CN107966648B - A kind of embedded failure diagnosis method based on correlation matrix - Google Patents
A kind of embedded failure diagnosis method based on correlation matrix Download PDFInfo
- Publication number
- CN107966648B CN107966648B CN201711201539.3A CN201711201539A CN107966648B CN 107966648 B CN107966648 B CN 107966648B CN 201711201539 A CN201711201539 A CN 201711201539A CN 107966648 B CN107966648 B CN 107966648B
- Authority
- CN
- China
- Prior art keywords
- failure
- test
- isolated location
- fault mode
- matrix
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
- G06F17/10—Complex mathematical operations
- G06F17/16—Matrix or vector computation, e.g. matrix-matrix or matrix-vector multiplication, matrix factorization
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Mathematical Analysis (AREA)
- Pure & Applied Mathematics (AREA)
- Computational Mathematics (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Mathematical Optimization (AREA)
- Data Mining & Analysis (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Algebra (AREA)
- Computer Hardware Design (AREA)
- Databases & Information Systems (AREA)
- Software Systems (AREA)
- Computing Systems (AREA)
- Data Exchanges In Wide-Area Networks (AREA)
Abstract
The present invention provides a kind of embedded failure diagnosis method based on correlation matrix, it is the following steps are included: Step 1: establish correlation models, the D matrix of correlation models is optimized, step 2, judge that fault mode is the failure for being certain to occur, the failure that may occur or the impossible failure of affirmative, step 3, detection and isolation unit is the isolated location to break down certainly, the isolated location that may be broken down or the trouble-proof isolated location of affirmative, step 4, Diagnostic Strategy deployment.In a short time all fault modes of product can diagnose and the isolated location to break down is isolated using this method.By the method implement to the diagnosis of product failure be isolated, not only the diagnosis of fault mode can be realized based on the correlation matrix that testability model obtains, but also the Diagnostic Strategy of generation can be deployed in the operational process of actual product.
Description
Technical field
The present invention relates to test method fields, more particularly to a kind of embedded failure diagnosis side based on correlation matrix
Method.
Background technique
The testability design concept of product was just suggested early on Cherry Hill testing session in 1970, by 70 years
For mid-term, due to the development of IC design, the necessity of testability design is gradually recognized and payes attention to.With test
Property the relevant paper of design and research achievement it is also more and more, testability design has become one in integrated circuit testing field
Important component part.Accurately measuring, evaluating one important method of testability design level of product is testability modeling, is
Refer to using standardized form to the isolated location of system or equipment, signal, fault mode, failure rate, test and they it
Between the process that is described of correlation.It, can be with after the design of the testability of system is described and is expressed in this way
Assistant analysis easily is carried out using computer, and testability design can be improved based on the analysis results, automatically generate test side
Tree is isolated in dependence (correlation matrix) and diagnosis between method and fault mode, greatly improves the effect of testability design
Rate.
Currently, the diagnosis isolation tree based on correlation matrix is using AO*, Rollout scheduling algorithm, with testing cost minimum
For optimal conditions, the testing procedure and diagnosis isolation result of diagnosis isolation are generated.Diagnosis isolation tree can effectively reduce failure and examine
Required test item when disconnected reduces diagnosis isolation cost, can effectively instruct diagnosis isolation design.
But there is also two problems for the diagnosis isolation tree based on correlation matrix: one is only supporting single fault
Situation, diagnosis isolation when not supporting multiple faults and depositing.This is because a basic assumption of testability modeling is single failure hair
It is raw, correlation matrix be exactly generated under the premise of this, so diagnosis isolation tree be only used for when single failure occurs diagnosis every
From, and be all much multiple faults under actual conditions and deposit state, this causes the application scenarios of diagnosis isolation tree limited；.Based on survey
Examination property model carries out testability design verification evaluation and mainly faces two problems: first, how to be obtained based on testability model
The diagnosis of correlation matrix realization fault mode；Second, the operational process of the Diagnostic Strategy and actual product that generate mutually disconnects.
In consideration of it, refine a set of strategy for fault diagnosis present invention is primarily based on the D matrix generated after testability modeling, and by its
It is converted into the code that can be run in product working procedure, is realized in actual products to the deployment of Diagnostic Strategy, to realize
Embedded fault diagnosis, isolation.Field deployment from testability model to Diagnostic Strategy extends testability design verification and comments
The application range of valence technology provides to the quick diagnosis of verifying and evaluation, failure that can design for product test with being isolated
A kind of practicable new way.
Summary of the invention
In order to overcome the drawbacks of the prior art, the purpose of the present invention is to propose to a kind of test accuracies, and the high, source of trouble is searched
Optimal test point selection method in a kind of fireballing machine based on correlation models.
