CN107990994A - A kind of multichannel Pt Resistance Temperature Measuring Circuit and method - Google Patents

A kind of multichannel Pt Resistance Temperature Measuring Circuit and method Download PDF

Info

Publication number
CN107990994A
CN107990994A CN201711098926.9A CN201711098926A CN107990994A CN 107990994 A CN107990994 A CN 107990994A CN 201711098926 A CN201711098926 A CN 201711098926A CN 107990994 A CN107990994 A CN 107990994A
Authority
CN
China
Prior art keywords
chip
thermometric
decoder
multiplexer
resistance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711098926.9A
Other languages
Chinese (zh)
Inventor
于鹏
郭亮
韩哈斯敖其尔
李行
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Changchun Institute of Optics Fine Mechanics and Physics of CAS
Original Assignee
Changchun Institute of Optics Fine Mechanics and Physics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Changchun Institute of Optics Fine Mechanics and Physics of CAS filed Critical Changchun Institute of Optics Fine Mechanics and Physics of CAS
Priority to CN201711098926.9A priority Critical patent/CN107990994A/en
Publication of CN107990994A publication Critical patent/CN107990994A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01KMEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
    • G01K7/16Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements
    • G01K7/18Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using resistive elements the element being a linear resistance, e.g. platinum resistance thermometer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Temperature Or Quantity Of Heat (AREA)

Abstract

The invention discloses a kind of multichannel Pt Resistance Temperature Measuring Circuit, it includes main control chip, decoder, multiplexer and multiple thermometric chips, the input terminal of the thermometric chip is connected with platinum resistance, the SPI interface of multiple thermometric chips is all connected to the SPI interface of the main control chip, the Enable Pin of multiple thermometric chips connects multiple enable signal output terminals of decoder respectively, the middle broken ends of fractured bone of multiple thermometric chips connects multiple interrupt signal input terminals of multiplexer respectively, the control terminal of the decoder and the control terminal of multiplexer are all connected to the I/O port of main control chip.The present invention has the characteristics that circuit structure is simple, is easily achieved, can improve measurement accuracy.

Description

A kind of multichannel Pt Resistance Temperature Measuring Circuit and method
Technical field
The present invention relates to temperature measurement circuit, more particularly to a kind of multichannel Pt Resistance Temperature Measuring Circuit and method.
Background technology
Temperature survey needs physical quantity being converted to electric signal, then is changed by electrical means, calculates temperature value, and warm Degree is converted to electric signal and just needs to use temperature sensor, and most common of which is exactly platinum resistance, its resistance value with temperature change Change and change, and it is dull, it is common to have PT100 and PT1000.Traditional Pt Resistance Temperature Measuring Circuit is more complicated, is related to simulation Circuit, analog-to-digital conversion, algorithm etc., especially when carrying out multichannel measurement, in order to share process circuit, a/d converter and MCU, usually Multichannel platinum resistance is accessed into measuring circuit by analog switch, is measured successively by gating, and in order to eliminate platinum resistance circuit Influence of the resistance to measurement accuracy, usually using three-wire system connection, so when thermometric way is very much, circuit scale is just huger Greatly, simultaneously because sealing in for each passage difference conducting resistance of analog switch, influences measurement accuracy.It can be seen from the above that in the prior art Lack multi-route measuring temperature circuit and the method that a kind of simplicity is easily realized.
The content of the invention
The technical problem to be solved in the present invention is, in view of the deficiencies of the prior art, there is provided a kind of circuit structure is simple, easily In realizing, the multichannel Pt Resistance Temperature Measuring Circuit and method of measurement accuracy can be improved.
In order to solve the above technical problems, the present invention adopts the following technical scheme that.
A kind of multichannel Pt Resistance Temperature Measuring Circuit, it includes main control chip, decoder, multiplexer and multiple thermometric cores Piece, the input terminal of the thermometric chip are connected with platinum resistance, and the SPI interface of multiple thermometric chips is all connected to the main control chip SPI interface, the Enable Pin of multiple thermometric chips connects multiple enable signal output terminals of decoder, multiple thermometric chips respectively The middle broken ends of fractured bone connect multiple interrupt signal input terminals of multiplexer, the control terminal and multiplexer of the decoder respectively Control terminal be all connected to the I/O port of main control chip, the main control chip to decoder and multiplexer output control signal, To make the decoder output enable signal to the Enable Pin of current thermometric chip, while the current survey of multiplexer detection The interrupt signal of the middle broken ends of fractured bone output of warm chip, current thermometric chip are and anti-by spi bus by platinum resistance collecting temperature data Main control chip is fed to, the main control chip controls next thermometric chip to gather and feed back by decoder and multiplexer afterwards Temperature data.
Preferably, the chip model of the main control chip is STM32F103RCT6, and the chip model of the thermometric chip is MAX31865。
Preferably, the decoder is 4-16 line decoders.
Preferably, the chip model of the decoder is CD74HC154.
Preferably, the multiplexer is 16 channel analog multiplexers.
Preferably, the chip model of the multiplexer is CD74HC4067.
A kind of multichannel platinum resistor temperature measuring method, this method realize that the circuit includes main control chip, translates based on a circuit Code device, multiplexer and multiple thermometric chips, the input terminal of the thermometric chip are connected with platinum resistance, multiple thermometric chips SPI interface is all connected to the SPI interface of the main control chip, and the Enable Pin of multiple thermometric chips connects the multiple of decoder respectively Enable signal output terminal, the middle broken ends of fractured bone of multiple thermometric chips connect multiple interrupt signal input terminals of multiplexer, institute respectively State the control terminal of decoder and the control terminal of multiplexer is all connected to the I/O port of main control chip, the described method includes:Step S1, the main control chip is to decoder and multiplexer output control signal;Step S2, the decoder export enable signal To the Enable Pin of current thermometric chip, while the multiplexer detects the interruption letter of the middle broken ends of fractured bone output of current thermometric chip Number;Step S3, current thermometric chip feed back to main control chip by platinum resistance collecting temperature data by spi bus;Step S4, the main control chip control next thermometric chip collection and feedback temperature data by decoder and multiplexer;Repeat Step S1~step S4, until whole thermometric chips complete collection and the feedback of temperature data.
