CN205899425U - Full -automatic temperature compensated equipment of APD array chip offset voltage - Google Patents
Full -automatic temperature compensated equipment of APD array chip offset voltage Download PDFInfo
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- CN205899425U CN205899425U CN201620829243.0U CN201620829243U CN205899425U CN 205899425 U CN205899425 U CN 205899425U CN 201620829243 U CN201620829243 U CN 201620829243U CN 205899425 U CN205899425 U CN 205899425U
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- array chip
- apd
- transducer
- apd array
- output
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Abstract
The utility model discloses a full -automatic temperature compensated equipment of APD array chip offset voltage. Include APD array chip (101), thermistor (108), AD converter I (107), matched resistance (110), AD converter II (105), microprocessor (102), digital potentiometer (103), export adjustable high pressure module (104), bee calling organ (109) and display module (106). The utility model discloses a resistance that detects thermistor reachs APD array chip operating temperature to obtain required best reverse bias voltage, recycle the output voltage that digital potentiometer changes the adjustable high pressure module of output, make APD array chip obtain the reverse bias voltage that matches with current operating temperature, realized the full -automatic temperature compensation function of APD array chip reverse bias voltage.
Description
Technical field
This utility model is related to apd bias voltage adjustment technology, and particularly a kind of apd array chip bias voltage is full-automatic
Temperature compensation means.
Background technology
Apd(avalanche photodide under high back voltage biasing) electric current flowing through apd can be made after light irradiation to produce snow
Collapse multiplier effect., closer to avalanche breakdown voltage, avalanche multiplication effect is more notable for apd reverse bias voltage, but can produce simultaneously
The additional noise effect of useful signal is flooded in life, and therefore precise control apd reverse bias voltage becomes the maximum of apd practical application
A difficult problem.Because avalanche breakdown voltage changes with temperature, therefore apd bias high voltage need to be controlled also with varying with temperature." light leads to
Letter technology " periodical 12 phases in 2014 " the apd bias voltage temperature compensation circuit design based on adl5317 and lm35 "；" Electronic Design work
Journey " 2 months (volume 23 the 3rd phase) in 2015 " apd based on tps40210 biases temperature compensation circuit design ", all disclose apd bias temperature
Degree compensation circuit design, it is disadvantageous in that: needs to manually adjust multiple element parameter in circuit, high-pressure modular voltage range
Little and adjust inconvenient." optics and photoelectric technology " periodical 4 phases in 2013 " have the apd numeric control bias circuit of temperature-compensating "；
" industrial control computer " the 3rd phase of volume 25 in 2012, " Digital Circuit for Bias Voltage of Avalanche Photodiode based on dsp designs ", it
Be disadvantageous in that: although employing microcontroller, high-pressure modular subelement still needs manual regulation；And
Temperature measuring circuit is more complicated.
Also it is not directed to apd array chip in existing temperature compensation, be all only limited to single apd, and all need
Manually adjust partial circuit parameter, be not carried out Full-automatic temperature compensation.
Content of the invention
The purpose of this utility model is to solve the problems, such as said system, there is provided a kind of using critesistor,
Digital regulation resistance, export adjustable high-pressure modular and microprocessor be applied to apd(avalanche photodide) array chip biasing
Voltage Full-automatic temperature compensation device.
It is a piece of that this utility model is achieved in that apd array chip bias voltage Full-automatic temperature compensation device includes
Apd array chip, critesistor, an ad(simulation numeral) transducer i, build-out resistor, ad(simulation numeral) transducer ii, one
Individual microprocessor, a digital regulation resistance, an adjustable high-pressure modular of output, a buzzer and a display module.Temperature-sensitive
Resistance is fixed on apd array chip, and ad transducer i connects critesistor, and output is adjustable, and high-pressure modular outfan connection ad turns
Parallel operation ii and apd array chip, are exported adjustable high-pressure modular control end and are connected with digital regulation resistance, and microprocessor connects ad conversion
Device i, ad transducer ii, digital regulation resistance, buzzer and display module.
Apd array chip, chip is integrated with multiple apd units, these apd units may make up 1xn linear array and
Nxn square array, wherein: n is 5-16.
Critesistor, as temperature sensor, its resistance value is sized to reflect apd array chip operating temperature.
Ad transducer i, for gathering the partial pressure of critesistor.
Build-out resistor, closes for the exponential type nonlinear function of critesistor and temperature is converted into linear function
System is it is ensured that the concordance of sampling sensitivity.
