CN107783378B - A kind of vertical micromotion structure of litho machine and control method - Google Patents

A kind of vertical micromotion structure of litho machine and control method Download PDF

Info

Publication number
CN107783378B
CN107783378B CN201610766749.6A CN201610766749A CN107783378B CN 107783378 B CN107783378 B CN 107783378B CN 201610766749 A CN201610766749 A CN 201610766749A CN 107783378 B CN107783378 B CN 107783378B
Authority
CN
China
Prior art keywords
photo
etching machine
signal
analysis system
vertical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201610766749.6A
Other languages
Chinese (zh)
Other versions
CN107783378A (en
Inventor
赵娟
张霖
夏海
陈明
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Micro Electronics Equipment Co Ltd
Original Assignee
Shanghai Micro Electronics Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Micro Electronics Equipment Co Ltd filed Critical Shanghai Micro Electronics Equipment Co Ltd
Priority to CN201610766749.6A priority Critical patent/CN107783378B/en
Publication of CN107783378A publication Critical patent/CN107783378A/en
Application granted granted Critical
Publication of CN107783378B publication Critical patent/CN107783378B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70716Stages
    • G03F7/70725Stages control
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70766Reaction force control means, e.g. countermass
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/709Vibration, e.g. vibration detection, compensation, suppression or isolation

Landscapes

  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Toxicology (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)

Abstract

The present invention provides a kind of vertical micromotion structure of litho machine and control method, at least four sensors will be arranged below photo-etching machine exposal platform in it, and use the calculating analysis system of the measurement transition matrix comprising capableing of Measurement redundancy position, position signal transmitted by four sensors is analyzed, using the desired locations of photo-etching machine exposal platform as target, analyze acceleration when photo-etching machine exposal platform catenary motion to desired locations, due to using above-mentioned calculating analysis system that can measure redundant position, therefore these useless redundant datas can be filtered when calculating analysis, accurately analyze driving force and acceleration required when photo-etching machine exposal platform catenary motion to desired locations, therefore the present invention can be improved the precision to photo-etching machine exposal platform vertical fine motion control compared with the existing technology.

