CN111504491B - Data processing method, temperature detection circuit and electronic equipment - Google Patents
Data processing method, temperature detection circuit and electronic equipment Download PDFInfo
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Abstract
The application discloses a data processing method, a temperature detection circuit and electronic equipment, wherein the data processing method comprises the following steps: acquiring a sampling value corresponding to the measured resistor; acquiring first reference information; determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor; and determining a target temperature value according to the resistance value of the measured resistor. The technical effect of improving the detection accuracy of the temperature is achieved.
Description
Technical Field
The application belongs to the technical field of medicine, and particularly relates to a data processing method, a temperature detection circuit and electronic equipment.
Background
In the prior art, a commonly used temperature detection method is to connect a thermistor and a fixed resistor in series, and then determine a corresponding temperature value based on a resistance value of the thermistor and a temperature characteristic table by measuring a voltage or a flowing current value at two ends of the thermistor; in the process, parameters of electronic components used in the measuring circuit are subjected to service time, and parameter drift can occur due to the change of the environmental temperature, so that the phenomenon of poor accuracy along with the change of the service time can occur, the temperature measuring result is inaccurate, and the accuracy of the temperature detecting result of the temperature measuring method in the prior art is low.
Disclosure of Invention
In view of this, the present application provides a data processing method, a temperature detection circuit and an electronic device, so as to solve the technical problem in the prior art that the accuracy of detecting the temperature is low in the temperature detection method.
In one embodiment of the present application, a data processing method is provided. The method comprises the following steps: acquiring a sampling value corresponding to the measured resistor; acquiring first reference information; determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor; and determining a target temperature value according to the resistance value of the measured resistor.
In one embodiment of the present application, there is provided a temperature detection circuit including: the device comprises a tested resistor, a first reference resistor, a detection device and a first switch circuit; the detection device is connected with the detected resistor and the first reference resistor through the first switch circuit, and is configured to: acquiring a sampling value corresponding to the measured resistor; acquiring first reference information; determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of the first reference resistor and the sampling value corresponding to the first reference resistor; and determining a target temperature value according to the resistance value of the measured resistor.
In one embodiment of the present application, there is provided an electronic device including: a memory and a processor; wherein the memory is used for storing programs; the processor is coupled with the memory and used for calling the program instructions in the memory so as to execute the data processing method.
According to the scheme provided by the embodiment of the application, the sampling value corresponding to the measured resistor is obtained; acquiring first reference information; determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor; according to the scheme of determining the target temperature value according to the resistance value of the measured resistor, based on the introduction of the sampling value corresponding to the measured resistor and the sampling value corresponding to the first reference resistor, the common like error of the two is eliminated, and the accuracy of temperature detection is improved.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative efforts. In the drawings:
fig. 1 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
FIG. 2 is a graph illustrating temperature and resistance characteristics of a thermistor according to an embodiment of the present disclosure;
fig. 3 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
FIG. 4 is a schematic diagram illustrating characteristics of ADC measurement results according to an embodiment of the present application;
FIG. 5 is a schematic diagram illustrating characteristics of ADC measurement results according to an embodiment of the present application;
fig. 6 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
fig. 7 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
fig. 8 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present disclosure;
fig. 9 is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present application;
fig. 10a is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present application;
fig. 10b is a schematic structural diagram of a temperature detection circuit according to an embodiment of the present application;
fig. 11 is a schematic flowchart of a data processing method according to an embodiment of the present application;
fig. 12 is a schematic structural diagram of a digital potentiometer according to an embodiment of the present application;
fig. 13 is a schematic structural diagram of a data processing apparatus according to an embodiment of the present application;
fig. 14 is a schematic structural diagram of an electronic device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The terminology used in the embodiments of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the examples of this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise, and "a" and "an" typically include at least two, but do not exclude the presence of at least one.
It should be understood that the term "and/or" as used herein is merely one type of association that describes an associated object, meaning that three relationships may exist, e.g., a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter associated objects are in an "or" relationship.
It should be noted that, the descriptions of "first", "second", etc. in this document are used for distinguishing different messages, devices, modules, etc., and do not represent a sequential order, nor limit the types of "first" and "second" to be different. The words "if", as used herein, may be interpreted as "at … …" or "at … …" or "in response to a determination" or "in response to a monitoring", depending on the context. Similarly, the phrase "if it is determined" or "if it is monitored (a stated condition or event)" may be interpreted as "when determining" or "in response to determining" or "when monitoring (a stated condition or event)" or "in response to monitoring (a stated condition or event)", depending on the context.
It is also noted that the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a good or system that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such good or system. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other like elements in a commodity or system that includes the element.
In the prior art, a commonly used temperature detection method is to connect a thermistor and a fixed resistor in series, measure a voltage or a current value flowing through two ends of the thermistor, and determine a corresponding temperature value based on a resistance value of the thermistor and a temperature characteristic table. When the method is used for determining the temperature, the measurement of the accuracy of the temperature is easily influenced by two aspects, namely the accuracy of a resistance measurement circuit on one hand and the accuracy of a thermistor on the other hand. Therefore, the conventional temperature monitoring device performs a uniform calibration process for the accuracy of the system (including the accuracy of the measurement circuit and the accuracy of the thermistor) during the production process, and the temperature calibration process needs to place the device to be calibrated into a constant oil tank or a water tank, send the current temperature of the oil tank or the water tank to the device to be calibrated, and complete the calibration, resulting in low production efficiency and high production cost. More importantly, parameters of electronic components used in the measuring circuit are subjected to service time, parameter drift can occur due to changes of environmental temperature, and the phenomenon that accuracy is poor along with changes of service time is caused, so that the temperature measuring result is inaccurate, and the accuracy of the temperature detecting result of the temperature measuring method in the prior art is low.
