CN107884095A

CN107884095A - Auto-calibration circuits structure and automatic calibrating method in temperature measuring equipment

Info

Publication number: CN107884095A
Application number: CN201711095982.7A
Authority: CN
Inventors: 王磊
Original assignee: Wuxi China Resources Semico Co Ltd
Current assignee: CRM ICBG Wuxi Co Ltd
Priority date: 2017-11-09
Filing date: 2017-11-09
Publication date: 2018-04-06
Anticipated expiration: 2037-11-09
Also published as: CN107884095B

Abstract

The present invention relates to the auto-calibration circuits structure in a kind of temperature measuring equipment and automatic calibrating method, described temperature measuring equipment also includes external reference resistor and externally measured resistance, wherein, auto-calibration circuits structure in described temperature measuring equipment includes automatic calibration main control module, measurement module, internal data registration module, comparator module, shift LD module and selector module, using the interconnection of above-mentioned module, and using the method for the automatic calibration for realizing temperature measuring equipment, realize the calibration to described temperature measuring equipment.Using the auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment, the adjustment to the benchmark number of oscillation can be passed through, meet the calibration to described temperature measuring equipment on the basis of reference resistance is changed without, the precision of measurement is reached manufacturer's standard, effectively improve efficiency, reduce production cost.

Description

Auto-calibration circuits structure and automatic calibrating method in temperature measuring equipment

Technical field

The present invention relates to detection field, more particularly to temperature detection calibration field；Specifically refer in a kind of temperature measuring equipment Auto-calibration circuits structure and automatic calibrating method.

Background technology

Electronic temperature measurement equipment is widely used in daily life, as electronic thermometer, these temperature measuring equipments are more Number is all compared using a reference resistance with thermistor, to test the temperature of human body, since being reference resistance and temperature-sensitive electricity Resistance, resistance are just bound to wrong difference, even if high-precision resistance again, because the reason for technological reason and material, also have error, by mistake Difference can cause test error, and it will be ± 0.1 DEG C that the manufacturer's standard of clinical thermometer, which is precision, such as the body temperature of a people is 36.7 DEG C, but actual test is 36.9 DEG C either 36.5 DEG C, then just exceed manufacturer's standard, this electronic thermometer is exactly not conform to Lattice.All electronic thermometer production firm is in production at present, when running into the precision of electronic thermometer and exceeding manufacturer's standard, The method of use is that the method for replacing reference resistance either thermistor is adjusted, after once being replaced to multiple resistance, Untill the precision of measurement meets manufacturer's standard, such a method is strictly effective and feasible, but existing this technology, is virtually increased The cost of production is added, has reduced production efficiency, also reduce daily yield, it could even be possible to once replacing to change to Suitable resistance, to replace more than twice just can be with.

The content of the invention

The purpose of the present invention is the shortcomings that overcoming above-mentioned prior art, there is provided a kind of cost is low and efficient thermometric dress Auto-calibration circuits structure and automatic calibrating method in putting.

To achieve these goals, the auto-calibration circuits structure in temperature measuring equipment of the invention and automatic calibrating method tool Body is as follows：

Auto-calibration circuits structure in the temperature measuring equipment, described temperature measuring equipment also include external reference resistor and outside Resistance is measured, it is mainly characterized by,

Described auto-calibration circuits structure include automatic calibration main control module, measurement module, internal data registration module, Comparator module, shift LD module and selector module：

Described automatic calibration main control module respectively with external power source, described comparator module and shift LD module phase Connection, output starts automatic detection signal to described comparator module and shift LD module, and receives described displacement and post Whether the stopping detection signal of storing module output, the auto-calibration circuits structure for setting described enter calibration mode；

Described measurement module is connected with described external reference resistor, externally measured resistance and internal data registration module Connect, when the test environment temperature for system intialization is tested, using the corresponding table of the number of oscillation of system intialization and temperature as foundation, Preset reference number of oscillation X corresponding to the described external reference resistor of storage_RF, and measure corresponding to described externally measured resistance The number of oscillation X of externally measured resistance_RS, by the number of oscillation X of described externally measured resistance_RSExport to described inside number According to registration module；

Described internal data registration module is connected with comparator module, the number of oscillation preset for storage system with The corresponding table of temperature, and using the corresponding table of the number of oscillation of described system intialization and temperature as foundation, by described outside survey Measure the number of oscillation X of resistance_RSCurrent measurement temperature value corresponding to being converted to, described current measurement temperature value is exported to described Comparator module；

Described comparator module is connected with described internal data registration module and shift LD module, for by institute The current measurement temperature value stated is described compared with the actual temperature value at a temperature of the test environment of described system intialization Actual temperature value is preset in described comparator module, described actual temperature value and described current measurement temperature value with Binary form is compared, and exports the comparative result of described current measurement temperature value and described actual temperature value extremely Described shift LD module；

Described shift LD module is connected with described comparator module and selector module, according to described current The comparative result of measurement temperature value and described actual temperature value sends shift signal, controls described selector module to select One described in preset Temperature numerical；

Described selector module is connected with described shift LD module and test module, described selector module Inside is provided with N number of different preset Temperature numerical and shaken with N number of benchmark corresponding to each described preset temperature value Swing number, described preset Temperature numerical is higher, the described benchmark number of oscillation it is more, by selected preset temperature number Value is to should determine that a new benchmark number of oscillation X '_RF, and by described X '_RFOutput to test module, and it is described it is N number of not Same preset Temperature numerical sequentially arranges by size.

This realizes the method for the automatic calibration of temperature measuring equipment based on above-mentioned auto-calibration circuits structure, and described system is pre- The test environment temperature put is described actual temperature value, and it is mainly characterized by, and described method specifically includes following steps：

(1) preset reference number of oscillation X of the measurement module to be currently stored in described measurement module described in_RFFor thermometric Standard, it is determined that the number of oscillation X of described externally measured resistance_RS；

(2) internal data registration module described according to the number of oscillation of described system intialization and the corresponding table of temperature, It is determined that the number of oscillation X of described externally measured resistance_RSCorresponding described current measurement temperature value；

(3) comparator module described in judge described current measurement temperature value whether with described actual temperature value phase Deng；

(4) if described current measurement temperature value is equal with described actual temperature value, subsequent step (12) is continued, it is no Then continue subsequent step (5)；

(5) comparator module described in judges whether described current measurement temperature value is more than described actual temperature value；

(6) if described current measurement temperature value is more than described actual temperature value, subsequent step (7) is continued, otherwise Continue subsequent step (8)；

