CN103175547A - Parameter fitting method of data acquisition device - Google Patents
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- CN103175547A CN103175547A CN2011104312136A CN201110431213A CN103175547A CN 103175547 A CN103175547 A CN 103175547A CN 2011104312136 A CN2011104312136 A CN 2011104312136A CN 201110431213 A CN201110431213 A CN 201110431213A CN 103175547 A CN103175547 A CN 103175547A
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Abstract
The invention provides a parameter fitting method of a data acquisition device. The parameter fitting method of the data acquisition device is used for measurement data acquisition of the data acquisition device. The parameter fitting method includes: A1, setting fitting parameters in section mode aiming at a total data range of the measurement data, and correspondingly obtaining a plurality of section data ranges of the measurement data; A2, obtaining one measurement data; and A3, revising the measurement data according to a fitting parameter corresponding to the section data range of the measurement data, and obtaining a measurement result. The parameter fitting method of the data acquisition device can section the total data range of the measurement data, sets a fitting parameter for curve fitting independently on some section data range, and adopts a curve fitting function independently to perform fitting operation. The measurement result is more close to an actual measurement result, a fitting coefficient is matched with the fitting function mostly, therefore the measurement result is obtained through revision of the mostly matched fitting parameter, and measurement accuracy is improved.
Description
Technical field
The present invention relates to measurement, technical field of measurement and test, particularly relate to a kind of parameter fitness method of data collector.
Background technology
In measurement and technical field of measurement and test, so-called data collector refers to automatically gather also a kind of device of measurement data information from measured target.In some cases, data collector can not directly gather some physical quantity (as temperature, pressure etc.), but data collector need to be connected with the signal converter of outside, forms a data acquisition system.Signal converter gathers described physical quantity, and this physical quantity is converted into the electric signal that data collector can be measured, afterwards, described electric signal is accessed to data collector, then, the electric signal of data collector collection signal converter output after described electric signal is done further processing, just can measure various types of physical quantitys such as temperature, resistance, frequency, cycle, pressure, pressure.Described signal converter can be the various sensors such as temperature sensor, pressure transducer.
As shown in Figure 1, be a kind of structural representation of data acquisition system (DAS), described data acquisition system (DAS) comprises: data collector 100, module card 200 and signal converter 300.Described data collector 100 comprises: main control unit 101 and backboard unit 102, the slot that described backboard unit 102 has for insert module card 200 can insert various types of module card 200 on the backboard unit 102 of described data collector 100.
Before carrying out data acquisition, signal converter 300 first is converted to measurand the electric signal that data collector 100 can be measured, and be linked into the input end of some passages of channel card 201, signal converter 300 shown in Figure 1 is connected with channel card 1, in practical application, signal converter 300 can be connected with any one passage of any one channel card.When carrying out data acquisition, the main control unit 101 of data collector 100 sends control command to channel card 201 by communication bus; Channel card 201 is connected a corresponding passage according to control command, by this passage, described electric signal is input on emulation bus; Then main control unit 101 by communication bus, sends control command to data collecting card 202, and data collecting card 202 is measured the electric signal on emulation bus according to this control command, obtains measurement data; After measurement is completed, data collecting card 202 returns to main control unit 101 by communication bus with measurement data, so far, has completed the data acquisition on described passage.
Usually, the signal converter that is used for gathering in industry spot measurand is all nonlinear, non-accurate usually, and it is nonlinear, non-accurate being about to the process that measurand is converted to electric signal.After gathering electric signal, data collecting card 202 on data collector 100 obtains measurement data, then, also can adopt one or more methods according to workplace and the condition of work of this device, nonlinear, the coarse measurement data that collects is become accurate, linearizing measurement result by simple linear operation method with its correction.
For example, application number is the Chinese patent " a kind of self-checking device of measurement module " of CN03232661.0, disclose a kind of linear fit function y=kx+b that utilizes, measurement data (voltage) correction has been become the approximating method of measurement result (temperature).The method that this patent is mentioned is only for some special dimensions and purposes, and implementation is solidificated in storer (namely, the coefficient that the measurement data correction becomes the transfer function of measurement result employing is constant, and fixed storage is in nonvolatile memory, immutable), carry out for processor, to complete calibration and the conversion to certain particular measurement result, can not accomplish the nonlinear properties converter of any type is carried out Measurement accuracy.Because physical world is protean, can not only satisfy the conversion of all signal forms with a kind of general method, a certain coefficient form and transform method, only may satisfy signal converter a certain or a class, if the user has used the signal converter of other type, just can not adopt said method to implement.That is to say, under many circumstances, between the measurement data that data collector collects and corresponding measurement result, can not be simply describe the relation between them with a certain fixing, transfer function linearity.
