CN107966648A - A kind of embedded failure diagnosis method based on correlation matrix - Google Patents
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Abstract
The present invention provides a kind of embedded failure diagnosis method based on correlation matrix, it comprises the following steps：Step 1: establish correlation models, the D matrix of correlation models is optimized, step 2, failure judgement pattern is the failure for being certain to occur, the failure that may occur or the impossible failure of affirmative, step 3, detection and isolation unit is the isolated location to break down certainly, the isolated location that may be broken down or trouble-proof isolated location, step 4, Diagnostic Strategy are disposed certainly.All fault modes of product can be diagnosed in a short time using this method and the isolated location to breaking down is isolated.By diagnosis of the method implementation to product failure with isolating, the diagnosis of fault mode can be not only realized based on the correlation matrix that testability model is drawn, but also the Diagnostic Strategy of generation can be deployed in the operational process of actual product.
Description
Technical field
The present invention relates to test method field, more particularly to a kind of embedded failure diagnosis side based on correlation matrix
Method.
Background technology
The testability design concept of product was just suggested early on the Cherry Hill testing sessions of 1970, by 70 years
For mid-term, due to the development of IC design, the necessity of testability design is gradually recognized and payes attention to.With test
Property the relevant paper of design and achievement in research it is also more and more, testability design has become one in integrated circuit testing field
Important part.One important method of testability design level for weighing, evaluating product exactly is testability modeling, is
Refer to form using standardization to the isolated location of system or equipment, signal, fault mode, failure rate, test and they it
Between the process that is described of correlation., can be with after the design of the testability of system is described and is expressed in this way
Assistant analysis easily is carried out using computer, and testability design can be improved according to analysis result, automatically generates test side
Dependence (correlation matrix) and diagnosis between method and fault mode isolate tree, drastically increase the effect of testability design
Rate.
At present, the diagnosis isolation tree based on correlation matrix is using AO*, Rollout scheduling algorithm, with testing cost minimum
For optimal conditions, the testing procedure and diagnosis isolation result of generation diagnosis isolation.Diagnosis isolation tree can effectively reduce failure and examine
Required test item when disconnected, reduces diagnosis isolation cost, can effectively instruct diagnosis isolation design.
But the diagnosis isolation tree based on correlation matrix also has two：One is only support single fault
Situation, diagnosis isolation when not supporting multiple faults and depositing.This is because a basic assumption of testability modeling is single failure hair
Raw, correlation matrix is exactly what is generated under the premise of this, thus diagnosis isolation tree be only used for when single failure occurs diagnosis every
From, and be much all multiple faults under actual conditions and deposit state, this causes the application scenarios of diagnosis isolation tree limited；.Based on survey
Examination property model carries out testability design verification evaluation and mainly faces two problems：First, how to be drawn based on testability model
Correlation matrix realizes the diagnosis of fault mode；Second, the Diagnostic Strategy of generation and the operational process of actual product mutually disconnect.
In consideration of it, refine a set of strategy for fault diagnosis present invention is primarily based on the D matrix that is generated after testability modeling, and by its
The code that can be run in product working procedure is converted into, realizes the deployment to Diagnostic Strategy in actual product, so as to fulfill
Embedded fault diagnosis, isolation.Field deployment from testability model to Diagnostic Strategy, extends testability design verification and comments
The application range of valency technology, the verification to be designed for product test are provided with the quick diagnosis of evaluation, failure with isolating
A kind of practicable new way.
The content of the invention
The defects of in order to overcome the prior art, the purpose of the present invention is to propose to a kind of test accuracy height, the source of trouble to search
Optimal test point system of selection in a kind of fireballing machine based on correlation models.