Preferably, the thermometric chip is circumscribed with default reference resistance, and the temperature data of the thermometric chip feedback is The ratio of platinum resistance resistance value and reference resistance resistance value, the main control chip draw platinum according to the ratio and reference resistance computing the resistor value Resistance, the temperature value measured by platinum resistance is drawn further according to platinum resistance computing the resistor value.
In multichannel Pt Resistance Temperature Measuring Circuit disclosed by the invention, main control chip makes decoder and multichannel answer by control signal Enable signal and detection interrupt signal are exported respectively with device to control the thermometric chip specified so that the thermometric chip passes through platinum electricity Collecting temperature data are hindered, and temperature data is fed back to by main control chip by bus interface, thus complete current thermometric chip Temperature data acquisition, controls next thermometric chip using the same manner, main control chip by decoder and multiplexer afterwards Collection and feedback temperature data, until whole thermometric chips complete the feedback of temperature data.Based on foregoing circuit principle, the present invention Without analog switch, sealing in for each passage difference conducting resistance of analog switch is avoided, and then improves measurement accuracy, together When the bus mode that uses of the present invention simplify circuit structure, in addition, the present invention can select to survey according to actual thermometric demand Warm way, its actual thermometric way can be 8 tunnels, 32 tunnels, 64 tunnels etc., can meet a variety of thermometric demands, and be easily achieved.
Brief description of the drawings
Fig. 1 is multichannel Pt Resistance Temperature Measuring Circuit schematic diagram of the present invention.
Embodiment
The present invention is described in more detail with reference to the accompanying drawings and examples.
The invention discloses a kind of multichannel Pt Resistance Temperature Measuring Circuit, Fig. 1 is refer to, it includes main control chip U17, decoding Device U18, multiplexer U19 and multiple thermometric chips (U1~U16), the input terminal connection of the thermometric chip (U1~U16) There is platinum resistance, the SPI interface of multiple thermometric chips (U1~U16) is all connected to the SPI interface of the main control chip U17, multiple The Enable Pin CS of thermometric chip (U1~U16) connects multiple enable signal output terminals (Y0~Y15) of decoder U18 respectively, more The middle broken ends of fractured bone DRDY of a thermometric chip (U1~U16) connect respectively multiplexer U19 multiple interrupt signal input terminals (I0~ I15), the control terminal of the decoder U18 and the control terminal of multiplexer U19 are all connected to the I/O port of main control chip U17, institute Main control chip U17 is stated to decoder U18 and multiplexer U19 output control signals, to make the decoder U18 outputs enabled Signal is to the Enable Pin CS of current thermometric chip (U1~U16), while the multiplexer U19 detects current thermometric chip The interrupt signal of the middle broken ends of fractured bone DRDY outputs of (U1~U16), current thermometric chip (U1~U16) pass through platinum resistance collecting temperature number According to, and main control chip U17 is fed back to by spi bus, the main control chip U17 passes through decoder U18 and multiplexer afterwards U19 controls next thermometric chip (U1~U16) collection and feedback temperature data.
In foregoing circuit, main control chip U17 makes decoder U18 and multiplexer U19 export respectively by control signal Enable signal controls the thermometric chip (U1~U16) specified with detection interrupt signal so that the thermometric chip (U1~U16) is logical Platinum resistance collecting temperature data are crossed, and temperature data is fed back to by main control chip U17 by bus interface, thus complete current survey The temperature data acquisition of warm chip (U1~U16), passes through decoder U18 and multichannel using the same manner, main control chip U17 afterwards Multiplexer U19 controls next thermometric chip (U1~U16) collection and feedback temperature data, until whole thermometric chips (U1~ U16 the feedback of temperature data) is completed.Based on foregoing circuit principle, the present invention avoids analog switch without analog switch Each passage difference conducting resistance seals in, and then improves measurement accuracy, while the bus mode that the present invention uses simplifies electricity Line structure, in addition, the present invention can select thermometric way according to actual thermometric demand, its actual thermometric way can be 8 tunnels, 32 tunnels, 64 tunnels etc., can meet a variety of thermometric demands, and be easily achieved.
It should be noted that multiple thermometric chips (U1~U16) in the present embodiment, are not intended to limit thermometric way, it is made For the preferred embodiment of the present invention, it is only used for that technical scheme is better described.