For the problems referred to above, a data collector has appearred on market, this device provides the sensor translation function (namely, can measure the sensor output electrical signals), obtain measurement data by gathering electric signal, between the measurement result of measurement data and correspondence, can use non-linear conversion function (also claiming fitting function) to change, and for different measurands, the coefficient of transfer function is variable.But this device only provides point-to-point setting, and built-in system is according to the transformational relation that arranges, and the digital simulation curve carries out match.Take certain non-standard thermocouple temperature sensor as example, its implementation method is as follows:
1. the user needs first to carry out standard test according to any sensor of self using, choose 1~200 representational temperature spot in the working range of described sensor, record afterwards this sensor voltage signal that steady operation is exported when each temperature spot is measured.If the user has measured 200 magnitudes of voltage that temperature spot is corresponding, then need these 200 groups of data are arranged in list any sensor that (temperature-voltage) is input to DM3064.
2. the built-in system of this data collector can be according to the data of these inputs pair, and as X, temperature simulates one and can use Y=AX as Y with voltage
2The quafric curve function that+BX+C represents, wherein A, B, C carry out according to the right value of 200 groups of data of input 3 constant fitting coefficients that the quadratic fit algorithm obtains.
3. when carrying out temperature survey, bring as X the voltage measurement data that collect into above-mentioned formula, obtain as a result that Y is exactly the temperature measurement result that calculates, be used for showing and storage.
Can find out from above-mentioned steps, the reference point in the user is input to this data collector (data to) is more, and the conic fitting result is just more accurate, and transformation result is also just more accurate.But the words user's that reference point is too much input ratio is wasted time and energy.And, what used the inside of this data collector is flush bonding processor, the ability of its deal with data and carry out the limited in one's ability of conic fitting algorithm, ability far away from PC, so the deviation of fitting result is also larger on the impact of actual measurement output, is difficult to obtain accurate measurement result.
In a word, need the urgent technical matters that solves of those skilled in the art to be exactly: how can make the measurement result of data collector more accurate.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of parameter fitness method of data collector, can improve the accuracy of measurement result.
In order to address the above problem, the invention discloses a kind of parameter fitness method of data collector, be used for data collector and gather measurement data, described method comprises step:
A1, for total span subsection setup fitting parameter of described measurement data, and the corresponding a plurality of segmentation spans that obtain described measurement data;
A2 obtains a measurement data;
A3 according to the fitting parameter corresponding to segmentation span at described measurement data place, revises described measurement data, obtains measurement result.
The method that adopts the present invention to propose, the user can be fully according to the characteristic of signal converter, for various application and field condition, fitting parameter is arranged flexibly, namely on a certain segmentation span of measurement data, independently be provided for the fitting parameter of curve, a kind of iunction for curve of independent employing is carried out the match computing, more to approach actual measured results.The independent setting refers to that in different segmentations to different fitting coefficients should be arranged, the fitting function of this fitting coefficient and this segmentation mates the most, and therefore, the measurement result by the fitting coefficient correction of coupling obtains has improved the accuracy of measurement.
Preferably, described steps A 1 comprises step: A11, by a plurality of endpoint values are set, total span of described measurement data is carried out segmentation, and obtain a plurality of segmentation spans of described measurement data.
Preferably, described steps A 11 comprises: by a plurality of threshold values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.
Preferably, described steps A 11 comprises: by a plurality of end point values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.
Preferably, described steps A 1 also comprises step: A12, to each described segmentation span, one group of fitting coefficient that is used for curve is set.
Preferably, described steps A 3 comprises step:
A31 when the threshold value of described measurement data more than or equal to current segmentation span, and during less than the threshold value of adjacent next segmentation span, obtains the fitting parameter corresponding with current segmentation span;
A32 revises described measurement data according to described fitting parameter, obtains measurement result.
Preferably, described steps A 3 comprises step:
A33 when the end point values of described measurement data less than or equal to current segmentation span, and during greater than the end point values of an adjacent upper segmentation span, obtains the fitting parameter corresponding with current segmentation span;
A34 revises described measurement data according to described fitting parameter, obtains measurement result.
