CN107843830A - Heat-radiating properties measuring method for electronic chip - Google Patents
Heat-radiating properties measuring method for electronic chip Download PDFInfo
- Publication number
- CN107843830A CN107843830A CN201711022952.3A CN201711022952A CN107843830A CN 107843830 A CN107843830 A CN 107843830A CN 201711022952 A CN201711022952 A CN 201711022952A CN 107843830 A CN107843830 A CN 107843830A
- Authority
- CN
- China
- Prior art keywords
- checked
- minutes
- measurement equipment
- detection
- heat
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2877—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to cooling
Landscapes
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
The invention discloses the heat-radiating properties measuring method for electronic chip, including detection means, the detection means comprises the following steps：Step 1：Measurement equipment to be checked is provided, is placed in detection platform；Step 2：It is powered 30 minutes at high operating temperatures, detects the temperature linearity change slope K 1 of measurement equipment to be checked in 30 minutes；Step 3：Treat that the measurement equipment to be checked in step 2 is cooled to normal temperature state, be once again powered up 30 minutes, detect the temperature linearity change slope K 2 of measurement equipment to be checked in 30 minutes；Step 4：By K1, K2 is unqualified compared with threshold range H, beyond H range flags, is qualified without departing from H range flags.The threshold range H is specifically set according to the size species of actual device under test.The detection platform bottom sets hygrosensor and controller, and the temperature of the hygrosensor detection detection platform is simultaneously sent to controller, and controller receives temperature information and judged according to default threshold range H.
Description
Technical field
The present invention relates to a kind of detection means, and in particular to the heat-radiating properties measuring method for electronic chip.
Background technology
With the development of network technology, network is widely used every field, but to the status information of network
Obtaining the microcomputer state for being also only limitted to communicate with one another in network at present can not be to the real-time status, performance and running environment of network
Effectively obtained etc. information, network safeguards the also passive networking state for depending on microcomputer in network, present calculating
Machine network monitoring apparatus, structure is complex, bulky, and radiating effect is poor, the particularly network monitor when specifically used
During the high-power operation of device, substantial amounts of heat can be produced, if radiating not in time, it will it is slow network monitor device operation occur
Slowly, the phenomenon that network monitor device will be caused to burn out when serious.Electrical lighting equipment is same, radiates not in time or does not reach
Rotating savings burns out illuminating device, so we need to do a qualified detection to the radiating state of component equipment when dispatching from the factory.
The content of the invention
The technical problems to be solved by the invention are to do a qualified inspection to the radiating state of component equipment when dispatching from the factory
The heat-radiating properties measuring method, and it is an object of the present invention to provide for electronic chip is surveyed, radiating when solving to dispatch from the factory to component equipment
State does the problem of qualified detection.
The present invention is achieved through the following technical solutions：
For the heat-radiating properties measuring method of electronic chip, including detection means, the detection means includes following step
Suddenly：Step 1：Measurement equipment to be checked is provided, is placed in detection platform；Step 2：It is powered 30 minutes at high operating temperatures, detects 30 points
The temperature linearity change slope K 1 of measurement equipment to be checked in clock；Step 3：Treat that the measurement equipment to be checked in step 2 is cooled to normal temperature state,
It is once again powered up 30 minutes, detects the temperature linearity change slope K 2 of measurement equipment to be checked in 30 minutes；Step 4：By K1, K2 and threshold value
Scope H compares, and is unqualified beyond H range flags, is qualified without departing from H range flags.Present computer network monitoring dress
Put, structure is complex, bulky, and radiating effect is poor, the particularly high-power fortune of network monitor device when specifically used
During row, substantial amounts of heat can be produced, if radiating not in time, it will there is network monitor device operation slowly, will when serious
Cause the phenomenon that network monitor device is burnt out.Electrical lighting equipment is same, and radiating not in time or not up to standard can burn out illumination
Device, so we need to do a qualified detection to the radiating state of component equipment when dispatching from the factory, the present invention is understanding
Certainly this problem, a temperature detection platform is designed, solves this problem, determine whether that qualified products contrast by linear ratio platform
Traditional detection is that a little this is a continuous detection, it is impossible to which the component excluded simply instantaneously radiates bad, custom
Just become normal after environment, so the flashy radiating of long-term detection causes many qualified products to be also indicated as not conforming to
Lattice, it is qualified that many underproof products are also indicated as.
