CN107782981A - The system for improving free-space Method power of test - Google Patents
The system for improving free-space Method power of test Download PDFInfo
- Publication number
- CN107782981A CN107782981A CN201711008598.9A CN201711008598A CN107782981A CN 107782981 A CN107782981 A CN 107782981A CN 201711008598 A CN201711008598 A CN 201711008598A CN 107782981 A CN107782981 A CN 107782981A
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- CN
- China
- Prior art keywords
- test
- test sample
- transmitting antenna
- sample frame
- reception antenna
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0878—Sensors; antennas; probes; detectors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0807—Measuring electromagnetic field characteristics characterised by the application
- G01R29/0814—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
- G01R29/0821—Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
Abstract
The invention discloses a kind of system for improving free-space Method power of test, including reception antenna, test sample frame, vector network analyzer and transmitting antenna, test sample frame is arranged on the centre position between reception antenna and transmitting antenna, reception antenna and transmitting antenna are electromagnetic horn and structure is identical, the horn mouth of reception antenna, the equal face test sample frame of horn mouth of transmitting antenna, the waveguide segment of reception antenna is connected with vector network analyzer, the waveguide segment of transmitting antenna is connected with vector network analyzer, test sample frame is fixed on a base for the lower end of rectangular frame structure and test sample frame.The present invention by test sample frame by being arranged to rectangular frame structure, i.e., when sample is placed wherein, test sample frame places test sample wherein similar to bound edge, avoids test sample from local buckling occur, reduces test error.
Description
Technical field
The present invention relates to field of antenna, and in particular to a kind of system for improving free-space Method power of test.
Background technology
Free-space Method is a kind of prologue electromagnetic property parameters measuring technology, belongs to one kind of transmission/bounce technique.The method
Material electromagnetic parameter reason is measured by the Cullen A L free spaces released using fresnel formula earliest to draw.Free-space Method
Requirement to sample is relatively low, only needs sufficiently large one piece of two-sided parallel flat board, reason be to reduce external environment around
Penetrate and its diffusing reflection that uneven surface is brought.It is convenient that the sample of free-space Method is laid, and overcomes the coaxial line closed under field domain
Fit clearance problem in method and its square wave inducing defecation by enema and suppository.In addition, the method has further the advantage that：
(1) the electromagnetic wave approximation of lens antenna focal plane is considered as linear polarization plane wave, it is possible to orientation test is realized,
And then the test of some special materials can be met, it is non-homogeneous such as Chiral materials, plasma material and honeycomb form
Material etc..
(2) mode of operation is TEM moulds, it is possible to achieve the broadband test of Micro-wave low-noise transistor.
(3) the method has non-destructive and untouchable, can apply to the greatest extent using prologue domain test
Test under particular surroundings, such as the high temperature test of ceramic material.
(4) requirement to test sample is smaller, two parallel smooth surfaces is only needed, to side view limit without any requirement
System.
But free-space Method needs to be improved its power of test there is also test defect.
The content of the invention
It is an object of the invention to provide a kind of system for improving free-space Method power of test, the system will be by that will test
Sample rack is arranged to rectangular frame structure, i.e., when sample is placed wherein, test sample frame is similar to bound edge by test sample
Place wherein, avoid test sample from local buckling occur, reduce test error.
The present invention is achieved through the following technical solutions：
Improve free-space Method power of test system, including reception antenna, test sample frame, vector network analyzer and
Transmitting antenna, test sample frame are arranged on the centre position between reception antenna and transmitting antenna, reception antenna and transmitting antenna
It is electromagnetic horn and structure is identical, the equal face test sample frame of the horn mouth of reception antenna, the horn mouth of transmitting antenna, receives
The waveguide segment of antenna is connected with vector network analyzer, and the waveguide segment of transmitting antenna is connected with vector network analyzer, test specimens
This lower end for rectangular frame structure and test sample frame is fixed on a base.
Because the area of model is larger, the position that bending is had above sample occurs, and this bending can cause to test
As a result there is error, cause the power of test deficiency of test system.Therefore test sample frame is improved by the present invention, avoids testing
There is local buckling and causes test error larger in sample.
Transmitting antenna includes waveguide segment and loudspeaker section, and waveguide segment is connected with loudspeaker section, has waveguide cavity, waveguide in waveguide segment
2-3 ridge-like structure is respectively distributed with the upper lower wall of intracavitary.This transmitting antenna that the present invention uses can reduce to WAVEGUIDE LOADED
Cut-off frequency increases the bandwidth of operation of waveguide, can improve test scope.
Adapter cavity is additionally provided with waveguide segment, adapter cavity is arranged between waveguide cavity and loudspeaker section.
Ridge-like structure is extended in adapter cavity.
Annular protrusion is provided with adapter cavity.
The present invention compared with prior art, has the following advantages and advantages：
The present invention by test sample frame by being arranged to rectangular frame structure, i.e., when sample is placed wherein, test specimens
This is placed test sample wherein similar to bound edge, is avoided test sample from local buckling occur, is reduced test error.
Brief description of the drawings
Accompanying drawing described herein is used for providing further understanding the embodiment of the present invention, forms one of the application
Point, do not form the restriction to the embodiment of the present invention.In the accompanying drawings：
Fig. 1 is schematic structural view of the invention.
Mark and corresponding parts title in accompanying drawing：
1- waveguide segments, 2- ridge-like structures, 3- loudspeaker sections, 4- adapter cavities, 5- waveguide cavities, 6- test sample framves, 7- vector nets
Network analyzer, 8- bases.
Embodiment
For the object, technical solutions and advantages of the present invention are more clearly understood, with reference to embodiment and accompanying drawing, to this
Invention is described in further detail, and exemplary embodiment of the invention and its explanation are only used for explaining the present invention, do not make
For limitation of the invention.
Embodiment 1
As shown in figure 1, the system of free-space Method power of test is improved, including reception antenna, test sample frame 6, vector
Network Analyzer 7 and transmitting antenna, test sample frame 6 are arranged on the centre position between reception antenna and transmitting antenna, receive
Antenna and transmitting antenna are electromagnetic horn and structure is identical, the horn mouth of reception antenna, the equal face of the horn mouth of transmitting antenna
Test sample frame 6, the waveguide segment 1 of reception antenna are connected with vector network analyzer 7, the waveguide segment 1 and vector net of transmitting antenna
Network analyzer 7 is connected, and test sample frame 6 is fixed on a base 8 for the lower end of rectangular frame structure and test sample frame 6.
Because the area of model is larger, the position that bending is had above sample occurs, and this bending can cause to test
As a result there is error, cause the power of test deficiency of test system.Therefore test sample frame 6 is improved by the present invention, avoids surveying
Originally there is local buckling and causes test error larger in sample.
Embodiment 2
Transmitting antenna includes waveguide segment 1 and loudspeaker section 3, and waveguide segment 1 is connected with loudspeaker section 3, has waveguide cavity in waveguide segment 1
5,2-3 ridge-like structure 2 is respectively distributed with the upper lower wall in waveguide cavity 5.This transmitting antenna that the present invention uses can be to waveguide
Loading, the bandwidth of operation of cut-off frequency increase waveguide is reduced, test scope can be improved.
Adapter cavity 4 is additionally provided with waveguide segment 1, adapter cavity 4 is arranged between waveguide cavity 5 and loudspeaker section 3.
Ridge-like structure 2 is extended in adapter cavity 4.
Annular protrusion is provided with adapter cavity 4.
Above-described embodiment, the purpose of the present invention, technical scheme and beneficial effect are carried out further
Describe in detail, should be understood that the embodiment that the foregoing is only the present invention, be not intended to limit the present invention
Protection domain, within the spirit and principles of the invention, any modification, equivalent substitution and improvements done etc., all should include
Within protection scope of the present invention.
Claims (5)
1. improve the system of free-space Method power of test, it is characterised in that including reception antenna, test sample frame (6), vector
Network Analyzer (7) and transmitting antenna, test sample frame (6) are arranged on the centre position between reception antenna and transmitting antenna,
Reception antenna and transmitting antenna are electromagnetic horn and structure is identical, and the horn mouth of reception antenna, the horn mouth of transmitting antenna are equal
Face test sample frame (6), the waveguide segment (1) of reception antenna are connected with vector network analyzer (7), the waveguide segment of transmitting antenna
(1) it is connected with vector network analyzer (7), test sample frame (6) is consolidated for the lower end of rectangular frame structure and test sample frame (6)
It is scheduled on a base (8).
2. the system according to claim 1 for improving free-space Method power of test, it is characterised in that transmitting antenna includes
Waveguide segment (1) and loudspeaker section (3), waveguide segment (1) are connected with loudspeaker section (3), have waveguide cavity (5), waveguide cavity in waveguide segment (1)
(5) 2-3 ridge-like structure (2) is respectively distributed with the upper lower wall in.
3. the system according to claim 1 for improving free-space Method power of test, it is characterised in that in waveguide segment (1)
Adapter cavity (4) is additionally provided with, adapter cavity (4) is arranged between waveguide cavity (5) and loudspeaker section (3).
4. the system according to claim 3 for improving free-space Method power of test, it is characterised in that ridge-like structure (2)
Extend in adapter cavity (4).
5. the system according to claim 1 for improving free-space Method power of test, it is characterised in that in adapter cavity (4)
It is provided with annular protrusion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711008598.9A CN107782981A (en) | 2017-10-25 | 2017-10-25 | The system for improving free-space Method power of test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711008598.9A CN107782981A (en) | 2017-10-25 | 2017-10-25 | The system for improving free-space Method power of test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107782981A true CN107782981A (en) | 2018-03-09 |
Family
ID=61435279
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711008598.9A Pending CN107782981A (en) | 2017-10-25 | 2017-10-25 | The system for improving free-space Method power of test |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107782981A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111157580A (en) * | 2020-01-10 | 2020-05-15 | 青岛兴仪电子设备有限责任公司 | High-temperature material electromagnetic parameter measurement system and method based on fixture de-embedding |
| CN113433392A (en) * | 2021-07-21 | 2021-09-24 | 苏州伏波电子科技有限公司 | Device and method for measuring electromagnetic parameters of dielectric material |
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| CN205680792U (en) * | 2016-04-12 | 2016-11-09 | 中国电子科技集团公司第五十四研究所 | A kind of pyramidal horn antenna |
| CN205790394U (en) * | 2016-06-27 | 2016-12-07 | 成都驰通数码系统有限公司 | A kind of Ka wave band conical corrugated speaker |
| CN106842037A (en) * | 2016-12-13 | 2017-06-13 | 同济大学 | A kind of lithium ion battery battery heat engine characteristic test holder device and its application |
| CN107202942A (en) * | 2017-04-26 | 2017-09-26 | 北京航空航天大学 | A kind of free-space Method dielectric constant measurement system and measuring method for adding polarization grid |
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2017
- 2017-10-25 CN CN201711008598.9A patent/CN107782981A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002296202A (en) * | 2001-04-02 | 2002-10-09 | Daido Steel Co Ltd | Method and device of measuring temperature characteristic of electromagnetic wave absorber |
| JP2005351728A (en) * | 2004-06-10 | 2005-12-22 | Matsushita Electric Ind Co Ltd | Apparatus for measuring dielectric constant, and apparatus for measuring dielectric loss |
| CN103630864A (en) * | 2013-11-26 | 2014-03-12 | 中国电子科技集团公司第四十一研究所 | Calibration method for free space material electromagnetic parameter test system |
| CN105098368A (en) * | 2015-08-17 | 2015-11-25 | 河海大学 | Ultra wide band millimeter wave antenna and manufacturing method thereof |
| CN105020637A (en) * | 2015-08-25 | 2015-11-04 | 江苏翠钻照明有限公司 | LED lamp panel fixing jig |
| CN205108755U (en) * | 2015-11-18 | 2016-03-30 | 成都恒波医疗器械有限公司 | Heat radiator for millimeter wave antenna |
| CN105388442A (en) * | 2015-12-16 | 2016-03-09 | 中国电子科技集团公司第四十一研究所 | Free space method calibration method based on movable short circuit plate |
| CN205680792U (en) * | 2016-04-12 | 2016-11-09 | 中国电子科技集团公司第五十四研究所 | A kind of pyramidal horn antenna |
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| CN111157580A (en) * | 2020-01-10 | 2020-05-15 | 青岛兴仪电子设备有限责任公司 | High-temperature material electromagnetic parameter measurement system and method based on fixture de-embedding |
| CN113433392A (en) * | 2021-07-21 | 2021-09-24 | 苏州伏波电子科技有限公司 | Device and method for measuring electromagnetic parameters of dielectric material |
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Application publication date: 20180309 |