Preferably, described steps A 2 comprises: gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain a measurement data.
Preferably, described steps A 2 comprises: gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain digital electric signal; Described digital electric signal is calibrated, obtained a measurement data.After data collector collects an electric signal, in transfer process by analog to digital, transformed error may appear, after being converted to digital electric signal, by being calibrated, digital electric signal obtains measurement data, can eliminate the error of bringing in analog to digital conversion, improve the accuracy of measuring.
Description of drawings
Fig. 1 is a kind of structural representation of data acquisition system (DAS);
Fig. 2 is the process flow diagram of the parameter fitness method embodiment of a kind of data collector of the present invention;
Fig. 3 is the schematic diagram that concerns of the output voltage of data collecting card and corresponding actual temperature;
Fig. 4 is the schematic diagram of the quafric curve that obtains according to the piecewise fitting result;
Fig. 5 is the configuration interface schematic diagram of one group of fitting parameter;
Fig. 6 is the interface schematic diagram after the setting of fitting parameter is completed.
Embodiment
For above-mentioned purpose of the present invention, feature and advantage can be become apparent more, the present invention is further detailed explanation below in conjunction with the drawings and specific embodiments.
With reference to Fig. 2, show the process flow diagram of the parameter fitness method embodiment of a kind of data collector of the present invention, in conjunction with Fig. 1, the parameter fitness method that the present embodiment proposes is used for data collector 100 and gathers measurement data, described method comprises step 20, and it specifically comprises the steps:
Need to prove, the present invention is directed to the corresponding fitting parameter of one of them channel setting in channel card, that is to say, parameter fitness method of the present invention, for be DATA REASONING in some passages.After the fitting parameter that sets up a passage, can utilize communication interface to send order, notice main control unit 101 arranges to be completed.
Illustrate as one, the described step 22 of the present embodiment can comprise: gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain a measurement data.Below, this is illustrated be specifically introduced.Carrying out real data when gathering, signal converter 300 gathers measurands, and measurand is converted into corresponding electric signal exports, and described electric signal is simulating signal.Channel card 201 on data collector 100 is connected with signal converter 200, the main control unit 101 control channel cards 201 of data collector 100 are opened a corresponding passage, the electric signal of signal converter 200 outputs is accessed this passage, and electric signal is input on the emulation bus of backboard unit by this passage; Data collecting card 202 on data collector 100 (also claiming measuring unit) gathers an electric signal from emulation bus, and described electric signal is carried out the conversion of analog to digital by the analog to digital converter of data collecting card 202 inside, obtain measurement data.Afterwards, data collecting card 202 also can return to main control unit 101 with described measurement data by the communication bus in backboard unit 102, and main control unit 101 gets described measurement data by described communication bus.
Illustrate as one, the described step 21 of the present embodiment can comprise: step 211, by a plurality of endpoint values are set, total span of described measurement data is carried out segmentation, and obtain a plurality of segmentation spans of described measurement data.That is to say, set fitting parameter comprises the endpoint value of segmentation span, and the user can utilize physical button or the virtual key on data collector, inputs the endpoint value of each segmentation span.Further, choose mode according to the difference of end points, to different segmentation methods should be arranged.
In originally illustrating, as a kind of distortion, described step 211 can comprise: by a plurality of threshold values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.As a kind of example, in this distortion, suppose that total span of measurement data is [0,15], a plurality of threshold values that arrange are respectively 0,5,10, according to above-mentioned three threshold values, total span [0,15] of described measurement data is carried out segmentation, can obtain three segmentation spans of described measurement data, be followed successively by [0,4), [5,10), [10,15].
In originally illustrating, as the another kind distortion, described step 211 can comprise: by a plurality of end point values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.As a kind of example, in this distortion, suppose that total span of measurement data is [10,40], a plurality of end point values that arrange are respectively 20,30,40, according to above-mentioned three end point values, total span [10,40] of described measurement data is carried out segmentation, can obtain three segmentation spans of described measurement data, be followed successively by [10,20], (20,30], (30,40].
Illustrate as another, the described step 21 of the present embodiment can also comprise: step 212 to each described segmentation span, arranges one group of fitting coefficient that is used for curve.That is to say, set fitting parameter also comprises one group of fitting coefficient that is used for curve except the endpoint value of segmentation span.Usually carry out curve fitting according to fitting function, described curve can be conic fitting, can be also Cubic Curve Fitting, can also be more high order or other forms of curve.
