported to microcontroller, using the microcontroller with analog-digital conversion function, microcontroller By the signal processing and calculate, you can testing resistance resistance value is calculated;This exempts from the thermal resistance measuring circuit of input calibration, its nothing Input need to be demarcated, has been saved the time, improves production efficiency;Effectively avoid mistake and failure caused by artificial origin.
Another embodiment according to the present invention, thermal resistance measuring circuit further comprise signal amplifier, and signal is put The input terminal of big device is connected with the first output terminal of analog switch unit and the second output terminal respectively;The output terminal of signal amplifier It is connected with the input terminal of microcontroller.
Another embodiment according to the present invention, thermal resistance measuring circuit further comprise a/d converter, a/d converter Input terminal and the output terminal of signal amplifier connect, the input terminal of the output terminal of a/d converter and microcontroller connects.
Another embodiment according to the present invention, power supply are DC constant flowing power.
Another embodiment according to the present invention, power supply 0.1-1mA.
Another embodiment according to the present invention, first resistor are full scale reference resistance;Second resistance is zero degree benchmark Resistance.
Another embodiment according to the present invention, signal amplifier are programmable signal amplifying circuit.
Another embodiment according to the present invention, precision≤0.02% of first resistor, temperature drift≤10ppm/ DEG C; Precision≤0.02% of second resistance, temperature drift≤10ppm/ DEG C.
The invention has the advantages that:By the output control analog switch unit of microcontroller, make analog switch Input respectively be the voltage of first resistor, second resistance and testing resistance both ends, and the voltage signal is exported to can Program amplifier;Processing is amplified, voltage signal is converted into corresponding digital quantity through a/d converter after, is stored in microcontroller In depositing, microcontroller is calculated so as to obtain the resistance value of testing resistance.This exempts from the thermal resistance measuring circuit of input calibration, it is without mark Fixed input, has been saved the time, improves production efficiency;Effectively avoid mistake and failure caused by artificial origin;Meanwhile using this Measuring circuit can offset zero point and full scale drift, measurement result precision higher.
Below in conjunction with the attached drawing in the embodiment of the present invention, the technical solution in the embodiment of the present invention is carried out clear, complete Site preparation describes, it is clear that described embodiment is only part of the embodiment of the present invention, instead of all the embodiments.It is based on Embodiment in the present invention, those of ordinary skill in the art are obtained every other without creative efforts Embodiment, belongs to the scope of protection of the invention.
Brief description of the drawings
Fig. 1 is the circuit diagram for the thermal resistance measuring circuit for exempting from input calibration that embodiment 1 provides.
Embodiment
Embodiment 1
It is the circuit diagram provided in this embodiment for exempting from the thermal resistance measuring circuit that input is demarcated referring to Fig. 1.This exempts from input mark Fixed thermal resistance measuring circuit includes:Input unit, analog switch unit U1, signal amplifier U2, a/d converter U3 and micro-control Device U4 processed.
In the present embodiment, signal amplifier U2 is pga circuit, i.e. PGA.
Input unit includes power supply, first resistor RS, second resistance RZ and treats bolometric Ri, and power supply is electric with first respectively Hinder RS, second resistance RZ and treat that bolometric Ri connects.
The pin X1 of the first input end of the analog switch unit U1 and pin Y1 of the second input terminal respectively with first resistor The both ends connection of RS;The pin X2 of the first input end of the analog switch unit U1 and pin Y2 of the second input terminal is respectively with second The both ends connection of resistance RZ;The pin X3 of the first input end of the analog switch unit U1 and pin Y3 of the second input terminal respectively with Treat the both ends connection of bolometric Ri;The first output terminal of the first control terminal A and microcontroller U4 of analog switch unit U1 connect Connect, the second control terminal B of analog switch unit U1 and the second output terminal of microcontroller connect;The first of analog switch unit U1 is defeated The input terminal of outlet X and the second output terminal Y respectively with signal amplifier U23 is connected;The output terminal of signal amplifier U2 turns with AD The input terminal connection of parallel operation U3, the output terminal of a/d converter U3 are connected with the input terminal of microcontroller U4.
