CN107860780A - A kind of detection means and method of glass defect deflection - Google Patents

A kind of detection means and method of glass defect deflection Download PDF

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Publication number
CN107860780A
CN107860780A CN201710947718.5A CN201710947718A CN107860780A CN 107860780 A CN107860780 A CN 107860780A CN 201710947718 A CN201710947718 A CN 201710947718A CN 107860780 A CN107860780 A CN 107860780A
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CN
China
Prior art keywords
glass
defect
glass sample
sample
detection means
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710947718.5A
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Chinese (zh)
Inventor
庞西荣
范铭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Rainbow Group (shaoyang) Special Glass Co Ltd Xianyang Branch
Original Assignee
Rainbow Group (shaoyang) Special Glass Co Ltd Xianyang Branch
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rainbow Group (shaoyang) Special Glass Co Ltd Xianyang Branch filed Critical Rainbow Group (shaoyang) Special Glass Co Ltd Xianyang Branch
Priority to CN201710947718.5A priority Critical patent/CN107860780A/en
Publication of CN107860780A publication Critical patent/CN107860780A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958Inspecting transparent materials or objects, e.g. windscreens
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid

Abstract

The detection means and method of a kind of glass defect deflection provided by the invention, including support system, the first parallel line source and grid imaging system, wherein, glass sample is fixed with support system, first parallel line source is arranged in support system, and is placed in the side of glass sample, while is placed in glass sample in same horizontal line, grid imaging system is placed on the dead astern of glass sample, and parallel to each other with glass sample.The detection means can fast and accurately define glass and melt class and non-melting class defect, and by gathering the image of glass defect in grid imaging system, and then deflection and deformation form to melting class glass defect are analyzed and researched;Detection means equipment manufacturing cost of the present invention is low, be easy to promote the use of, equipment operation and safeguards the characteristics of simple and convenient.

Description

A kind of detection means and method of glass defect deflection
Technical field
The invention belongs to the detection technique field of cover-plate glass, base plate glass and other plate glass, is related to a kind of glass The detection means and method of defect deflection.
Background technology
The artificial visual defect inspection method that base plate glass, cover-plate glass industry generally use at present is:1st, Halogen lamp LED is anti- Penetrate the detection of light source artificial visual;2nd, fluorescent lamp reflected light, the detection of transmitted light artificial visual;3rd, LED side light lamps artificial visual detects. Although light source is variant used by the manual measuring device of current industry universal, light source direction of illumination is also had nothing in common with each other, All it is mainly to produce bright bright spot, the detection mode manually judged again bright spot, classified using reflection of the defect to light. Cleaning Principle, Detection results are substantially suitable under light source not of the same race described above.
Aforesaid substrate glass, cover-plate glass and the general visual detection equipment of related industry chain, can not intuitively be presented scarce Fall into surrounding deformation state, can not realize that the quantitative analysis to glass deformation amount around defect works.Therefore, by means of existing detection Equipment, check analysis technical staff can not analyze and research to deformation state around defect.
The content of the invention
It is an object of the invention to provide a kind of detection means and method of glass defect deflection, solves existing inspection The defects of analytical technology personnel can not be analyzed and researched using existing detection device to the deformation form around glass defect.
In order to achieve the above object, the technical solution adopted by the present invention is:
A kind of detection means of glass defect deflection provided by the invention, including support system, the first parallel line source With grid imaging system, wherein, be fixed with glass sample in support system, the first parallel line source is arranged in support system, And the side of glass sample is placed in, while be placed in glass sample in same horizontal line, grid imaging system is placed on hyaloid The dead astern of product, and it is parallel to each other with glass sample.
Preferably, support system includes base and the support bar of L-type structure, and the first parallel line source is arranged on support bar In vertical bar.
Preferably, it is connected with the horizon bar of support bar to the clamping device of fixed glass sample.
Preferably, it is detachable on base that fix bar is installed, the second parallel line source is provided with fix bar, second is flat Line light source is placed in the opposite side of glass sample.
Preferably, the horizon bar of support bar and vertical bar are telescopic structure.
Preferably, grid imaging system is Turbogrid plates, and each grid size that the Turbogrid plates are projected out is consistent and is Square structure.
A kind of detection method of glass defect deflection, comprises the following steps:
The first step, glass sample is fixed in support system;
Second step, the position of glass sample is adjusted, glass sample is abutted the first parallel line source;
3rd step, grid imaging system is placed on to the dead astern of glass sample, and it is parallel to each other with glass sample;
4th step, the projection of grid imaging system on sight glass sample, while to the glass of grid imaging system projection Defect carries out mug, obtains the deformation form of glass defect;Grid imaging system is measured by self-adhering-type film graduated scale The deflection of the glass defect of projection;
5th step, the image obtained by the 4th step and measurement data are preserved.
Preferably, the gridline deformation state for glass defect region being projected in when grid imaging system does not reach requirement of taking pictures When, increase by the second parallel line source in support system.
Preferably, the glass defect on glass sample is placed in the centre position of the first parallel line source.
Preferably, the distance between grid imaging system and glass sample are 5cm-50cm.
Compared with prior art, the beneficial effects of the invention are as follows:
A kind of detection means of glass defect deflection provided by the invention, is consolidated glass sample by support system Fixed, parallel line source provides the light intensity needed for detection, and using the light reflection principle and light scattering principle of glass, glass defect is thrown To in grid imaging system, the detection means can fast and accurately define glass and melt class and non-melting class defect shadow, pass through The image of glass defect in grid imaging system is gathered, and then deflection and deformation form to melting class glass defect divide Analysis research;Detection means equipment manufacturing cost of the present invention is low, be easy to promote the use of, equipment operation and safeguards simply and easily special Point.
Further, by the telescopic structure of support bar, gripping for different dimension glass is realized.
The present invention also provides a kind of detection method of glass defect deflection, and glass sample is fixed on into support system first On, then adjust the position of sample, using the light reflection principle and light scattering principle of glass, by glass defect project to grid into As in system, the detection means can fast and accurately define glass and melt class and non-melting class defect, by gather grid into As the image of glass defect in system, and then deflection and deformation form to melting class glass defect are analyzed and researched;This Invent that the detection means equipment manufacturing cost that is related to is low, be easy to promote the use of, equipment operation and safeguards the characteristics of simple and convenient.
Brief description of the drawings
Fig. 1 is structure of the detecting device schematic diagram;
Fig. 2 is optional parallel lines light-source structure schematic diagram;
Fig. 3 is grid plate structure schematic diagram;
Fig. 4 is that the glass defect deformation form as obtained by the application and prior art detection and deflection contrast respectively Figure;
Wherein, 1, base 2, support bar 3, the first parallel line source 4, Turbogrid plates 5, clip 6, fix bar 7, second Parallel line source.
Embodiment
Below in conjunction with the accompanying drawings, the present invention is described in more detail.
As shown in Figure 1-Figure 3, the detection means of a kind of glass defect deflection provided by the invention, including support system, First parallel line source 3 and grid imaging system, wherein, support system includes base 1 and the support bar 2 of L-type structure, and first is flat Line light source 3 is arranged in the vertical bar of support bar 2, and grid imaging system is placed on the rear of glass sample, and and hyaloid Product are parallel to each other.
Meanwhile clamping device is provided with the horizon bar of support bar 2, the clamping device is two clips 5, the energy of clip 5 It is enough to be slidably reciprocated along horizon bar.
In order to ensure that the side of glass abuts the first parallel line source 3, the horizon bar of support bar 2 is arranged to telescopic knot Structure;Meanwhile in order to ensure that glass defect is in the center of the first parallel line source 3, the vertical bar of support bar 2 is arranged to Telescopic structure.
When the light intensity is insufficient, when the display effect of glass defect needs to further enhance, increase by one is removable on base 1 The fix bar 6 of formula installation is unloaded, and the second parallel line source 7 of absolute construction is provided with fix bar 6;Meanwhile second parallel lines Light source 7 is placed in the opposite side of glass.
Grid imaging system is Turbogrid plates 4, and each grid that the Turbogrid plates 4 are projected out is square structure, and size Unanimously, at the same grid projection width lower limit be 0.2mm, upper limit 5mm;When lattice dimensions are excessive, glass surface is being projected to During defect deformed region, because deformed region is smaller, multiple square grids can not be covered, then gridline deformation state can not be in Reveal and;When lattice dimensions are too small, it is excessive to project the grid of defect deformed region, can not accurately check deformation grid number.
For the portability of equipment, the size of support system is less than 50cm.
The present invention also provides a kind of detection method of glass defect deflection, comprises the following steps:
The first step, glass sample is clamped on support bar 2 by clip 5;
Second step, the position of glass sample is adjusted, glass sample is abutted the first parallel line source 3, meanwhile, cause as far as possible Glass defect on glass sample is placed in the centre position of the first parallel line source 3;
3rd step, grid imaging system is placed on the dead astern of glass sample, grid imaging system and glass sample it Between distance be 5cm-50cm, it is and parallel to each other with glass sample;
4th step, the deformation state of the glass defect position of grid imaging system on sight glass sample, while by phase Machine can carry out mug;The deflection of the Turbogrid plates as caused by glass defect is measured by self-adhering-type film graduated scale;
5th step, the image obtained by the 4th step and measurement data are preserved.
It is illustrated in figure 4 glass defect deformation form and deflection as obtained by detection method described herein detection With the contrast of glass defect deformation form and deflection obtained by prior art.
The present invention operation principle be:
A kind of detection method of glass defect deflection provided by the invention, by the light reflection principle of special glass, Under the irradiation of the parallel line source in side, the defects of glass place forms strong light pip, meanwhile, the light scattering of special glass Principle, glass surface deformation change the scattering angle for causing light;
The image being projected in by gathering Turbogrid plates 4 on glass sample, and then the picture of glass defect deformation form is obtained, The deflection of the Turbogrid plates as caused by glass defect is measured by self-adhering-type film graduated scale, and then acquires accurate glass The quantized data of glass defect;Measuring accuracy obtained by this method can reach 1/10th of graduated scale minimum scale value.

Claims (10)

  1. A kind of 1. detection means of glass defect deflection, it is characterised in that:Including support system, the first parallel line source (3) With grid imaging system, wherein, glass sample is fixed with support system, the first parallel line source (3) is arranged on support system On, and the side of glass sample is placed in, while be placed in glass sample in same horizontal line, grid imaging system is placed on glass The dead astern of sample, and it is parallel to each other with glass sample.
  2. A kind of 2. detection means of glass defect deflection according to claim 1, it is characterised in that:Support system includes The support bar (2) of base (1) and the L-type structure on base (1), the first parallel line source (3) are arranged on support bar (2) Vertical bar on.
  3. A kind of 3. detection means of glass defect deflection according to claim 2, it is characterised in that:Support bar (2) It is connected with horizon bar to the clamping device of fixed glass sample.
  4. A kind of 4. detection means of glass defect deflection according to claim 2, it is characterised in that:Can on base (1) Detachable is provided with fix bar (6), and the second parallel line source (7) is provided with fix bar (6), and the second parallel line source (7) is put In the opposite side of glass sample.
  5. A kind of 5. detection means of glass defect deflection according to claim 2, it is characterised in that:Support bar (2) Horizon bar and vertical bar are telescopic structure.
  6. A kind of 6. detection means of glass defect deflection according to claim 1, it is characterised in that:Grid imaging system For Turbogrid plates (4), each grid size that the Turbogrid plates (4) are projected out is consistent and is square structure.
  7. 7. a kind of detection method of the detection means based on described in claim any one of 1-6, it is characterised in that including following step Suddenly:
    The first step, glass sample is fixed in support system;
    Second step, the position of glass sample is adjusted, glass sample is abutted the first parallel line source (3);
    3rd step, grid imaging system is placed on to the dead astern of glass sample, and it is parallel to each other with glass sample;
    4th step, the projection of grid imaging system on sight glass sample, while to the glass defect of grid imaging system projection Mug is carried out, obtains the deformation form of glass defect;Grid imaging system is measured by self-adhering-type film graduated scale to project Glass defect deflection;
    5th step, the image obtained by the 4th step and measurement data are preserved.
  8. A kind of 8. detection method of glass defect deflection according to claim 7, it is characterised in that:It is when grid is imaged The glass defect projected on system, which does not reach, takes pictures when requiring, increases by the second parallel line source (7) in support system.
  9. A kind of 9. detection method of glass defect deflection according to claim 7, it is characterised in that:On glass sample Glass defect is placed in the centre position of the first parallel line source (3).
  10. A kind of 10. detection method of glass defect deflection according to claim 7, it is characterised in that:Grid imaging system The distance between system and glass sample are 5cm-50cm.
CN201710947718.5A 2017-10-12 2017-10-12 A kind of detection means and method of glass defect deflection Pending CN107860780A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710947718.5A CN107860780A (en) 2017-10-12 2017-10-12 A kind of detection means and method of glass defect deflection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710947718.5A CN107860780A (en) 2017-10-12 2017-10-12 A kind of detection means and method of glass defect deflection

Publications (1)

Publication Number Publication Date
CN107860780A true CN107860780A (en) 2018-03-30

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Application Number Title Priority Date Filing Date
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Country Status (1)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237216A (en) * 1997-12-17 1999-08-31 Asahi Glass Co Ltd Evaluation method for optical distortion and evaluation device
EP1600764A1 (en) * 2004-05-27 2005-11-30 Krieg, Gunther, Prof.Dr.Ing. Method and device for inspecting transparent objects
CN1720444A (en) * 2002-12-27 2006-01-11 日本板硝子株式会社 Device and method for evaluating optical distortion of transparent plate body
EP1821110A2 (en) * 2006-02-17 2007-08-22 Commissariat A L'energie Atomique Contactless device for testing electrical connections
CN101660967A (en) * 2008-08-29 2010-03-03 信义汽车玻璃(深圳)有限公司 Glass optical distortion detection board and system, and detection method
CN103454287A (en) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 Glass tube defect visual detection method and device
CN105259189A (en) * 2015-10-21 2016-01-20 凌云光技术集团有限责任公司 Glass defect imaging system and method

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11237216A (en) * 1997-12-17 1999-08-31 Asahi Glass Co Ltd Evaluation method for optical distortion and evaluation device
CN1720444A (en) * 2002-12-27 2006-01-11 日本板硝子株式会社 Device and method for evaluating optical distortion of transparent plate body
EP1600764A1 (en) * 2004-05-27 2005-11-30 Krieg, Gunther, Prof.Dr.Ing. Method and device for inspecting transparent objects
EP1821110A2 (en) * 2006-02-17 2007-08-22 Commissariat A L'energie Atomique Contactless device for testing electrical connections
CN101660967A (en) * 2008-08-29 2010-03-03 信义汽车玻璃(深圳)有限公司 Glass optical distortion detection board and system, and detection method
CN103454287A (en) * 2013-09-05 2013-12-18 深圳市维图视技术有限公司 Glass tube defect visual detection method and device
CN105259189A (en) * 2015-10-21 2016-01-20 凌云光技术集团有限责任公司 Glass defect imaging system and method

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Application publication date: 20180330