(7) the selector module selection described in the shift LD module drive described in is vibrated with presently described preset reference Number X_RFDiffer the first preset reference number of oscillation X ' of the difference of system intialization quantity_RF1Replace presently described preset reference Number of oscillation X_RF, it is stored in described measurement module, i.e. the first described preset reference number of oscillation X '_RF1As new current institute The preset reference number of oscillation X stated_RFThe described measurement module of deposit, as thermometric standard, and continues subsequent step (9), wherein, The first described preset reference number of oscillation X '_RF1Numerical value be equal to presently described preset reference number of oscillation X_RFQuantity subtract The difference of mini system preset quantity；

(8) the selector module selection described in the shift LD module drive described in is vibrated with presently described preset reference Number X_RFDiffer the second preset reference number of oscillation X ' of the difference of system intialization quantity_RF2Replace presently described preset reference Number of oscillation X_RF, it is stored in described measurement module, i.e. the second described preset reference number of oscillation X '_RF2As new current institute The preset reference number of oscillation X stated_RFThe described measurement module of deposit, as thermometric standard, and continues subsequent step (9), wherein, The second described preset reference number of oscillation X '_RF2Numerical value be equal to presently described preset reference number of oscillation X_RFQuantity increase The difference of adding system preset quantity；

(9) shift register module judges currently to judge whether number exceedes default judgement frequency threshold value；

(10) judge that number continues subsequent step (11) if exceeding default judgement frequency threshold value if current, otherwise return State step (2)；

(11) the automatic calibration main control module described in improves strategy to the default judgement number threshold according to default threshold value Value is increased, and returns to above-mentioned steps (2)；

(12) automatic calibration, the described current measurement temperature value of described internal data registration module output are terminated.

, can be described by changing using the auto-calibration circuits structure and automatic calibrating method in this kind of temperature measuring equipment The parameter value of the benchmark number of oscillation, realize in the case where not replacing described external reference resistor, realize outer described in replacing The effect of portion's reference resistance, eliminate replacement external reference resistor in prior art production process or replace externally measured resistance Cost, improve the efficiency of temperature measuring equipment calibration, without manual operation, the precision of measurement is reached manufacturer's standard, the present invention Using the auto-calibration circuits structure in this kind of temperature measuring equipment and automatic calibrating method accuracy are high, cost is low, efficiency high.

Brief description of the drawings

Fig. 1 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In the automatic calibration for realizing temperature measuring equipment method flow chart.

Fig. 2 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure circuit theory diagrams.

Fig. 3 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure automatic calibration main control module schematic diagram.

Fig. 4 is and the auto-calibration circuits structure in the temperature measuring equipment of the specific embodiment of the present invention and automatic calibration side The display screen figure of the outside display module of auto-calibration circuits structure connection in temperature measuring equipment in method.

Fig. 5 is and the auto-calibration circuits structure in the temperature measuring equipment of the specific embodiment of the present invention and automatic calibration side The outside driver module schematic diagram that auto-calibration circuits structure in temperature measuring equipment in method is connected.

Fig. 6 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure in comparator unit schematic diagram.

Fig. 7 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure in comparator module logic chart.

Fig. 8 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure in selector module logic chart.

Fig. 9 is auto-calibration circuits structure and automatic calibrating method in the temperature measuring equipment of the specific embodiment of the present invention In temperature measuring equipment in auto-calibration circuits structure in shift LD module logic chart.

Embodiment

In order to more clearly describe the technology contents of the present invention, carried out with reference to specific embodiment further Description.

Embodiment described in following exemplary embodiment does not represent all embodiment party consistent with the application Formula.On the contrary, they are only the device consistent with some aspects being described in detail in such as appended claims, the application and side The example of method.

It is only merely for the purpose of description specific embodiment in term used in this application, and is not intended to be limiting the application. " one kind " of singulative used in the application and appended claims, " described " and "the" are also intended to including majority Form, unless context clearly shows that other implications.Below with reference to the accompanying drawings the embodiments of the present invention are described in detail.

The present invention temperature measuring equipment in auto-calibration circuits structure and automatic calibrating method in, in the temperature measuring equipment from Dynamic calibration circuit structure, described temperature measuring equipment also include external reference resistor and externally measured resistance, wherein, described is automatic Calibration circuit structure includes calibration main control module, measurement module, internal data registration module, comparator module, displacement automatically and posted Storing module and selector module：

Described selector module is connected with described shift LD module and test module, described selector module Inside is provided with N number of different preset Temperature numerical and shaken with N number of benchmark corresponding to each described preset temperature value Swing number, described preset Temperature numerical is higher, the described benchmark number of oscillation it is more, by selected preset temperature number Value is to should determine that a new benchmark number of oscillation X '_RF, and by described X '_RFOutput to test module, and it is described it is N number of not Same preset Temperature numerical sequentially arranges by size, wherein, N is default value.

In the specific embodiment of the present invention, described automatic calibration main control module can also include：

Start button, described external power source incoming end connect described external power source by the start button, and output is opened Dynamic signal and mode of operation selection signal；

Clock timing unit, the clock timing unit are connected with described start button, for being pressed to described startup The turn-on time of button carries out timing；

Reset signal port, it is connected with described external power supply, for described automatic calibration main control module is initial Change.

In the specific embodiment of the present invention, described comparator module can include a highest bit comparator Unit and M-1 comparator unit, wherein, M is equal to that described current measurement temperature value is converted to digit after binary number Number, described highest order comparator unit and M-1 comparator unit are with the height of the binary digit company of sequence from high to low Connect, described highest order comparator unit and comparator unit comprise at least：

XNOR subelement, be converted to for relatively described current measurement temperature value the corresponding position after binary system whether etc. Corresponding position after described actual temperature value is converted to binary system；

Subelement is negated, is negated for described actual temperature value to be converted to the corresponding position after binary system, is obtained described Actual temperature value be converted to the inverted value of the corresponding position after binary system；

With subelement, for judging and exporting corresponding position after described current measurement temperature value is converted to binary system, institute The actual temperature value stated is converted to the high value among both inverted values of corresponding position after binary system；

The input of described XNOR subelement with the of the input of subelement with described comparator module One input is corresponding to be connected, the output end of described XNOR subelement, with the output end of subelement with described comparator The feedback output end of module is corresponding to be connected；

Wherein, M is equal to the number that described current measurement temperature value is converted to digit after binary number, described highest order Comparator unit and M-1 comparator unit are sorted cascade Connection from high to low with the height of binary digit.