In the present embodiment, the first control terminal A and the second control terminal B of analog switch unit U1 are gating control terminal.
In the present embodiment, power supply is DC constant flowing power, power supply 0.1-1mA.First resistor is full scale reference resistance; Second resistance is zero degree reference resistance;Precision≤0.02% of first resistor, temperature drift≤10ppm/ DEG C;The essence of second resistance Degree≤0.02%, temperature drift≤10ppm/ DEG C.
The workflow of the present embodiment is as follows:
1st, the first control terminal output low level of microcontroller U4, the second control terminal input low level, the of analog switch One control terminal A and the second control terminal receive low level signal respectively, make the pin X1 of the first input end of analog switch unit U1 Conducting, the second input terminal pin Y1 conductings;The both ends of first resistor RS are by access analog switch unit U1, analog switch unit U1 The positive and negative both ends of voltage VS, VS in output first resistor are linked into signal amplifier U2 and are amplified processing, turn by AD Parallel operation U3 is converted into corresponding digital quantity ADS, is stored in the memory of microcontroller U4.
2nd, the first control terminal output high level, the second control terminal input low level of microcontroller U4, the of analog switch One control terminal A receives the high level signal, and the second control terminal receives the low level signal, makes that analog switch unit U1's is first defeated Enter pin X2 conductings, the second input terminal pin Y2 conductings at end;The both ends of second resistance RZ are by access analog switch unit U1, mould The positive and negative both ends of voltage VZ, VZ in plan switch element U1 output second resistances are linked into signal amplifier U2 and are amplified place Reason, is converted into corresponding digital quantity ADZ by a/d converter U3, is stored in the memory of microcontroller U4.
3rd, the first control terminal output low level of microcontroller U4, the second control terminal input high level, the of analog switch One control terminal A receives the low level signal, and the second control terminal receives the high level signal, makes that analog switch unit U1's is first defeated Enter pin X3 conductings, the second input terminal pin Y3 conductings at end;The both ends of bolometric Ri are treated by access analog switch unit U1, Analog switch unit U1 outputs treat that the positive and negative both ends of voltage Vi, Vi on bolometric Ri are linked into signal amplifier U2 progress Enhanced processing, is converted into corresponding digital quantity ADi by a/d converter U3, is stored in the memory of microcontroller U4.
4th, since RZ and RS are resistance values it is known that microcontroller U4 is calculated the resistance value of Ri by formula.Formula is:Ri= (ADi-ADZ)/(ADS-ADZ) * (RS-RZ)+RZ.
Even if can be seen that PGA and A/D converter from above-mentioned calculation formula occurs null offset, ADi, ADZ, ADS be through Cross what same PGA and A/D converter were got, their null offset amount be it is identical, then (Vi-VZ)/(VS-VZ) point Son and denominator can subtract null offset automatically by doing subtraction.As a same reason, if the amplification factor of PGA and A/D converter by Time and temperature influence to produce drift, then Vi, VZ, VS are by same PGA and A/D converter, and molecule and denominator are put Big multiple all changes at the same time, after molecule denominator is divided by, can also balance out the drift of PGA amplification factors.
The thermal resistance measuring circuit provided in this embodiment for exempting from input calibration, is simulated by the output control of microcontroller U4 Switch element U1, makes the input of analog switch respectively be the voltage of first resistor, second resistance and testing resistance both ends, and The voltage signal is exported to programmable amplifier;Processing is amplified, is converted into voltage signal pair through a/d converter after Digital quantity is answered, is stored in microcontroller memory, microcontroller U4 is calculated so as to obtain the resistance value of testing resistance.This exempts from input calibration Thermal resistance measuring circuit, it inputs without demarcating, has saved the time, improves production efficiency;Effectively avoid caused by artificial origin Mistake and failure;Meanwhile zero point and full scale drift, measurement result precision higher can be offset using the measuring circuit.
Although the present invention is disclosed above with preferred embodiment, the scope that the present invention is implemented is not limited to.Any The those of ordinary skill in field, in the invention scope for not departing from the present invention, improves when can make a little, i.e., every according to this hair Bright done equal improvement, should be the scope of the present invention and is covered.

