CN107767377A - Liquid crystal display defect and dust differentiating approach and detection means based on binocular vision system - Google Patents
Liquid crystal display defect and dust differentiating approach and detection means based on binocular vision system Download PDFInfo
- Publication number
- CN107767377A CN107767377A CN201711100005.1A CN201711100005A CN107767377A CN 107767377 A CN107767377 A CN 107767377A CN 201711100005 A CN201711100005 A CN 201711100005A CN 107767377 A CN107767377 A CN 107767377A
- Authority
- CN
- China
- Prior art keywords
- image
- defect
- liquid crystal
- crystal display
- principal phase
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000007547 defect Effects 0.000 title claims abstract description 94
- 239000004973 liquid crystal related substance Substances 0.000 title claims abstract description 74
- 238000001514 detection method Methods 0.000 title claims abstract description 34
- 239000000428 dust Substances 0.000 title claims abstract description 16
- 238000013459 approach Methods 0.000 title claims abstract description 14
- 238000013507 mapping Methods 0.000 claims abstract description 9
- 238000003384 imaging method Methods 0.000 claims description 18
- 230000007246 mechanism Effects 0.000 claims description 10
- 238000009826 distribution Methods 0.000 claims description 7
- 230000033001 locomotion Effects 0.000 claims description 6
- 230000003028 elevating effect Effects 0.000 claims description 5
- 239000000203 mixture Substances 0.000 claims description 5
- 230000015572 biosynthetic process Effects 0.000 claims description 4
- 239000007788 liquid Substances 0.000 claims 2
- 239000000126 substance Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 7
- 238000000034 method Methods 0.000 description 7
- 238000005516 engineering process Methods 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 238000012372 quality testing Methods 0.000 description 4
- 230000033228 biological regulation Effects 0.000 description 3
- 230000004069 differentiation Effects 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 238000005520 cutting process Methods 0.000 description 2
- 230000000007 visual effect Effects 0.000 description 2
- 206010021703 Indifference Diseases 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000006698 induction Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
- Y02P90/30—Computing systems specially adapted for manufacturing
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Nonlinear Science (AREA)
- Chemical & Material Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Quality & Reliability (AREA)
- Optics & Photonics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Life Sciences & Earth Sciences (AREA)
- Theoretical Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Liquid Crystal (AREA)
Abstract
The present invention discloses a kind of liquid crystal display defect based on binocular vision system and dust differentiating approach and detection means.Differentiating approach comprises the following steps：The face on the basis of liquid crystal layer, binocular vision system is demarcated using target picture, determine the mapping relations between image coordinate system corresponding to binocular vision system；Liquid crystal display is imaged using binocular vision system, obtains binocular image A and image B；Image procossing is carried out to image A and image B respectively, obtains the defects of image information；Image A and image B are transformed into reference plane coordinate system；In reference plane coordinate system, to the defects of image A and image B, parallax information of the defect in image A and image B on liquid crystal display is obtained；Judge parallax information of the defect in image A and image B, identical is then foreign matter defect, different then be shown to be surface dirt.Can solve the problems, such as that the foreign matter defect that can not be realized in automatic checkout equipment in the prior art and surface dirt cannot be distinguished by.
Description
Technical field
The present invention relates to technical field of vision detection, more particularly to a kind of liquid crystal display defect based on binocular vision system
With dust differentiating approach and detection means.
Background technology
LCD (Liquid Crystal Display) liquid crystal display typical case's composition is from top to bottom followed successively by TP (Touch
Panel, touch-screen) glass, upper polaroid, colored filter, liquid crystal layer, (Thin Film Transistor, film are brilliant by TFT
Body pipe) substrate, down polaroid and backlight.With the development of LCD technology, it is with high resolution, small volume, in light weight, nothing
Radiation, panelized and it is low in energy consumption the features such as, the leading role in display market is rapidly become, from mobile phone to portable game machine, from industry
The manual operation platform of equipment to numerous areas such as bank self-aid apparatus ATM (Automatic Teller Machine), LCD without
Institute does not exist.Therefore, the quality testing for LCD liquid crystal displays becomes particularly important.
The technological process and quality testing of LCD liquid crystal displays mainly include：Panel cuttings, paster, COG FOG, dispensing, group
Backlight；Wherein main quality testing include panel cutting after, after paster and group backlight after lighting inspection and visual examination.