What the present invention was realized in：The present invention provides a kind of embedded failure diagnosis side based on correlation matrix
Method, realizes that step is as follows：
Step 1: establishing correlation models, the D matrix of correlation models is optimized：
The expression formula of the D matrix of correlation models is as follows,
Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is to test quantity, the i-th row [a of matrixi1
ai2 … aim] what is represented is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j
… anj]TWhat is represented is the correlation between j-th of test and each fault mode, works as aijWhen=0, i-th of failure mould is represented
Formula and j-th of test are uncorrelated, work as aijWhen=1, represent that i-th of fault mode and j-th of test are related；
To be represented in D matrix can not examine the full 0 row of fault mode, represent complete the 1 of all fault modes tested and can all examined
Complete 1 row that row, the full 0 row for representing invalid test and representative can measure the super test of all fault modes are deleted；By D
The same column for mutually going together and representing redundancy testing that ambiguity group is represented in matrix merges, matrix D after being optimized0, it is excellent
Matrix D after change0Expression formula it is as follows：
Step 2, failure judgement pattern are the failure for being certain to occur, the failure or certainly impossible that may occur
Failure, it includes following sub-step：
Step 21, obtain test result vector
Determine to need the product for carrying out embedded diagnosis, gather the sensor test information of product current state, judge to survey
Examination whether by, when test it is obstructed out-of-date, then the test is denoted as " 1 "；When test information by when, then the test is denoted as
“0”.All tests of product corresponding " 1 " and " 0 " are in line according to the order of test point in D matrix, just constitute this
Test result vector of the product at current time；
D matrix D0In the corresponding row test information of each fault mode be known as test vector, be made of " 0 ", " 1 ", " 0 "
Representing fault pattern does not possess correlation with test, possesses correlation between " 1 " representing fault pattern and test；
Step 22, judgement are certain to the failure occurred：
Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some failure mould
Formula is in D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode to be certain to
The failure of generation, travels through all fault modes successively, finally obtains all fault mode collection for being certain to occur；
The failure that step 23, judgement may occur:
If some fault mode is in D0It is right that the corresponding test of test vector of matrix is all contained in test result vector
In the test set answered, then it can be determined that the fault mode for the possible failure occurred, travels through all fault modes successively, it is final to obtain
To all fault mode collection that may occur；
Step 24, judge impossible failure certainly：
If some fault mode is in the test vector of D matrix there are " 1 " on certain position corresponding test not in test knot
In the corresponding test set of fruit vector " 1 ", then the fault mode is can be determined that as impossible failure certainly, traversal is all successively
Fault mode, finally obtains the impossible fault mode collection of all affirmatives；
Step 3, detection and isolation unit be the isolated location to break down certainly, the isolated location that may break down or
Certainly trouble-proof isolated location, it includes following sub-step：
Fault mode under step 31, the isolated location for determining product and each unit：
The product form information diagnosed with reference to needs, determines its isolated location, special according to the hardware of product each unit
Property and functional characteristic determine all fault modes under each isolated location of product；
The isolated location that step 32, judgement are broken down certainly：
If there is the failure occurred certainly in the corresponding fault mode of some isolated location, the isolation list can be determined that
Member is the isolated location that breaks down certainly, travel through all isolated locations successively, finally obtains and all breaks down certainly
Isolated location；
The isolated location that step 33, judgement may break down：
If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but the event that presence may occur
Barrier, then judge the isolated location for the isolated location that may break down, travels through all isolated locations successively, finally obtains institute
It is possible to the isolated location to break down surely；
Step 34, judge trouble-proof isolated location certainly：
If the failure occurred in the corresponding fault mode of some isolated location there is no affirmative and the failure that may occur,
Fault mode i.e. under the isolated location is all the failure not occurred certainly, then judges the isolated location not break down certainly
Isolated location, travel through all isolated locations successively, finally obtain the trouble-proof isolated location of all affirmatives；
Step 4, Diagnostic Strategy deployment：
Above Diagnostic Strategy is deployed in the Diagnostic Strategy storehouse of product in a manner of C language code or dynamic link library,
Product calls the diagnostic code and dynamic link library to carry out the diagnosis of failure with isolating in Diagnostic Strategy storehouse, so as to obtain institute
There are the failure occurred certainly, the failure that may occur and the failure not occurred certainly, and the diagnosis situation occurred according to failure
Come determine all isolated locations to break down certainly, the isolated location that may be broken down and certainly it is trouble-proof every
From unit.
Preferably, step 4 specifically includes following sub-step：
Step 41, the calling for adding diagnosis function：
The reference of source file, and the addition diagnosis letter in the code position on diagnosis opportunity are added in the software code of product
Several calling；
Step 42, define test result array：
The sensor test information of product is gathered, by test result vector representation into array, and defined in diagnostic code
The array of test result storage；
Step 43, by test result assignment test vector array in order：
After test, test result is assigned to successively in order in the test result array of definition；
Step 44, the reference for adding diagnostic code：
The diagnostic code of generation is copied in the file of soft project, and diagnostic code text is added in soft project
Part, on the diagnosis opportunity determined in being analyzed according to diagnostic requirements, determine the source file that diagnostic code is run, in source file or its correspondence
The reference of diagnostic code header file is added in header file, diagnosis opportunity corresponding position is found out in product function code, is called
Diagnosis function；
Step 45, the calling for completing fault mode diagnostic dynamic chained library：
When application and trouble modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code,
Call fault mode diagnosis function code successively, judge in product institute it is faulty a situation arises, by the diagnosis knot of each failure
Fruit is write in function return value successively；
Step 46, the calling for adding isolated location diagnosis function：
Input using the return value of fault mode diagnosis function as isolated location fault diagnosis function, according to each isolation
In unit faulty generation situation come the isolation list that judges all isolated locations to break down certainly, may break down
First, the trouble-proof isolated location of affirmative, its function return value are the situation that isolated location failure occurs；
Step 47, diagnostic result conversion：
According to the return value of the diagnosis function of some LRU/ module, prepare display and the data packet stored；
Step 48, diagnostic result processing：
By ready display, storage data packet, shown and stored.
Preferably, in step 45 in application and trouble modality diagnostic dynamic link library, called in product working procedure dynamic
State chained library, a situation arises for all fault modes for return value.
Beneficial effects of the present invention：
The present invention carries out fault diagnosis for the product for having integrated chip, it is proposed that a kind of insertion based on correlation matrix
Formula fault diagnosis reasoning is illegal.All fault modes of product can be diagnosed in a short time using this method and to occurring
The isolated location of failure is isolated.By diagnosis of the method implementation to product failure with isolating, testability can be both based on
The correlation matrix that model is drawn realizes the diagnosis of fault mode, and the Diagnostic Strategy of generation can be deployed to actual product
In operational process.
Brief description of the drawings
Fig. 1 is the flow diagram of the present invention；
Fig. 2 is the D matrix that product is selected in the embodiment of the present invention；
Fig. 3 be in the embodiment of the present invention select product optimization after D matrix；
Fig. 4 is the test result vector that product actual measurement is selected in the embodiment of the present invention；
Fig. 5 is the diagnostic code for selecting product to correspond to generation in the embodiment of the present invention.
Embodiment
The present invention provides a kind of embedded failure diagnosis inference machine based on correlation matrix, below to the present invention based on
The embedded failure diagnosis inference machine of correlation matrix realizes that step illustrates.
The present invention provides a kind of embedded failure diagnosis method based on correlation matrix, realize that step is as follows：
Step 1: establishing correlation models, the D matrix of correlation models is optimized：
The expression formula of the D matrix of correlation models is as follows,
Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is to test quantity, the i-th row [a of matrixi1
ai2 … aim] what is represented is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j
… anj]TWhat is represented is the correlation between j-th of test and each fault mode, works as aijWhen=0, i-th of failure mould is represented
Formula and j-th of test are uncorrelated, work as aijWhen=1, represent that i-th of fault mode and j-th of test are related；
To be represented in D matrix can not examine the full 0 row of fault mode, represent complete the 1 of all fault modes tested and can all examined
Complete 1 row that row, the full 0 row for representing invalid test and representative can measure the super test of all fault modes are deleted；By D
The same column for mutually going together and representing redundancy testing that ambiguity group is represented in matrix merges, matrix D after being optimized0, it is excellent
Matrix D after change0Expression formula it is as follows：
Step 2, failure judgement pattern are the failure for being certain to occur, the failure or certainly impossible that may occur
Failure, it includes following sub-step：
Step 21, obtain test result vector
Determine to need the product for carrying out embedded diagnosis, gather the sensor test information of product current state, judge to survey
Examination whether by, when test it is obstructed out-of-date, then the test is denoted as " 1 "；When test information by when, then the test is denoted as
“0”.All tests of product corresponding " 1 " and " 0 " are in line according to the order of test point in D matrix, just constitute this
Test result vector of the product at current time；
D matrix D0In the corresponding row test information of each fault mode be known as test vector, be made of " 0 ", " 1 ", " 0 "
Representing fault pattern does not possess correlation with test, possesses correlation between " 1 " representing fault pattern and test；
Step 22, judgement are certain to the failure occurred：
Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some failure mould
Formula is in D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode to be certain to
The failure of generation, travels through all fault modes successively, finally obtains all fault mode collection for being certain to occur；
The failure that step 23, judgement may occur:
If some fault mode is in D0It is right that the corresponding test of test vector of matrix is all contained in test result vector
In the test set answered, then it can be determined that the fault mode for the possible failure occurred, travels through all fault modes successively, it is final to obtain
To all fault mode collection that may occur；
Step 24, judge impossible failure certainly：
If some fault mode is in the test vector of D matrix there are " 1 " on certain position corresponding test not in test knot
In the corresponding test set of fruit vector " 1 ", then the fault mode is can be determined that as impossible failure certainly, traversal is all successively
Fault mode, finally obtains the impossible fault mode collection of all affirmatives；
Step 3, detection and isolation unit be the isolated location to break down certainly, the isolated location that may break down or
Certainly trouble-proof isolated location, it includes following sub-step：
Fault mode under step 31, the isolated location for determining product and each unit：
The product form information diagnosed with reference to needs, determines its isolated location, special according to the hardware of product each unit
Property and functional characteristic determine all fault modes under each isolated location of product；
The isolated location that step 32, judgement are broken down certainly：
If there is the failure occurred certainly in the corresponding fault mode of some isolated location, the isolation list can be determined that
Member is the isolated location that breaks down certainly, travel through all isolated locations successively, finally obtains and all breaks down certainly
Isolated location；
The isolated location that step 33, judgement may break down：
If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but the event that presence may occur
Barrier, then judge the isolated location for the isolated location that may break down, travels through all isolated locations successively, finally obtains institute
It is possible to the isolated location to break down surely；
Step 34, judge trouble-proof isolated location certainly：
If the failure occurred in the corresponding fault mode of some isolated location there is no affirmative and the failure that may occur,
Fault mode i.e. under the isolated location is all the failure not occurred certainly, then judges the isolated location not break down certainly
Isolated location, travel through all isolated locations successively, finally obtain the trouble-proof isolated location of all affirmatives；
Step 4, Diagnostic Strategy deployment：
Above Diagnostic Strategy is deployed in the Diagnostic Strategy storehouse of product in a manner of C language code or dynamic link library,
Product calls the diagnostic code and dynamic link library to carry out the diagnosis of failure with isolating in Diagnostic Strategy storehouse, so as to obtain institute
There are the failure occurred certainly, the failure that may occur and the failure not occurred certainly, and the diagnosis situation occurred according to failure
Come determine all isolated locations to break down certainly, the isolated location that may be broken down and certainly it is trouble-proof every
From unit.
Preferably, step 4 specifically includes following sub-step：
Step 41, the calling for adding diagnosis function：
The reference of source file, and the addition diagnosis letter in the code position on diagnosis opportunity are added in the software code of product
Several calling；
Step 42, define test result array：
The sensor test information of product is gathered, by test result vector representation into array, and defined in diagnostic code
The array of test result storage；
Step 43, by test result assignment test vector array in order：
After test, test result is assigned to successively in order in the test result array of definition；
Step 44, the reference for adding diagnostic code：
The diagnostic code of generation is copied in the file of soft project, and diagnostic code text is added in soft project
Part, on the diagnosis opportunity determined in being analyzed according to diagnostic requirements, determine the source file that diagnostic code is run, in source file or its correspondence
The reference of diagnostic code header file is added in header file, diagnosis opportunity corresponding position is found out in product function code, is called
Diagnosis function；
Step 45, the calling for completing fault mode diagnostic dynamic chained library：
When application and trouble modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code,
Call fault mode diagnosis function code successively, judge in product institute it is faulty a situation arises, by the diagnosis knot of each failure
Fruit is write in function return value successively；
Step 46, the calling for adding isolated location diagnosis function：
Input using the return value of fault mode diagnosis function as isolated location fault diagnosis function, according to each isolation
In unit faulty generation situation come the isolation list that judges all isolated locations to break down certainly, may break down
First, the trouble-proof isolated location of affirmative, its function return value are the situation that isolated location failure occurs；
Step 47, diagnostic result conversion：
According to the return value of the diagnosis function of some LRU/ module, prepare display and the data packet stored；
Step 48, diagnostic result processing：
By ready display, storage data packet, shown and stored.
Preferably, in step 45 in application and trouble modality diagnostic dynamic link library, called in product working procedure dynamic
State chained library, a situation arises for all fault modes for return value.
Embodiment
In order to solve existing testability design and verification method can not be realized based on correlation matrix the diagnosis of fault mode every
From the problem of, also for the requirement for meeting Fault Diagnosis Strategy and disposing in the product, an embodiment of the present invention provides one kind to be based on
The optimization and logic decision of correlation matrix carry out the side of Fault Isolation to be diagnosed to the failure of product, to isolated location
Method.By taking flap slat controller computer as an example, the present embodiment the described method comprises the following steps.