Further, the chip model of the main control chip U17 is STM32F103RCT6.The STM32F103RCT6 chips It is a kind of 32 embedded microcontrollers, peak frequency 72MHz, 512K Flash built on piece, 64K SRAM.
Further, the chip model of the thermometric chip (U1~U16) is MAX31865.The MAX31865 chips are one Kind of RTD is maintained at 0.05%FS, maximum conversion time 21ms to numeral output converter, 15 ADC resolution ratio, overall accuracy, from Tape jam detects.
As a kind of preferred embodiment, the decoder U18 is 4-16 line decoders.The chip model of the decoder U18 For CD74HC154.The multiplexer U19 is 16 channel analog multiplexers.The multiplexer U19's is chip-shaped Number it is CD74HC4067.
In order to preferably describe technical scheme, the invention also discloses a kind of multichannel platinum resistor temperature measuring method, Fig. 1 is refer to, this method realizes that the circuit includes main control chip U17, decoder U18, multiplexer based on a circuit U19 and multiple thermometric chips (U1~U16), the input terminal of the thermometric chip (U1~U16) are connected with platinum resistance, multiple thermometrics The SPI interface of chip (U1~U16) is all connected to the SPI interface of the main control chip U17, multiple thermometric chips (U1~U16) Enable Pin CS connect multiple enable signal output terminals (Y0~Y15) of decoder U18 respectively, multiple thermometric chips (U1~ U16 middle broken ends of fractured bone DRDY) connects multiple interrupt signal input terminals (I0~I15) of multiplexer U19, the decoder respectively The control terminal of U18 and the control terminal of multiplexer U19 are all connected to the I/O port of main control chip U17, the described method includes:
Step S1, the main control chip U17 are to decoder U18 and multiplexer U19 output control signals;
Step S2, the decoder U18 output enable signal to the Enable Pin CS of current thermometric chip (U1~U16), together Shi Suoshu multiplexers U19 detects the interrupt signal of the middle broken ends of fractured bone DRDY outputs of current thermometric chip (U1~U16);
Step S3, current thermometric chip (U1~U16) are fed back to by platinum resistance collecting temperature data by spi bus Main control chip U17;
Step S4, the main control chip U17 control next thermometric chip (U1 by decoder U18 and multiplexer U19 ~U16) gather and feedback temperature data;
Repeat step S1~step S4, until whole thermometric chips (U1~U16) complete collection and the feedback of temperature data.
On the calculating process of temperature value, in the present embodiment, the thermometric chip (U1~U16) is circumscribed with default reference Resistance, the temperature data of thermometric chip (U1~U16) feedback is the ratio of platinum resistance resistance value and reference resistance resistance value, described Main control chip U17 draws platinum resistance resistance value according to the ratio and reference resistance computing the resistor value, is obtained further according to platinum resistance computing the resistor value Go out the temperature value measured by platinum resistance.
In the present embodiment, thermometric chip (U1~U16) uses the MAX31865 of MAXIM, and main control chip U17 is using ST's STM32F103RCT6, decoder U18 use the CD74HC154 of TI, multiplexer U19 to use the CD74HC4067 of TI.Its In, main control chip U17 reads the change data of thermometric chip (U1~U16) by spi bus, this data is corresponding platinum resistance The proportionate relationship of resistance value and reference resistance resistance value, and the resistance value of reference resistance is it is known that can thus obtain the resistance of corresponding platinum resistance Value, then calculated through certain algorithm, relevant temperature can be obtained, and enabled and interrupt signal the detection of each thermometric chip then divides Do not realize that so for main control chip, the control of all thermometric chips is consistent by decoder and multiplexer, according to The operation of all thermometric passages can be completed by cyclic program.
In practical application, platinum resistance interface X1~X16 connects three-wire system platinum resistance respectively, so each platinum resistance resistance value and its The ratio of corresponding reference resistance R1~R16 resistance values can be converted to corresponding digital quantity by thermometric chip U1~U16, then by leading Control chip U17 is read in by spi bus, by certain calculating, can obtain each platinum resistance measured temperature.If it is desired, can Measured temperature data are shown on charactron with slightly peripheral circuit or module, or are transmitted via serial ports, USB port, network interface etc. Shown and recorded on to host computer or PC machine.
The above is preferred embodiments of the present invention, is not intended to limit the present invention, all in the technical scope of the present invention Modification, equivalent substitution or improvement for being made etc., should be included in the range of of the invention protect.