In the specific embodiment of the present invention, described shift signal is the signal of N position, the shift signal Each correspond to a preset Temperature numerical, when described shift LD module sends shift signal every time, the displacement Only one is high level in signal, and corresponding with selected preset Temperature numerical, remaining N-1 position is low level；By The comparative result of current the measurement temperature value and actual temperature value of described comparator module output determines described shift signal In who be high level, wherein N >=2；

When described current measurement temperature value is equal with actual temperature value, described shift signal keeps constant, institute The shift LD module stated stops detection signal to described automatic calibration main control module output, makes auto-calibration circuits structure knot Beam is calibrated, and exports current measurement temperature value；

When described current measurement temperature value is more than described actual temperature value, the high level in described shift signal Signal position to temperature value less than presently described preset Temperature numerical other preset Temperature numericals direction move, And the signal position of the high level in the shift signal only moves a bit every time, for selecting and presently described preset temperature The adjacent preset Temperature numerical of number of degrees value is as new preset Temperature numerical, until described comparator module is to described When the described current measurement temperature value of shift LD module transmission is equal to the signal of described actual temperature value, described displacement letter The signal position of high level in number just stops movement, i.e. described shift signal is kept constant；

When described current measurement temperature value is less than described actual temperature value, the high level in described shift signal Signal position to temperature value higher than presently described preset Temperature numerical other preset Temperature numericals direction move, And the signal position of the high level in the shift signal only moves a bit every time, for selecting and presently described preset temperature The adjacent preset Temperature numerical of number of degrees value is as new preset Temperature numerical, until described comparator module is to described When the described current measurement temperature value of shift LD module transmission is equal to the signal of described actual temperature value, described displacement letter The signal position of high level in number just stops movement, i.e. described shift signal is kept constant.

As the specific embodiment of the present invention, described highest order comparator unit and M-1 comparator unit Between inside annexation specifically can be as follows, for convenience of distinguish highest order comparator unit in subelement and comparator list In the annexation below subelement in member, subelement and input, output end life in described highest order comparator unit " highest order " three word is added during name, to distinguish highest order comparator unit and comparator unit, and in highest bit comparator Corresponding position is the highest order in binary number, therefore " the corresponding position " in highest bit comparator is directly named with " highest order "：

(1) the highest order comparator unit described in includes：

(a) highest order XNOR subelement, including highest order XNOR subelement first input end, highest order XNOR The input of unit second and highest order XNOR the first output end of subelement, described highest order XNOR subelement first are defeated Enter the described current measurement temperature value of end input and be converted to the highest order after binary system, described highest order XNOR subelement the Two inputs are converted to the highest order after binary system for inputting described actual temperature value, and the highest order XNOR subelement is used Whether the highest order after relatively more described current measurement temperature value is converted to binary system, which is equal to described actual temperature value, is changed For the highest order after binary system；

(b) highest order negates subelement, including highest order negates the input of subelement the 3rd and highest order negates subelement Second output end, described highest order, which negates the input of subelement the 3rd and is used to inputting described actual temperature value, to be converted to two and enters Highest order after system, the highest order, which negates subelement described actual temperature value is converted to the highest order after binary system, to be negated, Obtain the inverted value that described actual temperature value is converted to the highest order after binary system；

(c) highest order first and subelement, including highest order first and the input of subelement the 4th, highest order first and son The input of unit the 5th and highest order first and the output end of subelement the 3rd；Described highest order first inputs with subelement the 4th End is connected with described highest order XNOR the second output end of subelement, and described highest order first inputs with subelement the 5th Input described current measurement temperature value in end is converted to the highest order after binary system, described highest order first and subelement the 3rd The described actual temperature value of output end output is converted to the inverted value of the highest order after binary system and described current measurement temperature Value is converted to the comparative result of the highest order after binary system, and the highest order first according to the comparative result judges with subelement Described current measurement temperature value, which is converted to the highest order after binary system and whether is converted to two higher than described actual temperature value, to be entered Highest order after system；The described highest order first current measurement temperature value described with the output of the output end of subelement the 3rd is converted to Highest order after binary system is converted to highest order which big signal after binary system with described actual temperature value；

(d) highest order second and subelement, including highest order second and the input of subelement the 6th and highest order second with The output end of subelement the 4th, described highest order second and the input of subelement the 6th and described highest order XNOR subelement First output end is connected；

(e) highest order the 3rd and subelement, including highest order the 3rd and the input of subelement the 7th, highest order the 3rd and son The input of unit the 8th and highest order the 3rd and the output end of subelement the 5th, described highest order the 3rd are defeated with subelement the 7th Enter end connection described highest order first and the output end of subelement the 3rd, described highest order the 3rd and the input of subelement the 8th It is connected with described highest order second with the output end of subelement the 4th；

Wherein, described highest order XNOR subelement first input end and highest order first and the input of subelement the 5th Connection corresponding with described internal data registration module, described the first output end of highest order XNOR subelement, highest order First posts with the output end of subelement the 3rd and described highest order the 3rd with the output end of subelement the 5th with described displacement Buffer module is corresponding to be connected.

(2) each described comparator unit includes：

(a) XNOR subelement, including the input of XNOR subelement the 9th, the input of XNOR subelement the tenth and The output end of XNOR subelement the 6th, the described current measurement temperature value of the described input of XNOR subelement the 9th input turn The corresponding position after binary system is changed to, the described input of XNOR subelement the tenth is used to input described actual temperature value conversion For the corresponding position after binary system, the XNOR subelement is used for after relatively more described current measurement temperature value is converted to binary system Whether corresponding position equal to described actual temperature value is converted to the corresponding position after binary system；

(b) subelement is negated, including negates the input of subelement the 11st and negates the output end of subelement the 7th, it is described Negate the input of subelement the 11st and be converted to the corresponding position after binary system for inputting described actual temperature value, this negates son Described actual temperature value is converted to the corresponding position after binary system and negated by unit, is obtained described actual temperature value and is converted to two The inverted value of corresponding position after system；

(c) first and subelement, including first with the input of subelement the 12nd, first with the input of subelement the 13rd And first and the output end of subelement the 8th；Described first negates subelement the 7th with the input of subelement the 12nd and described Output end is connected, and the described first current measurement temperature value described with the input of the input of subelement the 13rd is converted to two and entered Corresponding position after system, after the described first actual temperature value described with the output of the output end of subelement the 8th is converted to binary system The comparative result of corresponding position after correspondingly the inverted value of position is converted to binary system with described current measurement temperature value, according to the ratio Whether the corresponding position after being converted to binary system with the current measurement temperature value described in subelement judgement compared with first described in result is high Corresponding position after described actual temperature value is converted to binary system；Described in described first and the output end of subelement the 8th output Current measurement temperature value be converted to it is corresponding after the corresponding position after binary system is converted to binary system with described actual temperature value Position is which big signal；

