CN107806933B - Device and method for measuring laser-induced shock wave velocity of optical material - Google Patents

Device and method for measuring laser-induced shock wave velocity of optical material Download PDF

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CN107806933B
CN107806933B CN201711295075.7A CN201711295075A CN107806933B CN 107806933 B CN107806933 B CN 107806933B CN 201711295075 A CN201711295075 A CN 201711295075A CN 107806933 B CN107806933 B CN 107806933B
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CN107806933A (en
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刘志超
耿锋
吴倩
郑轶
王翔峰
王健
许乔
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Laser Fusion Research Center China Academy of Engineering Physics
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Abstract

The invention provides a method for measuring the in-vivo shock wave velocity of a laser-induced optical material based on a double-beam time-resolved pumping detection technology. A method for measuring the laser induced shock wave velocity of an optical material, the method comprising the steps of: 1) The double-beam detection imaging system acquires two images of the same position at a certain moment when the pump laser pulse excites the internal shock wave of the sample to be detected, and the time interval is set; 2) Based on an image processing algorithm, comparing the variation of the wave crest envelope position of the shock wave in the two images, and calculating and obtaining the shock wave speed at a certain moment. The invention establishes a double-beam detection imaging system, one path of pumping laser pulse acts on the optical material and excites the induced shock wave phenomenon, the double-path detection laser pulse irradiates to the excitation area at a certain time interval, the double-path detection light carrying shock wave position information is respectively captured by detection, and the laser induced shock wave speed at any moment can be accurately measured by changing the delay amount between the pumping laser pulse and the detection laser pulse.

Description

Device and method for measuring laser-induced shock wave velocity of optical material
Technical Field
The invention belongs to the technical field of high-speed measurement, and particularly relates to an accurate measurement device and method for laser-induced shock wave velocity of an optical material based on a time-resolved pumping detection technology.
Background
The nanosecond laser induced damage problem of optical materials is an important problem in the field of high-power laser optical material production for a long time, and theoretical research related to a damage physical mechanism can provide direction guidance for material growth process improvement. Extensive research has shown that nanosecond laser induced bulk damage to optical materials is often associated with defects of the material itself, including various types of impurity defects, electronic defects, structural defects, and the like. The physical mechanism of defect induced damage is quite complex, wherein laser induced shock waves are generated in the middle and later stages of the action of optical materials and laser pulses, and the propagation rule of the laser induced shock waves has a decisive influence on the formation of macroscopic features of damage to an optical material body. Therefore, quantitative measurement of the shock wave velocity is of great significance to the theoretical investigation of damage to an optical material body.
The accurate measurement of the laser-induced shock wave velocity is difficult, firstly, compared with the propagation of shock waves in free space, the propagation distance of shock waves in a material is limited due to the size limitation of a sample to be measured, and the measurement system is required to have extremely rapid time response capability; secondly, for some nonlinear optical materials, the shock wave shows anisotropic characteristics when propagating in the material body, and the velocity of each different direction needs to be measured one by one, so that the measurement difficulty is greatly increased; meanwhile, the impact fluctuation mechanical characteristics reflect the explosion internal energy intensity, and the impact wave speed under different delay amounts needs to be measured so as to obtain the propagation dynamics rule of the impact wave.
The laser induced shock wave velocity can be measured based on a time-resolved pump detection technique. Some researches adopt a single nanosecond laser to carry out multiplexing mode of pump light and detection light so as to realize shock wave velocity measurement, but the delay between the pump light and the detection light under the condition of a single laser usually adopts an optical delay mode, the delay amount is very limited, and the research on the middle-stage and later-stage physical phenomena of shock wave material laser damage is limited. In addition, due to overlong nanosecond exposure time, a certain smear is formed on the peak of the shock wave which propagates at high speed, so that accurate judgment on the position is seriously affected, and the measurement error is larger. In order to solve the smear problem, some studies use a picosecond or femtosecond laser with shorter pulse as a pumping source and probe light. However, the action mechanism of picosecond and femtosecond lasers on materials is completely different from nanosecond lasers, and the substitution makes the shock wave velocity measurement result lose applicability in the research of nanosecond induced damage mechanism.
Disclosure of Invention
The invention aims to provide a device and a method for measuring the in-vivo shock wave velocity of a laser-induced optical material based on a double-beam time-resolved pumping detection technology.
The technical scheme adopted for solving the technical problems is as follows: a method for measuring the laser induced shock wave velocity of an optical material, the method comprising the steps of:
1) The double-beam detection imaging system acquires two images of the same position at a certain moment when the pump laser pulse excites the internal shock wave of the sample to be detected, and the time interval is set;
2) Based on an image processing algorithm, comparing the variation of the wave crest envelope position of the shock wave in the two images, and calculating and obtaining the shock wave speed at a certain moment.
Further, the step 1) is: adjusting the pulse energy of the pumping laser to enable the sample (8) to be tested to be in the laser flux F i Generating body damage and explosion shock waves, adjusting delay delta T between pumping laser pulses and detection laser pulses, setting delay tau between double-beam sub-detection light, and collecting two shock wave crest surface position shadow images with time interval tau at the same position; the step 2) is as follows: comparing the propagation distance difference delta R of the shock wave crest in the two images, the instantaneous speed is v=delta R/tau, and the laser flux F is changed i And detecting the delay delta T to obtain the shock wave velocity expression of v=phi { F, delta T }.
Further, the step 1) is: the pumping laser emits nanosecond laser pulse, laser flux is adjusted through the energy attenuator, then the nanosecond laser pulse is incident into the sample to be detected through the second transmission reflector, and the energy density of the laser focus is F i Inducing material damage and exciting explosion shock wave; controlling a detection laser by a digital delay generator, and pumping laser pulseAfter the flushing out delta T i The method comprises the steps of emitting detection light pulses at moment, carrying out light path pointing adjustment on the detection light pulses through a first transmission reflector, dividing the detection light pulses into double detection light S light and P light with mutually perpendicular polarization directions through a first polarization splitting prism, enabling the S light to enter a time-delay light path formed by a first backward emitter, a second backward emitter and a third backward emitter, and enabling the S light to travel an additional light path through adjusting the distances between the second backward emitter and the first backward emitter and between the second backward emitter and the third backward emitter so as to obtain time-delay tau between the S light and the P light; after the S light and the P light are combined through the second polarization beam splitting prism, the S light and the P light are coaxially incident into a shock wave excitation area of the sample to be detected, and at the moment, the P light carries delta T i Time-of-day shockwave position information, whereas S-light carries DeltaT i Time +τ shockwave position information; after S light and P light carrying the position information of the shock waves at different moments are separated again through the third polarization splitting prism, the P light enters the first CCD microscope, the S light enters the second CCD microscope, and transient shadow images are obtained in a dark field imaging mode.
Further, the step 2) is: the upper computer extracts, analyzes and stores the transient shadow image signals, and respectively obtains delta T through a binarization image edge searching and processing algorithm i Moment shock wave radius R ip And DeltaT i Shock wave radius R at +τ is The travel distance of the peak surface of the shock wave within tau time interval is delta R i =R is -R ip At DeltaT i The wave speed of the time shock wave is v i =ΔR i τ, change of laser energy density F i And detecting the light delay DeltaT i The shockwave velocity expression v=Φ { F, Δt } can be obtained.
An optical material laser induced shock wave velocity measuring device, comprising:
laser generating device: emitting double laser pulses and controlling the delay amount between the double laser pulses;
an optical delay system: controlling the delay amount between the two detection sub-beams;
and the signal acquisition and analysis system comprises: and acquiring and analyzing the transient shadow image of the shock wave.
Further, the laser generating device comprises a detection laser, a pump laser and a digital delay generator arranged between the detection laser and the pump laser, wherein the detection laser adopts a picosecond pulse laser for generating detection light pulses for detecting the peak surface position of the shock wave in the sample to be detected, the pump laser adopts a nanosecond pulse laser for inducing damage of the sample to be detected and generating pump laser pulses for exciting shock waves of optical materials, and the digital delay generator is used for precisely controlling delay amount between the pump pulses and the detection pulses.
Further, a first transmission reflector, a first polarization beam splitting prism and a second polarization beam splitting prism are further arranged between the detection laser and the optical delay system and used for controlling the beam transmission trend, realizing accurate focusing and realizing polarization separation and beam combination of the detection beam, and an energy attenuator and a second transmission reflector are further arranged behind the optical path of the pumping laser and used for adjusting the pumping laser pulse energy and controlling the beam transmission trend, so that accurate focusing is realized.
Further, the emission center wavelength of the detection laser is 532nm, the pulse width is 50ps, and the repetition frequency is 5Hz, so that ultra-fast detection pulses are generated; the emission center wavelength of the pumping laser is 355nm, the pulse width is 3.5ns, the repetition frequency is 5Hz, and the pumping laser is used for exciting and inducing explosion shock waves in a sample to be detected; the delay control range of the digital delay generator is 0 to 2000s, and the control precision is 1ns.
Further, the optical delay system comprises a first backward emitter, a second backward emitter and a third backward emitter, and the delay between the two detection sub-beams is realized by adjusting the distance between the second backward emitter and the first backward emitter and the distance between the second backward emitter and the third backward emitter.
Further, the signal acquisition and analysis system comprises a first CCD microscope, a second CCD microscope and an upper computer, wherein the first CCD microscope and the second CCD microscope are used for photographing and acquiring transient shadow images of the shock waves under the double-beam delay detection illumination, and the upper computer is used for extracting, analyzing and storing signals of the transient shadow images of the shock waves acquired by the first CCD microscope and the second CCD microscope and controlling the time sequence of the digital delay generator; and a third polarization splitting prism is further arranged between the first CCD microscope and the second CCD microscope and used for realizing polarization separation and beam combination of the detection light beams.
The beneficial effects of the invention are as follows: the method is based on a time resolution pumping detection technology, a double-beam detection imaging system is established, one path of pumping laser pulse acts on an optical material and excites and induces a shock wave phenomenon, two paths of detection laser pulses are irradiated to an excitation area at a certain time interval, two paths of detection light carrying shock wave position information are respectively captured by detection, displacement vectors of shock waves in the time interval are obtained through an image processing algorithm, and then transient wave speed of the shock waves is obtained. By changing the delay amount between the pumping laser pulse and the detecting laser pulse, the laser induced shock wave velocity at any moment can be accurately measured. The method of the invention adopts the picosecond laser light source as the detection light, can obtain clear imaging effect, and has picosecond control precision by combining the electric delay and the optical delay, so the method has high measurement precision when the laser-induced shock wave velocity is measured. The transient dynamics of laser induced shock waves in transparent materials can be studied by the method.
Drawings
Fig. 1 is a schematic diagram of the working principle of the present invention.
Fig. 2 is a schematic view of the optical path of the device of the present invention.
FIG. 3 is a schematic view of the invention in vivo shockwave shadow imaging of a sample to be tested.
Detailed Description
As shown in figure 1, the invention adopts a double-beam detection imaging system, which consists of a pumping laser, a detection laser, an electrical delay system, an optical delay system and a double-imaging detector, and the basic working principle is that the pumping laser pulse is sent out by a nanosecond laser, is transmitted and focused in a sample to be detected through the optical system, and the energy of the pumping laser pulse is regulated to exceed a certain flux threshold value, thereby generating body damage and destruction in the sample to be detected and triggering explosion shock waves. Meanwhile, the electrical delay system controls the delay amount of the picosecond laser to emit detection laser, the detection laser is divided into two sub-beams with mutually perpendicular polarization directions after passing through the polarization light separator, and the delay between the sub-beams is controlled by the optical delay system. The sub-beams are combined by the polarization beam combiner after delay adjustment, and the combined detection light is incident to a shock wave region of the sample to be detected. Shadow images carrying shockwave position information are acquired by a dual imaging detector. And extracting information from the shadow images by using an image processing algorithm, and calculating the transient speed of the shock wave by accurately comparing the difference value of the positions of the wave crest faces of the shock wave between the two images.
Specifically, as shown in fig. 2, the device of the invention comprises a laser generating device, an optical delay system and a signal acquisition and analysis system. The laser generating device comprises a detection laser 1, a pump laser 2 and a digital delay generator 9 arranged between the detection laser 1 and the pump laser 2, wherein the detection laser 1 adopts a picosecond pulse laser for generating detection light pulses for detecting the peak surface position of a shock wave in a sample 8 to be detected, the pump laser 2 adopts a nanosecond pulse laser for inducing the sample 8 to be detected to be damaged and generating pump laser pulses for exciting shock waves of optical materials, and the digital delay generator 9 is used for precisely controlling the delay amount between the pump pulses and the detection pulses.
The optical delay system is used for detecting the laser pulse to generate double detection light with a certain time interval, and comprises a first backward emitter 601, a second backward emitter 602 and a third backward emitter 603, and the time delay between the two detection sub-beams is realized by adjusting the distance between the second backward emitter 602 and the first backward emitter 601 and the distance between the second backward emitter 602 and the third backward emitter 603.
The invention is also provided with a first transmission reflector 301, a first polarization splitting prism 501 and a second polarization splitting prism 502 between the detection laser 1 and the optical delay system, which are used for controlling the beam transmission trend, realizing accurate focusing and realizing the polarization separation and beam combination of the detection beam, and an energy attenuator 4 and a second transmission reflector 302 behind the optical path of the pump laser 2, which are used for adjusting the pump laser pulse energy and controlling the beam transmission trend, so as to realize accurate focusing.
The signal acquisition and analysis system comprises a first CCD microscope 701, a second CCD microscope 702 and an upper computer 10, wherein the first CCD microscope 701 and the second CCD microscope 702 are used for photographing and acquiring transient shadow images of shock waves under double-beam delay detection illumination, and the upper computer 10 is used for extracting, analyzing and storing signals of the transient shadow images of the shock waves acquired by the first CCD microscope 701 and the second CCD microscope 702 and controlling the time sequence of the digital delay generator 9.
The present invention further provides a third polarization splitting prism 503 between the first CCD microscope 701 and the second CCD microscope 702, for implementing polarization splitting and beam combining of the probe beam.
The invention preferably has the advantages that the emission center wavelength of the detection laser 1 is 532nm, the pulse width is 50ps, the repetition frequency is 5Hz, and the detection laser is used for generating ultra-fast detection pulses; the central wavelength of the emission of the pumping laser 2 is 355nm, the pulse width is 3.5ns, and the repetition frequency is 5Hz, so as to excite and induce the sample to be tested to generate explosion shock waves; the delay amount of the digital delay generator 9 is controlled to be in the range of 0 to 2000s, and the control precision is 1ns.
The method for measuring the shock wave velocity in the laser-induced optical material body comprises the following steps:
1) The pumping laser 2 emits nanosecond laser pulse, laser flux adjustment is carried out through the energy attenuator 4, then the nanosecond laser pulse is incident into the body of the sample 8 to be detected through the second transmission reflector 302, and the energy density of the laser focus is F i Inducing material damage and exciting explosion shock wave;
2) The digital delay generator 9 controls the detection laser 1 to generate delta T after the pumping laser pulse is emitted i The detection light pulse is emitted at any time, the detection light pulse is subjected to light path direction adjustment through the first transmission reflector 301, and is divided into two beams of detection light S polarized light and P polarized light (hereinafter referred to as S light and P light) with the polarization directions being perpendicular to each other through the first polarization splitting prism 501, wherein the S light enters the first beam of detection lightIn the time-delay light path formed by the backward emitter 601, the second backward emitter 602 and the third backward emitter 603, the distance between the second backward emitter 602 and the first backward emitter 601 and the distance between the second backward emitter 602 and the third backward emitter 603 are adjusted so that the S light travels an additional light path, and the time-delay tau between the S light and the P light is obtained;
3) After the S light and the P light are combined by the second polarization splitting prism 502, the S light and the P light are coaxially incident into a shock wave excitation area of the sample 8 to be detected, and at the moment, the P light carries delta T i Time-of-day shockwave position information, whereas S-light carries DeltaT i Time +τ shockwave position information;
4) After the S light and the P light carrying the position information of the shock waves at different moments are separated again through the third polarization splitting prism 503, the P light enters the first CCD microscope 701, the S light enters the second CCD microscope 702, and transient shadow images are obtained in a dark field imaging mode;
5) The upper computer 10 extracts, analyzes and stores the transient shadow image signals, and respectively obtains delta T through a binarization image edge searching and processing algorithm i Moment shock wave radius R ip (as shown in FIG. 3 a), and DeltaT i Shock wave radius R at +τ is (as shown in FIG. 3 b), the peak surface of the shock wave travels a distance DeltaR within a time interval of τ i =R is -R ip As shown in FIG. 3c, since τ can be controlled to be on the order of ps by optical retardation, it can be approximately considered to be at i The wave speed of the time shock wave is v i =ΔR i τ, change of laser energy density F i And detecting the light delay DeltaT i The shockwave velocity expression v=Φ { F, Δt } can be obtained.
The detection laser adopts a picosecond laser, so that the single-frame imaging detection precision obtained by the detection laser is in the picosecond order; the electrical delay system adopts a delay trigger, and can randomly set a trigger electric signal with a delay interval in a time range of 1ns to 10 s; the optical delay system adopts an optical delay line, and the delay time amount can be arbitrarily set within the time range of 1ps to 15 ns; after the detection laser pulse is split by the polarization beam splitter, the delay amount between two detection laser pulses with orthogonal polarization directions is controlled by the optical delay system.
The detection laser is divided into two beams of S light and P light with perpendicular vibration directions by a polarization beam splitter, and the time interval between the S light and the P light is changed by adjusting the length of an optical delay line. The pump laser pulse acts on the inside of the optical material to be measured, and the energy of the pump laser pulse is adjusted to enable the pump laser pulse to exceed the excitation threshold value of the material shock wave, so that shock waves are generated with the focusing area. The coaxial double-beam detection light S light and P light are perpendicular to the pumping laser direction and transmit the shock wave excitation area of the optical material to be detected. The dual imaging microscope synchronously performs dark field imaging on the transmitted S light and P light, respectively.
The image processing algorithm adopts a binarization image edge searching algorithm to respectively obtain dark field images of shock wave fronts under S light and P light irradiation within a set time interval. And calculating the position difference of the impact wave crest surface in the two dark field images, and dividing the position difference by the time interval of the S light and the P light to obtain the instantaneous wave speed of the impact wave. Changing the delay amount of the delay trigger, and repeating the steps to obtain the instantaneous wave speed of the shock wave at different moments.
The image acquisition triggering mode of the double-imaging microscope is external triggering. The time interval adjustment precision of the S light and the P light is 1ps. The time interval adjustment precision of the pumping laser pulse and the detection laser pulse is 1ns. The absolute value of the difference between the incidence angles of the S light and the P light is not more than 1 degree.

Claims (6)

1. The method for measuring the laser-induced shock wave velocity of the optical material is characterized by comprising the following steps of:
1) The double-beam detection imaging system acquires two images of the same position and a set time interval at a certain moment of the internal shock wave of the sample (8) to be detected excited by the pumping laser pulse;
2) Based on an image processing algorithm, comparing the variation of the wave crest envelope position of the shock wave in the two images, calculating and obtaining the shock wave speed at a certain moment,
the step 2) is as follows: the upper computer (10) extracts, analyzes and stores transient shadow image signals, and respectively obtains delta T through a binarization image edge searching and processing algorithm i Moment shock wave radius R ip And DeltaT i Shock wave radius R at +τ is The travel distance of the peak surface of the shock wave within tau time interval is delta R i =R is -R ip At DeltaT i The wave speed of the time shock wave is v i =ΔR i τ, change of laser energy density F i And detecting the light delay DeltaT i The shockwave velocity expression v=Φ { F, Δt } can be obtained.
2. The method for measuring the laser induced shock wave velocity of an optical material according to claim 1, wherein the step 1) is: adjusting the pulse energy of the pumping laser to enable the sample (8) to be tested to be in the laser flux F i Generating body damage and explosion shock waves, adjusting delay delta T between pumping laser pulses and detection laser pulses, setting delay tau between double-beam sub-detection light, and collecting two shock wave crest surface position shadow images with time interval tau at the same position; the step 2) is as follows: comparing the propagation distance difference delta R of the shock wave crest in the two images, the instantaneous speed is v=delta R/tau, and the laser flux F is changed i And detecting the delay delta T to obtain the shock wave velocity expression of v=phi { F, delta T }.
3. The method for measuring the laser induced shock wave velocity of an optical material according to claim 1, wherein the step 1) is: the pumping laser (2) emits nanosecond laser pulse, laser flux is adjusted by the energy attenuator (4), then the nanosecond laser pulse is incident into the sample (8) to be detected through the second transmission reflector (302), and the energy density of the laser focus is F i Inducing material damage and exciting explosion shock wave; the detection laser (1) is controlled by a digital delay generator (9), delta T after the pump laser pulse is emitted i The method comprises the steps of emitting detection light pulses at any moment, performing light path direction adjustment on the detection light pulses through a first transmission reflector (301), and dividing the detection light pulses into double detection light beams S light and P light with mutually perpendicular polarization directions through a first polarization splitting prism (501), wherein the S light enters a first backward emitter (601), a second backward emitter (602) and a third backward emitter (603)By adjusting the distance between the second backward emitter (602) and the first backward emitter (601) and between the second backward emitter (602) and the third backward emitter (603), the S light travels an additional optical path, thereby obtaining the delay amount τ between the S light and the P light; after the S light and the P light are combined through the second polarization beam splitting prism (502), the S light and the P light are coaxially incident into a shock wave excitation area of the sample (8) to be detected, and at the moment, the P light carries delta T i Time-of-day shockwave position information, whereas S-light carries DeltaT i Time +τ shockwave position information; after S light and P light carrying the position information of the shock wave at different moments are separated again through a third polarization splitting prism (503), the P light enters a first CCD microscope (701), the S light enters a second CCD microscope (702), and transient shadow images are obtained in a dark field imaging mode.
4. The measuring device of the laser induced shock wave velocity of the optical material is characterized by comprising:
laser generating device: emitting double laser pulses and controlling the delay amount between the double laser pulses;
the laser generating device comprises a detection laser (1), a pump laser (2) and a digital delay generator (9) arranged between the detection laser (1) and the pump laser (2), wherein the detection laser (1) adopts a picosecond pulse laser for generating detection light pulses for detecting the peak surface position of a shock wave in a sample (8) to be detected, the pump laser (2) adopts a nanosecond pulse laser for inducing the damage of the sample (8) to be detected and generating pump laser pulses for exciting shock waves of an optical material, and the digital delay generator (9) is used for precisely controlling the delay amount between the pump pulses and the detection pulses;
an optical delay system: controlling the delay amount between the two detection sub-beams;
the optical delay system comprises a first backward emitter (601), a second backward emitter (602) and a third backward emitter (603), and the delay between the two detection sub-beams is realized by adjusting the distance between the second backward emitter (602) and the first backward emitter (601) and the distance between the second backward emitter (602) and the third backward emitter (603);
and the signal acquisition and analysis system comprises: collecting and analyzing the transient shadow image of the shock wave;
the signal acquisition and analysis system comprises a first CCD microscope (701), a second CCD microscope (702) and an upper computer (10), wherein the first CCD microscope (701) and the second CCD microscope (702) are used for photographing and acquiring transient shadow images of shock waves under double-beam delay detection illumination, and the upper computer (10) is used for extracting, analyzing and storing signals of the transient shadow images of the shock waves acquired by the first CCD microscope (701) and the second CCD microscope (702) and controlling the time sequence of a digital delay generator (9); a third polarization splitting prism (503) is further arranged between the first CCD microscope (701) and the second CCD microscope (702) and is used for realizing polarization separation and beam combination of the detection light beams.
5. The measuring device of the laser induced shock wave velocity of the optical material according to claim 4, characterized in that a first transmission reflector (301), a first polarization splitting prism (501) and a second polarization splitting prism (502) are further arranged between the detection laser (1) and the optical delay system, and are used for controlling the beam transmission trend, realizing accurate focusing and for realizing polarization separation and beam combination of the detection beam, and an energy attenuator (4) and a second transmission reflector (302) are further arranged behind the optical path of the pump laser (2), and are used for adjusting the pulse energy of the pump laser and controlling the beam transmission trend, so as to realize accurate focusing.
6. The measuring device of the laser induced shock wave velocity of the optical material according to claim 4, wherein the detection laser (1) emits a central wavelength of 532nm, a pulse width of 50ps, and a repetition frequency of 5Hz for generating ultra-fast detection pulses; the pump laser (2) emits 355nm of center wavelength, 3.5ns of pulse width and 5Hz of repetition frequency, and is used for exciting and inducing explosion shock waves in the sample (8) to be detected; the delay amount control range of the digital delay generator (9) is 0 to 2000s, and the control precision is 1ns.
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Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007068979A1 (en) * 2005-12-16 2007-06-21 Bae Systems Plc Detection of defects in welded structures
CN102297898A (en) * 2011-05-17 2011-12-28 南京理工大学 Laser ultrasonic measuring method for third order elastic constant of metal
WO2012109733A1 (en) * 2011-02-15 2012-08-23 Luxmux Technology Corporation A fully integrated complementary metal oxide semiconductor (cmos) fourier transform infrared (ftir) spectrometer and raman spectrometer
CN102721824A (en) * 2012-06-27 2012-10-10 中国科学院力学研究所 Method and device for measuring particle velocity with low velocity and high acceleration characteristics
CN202547784U (en) * 2012-04-18 2012-11-21 安徽三联事故预防研究所 Measuring device of delay double-pulse laser generated plasma
WO2015009339A1 (en) * 2013-07-19 2015-01-22 Mayo Foundation For Medical Education And Research System and method for measurement of shear wave speed from multi-directional wave fields
CN104757959A (en) * 2015-04-20 2015-07-08 上海工程技术大学 Pulse wave transmission velocity detecting method and system based on image foldover
CN105092595A (en) * 2015-08-31 2015-11-25 哈尔滨工业大学(威海) Photo-acoustic elastic imaging method and device applied to rail flaw detection
CN105203461A (en) * 2015-09-17 2015-12-30 天津大学 Method for detecting piezoelectric material surface layer Young modulus through laser acoustic surface waves
WO2016127745A1 (en) * 2015-02-10 2016-08-18 Beijing Zhigu Rui Tuo Tech Co., Ltd. Method and device for determining action and/or action part
CN106645033A (en) * 2016-09-29 2017-05-10 西南科技大学 Integrated ultra-fast optical component laser damage diagnosis device
CN106940222A (en) * 2017-04-07 2017-07-11 中国工程物理研究院激光聚变研究中心 Four sensitivity laser fusion shock velocity stellar interferometers
CN107179132A (en) * 2017-05-09 2017-09-19 中国工程物理研究院激光聚变研究中心 Optical fiber image transmission beam velocity interferometer and shock velocity computational methods
CN207472432U (en) * 2017-12-08 2018-06-08 中国工程物理研究院激光聚变研究中心 The measuring device of optical material induced with laser shock wave velocity of wave

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005036192A1 (en) * 2005-08-02 2007-02-08 Robert Bosch Gmbh Fuel injection system e.g. high pressure-based fuel injection system, controlling method for e.g. self-ignition internal combustion engine, involves implementing compression wave correction based on periodic model that models masses wave
US8118744B2 (en) * 2007-02-09 2012-02-21 Duke University Methods, systems and computer program products for ultrasound shear wave velocity estimation and shear modulus reconstruction
JP5768429B2 (en) * 2011-03-23 2015-08-26 セイコーエプソン株式会社 Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device

Patent Citations (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007068979A1 (en) * 2005-12-16 2007-06-21 Bae Systems Plc Detection of defects in welded structures
WO2012109733A1 (en) * 2011-02-15 2012-08-23 Luxmux Technology Corporation A fully integrated complementary metal oxide semiconductor (cmos) fourier transform infrared (ftir) spectrometer and raman spectrometer
CN102297898A (en) * 2011-05-17 2011-12-28 南京理工大学 Laser ultrasonic measuring method for third order elastic constant of metal
CN202547784U (en) * 2012-04-18 2012-11-21 安徽三联事故预防研究所 Measuring device of delay double-pulse laser generated plasma
CN102721824A (en) * 2012-06-27 2012-10-10 中国科学院力学研究所 Method and device for measuring particle velocity with low velocity and high acceleration characteristics
WO2015009339A1 (en) * 2013-07-19 2015-01-22 Mayo Foundation For Medical Education And Research System and method for measurement of shear wave speed from multi-directional wave fields
WO2016127745A1 (en) * 2015-02-10 2016-08-18 Beijing Zhigu Rui Tuo Tech Co., Ltd. Method and device for determining action and/or action part
CN104757959A (en) * 2015-04-20 2015-07-08 上海工程技术大学 Pulse wave transmission velocity detecting method and system based on image foldover
CN105092595A (en) * 2015-08-31 2015-11-25 哈尔滨工业大学(威海) Photo-acoustic elastic imaging method and device applied to rail flaw detection
CN105203461A (en) * 2015-09-17 2015-12-30 天津大学 Method for detecting piezoelectric material surface layer Young modulus through laser acoustic surface waves
CN106645033A (en) * 2016-09-29 2017-05-10 西南科技大学 Integrated ultra-fast optical component laser damage diagnosis device
CN106940222A (en) * 2017-04-07 2017-07-11 中国工程物理研究院激光聚变研究中心 Four sensitivity laser fusion shock velocity stellar interferometers
CN107179132A (en) * 2017-05-09 2017-09-19 中国工程物理研究院激光聚变研究中心 Optical fiber image transmission beam velocity interferometer and shock velocity computational methods
CN207472432U (en) * 2017-12-08 2018-06-08 中国工程物理研究院激光聚变研究中心 The measuring device of optical material induced with laser shock wave velocity of wave

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
ELASTIC‐WAVE VELOCITY MEASUREMENTS IN ROCKS AND OTHER MATERIALS BY PHASE‐DELAY METHODS;E. A. Kaarsberg;《GEOPHYSICS》;第40卷(第6期);955-960 *
激光激发表面波与亚表面缺陷作用的理论研究;金磊;《固体力学学报》;第38卷(第02期);170-179 *

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