The threshold range H is specifically set according to the size species of actual device under test.Further, as the excellent of the present invention
Select scheme.
The detection platform bottom sets hygrosensor and controller, the temperature of the hygrosensor detection detection platform
Spend and send to controller, controller receives temperature information and judged according to default threshold range H.Further, it is used as this hair
Bright preferred scheme.Limitation is not strong, and this threshold range is voluntarily to adjust.
Also include display screen, the judged result of display screen display controller, further, as preferred scheme of the invention.
The present invention compared with prior art, has the following advantages and advantages：
1st, the present invention is used for the heat-radiating properties measuring method of electronic chip, and it is qualified to be determined whether by linear ratio platform
Production, practicality are high；
2nd, the present invention is used for the heat-radiating properties measuring method of electronic chip, and it is qualified to be determined whether by linear ratio platform
Product contrasts traditional detection and is that this is a continuous detection a little, and result of detection is more accurate；
3rd, the present invention is used for the heat-radiating properties measuring method of electronic chip, and limitation is not strong, and this threshold range is can
Voluntarily to adjust.
Embodiment
For the object, technical solutions and advantages of the present invention are more clearly understood, with reference to embodiment, the present invention is made
Further to describe in detail, exemplary embodiment of the invention and its explanation are only used for explaining the present invention, are not intended as to this
The restriction of invention.
Embodiment 1
The present invention is used for the heat-radiating properties measuring method of electronic chip, including detection means, the detection means include
Following steps：Step 1：Measurement equipment to be checked is provided, is placed in detection platform；Step 2：It is powered 30 minutes at high operating temperatures, inspection
Survey the temperature linearity change slope K 1 of measurement equipment to be checked in 30 minutes；Step 3：Treat that the measurement equipment to be checked in step 2 is cooled to often
Temperature state, it is once again powered up 30 minutes, detects the temperature linearity change slope K 2 of measurement equipment to be checked in 30 minutes；Step 4：By K1,
K2 is unqualified compared with threshold range H, beyond H range flags, is qualified without departing from H range flags.During work：Design one
Temperature detection platform, solve this problem, determine whether that qualified products contrast traditional detection and are a little by linear ratio platform
This is a continuous detection, it is impossible to which the component excluded simply instantaneously radiates bad, just becomes normal, institute after customary environment
Many qualified products are caused to be also indicated as with the long-term flashy radiating of detection unqualified, much underproof products
It is qualified to be marked as.
Embodiment 2
The present invention is used for the heat-radiating properties measuring method of electronic chip, including detection means, the detection means include
Following steps：Step 1：Measurement equipment to be checked is provided, is placed in detection platform；Step 2：It is powered 30 minutes at high operating temperatures, inspection
Survey the temperature linearity change slope K 1 of measurement equipment to be checked in 30 minutes；Step 3：Treat that the measurement equipment to be checked in step 2 is cooled to often
Temperature state, it is once again powered up 30 minutes, detects the temperature linearity change slope K 2 of measurement equipment to be checked in 30 minutes；Step 4：By K1,
K2 is unqualified compared with threshold range H, beyond H range flags, is qualified without departing from H range flags.The threshold range H roots
Factually the size species of border device under test is specifically set.The detection platform bottom sets hygrosensor and controller, described
The temperature of hygrosensor detection detection platform is simultaneously sent to controller, and controller receives temperature information and according to default threshold value
Scope H judges.Also include display screen, the judged result of display screen display controller.During work：A temperature detection platform is designed,
Solve this problem, determine whether that qualified products contrast traditional detection and are that this is one continuous a little by linear ratio platform
Detection, it is impossible to the component excluded simply instantaneously radiates bad, just becomes normal after customary environment, so long-term detection
It is unqualified that flashy radiating causes many qualified products to be also indicated as, and many underproof products are also indicated as closing
Lattice, limitation is not strong, and this threshold range is voluntarily to adjust.
Above-described embodiment, the purpose of the present invention, technical scheme and beneficial effect are carried out further
Describe in detail, should be understood that the embodiment that the foregoing is only the present invention, be not intended to limit the present invention
Protection domain, within the spirit and principles of the invention, any modification, equivalent substitution and improvements done etc., all should include
Within protection scope of the present invention.
Claims (4)
1. the heat-radiating properties measuring method for electronic chip, it is characterised in that：Including detection means, the detection means bag
Include following steps：
Step 1：Measurement equipment to be checked is provided, is placed in detection platform；
Step 2：It is powered 30 minutes at high operating temperatures, detects the temperature linearity change slope K 1 of measurement equipment to be checked in 30 minutes；
Step 3：Treat that the measurement equipment to be checked in step 2 is cooled to normal temperature state, be once again powered up 30 minutes, detect to be checked in 30 minutes
The temperature linearity change slope K 2 of measurement equipment；
Step 4：By K1, K2 is unqualified compared with threshold range H, beyond H range flags, is qualified without departing from H range flags.
2. the heat-radiating properties measuring method according to claim 1 for electronic chip, it is characterised in that：The threshold value
Scope H is specifically set according to the size species of actual device under test.
3. the heat-radiating properties measuring method according to claim 1 for electronic chip, it is characterised in that：The detection
Mesa base sets hygrosensor and controller, and the temperature of the hygrosensor detection detection platform is simultaneously sent to control
Device, controller receive temperature information and judged according to default threshold range H.
4. the heat-radiating properties measuring method according to claim 1 for electronic chip, it is characterised in that：Also include aobvious
Display screen, the judged result of display screen display controller.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711022952.3A CN107843830A (en) | 2017-10-27 | 2017-10-27 | Heat-radiating properties measuring method for electronic chip |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711022952.3A CN107843830A (en) | 2017-10-27 | 2017-10-27 | Heat-radiating properties measuring method for electronic chip |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107843830A true CN107843830A (en) | 2018-03-27 |
Family
ID=61663056
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711022952.3A Withdrawn CN107843830A (en) | 2017-10-27 | 2017-10-27 | Heat-radiating properties measuring method for electronic chip |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107843830A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834899A (en) * | 2020-12-30 | 2021-05-25 | 广州奥松电子有限公司 | Chip detection device |
-
2017
- 2017-10-27 CN CN201711022952.3A patent/CN107843830A/en not_active Withdrawn
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112834899A (en) * | 2020-12-30 | 2021-05-25 | 广州奥松电子有限公司 | Chip detection device |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107941348A (en) | A kind of infrared measurement of temperature Calibration Method | |
| CN104794555B (en) | A kind of LED production and test data management system based on Internet of Things | |
| CN207662867U (en) | A kind of VOC sensor devices | |
| TWI602372B (en) | Electric appliance monitor method and electric appliance monitor system | |
| CN205251520U (en) | Through measuring device that breast surface temperature judges breast disease | |
| CN106206352B (en) | A kind of micro-nano semiconductor light electrical characteristics three-dimensional detection system | |
| CN107607850A (en) | A kind of radiation performance of semiconductor lighting product detection means | |
| CN107843830A (en) | Heat-radiating properties measuring method for electronic chip | |
| CN109829614A (en) | A kind of food risk quantification stage division and system based on target model | |
| CN107462821B (en) | Remote monitoring method and system for wafer test machine | |
| CN104697749A (en) | Bar-type LED lamp illumination test system | |
| CN113741576B (en) | Circuit board temperature detection position selection and detection method, device, equipment and medium | |
| CN105097420B (en) | A kind of method of temperature correction for MASSON fast bench heat treaters | |
| CN105136819A (en) | Method for detecting appearance contour of air conditioner | |
| Hao et al. | Comparison of lifetime predictions with LED lamps and light source modules in accelerated aging tests | |
| Oliveira et al. | Assessment of thermal environments: Working conditions in the Portuguese ceramic industry in 1994 and 2012 | |
| CN103575655B (en) | A kind of infrared gas sensor | |
| CN109655490B (en) | Air conditioner electric control component thermal performance evaluation test method | |
| CN117269734A (en) | Electrified ageing detection system of mainboard | |
| CN105185006B (en) | The intelligent prompt method and intelligent electronic door bell system of electronic door bell | |
| CN105910648A (en) | Toughened glass cooling process monitoring system | |
| CN208125846U (en) | pyroelectric sensing unit testing machine | |
| CN107203232A (en) | A kind of thermal fuse-link operating temperature intelligent detecting instrument | |
| Zhang et al. | Two optimized models of life prediction based on luminance degradation for VFD under a conventional life test | |
| CN107941421A (en) | The air tightness testing method and device of a kind of product |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| WW01 | Invention patent application withdrawn after publication |
Application publication date: 20180327 |
|
| WW01 | Invention patent application withdrawn after publication |