CN108009355B - Darkroom spherical array compact field quiet zone characteristic spectrum analysis method - Google Patents

Darkroom spherical array compact field quiet zone characteristic spectrum analysis method Download PDF

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CN108009355B
CN108009355B CN201711247327.9A CN201711247327A CN108009355B CN 108009355 B CN108009355 B CN 108009355B CN 201711247327 A CN201711247327 A CN 201711247327A CN 108009355 B CN108009355 B CN 108009355B
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spherical array
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苏杨
尹光
耿波
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Nanjing Changfeng Space Electronics Technology Co Ltd
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Abstract

The invention discloses a darkroom spherical array compact field quiet zone characteristic spectrum analysis method, which comprises the steps of designing a feed source antenna, a reflecting surface and a spherical array model according to a frequency band and the size of a compact field; importing the designed model into electromagnetic modeling software, and extracting the electric field distribution of the sampling points of the static field; calculating the angular spectrum distribution of the static field according to the electric field distribution of the sampling points of the static field; and analyzing the diffraction field distribution according to the field angle spectrum of the dead zone. The electromagnetic modeling software can directly generate the data of the static field without considering the aperture surface field distribution and the free space network response function, and can analyze the influence of the spherical array on the compact field.

Description

Darkroom spherical array compact field quiet zone characteristic spectrum analysis method
Technical Field
The invention relates to a darkroom spherical array compact field quiet zone characteristic spectrum analysis method, and belongs to the field of compact field design.
Background
In the design process of a reflecting surface compact field (compact field: an electromagnetic field obtained by simulating far-field radiation and scattering conditions in a limited space in a microwave darkroom), in order to obtain stable distribution of a static field (the static field: the position of an object to be analyzed in the microwave darkroom needs to have the characteristics of stable electric field phase and amplitude), the shape of a reflecting surface and the distribution of an irradiation field need to be optimally designed, but because a plurality of diffraction field components exist in the static field, uneven standing wave distribution can be formed in the space, and when the frequency is changed, the distribution of an airspace field is changed. When the compact range is optimally designed, in order to investigate the quality of the design, the conventional method is to compare the change of the standing wave peak value or the root mean square of a quiet zone on a plurality of frequency points, and synthesize the change in a full frequency band, so that the workload is large. And because the index only reflects the total field change of a plurality of diffraction field components, and a direct relation with a certain type of diffraction field is not established, the mechanism generated by the diffraction field is inconvenient to analyze.
At present, the aperture near-field angular spectrum analysis method based on convolution method can be used for analyzing the diffraction field characteristics of compact field, because the aperture near field or far field can be represented as convolution of the aperture field space network corresponding function, the angular spectrum of the aperture near field and far field can be derived as the product of the aperture field angular spectrum and the network response function (the space is regarded as a filter, an impact pulse is placed at any point of the space, then the obtained electric field is received at any other point of the space, and the function between the impact pulse and the received electric field is the network response function), thereby calculating the angular spectrum of the aperture near field and far field. The method comprises the following steps of firstly solving an aperture field angular spectrum according to aperture field distribution, then solving an angular spectrum of the aperture field angular spectrum according to a free space network response function, and finally multiplying the aperture field angular spectrum and the free space network response function angular spectrum to obtain a final result.
However, in practical engineering, the feed source for generating the aperture field is a corrugated antenna or a square horn antenna, and is affected by the undesirable directional diagram, the electric field distribution obtained by the aperture surface (aperture surface: aperture cross section of the reflector antenna) is far different from the ideal distribution, and especially when a large diffraction field generating structure such as a spherical array (a spherical array: a metal spherical surface provided with a plurality of antennas and used for simulating the generation of plane waves in any direction in a microwave darkroom) appears in the compact field. Therefore, the aperture field given by the ideal mathematical model is far from the actual distribution.
Secondly, when large diffraction field generating structures such as a spherical array exist in a compact field, a spatial network response function with a complete mathematical expression cannot be obtained, so that the traditional method cannot provide a characteristic angle spectrum of the spatial network response function. Therefore, a method of obtaining the angular distribution of the feature of the dead zone field by convolution is not feasible.
Disclosure of Invention
In order to solve the technical problem, the invention provides a darkroom spherical array compact field quiet zone characteristic spectrum analysis method.
In order to achieve the purpose, the invention adopts the technical scheme that:
a darkroom spherical array compact field quiet zone characteristic spectrum analysis method comprises,
designing a feed source antenna, a reflecting surface and a spherical array model according to the frequency band and the compact range size;
importing the designed model into electromagnetic modeling software, and extracting the electric field distribution of the sampling points of the static field;
calculating the angular spectrum distribution of the static field according to the electric field distribution of the sampling points of the static field;
and analyzing the diffraction field distribution according to the field angle spectrum of the dead zone.
And designing a feed source antenna, a reflecting surface and a spherical array model in CAD software according to the frequency band and the compact range size.
And (4) introducing the model into FEKO, setting an excitation type, and extracting the electric field distribution of the sampling points of the static field.
The set excitation type is waveguide excitation, and the distance between sampling points is less than 1/3 working wavelengths.
Out file, from which the electric field distribution of the quiet zone field sampling points is extracted.
The angular spectral distribution of the dead zone field is calculated using FFT and IFFT, and the formula is,
Figure BDA0001490979000000031
wherein M and N are the number of sampling points in x and y directions of the quiet zone field, kxIs the x-direction component of the wavenumber, kyIs the y-direction component of wave number, G is the static field electric field component, G is the static field angle spectrum component, FFT and IFFT are the fast Fourier transform and inverse transform, p and q are the element numbers of two-dimensional FFT, Deltax are the space of sampling point in x and y directions, x0、y0Is the relative origin coordinates of the quiet zone center.
kxAnd kyThe relationship with the angular spectrum of incidence angles is,
kx＝k0sin(θ)cos(φ)
ky＝k0sin(θ)sin(φ)
wherein k is0Theta and phi are angle components of the spherical coordinate system, which are wave numbers in free space.
The invention achieves the following beneficial effects: 1. because the electromagnetic modeling software (software for performing electromagnetic simulation by using a computational electromagnetism algorithm) can directly generate the data of the dead zone field, the distribution of the aperture surface field and the response function of the free space network do not need to be considered; 2. the invention can analyze the influence of the spherical array on the compact range; 3. the present invention uses fast fourier acceleration angular spectrum analysis.
Drawings
FIG. 1 is a flow chart of the present invention;
FIG. 2 is a schematic diagram of a feed antenna;
FIG. 3 is a front view of a spherical array compact range;
FIG. 4 is a side view of a spherical array compact range;
FIG. 5 is a top view of a spherical array compact range;
FIG. 6 is a schematic angular spectrum.
Detailed Description
The invention is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
As shown in fig. 1, a darkroom spherical array compact field quiet zone feature spectrum analysis method comprises the following steps:
step 1, designing a feed source antenna, a reflecting surface and a spherical array model in CAD software according to the frequency band and compact range size, as shown in figures 2-5, wherein the spherical array is replaced by an ideal spherical surface for simplifying display.
And 2, importing the designed model into electromagnetic modeling software, setting an excitation type, and extracting the electric field distribution of the sampling points of the static field.
The set excitation type is waveguide excitation, the distance between sampling points is smaller than 1/3 working wavelengths, the existing electromagnetic modeling software can be CST, HFSS, FEKO and the like, and can be used, the FEKO is adopted here, the FEKO exports an out file, programming software is used for reading in the out file generated by the FEKO, and the electric field distribution of the sampling points of the static field is extracted from the file.
And 3, calculating the angular spectrum distribution of the static field according to the electric field distribution of the sampling points of the static field.
In order to accelerate the angular spectrum analysis, the FFT and IFFT are used to calculate the angular spectrum distribution of the dead zone field, and the specific formula is as follows:
Figure BDA0001490979000000051
wherein M and N are respectively adopted in x and y directions for the quiet zone fieldNumber of spots, kxIs the x-direction component of the wavenumber, kyIs the y-direction component of wave number, G is the static field electric field component (G (x, y), G (M,1: N) G means static field electric field component), G is the static field angle spectrum component, FFT and IFFT are fast Fourier transform and inverse transform, p and q are the element number of two-dimensional FFT, Deltax are the space of sampling point in x and y direction, x and Deltax are the element number of two-dimensional FFT0、y0Is the relative origin coordinates of the quiet zone center.
And 4, analyzing the diffraction field distribution according to the field angle spectrum of the quiet area.
kxAnd kyThe relationship with the angular spectrum of incidence angles is,
kx＝k0sin(θ)cos(φ)
ky＝k0sin(θ)sin(φ)
wherein k is0Theta and phi are angle components of the spherical coordinate system, which are wave numbers in free space. After the wave number is obtained, electric field components in different directions can be extracted according to a formula. Only the angle spectrum of the static area field where the reflecting surface is installed and the angle spectrum of the static area field where the reflecting surface and the spherical array are installed are shown in fig. 6, it can be seen that, at the working frequency of 10GHz, a diffraction field component in the incoming wave direction of 70 degrees to 90 degrees can be generated in the static area field after the spherical array is installed, and a new diffraction field component can be generated in the incoming wave direction of-30 degrees through the secondary reflection of the reflecting surface, and the amplitude of the new diffraction field component is less than 10 dB.
In the method, because the electromagnetic modeling software (software for performing electromagnetic simulation by using a computational electromagnetism algorithm) can directly generate the data of the dead zone field, the influence of the spherical array on the compact field can be analyzed without considering the aperture surface field distribution and the free space network response function.
The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims (5)

1. A darkroom spherical array compact field quiet zone characteristic spectrum analysis method is characterized by comprising the following steps: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
designing a feed source antenna, a reflecting surface and a spherical array model according to the frequency band and the compact range size;
importing the designed model into electromagnetic modeling software, and extracting the electric field distribution of the sampling points of the static field;
calculating the angular spectrum distribution of the static field according to the electric field distribution of the sampling points of the static field;
the angular spectral distribution of the dead zone field is calculated using FFT and IFFT, and the formula is,
Figure FDA0002980115190000011
wherein M and N are the number of sampling points in x and y directions of the quiet zone field, kxIs the x-direction component of the wavenumber, kyIs the y-direction component of wave number, G is the static field electric field component, G is the static field angle spectrum component, FFT and IFFT are the fast Fourier transform and inverse transform, p and q are the element numbers of two-dimensional FFT, Deltax are the space of sampling point in x and y directions, x0、y0Is the relative origin coordinates of the quiet zone center;
kxand kyThe relationship with the angular spectrum of incidence angles is,
kx＝k0sin(θ)cos(φ)
ky＝k0sin(θ)sin(φ)
wherein k is0The wave number in the free space is theta and phi, and the angle components of the spherical coordinate system are theta and phi;
and analyzing the diffraction field distribution according to the field angle spectrum of the dead zone.
2. The darkroom spherical array compact field quiet zone feature spectrum analysis method of claim 1, wherein: and designing a feed source antenna, a reflecting surface and a spherical array model in CAD software according to the frequency band and the compact range size.
3. The darkroom spherical array compact field quiet zone feature spectrum analysis method of claim 1, wherein: and (4) introducing the model into FEKO, setting an excitation type, and extracting the electric field distribution of the sampling points of the static field.
4. The darkroom spherical array compact field quiet zone feature spectrum analysis method of claim 3, wherein: the set excitation type is waveguide excitation, and the distance between sampling points is less than 1/3 working wavelengths.
5. The darkroom spherical array compact field quiet zone feature spectrum analysis method of claim 3, wherein: out file, from which the electric field distribution of the quiet zone field sampling points is extracted.
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