The present invention is implemented as follows: the present invention provides a kind of embedded failure diagnosis sides based on correlation matrix
Method realizes that steps are as follows:
Step 1: establishing correlation models, the D matrix of correlation models is optimized:
The expression formula of the D matrix of correlation models is as follows,
Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is test quantity, the i-th row [a of matrixi1
ai2 … aim] what is indicated is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j
… anj]TWhat is indicated is the correlation between j-th of test and each fault mode, works as aijWhen=0, i-th of failure mould is indicated
Formula and j-th of test are uncorrelated, work as aijWhen=1, indicate that i-th of fault mode and j-th of test are related；
To represent in D matrix can not examine the full 0 row of fault mode, represent complete the 1 of all fault modes tested and can all examined
Row, complete 1 column for representing the full 0 column tested in vain and representing the super test that can measure all fault modes are deleted；By D
The same column for mutually going together and representing redundancy testing that ambiguity group is represented in matrix merges, matrix D after being optimized0, excellent
Matrix D after change0Expression formula it is as follows:
Step 2 judges that fault mode is the failure for being certain to occur, the failure that may occur or certainly impossible
Failure comprising following sub-step:
Step 21 obtains test result vector
Determine that the product for needing to carry out embedded diagnosis, the sensor of acquisition product current state test information, judge to survey
Whether examination passes through, obstructed out-of-date when testing, then the test is denoted as " 1 "；When test information passes through, then the test is denoted as
"0".All tests of product corresponding " 1 " and " 0 " are in line according to the sequence of test point in D matrix, just constitute this
Test result vector of the product at current time；
D matrix D0In each fault mode corresponding row test information be known as test vector, be made of " 0 ", " 1 ", " 0 "
Representing fault mode does not have correlation with test, has correlation between " 1 " representing fault mode and test；
Step 22, judgement are certain to the failure occurred:
Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some failure mould
Formula is in D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode is to be certain to
The failure of generation successively traverses all fault modes, finally obtains all fault mode collection for being certain to occur；
The failure that step 23, judgement may occur:
If some fault mode is in D0The corresponding test of the test vector of matrix is all contained in test result vector pair
In the test set answered, then it can be determined that the fault mode is the failure that possible occur, successively traverse all fault modes, it is final to obtain
To all fault mode collection that may occur；
Step 24 determines impossible failure certainly:
If there are " 1 " on certain position corresponding tests not to tie in test in the test vector of D matrix for some fault mode
In the corresponding test set of fruit vector " 1 ", then it can be determined that the fault mode as impossible failure certainly, successively traversal is all
Fault mode finally obtains the impossible fault mode collection of all affirmatives；
Step 3, detection and isolation unit be the isolated location to break down certainly, the isolated location that may be broken down or
Certainly trouble-proof isolated location comprising following sub-step:
Step 31, the isolated location for determining product and the fault mode under each unit:
In conjunction with the product form information diagnosed, its isolated location is determined, it is special according to the hardware of product each unit
Property and functional characteristic determine all fault modes under each isolated location of product；
The isolated location that step 32, judgement are broken down certainly:
If there is the failure occurred certainly in the corresponding fault mode of some isolated location, the isolation list can be determined that
Member is the isolated location that breaks down certainly, successively traverse all isolated locations, finally obtains and all breaks down certainly
Isolated location；
The isolated location that step 33, judgement may break down:
If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but there is the event that may occur
Barrier, then determine the isolated location for the isolated location that may break down, successively traverses all isolated locations, finally obtains institute
It is possible that the isolated location to break down surely；
Step 34 determines trouble-proof isolated location certainly:
If the failure of the failure occurred certainly and possible generation is not present in the corresponding fault mode of some isolated location,
Fault mode i.e. under the isolated location is all the failure not occurred certainly, then determines the isolated location not break down certainly
Isolated location, successively traverse all isolated locations, finally obtain the trouble-proof isolated location of all affirmatives；
Step 4, Diagnostic Strategy deployment:
The above Diagnostic Strategy is deployed in a manner of C language code or dynamic link library in the Diagnostic Strategy library of product,
Product the diagnostic code and dynamic link library are called in Diagnostic Strategy library come carry out the diagnosis of failure be isolated, to obtain institute
There are the failure occurred certainly, the failure that may occur and the failure not occurred certainly, and the diagnosis situation occurred according to failure
Come determine all isolated locations to break down certainly, the isolated location that may be broken down and certainly it is trouble-proof every
From unit.