Claims (8)

  1. A kind of 1. thermal resistance measuring circuit for exempting from input calibration, it is characterised in that including:Input unit, analog switch unit and Microcontroller, the input unit include power supply, first resistor, second resistance and treat bolometric, the power supply respectively with institute State first resistor, the second resistance and it is described treat bolometric connect;The first input end difference of the analog switch unit It is connected with the first resistor, the second resistance and described one end for treating bolometric;The second of the analog switch unit Input terminal is connected with the first resistor, the second resistance and the other end for treating bolometric respectively;The simulation is opened The input terminal of the first output terminal and the second output terminal of unit respectively with the microcontroller is closed to be connected;The analog switch unit Output terminal respectively with the microcontroller of the first control terminal and the second control terminal be connected.
  2. 2. the thermal resistance measuring circuit as claimed in claim 1 for exempting from input calibration, it is characterised in that the thermal resistance measurement electricity Road further comprises signal amplifier, input terminal the first output with the analog switch unit respectively of the signal amplifier End is connected with the second output terminal;The output terminal of the signal amplifier is connected with the input terminal of the microcontroller.
  3. 3. the thermal resistance measuring circuit as claimed in claim 2 for exempting from input calibration, it is characterised in that the thermal resistance measurement electricity Road further comprises a/d converter, and the input terminal of the a/d converter is connected with the output terminal of the signal amplifier, the AD The output terminal of converter is connected with the input terminal of the microcontroller.
  4. 4. the thermal resistance measuring circuit as claimed in claim 1 for exempting from input calibration, it is characterised in that the power supply is permanent for direct current Galvanic electricity source.
  5. 5. the thermal resistance measuring circuit as claimed in claim 4 for exempting from input calibration, it is characterised in that the power supply is 0.1- 1mA。
  6. 6. the thermal resistance measuring circuit as claimed in claim 1 for exempting from input calibration, it is characterised in that the first resistor is full Spend reference resistance;The second resistance is zero degree reference resistance.
  7. 7. the as claimed in claim 2 thermal resistance measuring circuit for exempting from input calibration, it is characterised in that the signal amplifier is Programmable signal amplifying circuit.
  8. 8. the thermal resistance measuring circuit as claimed in claim 1 for exempting from input calibration, it is characterised in that the essence of the first resistor Degree≤0.02%, temperature drift≤10ppm/ DEG C;Precision≤0.02% of the second resistance, temperature drift≤10ppm/ DEG C.
CN201711431799.XA 2017-12-25 2017-12-25 A kind of thermal resistance measuring circuit for exempting from input calibration Pending CN108020339A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711431799.XA CN108020339A (en) 2017-12-25 2017-12-25 A kind of thermal resistance measuring circuit for exempting from input calibration

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711431799.XA CN108020339A (en) 2017-12-25 2017-12-25 A kind of thermal resistance measuring circuit for exempting from input calibration

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CN108020339A true CN108020339A (en) 2018-05-11

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111256864A (en) * 2020-03-19 2020-06-09 上海卫星工程研究所 Multipoint temperature measuring method and system based on serial connection of multiple thermistors
CN111504491A (en) * 2020-05-28 2020-08-07 为麦智能科技(天津)有限公司 Data processing method, temperature detection circuit and electronic equipment
CN112212908A (en) * 2020-10-10 2021-01-12 北京航空航天大学 Intelligent sensor and intelligent method thereof

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0302002A1 (en) * 1987-07-30 1989-02-01 Siemens Aktiengesellschaft Method for converting an analogue input signal into a digital output signal
JPH05110350A (en) * 1991-10-18 1993-04-30 Yamatake Honeywell Co Ltd Input offset voltage correcting device
CN101467013A (en) * 2006-07-17 2009-06-24 梅特勒-托利多公开股份有限公司 Method and apparatus for measuring temperature
CN101498749A (en) * 2008-02-01 2009-08-05 凯迈(洛阳)测控有限公司 Accurate resistor measuring apparatus and method thereof
CN202582775U (en) * 2011-11-28 2012-12-05 凯迈(洛阳)环测有限公司 Temperature measuring circuit

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0302002A1 (en) * 1987-07-30 1989-02-01 Siemens Aktiengesellschaft Method for converting an analogue input signal into a digital output signal
JPH05110350A (en) * 1991-10-18 1993-04-30 Yamatake Honeywell Co Ltd Input offset voltage correcting device
CN101467013A (en) * 2006-07-17 2009-06-24 梅特勒-托利多公开股份有限公司 Method and apparatus for measuring temperature
CN101498749A (en) * 2008-02-01 2009-08-05 凯迈(洛阳)测控有限公司 Accurate resistor measuring apparatus and method thereof
CN202582775U (en) * 2011-11-28 2012-12-05 凯迈(洛阳)环测有限公司 Temperature measuring circuit

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111256864A (en) * 2020-03-19 2020-06-09 上海卫星工程研究所 Multipoint temperature measuring method and system based on serial connection of multiple thermistors
CN111504491A (en) * 2020-05-28 2020-08-07 为麦智能科技(天津)有限公司 Data processing method, temperature detection circuit and electronic equipment
CN111504491B (en) * 2020-05-28 2022-05-10 为麦智能科技(天津)有限公司 Data processing method, temperature detection circuit and electronic equipment
CN112212908A (en) * 2020-10-10 2021-01-12 北京航空航天大学 Intelligent sensor and intelligent method thereof

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Application publication date: 20180511

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