The temperature measuring circuit aims to solve the problems that in a temperature detection method, the measurement precision and accuracy of the temperature measuring circuit are not high, and meanwhile, electronic components on the circuit are easy to drift along with the change of time to cause the measurement error to be large. The method for calibrating the resistance value of the thermistor through the fixed resistor is provided, so that errors caused by the drift of electronic components are eliminated, and the accuracy of temperature measurement is improved.
The technical solutions provided by the embodiments of the present application are described in detail below with reference to the accompanying drawings.
Fig. 1 is a schematic diagram of a temperature detection circuit according to an exemplary embodiment of the present application, and as shown in fig. 1, the temperature detection circuit includes: a measured resistance rt, a first reference resistance r1, a detection device 100 and a first switch circuit 10;
the detection apparatus 100 is configured to be connected to the measured resistance rt and the first reference resistance r1 through the first switch circuit 10, and configured to:
acquiring a sampling value corresponding to the measured resistance rt;
acquiring first reference information;
determining the resistance value of the measured resistance rt by using the sampling value corresponding to the measured resistance rt and the first reference information; wherein the first reference information includes: the resistance value of the first reference resistor r1 and the sampling value corresponding to the first reference resistor r 1;
and determining a target temperature value according to the resistance value of the measured resistance rt.
Specifically, the measured resistor rt may be a thermistor or a digital potentiometer, the resistance value of the first reference resistor r1 is known, and the detection apparatus 100 may be a differential input ADC, a single-ended input ADC, or a processing device for performing data processing. The sampling value corresponding to the measured resistance rt and the sampling value corresponding to the first reference resistance r1 may be AD values, and may be acquired by a differential input ADC or a single-ended input ADC in the detection apparatus 100. The first reference resistor r1 may be a fixed resistor with a fixed resistance value meeting a certain accuracy requirement, and the specific accuracy requirement may be selected according to the target temperature measurement accuracy, for example, a fixed resistor with an accuracy of 0.1% or even higher may be selected under the condition that the target temperature measurement accuracy is 0.1 ℃, and a fixed resistor with an accuracy of 0.5% may be selected if the target temperature measurement accuracy is more than 0.3 ℃. Fig. 2 is a characteristic curve of the temperature and resistance value of the NTC thermistor RT, when the temperature rises, the resistance value of the thermistor gradually decreases, and after the resistance value of the thermistor is obtained by the above-mentioned data processing method, a temperature value corresponding to the resistance value can be obtained by performing search calculation on the curve of fig. 2, so that an accurate body temperature can be obtained.
Optionally, the processing device in the detection apparatus 100 may be specifically configured to: acquiring a sampling value corresponding to the measured resistance rt; acquiring first reference information; determining the resistance value of the measured resistance rt by using the sampling value corresponding to the measured resistance rt and the first reference information; wherein the first reference information includes: the resistance value of the first reference resistor r1 and the sampling value corresponding to the first reference resistor r 1; and determining a target temperature value according to the resistance value of the measured resistance rt.
Alternatively, the first switching circuit 10 may include a plurality of analog switches; when the detection device 100 collects the sampling value corresponding to the first reference resistance r1 and the sampling value corresponding to the measured resistance rt, the sampling value can be realized based on the control of the analog switch in the first switch circuit 10.
Referring to fig. 3, fig. 3 is a schematic diagram of a temperature detection circuit according to an embodiment of the present disclosure; the first switching circuit 10 includes:
a first analog switch 11, a second analog switch 12, and a third analog switch 13;
the first analog switch 11 has a first connection point and a second connection point, wherein the first connection point is connected to one end of the first reference resistor r1, and the second connection point is connected to a first input end of the detection device 100;
the second analog switch 12 has a third connection point, a fourth connection point and a fifth connection point, wherein the third connection point is connected to the other end of the first reference resistor r1 and one end of the measured resistor rt, and is connected between the first reference resistor r1 and the measured resistor rt, the fourth connection point is connected to the first input terminal, and the fifth connection point is connected to the second input terminal of the detection apparatus 100;
the third analog switch 13 has a sixth connection point and a seventh connection point, where the sixth connection point is connected to the other end of the resistor rt to be measured, and the seventh connection point is connected to the second input terminal.
Referring to fig. 3, the first analog switch 11 is a single-pole single-throw switch, the second analog switch 12 is a single-pole double-throw switch, and the third analog switch 13 is a single-pole single-throw switch; the detection device 100 may be a differential input ADC, Vref is an excitation power supply, the first connection point may be connected to Vref, and the sixth connection point is grounded; the first reference resistor r1 can also be connected with a capacitor in parallel for filtering; the first input of the detection apparatus 100 is the positive terminal of the differential input ADC, and the second input is the negative terminal of the differential input ADC.
The sampling value AD0 corresponding to the first reference resistor r1 and the sampling value ADT corresponding to the measured resistor rt of the temperature detection circuit of fig. 3 can be set, and the analog switch in the first switch circuit 10 can be controlled by the following method: setting a first analog switch 11 to be closed, a third analog switch 13 to be opened, and a third connecting point of a second analog switch 12 to be connected with a fifth connecting point; detecting the AD value corresponding to the first reference resistor r1 as AD0 by the detection device 100; the first analog switch 11 is switched off, the third connecting point of the second analog switch 12 is connected with the fourth connecting point, and the third analog switch 13 is switched on; the detection device 100 detects that the AD value corresponding to the measured resistance rt is ADT, and the resistance value R1 of the first reference resistance R1 is known.