In originally illustrating, as a kind of distortion, can be according to fitting function Y=A*X
2+ B*X+C carries out conic fitting, and so, the A in above-mentioned fitting function, B, C are exactly the fitting coefficient for conic fitting.In originally illustrating, as the another kind distortion, also can be according to fitting function y=A*X
3+ B*X
2+ CX+D carries out Cubic Curve Fitting, and so, the A in above-mentioned fitting function, B, C, D are exactly the fitting coefficient for Cubic Curve Fitting.In originally illustrating, as another distortion, can also carry out curve fitting according to fitting function Y=A*Log (X+B)+C*X+D, so, the A in above-mentioned fitting function, B, C, D are exactly the fitting coefficient for described curve.In originally illustrating, as another distortion, also can be according to fitting function Y=A*e
(BX+C)+ D*X
2+ E*X+F carries out curve fitting, and so, the A in above-mentioned fitting function, B, C, D, E, F are exactly the fitting coefficient for described curve.Need to prove, fitting function also may represent with other mathematical operation forms, and repeat no more, the present invention is not construed as limiting the expression-form of fitting function herein.
Be understandable that, for step 211 and 212, the endpoint value of each segmentation span can be set first, after obtaining a plurality of segmentations, then be provided for respectively the fitting coefficient of curve for each segmentation; Also can be for each segmentation, disposable endpoint value and the corresponding fitting coefficient thereof that each segmentation span is set simultaneously.
Need to prove, before fitting parameter is set, can also utilize described data collector 100, signal converter 300, computing machine etc. to carry out the data pre-service, to determine the concrete numerical value of fitting parameter.Below, described pre-service is described:
With reference to Fig. 1, at first, signal converter 300 is connected with a channel card 201 on data collector 200, utilize 300 pairs of known physical amounts of signal converter to change, the electric signal that the known physical amount is converted to inputs in channel card 201.Afterwards, the electric signal in the data collecting card 202 acquisition channel cards 201 on data collector 100, described electric signal is analog electrical signal.Data collecting card 202 inside comprise an analog to digital converter (ADC), can carry out the conversion of analog to digital to described electric signal, obtain the measurement data corresponding with this known physical amount.By measuring a plurality of typical known physical amounts, can record multi-group data to (known physical amount-measurement data).At last, for described multi-group data pair, utilize on computers professional operational software, carrying out conic fitting according to the actual converted characteristic segmentation of described signal converter 300 approaches, and obtain a plurality of conic fitting functions, record the applicable scope of each fitting function, be exactly total the span of the described measurement data of scope sum that each fitting function is suitable for.
Illustrate as one, the described pre-service of the present embodiment can be as follows: take the temperature sensor of certain UNKNOWN TYPE as example, obtain measurement data according to experiment, every the temperature of 0.1 ℃ (known physical amount) actual measurement output voltage values (measurement data), describe a point, connect institute have a few the output voltage that just can depict data collecting card and correspondence actual temperature concern schematic diagram, as shown in Figure 3, X-axis is depicted as the output voltage values of data collecting card, and Y-axis is depicted as the corresponding actual temperature value of output voltage.
With reference to Fig. 3, as can be seen from Figure 3, total span of described measurement data is [9.5,15.3].According to curve shown in Figure 3, according to curve characteristic, the temperature error of calculating after satisfying match is divided into 5 sections less than the condition of 0.1 ℃ with whole curve regions, and conic fitting is carried out in segmentation, and the quadratic fit function is y=A*X
2+ B*X+C obtains comprising the piecewise fitting result of 5 groups of fitting parameters (endpoint value of segmentation and fitting coefficient), as shown in following table 1.
Table 1 piecewise fitting result
In originally illustrating, the endpoint value of segmentation is threshold value, during conic fitting, can utilize mapping software (for example Matlab), the temperature value of each point of the magnitude of voltage of each point of segmentation input X-axis and corresponding Y-axis obtains the fitting coefficient for curve.The said temperature error refers to less than the condition of 0.1 ℃: when segmentation carries out curve fitting, the fitting function corresponding according to each segmentation calculates temperature results, ask poor with the temperature of actual measurement, guarantee that maximum error gets final product less than 0.1 ℃, otherwise need to readjust the match mode, until satisfy condition.Guaranteed that with result maximum error is less than 0.1 ℃ shown in table 1.According to the piecewise fitting result of table 1, the quafric curve that obtains as shown in Figure 4, it shows the drawing output of piecewise fitting result.