Claims (10)

1. a kind of multichannel Pt Resistance Temperature Measuring Circuit, it is characterised in that include main control chip (U17), decoder (U18), multichannel Multiplexer (U19) and multiple thermometric chips ((U1~U16)), the input terminal of the thermometric chip ((U1~U16)) are connected with platinum Resistance, the SPI interface of multiple thermometric chips ((U1~U16)) is all connected to the SPI interface of the main control chip (U17), multiple The Enable Pin (CS) of thermometric chip ((U1~U16)) connect respectively decoder (U18) multiple enable signal output terminals ((Y0~ Y15)), the middle broken ends of fractured bone (DRDY) of multiple thermometric chips ((U1~U16)) connects multiple interruptions of multiplexer (U19) respectively Signal input part ((I0~I15)), the control terminal of the decoder (U18) and the control terminal of multiplexer (U19) are all connected with In the I/O port of main control chip (U17), the main control chip (U17) is to decoder (U18) and multiplexer (U19) output control Signal, to make the decoder (U18) output enable signal to the Enable Pin (CS) of current thermometric chip ((U1~U16)), together Shi Suoshu multiplexers (U19) detect the interrupt signal of the middle broken ends of fractured bone (DRDY) output of current thermometric chip ((U1~U16)), Current thermometric chip ((U1~U16)) feeds back to main control chip (U17) by platinum resistance collecting temperature data, and by spi bus, Afterwards the main control chip (U17) by decoder (U18) and multiplexer (U19) control next thermometric chip ((U1~ U16)) collection and feedback temperature data.
2. multichannel Pt Resistance Temperature Measuring Circuit as claimed in claim 1, it is characterised in that the chip of the main control chip (U17) Model STM32F103RCT6, the chip model of the thermometric chip ((U1~U16)) is MAX31865.
3. multichannel Pt Resistance Temperature Measuring Circuit as claimed in claim 1, it is characterised in that the decoder (U18) is 4-16 lines Decoder.
4. multichannel Pt Resistance Temperature Measuring Circuit as claimed in claim 3, it is characterised in that the decoder (U18) it is chip-shaped Number it is CD74HC154.
5. multichannel Pt Resistance Temperature Measuring Circuit as claimed in claim 1, it is characterised in that the multiplexer (U19) is 16 Channel analog multiplexer.
6. multichannel Pt Resistance Temperature Measuring Circuit as claimed in claim 5, it is characterised in that the core of the multiplexer (U19) Piece model CD74HC4067.
A kind of 7. multichannel platinum resistor temperature measuring method, it is characterised in that this method realizes that the circuit includes master based on a circuit Control chip (U17), decoder (U18), multiplexer (U19) and multiple thermometric chips ((U1~U16)), the thermometric chip The input terminal of ((U1~U16)) is connected with platinum resistance, and the SPI interfaces of multiple thermometric chips ((U1~U16)) is all connected to described The SPI interface of main control chip (U17), the Enable Pin (CS) of multiple thermometric chips ((U1~U16)) connect decoder (U18) respectively Multiple enable signal output terminals ((Y0~Y15)), the middle broken ends of fractured bone (DRDY) of multiple thermometric chips ((U1~U16)) connects respectively Multiple interrupt signal input terminals ((I0~I15)) of multiplexer (U19), the control terminal and multichannel of the decoder (U18) The control terminal of multiplexer (U19) is all connected to the I/O port of main control chip (U17), the described method includes:
Step S1, the main control chip (U17) is to decoder (U18) and multiplexer (U19) output control signal;
Step S2, the decoder (U18) output enable signal to the Enable Pin (CS) of current thermometric chip ((U1~U16)), The multiplexer (U19) detects the interruption letter of the middle broken ends of fractured bone (DRDY) output of current thermometric chip ((U1~U16)) at the same time Number;
Step S3, current thermometric chip ((U1~U16)) feed back to master by platinum resistance collecting temperature data by spi bus Control chip (U17);
Step S4, the main control chip (U17) control next thermometric chip by decoder (U18) and multiplexer (U19) ((U1~U16)) is gathered and feedback temperature data;
Repeat step S1~step S4, until whole thermometric chips ((U1~U16)) complete collection and the feedback of temperature data.
8. multichannel platinum resistor temperature measuring method as claimed in claim 7, it is characterised in that the thermometric chip ((U1~U16)) Default reference resistance is circumscribed with, the temperature data of thermometric chip ((U1~U16)) feedback is platinum resistance resistance value and reference The ratio of resistance, the main control chip (U17) draw platinum resistance resistance value according to the ratio and reference resistance computing the resistor value, then Temperature value according to measured by platinum resistance computing the resistor value draws platinum resistance.
9. multichannel platinum resistor temperature measuring method as claimed in claim 7, it is characterised in that the decoder (U18) is 4-16 lines Decoder, the chip model of the decoder (U18) is CD74HC154.
10. multichannel platinum resistor temperature measuring method as claimed in claim 7, it is characterised in that the multiplexer (U19) is 16 Channel analog multiplexer, the chip model of the multiplexer (U19) is CD74HC4067.
CN201711098926.9A 2017-11-09 2017-11-09 A kind of multichannel Pt Resistance Temperature Measuring Circuit and method Pending CN107990994A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711098926.9A CN107990994A (en) 2017-11-09 2017-11-09 A kind of multichannel Pt Resistance Temperature Measuring Circuit and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711098926.9A CN107990994A (en) 2017-11-09 2017-11-09 A kind of multichannel Pt Resistance Temperature Measuring Circuit and method