In some optional embodiments, on the basis of the temperature detection circuit in fig. 3, the determining, by the detection apparatus 100, the resistance value RT of the measured resistance RT according to the sampled value corresponding to the measured resistance RT and the first reference information includes:
determining a first value according to a sampling value AD0 of a resistance value R1 of the first reference resistance R1 corresponding to the first reference resistance R1;
and obtaining the resistance value RT of the measured resistor RT by using the first numerical value and the sampling value ADT corresponding to the measured resistor RT.
In general, the principle of the temperature detection circuit affected by the linearity error can be seen in a characteristic diagram of the ADC measurement result shown in fig. 4, where in fig. 4, the horizontal axis represents the input voltage value and the vertical axis represents the AD value measured by the ADC. The ideal ADC measurement is characterized by an ideal curve in the figure, where the AD value and the input voltage value ideally satisfy VIN ═ VREF × AD/ADMAX, where VIN is the input voltage of the ADC, ADMAX is the maximum output AD value of the ADC, usually determined by the resolution N of the ADC, and VREF is the reference voltage of the ADC. However, the actual curve is affected by the ADC production process, as shown in the actual curve in fig. 4, and there is a certain gain error with the ideal curve, and when there is no offset error, the gain error will produce a large deviation in the resistance measurement process, thereby resulting in insufficient accuracy of the ADC measurement result, in this case, the actual curve corresponding to the ADC becomes VIN ═ k × VREF × AD/ADMAX, where k is an error coefficient due to the process deviation, and is uncertain according to the process and between different ADCs under the same process.
In fig. 3, the measured resistor RT and the first reference resistor R1 pass the same current in the same circuit path, so that VAD0/R1 (VREF-VAD0)/RT is satisfied; VAD0 is the voltage across the first reference resistor r1, and VREF is the voltage of the excitation power VREF. Further, since AD0 corresponds to VAD0 and ADT corresponds to voltage VADT across rt (i.e., (VREF-VAD0)) (the specific correspondence may be AD0/ADT ═ VAD0/VADT), the following equation (1) is further obtained:
in the formula (1), by introducing ADT and AD0, the gain error of the ADC is eliminated, which results in the effect that the characteristic curve of the ADC measurement actually becomes VIN ═ k × VREF × AD/ADMAX, that is, the effect of VAD0 ═ k ═ VREF AD0/ADMAX/R1 and VADT ═ k ═ VREF ADT/ADMAX/RT in the circuit is eliminated. Wherein RT is a resistance value of the measured resistor RT, R1 is a resistance value of the first reference resistor R1, ADT is a sampling value corresponding to the measured resistor RT, and AD0 is a sampling value corresponding to the first reference resistor R1; the R1/AD0 may be a first value. That is, the detection apparatus 100 determines a first value according to the resistance value R1 of the first reference resistor R1 and the sampling value AD0 corresponding to the first reference resistor R1; obtaining the resistance value RT of the measured resistor RT by using the first numerical value and the sampling value ADT corresponding to the measured resistor RT can be realized by the formula (1).
By the temperature detection circuit and the data processing method, all deviations caused by k, Vref and the like are cancelled, so that the influence of temperature measurement accuracy caused by k and Vref errors is eliminated.
In general, many ADCs have zero offset, and when there is no gain error, the temperature detection circuit receives a zero error, that is, an offset error, and the principle of the offset error affecting the circuit is shown in a characteristic diagram of the ADC measurement result shown in fig. 5, in which the horizontal axis represents an input voltage value and the vertical axis represents an AD value measured by the ADC in fig. 5. The ideal ADC measurement is characterized by an ideal curve in the graph, and the actual measurement of the ADC measurement when there is a zero error in the circuit is characterized by an actual curve in fig. 5. When both the zero point error and the gain error exist, in the actual measurement, the actual curve of the ADC is VIN ═ k × VREF × AD/ADMAX + b, where VREF is the reference voltage of the ADC, k is the gain error coefficient caused by the process deviation, and b is the coefficient of zero point offset, which are all uncertain according to the process and between different ADCs in the same process, thereby affecting the measurement accuracy.
The present application provides a temperature detection circuit and a method capable of eliminating the influence of k and b, which can further modify the structure of fig. 3, and specifically refer to the temperature detection circuit shown in fig. 6, that is, the temperature detection circuit may further include a second reference resistor r2 and a second switch circuit;
the detection device 100 is further connected with the second reference resistor r2 through the second switch circuit, and is configured to obtain a sampling value corresponding to the second reference resistor r2 through the second switch circuit;
the first reference information further comprises a resistance value of the second reference resistor r2 and a sampling value corresponding to the second reference resistor r 2;
the determining, by the detection apparatus 100, the resistance value of the measured resistance rt according to the sampling value corresponding to the measured resistance rt and the first reference information includes: determining a second value according to the resistance value of the first reference resistor r1, the resistance value of the second reference resistor r2, the sampling value corresponding to the first reference resistor r1 and the sampling value corresponding to the second reference resistor r 2; and obtaining the resistance value of the measured resistance rt by using the second numerical value and the sampling value corresponding to the measured resistance rt.
Referring to fig. 6, the second switch circuit includes a fourth analog switch 14, and the fourth analog switch 14 has eight connection points and a ninth connection point;
the eighth connection point is connected to one end of the second reference resistor r2, and the ninth connection point is connected to the first input end;
the other end of the second reference resistor r2 is connected with the first connection point; the first analog switch 11 further includes a tenth connection point (in this case, the first analog switch 11 may be a single-pole double-throw switch), and the tenth connection point is connected to the second input terminal. The second reference resistor r2 is specifically connected between the excitation power Vref and the first reference resistor r 1.