Empirical tests after fitting result meets the demands, has been completed preprocessing process, afterwards, and can the subsection setup fitting parameter.Operation of front panel that can be by data collector or utilize communication interface to send order carries out the configuration of fitting parameter according to the piecewise fitting result in above-mentioned table 1.In originally illustrating, set-up mode can be as follows: the user is by the button on the data collector front panel, input corresponding fitting parameter, at first, the threshold value that first segmentation span is set is-9.5, afterwards, the fitting coefficient of the fitting function corresponding with first segmentation span is set, wherein, A=32.6, B=593.3, C=2595.9, after the user set up fitting coefficient, the built-in system of data collector can be according to a public fitting function y=A*X
2+ B*X+C generates a concrete fitting function corresponding with described fitting coefficient automatically, and at this moment, corresponding fitting function is: Y=32.6*X
2+ 593.3*X+2595.9.Accordingly, the configuration interface of first group of fitting parameter as shown in Figure 5.Then, the threshold value that second segmentation span is set is-6.3, and the fitting coefficient of the fitting function corresponding with second segmentation span is set, wherein, A=-117.8, B=-1250.3, C=-3052.0, the fitting function of correspondence is: Y=-117.8*X
2-1250.3*X-3052.0.By that analogy, in originally illustrating, 5 groups of fitting parameters are set altogether, and the interface after the setting of fitting parameter is completed obtains 5 segmentation spans of described measurement data as shown in Figure 6, be followed successively by: [9.5,-6.3), [6.3 ,-5.1), [5.1,2.6), [2.6,10.2), [10.2,15.3].In originally illustrating, no matter which kind of the user sequentially input with, data collector can automatically according to the order of threshold value, be arranged the set fitting parameter of each segmentation span from small to large.In addition, can also arrange according to order from big to small.
Common, in actual applications, the user can arrange at least 1 group fitting parameter, maximum 20 groups of fitting parameters.Be understandable that, according to the match segmentation result, also the fitting parameter of more groups can be set, decide according to user's demand.
Below, with reference to Fig. 2 and in conjunction with Fig. 1, the specific implementation of the step 22 in the present embodiment and step 23 is described.
Illustrate as another, the described step 22 of the present embodiment can also comprise: gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain digital electric signal; Described digital electric signal is calibrated, obtained a measurement data.after data collector 100 collects an electric signal, in transfer process by analog to digital, transformed error can appear, in originally illustrating, a processor that is used for calibration can be set in data collector 100, error characteristics according to analog to digital converter (ADC) itself, storage inside at processor presets calibration data, after being converted to digital electric signal, data collecting card 202 is calibrated digital electric signal according to presetting calibration data, obtain measurement data, the method can be eliminated the error that data collecting card 202 brings in analog to digital conversion, improve the accuracy of measuring.
Need to prove, step 22 pair analog to digital conversion obtains digital electric signal when calibrating, in pre-service, utilize after the analog to digital converter of data collecting card 202 obtains the measurement data corresponding with the known physical amount, need that also analog to digital conversion is obtained digital electric signal and calibrate.
Illustrate as one, the described step 23 of the present embodiment can comprise:
Step 231 when the threshold value of described measurement data more than or equal to current segmentation span, and during less than the threshold value of adjacent next segmentation span, is obtained the fitting parameter corresponding with current segmentation span;
Step 232 is revised described measurement data according to described fitting parameter, obtains measurement result.
This illustrational prerequisite is that step 21 is carried out segmentation by a plurality of threshold values are set to total span of described measurement data.In originally illustrating, the value of supposing the measurement data that step 22 is obtained is 10 (units: mV), the configuration of fitting parameter as shown in Figure 6, the value of this measurement data is greater than the 4th segmentation span [2.6,10.2) threshold value 2.6, and be the threshold value 10.2 of the 5th segmentation span [10.2,15.3] less than the adjacent next one, obtain and the 4th fitting parameter that the segmentation span is corresponding; And according to the fitting coefficient in described fitting parameter, described measurement data 10 is revised.Concrete, according to fitting coefficient A=-4.2648, B=82.879, C=618.845, its value is brought into quadratic fit function y=A*X
2In+B*X+C, and to make the X value be 10, and the result of digital simulation function is as follows:
Y=-4.2648*X
2+82.879*X+618.845
=-4.2648*(10)
2+82.879*10+618.845
=1021.155(℃)
The Y value that calculates is the measurement result that obtains by revising measurement data 10, and this measurement result can be thought the temperature value of the corresponding signal converter actual measurement of output voltage 10mV.