Microprocessor, for reading the value of ad transducer i, calculates thermosensitive resistance, then tables look-up and obtain apd array chip work
Make temperature, then control digital regulation resistance to export suitable resistance value to exporting adjustable high-pressure modular；Described microprocessor is also
Read the value of ad transducer ii, thus obtaining the adjustable high-pressure modular real output value of output；Described microprocessor also will be controlled
Buzzer warning processed and display module complete to show.
Digital regulation resistance, is controlled by microprocessor and exports suitable resistance value, so that output adjustable high-pressure modular output
The required bias voltage value under current operating temperature of apd array chip is it is ensured that each apd unit on array chip is in and connects
The high gain state of nearly snowslide.
Export adjustable high-pressure modular, the resistance value according to digital regulation resistance exports corresponding high-voltage value to apd array chip.
Ad transducer ii, for the magnitude of voltage of Real-time Collection output adjustable high-pressure modular output, prevents from exporting adjustable high pressure
Module hinders for some reason and damages expensive apd array chip.
Buzzer, sends warning when exporting adjustable high-pressure modular output voltage and being abnormal.
Display module, for showing critesistor partial pressure value, the resistance of critesistor, apd array chip operating temperature, number
Word potentiometer output valve and the adjustable high-pressure modular output voltage values of output.
Apd array chip bias high voltage Full-automatic temperature compensation system of the present utility model, by detecting critesistor
Resistance draws apd array chip operating temperature, thus obtaining required optimal reverse bias voltage, recycles digital regulation resistance to change
Export the output voltage of adjustable high-pressure modular, make apd array chip obtain the reverse bias voltage mating with current operating temperature,
Achieve the Full-automatic temperature compensation function of apd array chip reverse bias voltage.
The utility model has the advantage of: (1) is used the temperature that critesistor gathers as apd array chip operating temperature
Sensor, small volume, sensitivity is high.(2) connected with digital regulation resistance and export adjustable high-pressure modular control end, such microprocessor
Only need to control digital regulation resistance output according to the thermosensitive resistance measured, without human intervention or using other hand regulators
Part is so that it may make output adjustable high-pressure modular output voltage values automatically follow the change of apd array chip operating temperature it is achieved that complete
Auto thermal compensation.(3) by increasing a build-out resistor, the exponential type nonlinear function of critesistor and temperature is turned
Turn to linear functional relation, circuit structure is simple, also assures that the concordance of sampling sensitivity simultaneously.(4) adopt microprocessor
Built-in ad transducer, need not increase ad converter chip and board area will not be caused to increase.(5) ad transducer ii is used to gather
Export adjustable high-pressure modular actual output voltage value, expensive apd array chip is served with safeguard protection effect.
Brief description
Fig. 1 is this utility model apd array chip bias voltage Full-automatic temperature compensation apparatus structure block diagram.
Fig. 2 this utility model critesistor sample graph.
Fig. 3 this utility model microprocessor control flow chart.
Specific embodiment
Describe specific embodiment of the present utility model below in conjunction with the accompanying drawings in detail.
Embodiment:
As shown in figure 1, apd array chip bias voltage Full-automatic temperature compensation device is by apd array chip 101, temperature-sensitive
Resistance 108, ad transducer i 107, build-out resistor 110, ad transducer ii 105, microprocessor 102, digital regulation resistance 103, defeated
Go out adjustable high-pressure modular 104, buzzer 109 and display module 106 to constitute.Critesistor 108 is fixed on apd array chip 101
On；Ad transducer i connects critesistor 108 and build-out resistor 110；The outfan connection ad exporting adjustable high-pressure modular 104 turns
Parallel operation ii 105 and apd array chip 101；The control end exporting adjustable high-pressure modular 104 is connected with digital regulation resistance 103；Micro-
Processor 102 connects ad transducer i 107, ad transducer ii 105, digital regulation resistance 103, display module 106 and buzzer
109.
The 5x5 apd square array chip that apd array chip 101 is produced from German first sensor company, this core
25 apd units are integrated with piece, these apd units constitute 5x5 square array.
Critesistor 108, as temperature sensor, its resistance value can change with temperature, and the present embodiment selects the U.S.
The high accuracy negative temperature coefficient ntc critesistor with glass sheath that vishay company produces, is encapsulated as 0805 paster, volume
Little, sensitivity is high, and is fixed on apd array chip so as to resistance value follows apd array chip 101 work at present temperature
Spend and change.
Ad transducer i 107, for gathering the partial pressure of critesistor 108.Ad transducer i 107 in the present embodiment uses
The built-in ad transducer of microprocessor 102, so need not increase extra ad conversion chip, do not result in temperature compensation system electricity
Road plate suqare increases.