(d) second and subelement, including second with the input of subelement the 14th, second with the input of subelement the 15th And second with the output end of subelement the 9th, described second with the input of subelement the 14th and described XNOR subelement the Six output ends are connected, and described second is corresponding with the comparator unit high by one for inputting with the input of subelement the 15th The comparative result of comparator unit described in position；

(e) the 3rd and subelement, including the 3rd with the input of subelement the 16th, the 3rd with the input of subelement the 17th And the 3rd and the output end of subelement the tenth, the described the 3rd is connected described first and sub- list with the input of subelement the 16th First 8th output end, the described the 3rd is connected with the input of subelement the 17th with described second with the output end of subelement the 9th Connect；

Wherein, the described input of XNOR subelement the 9th and first with the input of subelement the 13rd with it is described Internal data registration module is corresponding to be connected, the described output end of XNOR subelement the 6th, first and the output end of subelement the 8th And described the 3rd and the output end of subelement the tenth corresponding connection with described shift register module.

Moreover, in the M-1 described comparator units of the present invention, with described highest order comparator unit Described second and the input of subelement the 15th and described highest bit comparator in adjacent described comparator unit The 5th output end described in unit is connected；Described second and subelement in remaining M-2 described comparator units In the 15th input described comparator unit of high one corresponding with the comparator unit the 3rd with subelement the Ten output ends are connected, because described actual temperature value is to be preset in the numerical value of described comparator module, so described Highest order negates the output end of subelement the 3rd and negates the output end of subelement the 11st with other modules without any company with described Connect relation.

In the specific embodiment of the present invention, predetermined number N choosing can be included in described selector module Device unit is selected, wherein, each described selector unit is equipped with preset Temperature numerical described in one and preset with this Temperature value corresponding to the described benchmark number of oscillation, it is defeated that each described selector unit includes a selector unit Enter end and a selector unit output end；Described N number of selector unit is with described preset built in the selector unit Temperature numerical size order arrangement, wherein, the selector unit input of each described selector unit with it is corresponding Described selector module input be connected, the selector unit output end of each described selector unit with it is described Selector module output end it is corresponding be connected, the selector unit output end of each described selector unit is used to output pair The described benchmark number of oscillation answered.

As the embodiment of the present invention, described comparator module can be successive appraximation device module, by inside Logic gate the numerical value after binary system be converted to preset Temperature numerical compared by turn, and comparison process is from height Position is gradually compared to low level, if a high position is it has been determined that comparative result, need not be compared (binary number to low level again Value only comprising 0 and 1 the two numbers, is represented several with the two numbers), it is low only when high bit comparison does not go out judged result One just needs to continue to compare, because highest order comparator unit is highest order (i.e. first), so described highest Position second is highest order second and the input of subelement the 6th only including an input with subelement, and remaining digit is all connected with The comparative result end of previous position, therefore second described in the comparator unit described in remaining is equipped with two inputs with subelement End, i.e., second is used to connect with the input of subelement the 14th, second with the input of subelement the 15th, one of input The comparative result output end of corresponding previous position, i.e., described second in comparator unit and the input of subelement the 15th with Highest order first described in described highest order comparator unit is connected with the output end of subelement the 5th；Remaining M-2 institute Described second in the comparator unit stated and subelement second and the input of subelement the 15th with the comparator unit The 3rd in the described comparator unit of corresponding high one is connected with the output end of subelement the tenth.

In the specific embodiment of the present invention, described shift LD module includes N number of shift signal output end, Each described shift signal output end is used to export a signal of described shift signal, described selector module bag N number of selector module input is included, each described selector module input corresponds to the preset temperature number described in one Value, described N number of selector module input are suitable by size using the size of corresponding described preset Temperature numerical as foundation Sequence arranges, and described N number of shift signal output end corresponds with described N number of selector module input to be connected.

In the specific embodiment of the present invention, can be between described N number of different preset Temperature numerical Equal difference relation, its difference for system intialization etc. difference, other preset relations that can be realized can also be used certainly.

In the specific embodiment of the present invention, described selector module includes predetermined number N selector Unit, wherein, each described selector unit is equipped with preset Temperature numerical and the temperature preset with this described in one The described benchmark number of oscillation corresponding to angle value, each described selector unit include a selector unit input With a selector unit output end；Described N number of selector unit is with described preset built in described selector unit Temperature numerical size order arrangement, wherein, each described selector unit input with described shift LD mould Block is connected, and for receiving shift signal, each described selector unit output end is used to export built in the selector unit The described benchmark number of oscillation.

In the specific embodiment of the present invention, described selector module output end be used to exporting one it is new, Selected benchmark number of oscillation X '_RFTo described measurement module, the new benchmark number of oscillation X '_RFBy described shift LD After module controls the preset Temperature numerical described in one that described selector module is selected, by the selected preset temperature Number of degrees value is to should determine that；

Described shift LD module exports the output shift signal of a N position every time, the output shift signal of the N positions Each signal position exports by corresponding shift signal output end；Every time, in the shift signal of described N positions only one be high electricity Flat, remaining N-1 position is low level, the signal position of the output shift signal of described N positions and described N number of shift signal Output end corresponds, and described comparator module is according to the comparative result of described current measurement temperature value and actual temperature value The output shift signal of described shift LD module is determined, when described current measurement temperature value is equal with actual temperature value When, the output signal of described shift LD module keeps the shift LD module of constant, described shift LD module to stop Automatic detection signal output end stops detection signal to described automatic calibration main control module output, makes auto-calibration circuits structure Terminate calibration, and export current measurement temperature value；When described current measurement temperature value and actual temperature value are unequal, by institute The comparator module stated determines the movement of the high level signal position in the output shift signal of described N positions according to the size of the two Direction, after moving direction is determined, moving each time afterwards is moved to the moving direction of the determination, and is compared each time Described high level signal displacement is only set to move a bit compared with result, until fiducial value is equal, described output shift signal Just no longer move high level position.