Illustrate as another, the described step 203 of the present embodiment also can comprise:
Step 2033 when the end point values of described measurement data less than or equal to current segmentation span, and during greater than the end point values of an adjacent upper segmentation span, is obtained the fitting parameter corresponding with current segmentation span;
Step 2034 is revised described measurement data according to described fitting parameter, obtains measurement result.
This illustrational prerequisite is that step 21 is carried out segmentation by a plurality of end point values are set to total span of described measurement data.For example, by a plurality of end point values-6.3 ,-5.1,2.6,10.2,15.3 pairs of total spans [9.5 are set, 15.3] segmentation, obtain 5 segmentation spans of measurement data: [9.5,-6.3], (6.3 ,-5.1], (5.1,2.6], (2.6,10.2], (10.2,15.3].The value of the measurement data that step 22 is obtained is-5 (units: mV), the value of this measurement data is less than the 3rd segmentation span (5.1,2.6] end point values 2.6, and be the 2nd segmentation span (6.3 greater than adjacent upper one,-5.1] end point values-5.1 obtain and the 3rd fitting parameter that the segmentation span is corresponding; And according to the fitting coefficient in described fitting parameter, described measurement data-5 are revised.Concrete, according to fitting coefficient A=9.1864, B=-93.615, C=500.0, its value is brought into quadratic fit function Y=A*X
2In+B*X+C, and to make the X value be-5, and the result of digital simulation function is as follows:
Y=9.1864*X
2+93.615*X+500.0
=9.1864*(-5)
2+93.615*(-5)+500.0
=261.585(℃)
The Y value that calculates is the measurement result that obtains by revising measurement data-5, and this measurement result can be thought the temperature value of the corresponding signal converter actual measurement of output voltage-5mV.
Can find out by embodiments of the invention, described parameter fitting function refers to according to the fitting parameter (comprising end point values, fitting coefficient) that arranges measurement data is revised, and obtains measurement result.
The parameter fitness method of a kind of data collector that the present invention proposes, make the user can be according to the physical characteristics of sensor or other signal converters of its use, with the measurement data that the data collecting card on data collector (also claiming measuring unit) gets, be converted to more the measurement result near the actual physics signal.For example, K type thermocouple type temperature sensor can be converted to temperature signal the voltage signal that can directly directly measure for data collector, and still, the conversion process of K type thermocouple type temperature sensor itself is nonlinear, non-accurate.The present invention just can change and revise the electric signal similar with the sensor, that off-gauge signal converter is changed, the various complexity that may use for the user, nonlinear signal converter provide a kind of accurately, the method for reduction measurand legitimate reading.
The method that adopts the present invention to propose, the user can fully according to the characteristic of signal converter, on a certain segmentation span of measurement data, independently be provided for the fitting parameter of curve, a kind of iunction for curve of independent employing is carried out the match computing, more to approach actual measured results.The independent setting refers to that in different segmentations to different fitting coefficients should be arranged, this fitting coefficient section fitting function therewith mates the most, and therefore, the measurement result by the fitting coefficient correction of coupling obtains has improved the accuracy of measuring.Simultaneously, the user can take full advantage of the powerful arithmetic capability of computing machine, by various operational softwares, actual converted characteristic according to signal converter, generation comprises the fitting parameter of endpoint value and fitting coefficient, both user friendly settings can reach again best measurement effect, have accelerated simultaneously the processing speed of data collector itself.
Above parameter fitness method to a kind of data collector provided by the present invention, be described in detail, used specific case herein principle of the present invention and embodiment are set forth, the explanation of above embodiment just is used for helping to understand method of the present invention and core concept thereof; Simultaneously, for one of ordinary skill in the art, according to thought of the present invention, all will change in specific embodiments and applications, in sum, this description should not be construed as limitation of the present invention.
Claims (9)
1. the parameter fitness method of a data collector, be used for data collector and gather measurement data, it is characterized in that, described method comprises step:
A1, for total span subsection setup fitting parameter of described measurement data, and the corresponding a plurality of segmentation spans that obtain described measurement data;
A2 obtains a measurement data;
A3 according to the fitting parameter corresponding to segmentation span at described measurement data place, revises described measurement data, obtains measurement result.
2. the method for claim 1, is characterized in that, described steps A 1 comprises step:
A11 carries out segmentation by a plurality of endpoint values are set to total span of described measurement data, obtains a plurality of segmentation spans of described measurement data.
3. method as claimed in claim 2, is characterized in that, described steps A 11 comprises:
By a plurality of threshold values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.
4. method as claimed in claim 2, is characterized in that, described steps A 11 comprises:
By a plurality of end point values are set, total span of described measurement data is carried out segmentation, obtain a plurality of segmentation spans of described measurement data.
5. method as claimed in claim 2, is characterized in that, described steps A 1 also comprises step:
A12 to each described segmentation span, arranges one group of fitting coefficient that is used for curve.
6. method as claimed in claim 3, is characterized in that, described steps A 3 comprises step:
A31 when the threshold value of described measurement data more than or equal to current segmentation span, and during less than the threshold value of adjacent next segmentation span, obtains the fitting parameter corresponding with current segmentation span;
A32 revises described measurement data according to described fitting parameter, obtains measurement result.
7. method as claimed in claim 4, is characterized in that, described steps A 3 comprises step:
A33 when the end point values of described measurement data less than or equal to current segmentation span, and during greater than the end point values of an adjacent upper segmentation span, obtains the fitting parameter corresponding with current segmentation span;
A34 revises described measurement data according to described fitting parameter, obtains measurement result.
8. method as described in claim 6 or 7, is characterized in that, described steps A 2 comprises:
Gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain a measurement data.
9. method as described in claim 6 or 7, is characterized in that, described steps A 2 comprises:
Gather an electric signal, after described electric signal being carried out the conversion of analog to digital, obtain digital electric signal;
Described digital electric signal is calibrated, obtained a measurement data.
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CN105071807A (en) * | 2015-07-20 | 2015-11-18 | 浙江大学 | Analog-to-digital converter adjustment and calibration method and system |
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CN107565643A (en) * | 2017-09-22 | 2018-01-09 | 惠州Tcl移动通信有限公司 | Start method, storage device and the terminal of battery charging based on consumption electric power detection |
CN111121998A (en) * | 2019-12-20 | 2020-05-08 | 扬州船用电子仪器研究所(中国船舶重工集团公司第七二三研究所) | Temperature measurement calibration method based on PT1000 temperature sensor |
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WO2016065633A1 (en) * | 2014-10-31 | 2016-05-06 | 华为技术有限公司 | Curve fitting circuit, analog predistorter and radio frequency signal transmitter |
US10141896B2 (en) | 2014-10-31 | 2018-11-27 | Huawei Technologies Co., Ltd | Curve fitting circuit, analog predistorter, and radio frequency signal transmitter |
CN104570870A (en) * | 2014-12-30 | 2015-04-29 | 广东美的制冷设备有限公司 | Air conditioner sensor detection method and device |
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CN111257620A (en) * | 2020-02-28 | 2020-06-09 | 张苏 | Current detection device and method |
CN112834912A (en) * | 2021-01-08 | 2021-05-25 | 胜达克半导体科技(上海)有限公司 | Method for measuring internal resistance of chip by using curve fitting mode on chip testing machine |
CN113009404A (en) * | 2021-01-26 | 2021-06-22 | 江阴长仪集团有限公司 | Method for calibrating direct-current even harmonic error and electric energy meter |
CN113009404B (en) * | 2021-01-26 | 2023-08-11 | 江阴长仪集团有限公司 | DC even harmonic error calibration method and electric energy meter |
CN113533644A (en) * | 2021-06-26 | 2021-10-22 | 西北工业大学 | Method for monitoring normal atmospheric pollutants on face source based on unmanned aerial vehicle |
CN113686280A (en) * | 2021-09-08 | 2021-11-23 | 中国航发沈阳黎明航空发动机有限责任公司 | Method for evaluating sectional fitting of air inlet and outlet edges of blade profile |
CN113686280B (en) * | 2021-09-08 | 2023-12-19 | 中国航发沈阳黎明航空发动机有限责任公司 | Method for evaluating sectional fitting of air inlet and outlet edges of blade profile |
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