When the detection device 100 detects the sampling value AD2 corresponding to the second reference resistor r2, the fourth analog switch 14 (the fourth analog switch 14 may be a single-pole single-throw switch) may be turned on, the connection points of the second analog switch 12 are not connected to each other, the third analog switch 13 is turned off, and the first connection point and the tenth connection point of the first analog switch 11 are connected to each other.
The current through the path can be set to I, then:
VREF–V1＝I*R2＝k*AD2+b；
V1–VT＝I*R1＝k*AD0+b；
VT–GND＝I*RT＝k*ADT+b；
wherein VREF is a power voltage, V1 is a voltage at the first connection point, VT is a voltage at the third connection point, and GND is a voltage at the ground terminal; obtaining R2K AD2+ B, R1K AD0+ B from VREF-V1K R2K AD2+ B and V1 VT R1K AD0+ B; wherein K is K/I; b is B/I.
Determining the second value according to the resistance value R1 of the first reference resistor R1, the resistance value R2 of the second reference resistor R2, the sampling value AD0 corresponding to the first reference resistor R1 and the sampling value AD2 corresponding to the second reference resistor R2 can be realized in the following manner;
combined stand
Solving the equation, K, B can be obtained.Wherein K, B is the second value.
Obtaining the resistance value RT of the measured resistance RT by using the second numerical value and the sampling value ADT corresponding to the measured resistance RT through the following formula (2):
RT＝K*ADT+B (2)。
in some optional embodiments, the resistance of the second reference resistor r2 may also be 0, at this time, when the input of the detection apparatus 100 is 0, the AD value AD1 corresponding to r2 is read, and first, according to the voltage across r1, the AD value AD0 corresponding to the first reference resistor r1 is obtained; then, according to the voltage at the two ends of the measured resistor rt, the AD value ADT corresponding to the measured resistor rt can be obtained; according to the principle that the current in the whole channel is equal, the following equation is obtained, (k × VREF (AD0-AD1)/ADMAX)/R1 ═ k × VREF (ADT-AD 1)/ADMAX)/RT;
further, (AD0-AD1)/R1 is obtained as (ADT-AD1)/RT, and since all but RT are known in the above formula, the value of RT can be obtained from R1, AD0, and AD1, and a temperature value can be obtained by further table lookup.
By the method, gain errors caused by process deviation and errors caused by zero offset can be offset, so that the accuracy of temperature detection is improved.
In other alternative embodiments, for a manner of eliminating the influence of k, the detection of the AD value corresponding to the first reference resistor r1 and the AD value corresponding to the measured resistor rt may also be implemented based on a circuit with a consistent topology, and specifically may be implemented based on the temperature detection circuit in fig. 7, and specifically may be: the first reference resistor r1 and the measured resistor rt are respectively connected with fixed resistors with the same resistance, wherein the first reference resistor r1 is connected in series with the first calibration resistor r01, and the measured resistor rt is connected in series with the second calibration resistor r 02. Namely, the temperature detection circuit corresponding to fig. 1 further includes: a first calibration resistor and a second calibration resistor; the specific temperature detection circuit can be seen in fig. 7:
the first switch circuit 10 includes a fifth analog switch 15 and a sixth analog switch 16;
the fifth analog switch 15 has an eleventh connection point and a twelfth connection point, the eleventh connection point is connected to one end of the first reference resistor r1 and one end of the first calibration resistor r01, and is connected between the first reference resistor r1 and the first calibration resistor r 01; the twelfth connecting point is connected to a third input end of the detection apparatus 100;
the sixth analog switch 16 has a thirteenth connection point and a fourteenth connection point, the thirteenth connection point being connected to one end of the measured resistor rt and one end of the second calibration resistor r02, and being connected between the measured resistor rt and the second calibration resistor r 02; the fourteenth connection point is connected to the third input terminal.
Optionally, the fifth analog switch 15 and the sixth analog switch 16 are single-pole single-throw switches, the other end of the first reference resistor r1 and the other end of the resistor rt to be measured are grounded, the detection apparatus 100 may include a single-ended input ADC, the third input end of the detection apparatus 100 is the positive end of the single-ended input ADC, the fourth input end of the detection apparatus 100 is grounded, and the fourth input end is the negative end of the single-ended input ADC; the first calibration resistor R01 and the second calibration resistor R02 have the same resistance value, for example, the resistance value of the first calibration resistor R01 is R01, and the resistance value of the second calibration resistor R02 is R02, then R01 is the same as R02. The other ends of the first and second calibration resistors r01 and r02 may be connected to a pumping power supply Vref.
Specifically, the fifth analog switch 15 may be set to be closed, the sixth analog switch 16 may be set to be open, and the AD value AD0 corresponding to the first reference resistor r1 is detected by the detection device 100; the fifth analog switch 15 is set to be open, the sixth analog switch 16 is set to be closed, and the AD value ADT corresponding to the measured resistance rt is obtained through detection by the detection device 100.
When the first reference resistance R1 and the measured resistance rt are equal, the parameters on the two circuits are completely the same, and there are V11 ═ k ═ AD0 ═ VREF (R1/(R1+ R01)), and k/VREF ═ R1/(R1+ R01)/AD 0. V11 is the voltage across the first reference resistor R1, VREF is the power voltage, and R01 is the resistance of the first calibration resistor R01.
Let the voltage across the measured resistance RT be VT1, since VT1 ═ k × ADT ═ VREF (RT/(RT + R02)), k/VREF ═ R1/(R1+ R01)/AD 0; wherein R02 is the resistance value of the second calibration resistor R02.
And further obtaining the calculation relations of the RT with respect to R1, AD0, R01 and ADT, thereby calculating the RT.