Step 1：Intercept a part for the D matrix of flap slat controller computer as shown in Fig. 2, delete full 0 row, complete 1 row,
Full 0 row, complete 1 row, merge the row and column repeated in D matrix, then the D matrix after optimizing is as shown in Figure 3；
Step 2：The test result vector of actual measurement is as shown in figure 4, to every a line and test result in the D matrix after optimization
Vector is compared, and is determined the fault mode " 1553 bus communications are abnormal " occurred certainly, " 1553 buses send often low ", is agreed
The fixed fault mode " 429 bus level transcription error " not occurred, " 429 buses send often low ", it may occur however that fault mode
" 1553 bus level transcription error "；
Step 3：By above fault mode, a situation arises and " 1553 communicate mould the product isolated location belonging to fault mode
Block ", " ARINC429 communication modules " are corresponded to, and it is " 1553 communication module " to be isolated to the isolated location to break down certainly,
Certainly trouble-proof isolated location is " ARINC429 communication modules ", the isolated location that may not be broken down；
Step 4：Each failure is subjected to diagnostic analysis, the process of each isolated location Fault Isolation generates code, such as Fig. 5
It is shown, code is deployed in the Diagnostic Strategy storehouse of product, calls the program to realize the diagnosis of failure with isolating through product.
Finally it should be noted that：Above-described embodiments are merely to illustrate the technical scheme, rather than to it
Limitation；Although the present invention is described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that：
It can still modify the technical solution described in previous embodiment, or to which part or all technical characteristic into
Row equivalent substitution；And these modifications or substitutions, the essence of appropriate technical solution is departed from various embodiments of the present invention technical side
The scope of case.
Claims (5)
- A kind of 1. embedded failure diagnosis method based on correlation matrix, it is characterised in that it comprises the following steps：Step 1: establishing correlation models, the D matrix of correlation models is optimized：The expression formula of the D matrix of correlation models is as follows,Wherein F is fault mode, and n is fault mode quantity, and T is test, and m is to test quantity, the i-th row [a of matrixi1 ai2 … aim] what is represented is the correlation between i-th of fault mode of product and each test, the jth of matrix arranges [a1j a2j … anj]TWhat is represented is the correlation between j-th of test and each fault mode, works as aijWhen=0, represent i-th fault mode and J-th of test is uncorrelated, works as aijWhen=1, represent that i-th of fault mode and j-th of test are related, can not by being represented in D matrix Examine fault mode full 0 row, represent it is all test can all examine fault modes complete 1 row, represent invalid test full 0 row and Complete 1 row for representing the super test that can measure all fault modes are deleted；By the mutually colleague that ambiguity group is represented in D matrix with And represent the same column of redundancy testing and merge, matrix D after being optimized0, matrix D after optimization0Expression formula it is as follows：Step 2, failure judgement pattern are the failure, the possible failure occurred or the impossible failure of affirmative for being certain to occur, It includes following sub-step：Step 21, obtain test result vectorDetermine to need the product for carrying out embedded diagnosis, the sensor test information of collection product current state is compared with standard Compared with, judgement test whether by, when test it is obstructed out-of-date, then by the test badge be 1；When test information by when, then should Test badge is 0, and all tests corresponding 1 and 0 at product current time are lined up one according to the order of test point in D matrix OK, test result vector of the product at current time is just constituted；D matrix D0In the corresponding row test information of each fault mode be known as test vector, be made of 0 and 1,0 representing fault mould Formula does not possess correlation with test, possesses correlation between 1 representing fault pattern and test；Step 22, judgement are certain to the failure occurred：Matrix D after optimizing0In the corresponding test vector of each fault mode carry out successive appraximation, if some fault mode exists D0Corresponding test vector and test result vector are completely the same in matrix, then can be determined that the fault mode to be certain to occur Failure, travel through all fault modes successively, finally obtain it is all be certain to occur fault mode collection；The failure that step 23, judgement may occur:If some fault mode is in D0The corresponding test of test vector of matrix is all contained in the corresponding survey of test result vector Examination is concentrated, then judges that the fault mode for the failure that may occur, travels through all fault modes, finally obtain and be possible to successively The fault mode collection that can occur；Step 24, judge impossible failure certainly：If some fault mode is in the test vector of D matrix there are on certain position 1 corresponding test not in test result vector 1 In corresponding test set, then judge that the fault mode for impossible failure certainly, travels through all fault modes, finally successively Obtain the impossible fault mode collection of all affirmatives；Step 3, judges the isolated location of product for the isolated location to break