CN107807289A - A kind of DC charging module life prediction and reliability estimation method - Google Patents
A kind of DC charging module life prediction and reliability estimation method Download PDFInfo
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- CN107807289A CN107807289A CN201711002603.5A CN201711002603A CN107807289A CN 107807289 A CN107807289 A CN 107807289A CN 201711002603 A CN201711002603 A CN 201711002603A CN 107807289 A CN107807289 A CN 107807289A
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The present invention provides a kind of DC charging module life prediction and reliability estimation method, extracts the switching device and electric capacity in DC charging module, the circuit parameter of the whole circuit of DC charging module is obtained according to electric model；The junction temperature of each switching device, and the core temperature of each electric capacity are obtained according to thermal model respectively；To switching device and electric capacity, life model is established respectively, calculates the B10 life-spans of each switching device and electric capacity, and obtain the reliability of each switching device and electric capacity with reference to two parameter Weibull distributions；All switching devices are multiplied with the reliability of electric capacity, obtain the reliability of DC charging module, so as to obtain the reliability curve that the reliability of DC charging module changes over time；The point that ordinate i.e. reliability is 0.9 is found on reliability curve, its abscissa is the B10 life-spans of DC charging module.The present invention obtains the overall life and reliability of DC charging module, and the reliability for electric automobile DC charging equipment provides strong data supporting.
Description
Technical field
The invention belongs to field of new energy technologies, and in particular to a kind of DC charging module life prediction and reliability assessment
Method.
Background technology
The development of new energy technology so that electric automobile progressively moves towards commercialization, scale, but electric automobile is supporting
Also there is a series of problems when in use for facility.The survey report of China Electric Power Research Institute is as shown in figure 1, electric automobile
In the failure of DC charging equipment, 27% is caused by DC charging module.Therefore, the life and reliability pair of DC charging module
Whole electric automobile DC charging equipment influences very big.Need badly and life prediction and reliability assessment are carried out to DC charging module.
The content of the invention
The technical problem to be solved in the present invention is：A kind of DC charging module life prediction and reliability assessment side are provided
Method.
The technical solution taken by the invention to solve the above technical problem is：A kind of prediction of DC charging module life and
Reliability estimation method, it is characterised in that：It comprises the following steps：
Switching device and electric capacity in S1, extraction DC charging module, it is whole that DC charging module is obtained according to electric model
The circuit parameter of circuit；
S2, respectively according to thermal model, obtain the junction temperature of each switching device, and the core temperature of each electric capacity；
S3, to switching device and electric capacity, establish life model respectively, calculate the B10 life-spans of each switching device and electric capacity,
And obtain the reliability of each switching device and electric capacity with reference to two parameter Weibull distributions；
S4, all switching devices are multiplied with the reliability of electric capacity, the reliability of DC charging module are obtained, so as to obtain
The reliability curve that the reliability of DC charging module changes over time；Ordinate i.e. reliability is found on reliability curve is
0.9 point, its abscissa are the B10 life-spans of DC charging module.
As stated above, the junction temperature of described switching device obtains in the following manner：
Tc=Ta+Ptot·Zth(c-a)；Tj=Tc+Ptot·Zth(j-c)；
Wherein：TaFor environment temperature；TcFor skin temperature；Zth(j-c)Equivalent heat impedance between knot and shell, with switch
The thermal impedance model of device is calculated；Zth(c-a)Thermal impedance between shell and environment；TjFor junction temperature；PtotFor switching device
Total-power loss, be conduction loss and switching loss sum.
As stated above, the junction temperature of described switching device obtains in the following manner：
The circuit of DC charging module is built using the hot simulation softwares of PLECS, the databook by switching device is to open
Close device addition comprising thermal impedance model coefficient heat description file, the junction temperature of switching device is emulated, obtain junction temperature with
The relation curve of time.
As stated above, the core temperature of described electric capacity obtains in the following manner：
Th=Ta+PCZth(h-a)；
Wherein：TcFor the core temperature of electric capacity；TaFor environment temperature；PCDamage caused by the ESR of electric capacity is flowed through for ripple current
Consumption；Zth(h-a)Thermal impedance between capacitor core and environment.
As stated above, the junction temperature T of switching device is passed throughjCalculated with Coffin-Manson-Arrhenius life models
Overall thermal cycle number when switching device fails, times of thermal cycle and the ripple electricity at input lateral capacitance both ends in each second time
Voltage-frequency rate is identical, is worth for twice of power frequency, then overall thermal cycle number is converted into the B10 life-spans of switching device.
Maximum voltage V, the core temperature T born when as stated above, according to the work of electric capacityhAnd the life model of electric capacity is pre-
Survey the B10 life-spans of electric capacity, electric capacity life model：
Wherein：L0For with reference to the life-span under operating mode, V0To be the life-span under actual condition with reference to the voltage under operating mode, L, V is
The actual maximum voltage born of electric capacity, T0For with reference to the core temperature under operating mode, γ is voltage stress constant.
Beneficial effects of the present invention are：The junction temperature of switching device and the core temperature of electric capacity are obtained using thermal model and electric model,
The life and reliability of switching device and electric capacity is obtained by the life model of individual devices again, finally synthesis obtains DC charging mould
The overall life and reliability of block, the reliability for electric automobile DC charging equipment provide strong data supporting.
Brief description of the drawings
Fig. 1 is the survey report figure of China Electric Power Research Institute.
Fig. 2 is LLC resonant converter circuit diagram.
Fig. 3 is the ripple voltage schematic diagram in input lateral capacitance.
Fig. 4 is the method flow diagram of one embodiment of the invention.
Fig. 5 is the thermal impedance model topology figure of switching device.
Fig. 6 is the system reliability structure chart of one embodiment of the invention.
Fig. 7 is the junction temperature curve of cyclical fluctuations of one embodiment of the invention switching device.
Fig. 8 is one embodiment of the invention fs=0.8frWhen switching device and electric capacity reliability.
Fig. 9 is one embodiment of the invention fs=frWhen switching device and electric capacity reliability.
Figure 10 is one embodiment of the invention fs=1.2frWhen switching device and electric capacity reliability.
Figure 11 is one embodiment of the invention in different fsWhen reliability.
Embodiment
With reference to instantiation and accompanying drawing, the present invention will be further described.
In order to realize high power density, high efficiency, direct-current charging post power module, which commonly uses topology, phase-shifted full-bridge converter
And LLC resonant converter, wherein LLC resonant converter are widely used because of its efficiency high, cost is low.In DC charging module
Have it is a variety of can realize high power density, efficient circuit topology, usually using LLC resonant converter as DC/DC conversion
Device.
As shown in Fig. 2 LLC resonant converter is by input, full-bridge inverting, resonator, transformer, full-bridge rectification and outlet side
DC-Link electric capacity forms.Because the output of front stage converter contains the ripple voltage of twice of power frequency, LLC resonant converter
Input is with an electric capacity CDCForm give, i.e., the voltage of electric capacity both sides is not steady state value, and electric capacity both end voltage voltage waveform is such as
Fig. 3.Due to the switching frequency f of switching device in full-bridge invertingsIt is to change in a region, 3 is operated in converter not
Same fsReliability during operating point carries out assessment fs=0.8fr；fs=1.0fr；fs=1.2fr.Resonant frequency frSuch as formula (1)
Wherein：Lr、CrIt is the inductance and electric capacity in resonator respectively.
When LLC resonant converter works, the resonant frequency of the middle inductance and electric capacity of resonator is fr, the switch of switching device
Frequency is fs.The working region of converter is in no-voltage opens (ZVS) region, i.e. switching frequency fsCan be the one of ZVS regions
Change in sub-regions, now switching device can realize ZVS, reduce turn-on consumption.The power attenuation and heat of switching device
Stress is with switching frequency fsChange and change.Due to the resonant frequency f of designrShi Gaoda kHz up to a hundred, and switching frequency fs
In frNear change in region, although the turn-on consumption of switching device is very low in ZVS, switching device is operated in high frequency
State, total power attenuation is still very high, can produce very high thermal stress, causes the junction temperature of switching device to raise so as to reduce it
Life and reliability.The DC-Link electric capacity of outlet side is electrochemical capacitor, for buffering pulsating power, its short life, and ripple current
Temperature rise can be produced during equivalent series resistance (ESR) for flowing through electric capacity further to shorten its life-span, reduce reliability.The life-span of device
Limit the life-span of LLC resonant converter.
The present invention provides a kind of prediction of DC charging module life and reliability estimation method, as shown in figure 4, it include with
Lower step：
Switching device and electric capacity in S1, extraction DC charging module, it is whole that DC charging module is obtained according to electric model
The circuit parameter of circuit.
S2, respectively according to thermal model, obtain the junction temperature of each switching device, and the core temperature of each electric capacity.
The junction temperature of described switching device can obtain in the following manner：
Tc=Ta+Ptot·Zth(c-a)(2)；
Tj=Tc+Ptot·Zth(j-c)(3)；
Wherein：TaFor environment temperature；TcFor skin temperature；Zth(j-c)Equivalent heat impedance between knot and shell, with switch
The thermal impedance model of device is calculated；Zth(c-a)Thermal impedance between shell and environment；TjFor junction temperature；PtotFor switching device
Total-power loss, be conduction loss and switching loss sum.
It is the equivalent thermal resistance between Foster models calculating knot and shell with the thermal impedance model of the switching device shown in Fig. 5
It is anti-.
τk=Rk·Ck(5),
In formula, RkFor the resistance value in k-th of RC parallel units in Foster models, CkFor in k-th of RC parallel units
Capacitance, t are the time, τkFor the time constant of k-th of unit, m is the total number of RC parallel units in Foster models.
The junction temperature of described switching device can also obtain in the following manner：
The circuit of DC charging module is built using the hot simulation softwares of PLECS, the databook by switching device is to open
Close device addition comprising thermal impedance model coefficient heat description file, the junction temperature of switching device is emulated, obtain junction temperature with
The relation curve of time.
The core temperature of described electric capacity obtains in the following manner：
Th=Ta+PCZth(h-a)(6)；
Wherein：TcFor the core temperature of electric capacity；TaFor environment temperature；PCDamage caused by the ESR of electric capacity is flowed through for ripple current
Consumption；Zth(h-a)Thermal impedance between capacitor core and environment.
Described ripple current flows through loss P caused by the ESR of electric capacityCCalculate in the following manner：
Wherein：ipsin(ωpT+ θ) it is electric current p subharmonic, ESRpIt is ω for angular frequencypWhen electric capacity equivalent series resistance,
N is harmonic wave sum.
S3, to switching device and electric capacity, establish life model respectively, calculate the B10 life-spans of each switching device and electric capacity,
And obtain the reliability of each switching device and electric capacity with reference to two parameter Weibull distributions.The definition in B10 life-spans is：The B10 life-spans are
The working time point of individual product, after this time point is arrived in product work, it is contemplated that the product for having 10% will break down.
Pass through the junction temperature T of switching devicejSwitching device failure is calculated with Coffin-Manson-Arrhenius life models
When overall thermal cycle number, times of thermal cycle in each second time is identical with the ripple voltage frequency at input lateral capacitance both ends,
It is worth for twice of power frequency, then overall thermal cycle number is converted into the B10 life-spans of switching device.
Wherein：A and α is model parameter, △ TjFor junction temperature fluctuation amplitude, TjmFor junction temperature maximums, EaFor activation energy, kbFor
Boltzmann constant.The frequency of thermal cycle is identical with the ripple voltage frequency at input lateral capacitance both ends, is twice of power frequency.
The parameter of Coffin-Manson-Arrhenius models is listed in Table 1 below.
The Coffin-Manson-Arrhenius life model parameters of table 1
| Parameter | Value |
| A | 3.4368*1014 |
| α | -4.923 |
| Ea | 0.066eV |
| kb | 8.61733*10-5eV |
The reliability of switching device is obtained by the B10 life-spans and two parameter Weibull distributions of switching device, by switching device
The B10 life-spans substitute into t, and R (t) takes 0.9, obtain characteristics life η.The relation curve for drawing time t and reliability R (t) is switched
The curve that the reliability of device changes over time.
Wherein：Characteristics life when η is R (t)=0.368, β is form parameter, and the β of switching device takes 2.5.
Maximum voltage V, the core temperature T born during according to the work of electric capacityhAnd the B10 of the life model prediction electric capacity of electric capacity
Life-span, electric capacity life model：
Wherein：L0For with reference to the life-span under operating mode, V0To be the life-span under actual condition with reference to the voltage under operating mode, L, V is
The actual maximum voltage born of electric capacity, T0For with reference to the core temperature under operating mode, γ is voltage stress constant.
The reliability of electric capacity is obtained by the B10 life-spans and two parameter Weibull distributions of electric capacity, and electric capacity β value takes 5, by electric capacity
The B10 life-spans substitute into t, and R (t) takes 0.9, obtain characteristics life η.The relation curve for drawing time t and reliability R (t) obtains electric capacity
The curve that changes over time of reliability.
S4, all switching devices are multiplied with the reliability of electric capacity, the reliability of DC charging module are obtained, so as to obtain
The reliability curve that the reliability of DC charging module changes over time；Ordinate i.e. reliability is found on reliability curve is
0.9 point, its abscissa are the B10 life-spans of DC charging module.
On the basis of device level reliability, life prediction and fail-safe analysis, system-level reliability choosing are carried out to system
Reliability block diagram is taken to be analyzed.By taking LLC resonant converter system as an example, redundancy is not present in LLC resonant converter system, any
Component failure can all cause thrashing, therefore reliability block diagram, using the form of series connection, system reliability structure such as Fig. 6 can
It is represented by by property model：
R (t)=RT1(t)RT2(t)RT3(t)RT4(t)RCf(t) (11),
Wherein, R (t) be system reliability, RT1(t)~RT4(t) it is the reliability of 4 switching devices, RCf(t) it is DC-
The reliability of Link electric capacity.
Experiment explanation is carried out with the example of LLC resonant converter below.
The simulation parameter of 3.8kW LLC resonant converter is as shown in table 2.
The LLC resonant converter parameter of table 2
| Nominal input voltage | 400V |
| Rated output voltage | 450V |
| Output voltage range | 200V~450V |
| Rated output power | 3.8kW |
| Resonant frequency fr | 110kHz |
| Maximum output current | 8.5A |
| Resonant inductance Lr | 19.33μH |
| Magnetizing inductance Lm | 48.32μH |
| Resonant capacitance Cr | 108.4nF |
| DC-Link electric capacity Cf | 68μF |
Simulation result：
Parameter in the hot simulation softwares of PLECS in table 2 establishes simulation model, and emulation obtains the junction temperature of switching device
Such as Fig. 7.The B10 life-spans of switching device are calculated by the life model of formula (10), and the B10 life-spans of electric capacity are by formula (14)
Life model is calculated, and the reliability point of the switching device and electric capacity under different frequency is obtained by two parameter Weibull distributions
Cloth, such as Fig. 8,9,10, the point marked in figure is B10 life-span points.By the reliability and reliability block diagram model of device, by each device
Reliability be multiplied, obtain system lifetim and reliability such as Figure 11.
Above example is merely to illustrate the design philosophy and feature of the present invention, and its object is to make technology in the art
Personnel can understand present disclosure and implement according to this, and protection scope of the present invention is not limited to above-described embodiment.So it is all according to
The equivalent variations made according to disclosed principle, mentality of designing or modification, within protection scope of the present invention.
Claims (6)
1. a kind of DC charging module life prediction and reliability estimation method, it is characterised in that：It comprises the following steps：
Switching device and electric capacity in S1, extraction DC charging module, the whole circuit of DC charging module is obtained according to electric model
Circuit parameter；
S2, respectively according to thermal model, obtain the junction temperature of each switching device, and the core temperature of each electric capacity；
S3, to switching device and electric capacity, establish life model respectively, calculate the B10 life-spans of each switching device and electric capacity, and tie
Close two parameter Weibull distributions and obtain the reliability of each switching device and electric capacity；
S4, all switching devices are multiplied with the reliability of electric capacity, the reliability of DC charging module are obtained, so as to obtain direct current
The reliability curve that the reliability of charging module changes over time；Ordinate i.e. reliability is found on reliability curve as 0.9
Point, its abscissa is the B10 life-spans of DC charging module.
2. DC charging module life prediction according to claim 1 and reliability estimation method, it is characterised in that：It is described
The junction temperature of switching device obtain in the following manner：
Tc=Ta+Ptot·Zth(c-a)；Tj=Tc+Ptot·Zth(j-c)；
Wherein：TaFor environment temperature；TcFor skin temperature；Zth(j-c)Equivalent heat impedance between knot and shell, uses switching device
Thermal impedance model be calculated；Zth(c-a)Thermal impedance between shell and environment；TjFor junction temperature；PtotFor the total of switching device
Power attenuation, it is conduction loss and switching loss sum.
3. DC charging module life prediction according to claim 1 and reliability estimation method, it is characterised in that：It is described
The junction temperature of switching device obtain in the following manner：
The circuit of DC charging module is built using the hot simulation softwares of PLECS, the databook by switching device is derailing switch
Heat description file of the part addition comprising thermal impedance model coefficient, emulates to the junction temperature of switching device, obtains junction temperature and time
Relation curve.
4. DC charging module life prediction according to claim 1 and reliability estimation method, it is characterised in that：It is described
The core temperature of electric capacity obtain in the following manner：
Th=Ta+PCZth(h-a)；
Wherein：ThFor the core temperature of electric capacity；TaFor environment temperature；PCLoss caused by the ESR of electric capacity is flowed through for ripple current；
Zth(h-a)Thermal impedance between capacitor core and environment.
5. DC charging module life prediction according to claim 1 and reliability estimation method, it is characterised in that：Pass through
The junction temperature T of switching devicejOverall thermal cycle during switching device failure is calculated with Coffin-Manson-Arrhenius life models
Number, times of thermal cycle in each second time is identical with the ripple voltage frequency at input lateral capacitance both ends, is worth for twice of power frequency,
Overall thermal cycle number is converted into the B10 life-spans of switching device again.
6. DC charging module life prediction according to claim 1 and reliability estimation method, it is characterised in that：According to
Maximum voltage V, the core temperature T born during the work of electric capacityhAnd the B10 life-spans of the life model prediction electric capacity of electric capacity, the electric capacity longevity
Order model：
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Wherein：L0For with reference to the life-span under operating mode, V0To be the life-span under actual condition with reference to the voltage under operating mode, L, V is electric capacity
The maximum voltage actually born, T0For with reference to the core temperature under operating mode, γ is voltage stress constant.
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| CN109710971A (en) * | 2018-11-20 | 2019-05-03 | 国家电网有限公司 | IGBT device reliability estimation method, device and model in high voltage DC breaker |
| CN111104756A (en) * | 2020-01-06 | 2020-05-05 | 西安交通大学 | Metallized film capacitor life prediction method based on task profile and aging analysis |
| CN112698130A (en) * | 2020-12-11 | 2021-04-23 | 西安交通大学 | Task profile-based accelerated life test device and method for metallized film capacitor |
| CN116338299A (en) * | 2023-05-29 | 2023-06-27 | 广东电网有限责任公司佛山供电局 | Method and system for testing output power factor of charging module of direct current system |
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