CN107941471A - A kind of detection method of free form surface - Google Patents

A kind of detection method of free form surface Download PDF

Info

Publication number
CN107941471A
CN107941471A CN201711148520.7A CN201711148520A CN107941471A CN 107941471 A CN107941471 A CN 107941471A CN 201711148520 A CN201711148520 A CN 201711148520A CN 107941471 A CN107941471 A CN 107941471A
Authority
CN
China
Prior art keywords
curve
freeform optics
center
test structure
freeform
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201711148520.7A
Other languages
Chinese (zh)
Inventor
汪际军
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Quanpu Semiconductor Technology (Shenzhen) Co., Ltd.
Original Assignee
Qualper Optoelectronics Technology (shanghai) Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualper Optoelectronics Technology (shanghai) Co Ltd filed Critical Qualper Optoelectronics Technology (shanghai) Co Ltd
Priority to CN201711148520.7A priority Critical patent/CN107941471A/en
Publication of CN107941471A publication Critical patent/CN107941471A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/20Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring contours or curvatures, e.g. determining profile

Abstract

The present invention provides a kind of detection method of free form surface, including:One test structure is provided;Test structure has freeform optics surface;Obtain the center of freeform optics surface;A plurality of curve is marked in freeform optics surface, using center as coordinate origin, establishes three-dimensional system of coordinate, obtains the curvilinear coordinate data of a plurality of curve;According to curvilinear coordinate data, simulation curved surface is fitted;Simulation curved surface and theoretical optics free form surface are compared, obtain the face shape error value of freeform optics surface.The present invention realizes effective measurement to freeform optics surface, improves accuracy of detection.

Description

A kind of detection method of free form surface
Technical field
The present invention relates to technical field of semiconductors, and in particular to a kind of detection method of freeform optics surface.
Background technology
Traditional optical system generally use coaxial system, such as sphere or aspherical mirror.But with optical device Application range constantly extends, and traditional optical system can not meet optical device high-performance, the requirement of miniaturization.Therefore, Non co axial reflecting system is come into being.There is freeform optics surface plane and sphere etc. can not substitute in Off-axial optical system Function, therefore, using freeform optics surface shape come according to be actually needed design so that freeform optics surface imaging, shine The application in the fields such as bright, measurement is increasingly favored be subject to people.
Freeform optics surface is often referred to optical surface that can not be with sphere or asphericity coefficient to represent, refers mainly to non-rotating The curved surface of symmetry axis or curved surface that can only be with parameter vector to represent.Freeform optics surface is widely used in reprographic printing equipment In, in color CRT, the field such as the aircraft window of aircraft, therefore, the design and fabrication technology of freeform optics surface is increasingly becoming research heat Point.
However, the detection difficulty of existing freeform optics surface is very big, machining accuracy is not high, and cost is big in particular how To realize that the high-accuracy measurement of freeform optics surface becomes the main difficult technical for improving freeform optics surface and designing.
The content of the invention
In order to overcome problem above, the present invention is intended to provide a kind of detection method of freeform optics surface, so as to improve light Learn the accuracy of detection of free form surface.
In order to achieve the above object, the present invention provides a kind of detection method of freeform optics surface, including:
Step 01:One test structure is provided;Test structure has freeform optics surface;
Step 02:Obtain the center of freeform optics surface;
Step 03:A plurality of curve is marked in freeform optics surface, using the center as coordinate origin, establishes three Dimension coordinate system, obtains the curvilinear coordinate data of a plurality of curve;
Step 04:According to the curvilinear coordinate data, simulation curved surface is fitted;
Step 05:Simulation curved surface and theoretical optics free form surface are compared, the face shape for obtaining freeform optics surface is missed Difference.
Preferably, the step 02 specifically includes:
Step 021:The center of the exterior contour of test structure is set according to the exterior contour size of test structure;
Step 022:A normal of the freeform optics surface at the center of the exterior contour through the test structure is found out, should The center of normal and the intersection point of freeform optics surface as freeform optics surface.
Preferably, setting the center of the exterior contour size of test structure includes:Measure the exterior contour ruler of test structure It is very little, the geometric center of test structure exterior contour is gone out according to exterior contour Size calculation.
Preferably, when test structure is obtained using turning mode, then using the center of the turning of test structure as test structure The center of exterior contour.
Preferably, in the step 03, specifically include:Mark the curve of a plurality of X-direction in X direction, also, along Y-direction Mark the curve of a plurality of Y-direction;The curve of X-direction and the curve intersection of Y-direction.
Preferably, in the step 03, wherein the curve of an X-direction streaks the center;A wherein Y-direction Curve streak the curve intersection of the center and an X-direction.
Preferably, the curve of a plurality of X-direction is marked in X direction, then, obtains the curvilinear coordinate data of the curve of X-direction; Thickness of the curve in Z-direction of X-direction is obtained again, by the curvilinear coordinate number of the curve of the thickness compensation of the Z-direction to X-direction In, the curvilinear coordinate data of the curve of revised X-direction are obtained.
Preferably, the step 05 specifically includes:The coordinate origin and three-dimensional system of coordinate for the freeform optics surface that theorizes, So that the coordinate origin of theoretical optics free form surface and the coordinate origin of the freeform optics surface are corresponding on Z directions, from And theoretical optics free form surface is parallel to each other with freeform optics surface;Then, the coordinate of theoretical optics free form surface is obtained Data and the coordinate data for obtaining simulation curved surface, then by identical X values and the Z values and optics of the theoretical optics free form surface of Y value The Z values of free form surface are subtracted each other, so as to obtain the error amount each put in freeform optics surface, are each put in freeform optics surface X values, Y value and corresponding error amount form the face shape error value of freeform optics surface.
Preferably, in the step 03, the coordinate origin is obtained using three coordinate measuring machine, establishes three-dimensional coordinate System, and obtain the curvilinear coordinate data.
A kind of detection method of freeform optics surface of the present invention is big for the detection difficulty of existing freeform optics surface And precision it is low the problem of, the center by obtaining freeform optics surface is used as coordinate origin and establishes three-dimensional system of coordinate, and By marking a plurality of curve in freeform optics surface, so as to obtain curvilinear coordinate data, and simulation curved surface is fitted accordingly, then According to the comparison of simulation curved surface and theoretical optics free form surface, the face shape error value of freeform optics surface is obtained, it is achieved thereby that Effective monitoring to freeform optics surface, improves the accuracy of detection of freeform optics surface.
Brief description of the drawings
Fig. 1 be the present invention a preferred embodiment freeform optics surface detection method flow diagram Fig. 2~ 10 be each preparation process schematic diagram of the detection method of the freeform optics surface of the preferred embodiment of the present invention
Embodiment
To make present disclosure more clear understandable, below in conjunction with Figure of description, present disclosure is made into one Walk explanation.Certainly the invention is not limited to the specific embodiment, the general replacement known to those skilled in the art Cover within the scope of the present invention.
The present invention is described in further detail below in conjunction with attached drawing 1~10 and specific embodiment.It should be noted that attached drawing Using very simplified form, using non-accurate ratio, and only to it is convenient, clearly reach aid illustration the present embodiment Purpose.
Referring to Fig. 1, a kind of detection method of freeform optics surface of the present embodiment, including:
Step 01:Referring to Fig. 2, provide a test structure;Test structure has freeform optics surface;
Specifically, test structure can be any workpiece, for example, various speculums, concave-convex lens etc..
Step 02:Obtain the center of freeform optics surface;
Specifically, in the present embodiment, obtaining the detailed process of the center of freeform optics surface can include:
Step 021:The center of the exterior contour of test structure is set according to the exterior contour size of test structure;This In, setting the center of the exterior contour size of test structure includes:The exterior contour size of test structure is measured, according to outer wheels Wide Size calculation goes out the geometric center of test structure exterior contour.In addition, when test structure is obtained using turning mode, then to survey The center for trying the turning of structure is the center of test structure exterior contour.
Alternatively, first, referring to Fig. 3, obtaining the exterior contour dimension data of test structure using infrared detecting set, so Afterwards, referring to Fig. 4, fitting the first simulation polygon of test structure exterior contour, then, the first simulation polygon is found out Geometric center;Then, referring to Fig. 5, the first simulation polygon is carried out multiple rotary, each rotation angle is identical, every time rotation It can move the first simulation polygon after turning and make its vertex more be fitted on exterior contour, and find out every time postrotational the The geometric center of one simulation polygon, until the first simulation polygon sets back;Then, it is all the first obtained simulations are more The geometric center of side shape sequentially connects, and obtains the second simulation polygon, then finds out the geometric center conduct of the second simulation polygon The center of test structure exterior contour.It should be noted that when looking for geometric center using this method, show in above-mentioned Fig. 5 and Fig. 6 The exterior contour of rule is gone out, regular exterior contour is such as circular, ellipse, regular polygon symmetric figure, after multiple rotary Multiple geometric centers of the first obtained simulation polygon are more smart so as to the utilization above method substantially in same position Accurately determine geometric center;For irregular exterior contour, as shown in Fig. 6, dotted line frame represents that rotating first simulation is polygon Shape, solid outline represent exterior contour, it can be seen that the multiple geometric centers obtained after dotted outline rotation are bullet, this In show four rotation dotted outlines, obtain four bullets and represent four geometric centers, this four bullets are sequentially connected Connect to obtain a quadrangle, then be easy to obtain the center of exterior contour using quadrangle, as shown in black five-pointed star in Fig. 6.
Step 022:Referring to Fig. 7, find out one of the freeform optics surface at the center of the exterior contour of structure after tested Center of the intersection point of normal, the normal and freeform optics surface as freeform optics surface.Here, it is necessary to illustrate, When there are a plurality of normal pass through exterior contour center when, choose freeform optics surface on formed relative to exterior contour it is flat Normal where the position of the height maximum in face, that is to say normal where the position of Z values maximum.
Step 03:Referring to Fig. 8, a plurality of curve is marked in freeform optics surface, using center as coordinate origin, Three-dimensional system of coordinate is established, obtains the curvilinear coordinate data of a plurality of curve;
Specifically, in the present embodiment, can be rule using contourgraph in freeform optics surface, curvilinear coordinate data Acquisition can be in the following way:The curve of a plurality of X-direction is marked in X direction, also, marks a plurality of Y-direction along Y-direction Curve;The curve of X-direction and the curve intersection of Y-direction.In order to further improve accuracy of detection, it can be set in the present embodiment In the curve of an X-direction streak the center, wherein the curve of a Y-direction streaks the center and described one The curve intersection of bar X-direction.In the present embodiment, the coordinate origin can be obtained using three coordinate measuring machine, is established three-dimensional Coordinate system, and obtain curvilinear coordinate data.
Step 04:Referring to Fig. 9, according to curvilinear coordinate data, simulation curved surface is fitted;
Specifically, in the present embodiment, it can be, but not limited to be fitted using MATLAB softwares, the side of fitting simulation curved surface Method can include:
Step 041:The curve of a plurality of X-direction is marked in X direction;
Step 042:Obtain the curvilinear coordinate data of the curve of X-direction;
Step 043:Thickness of the curve in Z-direction of X-direction is obtained, by the song of the thickness compensation of the Z-direction to X-direction In the curvilinear coordinate data of line, the curvilinear coordinate data of the curve of revised X-direction are obtained.
Step 05:Referring to Fig. 10, simulation curved surface and theoretical optics free form surface are compared, it is freely bent to obtain optics The face shape error value in face.
Specifically, the coordinate origin and three-dimensional system of coordinate of the freeform optics surface that theorizes so that theoretical optics is freely bent The coordinate origin in face is corresponding in z-direction with the coordinate origin of freeform optics surface, so that theoretical optics free form surface It is parallel to each other with freeform optics surface, as shown in Figure 10;Then, coordinate data and the acquisition of theoretical optics free form surface are obtained Simulate the coordinate data of curved surface, then by identical X values and the Z values of the theoretical optics free form surface of Y value and the Z values of freeform optics surface Subtract each other, so as to obtain the error amount each put in freeform optics surface, the X values each put in freeform optics surface, Y value and corresponding Error amount form freeform optics surface face shape error value.
Although the present invention is disclosed as above with preferred embodiment, the right embodiment illustrate only for the purposes of explanation and , the present invention is not limited to, if those skilled in the art can make without departing from the spirit and scope of the present invention Dry changes and retouches, and the protection domain that the present invention is advocated should be subject to described in claims.

