CN105589047A - Power supply aging test circuit - Google Patents
Power supply aging test circuit Download PDFInfo
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- CN105589047A CN105589047A CN201510973360.4A CN201510973360A CN105589047A CN 105589047 A CN105589047 A CN 105589047A CN 201510973360 A CN201510973360 A CN 201510973360A CN 105589047 A CN105589047 A CN 105589047A
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- power supply
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Provided is a power supply aging test circuit, relating to the power supply aging test technical field. The power supply aging test circuit comprises a square-wave generator; the input terminal of the square-wave generator is in connection with an RC oscillation circuit, and the output terminal of the square-wave generator is in connection with a control circuit; the control circuit comprises a silicon controlled rectifier diode; if the silicon controlled rectifier diode is conducted, the voltage inputted to the power supply to be detected is conducted to the power supply to be detected; if the silicon controlled rectifier diode is cut off, the voltage inputted to the power supply to be detected is cut off from the power supply to be detected. Accordingly, through the square-wave generator and the silicon controlled rectifier diode, the on and off control of the input voltage in a power supply aging test can be realized, thereby avoiding partial burning of a switching power supply in an input rectification portion possibly caused by using an alternating current contactor; the power supply aging test circuit has a simple structure, and can safely perform power supply aging test, and cause less damage to a power supply in test.
Description
Technical field
The present invention relates to power source aging technical field of measurement and test, particularly relate to a kind of burn in test circuit of power supply.
Background technology
In field of power supplies, before dispatching from the factory, power supply all needs to do burn-in test, and burn-in test generally has three kinds of modes.
First kind of way is normal aging: by power supply, directly band year energising is aging. The uninterrupted continuous working period of power supply is more than one month, and failsafe, does not burn phenomenon, and parameters is stable, and it is qualified to be considered as.
The second way is intermittent aging: Power supply belt is carried to intermittent energising burn-in test, and power supply, in load-carrying situation, is ceaselessly switched on and power-off, the shock resistance of testing power supply. Ageing time is more than one month, and failsafe, does not burn phenomenon, and parameters is stable, and it is qualified to be considered as.
Whether the third mode is accelerated ageing: power supply is positioned over to bringing onto load long-term work in high-temperature test chamber, checks its properties stable.
All be with in loaded situation in the output of Switching Power Supply, conventional intermittent burn-in test, it is input voltage on off test, normally control an A.C. contactor and reach the break-make control of input voltage with the time relay, still, A.C. contactor is mechanical switch, in make and break process, all can there is the phenomenon of shake in contact, may cause Switching Power Supply to burn out in the rectifying part of input, larger on the impact of Switching Power Supply.
Summary of the invention
The burn in test circuit that the object of the invention is to avoid weak point of the prior art and provide a kind of power supply, the circuit structure of the burn in test circuit of this power supply is simple, and the burn-in test that can realize power supply carries out safely, and the damage to power supply when test is little.
Object of the present invention is achieved through the following technical solutions:
A kind of burn in test circuit of power supply is provided, comprise square-wave generator, the input of described square-wave generator is connected to RC oscillating circuit, the output of described square-wave generator is connected to the control circuit that whether is switched to power supply to be measured for carry out control inputs according to the output of square wave acoustical generator to the voltage of power supply to be measured, and described control circuit comprises controllable silicon diode.
Described RC oscillating circuit is the RC oscillating circuit that can change frequency of oscillation.
The RC oscillating circuit that can change frequency of oscillation is the RC oscillating circuit that can change the resistance that participates in vibration.
The described RC oscillating circuit that can change the resistance that participates in vibration comprises toggle switch and electric resistance array, and described toggle switch accesses to the resistance value of RC oscillating circuit for controlling resistance array.
Described toggle switch comprises at least two sub-switches in parallel, and the same side of every sub-switch is a resistance of series resistor array respectively.
Described square-wave generator is that model is the square-wave generator of LM555.
Described toggle switch comprises the first sub-switch in parallel, the second sub-switch and the 3rd sub-switch, described RC oscillating circuit comprises the first resistance, the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance and the first electric capacity, described the first resistance is connected between the RESET pin and DISCH pin of LM555 square-wave generator, described the second resistance is connected to by the first sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 3rd resistance is connected to by the second sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 4th resistance is connected to by the 3rd sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 5th resistance is connected between the TRIG pin and DISCH pin of LM555 square-wave generator, the TRIG pin of LM555 square-wave generator is connected with THRES pin, described the first electric capacity is connected between the TRIG pin and ground of LM555 square-wave generator, dc source adds to described RC oscillating circuit through described toggle switch.
Described control circuit also comprises switching tube, transformer, primary rectifier and secondary commutation device, square-wave generator output high level, switching tube conducting, DC pulse power supply passes through transformer, primary rectifier, controllable silicon diode forms loop with ground, and then transformer produces electromotive force, its secondary output is by after the rectification of secondary commutation device, the control that voltage is added to controllable silicon diode is extremely gone up, controllable silicon diode current flow, make the voltage that inputs to power supply to be measured be switched to power supply to be measured, square-wave generator output low level, not conducting of switching tube, DC pulse power supply passes through transformer, rectifier, controllable silicon diode cannot with formation loop, ground, the not conducting of controllable silicon diode, make the voltage that inputs to power supply to be measured cannot be switched to power supply to be measured.
Described control circuit also comprises the 3rd electric capacity, the 4th electric capacity, the 5th electric capacity, the 7th resistance, the 8th resistance, as the first commutation diode of primary rectifier with as the second commutation diode of secondary commutation device, described switching tube is FET, the grid of described FET connects the OUT pin of described LM555 square-wave generator, the source ground of FET, DC pulse power supply is connected to the drain electrode of FET after elementary and second rectifies of transformer successively, secondary the 4th electric capacity that is connected to after the first rectifies successively of transformer, the control utmost point of controllable silicon diode is connected to the contact between the first commutation diode and the 4th electric capacity, the 7th resistance is connected between the control utmost point and negative electrode of controllable silicon diode, after the 5th electric capacity and the series connection of the 8th resistance, be connected between the anode and negative electrode of controllable silicon diode, the anode of controllable silicon diode connects the voltage that inputs to power supply to be measured, the negative electrode of controllable silicon diode is used for receiving survey power supply.
Described control circuit also comprises the 3rd electric capacity and the 6th resistance, and described the 3rd electric capacity is connected between the grid and source electrode of described FET, and described the 6th resistance is connected between the grid and source electrode of described FET.
The Vcc pin of described LM555 square-wave generator connects described dc source.
Beneficial effect of the present invention:
The burn in test circuit of a kind of power supply of the present invention, comprise square-wave generator, the output of described square-wave generator is connected to the control circuit for whether be switched to power supply to be measured to the voltage of power supply to be measured according to the output control inputs of square wave acoustical generator, described control circuit comprises controllable silicon diode, square-wave generator is for generation of controlling the whether low and high level of conducting of controllable silicon diode, whether conducting determines whether the voltage that inputs to power supply to be measured is switched to power supply to be measured to controllable silicon diode, the present invention has broken through the custom circuit (utilizing the time relay and A.C. contactor) of power source aging test, square-wave generator is applied to dexterously to the burn-in test field of power supply, the break-make control of the input voltage while realizing power source aging test by the combination of square-wave generator and controllable silicon diode, controllable silicon diode belongs to electronic switch, can avoid relay and the mechanical switch such as A.C. contactor and the situation that Switching Power Supply burns out in the rectifying part of input that may cause that produces occurs service time, circuit structure is simple, the burn-in test that can realize power supply carries out safely, damage to power supply when test is little.
RC oscillating circuit of the present invention is the RC oscillating circuit that can change frequency of oscillation, so just selects the flip-flop transition of the output level to square-wave generator according to actual needs, and the scope of application is wider.
The RC oscillating circuit that can change frequency of oscillation of the present invention is the RC oscillating circuit that can change the resistance that participates in vibration, it comprises toggle switch and electric resistance array, described toggle switch accesses to the resistance value of RC oscillating circuit for controlling resistance array, circuit structure is simple, handled easily.
Brief description of the drawings
Utilize accompanying drawing to be described further invention, but embodiment in accompanying drawing does not form any limitation of the invention, for those of ordinary skill in the art, is not paying under the prerequisite of creative work, can also obtain according to the following drawings other accompanying drawing.
Fig. 1 is the circuit diagram of the burn in test circuit of a kind of power supply of the present invention.
Detailed description of the invention
The invention will be further described with the following Examples.
The burn in test circuit of a kind of power supply of the present embodiment, comprise square-wave generator, the input of described square-wave generator is connected to the RC oscillating circuit that can change frequency of oscillation, and the output of described square-wave generator is connected to the control circuit for whether be switched to power supply to be measured to the voltage of power supply to be measured according to the output control inputs of square wave acoustical generator.
The described RC oscillating circuit that can change frequency of oscillation is the RC oscillating circuit that can change the resistance that participates in vibration, comprises toggle switch and electric resistance array, and described toggle switch accesses to the resistance value of RC oscillating circuit for controlling resistance array.
Described square-wave generator is that model is the square-wave generator of LM555, certainly, also can use the square-wave generator of other models.
Concrete, as shown in Figure 1, described toggle switch K1 comprises the first sub-switch in parallel, the second sub-switch and the 3rd sub-switch, described RC oscillating circuit comprises the first resistance R 8, the second resistance R 3, the 3rd resistance R 4, the 4th resistance R 1, the 5th resistance R 4 and the first capacitor C 1, described the first resistance R 8 is connected between the RESET pin and DISCH pin of LM555 square-wave generator U1, described the second resistance R 3 is connected to by the first sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator U1, described the 3rd resistance R 2 is connected to by the second sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator U1, described the 4th resistance R 1 is connected to by the 3rd sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator U1, described the 5th resistance R 4 is connected between the TRIG pin and DISCH pin of LM555 square-wave generator U1, the TRIG pin of LM555 square-wave generator U1 is connected with THRES pin, described the first capacitor C 1 is connected between the TRIG pin and ground of LM555 square-wave generator U1, the dc source VCC of 15V adds to described RC oscillating circuit through described toggle switch K1.
Described control circuit comprises FET Q1, transformer T1, controllable silicon diode SCR1, the 3rd capacitor C 3, the 4th capacitor C 4, the 5th capacitor C 5, the 7th resistance R 6, the 8th resistance R 7, the first commutation diode D1 and the second commutation diode D2, the grid of described FET Q1 connects the OUT pin of described LM555 square-wave generator U1, the source ground of FET Q1, DC pulse power vd D is connected to the drain electrode of FET Q1 after elementary and the second commutation diode D2 rectification of transformer T1 successively, the secondary of transformer T1 is connected to the 4th capacitor C 4 successively after the first commutation diode D1 rectification, the control utmost point of controllable silicon diode SCR1 is connected to the contact between the first commutation diode D1 and the 4th capacitor C 4, the 7th resistance R 6 is connected between the control utmost point and negative electrode of controllable silicon diode SCR1, after the 5th capacitor C 5 and the 8th resistance R 7 series connection, be connected between the anode and negative electrode of controllable silicon diode SCR1, the anode of controllable silicon diode SCR1 connects the voltage (INPUT inputs to the anode of controllable silicon diode SCR1 for inputing to the voltage of power supply to be measured) that inputs to power supply to be measured, the negative electrode of controllable silicon diode SCR1 is used for receiving survey power supply (OUTPUT is for being connected to power supply to be measured).
Described control circuit also comprises the 3rd capacitor C 3 and the 6th resistance R 5, described the 3rd capacitor C 3 is connected between the grid and source electrode of described FET Q1, described the 6th resistance R 5 is connected between the grid and source electrode of described FET Q1, can prevent controllable silicon diode SCR1 misoperation.
The dc source VCC of described 15V is through the second capacitor C 2 ground connection, and the second capacitor C 2 is carried out filtering to dc source VCC.
The operation principle of the present embodiment is as follows:
Resistance R 1, R2, R3, R4, R8 and capacitor C 1 are the peripheral oscillating devices of LM555 square-wave generator U1, by with the above annexation of toggle switch K1, can be used for the time constant of the peripheral oscillating device RC that adjusts LM555 square-wave generator U1, change the frequency of oscillation of LM555 square-wave generator U1, realize the height-low level upset of output different time.
Square-wave generator U1 exports high level, FET Q1 conducting, DC pulse power vd D forms loop by transformer T1, the second commutation diode D2, controllable silicon diode SCR1 with ground, and then transformer T1 produces electromotive force, its secondary output is by after the first commutation diode D1 rectification, the control that voltage is added to controllable silicon diode SCR1 is extremely gone up, and controllable silicon diode SCR1 conducting makes the voltage that inputs to power supply to be measured be switched to power supply to be measured.
Square-wave generator U1 output low level, not conducting of FET Q1, DC pulse power vd D by transformer T1, the second commutation diode D2, controllable silicon diode SCR1 cannot with formation loop, ground, not conducting of controllable silicon diode SCR1, makes the voltage that inputs to power supply to be measured cannot be switched to power supply to be measured.
The burn in test circuit of a kind of power supply of the present embodiment, break through the custom circuit (utilizing the time relay and A.C. contactor) of power source aging test, square-wave generator is applied to dexterously to the burn-in test field of power supply, the break-make control of the input voltage while realizing power source aging test by the combination of square-wave generator and controllable silicon diode, controllable silicon diode belongs to electronic switch, can avoid relay and the mechanical switch such as A.C. contactor and the situation that Switching Power Supply burns out in the rectifying part of input that may cause that produces occurs service time, circuit structure is simple, the burn-in test that can realize power supply carries out safely, damage to power supply when test is little.
The RC oscillating circuit of the present embodiment is the RC oscillating circuit that can change frequency of oscillation, so just selects the flip-flop transition of the output level to square-wave generator according to actual needs, and the scope of application is wider.
The RC oscillating circuit that can change frequency of oscillation of the present embodiment is the RC oscillating circuit that can change the resistance that participates in vibration, it comprises toggle switch and electric resistance array, described toggle switch accesses to the resistance value of RC oscillating circuit for controlling resistance array, circuit structure is simple, handled easily.
Finally should be noted that; above embodiment is only in order to illustrate technical scheme of the present invention; but not limiting the scope of the invention; although the present invention has been done to explain with reference to preferred embodiment; those of ordinary skill in the art is to be understood that; can modify or be equal to replacement technical scheme of the present invention, and not depart from essence and the scope of technical solution of the present invention.
Claims (10)
1. the burn in test circuit of a power supply, it is characterized in that: comprise square-wave generator, the input of described square-wave generator is connected to RC oscillating circuit, the output of described square-wave generator is connected to control circuit, described control circuit comprises controllable silicon diode, the voltage that described controllable silicon diode current flow inputs to power supply to be measured is switched to power supply to be measured, and voltage and power supply to be measured that described controllable silicon diode cut-off inputs to power supply to be measured disconnect.
2. the burn in test circuit of a kind of power supply as claimed in claim 1, is characterized in that: described RC oscillating circuit is the RC oscillating circuit that can change frequency of oscillation.
3. the burn in test circuit of a kind of power supply as claimed in claim 2, is characterized in that: the RC oscillating circuit that can change frequency of oscillation is the RC oscillating circuit that can change the resistance that participates in vibration.
4. the burn in test circuit of a kind of power supply as claimed in claim 3, it is characterized in that: the described RC oscillating circuit that can change the resistance that participates in vibration comprises toggle switch and electric resistance array, described toggle switch accesses to the resistance value of RC oscillating circuit for controlling resistance array.
5. the burn in test circuit of a kind of power supply as claimed in claim 4, is characterized in that: described toggle switch comprises at least two sub-switches in parallel, and the same side of every sub-switch is a resistance of series resistor array respectively.
6. the burn in test circuit of a kind of power supply as claimed in claim 4, is characterized in that: described square-wave generator is that model is the square-wave generator of LM555.
7. the burn in test circuit of a kind of power supply as claimed in claim 5, it is characterized in that: described toggle switch comprises the first sub-switch in parallel, the second sub-switch and the 3rd sub-switch, described RC oscillating circuit comprises the first resistance, the second resistance, the 3rd resistance, the 4th resistance, the 5th resistance and the first electric capacity, described the first resistance is connected between the RESET pin and DISCH pin of LM555 square-wave generator, described the second resistance is connected to by the first sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 3rd resistance is connected to by the second sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 4th resistance is connected to by the 3rd sub-switch between the RESET pin and DISCH pin of LM555 square-wave generator, described the 5th resistance is connected between the TRIG pin and DISCH pin of LM555 square-wave generator, the TRIG pin of LM555 square-wave generator is connected with THRES pin, described the first electric capacity is connected between the TRIG pin and ground of LM555 square-wave generator, dc source adds to described RC oscillating circuit through described toggle switch.
8. the burn in test circuit of a kind of power supply as described in claim 1 or 7, it is characterized in that: described control circuit also comprises switching tube, transformer, primary rectifier and secondary commutation device, square-wave generator output high level, switching tube conducting, DC pulse power supply passes through transformer, primary rectifier, controllable silicon diode forms loop with ground, and then transformer produces electromotive force, its secondary output is by after the rectification of secondary commutation device, the control that voltage is added to controllable silicon diode is extremely gone up, controllable silicon diode current flow, make the voltage that inputs to power supply to be measured be switched to power supply to be measured, square-wave generator output low level, not conducting of switching tube, DC pulse power supply passes through transformer, rectifier, controllable silicon diode cannot with formation loop, ground, the not conducting of controllable silicon diode, make the voltage that inputs to power supply to be measured cannot be switched to power supply to be measured.
9. the burn in test circuit of a kind of power supply as claimed in claim 8, it is characterized in that: described control circuit also comprises the 3rd electric capacity, the 4th electric capacity, the 5th electric capacity, the 7th resistance, the 8th resistance, as the first commutation diode of primary rectifier with as the second commutation diode of secondary commutation device, described switching tube is FET, the grid of described FET connects the OUT pin of described LM555 square-wave generator, the source ground of FET, DC pulse power supply is connected to the drain electrode of FET after elementary and second rectifies of transformer successively, secondary the 4th electric capacity that is connected to after the first rectifies successively of transformer, the control utmost point of controllable silicon diode is connected to the contact between the first commutation diode and the 4th electric capacity, the 7th resistance is connected between the control utmost point and negative electrode of controllable silicon diode, after the 5th electric capacity and the series connection of the 8th resistance, be connected between the anode and negative electrode of controllable silicon diode, the anode of controllable silicon diode connects the voltage that inputs to power supply to be measured, the negative electrode of controllable silicon diode is used for receiving survey power supply.
10. the burn in test circuit of a kind of power supply as claimed in claim 9, it is characterized in that: described control circuit also comprises the 3rd electric capacity and the 6th resistance, described the 3rd electric capacity is connected between the grid and source electrode of described FET, and described the 6th resistance is connected between the grid and source electrode of described FET.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510973360.4A CN105589047A (en) | 2015-12-22 | 2015-12-22 | Power supply aging test circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510973360.4A CN105589047A (en) | 2015-12-22 | 2015-12-22 | Power supply aging test circuit |
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| CN105589047A true CN105589047A (en) | 2016-05-18 |
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| CN201510973360.4A Pending CN105589047A (en) | 2015-12-22 | 2015-12-22 | Power supply aging test circuit |
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| CN (1) | CN105589047A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106501737A (en) * | 2016-10-11 | 2017-03-15 | 深圳Tcl数字技术有限公司 | Switching Power Supply test device |
| CN107807289A (en) * | 2017-10-24 | 2018-03-16 | 中国电力科学研究院有限公司 | A kind of DC charging module life prediction and reliability estimation method |
| CN109239618A (en) * | 2018-09-06 | 2019-01-18 | 凌云光技术集团有限责任公司 | A kind of full-automatic ageing system of light source power and method |
| CN115166462A (en) * | 2022-07-04 | 2022-10-11 | 赖俊生 | Method, device and equipment for continuously monitoring full life cycle of semiconductor |
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Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106501737A (en) * | 2016-10-11 | 2017-03-15 | 深圳Tcl数字技术有限公司 | Switching Power Supply test device |
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| CN107807289A (en) * | 2017-10-24 | 2018-03-16 | 中国电力科学研究院有限公司 | A kind of DC charging module life prediction and reliability estimation method |
| CN107807289B (en) * | 2017-10-24 | 2020-03-10 | 中国电力科学研究院有限公司 | Method for predicting service life and evaluating reliability of direct current charging module |
| CN109239618A (en) * | 2018-09-06 | 2019-01-18 | 凌云光技术集团有限责任公司 | A kind of full-automatic ageing system of light source power and method |
| CN115166462A (en) * | 2022-07-04 | 2022-10-11 | 赖俊生 | Method, device and equipment for continuously monitoring full life cycle of semiconductor |
| CN115166462B (en) * | 2022-07-04 | 2023-08-22 | 赖俊生 | Method, device and equipment for continuously detecting full life cycle of semiconductor chip |
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Application publication date: 20160518 |
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