Through the data processing method and the temperature detection circuit, the deviation caused by k, Vref and the like can be offset, so that the influence of measurement accuracy caused by errors caused by k, Vref and the like is eliminated.
On the basis of fig. 7, in order to further eliminate the combined effect of the zero offset and the gain offset, the present application further provides a temperature detection circuit, specifically referring to fig. 8, the temperature detection circuit further includes a third switching circuit, a third reference resistor r2', and a third calibration resistor r 03; the detection apparatus 100 is a single-ended input ADC.
The detection device 100 is further connected with the third reference resistor r2 'through the third switching circuit, and is used for acquiring a sampling value corresponding to the third reference resistor r2' through the third switching circuit;
the first reference information further comprises a resistance value r2 'of the third reference resistance and a sampling value corresponding to the third reference resistance r 2';
the determining, by the detection apparatus 100, the resistance value of the measured resistance rt according to the sampling value corresponding to the measured resistance rt and the first reference information includes: determining a third value according to the resistance value of the first reference resistor r1, the resistance value of the third reference resistor r2', the sampled value corresponding to the first reference resistor r1 and the sampled value corresponding to the third reference resistor r 2'; obtaining the resistance value of the measured resistance rt by using the third numerical value and the sampling value corresponding to the measured resistance rt;
the third switch circuit comprises a seventh analog switch 17;
the seventh analog switch 17 has a fifteenth connection point and a sixteenth connection point, the fifteenth connection point is connected to one end of the third reference resistor r2 'and one end of the third calibration resistor r03, and is connected between the third reference resistor r2' and the third calibration resistor r 03; the sixteenth connection point is connected to the third input terminal.
Alternatively, the seventh analog switch 17 is a single-pole single-throw switch, the other end of the third reference resistor R2' is grounded, the resistance value R03 of the third calibration resistor R03 is the same as the resistance values of the first calibration resistor R01 and the second calibration resistor R02, and the other end of the third calibration resistor R03 may be connected to the excitation power Vref.
Specifically, by setting the fifth analog switch 15 to be open from the sixth analog switch 16 and the seventh analog switch 17 to be closed, the AD value AD2 'corresponding to the third reference resistance r2' is measured by the detection device 100.
Then in the context of figure 8,
VT1＝k*ADT+b＝VREF*(RT/(RT+R02))；
V11＝k*AD0+b＝VREF*(R1/(R1+R01))；
V12＝k*AD2'+b＝VREF*(R2'/(R2'+R03))；
further obtaining AD0 k/VREF + b/VREF as R1/(R1+ R01);
V12＝AD2'*k/VREF+b/VREF＝R2'/(R2'+R03)；
wherein, VT1 is the voltage across the resistor rt to be measured; v11 is the voltage across the first reference resistor R1, V12 is the voltage across the third reference resistor R2', R2' is the resistance of the third reference resistor R2', and AD2' is the sampling value corresponding to the third reference resistor R2 '.
Determining a third value according to the resistance value R1 of the first reference resistor R1, the resistance value R2 'of the third reference resistor R2', the sampling value AD0 corresponding to the first reference resistor R1, and the sampling value AD2 'corresponding to the third reference resistor R2' can be implemented as follows:
combined stand
Solving an equation to obtain k/VREF and b/VREF; wherein k/VREF and b/VREF are third values;
obtaining the resistance value RT of the measured resistance RT by using the third value and the sampling value ADT corresponding to the measured resistance RT may be implemented based on the following manner:
according to VT1 ═ k × ADT + b ═ VREF (RT/(RT + R02)); and the value of RT can be determined by the k/VREF and b/VREF obtained in the above way.
In other alternative embodiments of the present application, the fourth input terminal may be further connected to an eleventh connection point of the fifth analog switch 15, and particularly, as shown in fig. 9, the detection apparatus 100 in fig. 9 may set the fifth analog switch 15 to be closed, the sixth analog switch 16 to be opened, and the seventh analog switch 17 to be opened for the differential input ADC; detecting an AD value AD0 corresponding to the first reference resistor r1 through the differential input ADC;
the fifth analog switch 15 can be set to be closed, the sixth analog switch 16 can be set to be closed, and the seventh analog switch 17 can be set to be open; detecting an AD value ADT corresponding to a measured resistance rt through a differential input ADC;
the fifth analog switch 15 may be set to be closed, the sixth analog switch 16 may be set to be open, and the seventh analog switch 17 may be set to be closed; detecting an AD value AD2 'corresponding to the third reference resistor r2' through the differential input ADC;
in specific calculation, the resistance value and the AD value corresponding to the corresponding resistance are approximately regarded as a straight line, namely R ═ k × AD + b;
as can be seen from fig. 9: r1 ═ k × AD0+ b; r2'═ k × AD2' + b.
Since R1 and R2 'are known and AD0 and AD2' can be measured by the detection device 100, the relational expressions in which k and b are related only to R1, R2', AD0, and AD2' can be obtained, and at this time, since k and b are not related to Vref, an error of the ADC, and the like, an error caused by the part is eliminated.
And substituting the AD value ADT corresponding to the measured resistance RT into RT ═ k × ADT + b to obtain the value of RT, and further obtain the temperature value.
In the circuit of fig. 9, the input range of the differential input voltage is smaller than the range of the single-ended input voltage, and therefore the ratio of the effective voltage input range is higher, compared to a circuit in which the fourth input terminal is grounded.