Preferably, step 4 specifically includes following sub-step:
Step 41, the calling for adding diagnosis function:
The reference of source file is added in the software code of product, and the addition diagnosis letter in the code position on diagnosis opportunity
Several calling；
Step 42 defines test result array:
The sensor for acquiring product tests information, test result vector is expressed as array, and define in diagnostic code
The array of test result storage；
Step 43, by test result assignment test vector array in order:
After test, test result is successively assigned in order in the test result array of definition；
Step 44, the reference for adding diagnostic code:
The diagnostic code of generation is copied in the file of soft project, and adds diagnostic code text in soft project
Part, according to diagnostic requirements analyze in determine diagnosis opportunity, determine diagnostic code operation source file, source file or its correspondence
The reference that diagnostic code header file is added in header file, finds out diagnosis opportunity corresponding position in product function code, calls
Diagnosis function；
Step 45, the calling for completing fault mode diagnostic dynamic chained library:
When application failure modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code,
Successively call fault mode diagnosis function code, judge in product institute it is faulty a situation arises, by the diagnosis knot of each failure
Fruit is sequentially written in function return value；
Step 46, the calling for adding isolated location diagnosis function:
Using the return value of fault mode diagnosis function as the input of isolated location fault diagnosis function, according to each isolation
In unit faulty there is a situation where come the isolation list that determines all isolated locations to break down certainly, may break down
First, trouble-proof isolated location certainly, function return value be isolated location failure there is a situation where；
Step 47, diagnostic result conversion:
According to the return value of the diagnosis function of some LRU/ module, prepare the data packet of display and storage；
Step 48, diagnostic result processing:
By ready display, storing data packet, is shown and stored.
Preferably, it in step 45 in application failure modality diagnostic dynamic link library, is called in product working procedure dynamic
State chained library, return value are that a situation arises for all fault modes.
Beneficial effects of the present invention:
The present invention, which is directed to, has the product of integrated chip to carry out fault diagnosis, proposes a kind of insertion based on correlation matrix
Formula fault diagnosis reasoning is illegal.Diagnosis can be carried out to all fault modes of product in a short time and to generation using this method
The isolated location of failure is isolated.By the method implement to the diagnosis of product failure be isolated, can both be based on testability
The correlation matrix that model obtains realizes the diagnosis of fault mode, and the Diagnostic Strategy of generation can be deployed to actual product
In operational process.
Detailed description of the invention
Fig. 1 is flow diagram of the invention；
Fig. 2 is the D matrix that product is selected in the embodiment of the present invention；
Fig. 3 be in the embodiment of the present invention select product optimization after D matrix；
Fig. 4 is the test result vector that product actual measurement is selected in the embodiment of the present invention；
Fig. 5 is that the corresponding diagnostic code generated of product is selected in the embodiment of the present invention.
Specific embodiment
The present invention provides a kind of embedded failure diagnosis inference machine based on correlation matrix, below to it is of the invention based on
The realization step of the embedded failure diagnosis inference machine of correlation matrix is illustrated.
The embedded failure diagnosis method based on correlation matrix that the present invention provides a kind of realizes that steps are as follows:
Step 1: establishing correlation models, the D matrix of correlation models is optimized:
The expression formula of the D matrix of correlation models is as follows,
Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is test quantity, the i-th row [a of matrixi1
ai2 … aim] what is indicated is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j
… anj]TWhat is indicated is the correlation between j-th of test and each fault mode, works as aijWhen=0, i-th of failure mould is indicated
Formula and j-th of test are uncorrelated, work as aijWhen=1, indicate that i-th of fault mode and j-th of test are related；
To represent in D matrix can not examine the full 0 row of fault mode, represent complete the 1 of all fault modes tested and can all examined
Row, complete 1 column for representing the full 0 column tested in vain and representing the super test that can measure all fault modes are deleted；By D
The same column for mutually going together and representing redundancy testing that ambiguity group is represented in matrix merges, matrix D after being optimized0, excellent
Matrix D after change0Expression formula it is as follows:
Step 2 judges that fault mode is the failure for being certain to occur, the failure that may occur or certainly impossible
Failure comprising following sub-step:
Step 21 obtains test result vector
Determine that the product for needing to carry out embedded diagnosis, the sensor of acquisition product current state test information, judge to survey
Whether examination passes through, obstructed out-of-date when testing, then the test is denoted as " 1 "；When test information passes through, then the test is denoted as
"0".All tests of product corresponding " 1 " and " 0 " are in line according to the sequence of test point in D matrix, just constitute this
Test result vector of the product at current time；
D matrix D0In each fault mode corresponding row test information be known as test vector, be made of " 0 ", " 1 ", " 0 "
Representing fault mode does not have correlation with test, has correlation between " 1 " representing fault mode and test；
Step 22, judgement are certain to the failure occurred:
Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some failure mould
Formula is in D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode is to be certain to
The failure of generation successively traverses all fault modes, finally obtains all fault mode collection for being certain to occur；
The failure that step 23, judgement may occur:
If some fault mode is in D0The corresponding test of the test vector of matrix is all contained in test result vector pair
In the test set answered, then it can be determined that the fault mode is the failure that possible occur, successively traverse all fault modes, it is final to obtain
To all fault mode collection that may occur；
Step 24 determines impossible failure certainly:
If there are " 1 " on certain position corresponding tests not to tie in test in the test vector of D matrix for some fault mode
In the corresponding test set of fruit vector " 1 ", then it can be determined that the fault mode as impossible failure certainly, successively traversal is all
Fault mode finally obtains the impossible fault mode collection of all affirmatives；
Step 3, detection and isolation unit be the isolated location to break down certainly, the isolated location that may be broken down or
Certainly trouble-proof isolated location comprising following sub-step:
Step 31, the isolated location for determining product and the fault mode under each unit:
In conjunction with the product form information diagnosed, its isolated location is determined, it is special according to the hardware of product each unit
Property and functional characteristic determine all fault modes under each isolated location of product；
The isolated location that step 32, judgement are broken down certainly:
If there is the failure occurred certainly in the corresponding fault mode of some isolated location, the isolation list can be determined that
Member is the isolated location that breaks down certainly, successively traverse all isolated locations, finally obtains and all breaks down certainly
Isolated location；
The isolated location that step 33, judgement may break down:
If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but there is the event that may occur
Barrier, then determine the isolated location for the isolated location that may break down, successively traverses all isolated locations, finally obtains institute
It is possible that the isolated location to break down surely；
Step 34 determines trouble-proof isolated location certainly:
If the failure of the failure occurred certainly and possible generation is not present in the corresponding fault mode of some isolated location,
Fault mode i.e. under the isolated location is all the failure not occurred certainly, then determines the isolated location not break down certainly
Isolated location, successively traverse all isolated locations, finally obtain the trouble-proof isolated location of all affirmatives；
Step 4, Diagnostic Strategy deployment:
The above Diagnostic Strategy is deployed in a manner of C language code or dynamic link library in the Diagnostic Strategy library of product,
Product the diagnostic code and dynamic link library are called in Diagnostic Strategy library come carry out the diagnosis of failure be isolated, to obtain institute
There are the failure occurred certainly, the failure that may occur and the failure not occurred certainly, and the diagnosis situation occurred according to failure
Come determine all isolated locations to break down certainly, the isolated location that may be broken down and certainly it is trouble-proof every
From unit.
Preferably, step 4 specifically includes following sub-step:
Step 41, the calling for adding diagnosis function:
The reference of source file is added in the software code of product, and the addition diagnosis letter in the code position on diagnosis opportunity
Several calling；
Step 42 defines test result array:
The sensor for acquiring product tests information, test result vector is expressed as array, and define in diagnostic code
The array of test result storage；
Step 43, by test result assignment test vector array in order:
After test, test result is successively assigned in order in the test result array of definition；
Step 44, the reference for adding diagnostic code:
The diagnostic code of generation is copied in the file of soft project, and adds diagnostic code text in soft project
Part, according to diagnostic requirements analyze in determine diagnosis opportunity, determine diagnostic code operation source file, source file or its correspondence
The reference that diagnostic code header file is added in header file, finds out diagnosis opportunity corresponding position in product function code, calls
Diagnosis function；
Step 45, the calling for completing fault mode diagnostic dynamic chained library:
When application failure modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code,
Successively call fault mode diagnosis function code, judge in product institute it is faulty a situation arises, by the diagnosis knot of each failure
Fruit is sequentially written in function return value；
Step 46, the calling for adding isolated location diagnosis function:
Using the return value of fault mode diagnosis function as the input of isolated location fault diagnosis function, according to each isolation
In unit faulty there is a situation where come the isolation list that determines all isolated locations to break down certainly, may break down
First, trouble-proof isolated location certainly, function return value be isolated location failure there is a situation where；
Step 47, diagnostic result conversion:
According to the return value of the diagnosis function of some LRU/ module, prepare the data packet of display and storage；
Step 48, diagnostic result processing:
By ready display, storing data packet, is shown and stored.
Preferably, it in step 45 in application failure modality diagnostic dynamic link library, is called in product working procedure dynamic
State chained library, return value are that a situation arises for all fault modes.