Claims (9)

  1. A kind of 1. detection method of freeform optics surface, it is characterised in that including:
    Step 01:One test structure is provided;Test structure has freeform optics surface;
    Step 02:Obtain the center of freeform optics surface;
    Step 03:A plurality of curve is marked in freeform optics surface, using the center as coordinate origin, establishes three-dimensional sit Mark system, obtains the curvilinear coordinate data of a plurality of curve;
    Step 04:According to the curvilinear coordinate data, simulation curved surface is fitted;
    Step 05:Simulation curved surface and theoretical optics free form surface are compared, obtain the face shape error value of freeform optics surface.
  2. 2. the detection method of freeform optics surface according to claim 1, it is characterised in that the step 02 is specifically wrapped Include:
    Step 021:The center of the exterior contour of test structure is set according to the exterior contour size of test structure;
    Step 022:Find out a normal of the freeform optics surface at the center of the exterior contour through the test structure, the normal With the center of the intersection point of freeform optics surface as freeform optics surface.
  3. 3. the detection method of freeform optics surface according to claim 2, it is characterised in that set the outside of test structure The center of overall size includes:The exterior contour size of test structure is measured, test structure is gone out according to exterior contour Size calculation The geometric center of exterior contour.
  4. 4. the detection method of freeform optics surface according to claim 2, it is characterised in that when test structure uses turning Mode obtains, then the center using the center of the turning of test structure as test structure exterior contour.
  5. 5. the detection method of freeform optics surface according to claim 1, it is characterised in that in the step 03, specifically Including:The curve of a plurality of X-direction is marked in X direction, also, the curve of a plurality of Y-direction is marked along Y-direction;The curve of X-direction with The curve intersection of Y-direction.
  6. 6. the detection method of freeform optics surface according to claim 5, it is characterised in that in the step 03, wherein The curve of one X-direction streaks the center;The curve of wherein one Y-direction streaks the center and described one The curve intersection of X-direction.
  7. 7. the detection method of freeform optics surface according to claim 5, it is characterised in that mark a plurality of X side in X direction To curve, then, obtain the curvilinear coordinate data of the curve of X-direction;Thickness of the curve in Z-direction of X-direction is obtained again, will The thickness compensation of the Z-direction obtains the curve of the curve of revised X-direction into the curvilinear coordinate data of the curve of X-direction Coordinate data.
  8. 8. the detection method of freeform optics surface according to claim 1, it is characterised in that the step 05 is specifically wrapped Include:The coordinate origin and three-dimensional system of coordinate for the freeform optics surface that theorizes so that the coordinate origin of theoretical optics free form surface It is corresponding in z-direction with the coordinate origin of the freeform optics surface, so that theoretical optics free form surface and optics are certainly It is parallel to each other by curved surface;Then, obtain the coordinate data of theoretical optics free form surface and obtain the coordinate data of simulation curved surface, Identical X values and the Z values of the theoretical optics free form surface of Y value and the Z values of freeform optics surface are subtracted each other again, so as to obtain optics certainly By the error amount each put on curved surface, X values, Y value and the corresponding error amount each put in freeform optics surface form optics certainly By the face shape error value of curved surface.
  9. 9. the detection method of freeform optics surface according to claim 1, it is characterised in that in the step 03, use Three coordinate measuring machine obtains the coordinate origin, establishes three-dimensional system of coordinate, and obtain the curvilinear coordinate data.
CN201711148520.7A 2017-11-17 2017-11-17 A kind of detection method of free form surface Pending CN107941471A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201711148520.7A CN107941471A (en) 2017-11-17 2017-11-17 A kind of detection method of free form surface

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201711148520.7A CN107941471A (en) 2017-11-17 2017-11-17 A kind of detection method of free form surface