Build-out resistor 110, is a precision resister being connected with critesistor 108, for by critesistor and temperature
Exponential type nonlinear function be converted into linear functional relation it is ensured that the concordance of sampling sensitivity.
Microprocessor 102, the stm32f103rct6 of the arm cortex m3 framework being produced from ST Microelectronics
Microprocessor.For reading the value of ad transducer i 107, calculate the resistance of critesistor 108, then acquisition apd array core of tabling look-up
The operating temperature of piece 101, then controls digital regulation resistance 103 to export the control being suitably worth to exporting adjustable high-pressure modular 104
End；Microprocessor 102 is additionally operable to read the value of ad transducer ii 105, thus obtaining the reality exporting adjustable high-pressure modular 104
Output valve, sends warning when exporting adjustable high-pressure modular 104 output abnormality by microprocessor 102 buzzer 109 also to be controlled；
Also display module 106 to be controlled shows the resistance of critesistor 108, the work at present of apd array chip 101 to microprocessor 102
Temperature, the output resistance of digital regulation resistance 103 and export adjustable high-pressure modular 104 reality output high-voltage value, described high pressure
Value be apd array chip 101 obtain temperature compensated after bias voltage value.
Digital regulation resistance 103, the 10k ω digital regulation resistance being produced from microchip company, model mcp41010.
Current operating temperature according to apd array chip 101 is controlled digital regulation resistance 103 to export suitable electricity by microprocessor 102
Resistance is to the control end exporting adjustable high-pressure modular 104, so that the adjustable high-pressure modular 104 of output exports apd array chip 101
Current operating temperature snow required bias voltage value it is ensured that 25 apd units on apd array chip 101 be in close
The high gain state collapsing.Due to employing digital regulation resistance 103, microprocessor 102 needs according to the thermosensitive resistance control measured
Digital regulation resistance 103 processed exports, without human intervention or using other hand regulator parts so that it may make the adjustable high-pressure modular of output
104 output voltage values follow the change of apd array chip 101 operating temperature automatically it is achieved that Full-automatic temperature compensation.
Export adjustable high-pressure modular 104, the 0-300v output adjustable type high-pressure modular producing from Tianjin Dong Wen company.Defeated
The control end going out adjustable high-pressure modular 104 connects the resistance outfan of digital regulation resistance 103, exports adjustable high-pressure modular 104
Outfan connects apd array chip 101, provides suitable bias voltage for this chip.
Ad transducer ii 105, for the magnitude of voltage of Real-time Collection output adjustable high-pressure modular 104 output, can prevent from exporting
Adjustable high-pressure modular 104 breaks down and damages expensive apd array chip 101.In order to not increase whole temperature compensation system
Volume, the ad transducer ii 105 in the present embodiment is also the built-in ad transducer using microprocessor 102.
Buzzer 109, sends warning when exporting adjustable high-pressure modular 104 output voltage and being abnormal.
Display module 106, from compact word Liquid Crystal Module.For showing partial pressure value and the resistance of critesistor 108
Value, the operating temperature of apd array chip 101, the resistance value of digital regulation resistance 103, export the output electricity of adjustable high-pressure modular 104
Pressure value.Also carry out flickering display when exporting adjustable high-pressure modular 104 output voltage exception.
Fig. 2 is critesistor sample graph, comprising: critesistor 108, ad transducer i 107, build-out resistor 110.This reality
Apply in example, build-out resistor 110 employs the low excursion with temperature of vishay company of U.S. production, high stability resistance；Critesistor
108 using the high accuracy ntc critesistor with glass sheath for the vishay company.Described sample circuit structure is simple, essence
Degree is high it is achieved that the linearisation of critesistor and the exponential type nonlinear function of temperature is it is ensured that the concordance of sampling sensitivity.
The apd array chip bias voltage Full-automatic temperature compensation device work process of the present embodiment is as follows:
1) microprocessor 102 reads the value of ad transducer i 107, calculates the resistance of critesistor 108, then acquisition of tabling look-up
The current operating temperature of apd array chip 101, then calculates the resistance value that digital regulation resistance 103 should export.
2) digital regulation resistance 103 exports corresponding resistance value to the control end exporting adjustable high-pressure modular 104, exports adjustable
High-pressure modular 104 then exports corresponding voltage to apd array chip 101 by outfan, and such apd array chip 101 just obtains
Required bias voltage under current operating temperature.
3) magnitude of voltage of ad transducer ii 105 collection output adjustable high-pressure modular 104 output, if this magnitude of voltage is abnormal,
Microprocessor 102 can adjust the output resistance of digital regulation resistance 103 immediately, and triggers buzzer 109 warning and display module 106
Flickering display, is prevented effectively from and extremely expensive apd array chip 101 is caused to damage because exporting adjustable high-pressure modular 104.
Fig. 3 be microprocessor control flow chart, microprocessor 102 as the present embodiment control unit be operate in embedded
On formula operating system uc/os ii, the present embodiment is built together vertical 4 tasks, is respectively: ad convert task, calculating task, shows
Show and warning task and beginning a task with.This flow chart starts from step s301.
In step s302, microprocessor 102 configures to system hardware, simultaneously also to embedded OS uc/os
Ii is initialized, for executing follow-up each task preparation environment.
In step s303, uc/os ii startup begins a task with.
In step s304, begin a task with the term of execution, uc/os ii creates other three tasks, is respectively: ad conversion
Task, calculating task, display and warning task, after the completion of three described task creations, begin a task with and are suspended.Hereafter exist
Under uc/os ii scheduling, microprocessor 102 runs three described tasks in round-robin mode simultaneously it may be assumed that step s305-
The ad convert task of s309, the calculating task of step s310-s316, the display of step s317-s325 and warning task are simultaneously
Run.
In step s305, microprocessor 102 brings into operation ad convert task.
In step s306, microprocessor 102 controls ad transducer i 107 and ad transducer ii 105 to carry out ad conversion.
In step s307, microprocessor 102 sends the transformation result of ad transducer i 107 to mailbox 1, described mailbox
It is a kind of mechanism realized between different task and communicating.
In step s308, microprocessor 102 sends the transformation result of ad transducer i 107 to mailbox 2.
In step s309, microprocessor 102 sends the transformation result of ad transducer ii 105 to mailbox 3.
In step s310, microprocessor 102 brings into operation calculating task.
In step s311, calculating task inquires about mailbox 1, sees whether receive the ad transducer i 107 sending in step s307
Transformation result, if received, proceed to step s312 immediately, after otherwise time delay reaches enter step s312.
In step s312, microprocessor 102 is calculated critesistor 108 according to the transformation result of ad transducer i 107
Resistance value, then look into compareing form and can obtaining apd array chip 101 of critesistor resistance and temperature in program storage
Current operating temperature.
In step s313, microprocessor 102 sends a message to mailbox 4, and described message content is apd array chip 101
Current operating temperature.
In step s314, microprocessor 102 calculates apd array chip according to apd array chip 101 current operating temperature
101 bias voltage values required at this working temperature, according to the output exporting adjustable high-pressure modular and control planning curve
Calculate the resistance value that digital regulation resistance 103 should export.
In step s315, digital regulation resistance 103 is controlled to export calculated resistance value to exporting adjustable high-pressure modular 104
Control end, then export adjustable high-pressure modular 104 and export bias voltage value described in step s314, such apd array chip
101 just obtain the bias voltage after temperature-compensating.
In step s316, microprocessor 102 sends a message to mailbox 5, and described message content calculates for step s314
The resistance value that should export of digital regulation resistance 103 and apd array chip 101 needed for bias voltage value.
In step s317, microprocessor 102 brings into operation and shows and warning task.
In step s318, display and warning job enquiry mailbox 2, see whether receive the ad transducer sending in step s308
The transformation result of i 107, if received, proceeds to step s319 immediately, enters step s319 after otherwise time delay reaches.
In step s319, show the partial pressure value of critesistor 108, described partial pressure value is turning by ad transducer i 107
Change what result conversion obtained.
In step s320, display and warning job enquiry mailbox 3, see whether receive the ad transducer sending in step s309
The transformation result of ii 105, if received, proceeds to step s321 immediately, enters step s321 after otherwise time delay reaches.
In step s321, the output voltage values of display output is adjustable high-pressure modular 104, described output voltage values are by ad
The transformation result conversion of transducer ii 105 obtains, if described output voltage values are abnormal, buzzer warning, and show
Show that module carries out flickering display.
In step s322, display and warning job enquiry mailbox 4, see whether receive the message sending in step s313, such as
Fruit receives, and proceeds to step s323 immediately, enters step s323 after otherwise time delay reaches.
In step s323, show the current operating temperature of apd array chip 101.
In step s324, display and warning job enquiry mailbox 5, see whether receive the digital current potential sending in step s316
Bias voltage value needed for resistance value that device 103 should export and apd array chip 101, if received, proceeds to step immediately
S325, enters step s325 after otherwise time delay reaches.