At present, the quality testing to the automatic lighting of each stage can have been realized in the prior art, still, in the prior art
Automatic detection device can not realize the surface dirt that does not filter out when whether TP layers foreign matter is detection.Especially after TP is bonded entirely
In technique, due to introducing defect in the assembling process of technique, need to detect for the foreign matter among TP layers and liquid crystal layer, pass at present
The differentiation mode of system makes surface dirt imaging be contrasted with internal real defect, still with increasing light source in liquid crystal layer surface
TP layers foreign matter can be also imaged under surface source of light, be difficult to differentiate between with dust, and TP foreign matter missing inspections are caused in detection process.Therefore to TP
The detection of layer foreign matter is constantly in space state in LCD detection devices.
As shown in figure 1, it is a kind of level schematic diagram of liquid crystal display 10.Liquid crystal display 10 include be bonded successively cover plate 11,
Upper polaroid 12, liquid crystal layer 13, down polaroid 14, backlight 15.Small items positioned at the surface of cover plate 11 are defined as surface ash
Dirt 16, the small items between cover plate 11 and upper polaroid 12 are defined as foreign matter defect 17.The origin cause of formation of foreign matter defect 17 is,
Because liquid crystal module 10 is when being assembled in fitting cover plate 11, the foreign matter that falls between cover plate 11 and upper polaroid 12 also has in addition
Sub-fraction is the foreign matter that the supplied materials of cover plate 11 is present in cover plate.
Foreign matter defect 17 usually there will be missing inspection, and missing inspection reason is, when doing surface polishing most of foreign matter defect 17
Get and filtered out as dust, because surface dirt 16 and foreign matter defect 17 are only every layer transparent cover plate 11, both take
The basic indifference of feature, can not accurately distinguish.
The content of the invention
The purpose of the present invention is to overcome weak point of the prior art, there is provided a kind of liquid crystal based on binocular vision system
Shield defect and dust differentiating approach and detection means, to solve in current technology automatic checkout equipment to foreign matter defect and surface dirt
The problem of cannot be distinguished by.
The purpose of the present invention is achieved through the following technical solutions：
A kind of liquid crystal display defect based on binocular vision system and dust differentiating approach, comprise the following steps：
Liquid crystal display to be detected is positioned in detection device, detection device includes a principal phase machine and is surrounded on principal phase machine
The Duo Tai sides camera of distribution, using a principal phase machine and any one side camera composition binocular vision system；
The face on the basis of the liquid crystal layer of liquid crystal display to be detected, binocular vision system is demarcated using target picture,
Determine the mapping relations between image coordinate system corresponding to binocular vision system；
Liquid crystal display is imaged using binocular vision system, obtains binocular image A and image B, wherein, image A is main camera
Imaging to liquid crystal display, image B are imaging of the side camera to liquid crystal display；
Image procossing is carried out to image A and image B respectively, according to half-tone information, obtains the defects of image information；
By image A and image B according to mapping relations, reference plane coordinate system is transformed into；
In reference plane coordinate system, to the defects of image A and image B, defect registration is carried out according to matching criterior, obtained
Take parallax information of the defect in image A and image B on liquid crystal display；
Judge parallax information of the defect in image A and image B, be if the same shown to be foreign matter defect, if different
Then it is shown to be surface dirt.
In one of the embodiments, detection device includes a principal phase machine and is surrounded on four side phases of principal phase machine distribution
Machine, formation is distributed four side cameras in a ring centered on principal phase machine.
In one of the embodiments, principal phase machine is high resolution camera, and side camera is low-resolution cameras.
In one of the embodiments, defect information includes：Foreign matter defect information, the table of liquid crystal screen surfaces in liquid crystal display
Face dust information.
In one of the embodiments, judge that parallax information of the defect in image A and image B includes：
Judge whether the image parallactic of corresponding defect is more than default error threshold；
If described image parallax is more than the error threshold, the defect is judged not for foreign matter defect；
If described image parallax is less than the error threshold, judge the defect for foreign matter defect.