Embodiment
In order to solve existing testability design and verification method can not based on correlation matrix realize fault mode diagnosis every
From the problem of, also for the requirement for meeting Fault Diagnosis Strategy and disposing in the product, the embodiment of the invention provides one kind to be based on
The optimization and logic decision of correlation matrix come the failure of product is diagnosed, to isolated location carry out Fault Isolation side
Method.By taking flap slat controller computer as an example, the present embodiment be the described method comprises the following steps.
Step 1: interception flap slat controller computer D matrix a part as shown in Fig. 2, delete full 0 row, complete 1 row,
Full 0 column, complete 1 column, merge the row and column repeated in D matrix, then the D matrix after optimizing is as shown in Figure 3；
Step 2: the test result vector of actual measurement is as shown in figure 4, to every a line and test result in the D matrix after optimization
Vector is compared, and is determined the fault mode " 1553 bus communications are abnormal " occurred certainly, " 1553 buses send often low ", is agreed
The fixed fault mode " 429 bus level transcription error " not occurred, " 429 buses send often low ", it may occur however that fault mode
" 1553 bus level transcription error "；
Step 3: by the above fault mode, a situation arises that " 1553 communicate mould with product isolated location belonging to fault mode
Block ", " ARINC429 communication module " are corresponded to, and being isolated to the isolated location to break down certainly is " 1553 communication module ",
Certainly trouble-proof isolated location is " ARINC429 communication module ", the isolated location that may not be broken down；
Step 4: each failure being subjected to diagnostic analysis, the process of each isolated location Fault Isolation generates code, such as Fig. 5
It is shown, code is deployed in the Diagnostic Strategy library of product, through product call the program realize failure diagnosis be isolated.
Finally, it should be noted that above-described embodiments are merely to illustrate the technical scheme, rather than to it
Limitation；Although the present invention is described in detail referring to the foregoing embodiments, those skilled in the art should understand that:
It can still modify to technical solution documented by previous embodiment, or to part of or all technical features into
Row equivalent replacement；And these modifications or substitutions, it does not separate the essence of the corresponding technical solution various embodiments of the present invention technical side
The range of case.
Claims (5)
1. a kind of embedded failure diagnosis method based on correlation matrix, which is characterized in that itself the following steps are included:
Step 1: establishing correlation models, the D matrix of correlation models is optimized:
The expression formula of the D matrix of correlation models is as follows,
Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is test quantity, the i-th row [a of matrixi1 ai2 …
aim] what is indicated is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j …
anj]TWhat is indicated is the correlation between j-th of test and each fault mode, works as aijWhen=0, indicate i-th fault mode and
J-th of test is uncorrelated, works as aijWhen=1, indicate that i-th of fault mode and j-th of test are related, it can not by being represented in D matrix
Examine fault mode full 0 row, represent it is all test can all examine fault modes complete 1 row, represent test in vain full 0 column and
Complete 1 column for representing the super test that can measure all fault modes are deleted；By the mutually colleague that ambiguity group is represented in D matrix with
And represent the same column of redundancy testing and merge, matrix D after being optimized0, matrix D after optimization0Expression formula it is as follows:
Step 2 judges that fault mode is the failure for being certain to occur, the failure of possibility generation or affirms impossible failure,
It includes following sub-step:
Step 21 obtains test result vector
Determine the product for needing to carry out embedded diagnosis, the sensor test information of acquisition product current state is compared with standard
Compared with, judgement tests whether to pass through, and it is obstructed out-of-date when testing, then it is 1 by the test badge；When test information passes through, then should
Test badge is 0, and all tests corresponding 1 and 0 at product current time are lined up one according to the sequence of test point in D matrix
Row, just constitutes the product in the test result vector at current time；
Matrix D0In each fault mode corresponding row test information be known as test vector, be made of 0 and 1,0 representing fault mould
Formula does not have correlation with test, has correlation between 1 representing fault mode and test；
Step 22, judgement are certain to the failure occurred:
Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some fault mode exists
D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode is to be certain to occur
Failure, successively traverse all fault modes, finally obtain it is all be certain to occur fault mode collection；
The failure that step 23, judgement may occur:
If some fault mode is in D0The corresponding test of the test vector of matrix is all contained in the corresponding survey of test result vector
Examination is concentrated, then determines that the fault mode for the failure that may occur, successively traverses all fault modes, finally obtains all possibility
The fault mode collection that can occur；