Determine which preset Temperature numerical, i.e. N described selector module selects by described shift register module It is connected in individual selector module input with exporting the shift signal output end of high level signal in N bit shift signal output parts Selector module input be selected input, it is exactly to be selected to be chosen the corresponding preset Temperature numerical of input with this Preset temperature value, by the benchmark number of oscillation X ' corresponding to the preset temperature value_RFExport to described measurement module as new Preset reference number of oscillation X_RF。

In the specific embodiment of the present invention, described temperature measuring equipment also includes：Show that modular converter, display drive Dynamic model block and display module；

Described display modular converter respectively with described internal data registration module and described driver module Input be correspondingly connected, the display modular converter is used for the current measurement temperature for exporting described internal data registration module Angle value is converted to the described displayable make-and-break signal of display module, and by the described displayable make-and-break signal pair of display module That answers exports the input to described driver module；

The output end of described driver module is connected with described display module, and the driver module is according to institute The display module described in the displayable make-and-break signal driving of display module stated shows described current measurement temperature value；

The also described automatic calibration main control module of described display module is connected, and described display module is additionally operable to show The prompting character of system intialization.

As a kind of specific embodiment of the present invention, described display modular converter can use LCD display conversions Module；Described driver module is described LCD driver modules；Described display module is that described LCD is shown Module.

In a specific embodiment of the present invention, it should realize that thermometric filled based on above-mentioned auto-calibration circuits structure The method for the automatic calibration put, the test environment temperature of described system intialization is described actual temperature value, wherein, it is described Method specifically includes following steps：

(2) internal data registration module described according to the number of oscillation of described system intialization and the corresponding table of temperature, It is determined that the number of oscillation X of described externally measured resistance_RSCorresponding described current measurement temperature value, the step specifically include with Lower step：

(21) the internal data registration module described in obtains the number of oscillation X of described externally measured resistance_RS；

(22) using the corresponding table of the number of oscillation of described system intialization and temperature as foundation, it is determined that described is externally measured The number of oscillation X of resistance_RSCorresponding number of oscillation section；

(23) number of oscillation X of described externally measured resistance is determined according to described number of oscillation section_RSCorresponding Described current measurement temperature value；

(9) shift register module judges the current threshold value for judging number and whether exceeding default judgement number；

(10) judge that number continues subsequent step (11) if exceeding the threshold value of default judgement number if current, otherwise return Above-mentioned steps (2)；

(12) automatic calibration, the described current measurement temperature value of described internal data registration module output, the step are terminated Suddenly following steps are specifically included：

(121) automatic calibration, the described current measurement temperature value of described internal data registration module output to institute are terminated The display modular converter stated；

(122) described current measurement temperature value is converted to corresponding temperature-driven letter by the display modular converter described in Number, export to described driver module；

(123) display module described in driver module driving described in shows described current measurement temperature value.

, wherein it is desired to explanation, if the above-mentioned steps (11) by the present invention increase the default judgement number threshold Value still can not hit pay dirk the effect of accurate calibration, then need it is artificial change described externally measured resistance, and re-start Calibration operation, so as to further ensure that the accurate calibration of temperature measuring equipment.

As the more complete embodiment of another kind of the present invention, can also include before described step (1) with Lower step：

(a0) start described reset signal port, described automatic calibration main control module is initialized；

(a1) start button in described automatic calibration main control module is opened；

(a2) the clock timing unit in automatic calibration main control module described in starts timing, judges described start button Turn-on time whether reach the duration of system intialization；

(a3) automatic calibration mode is entered if reaching the duration of system intialization if the turn-on time of described start button, and Into subsequent step (a4), otherwise into thermometric pattern；

(a4) the preset prompting character of outside display module display system described in, described prompting character are used to prompt to work as Premode is automatic calibration mode.

In the embodiment of the present invention, described temperature measuring equipment can be an electronic thermometer.

Wherein, show that modular converter selects LCD display modular converter, driver module is driven from LCD display Mould, display module select LCD display module, and the auto-calibration circuits structure in the temperature measuring equipment of the present invention and method is direct Design is in the IC chip of electronic thermometer.

The IC chip principle of conditional electronic clinical thermometer：

The IC chip detection principle of conditional electronic clinical thermometer realizes that formula is as follows with a formula

R_RF×X_RF=R_RS×X_RS；

Wherein, R_RFFor the resistance value of external reference resistor, X_RFFor with R_RFThe corresponding preset reference number of oscillation, R_RSIt is outside Measure the resistance value of resistance, X_RSFor with R_RSThe number of oscillation X of corresponding externally measured resistance_RS。

In one embodiment of this invention, select 503ET types thermistor and be used as measurement resistance, and described system is pre- The test environment temperature put is set as 37 degree of constant temperature, wherein, X_RF=6455, turned to so formula just becomesWherein R_RF=30K, R_RSAccording to temperature change, at a temperature of some, X_RSCalculated by formula, principle is exactly According to final X_RSTo judge current temperature, after looking into the corresponding table of the preset number of oscillation and temperature, result X is vibrated_RSAt which Which temperature individual section, be judged as, and specific result is as shown in the table：

X_RS	Temperature	X_RS	Temperature	X_RS	Temperature	X_RS	Temperature
								5247-5269	32	5874-5897	34.7	6559-6583	37.4	7344-7373	40.2
5270-5291	32.1	5898-5922	34.8	6584-6609	37.5	7374-7403	40.3
								5292-5313	32.2	5923-5946	34.9	6610-6637	37.6	7404-7433	40.4
5314-5335	32.3	5947-5971	35	6638-6665	37.7	7434-7463	40.5
								5336-5357	32.4	5972-5997	35.1	6666-6693	37.8	7464-7493	40.6
5358-5380	32.5	5998-6022	35.2	6694-6720	37.9	7494-7524	40.7
								5381-5403	32.6	6023-6047	35.3	6721-6747	38	7525-7553	40.8
5404-5425	32.7	6048-6071	35.4	6748-6775	38.1	7554-7583	40.9
								5426-5446	32.8	6072-6096	35.5	6776-6801	38.2	7584-7613	41
5447-5469	32.9	6097-6121	35.6	6802-6829	38.3	7614-7644	41.1
								5470-5491	33	6122-6146	35.7	6830-6856	38.4	7645-7675	41.2
5492-5515	33.1	6147-6171	35.8	6857-6884	38.5	7676-7707	41.3
								5516-5538	33.2	6172-6195	35.9	6885-6911	38.6	7708-7737	41.4
5539-5561	33.3	6196-6221	36	6912-6939	38.7	7738-7769	41.5
								5562-5585	33.4	6222-6246	36.1	6940-6967	38.8	7770-7799	41.6
5586-5608	33.5	6247-6271	36.2	6968-6995	38.9	7800-7829	41.7
								5609-5631	33.6	6272-6297	36.3	6996-7023	39	7830-7860	41.8
5632-5655	33.7	6298-6322	36.4	7024-7052	39.1	7861-7892	41.9
								5656-5678	33.8	6323-6347	36.5	7053-7081	39.2	7893-7923	42
5679-5702	33.9	6348-6374	36.6	7082-7109	39.3	7924-7955	42.1
								5703-5726	34	6375-6401	36.7	7110-7139	39.4	7956-7985	42.2
5727-5751	34.1	6402-6427	36.8	7140-7167	39.5	7986-8017	42.3
								5752-5774	34.2	6428-6454	36.9	7168-7196	39.6	8018-8047	42.4
5775-5799	34.3	6455-6481	37	7197-7225	39.7	8048-8079	42.5
								5800-5823	34.4	6482-6506	37.1	7226-7255	39.8	8080-8111	42.6
5824-5848	34.5	6507-6531	37.2	7256-7284	39.9	8112-8144	42.7
								5849-5873	34.6	6532-6558	37.3	7285-7313	40	8145-8176	42.8
				7314-7343	40.1	8177-8209	42.9