A kind of detection means, including：One principal phase machine, Duo Tai sides camera, circular orbit, a principal phase machine rising-falling tone nodule
Structure, the lifting of multiple side cameras and angle adjustment mechanism；
One principal phase machine is placed in the center of the circular orbit, and the more side cameras are slidably mounted on described
On circular orbit and around a principal phase machine distribution；
One principal phase machine lifting adjusting structure is corresponding with a principal phase machine, multiple side camera liftings and angle
Adjustment structure is spent to correspond respectively at the more side cameras；
The principal phase machine lifting adjusting structure drives the principal phase machine vertically to lift；
The side camera lifting and angle adjustment mechanism drive the side camera lifting or rotated, and the side camera edge is vertical
Direction elevating movement, the rotary shaft and plane-parallel of the side camera.
In one of the embodiments, the principal phase machine lifting adjusting structure is motor lead screw driving structure.
In one of the embodiments, the side camera lifting and angle adjustment mechanism include lifting drive division and angle is adjusted
Section portion, the lifting drive division drive the side camera vertically elevating movement, and the angle adjustment drives the side
Camera rotates, and the lifting drive division is motor lead screw driving structure, and the angle adjustment is cylinder driving structure, the angle
The telescopic end of degree adjustment portion is provided with rack, and the side camera is provided with and the rack meshed gears.
From above method step, this programme, can be according to defect in binocular vision while detection defect automatically
Parallax in system, so as to realize the foreign matter defect in liquid crystal automatic checkout equipment and the function of surface dirt differentiation, therefore, this
Invention can solve the foreign matter defect that can not be realized in automatic checkout equipment in the prior art and what surface dirt cannot be distinguished by asks
Topic.
Brief description of the drawings
Fig. 1 is a kind of level schematic diagram of liquid crystal display；
Fig. 2 is the step flow chart of the liquid crystal display defect and dust differentiating approach based on binocular vision system of the present invention；
Fig. 3 is the schematic diagram of detection device；
Fig. 4 is the schematic diagram detected using binocular vision system to liquid crystal display；
Fig. 5 is that liquid crystal display is imaged using binocular vision system to obtain binocular image A；
Fig. 6 is that liquid crystal display is imaged using binocular vision system to obtain binocular image B；
Fig. 7 is the schematic diagram of the detection device of another embodiment；
Fig. 8 is the schematic diagram of the principal phase machine lifting adjusting structure shown in Fig. 7；
Fig. 9 is the schematic diagram of the side camera lifting and angle adjustment mechanism shown in Fig. 7.
Embodiment
For the ease of understanding the present invention, the present invention is described more fully below with reference to relevant drawings.In accompanying drawing
Give the better embodiment of the present invention.But the present invention can realize in many different forms, however it is not limited to herein
Described embodiment.On the contrary, the purpose for providing these embodiments is to make to understand more the disclosure
Add thorough and comprehensive.
It should be noted that when element is referred to as " being fixed on " another element, it can be directly on another element
Or there may also be element placed in the middle.When an element is considered as " connection " another element, it can be directly connected to
To another element or it may be simultaneously present centering elements.Term as used herein " vertical ", " horizontal ", " left side ",
For illustrative purposes only, it is unique embodiment to be not offered as " right side " and similar statement.
Unless otherwise defined, all of technologies and scientific terms used here by the article is with belonging to technical field of the invention
The implication that technical staff is generally understood that is identical.Term used in the description of the invention herein is intended merely to description tool
The purpose of the embodiment of body, it is not intended that in the limitation present invention.Term as used herein " and/or " include one or more
The arbitrary and all combination of related Listed Items.
As shown in Fig. 2 a kind of liquid crystal display defect based on binocular vision system and dust differentiating approach, comprise the following steps：
Step 1, liquid crystal display to be detected is positioned in detection device, detection device includes a principal phase machine and is surrounded on
The Duo Tai sides camera of principal phase machine distribution, using a principal phase machine and any one side camera composition binocular vision system；
Step 2, the face on the basis of the liquid crystal layer of liquid crystal display to be detected, binocular vision system is carried out using target picture
Demarcation, determines the mapping relations between image coordinate system corresponding to binocular vision system；
Step 3, liquid crystal display is imaged using binocular vision system, obtains binocular image A and image B, wherein, image A is
Imaging of the principal phase machine to liquid crystal display, image B are imaging of the side camera to liquid crystal display；
Step 4, image procossing is carried out to image A and image B respectively, according to half-tone information, obtains the defects of image letter
Breath；In the present embodiment, defect information includes：The surface dirt information of foreign matter defect information, liquid crystal screen surfaces in liquid crystal display.