Publications (1)

Publication Number Publication Date
CN107941471A true CN107941471A (en) 2018-04-20

Family

ID=61931927

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201711148520.7A Pending CN107941471A (en) 2017-11-17 2017-11-17 A kind of detection method of free form surface

Country Status (1)

Country Link
CN (1) CN107941471A (en)

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109916299A (en) * 2019-03-11 2019-06-21 东莞市凯融光学科技有限公司 A kind of method of contact type measurement free form surface infrastructure product bias
CN110253151A (en) * 2019-05-30 2019-09-20 兰州空间技术物理研究所 A method of improving antenna reflector surface FSS laser ablation machining accuracy
CN111351965A (en) * 2020-03-02 2020-06-30 信联智翊科技(苏州)有限公司 Extended multi-order free-form surface detection method
CN112378367A (en) * 2020-11-05 2021-02-19 天津大学 Method for measuring surface shape and position of multi-free-form surface reflector distributed in inner cavity
CN112414676A (en) * 2020-11-05 2021-02-26 天津大学 Evaluation and calculation method for measurement data of multiple free-form surface reflectors
CN113758458A (en) * 2021-08-31 2021-12-07 南京茂莱光学科技股份有限公司 Surface shape measuring method of toric mirror
CN114076573A (en) * 2021-11-10 2022-02-22 中国科学院长春光学精密机械与物理研究所 Equivalent element, preparation method of equivalent element and detection precision checking method
CN114383531A (en) * 2021-12-24 2022-04-22 上海交通大学 Method and system for detecting three-dimensional profile of spherical optical lens
CN114460900A (en) * 2021-12-24 2022-05-10 泉州华中科技大学智能制造研究院 Method and device for processing special-shaped curved glass profile

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04270911A (en) * 1991-02-27 1992-09-28 Mitsutoyo Corp Free curved surface measuring method
CN101672637A (en) * 2009-09-24 2010-03-17 华东理工大学 Digitizing detection method of complicated curved face
CN102402001A (en) * 2010-09-16 2012-04-04 均贺科技股份有限公司 Design method for aspherical lenses
CN105627947A (en) * 2015-12-23 2016-06-01 中国科学院长春光学精密机械与物理研究所 Measurement method of rotary symmetry unknown aspherical surface error and measurement device
CN107063161A (en) * 2017-05-10 2017-08-18 西安工业大学 The surface shape detection apparatus and detection method of a kind of freeform optics element

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04270911A (en) * 1991-02-27 1992-09-28 Mitsutoyo Corp Free curved surface measuring method
CN101672637A (en) * 2009-09-24 2010-03-17 华东理工大学 Digitizing detection method of complicated curved face
CN102402001A (en) * 2010-09-16 2012-04-04 均贺科技股份有限公司 Design method for aspherical lenses
CN105627947A (en) * 2015-12-23 2016-06-01 中国科学院长春光学精密机械与物理研究所 Measurement method of rotary symmetry unknown aspherical surface error and measurement device
CN107063161A (en) * 2017-05-10 2017-08-18 西安工业大学 The surface shape detection apparatus and detection method of a kind of freeform optics element

Cited By (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109916299A (en) * 2019-03-11 2019-06-21 东莞市凯融光学科技有限公司 A kind of method of contact type measurement free form surface infrastructure product bias
CN110253151B (en) * 2019-05-30 2021-05-28 兰州空间技术物理研究所 Method for improving FSS laser etching processing precision of surface of antenna reflector
CN110253151A (en) * 2019-05-30 2019-09-20 兰州空间技术物理研究所 A method of improving antenna reflector surface FSS laser ablation machining accuracy
CN111351965A (en) * 2020-03-02 2020-06-30 信联智翊科技(苏州)有限公司 Extended multi-order free-form surface detection method
CN112378367B (en) * 2020-11-05 2021-10-22 天津大学 Method for measuring surface shape and position of multi-free-form surface reflector distributed in inner cavity
CN112414676A (en) * 2020-11-05 2021-02-26 天津大学 Evaluation and calculation method for measurement data of multiple free-form surface reflectors
CN112378367A (en) * 2020-11-05 2021-02-19 天津大学 Method for measuring surface shape and position of multi-free-form surface reflector distributed in inner cavity
CN112414676B (en) * 2020-11-05 2022-02-11 天津大学 Evaluation and calculation method for measurement data of multiple free-form surface reflectors
CN113758458A (en) * 2021-08-31 2021-12-07 南京茂莱光学科技股份有限公司 Surface shape measuring method of toric mirror
CN114076573A (en) * 2021-11-10 2022-02-22 中国科学院长春光学精密机械与物理研究所 Equivalent element, preparation method of equivalent element and detection precision checking method
CN114076573B (en) * 2021-11-10 2022-10-28 中国科学院长春光学精密机械与物理研究所 Equivalent element, preparation method of equivalent element and detection precision checking method
CN114383531A (en) * 2021-12-24 2022-04-22 上海交通大学 Method and system for detecting three-dimensional profile of spherical optical lens
CN114460900A (en) * 2021-12-24 2022-05-10 泉州华中科技大学智能制造研究院 Method and device for processing special-shaped curved glass profile
CN114383531B (en) * 2021-12-24 2023-02-17 上海交通大学 Method and system for detecting three-dimensional profile of spherical optical lens
WO2023115886A1 (en) * 2021-12-24 2023-06-29 泉州华中科技大学智能制造研究院 Method and device for processing special-shaped curved glass contour

Similar Documents

Publication Publication Date Title
CN107941471A (en) A kind of detection method of free form surface
CN103499302B (en) The camshaft diameter dimension On-line Measuring Method of structure based light Vision imaging system
CN107167169B (en) Readings of pointer type meters based on NI Vision Builder for Automated Inspection identifies measurement method
Zexiao et al. Complete 3D measurement in reverse engineering using a multi-probe system
CN109520436B (en) Butterfly spring three-dimensional size automatic measurement system based on machine vision and measurement method thereof
CN110230993A (en) A kind of accuracy assessment method of optical three-dimensional scanning instrument
CN105783786B (en) Part chamfering measuring method and device based on structured light vision
CN105571527B (en) A kind of turntable pivot angle precision measurement method
CN110108207A (en) Rotary shaft centre of gyration line geometry error calibrating method based on probe
Li et al. A measurement strategy and an error-compensation model for the on-machine laser measurement of large-scale free-form surfaces
Xia et al. An accurate and robust method for the measurement of circular holes based on binocular vision
CN107816942A (en) A kind of planar dimension measurement method based on cross structure light vision system
CN106127758A (en) A kind of visible detection method based on virtual reality technology and device
Li et al. Monocular-vision-based contouring error detection and compensation for CNC machine tools
CN102243103A (en) Method for quickly measuring colors and three-dimensional profile of object
CN108120394A (en) The high-speed train curved face quality determining method of flexibility
CN101509759B (en) Self-demarcating system and method for vision detecting system
CN109084699A (en) A kind of scaling method of the car light profile measuring system based on fixed point
CN103954220B (en) Hit ship motion status number image measuring method in bridge test
CN110940267A (en) Measuring method and measuring system thereof
CN109974608A (en) Part aperture dimension measurement method based on machine vision technique
CN103697811A (en) Method of obtaining three-dimensional coordinates of profile of object through combining camera and structural light source
CN113916128A (en) Method for improving precision based on optical pen type vision measurement system
CN109084734A (en) Microballoon attitude measuring and measurement method based on monocular micro-vision
CN106197274A (en) A kind of digital measuring has the method for the scribe line position degree of the mould of curved surface

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20190930

Address after: 518000 Longgang Venture Capital Building 4401 Floor, Tengfei Road, Longgang District, Shenzhen City, Guangdong Province

Applicant after: Quanpu Semiconductor Technology (Shenzhen) Co., Ltd.

Address before: No. 1185 Huyi Highway, Nanxiang Town, Jiading District, Shanghai 200000

Applicant before: Quanpu Photoelectric Technology (Shanghai) Co., Ltd.

WD01 Invention patent application deemed withdrawn after publication
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20180420