Biasing needed for the resistance value that step s325, display digit potentiometer 103 should export and apd array chip 101
Magnitude of voltage.
Claims (1)
1. a kind of apd array chip bias voltage Full-automatic temperature compensation device is it is characterised in that apd array chip biased electrical
Pressure Full-automatic temperature compensation device includes apd array chip (101), critesistor (108), ad transducer i (107), coupling electricity
Resistance (110), ad transducer ii (105), microprocessor (102), digital regulation resistance (103), export adjustable high-pressure modular (104),
Buzzer (109) and display module (106)；Critesistor (108) is fixed on apd array chip (101), ad transducer i
(107) connect critesistor (108), output adjustable high-pressure modular (104) outfan connects ad transducer ii (105) and apd battle array
Row chip (101), output adjustable high-pressure modular (104) control end is connected with digital regulation resistance (103), and microprocessor (102) is even
Connect ad transducer i (107), ad transducer ii (105), digital regulation resistance (103), buzzer (109) and display module
(106)；
It is integrated with multiple apd units, these apd units can constitute 1xn linear array and nxn side on apd array chip (101)
Type array, wherein: n is 5-16；
Critesistor (108) is used as temperature sensor, and its resistance value is sized to reflect the work temperature of apd array chip (101)
Degree；
Ad transducer i (107) is used for gathering the partial pressure of critesistor (108)；
Build-out resistor (110) is used for for the exponential type nonlinear function of critesistor (108) and temperature being converted into linear letter
Number relations are it is ensured that the concordance of sampling sensitivity；
Microprocessor (102) is used for reading the value of ad transducer i (107), calculates the resistance of critesistor (108), then tables look-up
To the operating temperature of apd array chip (101), then controlling digital regulation resistance (103) to export suitable resistance value can to output
Heighten die block (104)；Described microprocessor (102) also will read the value of ad transducer i (105), thus obtain output can
Heighten die block (104) real output value；Described microprocessor (102) also report to the police and show by buzzer (109) to be controlled
Module (106) completes to show；
Digital regulation resistance (103) controls the suitable resistance value of output by microprocessor (102), so that exporting adjustable high-pressure modular
(104) output apd array chip (101) bias voltage required under current operating temperature is it is ensured that each on array chip
Apd unit is in the high gain state close to snowslide；
Export adjustable high-pressure modular (104) and corresponding high-voltage value is exported to apd array according to the resistance value of digital regulation resistance (103)
Chip (101)；
Ad transducer i (105) is used for Real-time Collection and exports adjustable high-pressure modular (104) magnitude of voltage that exports, prevents from exporting adjustable
High-pressure modular (104) hinders for some reason and damages expensive apd array chip (101)；
Buzzer (109) sends warning when exporting adjustable high-pressure modular (104) output voltage exception；
Display module (106) is used for showing critesistor (108) partial pressure value, the resistance of critesistor (108), apd array chip
(101) operating temperature, digital regulation resistance (103) output valve and output adjustable high-pressure modular (104) output voltage values；
Described ad transducer is analog-digital converter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620829243.0U CN205899425U (en) | 2016-07-31 | 2016-07-31 | Full -automatic temperature compensated equipment of APD array chip offset voltage |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201620829243.0U CN205899425U (en) | 2016-07-31 | 2016-07-31 | Full -automatic temperature compensated equipment of APD array chip offset voltage |
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| Publication Number | Publication Date |
|---|---|
| CN205899425U true CN205899425U (en) | 2017-01-18 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201620829243.0U Expired - Fee Related CN205899425U (en) | 2016-07-31 | 2016-07-31 | Full -automatic temperature compensated equipment of APD array chip offset voltage |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106094963A (en) * | 2016-07-31 | 2016-11-09 | 桂林理工大学 | APD array chip bias voltage Full-automatic temperature compensation system |
| CN114242006A (en) * | 2021-11-12 | 2022-03-25 | 华田信科（廊坊）电子科技有限公司 | Intelligent ammeter and temperature compensation display driving method |
-
2016
- 2016-07-31 CN CN201620829243.0U patent/CN205899425U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106094963A (en) * | 2016-07-31 | 2016-11-09 | 桂林理工大学 | APD array chip bias voltage Full-automatic temperature compensation system |
| CN114242006A (en) * | 2021-11-12 | 2022-03-25 | 华田信科（廊坊）电子科技有限公司 | Intelligent ammeter and temperature compensation display driving method |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20170118 Termination date: 20170731 |