But due to the influence of technique or manufacturing process, external reference resistor R_RF, externally measured resistance R_RSThere is error. The presence of this error is take into account in the present invention, therefore the preset temperature temperature spot in above table is generally corresponded to one Benchmark number of oscillation section, such as：Temperature benchmark number of oscillation section corresponding when being 37 degree is " 6455-6481 ", temperature For 36.9 degree when corresponding benchmark number of oscillation section be " 6428-6454 ", temperature benchmark corresponding when being 37.1 degree shakes It is " 6482-6506 " to swing time intervals.So as to it is determined that in the case of benchmark number of oscillation section, if vibration result X_RSChoosing The arbitrary value in the boundary value or boundary value in the section has been selected, can all correspond to corresponding temperature spot.

The general principle of calibration method in the present invention is exactly, because what actual temperature value determined, if thermometer measure The current measurement temperature value arrived, that is, the temperature surveyed>37.0, just X_RFIt is substituted for<6455 value, in turn if the temperature of actual measurement Degree<37.0, just X_RFIt is substituted for>6455 value, that is, it is equivalent to the preset reference number of oscillation X in detection module_RFWith new The first preset reference number of oscillation X '_RF1Or the second preset reference number of oscillation X '_RF2It is replaced, according to the number in tabling look-up Value,<6455 value can be 6428,6402,6375,6348,>6455 value can be 6482,6507,6532,6559, due to Temperature more than in clinical thermometer corresponding to several numbers of oscillation more meets the temperature of human body, therefore in the calibration of clinical thermometer only These numbers of oscillation need to be replaced.

In hardware circuit, the purpose of calibration is realized using replacing by turn, i.e., by the number of oscillation selected by above-mentioned 9 by One is replaced, carry out gradually orientation ratio compared with.The method replaced by turn is to use following flow scheme design, flow as shown in figure 1, Hardware configuration schematic diagram is as shown in Fig. 2 wherein, modules difference is as follows：

1.1st, the mode of the automatic calibration mode of entrance in flow chart is as follows：

Wherein, ARR is the meaning calibrated automatically in figure, and " Arr " is default screen display character：

Using following logical design, as shown in figure 3, wherein, PSW is switch key (i.e. start button), and CLK is one Cycle is 4s clock timing unit, and (time can be warm if the start button access failure time reaches 4s with system intialization Degree meter enters calibration mode, and otherwise thermometer enters common thermometric pattern).

Automatic calibration main control module automatic detection signal output end output ARR2 signals, ARR2, which is one, can control display Signal, ARR2=1, screen display Arr work as ARR2=0, and screen no longer shows that (Arr enters automatic calibration to Arr for prompting The prompting character of pattern, other characters may be selected as prompting character).

1.2nd, the Display in flow chart " Arr " (display " Arr ")

Display driving " Arr ", by automatic calibration main control module automatic detection signal output terminals A RR2 controls, outside shows mould Block is shown that modular converter and outside driver module control by outside, shows corresponding character, is particularly shown the corresponding pass of content It is as shown in the table：

Port

S1

S2

S3

S4

S5

S6

S7

S8

S9

S10

COM1

F1

A1

B1

F2

A2

B2

F3

A3

B3

A5

COM2

E1

G1

C1

E2

G2

C2

E3

G3

C3

B5

COM3

H1

D1

D2

H2

H4

D3

I4

C5

Described LCD modular converters, the temperature transition that the module measures thermometer are the break-make letter that LCD can be shown Number, the make-and-break signal is inputed into LCD drive modules, then shown by LCD drive modules driving LCD display, it is described Outside display module energy display reminding character and test temperature value, LCD display is as shown in figure 4, LCD drive module such as Fig. 5 It is shown.

Work as ARR2=1, screen display Arr, after the completion of automatic calibration, ARR2=0, display screen recovers normal.

1.3rd, the temperature in flow chart judges, temperature<37, temperature=37, temperature>37 3 kinds of situations, the side that temperature judges Method, using following digital comparator.

Described comparator module schematic diagram is as shown in fig. 6, due to the highest order in described highest order comparator unit Second with subelement only than second in the comparator unit of subsequent cascaded and the few input for connecing previous position of subelement, therefore No longer draw and illustrate, its comparison principle is as follows：

Wherein, AThe corresponding position after binary system is converted to for current measurement temperature value；

BThe corresponding position after binary system is converted to for actual temperature value；

nxorTo judge that current measurement temperature value is converted to the corresponding position after binary system two are converted to actual temperature value The comparison output result of both corresponding positions after system comparison result；

bigger_nFor AWith BWhich is worth the output signal of big result in middle size comparison result；

alarmIt is the comparative result not；

alarm<i-1>It is the comparative result of low one；

I specific value is determined by the position than the specific residing position in contraposition duodecimal number.

1) two (B are takenAnd A) XNOR nxor, 1 is exported if equal, does not wait then exporting 0, wherein, AFor current measurement temperature value, BFor actual temperature value；

2) by BThen and A negate,Mutually with obtaining bigger_nIf nxor=0 (represents two not phases Deng)：bigger_n=0 expression AMore than B, alarm=1；bigger_n=1 expression AIt is less than Or equal to B, alarm=0.