Step 24 determines impossible failure certainly:
If there are on certain position 1 corresponding tests not in test result vector 1 in the test vector of D matrix for some fault mode
In corresponding test set, then determine that the fault mode for impossible failure certainly, successively traverses all fault modes, finally
Obtain the impossible fault mode collection of all affirmatives；
Step 3 judges the isolated location of product for the isolated location to break down certainly, the isolated location that may be broken down
Or the trouble-proof isolated location of affirmative comprising following sub-step:
Fault mode under step 31, the isolated location for determining product and each isolated location:
In conjunction with the product form information diagnosed, its isolated location is determined, it is special according to the hardware of each isolated location of product
Property and functional characteristic determine all fault modes under each isolated location of product；
The isolated location that step 32, judgement are broken down certainly:
If there is the failure occurred certainly in the corresponding fault mode of some isolated location, it can be determined that the isolated location is
Certainly the isolated location to break down successively traverses all isolated locations, obtains all isolated locations to break down certainly；
The isolated location that step 33, judgement may break down:
If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but there is the failure that may occur,
Determine the isolated location then for the isolated location that may break down, successively traverses all isolated locations, obtain all possible hairs
The isolated location of raw failure；
Step 34 determines trouble-proof isolated location certainly:
If sentenced in the corresponding fault mode of some isolated location there is no the failure occurred certainly and the failure that may occur
The fixed isolated location is the trouble-proof isolated location of affirmative, successively traverses all isolated locations, finally obtains all affirmatives
Trouble-proof isolated location；
Step 4, Diagnostic Strategy deployment:
The above Diagnostic Strategy is deployed in a manner of diagnostic code or dynamic link library in the Diagnostic Strategy library of product, product exists
The diagnostic code and dynamic link library are called in Diagnostic Strategy library come carry out the diagnosis of failure be isolated, to obtain all affirmatives
The failure of generation, the failure that may occur and the failure not occurred certainly, and determined according to the diagnosis situation that failure occurs
All isolated locations to break down certainly, the isolated location that may be broken down and the trouble-proof isolation of affirmative are single
Member.
2. the embedded failure diagnosis method according to claim 1 based on correlation matrix, it is characterised in that: step 4
Specifically include following sub-step:
Step 41, the calling for adding diagnosis function:
The reference of source file is added in the code in the Diagnostic Strategy library of product, and is added and examined in the code position on diagnosis opportunity
The calling of disconnected function；
Step 42 defines test result array:
The sensor for acquiring product tests information, and test result vector is expressed as array, and test is defined in diagnostic code
As a result the array stored；
Step 43, by test result assignment test vector array in order:
After test, test result is successively assigned in order in the test result array of definition；
Step 44, the reference for adding diagnostic code:
The diagnostic code of generation is copied in the file in Diagnostic Strategy library, and adds diagnostic code text in Diagnostic Strategy library
Part；
Step 45, the calling for completing fault mode diagnostic dynamic chained library:
When application failure modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code, successively
Call fault mode diagnosis function code, judge in product institute it is faulty a situation arises, by the diagnostic result of each failure according to
In secondary write-in function return value；
Step 46, the calling for adding isolated location diagnosis function:
Using the return value of fault mode diagnosis function as the input of isolated location fault diagnosis function, according to each isolated location
It is middle it is faulty there is a situation where come determine all isolated locations to break down certainly, the isolated location that may be broken down with
And trouble-proof isolated location certainly, function return value be isolated location failure there is a situation where；
Step 47, diagnostic result conversion:
According to the return value of the diagnosis function of some LRU/ module, prepare the data packet of display and storage；
Step 48, diagnostic result processing:
By the data packet of ready display and storage, is shown and stored.
3. the embedded failure diagnosis method according to claim 2 based on correlation matrix, it is characterised in that: step 45
In in application failure modality diagnostic dynamic link library, dynamic link library is called in product working procedure, return value is all
A situation arises for fault mode.
4. the embedded failure diagnosis method according to claim 2 based on correlation matrix, it is characterised in that: step 44
It is middle according to diagnostic requirements analyze in determine diagnosis opportunity, determine diagnostic code operation source file, source file or its correspondence
The reference that diagnostic code header file is added in header file, finds out diagnosis opportunity corresponding position in product function code, calls
Diagnosis function.
5. the embedded failure diagnosis method according to claim 3 based on correlation matrix, it is characterised in that: step 45
In all fault modes include the failure occurred certainly, the failure that may occur and the failure that does not occur certainly.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711201539.3A CN107966648B (en) | 2017-11-27 | 2017-11-27 | A kind of embedded failure diagnosis method based on correlation matrix |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711201539.3A CN107966648B (en) | 2017-11-27 | 2017-11-27 | A kind of embedded failure diagnosis method based on correlation matrix |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107966648A CN107966648A (en) | 2018-04-27 |
| CN107966648B true CN107966648B (en) | 2019-10-01 |
Family
ID=61998736
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711201539.3A Active CN107966648B (en) | 2017-11-27 | 2017-11-27 | A kind of embedded failure diagnosis method based on correlation matrix |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107966648B (en) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572640A (en) * | 2018-05-10 | 2018-09-25 | 北京中能博泰科技有限公司 | A kind of industrial system intelligent diagnosing method |
| CN109325293B (en) * | 2018-09-25 | 2023-08-15 | 中国人民解放军海军航空大学 | Multi-fault diagnosis method based on correlation model |
| CN112035996A (en) * | 2020-05-15 | 2020-12-04 | 中国人民解放军32181部队 | Equipment testability integrated design and evaluation system |
| CN115712840B (en) * | 2022-11-15 | 2023-06-13 | 中国人民解放军陆军工程大学 | Multi-fault diagnosis method and system for electronic information system |
Citations (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101821640A (en) * | 2008-12-17 | 2010-09-01 | 惠瑞捷（新加坡）私人有限公司 | Method and apparatus for determining relevance values for detection of fault on chip and for determining fault probability of location on chip |
| CN102608519A (en) * | 2012-03-01 | 2012-07-25 | 西安电子科技大学 | Circuit failure diagnosis method based on node information |
| CN102607845A (en) * | 2012-03-05 | 2012-07-25 | 北京工业大学 | Bearing fault characteristic extracting method for redundantly lifting wavelet transform based on self-adaptive fitting |
| CN102722471A (en) * | 2012-05-21 | 2012-10-10 | 北京航空航天大学 | Fuzzy relation matrix generating method based on comprehensive correlation matrix |
| CN102750212A (en) * | 2012-06-13 | 2012-10-24 | 长园深瑞继保自动化有限公司 | Embedded system fault diagnosis method and embedded system with fault diagnosis |
| CN103646013A (en) * | 2013-12-09 | 2014-03-19 | 清华大学 | Multiple fault reconstruction method based on covariance matrix norm approximation |
| CN103645432A (en) * | 2013-09-25 | 2014-03-19 | 临安科泰通信科技有限公司 | Signal reproduction type integrated circuit board failure detection device |
| CN103792486A (en) * | 2014-02-27 | 2014-05-14 | 北京航空航天大学 | Circuit board test design and relevant matrix establishing method based on fault effect data in FMEA |
| CN105510807A (en) * | 2016-02-04 | 2016-04-20 | 国家电网公司 | Fault diagnosis circuit for electronic circuit |
| CN106021671A (en) * | 2016-05-12 | 2016-10-12 | 北京航空航天大学 | Circuit health ranking evaluation method in combination with dependency relation and gray clustering technology |
| CN106570200A (en) * | 2015-10-12 | 2017-04-19 | 南京赛宝工业技术研究院 | Virtual simulation test method |
| CN107101813A (en) * | 2017-04-26 | 2017-08-29 | 河北工业大学 | A kind of frame-type circuit breaker mechanical breakdown degree assessment method based on vibration signal |
| CN107133118A (en) * | 2016-02-26 | 2017-09-05 | 华为技术有限公司 | A kind of fault diagnosis model training method, method for diagnosing faults and relevant apparatus |
| CN107202950A (en) * | 2017-05-12 | 2017-09-26 | 南京邮电大学 | Analog-circuit fault diagnosis method based on LMD approximate entropies and SVM |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB0803238D0 (en) * | 2008-02-22 | 2008-04-02 | Isis Innovation | Parallel processing |
| US9355069B2 (en) * | 2013-12-20 | 2016-05-31 | Johnson Controls Technology Company | Systems and methods for determining the uncertainty in parameters of an energy use model |
| JP6378149B2 (en) * | 2015-09-16 | 2018-08-22 | 東芝メモリ株式会社 | Defect detection apparatus, defect detection method and program |
-
2017
- 2017-11-27 CN CN201711201539.3A patent/CN107966648B/en active Active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101821640A (en) * | 2008-12-17 | 2010-09-01 | 惠瑞捷（新加坡）私人有限公司 | Method and apparatus for determining relevance values for detection of fault on chip and for determining fault probability of location on chip |
| CN102608519A (en) * | 2012-03-01 | 2012-07-25 | 西安电子科技大学 | Circuit failure diagnosis method based on node information |
| CN102607845A (en) * | 2012-03-05 | 2012-07-25 | 北京工业大学 | Bearing fault characteristic extracting method for redundantly lifting wavelet transform based on self-adaptive fitting |
| CN102722471A (en) * | 2012-05-21 | 2012-10-10 | 北京航空航天大学 | Fuzzy relation matrix generating method based on comprehensive correlation matrix |
| CN102750212A (en) * | 2012-06-13 | 2012-10-24 | 长园深瑞继保自动化有限公司 | Embedded system fault diagnosis method and embedded system with fault diagnosis |
| CN102750212B (en) * | 2012-06-13 | 2016-01-06 | 长园深瑞继保自动化有限公司 | Embedded system method for diagnosing faults and the embedded system being provided with fault diagnosis |
| CN103645432A (en) * | 2013-09-25 | 2014-03-19 | 临安科泰通信科技有限公司 | Signal reproduction type integrated circuit board failure detection device |
| CN103646013A (en) * | 2013-12-09 | 2014-03-19 | 清华大学 | Multiple fault reconstruction method based on covariance matrix norm approximation |
| CN103792486A (en) * | 2014-02-27 | 2014-05-14 | 北京航空航天大学 | Circuit board test design and relevant matrix establishing method based on fault effect data in FMEA |
| CN106570200A (en) * | 2015-10-12 | 2017-04-19 | 南京赛宝工业技术研究院 | Virtual simulation test method |
| CN105510807A (en) * | 2016-02-04 | 2016-04-20 | 国家电网公司 | Fault diagnosis circuit for electronic circuit |
| CN107133118A (en) * | 2016-02-26 | 2017-09-05 | 华为技术有限公司 | A kind of fault diagnosis model training method, method for diagnosing faults and relevant apparatus |
| CN106021671A (en) * | 2016-05-12 | 2016-10-12 | 北京航空航天大学 | Circuit health ranking evaluation method in combination with dependency relation and gray clustering technology |
| CN107101813A (en) * | 2017-04-26 | 2017-08-29 | 河北工业大学 | A kind of frame-type circuit breaker mechanical breakdown degree assessment method based on vibration signal |
| CN107202950A (en) * | 2017-05-12 | 2017-09-26 | 南京邮电大学 | Analog-circuit fault diagnosis method based on LMD approximate entropies and SVM |
Non-Patent Citations (1)
| Title |
|---|
| 基于模型的系统级故障诊断与预测推理技术;张士刚 等;《国防科技》;20160430;第37卷(第2期);全文 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107966648A (en) | 2018-04-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107966648B (en) | A kind of embedded failure diagnosis method based on correlation matrix | |
| US7844873B2 (en) | Fault location estimation system, fault location estimation method, and fault location estimation program for multiple faults in logic circuit | |
| CN108804326B (en) | Automatic software code detection method | |
| CN106776208B (en) | Fault Locating Method when a kind of running software | |
| CN109325293A (en) | A kind of Multiple faults diagnosis approach based on correlation models | |
| CN111125052B (en) | Big data intelligent modeling system and method based on dynamic metadata | |
| CN102096410B (en) | Dynamic function test method of high-speed train operation control system | |
| CN108268023B (en) | Remote fault diagnosis method and system for rail transit platform door | |
| CN100514307C (en) | Test cost-sensitive system failure position finding method and its device | |
| CN110221145A (en) | Fault Diagnosis for Electrical Equipment method, apparatus and terminal device | |
| CN109669866A (en) | A kind of acquisition methods of software run time fault propagation path | |
| Su et al. | Diagnosability of Discrete-Event Systems with Uncertain Observations. | |
| CN104424064A (en) | Diagnostic test method, diagnostic device and diagnostic system | |
| US8402421B2 (en) | Method and system for subnet defect diagnostics through fault compositing | |
| CN106526460B (en) | A kind of fault localization method and device | |
| CN100492033C (en) | Intelligent failure diagnosis method for vehicle power distribution unit | |
| CN117110794A (en) | Intelligent diagnosis system and method for cable faults | |
| Bodhe et al. | Diagnostic Fail Data Minimization Using an $ N $-Cover Algorithm | |
| CN112214912B (en) | External automatic test system and airborne equipment test method | |
| CN101147076A (en) | Circuit arrangement and method of testing and/or diagnosing the same | |
| Kustarev et al. | Functional monitoring of SoC with dynamic actualization of behavioral model | |
| CN115563017B (en) | Test system and method based on bus injection and computer equipment | |
| CN115473831B (en) | Reliability verification method and system for Internet of things chip | |
| CN109800155B (en) | Method and device for testing QTE interlocking application software based on Probe | |
| CN113221316A (en) | Fault diagnosis strategy optimization method considering test uncertainty |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |