CN107850610A - A kind of test sample application method, device and sample analyser - Google Patents

A kind of test sample application method, device and sample analyser Download PDF

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Publication number
CN107850610A
CN107850610A CN201580081797.5A CN201580081797A CN107850610A CN 107850610 A CN107850610 A CN 107850610A CN 201580081797 A CN201580081797 A CN 201580081797A CN 107850610 A CN107850610 A CN 107850610A
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China
Prior art keywords
sample
user
bit
load carrier
graphics field
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CN201580081797.5A
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CN107850610B (en
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王起阳
王强
李俊
陈永茂
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Shenzhen Mindray Bio Medical Electronics Co Ltd
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Shenzhen Mindray Bio Medical Electronics Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations

Abstract

A kind of test sample application method, device and sample analyser, the sample analyser shows the signal figure (303) of sample load carrier (21) on sample position displaying interface, illustrates the sample bit pattern (304) on figure (303) to be corresponded with the sample bit on sample load carrier (21);Detect click information of the user on the signal figure (303) of sample load carrier (21), sample bit pattern (304) region that the sample number and user inputted when capturing user in the clicking operation in any one sample bit pattern (304) region based on user on sample position displaying interface is clicked on is allocated to placement location of the sample on sample load carrier (21), and sample number is included in corresponding sample bit pattern (304) region.By introducing an exercisable signal figure (303), user can carry out position distribution by the sample bit pattern (304) to the sample to be tested of input numbering, sample application is completed by graphical operation, makes sample application process directly perceived, simple, convenient and efficient.

Description

A kind of test sample application method, device and sample analyser
A kind of test sample application method, device and sample analyser technical field
[0001] the present invention relates to a kind of sample analysers, and in particular to the test application method and device of the sample analyser.
[0002]
[0003] background technique
[0004] full-automatic sample analyser is for analyzing the sample from tested body, its high degree of automation, test speed is fast, inspection activity generally requires user and first carries out test sample application, i.e. user numbers in sample application interface input sample, then the test item of the selection sample is required according to test sample, and inputs the physical location that the sample is placed on sample load carrier (such as sample disk or sample rack).
[0005] user is applied based on the input edit box at sample application interface in this processing mode, is needed user to repeat the above steps each sample and is carried out test application.
[0006]
[0007] summary of the invention
[0008] according in a first aspect, providing a kind of test sample application method in a kind of embodiment, comprising:
[0009] sample number of the sample to be tested of user's input is received on sample application interface;
[0010] the signal figure that sample load carrier is shown on sample position displaying interface, illustrates the sample bit pattern on figure and the sample bit on sample load carrier to correspond;
[0011] click information of the detection user on the signal figure of sample load carrier, when capturing user in the clicking operation inch location assignment step of any one sample bit graphics field, the position allocation step includes: to receive user to show the sample number inputted on interface in sample position, the sample bit graphics field that sample number and user based on user's input are clicked is allocated placement location of the sample on sample load carrier, and sample number is shown in corresponding sample bit graphics field.
[0012] according to second aspect, a kind of test sample application device is provided in a kind of embodiment, comprising:
[0013] sample application unit, the sample number of the sample to be tested for receiving user's input on sample application interface
[0014] pattern displaying unit, for showing the signal figure for showing sample load carrier on interface in sample position, The sample bit pattern on figure and the sample bit on sample load carrier is illustrated to correspond;
[0015] position allocation unit, for detecting click information of the user on the signal figure of sample load carrier, when capturing user in the clicking operation inch location assignment of any one sample bit graphics field, it include: to receive user to show the sample number inputted on interface in sample position, the sample bit graphics field clicked based on sample number and user is allocated placement location of the sample on sample load carrier, and sample number is shown in corresponding sample bit graphics field.
[0016] another test sample application device includes:
[0017] sample application unit, the sample number of the sample to be tested for receiving user's input on sample application interface
[0018] pattern displaying unit illustrates the sample bit pattern on figure and the sample bit on sample load carrier to correspond for showing the signal figure for showing sample load carrier on interface in sample position;
[0019] position allocation unit for distributing the sample of input number to placement location on sample load carrier automatically according to pre-defined rule, and shows its number in the corresponding sample bit graphics field of each sample placement location.
[0020] according to the third aspect, a kind of sample analyser is provided in a kind of embodiment, including above-mentioned test sample application device.
[0021] according to the test sample application method, device and sample analyser of above-described embodiment, due to user can with operated in the one-to-one sample bit pattern of sample bit on sample load carrier, position distribution is carried out to the sample to be tested of input being numbered, sample application is completed by graphical operation, it is intuitive, simple, convenient and efficient.
[0022]
[0023] Detailed description of the invention
[0024] Fig. 1 is a kind of a kind of-structural representation of the sample analyser of embodiment;
[0025] Fig. 2 be-a kind of sample introduction module of embodiment and inhale the structural schematic diagram of egf block;
[0026] Fig. 3 is a kind of-structural schematic diagram of the control module of embodiment;
[0027] Fig. 4 is a kind of-flow chart of the test sample application method of embodiment;
[0028] Fig. 5 is a kind of-schematic diagram at the sample application interface of embodiment;
[0029] Fig. 6 is a kind of a kind of-schematic diagram of the sample rack figure of embodiment;
[0030] Fig. 7 is a kind of a kind of-schematic diagram of dialog box of embodiment; [0031] Fig. 8 is a kind of schematic diagram of several sample bit patterns for distributing single sample position inch of embodiment;
[0032] Fig. 9 is a kind of a kind of flow chart for distributing continuous sample position of embodiment;
[0033] Figure 10 is a kind of schematic diagram of the first the sample bit pattern for distributing continuous sample position inch of embodiment;[0034] Figure 11 is a kind of schematic diagram of second of sample bit pattern for distributing continuous sample position inch of embodiment;[0035] Figure 12 is a kind of schematic diagram of the third sample bit pattern for distributing continuous sample position inch of embodiment;[0036] Figure 13 is a kind of a kind of schematic diagram of the sample bit pattern for distributing common sample, calibration sample and Quality Control sample position inch of embodiment;
[0037] Figure 14 is a kind of another schematic diagram of the sample rack figure of embodiment;
[0038] Figure 15 is a kind of schematic diagram of the sample bit pattern that common sample is placed on calibration sample position of embodiment.
[0039]
[0040] specific embodiment
[0041] sample analyser usually works according to following procedure: application test, sample introduction inhale sample, inhale reagent, reaction, are handled again for different analysis projects after reaction.Please refer to Fig. 1, sample analyser includes human-computer interaction device 10, sample introduction module 20, inhales egf block 30, reagent load carrier 40, reaction module 50, analysis module 60 and control module 70, and control module 70 is electrically connected with human-computer interaction device 10, sample introduction module 20, suction egf block 30, reagent load carrier 40, reaction module 50 and analysis module 60 respectively.
[0042] human-computer interaction device 10 provides input/output interface and input equipment for user, receives the information of user's input, and the state parameter of sample analyser is shown to user.In one specific example, human-computer interaction device 10 includes display, keyboard and mouse, and in another specific example, human-computer interaction device 10 can also be the display with touch screen.In the present embodiment, user passes through 10 input sample information of human-computer interaction device, the placement location of the test item of sample and sample on sample load carrier.
[0043] sample introduction module 20 includes sample load carrier 21 and transport establishment 22, sample load carrier 21 is equipped with multiple sample bits, the sample container that sample to be tested is housed can be placed on each sample bit, in a particular embodiment, sample load carrier 21 can be sample rack, it is also possible to sample disk, by its corresponding transport establishment 22, sample is transported to predetermined position.As shown in Fig. 2, sample load carrier is sample rack 21a, and sample analyser includes multiple storage channels 80 arranged side by side, and Jian is isolated between adjacent storage channels, is independent of each other in the present embodiment.Each storage channels can place a sample rack 21a, have multiple test tube positions on each sample rack, can carry multiple test tube 21b, test tube 21b is for containing sample.When the sample on sample rack needs to analyze inch, The sample rack can be placed in some storage channels by user, and when analysis inch is completed in the sample on sample rack, user can take sample rack away from storage channels.A side region of storage channels 80 is arranged in transport establishment 22, such as than storage channels further from the region of user, transport establishment 22 is transported to the executable position for inhaling sample operation for taking out the sample rack where needing sample to be tested from storage channels 80, and by the sample rack
[0044] it inhales egf block 30 and generally includes suction needle 31 and movement mechanism 32, as shown in Fig. 2, suction needle 31 is mounted on movement mechanism 32, and under the drive of movement mechanism 32, in reaction cup position and suction sample position, inhales and moved between reagent position.When need to carry out certain sample inhale sample inch, placement location control suction needle 31 of the sample that control module 70 is inputted according to user on sample rack navigates to above the sample position, and the sample is executed and inhales sample operation, after having executed suction sample operation, control module 70 controls suction needle 31 again and is moved to reaction cup position, and sample is injected in reaction cup.
[0045] reagent load carrier 40 is used to place the reagent for participating in test sample, in a particular embodiment, reagent load carrier 40 can be reagent disc, control module 70 is according to the placement location of reagent, reagent disc is controlled by agent delivery to scheduled suction reagent position, the suction reagent position is navigated to inch control suction needle 31, the reagent is executed and inhales reagent operation, after having executed suction reagent operation, control module 70 controls suction needle 31 again and is moved to reaction cup position, and reagent is injected in reaction cup.
[0046] reaction module 50, which is used to provide for the reaction cup of injecting sample and reagent, is incubated for place, makes mixed sample and reagent by the incubation reaction between predetermined inch.
[0047] analysis module 60 is for analyzing the sample after incubation.
[0048] control module 70 is also used for receiving each data module acquisition or generated, handle data for controlling each module.In the present embodiment, control module 70 includes test sample application device, as shown in figure 3, test sample application device includes sample application unit 71, pattern displaying unit 72 and position allocation unit 74.Sample application unit 71 is for receiving the sample number for the sample to be tested that user inputs on sample application interface and the test item of the sample;Pattern displaying unit 72 is used to show the signal figure of sample load carrier on sample position displaying interface, and the sample bit on the sample load carrier of the sample bit pattern and physics on figure is illustrated to correspond;Position allocation unit 74 is used to detect click information of the user on the signal figure of sample load carrier, when capturing user in the clicking operation inch location assignment of any one sample bit graphics field, it include: to receive user's input sample number, the sample bit graph area clicked based on sample number and user Domain is allocated placement location of the sample on physical samples load carrier, and sample number is shown and shows corresponding sample bit graphics field on interface in sample position.In one embodiment, position allocation unit 74 includes pop-up unit 73, pop-up unit 73 is used to detect click information of the user on the signal figure of sample load carrier, dialog box is popped up when capturing clicking operation inch of the user in some sample bit graphics field, sample number dialog box is included at least in dialog box, sample number dialog box can be editable space state, can also have existed content, but the content is allowed to be updated.
[0049] it is based on apparatus above, below by taking sample load carrier is sample rack as an example, the test sample application process of the present embodiment is illustrated, as shown in Figure 4, comprising the following steps:
[0050] step 200, input sample number and test item.User enters sample application interface by human-computer interaction device 10, as shown in Figure 5, sample application interface includes sample number dialog box 301 and several test item options 3 02, user input sample can number in sample number dialog box 301, then some test item option 302 is clicked, the sample number of sample to be tested and the test item of the sample are received to input sample to be tested number and test item, sample application unit 71.
[0051] step 210 shows sample rack figure.The signal figure that sample load carrier is shown on interface is shown in sample position, sample position shows that interface can be shown with sample application interface with inch, such as one is located at the display interface left side, another is located at the right of display interface;Sample position shows that interface and sample application interface can also be shown by way of tabs, and when user selects the first tabs inch, display sample position shows interface, when user's the second tabs inch of selection, shows sample application interface;Sample position shows that the instruction for carrying out position distribution to sample that user's input is also based on interface is shown, and the signal figure of sample load carrier is shown on its interface, the instruction for carrying out position distribution is begun to instruct as a Jian, can be one on display interface can handle icon, the option being also possible on drop-down menu.As shown in Figure 6, multiple sample bit patterns 304 have been drawn on signal figure 303, sample bit in sample bit pattern 304 and physical samples frame corresponds, for placing the embodiment of sample rack using storage channels, the quantity of sample load carrier signal figure and the quantity of storage channels are also consistent, so that signal figure is also corresponded with storage channels in kind, and the number of storage channels is shown below signal figure.In one preferably embodiment, a preferential storage channels 80 are arranged in sample introduction module 20, sample in the sample container on sample rack 21a being placed in preferential storage channels 80 can be analyzed instrument compared with the sample of other storage channels and preferentially detect, there are also label " (E) " inch behind the number of signal figure lower section display storage channels, show the storage channels of this number for preferential storage channels , in the present embodiment, the 6th storage channels are preferential storage channels.In one preferably embodiment, the storage channels whether sample rack is put into sample analyser are detected by a detection unit (such as sensor), detect in storage channels whether be put into sample rack, signal figure to the sample rack for having been placed in storage channels and the signal figure of sample rack for not being put into storage channels make different labels by a marking unit, as shown in Figure 6, the signal figure for being put into the sample rack of storage channels is indicated by the solid line, and the signal figure for not being put into the sample rack of storage channels is represented by dashed line.
[0052] step 220, the sample bit of detection user's selection.Pop-up unit 73 detects click information of the user on the signal figure of sample load carrier, in one specific embodiment, user can be captured in the clicking operation of sample bit graphics field by being preset in the focus of sample bit graphics field, when capturing user in the clicking operation inch of some sample bit graphics field, think that user selects physical samples position corresponding to the sample bit graphics field to place sample, dialog box is popped up immediately, the schematic diagram of dialog box is as shown in Figure 7, it include sample number dialog box 306 and setting quantity options in dialog box 305, sample number dialog box 306 is for inputting number, in the present embodiment, it includes setting single sample option 307 and setting continuous sample option 308 that quantity options, which are arranged,.In other embodiments, setting quantity options can also be shown by way of drop-down menu.
[0053] step 230, the sample number of input distribution position.Position allocation unit 74 receives the sample number that user inputs in sample number dialog box 306.If being blank in the sample number dialog box 306 popped up in step 220 without distributing sample on the sample bit of user's selection;If having had distribution sample on the sample bit of user's selection, it can be blank in the sample number dialog box 306 popped up in step 220, the number of the allocated sample can also be shown as.When sample number dialog box 306 is blank inch, user inputs expectation in the number of the sample of the sample bit allocation at cursor after can clicking directly on, when showing other sample number inch in sample number dialog box 306, user inputs expectation in the number of the sample of the sample bit allocation after can deleting existing sample number, or will it is expected directly to cover existing sample number in the number of the sample of the sample bit allocation
[0054] step 240 inputs the sample size of position to be allocated.Position allocation unit 74 receives the setting quantity options of user's selection, when user's selection setting single sample inch, executes step 250, when user selects that multiple continuous sample inch, execution step 260 is arranged.
[0055] step 250 distributes position to single sample.The placement location of the sample of input number is assigned to the sample bit captured on sample rack corresponding to the sample bit graphics field of user's clicking operation by position allocation unit 74, Then only by input number display in the sample bit graphics field for capturing user's clicking operation.Such as, as shown in Fig. 8 (a), user selects No. 4 sample bits on the sample rack of No. 1 storage channels, and No. 1 sample is inputted in sample number dialog box 306, then after user selects setting single sample, the placement location of No. 1 sample is set No. 4 sample bits on No. 1 sample rack by position allocation unit 74, then shows " 1 " on the schematic diagram of No. 4 sample bits on No. 1 sample rack.Later in inhaling sample step, control module 70 is controlled above No. 4 sample bits where suction needle 31 navigates to the sample, and is executed to the sample and inhaled sample operation.In one preferably embodiment, the a certain sample bit graphics field of user's clicking operation, then the sample of a certain number is inputted in the sample number dialog box 306 of pop-up, and after selecting setting single sample, position allocation unit 74 can show the number that user inputs in the sample bit graphics field that user clicks, when the sample inch bigger by 1 than the number that user inputs in above-mentioned sample number dialog box 306 there is also a number, position allocation unit 74 can also show big 1 number in the latter sample bit graphics field for the sample bit graphics field that user clicks, this the latter sample bit graphics field inch is operated when user again taps on, number on the latter sample bit graphics field can be deleted.Such as, as shown in Fig. 8 (b), user selects No. 4 sample bits on No. 1 sample rack, and No. 1 sample is inputted in sample number dialog box 3 06, then when user selects setting single sample, and after inputting the instruction of distribution position, position allocation unit 74 sets the position of No. 1 sample to No. 4 sample bits on No. 1 sample rack, and " 1 " is shown on the schematic diagram of No. 4 sample bits of No. 1 sample rack, when there is also No. 2 sample inch (such as in the sample number dialog box 301 in step 200 previous input No. 2 samples and selected its test item), position allocation unit 74 can also set the position of No. 2 samples to No. 5 sample bits on No. 1 sample rack, and " 2 " are shown on the schematic diagram of No. 5 sample bits on No. 1 sample rack, when user continues the graphics field inch of No. 5 sample bits on No. 1 sample rack of click, the current location (No. 5 sample bits on No. 1 sample rack) of No. 2 samples can be deleted, " 2 " shown on the schematic diagram of No. 5 sample bits on No. 1 sample rack can be also deleted, and final display is as shown in Fig. 8 (a).
[0056] step 260 distributes position to continuous sample.Specific allocation step is as shown in Figure 9, comprising the following steps:
[0057] step 261, for the sample number that user is inputted in sample number dialog box as Base Serial Number, the sample bit graphics field that will be captured user's clicking operation is initial position.
The placement location of the sample of Base Serial Number is assigned to the sample bit on sample load carrier corresponding to initial position, and Base Serial Number is shown in the sample bit graphics field of initial position by [0058] step 262.
The sample of the later serial number of Base Serial Number is sequentially assigned on the continuous position after the position that Base Serial Number sample is distributed by [0059] step 263, and the later serial number of Base Serial Number shown it is right in distribution position institute The sample bit graphics field answered.Such as, as shown in Figure 10, user selects No. 1 sample bit on the sample rack (i.e. No. 1 sample rack) of No. 1 storage channels, and No. 1 sample is inputted in sample number dialog box 306, then when user selects setting continuous sample, and after inputting the instruction of distribution position, position allocation unit 74 regard the number " 1 " of No. 1 sample as Base Serial Number, using No. 1 sample bit on No. 1 sample rack as initial position.The position of No. 1 sample is set No. 1 sample bit on No. 1 sample rack by position allocation unit 74, then display ' the Τ ' on the schematic diagram of No. 1 sample bit on No. 1 sample rack;The sample of the later serial number of above-mentioned Base Serial Number " 1 " is sequentially assigned on the continuous position after the position (i.e. No. 1 sample bit on No. 1 sample rack) that Base Serial Number sample (i.e. No. 1 sample) is distributed, and the later serial number of Base Serial Number " 1 " is shown in sample bit graphics field corresponding to distribution position, in the present embodiment, there are also the samples of serial number 2-15 for the later sample of Base Serial Number " 1 ", therefore the sample of serial number 2-15 is sequentially assigned onto the continuous position after No. 1 sample bit on No. 1 sample rack.In view of the number habit of user, in one preferably embodiment, position allocation unit 74 carries out position in the sample to serial number and distributes inch, from small to large according to sample number, position is from top to bottom, the placement location of rule distribution sample from left to right, so the continuous position after No. 1 sample bit on No. 1 sample rack is the 1-5 sample bit of the 2-10 sample bit of No. 1 sample rack and No. 2 sample racks in Figure 10, the later serial number 2-15 of Base Serial Number " 1 " is respectively displayed in the 2-10 sample bit of No. 1 sample rack and the 1-5 sample bit graphics field of No. 2 sample racks.
[0060] in the above-described embodiments, the sample number and test item of sample to be tested in step 200 input on sample application interface with inch, in the embodiment having, Jian can be divided to input sample number and test item, such as the sample number of sample to be tested is first inputted on sample application interface, input the test item of the sample again for the sample for needing to distribute placement location during location assignment step, for example, can in sample number dialog box input sample number and test item.Moreover, above-described embodiment is only for illustration, not limiting step 200-surely will be before step 210, in other embodiments, and step 200 can also be after step 210 or step 220.
[0061] it should be understood by those skilled in the art that, in other embodiments, position inch is being distributed to continuous sample, user also can specify the arbitrary sample bit shown as initial position, can also be using arbitrary sample number as Base Serial Number, such as will number on the continuous position after the sample for being 13 is assigned to No. 4 sample bits on No. 3 sample racks as continuous 5 samples of Base Serial Number.
[0062] user carries out position in the sample to serial number and distributes inch, can also according to actual needs, by a long section The sample of serial number is divided into the sample of several shorter serial numbers, and the sample of every section shorter of serial number may be disposed on the position of user's selection.In one specific embodiment, user can reach this purpose by repeatedly carrying out step 263.Please refer to Figure 10, after having applied for 1-15 sample and corresponding test item in step 200, in step 263, user selects No. 1 sample bit on No. 1 sample rack, and No. 1 sample is inputted in sample number dialog box 30 6, then when user's selection setting continuous sample inch, the 1-5 sample bit on 1-10 sample bit and No. 2 sample racks that 1-15 sample can be sequentially assigned on No. 1 sample rack by position allocation unit 74;Please refer to Figure 11, No. 1 sample bit on No. 3 sample racks of user's reselection, and No. 6 samples are inputted in sample number dialog box 306, then when user selects setting continuous sample, 6-15 sample can be sequentially assigned on the 1-10 sample bit on No. 3 sample racks by position allocation unit 74;Please refer to Figure 12, No. 1 sample bit on No. 2 sample racks of user's reselection, and No. 11 samples are inputted in sample number dialog box 306, then when user selects setting continuous sample, 11-15 sample can be sequentially assigned on the 1-5 sample bit on No. 2 sample racks by position allocation unit 74.In another embodiment, when user selects setting continuous sample inch, it will pop up a dialog box, for inputting the quantity for the continuous sample that user to be arranged, please refer to Figure 12, user selects No. 1 sample bit on No. 1 sample rack, and No. 1 sample is inputted in sample number dialog box 306, when user select setting continuous sample and quantity be 5 inch, the position of 1-5 sample is sequentially respectively set to 1-No. 5 sample bit on No. 1 sample rack by position allocation unit 74, and number 1-5 is shown respectively in the 1-5 sample bit graphics field on No. 1 sample rack;User selects No. 1 sample bit on No. 3 sample racks, and No. 6 samples are inputted in sample number dialog box 306, when user select setting continuous sample and quantity be 5 inch, the position of 6-10 sample is sequentially respectively set to the 1-5 sample bit on No. 3 sample racks by position allocation unit 74, and shows number 6-10 respectively in the 1-5 sample bit graphics field on No. 3 sample racks;User selects No. 1 sample bit on No. 2 sample racks, and No. 11 samples are inputted in sample number dialog box 306, when user select setting continuous sample and quantity be 5 inch, the position of 11-15 sample is sequentially respectively set to the 1-5 sample bit on No. 2 sample racks by position allocation unit 74, and shows number 11-15 respectively in the 1-5 sample bit graphics field on No. 2 sample racks.
In one preferably embodiment, sample application interface includes common sample application interface, calibration sample application interface and Quality Control sample application interface, common sample application interface, calibration sample application interface and Quality Control sample application interface all include sample number dialog box 301 and several test item options 302, in one embodiment, the sample number dialog box 301 at common sample application interface is for inputting number (such as 1, 2, 3 etc.), sample number dialog box 301 in calibration sample application interface is for inputting " S+ number " (such as Sl, S2 etc.), it will The number of " S+ number " as calibration sample, the sample number dialog box 301 at Quality Control sample application interface, will the number of " C+ number " as Quality Control sample for inputting " C+ number " (such as Cl, C2).
In order to facilitate user to common sample, calibration sample and Quality Control sample are distinguished and are looked for Check, in one preferably embodiment, test sample application device also passes through marking unit to the common sample of placement, make different labels in sample bit graphics field corresponding to the sample bit of calibration sample and Quality Control sample, in one embodiment, to display background color and digital number in sample bit graphics field corresponding to the sample bit for placing common sample, yellow and " C+ digital number " are shown in sample bit graphics field corresponding to sample bit to placement Quality Control sample, it is displayed in blue in sample bit graphics field corresponding to sample bit to placement calibration sample and " S+ digital number ", such as, as shown in figure 13, when user selects No. 1 sample on No. 4 sample racks Position, and input number " S1 " and selected 308 inch of continuous sample in the sample number dialog box 306 as shown in Fig. 7 of pop-up, the position of 1-3 calibration sample is sequentially respectively set to the 1-3 sample bit on No. 4 sample racks by position allocation unit 74, and is displayed in blue and shows respectively S1-S3 in the 1-3 sample bit graphics field on No. 4 sample racks;Similarly, when user selects No. 4 sample bits on No. 4 sample racks, and input number " C1 " and selected 308 inch of continuous sample in the sample number dialog box 306 of pop-up, the position of 1-2 Quality Control sample is sequentially respectively set to the 4-5 sample bit on No. 4 sample racks by position allocation unit 74, and yellow is shown in the 4-5 sample bit graphics field on No. 4 sample racks and shows C1-C2 respectively, wherein user has input calibration sample Sl-S3 in step 200, corresponding test item is selected, and have input Quality Control sample Cl-C2, corresponding test item is selected.In view of the habit of user, calibration sample position can be set by some sample bits on the sample rack kept right, some sample bits are set as Quality Control sample bit, as shown in figure 14, in the present embodiment, the 1-3 sample bit on No. 4 sample racks can be set to calibration sample position, 4-5 sample bit is set as Quality Control sample bit, and calibration sample and Quality Control sample can only be stored on the sample bit on corresponding sample rack.In the case where common sample bit is inadequate, calibration sample position and Quality Control sample bit can also be taken over for use, such as, when user selects No. 1 sample bit on No. 4 sample racks, and after inputting number " 1 " and selection single sample 307 in the sample number dialog box of pop-up, it will appear a bullet frame, it is calibration sample position for warning this calibration sample position (No. 1 sample bit on No. 4 sample racks) of user, inquire about whether user uses using this calibration sample position as common sample bit, it selects to use inch using this calibration sample position as common sample bit when user plays to click on frame herein, No. 1 sample is assigned to this calibration sample position by position allocation unit 74, and cancel the number of display background color and user's input on the signal figure of this calibration sample position " 1 ", as shown in figure 15. [0065] in order to make user carry out sample application inch operation it is more simple and convenient, in step 200, after sample application unit 71 receives the sample number and the test item of the sample of sample to be tested, position allocation unit 74 distributes the sample of input number to placement location on sample load carrier 21 automatically according to pre-defined rule, and its number is shown in the corresponding sample bit graphics field of each sample placement location, after receiving the sample number of sample bit graphics field and input that user selects on sample position displaying interface, update the placement location of the sample and the sample bit graphics field of display.
[0066]
[0067] it will be appreciated by those skilled in the art that, the all or part of the steps of various methods can instruct related hardware to complete by program in above embodiment, the program can be stored in a computer readable storage medium, and storage medium may include: read-only memory, random access memory, disk or CD etc..
[0068] use above specific case is illustrated the present invention, is merely used to help understand the present invention, is not intended to limit the invention.For those of ordinary skill in the art, according to the thought of the present invention, above-mentioned specific embodiment can be changed.
Technical problem
Solution to the problem
Advantageous effect of the invention

Claims (13)

  1. Claims
    [claim 1] a kind of test sample application method, it is characterised in that include:
    The sample number of the sample to be tested of user's input is received on sample application interface;The signal figure for showing sample load carrier on interface is shown in sample position, and the sample bit pattern on figure and the sample bit on sample load carrier is illustrated to correspond;
    Detect click information of the user on the signal figure of sample load carrier, when capturing user in the clicking operation inch location assignment step of any one sample bit graphics field, the position allocation step includes: to receive user to show the sample number inputted on interface in sample position, the sample bit graphics field that sample number and user based on user's input are clicked is allocated placement location of the sample on sample load carrier, and sample number is shown in corresponding sample bit graphics field.
    [claim 2] the method as described in claim 1, which is characterized in that distribute inch when user carries out position to single sample, the position allocation step includes:
    The placement location of the sample of input number is assigned to the sample bit captured on sample load carrier corresponding to the sample bit graphics field of user's clicking operation;
    By input number display in the sample bit graphics field for capturing user's clicking operation.
    [claim 3] the method as described in claim 1, which is characterized in that distribute inch when sample of the user to serial number carries out position, the position allocation step includes:
    Using the sample number of user's input as Base Serial Number, the sample bit graphics field that will be captured user's clicking operation is initial position;
    The placement location of the sample of Base Serial Number is assigned to the sample bit on sample load carrier corresponding to initial position, and Base Serial Number is shown in initial position;
    The sample of the later serial number of Base Serial Number is sequentially assigned on the continuous position after the position that Base Serial Number sample is distributed, and the later serial number of Base Serial Number is shown into the sample bit graphics field corresponding to distribution position.
    [claim 4] the method as described in claim 1, which is characterized in that the instruction for carrying out position distribution to sample based on user's input shows the signal figure that sample load carrier is shown on interface in sample position. [claim 5] the method as described in claim 1, it is characterized in that, the sample load carrier includes the sample rack with multiple sample bits, the method also includes the storage channels whether detection sample load carrier is put into sample analyser, show in sample position and make different labels to the signal figure of the signal figure for the sample rack for having been placed in storage channels and the sample rack for not being put into storage channels on interface.
    [claim 6] the method as described in claim 1, it is characterised in that further include that different labels is made to sample bit graphics field corresponding to the sample bit for placing common sample, calibration sample and Quality Control sample.
    [claim 7] such as method of any of claims 1-6, it is characterized in that, receiving user's input sample number includes: to work as to capture user in the clicking operation inch pop-up dialog box of any one sample bit graphics field, sample number dialog box is included at least in the dialog box, receives the sample number that user inputs in sample number dialog box;Or receiving user's input sample number includes: to work as the clicking operation inch for capturing user in any one sample bit graphics field the sample bit graphics field is become edit box, receives the sample number that user inputs in edit box.
    [claim 8] such as method of any of claims 1-7, it is characterized in that, after sample position shows and shows the signal figure of sample load carrier on interface and before location assignment step, it is not shown in sample bit pattern on the signal figure and is shown as the sample number that pre-defined rule distributes automatically in the sample bit pattern on any sample number or the signal figure.
    [claim 9] a kind of test sample application device, it is characterised in that include:
    Sample application unit, the sample number of the sample to be tested for receiving user's input on sample application interface;
    Pattern displaying unit illustrates the sample bit pattern on figure and the sample bit on sample load carrier to correspond for showing the signal figure for showing sample load carrier on interface in sample position;
    Position allocation unit, for detecting click information of the user on the signal figure of sample load carrier, when capturing user in the clicking operation inch location assignment of any one sample bit graphics field, it include: to receive user to show the sample number inputted on interface in sample position, the sample bit graphics field clicked based on sample number and user is allocated placement location of the sample on sample load carrier, and sample number is shown in corresponding sample bit graphics field. Device as claimed in claim 9, which is characterized in that distribute inch when user carries out position to single sample, the position allocation unit is used for:
    The placement location of the sample of input number is assigned to the sample bit captured on sample load carrier corresponding to the sample bit graphics field of user's clicking operation;
    And only by input number display in the sample bit graphics field for capturing user's clicking operation.Device as claimed in claim 9, which is characterized in that distribute inch when sample of the user to serial number carries out position, the position allocation unit is used for:
    Using the sample number of user's input as Base Serial Number, the sample bit graphics field that will be captured user's clicking operation is initial position;
    The placement location of the sample of Base Serial Number is assigned to the sample bit on sample load carrier corresponding to initial position, and Base Serial Number is shown in initial position;
    The sample of the later serial number of Base Serial Number is sequentially assigned on the continuous position after the position that Base Serial Number sample is distributed, and the later serial number of Base Serial Number is shown into the sample bit graphics field corresponding to distribution position.
    Device as claimed in claim 11, it is characterized in that, the sample load carrier includes the sample rack with multiple sample bits, to serial number sample carry out position distribute inch, according to sample number from small to large, position from top to bottom, from left to right rule distribution sample placement location.
    Device as claimed in claim 12, characterized by further comprising detection units and marking unit, detection unit is for detecting the storage channels whether sample rack is put into sample analyser, marking unit is used for the testing result according to detection unit, shows in sample position and makees different labels to the signal figure of the signal figure for the sample rack for having been placed in storage channels and the sample rack for not being put into storage channels on interface.
    Device as claimed in claim 12, which is characterized in that marking unit is also used to make different labels to sample bit graphics field corresponding to the sample bit for placing common sample, calibration sample and Quality Control sample.
    Device as described in any one of claim 9-14, which is characterized in that it includes: to work as to capture user in any one sample bit graph area that position allocation unit, which receives user's input sample number, The clicking operation inch in domain pops up dialog box, includes at least sample number dialog box in the dialog box, receives the sample number that user inputs in sample number dialog box;Or it includes: to work as the clicking operation inch for capturing user in any one sample bit graphics field the sample bit graphics field is become edit box that position allocation unit, which receives user's input sample number, receives the sample number that user inputs in edit box.
    The device of [claim 16] as described in any one of claim 9-15, it is characterized in that, after pattern displaying unit shows the signal figure for showing sample load carrier on interface in sample position and before position allocation unit location assignment step, it is not shown in sample bit pattern on the signal figure and is shown as the sample number that pre-defined rule distributes automatically in the sample bit pattern on any sample number or the signal figure.
    [claim 17]-kind of test sample application device, it is characterised in that include:
    Sample application unit, the sample number of the sample to be tested for receiving user's input on sample application interface;
    Pattern displaying unit illustrates the sample bit pattern on figure and the sample bit on sample load carrier to correspond for showing the signal figure for showing sample load carrier on interface in sample position;
    Position allocation unit for distributing the sample of input number to placement location on sample load carrier automatically according to pre-defined rule, and shows its number in the corresponding sample bit graphics field of each sample placement location.
    [claim 18]-kind of sample analyser, it is characterised in that including test sample application device as described in any one of claim 9 to 17.
CN201580081797.5A 2015-10-16 2015-10-16 Sample test application method and device and sample analyzer Active CN107850610B (en)

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