3)alarm<i-1>It is that the comparative result of low one (does not have other positions, therefore highest order second and a sub- list before highest order Member is without this end), if nxor=0, then do not have to look down on the comparative result of one, if nxor=1, then look down on one The comparative result of position.

4) according to this principle, successive appraximation from high to low, the logic chart of whole comparator is as shown in fig. 7, its truth table It is as shown in the table：

	OUT<0>	OUT<1>	OUT<2>
				A=B	1	0	0
A>B	0	1	0
				A<B	0	0	1

1.4th, temperature in flow chart<37, temperature>When 37, approached by turn using the number in table using the method approached by turn Value：

Wherein, the typical case as an actual correction temperature, 37, which can correspond to 6455,37.1, can correspond to 6482, 37.2 can correspond to 6507,37.3 can correspond to 6532,37.4 can correspond to 6559,36.9 can correspond to 6428,36.8 can be with Corresponding 6402,36.7, which can correspond to 6375,36.6, can correspond to 6348, work as temperature<At 37 degree, first allow benchmark the number of oscillation from 6455 are changed into 6482, here 6482 corresponding to be 37.1 degree, principle be exactly when 37 is improper, just allow cut-off position be changed into from 37 37.1, if now temperature<37 degree, continuing to cut-off position to be changed into 37.2 from 37.1, the number of oscillation is changed into 6507 from 6482, according to It is secondary to analogize, but when the number of oscillation is changed into 6559, or temperature<37 degree, then it is assumed that this circuit can not be calibrated.

Conversely, work as temperature>At 37 degree, first allow the number of oscillation of benchmark to be changed into 6428 from 6455, here 6428 corresponding to It it is exactly 36.9 degree, principle is equally when 37 is improper, just allows cut-off position to be changed into 36.9 from 37, by that analogy, works as the number of oscillation When being changed into 6348, or temperature>37 degree, then it is assumed that this circuit can not be calibrated.

No matter temperature<37 degree still>37 degree, be all with the method approached by turn, it is necessary to a shift register, by moving Bit register module gives selector module drive signal, come determine selector module select preset Temperature numerical corresponding to which and The benchmark number of oscillation corresponding with the temperature.

In one embodiment, it is necessary to nine selectors, selector can correspond to 37 respectively, 37.1,37.2,37.3,37.4, 36.9th, 36.8,36.7,36.6, logical design as shown in figure 8, the logical design of shift LD module as shown in figure 9, selector Corresponding selection：37th, 37.1,37.2,37.3,37.4,36.9,36.8,36.7,36.6 9 numbers, comparator module feedback output Hold the OUT of output<0:2>Signal judges the direction approached by turn, each CLK clock setting time, can all approach once, when After calibrating successfully, STOP signals produce, and represent that calibration is completed.

In summary, for the present invention, the purpose of automatic calibration has been reached with circuit logic, hardware electricity can be made in Lu Zhong, it is that production firm is cost-effective with the method for hardware, improves efficiency, increases yield.

It will be appreciated by those skilled in the art that accompanying drawing is the schematic diagram of a preferred embodiment, module or stream in accompanying drawing Journey is not necessarily implemented necessary to the present invention.It the foregoing is only the embodiment of the present invention, but the guarantor of the present invention Shield scope be not limited thereto, any one skilled in the art the invention discloses technical scope in, can be light Change or replacement are readily conceivable that, should be all included within the scope of the present invention.Therefore, protection scope of the present invention should be with described Scope of the claims is defined.

Claims

1. the auto-calibration circuits structure in a kind of temperature measuring equipment, described temperature measuring equipment also includes external reference resistor and outside Measure resistance, it is characterised in that described auto-calibration circuits structure includes automatic calibration main control module, measurement module, inside Data register module, comparator module, shift LD module and selector module：

Described automatic calibration main control module is connected with external power source, described comparator module and shift LD module respectively Connect, output starts automatic detection signal to described comparator module and shift LD module, and receives described shift LD Whether the stopping detection signal that module is exported, the auto-calibration circuits structure for setting described enter calibration mode；

Described measurement module is connected with described external reference resistor, externally measured resistance and internal data registration module, When test environment temperature for system intialization is tested, using the corresponding table of the number of oscillation of system intialization and temperature as foundation, deposit Preset reference number of oscillation X corresponding to the described external reference resistor of storage_RF, and measure outer corresponding to described externally measured resistance Portion measures the number of oscillation X of resistance_RS, by the number of oscillation X of described externally measured resistance_RSExport to described internal data Registration module；

Described internal data registration module is connected with comparator module, the number of oscillation preset for storage system and temperature Corresponding table, and using the corresponding table of the number of oscillation of described system intialization and temperature as foundation, by described externally measured electricity The number of oscillation X of resistance_RSCurrent measurement temperature value corresponding to being converted to, exports described current measurement temperature value to described comparison Device module；

Described comparator module is connected with described internal data registration module and shift LD module, for will be described Current measurement temperature value is compared with the actual temperature value at a temperature of the test environment of described system intialization, described reality Temperature value is preset in described comparator module, and described actual temperature value is entered with described current measurement temperature value with two The form of system is compared, and exports the comparative result of described current measurement temperature value and described actual temperature value to described Shift LD module；

Described shift LD module is connected with described comparator module and selector module, according to described current measurement The comparative result of temperature value and described actual temperature value sends shift signal, control that described selector module is selected one Individual preset Temperature numerical；

Described selector module is connected with described shift LD module and test module, according to selected described preset Temperature numerical is to should determine that a new benchmark number of oscillation X '_RF, and by described X '_RFExport to test module.

2. the auto-calibration circuits structure in temperature measuring equipment according to claim 1, it is characterised in that described automatic school Quasi- main control module also includes：

Start button, described external power source incoming end connect described external power source by the start button, and output starts letter Number and mode of operation selection signal；

Clock timing unit, the clock timing unit is connected with described start button, for described start button Turn-on time carries out timing；

Reset signal port, it is connected with described external power supply, for described automatic calibration main control module to be initialized.

3. the auto-calibration circuits structure in temperature measuring equipment according to claim 1, it is characterised in that described comparator Module includes a highest order comparator unit and M-1 comparator unit, described highest order comparator unit and comparator Unit comprises at least：

XNOR subelement, is converted to whether the corresponding position after binary system is equal to institute for relatively more described current measurement temperature value The actual temperature value stated is converted to the corresponding position after binary system；

Subelement is negated, is negated for described actual temperature value to be converted to the corresponding position after binary system, obtains described reality Border temperature value is converted to the inverted value of the corresponding position after binary system；

With subelement, the corresponding position after binary system and described is converted to for judging and exporting described current measurement temperature value Actual temperature value is converted to the high value among both inverted values of corresponding position after binary system；

The input of described XNOR subelement is defeated with the first of described comparator module with the input with subelement Enter the corresponding connection in end, the output end of described XNOR subelement, with the output end of subelement with described comparator module Feedback output end corresponding connect；

Wherein, M is equal to the number that described current measurement temperature value is converted to digit after binary number, described highest bit comparison Device unit and M-1 comparator unit are sorted cascade Connection from high to low with the height of binary digit.

4. the auto-calibration circuits structure in temperature measuring equipment according to claim 1, it is characterised in that described displacement is posted Storing module includes N number of shift signal output end, and each described shift signal output end is used to export described shift signal A signal, described shift signal each it is unique corresponding one described in preset Temperature numerical；

Described selector module includes N number of selector module input, and each described selector module input is corresponding Preset Temperature numerical described in one, described N number of selector module input is with corresponding described preset temperature number The size of value is foundation, and order arranges by size；

Described N number of shift signal output end corresponds with described N number of selector module input to be connected；

In the case of described current measurement temperature value is equal to actual temperature value, described shift signal keeps constant；

In the case of described current measurement temperature value is more than described actual temperature value, the height electricity in described shift signal Flat signal position moves one towards the direction of other preset Temperature numericals less than presently described preset Temperature numerical Bit；

In the case of described current measurement temperature value is less than described actual temperature value, the height electricity in described shift signal Flat signal position moves one towards the direction of other preset Temperature numericals higher than presently described preset Temperature numerical Bit.

5. the auto-calibration circuits structure in temperature measuring equipment according to claim 1, it is characterised in that different is described Be equal difference relation between preset Temperature numerical, its difference for system intialization etc. difference.

6. the auto-calibration circuits structure in temperature measuring equipment according to any one of claim 1 to 5, it is characterised in that Described temperature measuring equipment also includes：Show modular converter, driver module and display module；

Described display modular converter is defeated with described internal data registration module and described driver module respectively Enter to hold to correspond to and be connected, the current measurement temperature value that described internal data registration module exports is converted to described display mould The displayable make-and-break signal of block, and with exporting the described displayable make-and-break signal of display module to described driver module Input；

The output end of described driver module is connected with described display module, can be shown according to described display module Make-and-break signal, drive described display module to show described current measurement temperature value；

Described display module is also connected with described automatic calibration main control module, the prompting word preset for display system Symbol.

7. a kind of auto-calibration circuits structure based on described in claim 6 realizes the automatic calibrating method of temperature measuring equipment, described The test environment temperature of system intialization be described actual temperature value, it is characterised in that described method comprises the following steps：

(1) preset reference number of oscillation X of the measurement module to be currently stored in described measurement module described in_RFFor thermometric mark Standard, it is determined that the number of oscillation X of described externally measured resistance_RS；

(2) the internal data registration module described according to the number of oscillation of described system intialization and the corresponding table of temperature, it is determined that The number of oscillation X of described externally measured resistance_RSCorresponding described current measurement temperature value；

(3) comparator module described in judges whether described current measurement temperature value is equal with described actual temperature value；

(4) if described current measurement temperature value is equal with described actual temperature value, continue subsequent step (12), otherwise after Continuous subsequent step (5)；

(6) if described current measurement temperature value is more than described actual temperature value, continue subsequent step (7), otherwise continue Subsequent step (8)；

(7) selector module selection and the presently described preset reference number of oscillation described in the shift LD module drive described in X_RFDiffer the first preset reference number of oscillation X ' of the difference of system intialization quantity_RF1Replace presently described preset reference vibration Number X_RF, it is stored in described measurement module, i.e. the first described preset reference number of oscillation X '_RF1As new presently described Preset reference number of oscillation X_RFThe described measurement module of deposit, as thermometric standard, and continues subsequent step (9), wherein, it is described The first preset reference number of oscillation X '_RF1Numerical value be equal to presently described preset reference number of oscillation X_RFQuantity reduce system The difference of system preset quantity；

(8) selector module selection and the presently described preset reference number of oscillation described in the shift LD module drive described in X_RFDiffer the second preset reference number of oscillation X ' of the difference of system intialization quantity_RF2Replace presently described preset reference vibration Number X_RF, it is stored in described measurement module, i.e. the second described preset reference number of oscillation X '_RF2As new presently described Preset reference number of oscillation X_RFThe described measurement module of deposit, as thermometric standard, and continues subsequent step (9), wherein, it is described The second preset reference number of oscillation X '_RF2Numerical value be equal to presently described preset reference number of oscillation X_RFQuantity increase system The difference of system preset quantity；

(10) judge that number continues subsequent step (11) if exceeding default judgement frequency threshold value if current, otherwise return to above-mentioned step Suddenly (2)；

(11) the automatic calibration main control module described in improves strategy according to default threshold value and the default judgement frequency threshold value is entered Row increase, and return to above-mentioned steps (2)；

8. the method for the automatic calibration according to claim 7 for realizing temperature measuring equipment, it is characterised in that described automatic school Also include start button and clock timing unit in quasi- main control module,

It is further comprising the steps of before described step (1)：

(a2) the clock timing unit in automatic calibration main control module described in starts timing, judges connecing for described start button Whether the logical time reaches the duration of system intialization；

(a3) enter automatic calibration mode if reaching the duration of system intialization if the turn-on time of described start button, and enter Subsequent step (1), otherwise into thermometric pattern.

9. the method for the automatic calibration according to claim 8 for realizing temperature measuring equipment, it is characterised in that described automatic school Also include reset signal port in quasi- main control module, it is further comprising the steps of before described step (a1)：

(a0) start described reset signal port, described automatic calibration main control module is initialized.

10. the method for the automatic calibration according to claim 7 for realizing temperature measuring equipment, it is characterised in that described step (11) following steps are specifically included：

(111) the automatic calibration of end, described automatic calibration main control module end of output are calibrated and calibrate failure signal extremely automatically Described driver module；

(112) driver module described in drives the preset prompting character of described display module display system.

11. the method for the automatic calibration according to claim 7 for realizing temperature measuring equipment, it is characterised in that described step (12) following steps are specifically included：

(121) automatic calibration is terminated, the described current measurement temperature value of described internal data registration module output is to described Show modular converter；

(122) described current measurement temperature value is converted to corresponding temperature-driven signal by the display modular converter described in, defeated Go out to described driver module；