Step 5, image A and image B is transformed into reference plane coordinate system according to mapping relations；
Step 6, in reference plane coordinate system, to the defects of image A and image B, defect is carried out according to matching criterior
Registration, obtain parallax information of the defect in image A and image B on liquid crystal display；Wherein, it is accurate to include epipolar-line constraint for matching criterior
Then, similarity constraint criterion, disparity continuity constraint criterion, sequence constraint criterion, disparity constraint criterion, mutual induction constraint criterion
Deng.
Step 7, judge parallax information of the defect in image A and image B, be if the same shown to be foreign matter defect, such as
Fruit difference is then shown to be surface dirt.Further, judge that parallax information of the defect in image A and image B includes：Judgement pair
Answer whether the image parallactic of defect is more than default error threshold；If described image parallax is more than the error threshold, sentence
The defect of breaking is not foreign matter defect；If described image parallax is less than the error threshold, judge the defect for foreign matter
Defect.
As shown in figure 3, specifically, in the present embodiment, detection device 20 includes a principal phase machine 21 and is surrounded on principal phase
Four side cameras 22 that machine 21 is distributed, formation is distributed four side cameras 22 in a ring centered on principal phase machine 21.Wherein, principal phase machine
21 be high resolution camera, and side camera 22 is low-resolution cameras, and the camera collection visual field covers whole liquid crystal region.Using one
Principal phase machine 21 forms binocular vision system with any one side camera 22, and defects detection is carried out to liquid crystal display.For example, using one
Wherein one composition binocular vision system of the principal phase machine 21 successively respectively with four side cameras 22 is imaged to liquid crystal display, so as to obtain
Four binocular images, global alignment is carried out to four binocular images, so as to more accurately carry out defects detection to liquid crystal display.
As shown in Fig. 4, Fig. 5 and Fig. 6, it is described as follows：
Liquid crystal display 10 to be detected is positioned in detection device, liquid crystal module 10 include be bonded successively cover plate 11, it is upper partially
Mating plate 12, liquid crystal layer 13, down polaroid 14, backlight 15.Small items positioned at the surface of cover plate 11 are defined as surface dirt 16,
Small items between cover plate 11 and upper polaroid 12 are defined as foreign matter defect 17.
The face on the basis of the liquid crystal layer 13 of liquid crystal display 10 to be detected, rower is entered to binocular vision system using target picture
It is fixed, determine the mapping relations between image coordinate system corresponding to binocular vision system；
Liquid crystal display is imaged using binocular vision system, obtains binocular image A and image B, wherein, image A is main camera
Imaging to liquid crystal display, image B are imaging of the side camera to liquid crystal display；Image procossing, root are carried out to image A and image B respectively
According to half-tone information, the defects of image information is obtained；By image A and image B according to mapping relations, reference plane coordinate system is transformed into
System；For example, in image A, principal phase machine obtains surface dirt imaging 16 ' to the imaging of surface dirt 16, and principal phase machine is to foreign matter defect
17 imagings obtain foreign matter defect 17 '；In image B, side camera obtains surface dirt imaging 16 ", side to the imaging of surface dirt 16
Camera obtains foreign matter defect 17 " to the imaging of foreign matter defect 17.Because surface dirt 16 is located at the top of cover plate 11 and away from liquid crystal layer 13
It is farther, by side camera to surface dirt 16 be imaged obtain surface dirt imaging 16 " side view be converted to front view after, with principal phase
Machine shooting image comparison, the point-like can offset it is farther, conversely, foreign matter defect 17 offset it is smaller, thus, can be by surface dirt 16
Made a distinction with foreign matter defect 17, so as to identify whether liquid crystal display is foreign matter defect；
In reference plane coordinate system, to the defects of image A and image B, defect registration is carried out according to matching criterior, obtained
Take parallax information of the defect in image A and image B on liquid crystal display；Judge parallax information of the defect in image A and image B,
If the same foreign matter defect is shown to be, surface dirt is shown to be if different.For example, in image A, two imagings are mutual
Between by it is nearer, and in image B, two imagings are farther apart each other, then may determine that, current liquid crystal display 10 there is
Foreign matter defect.
From above method step, this programme, can be according to defect in binocular vision while detection defect automatically
Parallax in system, so as to realize the foreign matter defect in liquid crystal automatic checkout equipment and the function of surface dirt differentiation, therefore, this
Invention can solve the foreign matter defect that can not be realized in automatic checkout equipment in the prior art and what surface dirt cannot be distinguished by asks
Topic.
As shown in Fig. 7, Fig. 8 and Fig. 9, specifically, detection means 20 includes：One principal phase machine 21, Duo Tai sides camera 22, ring
23, principal phase machine lifting adjusting structures 24 of shape track, the lifting of multiple side cameras and angle adjustment mechanism 25.
One principal phase machine 21 is placed in the center of circular orbit 23, and Duo Tai sides camera 22 is slidably mounted on circular orbit 23
Go up and surround a principal phase machine 21 and be distributed.
One principal phase machine lifting adjusting structure 24 is corresponding with a principal phase machine 21, multiple side camera liftings and angular adjustment knot
Structure 25 corresponds respectively at Duo Tai sides camera 22.
Principal phase machine lifting adjusting structure 24 drives principal phase machine 21 vertically to lift.
Side camera lifting and the driving side camera 22 of angle adjustment mechanism 25 are lifted or rotated, and side camera 22 vertically rises
Drop motion, the rotary shaft and plane-parallel of side camera 22.
Detection means 20 is improved by above-mentioned structure, is had the advantages that：
Duo Tai sides camera 22 is slidably mounted on circular orbit 23 and is distributed around a principal phase machine 21, and such structure is set
Meter so that the regulation of position can be carried out between Duo Tai sides camera 22, according to the size of product and the actual feelings of detection
Condition, adaptability are adjusted to the position between Duo Tai sides camera 22；
Principal phase machine lifting adjusting structure 24 drives principal phase machine 21 vertically to lift, such structure design, according to production
Size, the thickness size of product, adaptability regulation can be carried out to the height and position of principal phase machine 21, reach the purpose focused,
So as to obtain the image become apparent from；
Side camera lifting and the driving side camera 22 of angle adjustment mechanism 25 are lifted or rotated, on the one hand, can be with offside camera
22 height and position is adjusted, and on the other hand, can be adjusted with the angle of offside camera 22, real according to size of product etc.
Border situation, the height and angle of the regulation side camera 22 of adaptability, so as to obtain the image become apparent from.
In the present embodiment, principal phase machine lifting adjusting structure 24 is motor lead screw driving structure；Side camera lifting and angle
Adjustment structure 25 includes lifting drive division and angle adjustment, lifts the vertically elevating movement of drive division driving side camera,
Angle adjustment driving side camera rotates, and lifting drive division is motor lead screw driving structure, and angle adjustment is cylinder driving knot
Structure, the telescopic end of angle adjustment are provided with rack, and side camera is provided with and rack meshed gears.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more specific and detailed, but simultaneously
Can not therefore it be construed as limiting the scope of the patent.It should be pointed out that come for one of ordinary skill in the art
Say, without departing from the inventive concept of the premise, various modifications and improvements can be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be determined by the appended claims.
Claims (8)
1. a kind of liquid crystal display defect based on binocular vision system and dust differentiating approach, it is characterised in that comprise the following steps：
Liquid crystal display to be detected is positioned in detection device, detection device includes a principal phase machine and is surrounded on the distribution of principal phase machine
Duo Tai sides camera, using a principal phase machine and any one side camera composition binocular vision system；
The face on the basis of the liquid crystal layer of liquid crystal display to be detected, binocular vision system is demarcated using target picture, it is determined that
Mapping relations between image coordinate system corresponding to binocular vision system；
Liquid crystal display is imaged using binocular vision system, obtains binocular image A and image B, wherein, image A is main camera to liquid
The imaging of crystalline substance screen, image B is imaging of the side camera to liquid crystal display；
Image procossing is carried out to image A and image B respectively, according to half-tone information, obtains the defects of image information；
By image A and image B according to mapping relations, reference plane coordinate system is transformed into；
In reference plane coordinate system, to the defects of image A and image B, defect registration is carried out according to matching criterior, obtains liquid
Upper parallax information of the defect in image A and image B of crystalline substance screen；
Judge parallax information of the defect in image A and image B, be if the same shown to be foreign matter defect, the table if different
Bright is surface dirt.
2. the liquid crystal display defect according to claim 1 based on binocular vision system and dust differentiating approach, it is characterised in that
Detection device includes a principal phase machine and is surrounded on four side cameras of principal phase machine distribution, and four side cameras are centered on principal phase machine
Formation is distributed in a ring.
3. the liquid crystal display defect according to claim 2 based on binocular vision system and dust differentiating approach, it is characterised in that
Principal phase machine is high resolution camera, and side camera is low-resolution cameras.
4. the liquid crystal display defect according to claim 1 based on binocular vision system and dust differentiating approach, it is characterised in that
Defect information includes：The surface dirt information of foreign matter defect information, liquid crystal screen surfaces in liquid crystal display.
5. the liquid crystal display defect according to claim 1 based on binocular vision system and dust differentiating approach, it is characterised in that
Judge that parallax information of the defect in image A and image B includes：
Judge whether the image parallactic of corresponding defect is more than default error threshold；
If described image parallax is more than the error threshold, the defect is judged not for foreign matter defect；
If described image parallax is less than the error threshold, judge the defect for foreign matter defect.
A kind of 6. detection means, it is characterised in that including：One principal phase machine, Duo Tai sides camera, circular orbit, a principal phase machine
Lifting adjusting structure, the lifting of multiple side cameras and angle adjustment mechanism；
One principal phase machine is placed in the center of the circular orbit, and the more side cameras are slidably mounted on the annular
On track and around a principal phase machine distribution；
One principal phase machine lifting adjusting structure is corresponding with a principal phase machine, and multiple side camera liftings and angle are adjusted
Nodule structure corresponds respectively at the more side cameras；
The principal phase machine lifting adjusting structure drives the principal phase machine vertically to lift；
The side camera lifting and angle adjustment mechanism drive the side camera lifting or rotated, and the side camera is vertically
Elevating movement, the rotary shaft and plane-parallel of the side camera.
7. detection means according to claim 6, it is characterised in that the principal phase machine lifting adjusting structure is motor lead screw
Driving structure.
8. detection means according to claim 6, it is characterised in that the side camera lifting and angle adjustment mechanism include
Drive division and angle adjustment are lifted, the lifting drive division drives the side camera vertically elevating movement, the angle
Spending adjustment portion drives the side camera to rotate, and the lifting drive division is motor lead screw driving structure, and the angle adjustment is
Cylinder driving structure, the telescopic end of the angle adjustment are provided with rack, and the side camera is provided with what is engaged with the rack
Gear.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711100005.1A CN107767377B (en) | 2017-11-09 | 2017-11-09 | Liquid crystal display defect and dust distinguishing method and detection device based on binocular vision system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711100005.1A CN107767377B (en) | 2017-11-09 | 2017-11-09 | Liquid crystal display defect and dust distinguishing method and detection device based on binocular vision system |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN107767377A true CN107767377A (en) | 2018-03-06 |
| CN107767377B CN107767377B (en) | 2024-02-06 |
Family
ID=61272209
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711100005.1A Active CN107767377B (en) | 2017-11-09 | 2017-11-09 | Liquid crystal display defect and dust distinguishing method and detection device based on binocular vision system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107767377B (en) |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108760755A (en) * | 2018-07-03 | 2018-11-06 | 银河水滴科技（北京）有限公司 | A kind of dust granule detection method and device |
| CN109580644A (en) * | 2018-12-17 | 2019-04-05 | 范建明 | A kind of visual detection equipment of auto-parts |
| CN110782782A (en) * | 2019-11-28 | 2020-02-11 | 合肥维信诺科技有限公司 | Array substrate repairing method and system |
| CN111445452A (en) * | 2020-03-23 | 2020-07-24 | Oppo（重庆）智能科技有限公司 | Defect detection method and device of electronic product and computer readable storage medium |
| CN111551559A (en) * | 2020-05-13 | 2020-08-18 | 深圳市全洲自动化设备有限公司 | LCD (liquid Crystal display) liquid crystal screen defect detection method based on multi-view vision system |