Publications (1)

Publication Number Publication Date
CN107990994A true CN107990994A (en) 2018-05-04

Family

ID=62029899

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711098926.9A Pending CN107990994A (en) 2017-11-09 2017-11-09 A kind of multichannel Pt Resistance Temperature Measuring Circuit and method

Country Status (1)

Country Link
CN (1) CN107990994A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110617893A (en) * 2019-09-20 2019-12-27 中国科学院长春光学精密机械与物理研究所 Temperature measurement circuit of general interface output

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201926520U (en) * 2010-11-30 2011-08-10 山东力创科技有限公司 Platinum resistor temperature sensor with shielding wire
CN102865941A (en) * 2012-10-10 2013-01-09 成都阜特科技股份有限公司 Method for collecting and determining temperature
CN102879124A (en) * 2012-10-10 2013-01-16 成都阜特科技股份有限公司 Temperature acquisition module
CN202836818U (en) * 2012-10-10 2013-03-27 成都阜特科技股份有限公司 Temperature data collection module
CN106020031A (en) * 2016-06-22 2016-10-12 中国水利水电第七工程局有限公司 Split-type mini multifunctional concrete temperature intelligent on-line monitoring system
CN106052893A (en) * 2016-06-22 2016-10-26 中国水利水电第七工程局有限公司 Temperature acquisition device supporting mix-matched measurement of thermistor, platinum resistor and copper resistor temperature sensors
CN106595892A (en) * 2016-12-16 2017-04-26 陕西电器研究所 Multichannel integrated temperature converter

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201926520U (en) * 2010-11-30 2011-08-10 山东力创科技有限公司 Platinum resistor temperature sensor with shielding wire
CN102865941A (en) * 2012-10-10 2013-01-09 成都阜特科技股份有限公司 Method for collecting and determining temperature
CN102879124A (en) * 2012-10-10 2013-01-16 成都阜特科技股份有限公司 Temperature acquisition module
CN202836818U (en) * 2012-10-10 2013-03-27 成都阜特科技股份有限公司 Temperature data collection module
CN106020031A (en) * 2016-06-22 2016-10-12 中国水利水电第七工程局有限公司 Split-type mini multifunctional concrete temperature intelligent on-line monitoring system
CN106052893A (en) * 2016-06-22 2016-10-26 中国水利水电第七工程局有限公司 Temperature acquisition device supporting mix-matched measurement of thermistor, platinum resistor and copper resistor temperature sensors
CN106595892A (en) * 2016-12-16 2017-04-26 陕西电器研究所 Multichannel integrated temperature converter

Non-Patent Citations (4)

* Cited by examiner, † Cited by third party
Title
刘权: "基于虚拟仪器的网络化多路温度测试系统设计与实现", 《全国学位论文全文库》 *
刘磊: "基于遗传算法的船舶柴油机智能排气温度检测仪的研究", 《全国学位论文全文库》 *
无: "MAX31865-温度检测器解决方案", 《世界电子元器件》 *
沙春哲: "气体传感器长期稳定性监测系统", 《全国学位论文全文库》 *

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110617893A (en) * 2019-09-20 2019-12-27 中国科学院长春光学精密机械与物理研究所 Temperature measurement circuit of general interface output

Similar Documents

Publication Publication Date Title
CN101119115B (en) Multi-channel A/D conversion device and method
CN105092075A (en) High accuracy multi-channel temperature signal acquisition device
CN110568252A (en) four-channel double-gear interface control circuit current detection system
CN103175547A (en) Parameter fitting method of data acquisition device
WO2017113920A1 (en) Circuit and method for improving precision of analog-to-digital conversion in single-chip microcomputer
CN2938573Y (en) Multi-channel analog-digital conversion device
CN105527893B (en) A kind of anti-interference multichannel analog amount sample circuit and method
KR101662354B1 (en) Apparatus for Multi Channel Resistance Measurement using Constant Current Source
CN107990994A (en) A kind of multichannel Pt Resistance Temperature Measuring Circuit and method
CN216695335U (en) Thermal resistance measuring device
CN103592883A (en) DSP (Digital Signal Processor) based multipath precise programmable resistance module and control method thereof
CN107831358A (en) A kind of current measurement device based on MAX4373HEUA
CN107478349A (en) Temperature polling instrument
Jevtic et al. Design and implementation of plug-and-play analog resistance temperature sensor
CN206892102U (en) A kind of clothes comfort level long-distance intelligent detecting system
CN103634009A (en) Method for improving analog-to-digital conversion accuracy of analog quantity collection device
CN105587679A (en) Mine ventilator temperature inspecting instrument based on Pt100
CN205176246U (en) Conductivity meter self -calibration system
CN211181045U (en) Wisdom agricultural is with multi-functional temperature and humidity sensor
CN107192742A (en) A kind of metal-oxide gas transducer temperature drift compensation device and method
CN206038177U (en) Three -way formula platinum resistance PT100 temperature measuring system
Wang et al. Multipoint temperature measurement system of hot pack based on DS18B20
CN207832337U (en) A kind of platinum resistance thermometer sensor, signal acquisition circuit based on multiway analog switch
CN110907050A (en) Temperature measuring device
CN205941869U (en) Measurement device for coil sensor resonance parameter

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20180504

RJ01 Rejection of invention patent application after publication