Description

A kind of vertical micromotion structure of litho machine and control method
Technical field
The present invention relates to semiconductor lithography machine field, in particular to the vertical micromotion structure of a kind of litho machine and control method.
Background technique
Lithographic equipment is a kind of machine that mask pattern is applied on target silicon wafer, be mainly used for integrated circuit IC or The manufacture of other microdevices.By lithographic equipment, the layered mask with different mask patterns in the case where precisely aligning successively at Picture is on the silicon wafer for being coated with photoresist, such as semi-conductor silicon chip or LCD panel.Lithographic equipment is generally divided into two classes, Yi Leishi Stepping lithographic equipment, by the exposure area that whole mask pattern single exposures are imaged on to silicon wafer;Another kind of is scanning Lithographic equipment, by the way that the pattern of mask plate is imaged in silicon in the forward direction of scanning direction projection exposure field or reverse scan movement On piece.
In precise motion equipment, object gravity is affected to catenary motion, needs to take measures to compensate.Close In litho machine over year, the combination that gravity compensator adds vertical motor, the special balance drive object of gravity compensator are generallyd use Gravity, it is most common with gas-powered, also have by magnetic suspension or spring driven, and vertical motor is then responsible for driving object Catenary motion carries out decoupling control.
In existing technology, the vertical control of exposure desk generally uses three gravity compensators and three vertical motors common Driving.Gravity compensator provides stable static force, balances the gravity of exposure desk;Vertical motor provides dynamic force, driving exposure Platform catenary motion.Design level and rotation air-bearing make it have the freedom degree in the direction Z, Rx and Ry in gravity compensator, lead to It crosses vertical motor driven object and does decoupling motion relative to lower lying body.
In precise motion equipment in the prior art, the control of vertical motor and gravity compensator is generally controlled using separated The mode of system controls Z, Rx and Ry Three Degree Of Freedom of object.As Chinese patent CN201210104004.5 (publication number: CN103365108A, publication date: on October 23rd, 2013) described in, three motor vertical to exposure desk and three pneumatically supported controls point For two control loops: the first via is used to control vertical motor, and the second tunnel is used to control gravity compensator, vertical motor and gravity Compensator Parallel Control moving object can be adjusted respective control object by debugging two paths respectively, but still So do not overcome the problems, such as that vertical bandwidth is relatively low, response speed is partially slow.
Summary of the invention
To solve the above problems, the invention proposes a kind of vertical micromotion structure of litho machine and control methods, to improve The precision of control.
In order to achieve the above objectives, the present invention provides a kind of vertical micromotion structure of litho machine, including
Several gravity compensators are symmetrically distributed in the lower surface of photo-etching machine exposal platform;
Several driving devices are symmetrically distributed in the lower surface of the photo-etching machine exposal platform;
Several sensors are symmetrically distributed in the quadrangle of the photo-etching machine exposal platform, for the photo-etching machine exposal platform Position carry out redundant measurement, and send amount of redundancy data-signal;
The mass center and the litho machine of mass center, all driving device formation that all gravity compensators are formed expose The mass center of light table is overlapped;
Further include a calculating analysis system, is sent according to the physical location of the photo-etching machine exposal platform measured and the sensor Amount of redundancy data-signal, after carrying out data analysis conversion, Xiang Suoshu driving device and the gravity compensator send control letter Number, the driving device and the gravity compensator adjust institute after receiving the control signal that the calculating analysis system is sent State the position of photo-etching machine exposal platform.
Preferably, the number of the sensor is at least four.
Preferably, the calculating analysis system and the driving device, the sensor form control loop, the control Circuit processed includes sequentially connected analysis module, control module, the driving device, the sensor, feedback module, described anti- It presents module and connects the analysis module.
Preferably, there is the feedback module redundant position to measure transition matrix.
Preferably, the analysis module includes the generator module being sequentially connected in series, summation comparator, feedover summer, It further include the feedforward gain module in parallel with the summation comparator.
Preferably, the generator module includes setting value generator parallel with one another, command generator and track letter Number generator.
Preferably, the setting value generator is digital signal processor or microprocessor.
Preferably, making X-axis with horizontal direction, it is in the horizontal plane Y-axis perpendicular to the direction of X-axis, is made with vertical direction For Z axis, XYZ coordinate system is established in litho machine, the summation comparator includes Z axis summation comparator, Rx axis summation comparator And Ry axis summation comparator.
Preferably, the control module includes signal controller parallel with one another, the signal controller includes Z axis position Set controller, Rx axis Position Control device and Ry axis Position Control device.
Preferably, being also in series with gain transition matrix module between the control module and the driving device.
Preferably, being also in series with configuration state equation model module between the driving device and the sensor.
Preferably, the calculating analysis system is also connected with exciter response device.
Preferably, the exciter response device is symmetrically distributed in photo-etching machine exposal platform quadrangle, the exciter response The node of vibration mode of position where device different from the photo-etching machine exposal platform.
Preferably, the gravity compensator is magnetic gravitation compensator.
Preferably, the driving device is voice coil motor.
The present invention also provides a kind of vertical fine motion control methods of litho machine, are symmetrical arranged in the lower surface of photo-etching machine exposal platform Several gravity compensators, several driving devices, in several symmetrical sensors of the quadrangle of the photo-etching machine exposal platform, Mass center, the mass center of all driving device formation and the matter of the photo-etching machine exposal platform that all gravity compensators are formed The heart is overlapped, using the calculating analysis system with redundant position measurement transition matrix, according to the reality of the photo-etching machine exposal platform measured The amount of redundancy data-signal that border position and the sensor are sent, after carrying out data analysis conversion, Xiang Suoshu driving device and institute It states gravity compensator and sends control signal, the driving device and the gravity compensator are receiving the calculating analysis system The position that the photo-etching machine exposal platform is adjusted after the control signal of transmission makes it reach desired locations.
Preferably, the following steps are included:
Step S1: three voice coil motors, four sensors and four gravity are installed on the photo-etching machine exposal platform and are mended Device is repaid, and the voice coil motor, sensor are all connect with calculating analysis system with the gravity compensator;
Step S2: the actual position coordinate for calculating analysis system and measuring the photo-etching machine exposal platform at this time, the meter Setting value generator in point counting analysis system sets the desired locations coordinate and desired acceleration of the photo-etching machine exposal platform;
Step S3: the command generator calculated in analysis system is by actual position coordinate described in step S2 and described Desired locations coordinate compares in summation comparator, the error signal compared is sent to signal controller, and by described The error signal is converted logic axle control force signal by signal controller;Trajectory signal hair in the calculating analysis system Raw device is calculated according to the result compared generates Acceleration Control signal;
Step S4: the Acceleration Control signal in step S3 forms feedforward compensation letter after feedforward gain module Number, and control force signal is formed by feedforward summer;
Step S5: by all signals in step S3 neutralization procedure S4 by redundant position measurement transition matrix conversion The driving signal for obtaining the voice coil motor afterwards, after receiving the driving signal, the voice coil motor drives the photoetching The movement of machine exposure desk.
It is in the horizontal plane Y-axis perpendicular to the direction of X-axis, to hang down preferably, making X-axis with horizontal direction Histogram establishes XYZ coordinate system, the redundant position measures transition matrix to as Z axis in litho machineWherein lyi, lxiIt (i=1,2,3......n) is respectively the sensor position To photo-etching machine exposal platform center of gravity distance projection in the Y direction with the length in X-direction, ξi(i=1,2,3,4) it shakes for the i-th rank The Mode Shape parameter in the sensor position is moved, n is the number of the sensor, n >=4.
Preferably, Mode Shape parameter ξi(i=1,2,3,4) determination method are as follows: in the photo-etching machine exposal platform four The symmetrical exciter response device in angle, tapping the photo-etching machine exposal platform using power hammer vibrates the photo-etching machine exposal platform, together The exercise data at four exciter response devices when photo-etching machine exposal platform described in Shi Suoshu sensor measurement vibrates is concurrent It send to the calculating analysis system, the calculating analysis system obtains the photo-etching machine exposal by Mode Shape discrimination method The vibration amplitude of the Mode Shape of platform and each exciter response device position.
Preferably, the calculating analysis system obtains the vibration amplitude of each exciter response device position Method is the movement of vibration at the photo-etching machine exposal platform four exciter response devices places for sending the sensor Data are sent to A/D converter, the signal of the exercise data are converted into digital signal, and carry out Fu to the digital signal In leaf transformation, frequency response function is formed by digital signal processing method, the calculating analysis system is by all exciter responses The frequency response function that the exercise data that device is sent is formed carries out parameter identification, estimates the Mode Shape of the photo-etching machine exposal platform With the vibration amplitude at each exciter response device place.
Compared with prior art, the beneficial effects of the present invention are: the present invention provide a kind of vertical micromotion structure of litho machine and At least four sensors will be arranged in control method below photo-etching machine exposal platform, and using comprising capableing of Measurement redundancy position The calculating analysis system for measuring transition matrix, analyzes position signal transmitted by four sensors, with photo-etching machine exposal The desired locations of platform are target, analyze acceleration when photo-etching machine exposal platform catenary motion to desired locations, above-mentioned due to using It calculates analysis system and is able to carry out redundant measurement, therefore be able to suppress maximum frequency in vibration frequency curve when calculating analysis The Mode Shape that rate is shown, accurately analyze driving force required when photo-etching machine exposal platform catenary motion to desired locations and Acceleration, therefore the present invention can be improved the precision to photo-etching machine exposal platform vertical fine motion control compared with the existing technology.
Detailed description of the invention
Fig. 1 is vertical micromotion structure schematic diagram provided by the invention;
Fig. 2 is the control system architecture schematic diagram of vertical micromotion structure provided by the invention;
Fig. 3 is that the exposure desk vertical mode parameter method of determination that the present invention provides motivates respective point schematic diagram;
Fig. 4 compares figure to letter is passed for Ry under normal triaxial driving and redundant drive provided by the invention;
Fig. 5 is parameter identification method flow chart provided by the invention.
In figure: 100- photo-etching machine exposal platform, the first voice coil motor of 101a-, the second voice coil motor of 101b-, 101c- third sound Enclose motor, the first gravity compensator of 102a-, the second gravity compensator of 102b-, 102c- third gravity compensator, 102d- the 4th Gravity compensator, 103a- first sensor, 103b- second sensor, 103c- 3rd sensor, the 4th sensor of 103d-, 201- configuration state equation model, 202- gain transition matrix, 203- measurement transition matrix, 204- generator module, 205- letter Number controller, 206- feedforward gain module, 207- summation comparator, 208- feedforward summer, the first exciter response of 301a- device, The second exciter response of 301b- device, 301c- third exciter response device, the 4th exciter response device of 301d-.
Specific embodiment
In order to make the foregoing objectives, features and advantages of the present invention clearer and more comprehensible, with reference to the accompanying drawing to the present invention Specific embodiment be described in detail.
Fig. 1 is please referred to, the present invention provides a kind of vertical micromotion structure of litho machine, including
Several gravity compensators are symmetrically distributed in the lower surface of photo-etching machine exposal platform 100, in the present embodiment, share Four symmetrical gravity compensators, respectively the first gravity compensator 102a, the second gravity compensator 102b, third gravity Compensator 102b, the 4th gravity compensator 102d, gravity compensator are specially that magnetic compensation device can with vertical repulsion To be compensated to gravity;
Several driving devices are symmetrically distributed in the lower surface of the photo-etching machine exposal platform 100, in the present embodiment, drive Dynamic device is specially voice coil motor, and 100 lower surface of photo-etching machine exposal platform is dispersed with three symmetrical voice coil motors, respectively First voice coil motor 101a, the second voice coil motor 101b, third voice coil motor 101c;
Several sensors are symmetrically distributed in the quadrangle of the photo-etching machine exposal platform 100, for the photo-etching machine exposal The position of platform 100 carries out redundant measurement, and sends amount of redundancy data-signal, and there are four symmetrical biographies altogether in the present embodiment Sensor, respectively first sensor 103a, second sensor 103b, 3rd sensor 103c, the 4th sensor 103d;
The mass center and the litho machine of mass center, all voice coil motor formation that all gravity compensators are formed expose The mass center of light table 100 is overlapped;
It further include a calculating analysis system, according to the physical location of the photo-etching machine exposal platform 100 measured and the sensor The redundant position data-signal of transmission, after carrying out data analysis conversion, Xiang Suoshu driving device and the gravity compensator are sent Signal, the driving device and the gravity compensator are controlled after receiving the control signal that the calculating analysis system is sent Adjust the position of the photo-etching machine exposal platform 100.
Specifically, referring to figure 2., the calculating analysis system is to be formed and controlled with three voice coil motors, four sensors Circuit, the control loop include sequentially connected analysis module, control module, three voice coil motors, four sensors and Feedback module, the feedback module connect the analysis module.
Analysis module includes the generator module 204 being sequentially connected in series, summation comparator 207, feedforward summer 208, is also wrapped Include the feedforward gain module 206 in parallel with the summation comparator 207.
Preferably, the feedback module is the measurement transition matrix 203 with redundant position.
Preferably, the generator module 204 include setting value generator in parallel, command generator (not shown) and Trajectory signal generator (not shown).
Preferably, the setting value generator is digital signal processor or microprocessor.
Preferably, making X-axis with horizontal direction, it is in the horizontal plane Y-axis perpendicular to the direction of X-axis, is made with vertical direction For Z axis, XYZ coordinate system is established in litho machine, the summation comparator 207 includes that Z axis summation comparator, the Rx axis of parallel connection are asked With comparator and Ry axis summation comparator.
Preferably, the control module includes signal controller 205, the signal controller 205 includes Z axis in parallel Positioner, Rx axis Position Control device and Ry axis Position Control device.
Preferably, being also in series with gain transition matrix 202 between the control module and the voice coil motor.
Preferably, being also in series with configuration state equation model 201 between the voice coil motor and the measuring device.
Preferably, being symmetrically distributed with exciter response device at 100 4 jiaos of the photo-etching machine exposal platform, respectively first swashs Responsor 301a, the second exciter response device 301b, third exciter response device 301c, the 4th exciter response device 301d are encouraged, it is all to swash The position where responding device is encouraged different from the node of vibration mode of the photo-etching machine exposal platform 100.
The present invention also provides a kind of fine motion control method using the vertical micromotion structure of above-mentioned litho machine, specifically:
Step S1: the photoetching machine equipment with the vertical micromotion structure of above-mentioned litho machine is provided;
Step S2: the actual position coordinate for calculating analysis system and measuring the photo-etching machine exposal platform 100 at this time, it is described Calculate analysis system in setting value generator set the photo-etching machine exposal platform 100 desired locations coordinate (Z, Rx, Ry) and It is expected that acceleration (acc_z, acc_rx, acc_ry);
Step S3: the command generator calculated in analysis system is by actual position coordinate described in step 1 and described Desired locations coordinate (Z, Rx, Ry) compares in summation comparator, and the error signal compared is sent to signal controller 205, and logic axle control force signal is converted by the error signal by the signal controller 205Generator Trajectory signal generator in module 204 is calculated according to the result compared generates Acceleration Control signal, Acceleration Control Signal is by obtaining the distance between the actual position coordinate and the desired locations coordinate (Z, Rx, Ry) differential;
Step S4: the Acceleration Control signal in step S3 forms feedforward compensation after feedforward gain module 206 SignalAnd control force signal is formed by feedforward summer 208;
Step S5: by all signals in step S4 after the measurement transition matrix 203 of the redundant position converts To the driving signal of three voice coil motors, its calculation formula isWherein lyi, lxi(i=1,2,3,4) be respectively all the sensors position to photo-etching machine exposal platform 100 center of gravity distance projection in the Y direction and X Length on direction, φ are contribution amount of the sensor to the i-th first order mode.When φ is taken as 0, then the i-th rank vibration frequency will be by Inhibit, ξi(i=1,2,3,4) is Mode Shape parameter of the i-th rank vibration in sensor position, Z1、Z2、Z3、Z4Respectively four The vertical position coordinate of sensor, after receiving driving signal, three voice coil motors drive the photo-etching machine exposal platform 100 to transport It is dynamic.
Measurement transition matrix 203 is not limited to only receive the signal of 4 sensor transmissions, when needing multiple sensors, Calculation matrix is shown asWherein n is the number of sensor, n >=4.Institute as above It states, general 4 sensors can only compensate first-order modal, that is to say, that the mode of certain single order in can inhibiting vertical, due to photoetching Machine exposure desk 100 is high-frequency vibration, and influence of this vibration to control precision is relatively small, so 4 sensors only need to inhibit Peak value namely maximum vibration frequency of the photo-etching machine exposal platform 100 on vibration frequency curve.
Referring to figure 4., it can be seen from the figure that Ry is provided to the first order frequency showed on letter is passed using the present invention Be capable of Measurement redundancy position measurement transition matrix measurement after be effectively suppressed, it is possible thereby to effectively improve control precision.
Preferably, Mode Shape parameter ξiThe determination method of (i=1,2,3,4) are as follows: referring to figure 3. and Fig. 5, described 100 4 jiaos of photo-etching machine exposal platform symmetrical exciter response devices are made described using the power hammer percussion photo-etching machine exposal platform 100 Photo-etching machine exposal platform 100 vibrate, while photo-etching machine exposal platform 100 described in sensor measurement vibrate when exercise data and be sent to The calculating analysis system, the photo-etching machine exposal platform 100 for calculating analysis system and sending the exciter response device Vibration motion data are sent to A/D converter, so that the signal of 100 exercise data of photo-etching machine exposal platform is converted into digital signal, And Fourier transformation is carried out to the digital signal, frequency response function, the calculating analysis are formed by digital signal processing method The frequency response function that the exercise data that all exciter response devices are sent is formed is carried out parameter identification by system, utilizes multinomial Curve-fitting method estimate the photo-etching machine exposal platform 100 Mode Shape and each exciter response device position Vibration amplitude, the as Mode Shape of the position.
In view of each point has an x, y, z three degree of freedom, then 4 points totally 12 vibration amplitudes.Current embodiment require that at least Determine 4 Mode Shape parameters, theoretically at least four point can just be met the requirements, it is contemplated that sensor can be added, inhibit more Mode, therefore the points that can be chosen are greater than 4 points, that is to say, that number can be set greater than four sensors.In this reality It applies in example, ξ1234Respectively the first exciter response device 301a, the second exciter response device 301b, third exciter response device Z at 301c, the 4th position exciter response device 301d is to amplitude.
The present invention provides a kind of vertical micromotion structure of photoetching and control method, will be arranged below photo-etching machine exposal platform 100 At least four sensors, and using the calculating analysis system of the measurement transition matrix 203 comprising capableing of Measurement redundancy position, to four Position signal transmitted by a sensor is analyzed, and using the desired locations of photo-etching machine exposal platform 100 as target, analyzes litho machine Acceleration when 100 catenary motion of exposure desk to desired locations is surveyed due to using above-mentioned calculating analysis system to be able to carry out redundancy Amount, therefore it is able to suppress the Mode Shape that maximum frequency is shown in vibration frequency curve when calculating analysis, accurately Driving force and acceleration required when 100 catenary motion of photo-etching machine exposal platform to desired locations are analyzed, therefore the present invention is opposite It can be improved the precision to the vertical fine motion of photo-etching machine exposal platform 100 control in the prior art.
Above-described embodiment is described in the present invention, but the present invention is not limited only to above-described embodiment.Obvious this field Technical staff can carry out various modification and variations without departing from the spirit and scope of the present invention to invention.If in this way, this hair These bright modifications and variations within the scope of the claims of the present invention and its equivalent technology, then the invention is also intended to include Including these modification and variations.

Claims (20)

1. a kind of vertical micromotion structure of litho machine, which is characterized in that including
Several gravity compensators are symmetrically distributed in the lower surface of photo-etching machine exposal platform;
Several driving devices are symmetrically distributed in the lower surface of the photo-etching machine exposal platform;
Several sensors are symmetrically distributed in the quadrangle of the photo-etching machine exposal platform, for the position to the photo-etching machine exposal platform Carry out redundant measurement is set, and sends amount of redundancy data-signal;
The mass center and the photo-etching machine exposal platform of mass center, all driving device formation that all gravity compensators are formed Mass center be overlapped;
Further include a calculating analysis system, is sent according to the physical location of the photo-etching machine exposal platform measured and the sensor superfluous Headroom data signal, after carrying out data analysis conversion, Xiang Suoshu driving device and the gravity compensator send control signal, institute It states driving device and the gravity compensator and adjusts the light after receiving the control signal that the calculating analysis system is sent Quarter machine exposure desk position;
The calculating analysis system and the driving device, the sensor form control loop.
2. the vertical micromotion structure of litho machine as described in claim 1, which is characterized in that the number of the sensor is at least four It is a.
3. the vertical micromotion structure of litho machine as described in claim 1, which is characterized in that the calculating analysis system and the drive Dynamic device, the sensor form control loop, and the control loop includes sequentially connected analysis module, control module, institute Driving device, the sensor, feedback module are stated, the feedback module connects the analysis module.
4. the vertical micromotion structure of litho machine as claimed in claim 3, which is characterized in that the feedback module has redundant position Measure transition matrix.
5. the vertical micromotion structure of litho machine as claimed in claim 3, which is characterized in that the analysis module includes being sequentially connected in series Generator module, summation comparator, feedforward summer, further include and summation comparator feedforward gain module in parallel.
6. the vertical micromotion structure of litho machine as claimed in claim 5, which is characterized in that the generator module includes mutually simultaneously Setting value generator, command generator and the trajectory signal generator of connection.
7. the vertical micromotion structure of litho machine as claimed in claim 6, which is characterized in that the setting value generator is number letter Number processor or microprocessor.
8. the vertical micromotion structure of litho machine as claimed in claim 5, which is characterized in that make X-axis with horizontal direction, in horizontal plane On perpendicular to the direction of X-axis be that Y-axis using vertical direction as Z axis establishes XYZ coordinate system in litho machine, the summation is compared Device includes Z axis summation comparator, Rx axis summation comparator and Ry axis summation comparator.
9. the vertical micromotion structure of litho machine as claimed in claim 8, which is characterized in that the control module includes parallel with one another Signal controller, the signal controller includes Z axis positioner, Rx axis Position Control device and Ry axis Position Control Device.
10. the vertical micromotion structure of litho machine as claimed in claim 3, which is characterized in that the control module and the driving Gain transition matrix module is also in series between device.
11. the vertical micromotion structure of litho machine as claimed in claim 3, which is characterized in that the driving device and the sensing Configuration state equation model module is also in series between device.
12. the vertical micromotion structure of litho machine as claimed in claim 3, which is characterized in that the calculating analysis system is also connected with There is exciter response device.
13. the vertical micromotion structure of litho machine as claimed in claim 12, which is characterized in that the exciter response device symmetrically divides Cloth is in the position where photo-etching machine exposal platform quadrangle, the exciter response device different from the vibration shape of the photo-etching machine exposal platform Node.
14. the vertical micromotion structure of litho machine as described in claim 1, which is characterized in that the gravity compensator is magnetic force weight Force compensating device.
15. the vertical micromotion structure of litho machine as described in claim 1, which is characterized in that the driving device is voice coil motor.
16. a kind of vertical fine motion control method of litho machine, which is characterized in that if being symmetrical arranged in the lower surface of photo-etching machine exposal platform Dry gravity compensator, several driving devices, in several symmetrical sensors of the quadrangle of the photo-etching machine exposal platform, institute Mass center, the mass center of all driving device formation and the mass center of the photo-etching machine exposal platform for thering is the gravity compensator to be formed It is overlapped, using the calculating analysis system with redundant position measurement transition matrix, according to the reality of the photo-etching machine exposal platform measured The amount of redundancy data-signal that position and the sensor are sent, after carrying out data analysis conversion, Xiang Suoshu driving device and described Gravity compensator sends control signal, the driving device and the gravity compensator and is receiving the calculating analysis system hair The position that the photo-etching machine exposal platform is adjusted after the control signal sent makes it reach desired locations;
The calculating analysis system and the driving device, the sensor form control loop.
17. the vertical fine motion control method of litho machine as claimed in claim 16, which comprises the following steps:
Step S1: installing three voice coil motors, four sensors and four gravity compensators on the photo-etching machine exposal platform, And the voice coil motor, sensor are all connect with calculating analysis system with the gravity compensator;
Step S2: the actual position coordinate for calculating analysis system and measuring the photo-etching machine exposal platform at this time, described calculate are divided Setting value generator in analysis system sets the desired locations coordinate and desired acceleration of the photo-etching machine exposal platform;
Step S3: the command generator calculated in analysis system is by actual position coordinate described in step S2 and the expectation Position coordinates compare in summation comparator, the error signal compared are sent to signal controller, and by the signal The error signal is converted logic axle control force signal by controller;Trajectory signal generator in the calculating analysis system It is calculated according to the result compared and generates Acceleration Control signal;
Step S4: the Acceleration Control signal in step S3 forms feedforward compensation signal after feedforward gain module, and Control force signal is formed by feedforward summer;
Step S5: by all signals in step S3 neutralization procedure S4 after redundant position measurement transition matrix conversion To the driving signal of the voice coil motor, after receiving the driving signal, the voice coil motor drives the litho machine to expose Light table movement.
18. the vertical fine motion control method of litho machine as claimed in claim 16, which is characterized in that X-axis is made with horizontal direction, XYZ coordinate system is established in litho machine using vertical direction as Z axis for Y-axis perpendicular to the direction of X-axis on horizontal plane, it is described superfluous Remaining position measures transition matrixWherein lyi, lxi(i=1,2,3......n) divide Not Wei the sensor position to photo-etching machine exposal platform center of gravity distance projection in the Y direction with the length in X-direction, ξi(i= It 1,2,3,4) is the vibration of the i-th rank in the Mode Shape parameter of the sensor position, n is the number of the sensor, n >=4.
19. the vertical fine motion control method of litho machine as claimed in claim 18, which is characterized in that Mode Shape parameter ξi(i= 1,2,3,4) determination method are as follows: in the symmetrical exciter response device in photo-etching machine exposal platform quadrangle, hammered into shape and tapped using power The photo-etching machine exposal platform vibrates the photo-etching machine exposal platform, while photo-etching machine exposal platform described in the sensor measurement vibrates When four exciter response devices at exercise data and be sent to the calculating analysis system, the calculating analysis system By Mode Shape discrimination method, obtain the photo-etching machine exposal platform Mode Shape and each exciter response device institute Vibration amplitude in position.
20. the vertical fine motion control method of litho machine as claimed in claim 19, which is characterized in that the calculating analysis system obtains The method for taking the vibration amplitude of each exciter response device position is the litho machine for sending the sensor The exercise data vibrated at where the exposure desk four exciter response devices is sent to A/D converter, by the exercise data Signal be converted into digital signal, and Fourier transformation is carried out to the digital signal, is formed by digital signal processing method Frequency response function, it is described calculate frequency response function that the exercise data that analysis system sends all exciter response devices is formed into The identification of row parameter estimates the vibration at the Mode Shape and each exciter response device place of the photo-etching machine exposal platform Amplitude.
CN201610766749.6A 2016-08-30 2016-08-30 A kind of vertical micromotion structure of litho machine and control method Active CN107783378B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610766749.6A CN107783378B (en) 2016-08-30 2016-08-30 A kind of vertical micromotion structure of litho machine and control method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610766749.6A CN107783378B (en) 2016-08-30 2016-08-30 A kind of vertical micromotion structure of litho machine and control method

Publications (2)

Publication Number Publication Date
CN107783378A CN107783378A (en) 2018-03-09
CN107783378B true CN107783378B (en) 2019-10-25

Family

ID=61440954

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610766749.6A Active CN107783378B (en) 2016-08-30 2016-08-30 A kind of vertical micromotion structure of litho machine and control method

Country Status (1)

Country Link
CN (1) CN107783378B (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113820924B (en) * 2021-09-22 2022-06-28 哈尔滨工业大学 Micro-motion platform of photoetching machine
CN114857429B (en) * 2022-04-26 2024-02-20 深圳市大族机器人有限公司 Positioning platform and positioning system
CN115857407B (en) * 2022-12-08 2023-06-02 哈尔滨工业大学 Multi-degree-of-freedom redundant driving motion platform dynamic output distribution method

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101561635A (en) * 2009-05-19 2009-10-21 上海微电子装备有限公司 System and method for controlling positioning of bilateral driving device
CN102122120A (en) * 2011-03-22 2011-07-13 哈尔滨工业大学 Two-table switching system of stepping and scanning lithography machine
CN104343885A (en) * 2013-08-09 2015-02-11 上海微电子装备有限公司 High-precision magnetic suspension active damping equipment
CN104880911A (en) * 2014-02-28 2015-09-02 上海微电子装备有限公司 Photoetching machine work-piece table and vertical direction position initialization method

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8773640B2 (en) * 2008-05-29 2014-07-08 Asml Netherlands B.V. Inspection method and apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101561635A (en) * 2009-05-19 2009-10-21 上海微电子装备有限公司 System and method for controlling positioning of bilateral driving device
CN102122120A (en) * 2011-03-22 2011-07-13 哈尔滨工业大学 Two-table switching system of stepping and scanning lithography machine
CN104343885A (en) * 2013-08-09 2015-02-11 上海微电子装备有限公司 High-precision magnetic suspension active damping equipment
CN104880911A (en) * 2014-02-28 2015-09-02 上海微电子装备有限公司 Photoetching machine work-piece table and vertical direction position initialization method

Also Published As

Publication number Publication date
CN107783378A (en) 2018-03-09

Similar Documents

Publication Publication Date Title
CN107783378B (en) A kind of vertical micromotion structure of litho machine and control method
US7072777B1 (en) Exposure apparatus anti-vibration apparatus, system identification apparatus and system identification method
US7622939B2 (en) Methods and apparatuses for improved stabilization in a probing system
US20060017908A1 (en) Exposure apparatus and semiconductor device manufacturing method
JP3902942B2 (en) Vibration isolator, control method therefor, and exposure apparatus having the vibration isolator
US11223303B2 (en) Motor with force constant modeling and identification for flexible mode control
CN100578362C (en) Vertically delicate adjusting and gravity force compensating mechanism and photo-etching machine
US6742393B2 (en) Vibration control apparatus, vibration control method, exposure apparatus, and device manufacturing method
JP2004532469A (en) Base stabilization system
CN103543613A (en) Moving-iron cableless six-freedom-of-degree magnetic levitation moving platform
WO2018017000A1 (en) Device for determining the position of an object in space
CN109738119B (en) Method and system for measuring gravity center position
CN102279529A (en) Position control apparatus of flexible bilateral driving device, and setting method of relative parameters
US20060241873A1 (en) Minimum force output control method for counter-mass with cable
TW202001442A (en) Workpiece table system and photolithography device
CN101561635B (en) System and method for controlling positioning of bilateral driving device
CN112985694A (en) Method and system for balancing mass center of triaxial air bearing table
CN109443333A (en) A kind of gyro array feedback weight fusion method
JP3286186B2 (en) Fine movement positioning control device
TWI666524B (en) Lithography machine and surface type compensation method of hanging frame in lithography machine
JPH08338472A (en) Active vibration removal unit and sensor setup method thereof
CN100465794C (en) Stepped scanning photoetching machine vibration isolation system analoy experimental apparatus
CN118760238A (en) Self-stabilizing system, control method and equipment
CN110874021B (en) Photoetching equipment, method and device for resisting air flow disturbance
US9519231B2 (en) Method for measuring and calibrating centroid of coarse stage of photolithography tool

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant