CN107807342A - Testing device for insulation defect and method for current transformer - Google Patents

Testing device for insulation defect and method for current transformer Download PDF

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Publication number
CN107807342A
CN107807342A CN201711044458.7A CN201711044458A CN107807342A CN 107807342 A CN107807342 A CN 107807342A CN 201711044458 A CN201711044458 A CN 201711044458A CN 107807342 A CN107807342 A CN 107807342A
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China
Prior art keywords
defect
current transformer
testing device
quantum sensor
electric field
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CN201711044458.7A
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Chinese (zh)
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CN107807342B (en
Inventor
赵龙
仇茹嘉
王鑫
郑国强
高博
胡世骏
罗亚桥
杨海涛
汪玉
丁津津
李远松
王小明
何开元
陈凡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
State Grid Corp of China SGCC
Electric Power Research Institute of State Grid Anhui Electric Power Co Ltd
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State Grid Corp of China SGCC
Electric Power Research Institute of State Grid Anhui Electric Power Co Ltd
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Priority to CN201711044458.7A priority Critical patent/CN107807342B/en
Publication of CN107807342A publication Critical patent/CN107807342A/en
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00Testing or calibrating of apparatus covered by the other groups of this subclass
    • G01R35/02Testing or calibrating of apparatus covered by the other groups of this subclass of auxiliary devices, e.g. of instrument transformers according to prescribed transformation ratio, phase angle, or wattage rating
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1218Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing using optical methods; using charged particle, e.g. electron, beams or X-rays
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/12Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing
    • G01R31/1227Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials
    • G01R31/1263Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing of components, parts or materials of solid or fluid materials, e.g. insulation films, bulk material; of semiconductors or LV electronic components or parts; of cable, line or wire insulation

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Relating To Insulation (AREA)

Abstract

Embodiment of the present invention provides a kind of testing device for insulation defect and method for current transformer, and testing device for insulation defect includes:Quantum sensor, it is arranged near current transformer;Laser generator, for quantum sensor emission laser with excitation quantum sensor;Microwave transceiver, for quantum sensor emission microwave signal and receiving the microwave signal of quantum sensor feedback;Electron spin resonance spectrometer, for starting laser generator and microwave transceiver and obtaining the distribution characteristics of the electric field and/or magnetic field intensity of current transformer spatially according to the microwave signal of feedback;Processor, for judging that current transformer whether there is defect and the type the defect is determined in the case of judging current transformer existing defects the defects of according to the distribution characteristics of the electric field that detects and/or magnetic field intensity.The defects of testing device for insulation defect can be detected to electric field, the characteristics of geomagnetic field distribution of current transformer and judge current transformer type.

Description

Testing device for insulation defect and method for current transformer
Technical field
The present invention relates to current transformer, more particularly to a kind of testing device for insulation defect for current transformer and Method.
Background technology
Electrical equipment is component important in power system, and it is power system security that its normal table, which is run, reliable The important foundation of operation.However, the reason such as raw material, design, manufacturing process, transport, installation can cause the flaw in Insulation Problems Defect.The problems such as hot-spot, shelf depreciation may be produced if can not find in time, in running, or even will cause to set Standby blast on fire, has a strong impact on power network and personal safety.At present, the state under the electric equipment operation state such as sleeve pipe, transformer Detection means mainly has infrared measurement of temperature, the measurement of relative medium loss factor.Infrared measurement of temperature can delicately find current caused hot type Defect and overall voltage pyrogenicity type defect, but the major defect of small range concentrated is difficult to find, and this kind of defect is proper It may just quickly grow and cause the generation of pernicious failure;Relative medium loss factor measurement needs to change equipment end shield Make, add equipment operation risk, and such e measurement technology is also difficult to the major defect of discovery small range concentrated.
The content of the invention
It is an object of the invention to provide a kind of testing device for insulation defect and method for current transformer, the insulation lacks Falling into detection means and method can be detected to electric field, the characteristics of geomagnetic field distribution of current transformer and judge the Current Mutual Inductance The defects of device type.
To achieve these goals, embodiment of the present invention provides a kind of insulation defect for current transformer and detects dress Put, the testing device for insulation defect can include:
Quantum sensor, it is arranged near current transformer;
Laser generator, for launching laser to the quantum sensor with excitation quantum sensor;
Microwave transceiver, for quantum sensor emission microwave signal and receive quantum sensor feedback microwave believe Number;
Electron spin resonance spectrometer, for starting laser generator and microwave transceiver and being obtained according to the microwave signal of feedback To electric field and/or the magnetic field intensity distribution characteristics spatially of current transformer;
Processor, it is used for:
Electric field and/or the distribution characteristics of magnetic field intensity according to detecting judge current transformer with the presence or absence of defect and The type the defect is determined in the case of judging current transformer existing defects the defects of.
Alternatively, the quantum sensor can include diamond.
Alternatively, the testing device for insulation defect may further include siren.The processor can be also used for true Start the siren in the case of determining the defect type for major defect.
Alternatively, the processor can be further used for:By distribution characteristics and the electric field prestored and/or magnetic field intensity Distributed model spatially is compared, and judges that current transformer lacks with the presence or absence of defect and existing according to comparison result The type the defects of defect in the case of falling into.
Alternatively, the distributed model can be the distributed model using neural net model establishing.
Alternatively, the neutral net can be radial basis function neural network.
Alternatively, testing device for insulation defect can also include:Display, the defects of at least showing current transformer Type.
Embodiment of the present invention also provides a kind of method for detecting insulation defect for being used to detect current transformer, and this method can With including:
Laser generator launches laser with excitation quantum sensor to the quantum sensor being arranged near current transformer;
Microwave transceiver is to quantum sensor emission microwave signal and receives the microwave signal of quantum sensor feedback;
Electron spin resonance spectrometer obtains the electric field of current transformer according to the microwave signal of feedback and/or magnetic field intensity exists Distribution characteristics spatially;
Processor judges current transformer with the presence or absence of defect according to distribution characteristics and is judging that current transformer deposits In the case of defect determine defect the defects of type.
Alternatively, processor judges current transformer with the presence or absence of defect according to distribution characteristics and is judging that electric current is mutual Determine that type can include the defects of defect in the case of sensor existing defects:
Distributed model of the distribution characteristics with the electric field and/or magnetic field intensity that prestore spatially is compared;
According to comparison result judge current transformer with the presence or absence of defect and in case of a defect defect lack Fall into type.
Alternatively, quantum sensor can include diamond.
Pass through above-mentioned technical proposal, the testing device for insulation defect and method can to the electric field of current transformer and/or Characteristics of geomagnetic field distribution is detected, by by the distribution characteristics of the electric field detected and/or magnetic field intensity and default electric field and/ Or the distribution characteristics of magnetic field intensity is compared, so as to judge the current transformer with the presence or absence of defect and in existing defects In the case of the defects of type.
The further feature and advantage of embodiment of the present invention will be described in detail in subsequent specific embodiment part.
Brief description of the drawings
Accompanying drawing is that embodiment of the present invention is further understood for providing, and a part for constitution instruction, with Following embodiment is used to explain embodiment of the present invention together, but does not form the limit to embodiment of the present invention System.In the accompanying drawings:
Fig. 1 is the flow of the method for detecting insulation defect for current transformer according to an embodiment of the present invention Figure;
Fig. 2 is the signal for the testing device for insulation defect for current transformer for being embodiment according to the one of the present invention Figure;
Fig. 3 is the structural frames of the testing device for insulation defect for current transformer according to an embodiment of the present invention Figure;
Fig. 4 is the structural frames of the testing device for insulation defect for current transformer according to an embodiment of the present invention Figure;And
Fig. 5 is the structural frames of the testing device for insulation defect for current transformer according to an embodiment of the present invention Figure.
Description of reference numerals
10th, current transformer 20, quantum sensor
30th, laser generator 40, microwave transceiver
50th, electron spin resonance spectrometer 60, processor
70th, siren 80, display
Embodiment
The embodiment of embodiment of the present invention is described in detail below in conjunction with accompanying drawing.It should be appreciated that Embodiment described herein is merely to illustrate and explain the present invention embodiment, is not intended to limit the invention implementation Mode.
Fig. 1 is the flow of the method for detecting insulation defect for current transformer according to an embodiment of the present invention Figure.In figure, the method for detecting insulation defect may comprise steps of:
In step slo, quantum sensor is set.In the present embodiment, can be as shown in Figure 2 mutual with electric current The central shaft of sensor is the center of circle, using preset distance to set quantum sensor on the annulus of radius.In the present embodiment, this is pre- Set a distance can be determined according to the electric field of detection and/or the precision of magnetic field intensity is actually needed.In addition, quantum is set to sense Device can also be arranged on different horizontal planes (assuming that the current transformer is placed to be vertical).
In step s 11, laser generator launches laser to swash to the quantum sensor being arranged near current transformer Send out quantum sensor.In the present embodiment, can be that laser generator is controlled to the electric current using electron spin resonance spectrometer Transformer launches laser with excitation quantum sensor.
In step s 12, microwave transceiver launches microwave signal to the quantum sensor and to receive the quantum sensor anti- The microwave signal of feedback.In this embodiment, can be that quantum is passed using electron spin resonance spectrometer control microwave transceiver Sensor launches microwave and the microwave signal of quantum sensor feedback is received by microwave transceiver.
In step s 13, electron spin resonance spectrometer according to the microwave signal of feedback obtain current transformer electric field and/ Or the distribution characteristics of magnetic field intensity spatially;In this embodiment, can be that this is passed through using electron spin resonance spectrometer The microwave frequency of the signal of feedback determines the electric field and/or magnetic field intensity at this, and the set location of incorporating quantum sensor comes Determine the distribution characteristics of the electric field and/or magnetic field intensity of the current transformer spatially.
In step S14, processor judges current transformer with the presence or absence of defect according to distribution characteristics and judged The defects of defect is determined in the case of current transformer existing defects type.In this embodiment, can be for example by detection To electric field and/or the distribution characteristics of magnetic field intensity and the electric field that prestores and/or magnetic field intensity distribution spatially Model is compared, to judge that the current transformer whether there is defect under the distribution characteristics of the electric field and/or magnetic field intensity. In this embodiment, the electric field and/or the distributed model of magnetic field intensity can be by entering to a large amount of current transformer samples What row learnt and established.Further, can also be according in electric field and/or the magnetic field intensity for learning to establish by great amount of samples Distributed model spatially judge the specific defect type of the current transformer.So it is easy to staff to the electric current Transformer makes effective measures.In addition it is also possible to learning point for the electric field and/or magnetic field intensity established by great amount of samples A part is chosen in cloth model and is used as early warning defect.When it is determined that the current transformer has early warning defect, now illustrate the electricity Current transformer is likely to go wrong in a short time, is so easy to staff to make early warning in time, avoids the generation of accident. In addition, in order to improve operation efficiency, the above-mentioned distributed model with learning the electric field and/or magnetic field intensity established by great amount of samples Can be for example using the distributed model of neural net model establishing, further, the neutral net can be RBF (Radial Basis Function, RBF) neutral net.
Fig. 3 is the structural frames of the testing device for insulation defect for current transformer according to an embodiment of the present invention Figure.In figure 3, the testing device for insulation defect includes:
Quantum sensor 20, it can be arranged near current transformer 10.In one example, quantum sensor 20 can be with Be provided in the central shaft as shown in Figure 2 using the current transformer 10 as the center of circle, using preset distance as on the annulus of radius.Should Preset distance can determine according to the electric field of detection and/or the precision of magnetic field intensity is actually needed.The quantum sensor 20 Quantity can determine according to the electric field of detection and/or the precision of magnetic field intensity is actually needed.In embodiments of the present invention, The quantum sensor 20 can include diamond.
Laser generator 30, the laser generator 30 are connected with electron spin resonance spectrometer 50, for being sensed to the quantum Device 20 launches laser with excitation quantum sensor 20.
Microwave transceiver 40, the microwave transceiver 40 are connected with electron spin resonance spectrometer 50, for quantum sensor 20 transmitting microwave signals simultaneously receive the microwave signal of quantum sensor feedback, finally by the microwave signal transmission of the feedback to electricity Sub- spin resonance spectrometer 50.
Electron spin resonance spectrometer 50, the electron spin resonance spectrometer 50 is connected with processor 60, for detecting the feedback Microwave signal frequency, the electric field of the current transformer 10 and/or magnetic field intensity are obtained by the frequency of the feedback signal Distribution characteristics spatially.
Processor 60, is used for:The electric field and/or magnetic field intensity of current transformer 10 are received from electron spin resonance spectrometer 50 Distribution characteristics spatially judges that the current transformer 10 whether there is according to the distribution characteristics of the electric field and/or magnetic field intensity Defect and determine defect type in the case where judging the existing defects of current transformer 10.
In detection, the control of electron spin resonance spectrometer 50 starts laser generator 30 and swashed to the quantum sensor 20 transmitting Light.The quantum sensor 20 is arranged on the annulus using the central shaft of the current transformer 10 as the center of circle, using preset distance as radius On, the quantity of the quantum sensor 20 can be such as 4, and the radius of the annulus can be such as 1 centimetre.People in the art For member it also will be understood that for the needs according to actual estimation precision, the quantity of the quantum sensor 20 can also be other values, should The radius of annulus can also be other numerical value.(in the present embodiment, the quantum sensor 20 can wrap the quantum sensor 20 Include diamond.) under the irradiation of laser, the free electron in nitrogen-room (NV) colour center structure produces polarization.Now, microwave is received Send out device 40 and launch microwave signal to the quantum sensor 20.The quantum sensor 20 the current transformer 10 electric field and/or Cause electron spin resonance in the presence of magnetic field and microwave signal.Now, the quantum sensor 20 reflects and own electronic The frequency identical feedback microwave signal of spin resonance.Microwave transceiver 40 receives the microwave signal of feedback and by the micro- of the feedback Ripple signal is transferred to electron spin resonance spectrometer 50.The electron spin resonance spectrometer 50 is by detecting the microwave signal of the feedback Frequency calculates the electric field of the current transformer 10 and/or magnetic field intensity.Processor 60 receives from electron spin resonance spectrometer 50 The distribution characteristics of electric field and/or magnetic field intensity simultaneously judges the electricity according to the electric field and/or the distribution characteristics of magnetic field intensity detected Current transformer 10 with the presence or absence of defect and determines defect type in the case where judging the existing defects of current transformer 10.
Relative to e measurement technology of the prior art, the quantum Technology of Precision Measurement that the quantum sensor 20 is based on is base In to monomolecular manipulation, the reflected physical features of the internal electron polarization to testee are very sensitive.Therefore, quantum passes The measurement accuracy of sensor 20 can reach 200mV/m (every meter of millivolt) to electric field, can reach 10 to magnetic field-13T/m (teslas Every meter), so as to obtain the fine distributed model of electric field and/or magnetic field spatially when equipment under test is run.
The processor 60 can be general processor, application specific processor, conventional processors, digital signal processor (DSP), Multi-microprocessor, the one or more microprocessors associated with DSP core, controller, microcontroller, application specific integrated circuit (ASIC), field programmable gate array (FPGA) circuit, the integrated circuit (IC) of any other type, state machine etc..In this reality Apply in mode, the processor 60 can be quantum detection analysis system.Although the above-mentioned selection example for listing several processors, But the selection example of these processors is not construed as limiting to technical scheme, those skilled in the art can also manage It is also applicable to solve as other processors.
Fig. 4 is the structure of the testing device for insulation defect for current transformer 10 according to an embodiment of the present invention Block diagram.It is with the testing device for insulation defect difference for current transformer 10 shown in Fig. 3, insulation defect inspection Device is surveyed to may further include:Siren 70, the siren 70 are connected with processor 20, can be used for starting to prompt work Personnel.The processor 60 can be also used for starting the siren in the case of it is determined that the current transformer 10 belongs to major defect 70.For example, when processor 60 judges the existing defects of current transformer 10, so as to determine whether the current transformer 10 Defect type, and judge whether the defect type belongs to major defect.Judging that the defect type belongs to the situation of major defect Under, start the siren 70 and notify staff to make corresponding measure, so as to avoid the occurrence of accident.The siren 70 can be selected LED, buzzer, voice device etc., those skilled in the art are it is also assumed that other sirens are also applicable.
Fig. 5 is the testing device for insulation defect for current transformer 10 according to an embodiment of the present invention.With Fig. 4 In the testing device for insulation defect difference for current transformer 10 that shows be that the testing device for insulation defect may be used also With including:Display 80, the display 80 can be connected with the processor 60, can be used at least showing the current transformer 10 The defects of type.For example, when processor 60 detects the existing defects of current transformer 10, it is mutual so as to further detect the electric current The defects of sensor 10 type.Now, processor 60 by the display 80 prompts the type of the staff defect to allow work Personnel make measure in advance.When the processor 60 judges that the defect type belongs to major defect, the processor 60 can be with a side Staff is prompted to take measures in time by display 80 in face;On the other hand work people can also be prompted by siren 70 Member.So avoided by alarm twice because the carelessness of staff is and the generation that causes the accident.The display 80 can select With LED, OLED display screen etc., those skilled in the art are it is also assumed that other displays are also applicable.
In an embodiment of the invention, examined based on the insulation defect for current transformer 10 as shown in Figure 5 Device is surveyed, the processor 60 can be configured to:By the distribution characteristics of the electric field detected and/or magnetic field intensity with by big The distributed model of the electric field and/or magnetic field intensity that amount sample learning is established spatially is compared, and is judged according to comparison result The current transformer 10 gone out under the distribution characteristics of the electric field and/or magnetic field intensity whether there is defect.Comparing out in the presence of scarce In the case of falling into, further by the distribution characteristics of the electric field detected and/or magnetic field intensity with learning to establish by great amount of samples Electric field and/or magnetic field distributed model spatially be compared, type the defects of so as to identify the defect.
In an embodiment of the invention, based on the insulation to being used for current transformer 10 as shown in Figure 5 Defect detecting device, the distributed model can use neural net model establishing, and further, the neutral net can be RBF (Radial Basis Function, RBF) neutral net.The side being modeled using neutral net to distributed model Method can be known to those skilled in the art, no longer illustrate its details herein.
As shown in Figure 1 be used for is performed to be used for the testing device for insulation defect of current transformer 10 as shown in Figure 5 The testing device for insulation defect of current transformer 10.In the course of the work, quantum sensor 10 can be arranged on current transformer Near 10.In one example, quantum sensor 20 can be provided in the center as shown in Figure 2 with the current transformer 10 Axle is the center of circle, using preset distance as on the annulus of radius.The quantity of the quantum sensor 20 can be such as 6, the annulus Radius can be such as 1 centimetre.Those skilled in the art it also will be understood that be according to reality estimation precision needs, the quantum The quantity of sensor 20 can also be other values, and the radius of the annulus can also be other numerical value.The quantum sensor 20 is (at this In embodiment, the quantum sensor 20 can include diamond.) under the irradiation of laser, in nitrogen-room (NV) colour center structure Electronics polarize.Electron spin resonance spectrometer 50 controls microwave transceiver 40 to launch to the transmitting microwave of the quantum sensor 20 Signal.The quantum sensor 20 causes electricity in the presence of the electric field of the current transformer 10 and/or magnetic field and microwave signal Sub- spin resonance simultaneously reflects the frequency identical microwave signal with the resonant frequency.Microwave transceiver 40 receives the microwave letter of feedback Number and by the microwave signal transmission electron spin resonance spectrometer 50 of the feedback.The electron spin resonance spectrometer 50 should by detection The frequency of the microwave signal of feedback calculates the electric field of the current transformer 10 and/or magnetic field intensity and sensed by each quantum The set location of device 20 determines the distribution characteristics of the electric field and/or magnetic field intensity.Built in processor 60 by RBF neural Mould is established by great amount of samples study has under number of drawbacks situation state the electric field of current transformer 10 and/or magnetic field intensity in sky Between on distributed model.The processor 60 is by the electric field of the actual current transformer 10 received and/or magnetic field intensity in space On distribution characteristics compared with electric field and/or the magnetic field intensity distributed model spatially for learning to establish by great amount of samples It is right, judge that the current transformer 10 whether there is defect according to comparison result.If the existing defects of current transformer 10, that , processor 60 then by locate start siren 70 notify staff.In addition, the processor 60 can also be further by detection Electric field and/or magnetic field intensity distribution characteristics spatially and the electricity that learns to establish by great amount of samples to current transformer 10 The distributed model of field and/or magnetic field intensity spatially is compared, so as to judge the type of the defect.Processor 60 passes through Display 80 shows the existing defects of current transformer 10 and shows corresponding defect type.Staff can also be in advance logical Cross in the distributed model of the electric field and/or magnetic field intensity of the number of drawbacks that a large amount of sample learnings are established spatially select it is a kind of or It is several to be used as major defect, then if the defect belongs to major defect, then processor 60 prompts work by display 80 Major defect be present in personnel's current transformer 10.Meanwhile the processor 60 can also start siren 80 and notify staff, from And avoid the generation to be caused the accident because of the carelessness of staff.
Further, the characteristics of staff can also occur according to major defect, built by great amount of samples study Early warning defect, the appearance of the defect are set in the distributed model of the electric field and/or magnetic field intensity of vertical number of drawbacks spatially Indicate that the current transformer 10 is likely to will appear from major defect.Therefore, when processor 60 compares out the current transformer When 10 the defects of is early warning defect, early warning can also be made to staff by display 80, so as to avoid accident in advance Occur.
Pass through above-mentioned technical proposal, the testing device for insulation defect and method proposed by the present invention for current transformer have Have the advantage that:
1st, current transformer is measured using the quantum sensor based on quantum Technology of Precision Measurement.By that will pass through The distributed model of the electric field and/or magnetic field intensity that great amount of samples study is established spatially and the electricity of the current transformer detected The distribution characteristics of field and/or magnetic field intensity spatially is compared, and solving in the prior art can only be whole to current transformer The problem of body state measures, realize the detection to the local small range defect of current transformer.
2nd, by setting early warning defect and major defect, when detecting early warning defect, staff can be prompted to shift to an earlier date Preparation is made, avoids the generation of accident.When detecting major defect, staff can be prompted in time, avoid getting over Therefore further deterioration.
3rd, also can be to the specific of the defect of current transformer 10 by the detection to 10 local small range of current transformer Position is positioned, and is easy to the maintenance of current transformer 10.
The optional embodiment of example of the present invention is described in detail above in association with accompanying drawing, still, embodiment of the present invention is not The detail being limited in above-mentioned embodiment, can be to of the invention real in the range of the technology design of embodiment of the present invention The technical scheme for applying mode carries out a variety of simple variants, and these simple variants belong to the protection domain of embodiment of the present invention.
It is further to note that each particular technique feature described in above-mentioned embodiment, in not lance In the case of shield, it can be combined by any suitable means.In order to avoid unnecessary repetition, embodiment of the present invention Various combinations of possible ways are no longer separately illustrated.
In addition, can also be combined between a variety of embodiments of embodiment of the present invention, as long as its Without prejudice to the thought of embodiment of the present invention, it should equally be considered as embodiment of the present invention disclosure of that.

Claims (10)

  1. A kind of 1. testing device for insulation defect for current transformer, it is characterised in that the testing device for insulation defect bag Include:
    Quantum sensor, it is arranged near the current transformer;
    Laser generator, for launching laser to the quantum sensor to excite the quantum sensor;
    Microwave transceiver, for launching microwave signal to the quantum sensor and receiving the microwave of the quantum sensor feedback Signal;
    Electron spin resonance spectrometer, for starting the laser generator and the microwave transceiver and according to the micro- of the feedback Ripple signal obtains the distribution characteristics of the electric field and/or magnetic field intensity of the current transformer spatially;
    Processor, for judging the current transformer with the presence or absence of defect and described in judging according to the distribution characteristics The defects of determining the defect in the case of current transformer existing defects type.
  2. 2. testing device for insulation defect according to claim 1, it is characterised in that the quantum sensor includes Buddha's warrior attendant Stone.
  3. 3. testing device for insulation defect according to claim 1, it is characterised in that the testing device for insulation defect enters one Step includes siren;
    The processor is additionally operable to start the siren in the case of it is determined that the defect type is major defect.
  4. 4. testing device for insulation defect according to claim 1, it is characterised in that the processor is further used for:
    Distributed model of the distribution characteristics with the electric field and/or magnetic field intensity that prestore spatially is compared, root Judge the defects of current transformer whether there is defect and the in case of a defect defect according to comparison result Type.
  5. 5. testing device for insulation defect according to claim 4, it is characterised in that the distributed model is to use nerve net The distributed model of network modeling.
  6. 6. testing device for insulation defect according to claim 5, it is characterised in that the neutral net is RBF Neutral net.
  7. 7. testing device for insulation defect according to claim 1, it is characterised in that the testing device for insulation defect also wraps Include:Display, type the defects of at least showing the current transformer.
  8. A kind of 8. method for being used to detect the insulation defect of current transformer, it is characterised in that methods described includes:
    Laser generator launches laser to excite the quantum to pass to the quantum sensor being arranged near the current transformer Sensor;
    Microwave transceiver launches microwave signal to the quantum sensor and receives the microwave signal of the quantum sensor feedback;
    Electron spin resonance spectrometer according to the microwave signal of the feedback obtain the current transformer electric field and/or magnetic field it is strong The distribution characteristics of degree spatially;
    Processor judges the current transformer with the presence or absence of defect according to the distribution characteristics and is judging the electric current The defects of determining the defect in the case of transformer existing defects type.
  9. 9. according to the method for claim 8, it is characterised in that the processor judges the electricity according to the distribution characteristics Current transformer with the presence or absence of defect and determines the defect in the case where judging the current transformer existing defects Defect type includes:
    Distributed model of the distribution characteristics with the electric field and/or magnetic field intensity that prestore spatially is compared;
    Judge that the current transformer whether there is defect and the in case of a defect defect according to comparison result The defects of type.
  10. 10. according to the method for claim 8, it is characterised in that the quantum sensor includes diamond.
CN201711044458.7A 2017-10-31 2017-10-31 Insulation defect detection device and method for current transformer Active CN107807342B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107807315A (en) * 2017-10-31 2018-03-16 国网安徽省电力公司电力科学研究院 Testing device for insulation defect and method for electrical equipment
CN110045310A (en) * 2019-04-03 2019-07-23 国家电网有限公司 Current standard device based on quantum accurate measurement

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