down certainly, the isolated location that may be broken down Or the trouble-proof isolated location of affirmative, it includes following sub-step：Fault mode under step 31, the isolated location for determining product and each isolated location：The product form information diagnosed with reference to needs, determines its isolated location, special according to the hardware of each isolated location of product Property and functional characteristic determine all fault modes under each isolated location of product；The isolated location that step 32, judgement are broken down certainly：If there is the failure occurred certainly in the corresponding fault mode of some isolated location, it can be determined that the isolated location is Certainly the isolated location to break down, travels through all isolated locations successively, obtains all isolated locations to break down certainly；The isolated location that step 33, judgement may break down：If there is no the failure of affirmative in the corresponding fault mode of some isolated location, but the failure that presence may occur, The isolated location is then judged for the isolated location that may break down, is traveled through all isolated locations successively, is obtained being possible to send out The isolated location of raw failure；Step 34, judge trouble-proof isolated location certainly：If sentence in the corresponding fault mode of some isolated location there is no the failure occurred certainly and the failure that may occur The fixed isolated location is trouble-proof isolated location certainly, travels through all isolated locations successively, finally obtains all affirmatives Trouble-proof isolated location；Step 4, Diagnostic Strategy deployment：Above Diagnostic Strategy is deployed in the Diagnostic Strategy storehouse of product in a manner of diagnostic code or dynamic link library, product exists The diagnostic code and dynamic link library are called in Diagnostic Strategy storehouse to carry out the diagnosis of failure with isolating, so as to obtain all affirmatives The failure of generation, the failure that may occur and the failure not occurred certainly, and determined according to the diagnosis situation that failure occurs All isolated locations to break down certainly, the isolated location that may be broken down and the trouble-proof isolation of affirmative are single Member.
- 2. the embedded failure diagnosis method according to claim 1 based on correlation matrix, it is characterised in that：Step 4 Specifically include following sub-step：Step 41, the calling for adding diagnosis function：The reference of source file is added in the code in the Diagnostic Strategy storehouse of product, and adds and examines in the code position on diagnosis opportunity The calling of disconnected function；Step 42, define test result array：The sensor test information of product is gathered, by test result vector representation into array, and is tested defined in diagnostic code As a result the array stored；Step 43, by test result assignment test vector array in order：After test, test result is assigned to successively in order in the test result array of definition；Step 44, the reference for adding diagnostic code：The diagnostic code of generation is copied in the file in Diagnostic Strategy storehouse, and diagnostic code text is added in Diagnostic Strategy storehouse Part；Step 45, the calling for completing fault mode diagnostic dynamic chained library：When application and trouble modality diagnostic function code, diagnosis opportunity corresponding position is found out in product function code, successively Call fault mode diagnosis function code, judge in product institute it is faulty a situation arises, by the diagnostic result of each failure according to In secondary write-in function return value；Step 46, the calling for adding isolated location diagnosis function：Input using the return value of fault mode diagnosis function as isolated location fault diagnosis function, according to each isolated location The situation of middle faulty generation come the isolated location that judges all isolated locations to break down certainly, may break down with And trouble-proof isolated location, its function return value are the situation that isolated location failure occurs certainly；Step 47, diagnostic result conversion：According to the return value of the diagnosis function of some LRU/ module, prepare display and the data packet stored；Step 48, diagnostic result processing：By the data packet of ready display and storage, shown and stored.
- 3. the embedded failure diagnosis method according to claim 2 based on correlation matrix, it is characterised in that：Step 45 In in application and trouble modality diagnostic dynamic link library, dynamic link library is called in product working procedure, return value is all A situation arises for fault mode.
- 4. the embedded failure diagnosis method according to claim 2 based on correlation matrix, it is characterised in that：Step 44 It is middle analyzed according to diagnostic requirements in determine diagnosis opportunity, determine diagnostic code operation source file, source file or its correspondence The reference of diagnostic code header file is added in header file, diagnosis opportunity corresponding position is found out in product function code, is called Diagnosis function.
- 5. the embedded failure diagnosis method according to claim 3 based on correlation matrix, it is characterised in that：Step 45 In all fault modes failure for including occurring certainly, the failure that may occur and the failure that does not occur certainly.
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