For example: the resistance range of the 30K thermistor corresponding to 30-45 ℃ is 25K-35K, because the central value is 30K, R1 is selected to be 30K, when RT changes between 25K-35K, the voltage at the thirteenth connecting point is between VREF 35/65 and VREF 25/55, and no matter how much VREF is set, all the lower VREF 25/55 are invalid conversion results; with the temperature detection circuit of fig. 9, since the detected value of the differential input ADC corresponds to the AD value corresponding to the voltage obtained by subtracting VREF × 25/55, the voltage range becomes 0- (VREF × 35/65-VREF × 25/55), and therefore, selecting an appropriate reference voltage VREF for the ADC can make the effective input voltage ratio in the conversion result of the ADC high, thereby increasing the measurement accuracy.
It should be further noted that many relatively poor performance and relatively inexpensive ADCs are not necessarily straight or likely to be curved across the full-scale range (i.e., the characteristic curve of the ADC), except for zero offset and linear offset. Therefore, in order to satisfy the full-scale use of the ADC, the characteristic curve of the whole ADC is usually divided into two or more sections, and it is considered from engineering that the curves of each section are nearly linear. In other alternative embodiments of the present application, the temperature sensing circuit may also be the circuit shown in FIG. 10 a. In fig. 10a, the reference resistors are connected in series, rn may be an X-th reference resistor, p may be a Y-th analog switch, one end of the X-th reference resistor is connected to the Y-th analog switch and Vref, and the other end is connected to other reference resistors.
In fig. 10a, the detection device 100 controls the Y-th analog switch to be closed, and controls the analog switch connected to the other end of rn to realize the connection between the detection device 100 and the other end of rn, so as to detect the AD value corresponding to rn, and at this time, if the AD value corresponding to rn is ADn, the reference resistor used for calculating RT may be selected based on ADn. For example: if the measured ADn value is between AD1 and AD2, the value of RT is found using R2, AD1, AD2, and if the ADn value is between AD0 and AD2, the value of RT is found using the relationship of R1, AD0, AD2, R2. The specific temperature measurement method is similar to the data processing method based on fig. 3 and 6, and is not described here again.
By the method, the reference resistor closest to the resistance value of the RT can be selected, device characteristic errors caused by overlarge resistance difference are avoided, and the RT determination accuracy is improved.
Similarly, in other alternative embodiments of the present application, the temperature sensing circuit may also be the circuit shown in fig. 10 b. In fig. 10b, r0n is the nth calibration resistor and rn' is the Z reference resistor. rn' is connected in series with the nth calibration resistor; q is the W analog switch, one end of the nth calibration resistor is connected with Vref, the other end is connected with one end of the Z reference resistor and the W analog switch, and the other end of the Z reference resistor can be grounded.
In fig. 10b, the detection apparatus 100 controls the W-th analog switch to be closed and the other analog switches to be opened, thereby detecting the AD value corresponding to rn ', and at this time, if the AD value corresponding to rn' is ADn ', the reference resistor used for calculating RT is selected based on ADn'. For example: if the value of ADn 'measured is between AD1 and AD2, then the value of RT is obtained using R2, AD1, AD2, and if the value of ADn' is between AD0 and AD2, then the value of RT is obtained using the relationship of R1, AD0, AD2, R2. The specific temperature measurement method is similar to the data processing method based on fig. 7 and 8, and is not described here again.
In fig. 10b, corresponding to fig. 9, the negative terminal corresponding to the detection device 100 may be connected to a connection point connected to the nth calibration resistor in the W-th analog switch without being grounded, so as to detect the AD values corresponding to the reference resistor and the measured resistor. Thereby selecting the reference resistance used for calculating RT based on ADn' to improve the accuracy of the resistance value determination result of the measured resistance RT.
Fig. 11 is a schematic flowchart of a data processing method according to an exemplary embodiment of the present application, where as shown in fig. 11, the method includes the following steps 101 to 104;
101. acquiring a sampling value corresponding to the measured resistor;
102. acquiring first reference information;
103. determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor;
104. and determining a target temperature value according to the resistance value of the measured resistor.
Optionally, determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information includes:
determining a first numerical value according to the resistance value of the first reference resistance and the sampling value corresponding to the first reference resistance; and obtaining the resistance value of the measured resistor by using the first numerical value and the sampling value corresponding to the measured resistor.
Optionally, the first reference information further includes a resistance value of a second reference resistor and a sampling value corresponding to the second reference resistor; determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information comprises: determining a second numerical value according to the resistance value of the first reference resistance, the resistance value of the second reference resistance, the sampling value corresponding to the first reference resistance and the sampling value corresponding to the second reference resistance; and obtaining the resistance value of the measured resistor by using the second numerical value and the sampling value corresponding to the measured resistor.
Optionally, the measured resistance comprises a thermistor or an adjustable resistance.
For a specific implementation of the data processing method corresponding to fig. 11, reference may be made to the foregoing embodiment based on the temperature detection circuit, which has been described in detail above, and thus, no further description is provided herein.
In other optional embodiments of the present application, the data processing method in the present application may be applied to resistor calibration, the temperature acquisition of the monitor is implemented by a temperature sensor, the principle of the temperature sensor is an NTC thermistor, different temperature outputs correspond to different resistance values, the monitor acquires different resistance values to obtain different temperature values, and displays the temperature values, the temperature information detected by the wearable detection device is also displayed by the monitor, the monitor end may set a resistance output module, the temperature value detected by the wearable detection device can be output to an accurate resistance value corresponding to the temperature value of the monitor based on the temperature value detected by the wearable detection device, so that the monitor can acquire the resistance value, and display the temperature value on a screen. The resistance output module can be arranged between the wearable detection device and the monitor and in a device electrically connected with the monitor side, and specifically can be a resistance output device or a circuit board.
The resistance output module is located between the wearable detection device and the monitor, resistance output is only needed to be carried out according to the standard corresponding to the monitor, and the multi-parameter monitor can display the corresponding temperature value on the screen. The wearable detection device measures that the human body temperature is 37 ℃, so that a digital value temperature value is sent to the resistance output module through the wireless communication channel, the resistance output module receives the digital value temperature value, the digital potentiometer and the analog processing circuit in the wearable detection device control the output of a resistance value of 1.35K (according to the standard of 2.25K @25 ℃), and the multi-parameter monitor displays the resistance value as 37 ℃ after the resistance corresponding to the resistance value is connected to the multi-parameter monitor.
Specifically, currently, a common resistance output module is implemented by a digital potentiometer, and fig. 12 is a schematic diagram of the digital potentiometer according to the embodiment of the present application; it includes N resistors with resistance value of Rs, N analog switches and a decoder. When the input digital signal of the decoder is used as the input of the digital potentiometer, the decoder always controls one of the N analog switches to be conducted, and the rest analog switches are in a closed state. Assuming that the input of the decoder is D, the decoder controls the opening of the D-th analog switch between Ax (which is one of the output terminals of the digital potentiometer) and Wx (which is the other output terminal of the digital potentiometer), and the resistance value R between Ax and Wx can be represented as R ═ Rs × D; thereby achieving conversion of the digital value into the resistance value.
The position of WX can be changed according to the value of D, and when the position of WX is located at BX, the output resistance of the digital potentiometer reaches the maximum value of the output resistance of the digital potentiometer.
The Rs of the digital potentiometer, however, is basically a circuit in a CMOS structure, which is relatively more sensitive to temperature changes, and the resistance of the CMOS structure changes with the current flowing through the circuit, because the temperature output is easily affected by the ambient temperature, including the sampling current of the monitor, the actual output resistance value of the resistance output module is not confirmed by the resistance output module, therefore, the solution of the present application provides a solution for measuring the output resistance outputted from the resistance output module to the monitor, comparing the measured value with the target output resistance value and adjusting the output resistance, and particularly when the difference between the measured value and the target output resistance value is greater than a first preset threshold value, and adjusting the output resistance, and when the difference value is smaller than a second preset threshold value, not adjusting the measured value.
That is, in some optional embodiments, the adjustable resistor in the data processing method may include a digital potentiometer, and the method further includes:
acquiring a resistance value to be calibrated;
judging whether the deviation between the resistance value to be calibrated and a target resistance value is larger than a preset threshold value, if so, adjusting the resistance corresponding to the resistance value to be calibrated based on the deviation;
the resistance value to be calibrated is obtained based on the resistance value of the digital potentiometer and the resistance value of the preset resistor. The predetermined resistor may be a fixed resistor connected in series with the digital potentiometer, and the predetermined resistor may be the first reference resistor r1 in fig. 3.
Specifically, the resistance value of the digital potentiometer can be detected based on the data processing method corresponding to fig. 3 or fig. 6, and the total resistance value of the digital potentiometer and the preset resistor is the resistance value to be calibrated.
Alternatively, when the measured resistance rt is a digital potentiometer, the excitation power Vref in FIGS. 3 and 6 can be provided by the monitor.
In some optional embodiments, corresponding to the temperature detection circuit in fig. 3, when the temperature value corresponding to the temperature information acquired by the resistor output module is 15 to 45 ℃, the output range of the corresponding resistance value is 1K to 5K Ω, and specifically, the first reference resistor r1 with a resistance value of 0.8K Ω may be selected, so that the digital potentiometer only needs to output 0.2K Ω to 4.2K Ω.
In some optional embodiments, corresponding to the temperature detection circuit in fig. 6, when the resistance value of the first reference resistor r1 is 0.2K Ω, and the resistance value of the second reference resistor r2 is 0.6K Ω, the digital potentiometer only needs to output 0.2K Ω -4.2K Ω.
In other optional embodiments, an ambient temperature sensor may be further disposed inside the resistance output module, and a table curve of the output resistance value varying with the ambient temperature is stored, when the resistance output by the resistance output module is calibrated, the ambient temperature T1 at the calibration time is recorded, during the operation of the resistance output module, the ambient temperature T is periodically detected, then, according to a difference between the ambient temperature and the ambient temperature T1 at the calibration time, the output resistance value of the resistance output module is corrected according to the temperature variation curve to obtain a resistance variation R0, and then, the variation R0, the first reference resistance R1, and the total resistance value of the digital potentiometer are used as the final resistance value of the resistance output module to be output.
The data processing method provided by the application can calibrate the output resistance of the resistance output module, and based on the fact that the digital potentiometer is connected with the preset resistance in series, common errors of the digital potentiometer and the preset resistance are eliminated, so that the problems that the internal resistance of the resistance output module is sensitive and unstable to temperature changes due to the digital potentiometer and the resistance of the digital potentiometer changes along with the change of the flowing current to cause inaccuracy of the resistance value corresponding to the digital potentiometer, and the output resistance of the resistance output module is inaccurate are solved.
Fig. 13 is a schematic structural diagram of a data processing apparatus according to an exemplary embodiment of the present application, and as shown in fig. 13, the data processing apparatus includes:
the first obtaining module 121 is configured to obtain a sampling value corresponding to the measured resistor;
a second obtaining module 122, configured to obtain the first reference information;
a first determining module 123, configured to determine a resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor;
and the second determining module 124 is used for determining a target temperature value according to the resistance value of the measured resistor.
Optionally, the first determining module 123 is configured to, when determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information, specifically:
determining a first numerical value according to the resistance value of the first reference resistance and the sampling value corresponding to the first reference resistance;
and obtaining the resistance value of the measured resistor by using the first numerical value and the sampling value corresponding to the measured resistor.
Optionally, the first reference information further includes a resistance value of a second reference resistor and a sampling value corresponding to the second reference resistor; the first determining module 123 is configured to, when determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information, specifically:
determining a second numerical value according to the resistance value of the first reference resistance, the resistance value of the second reference resistance, the sampling value corresponding to the first reference resistance and the sampling value corresponding to the second reference resistance;
and obtaining the resistance value of the measured resistor by using the second numerical value and the sampling value corresponding to the measured resistor.
Optionally, the measured resistance comprises a thermistor or an adjustable resistance.
Optionally, the adjustable resistor includes a digital potentiometer, and the data processing apparatus is further configured to:
acquiring a resistance value to be calibrated;
judging whether the deviation between the resistance value to be calibrated and a target resistance value is larger than a preset threshold value, if so, adjusting the resistance corresponding to the resistance value to be calibrated based on the deviation;
the resistance value to be calibrated is obtained based on the resistance value of the digital potentiometer and the resistance value of the preset resistor.
For the specific embodiment corresponding to fig. 13, reference may be made to the above description, and details are not repeated here.
Fig. 14 shows a schematic structural diagram of an electronic device provided in an embodiment of the present application. As shown in fig. 14, the electronic apparatus includes: a memory 131 and a processor 132; wherein the content of the first and second substances,
the memory 131 is used for storing programs;
the processor 132, coupled to the memory, is configured to execute the program stored in the memory to:
acquiring a sampling value corresponding to the measured resistor;
acquiring first reference information;
determining the resistance value of the measured resistor by using the sampling value corresponding to the measured resistor and the first reference information; wherein the first reference information includes: the resistance value of a first reference resistor and the sampling value corresponding to the first reference resistor;
and determining a target temperature value according to the resistance value of the measured resistor.
The memory 131 may be configured to store other various data to support operations on the electronic device. Examples of such data include instructions for any application or method operating on the electronic device. The memory 131 may be implemented by any type or combination of volatile or non-volatile memory devices, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks.
The processor 132 may also perform other functions besides the above functions when executing the program in the memory 131, which may be referred to in the foregoing description of the embodiments.
Further, as shown in fig. 14, the electronic apparatus further includes: a display 133, a power component 134, a communications component 135, and the like. Only some of the components are schematically shown in fig. 14, and it is not meant that the electronic device includes only the components shown in fig. 14.
Specifically, the electronic device may be a thermometer or a resistance output module.
Accordingly, embodiments of the present application also provide a computer-readable storage medium storing a computer program, where the computer program can implement the steps or functions of the data processing method provided in the foregoing embodiments when executed by a computer.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above embodiments are only used to illustrate the technical solutions of the present application, and not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions in the embodiments of the present application.
Claims (2)
1. A temperature sensing circuit, comprising: the device comprises a tested resistor, a first reference resistor, a detection device, a first switch circuit, a first calibration resistor, a second calibration resistor, a third switch circuit, a third reference resistor and a third calibration resistor;
the first switch circuit comprises a fifth analog switch and a sixth analog switch;
the fifth analog switch is provided with an eleventh connecting point and a twelfth connecting point, the eleventh connecting point is connected with one end of the first reference resistor and one end of the first calibration resistor and is connected between the first reference resistor and the first calibration resistor; the twelfth connecting point is connected with a third input end of the detection device;
the sixth analog switch is provided with a thirteenth connecting point and a fourteenth connecting point, the thirteenth connecting point is connected with one end of the measured resistor and one end of the second calibration resistor and is connected between the measured resistor and the second calibration resistor; the fourteenth connecting point is connected with the third input end;
the third switch circuit comprises a seventh analog switch;
the seventh analog switch is provided with a fifteenth connecting point and a sixteenth connecting point, wherein the fifteenth connecting point is connected with one end of the third reference resistor and one end of the third calibration resistor and is connected between the third reference resistor and the third calibration resistor; the sixteenth connecting point is connected with the third input end;
the detection device is connected with the detected resistor and the first reference resistor through the first switch circuit, and is connected with the third reference resistor through the third switch circuit, and the detection device is used for:
acquiring a sampling value corresponding to the measured resistor;
acquiring a resistance value of the first reference resistor, a sampling value corresponding to the first reference resistor, a resistance value of the third reference resistor and a sampling value corresponding to the third reference resistor;
determining a third numerical value according to the resistance value of the first reference resistance, the resistance value of the third reference resistance, the sampling value corresponding to the first reference resistance and the sampling value corresponding to the third reference resistance; obtaining the resistance value of the measured resistor by using the third numerical value and the sampling value corresponding to the measured resistor;
wherein, when determining the third value, according to formula (1)
Obtaining a third value k/VREF and b/VREF;
substituting k/VREF and b/VREF into formula (2) when determining the resistance value of the measured resistor:
k ADT + b = VREF (RT/(RT + R02)) (2), resulting in a resistance value RT of the measured resistance;
VREF is a voltage of an excitation power supply, AD0 is a sampling value corresponding to a first reference resistor, AD2 'is a sampling value corresponding to a third reference resistor, R01 is a resistance value of a first calibration resistor, R02 is a resistance value of a second calibration resistor, R03 is a resistance value of a third calibration resistor, R1 is a resistance value of the first reference resistor, and R2' is a resistance value of the third reference resistor; k is a gain error coefficient due to process variation, and b is a coefficient of zero offset; the ADT is a sampling value of the measured resistance.
2. The temperature sensing circuit of claim 1, wherein a fourth input of the sensing device is connected to the eleventh connection point or a fourth input of the sensing device is connected to ground.
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