| CN112200760A (en) * | 2019-06-20 | 2021-01-08 | 惠州旭鑫智能技术有限公司 | Device and method for measuring and layering depth of defect of liquid crystal module |
| CN112858318A (en) * | 2021-04-26 | 2021-05-28 | 惠州高视科技有限公司 | Method for distinguishing screen foreign matter defect from dust, electronic equipment and storage medium |
| CN112964642A (en) * | 2021-04-21 | 2021-06-15 | 广东速美达自动化股份有限公司 | Method and system for detecting foreign matters in liquid crystal display based on binocular stereo reconstruction |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104794717A (en) * | 2015-04-27 | 2015-07-22 | 中国科学院光电技术研究所 | Depth information comparison method based on binocular vision system |
| KR20160084212A (en) * | 2015-01-05 | 2016-07-13 | 한화테크윈 주식회사 | Apparatus for inspecting defect and method thereof |
| CN105842885A (en) * | 2016-03-21 | 2016-08-10 | 凌云光技术集团有限责任公司 | Liquid crystal screen defect layered positioning method and device |
| GB201711412D0 (en) * | 2016-12-30 | 2017-08-30 | Maxu Tech Inc | Early entry |
-
2017
- 2017-11-09 CN CN201711100005.1A patent/CN107767377B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20160084212A (en) * | 2015-01-05 | 2016-07-13 | 한화테크윈 주식회사 | Apparatus for inspecting defect and method thereof |
| CN104794717A (en) * | 2015-04-27 | 2015-07-22 | 中国科学院光电技术研究所 | Depth information comparison method based on binocular vision system |
| CN105842885A (en) * | 2016-03-21 | 2016-08-10 | 凌云光技术集团有限责任公司 | Liquid crystal screen defect layered positioning method and device |
| GB201711412D0 (en) * | 2016-12-30 | 2017-08-30 | Maxu Tech Inc | Early entry |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108760755A (en) * | 2018-07-03 | 2018-11-06 | 银河水滴科技（北京）有限公司 | A kind of dust granule detection method and device |
| CN109580644A (en) * | 2018-12-17 | 2019-04-05 | 范建明 | A kind of visual detection equipment of auto-parts |
| CN109580644B (en) * | 2018-12-17 | 2022-01-11 | 海南联新科技有限公司 | Visual inspection equipment for automobile parts |
| CN112200760A (en) * | 2019-06-20 | 2021-01-08 | 惠州旭鑫智能技术有限公司 | Device and method for measuring and layering depth of defect of liquid crystal module |
| CN110782782A (en) * | 2019-11-28 | 2020-02-11 | 合肥维信诺科技有限公司 | Array substrate repairing method and system |
| CN110782782B (en) * | 2019-11-28 | 2022-03-29 | 合肥维信诺科技有限公司 | Array substrate repairing method and system |
| CN111445452A (en) * | 2020-03-23 | 2020-07-24 | Oppo（重庆）智能科技有限公司 | Defect detection method and device of electronic product and computer readable storage medium |
| CN111445452B (en) * | 2020-03-23 | 2022-03-01 | Oppo（重庆）智能科技有限公司 | Defect detection method and device of electronic product and computer readable storage medium |
| CN111551559A (en) * | 2020-05-13 | 2020-08-18 | 深圳市全洲自动化设备有限公司 | LCD (liquid Crystal display) liquid crystal screen defect detection method based on multi-view vision system |
| CN112964642A (en) * | 2021-04-21 | 2021-06-15 | 广东速美达自动化股份有限公司 | Method and system for detecting foreign matters in liquid crystal display based on binocular stereo reconstruction |
| CN112858318A (en) * | 2021-04-26 | 2021-05-28 | 惠州高视科技有限公司 | Method for distinguishing screen foreign matter defect from dust, electronic equipment and storage medium |
Also Published As
| Publication number | Publication date |
|---|---|
| CN107767377B (en) | 2024-02-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN107767377A (en) | Liquid crystal display defect and dust differentiating approach and detection means based on binocular vision system | |
| CN102753933B (en) | Transparent object detection system and transparent flat plate detection system | |
| CN110657946B (en) | Screen defect detection system, screen detection line and screen defect detection method | |
| CN101460832B (en) | External appearance inspection device | |
| CN107390393B (en) | Re-judgment layering method after defect detection of liquid crystal module | |
| CN104359917A (en) | Method and device for detecting internal dust of liquid crystal screen | |
| WO2014169516A1 (en) | Detection device and detection method | |
| CN105044942B (en) | The contraposition of liquid crystal display panel checks equipment and contraposition inspection method | |
| TW200302345A (en) | Substrate inspection device | |
| CN104840180B (en) | Unattended automatic vision inspection device | |
| CN107966836A (en) | TFT-L CD defect optical automatic detection system | |
| CN104464584A (en) | Image collecting device applied to TFT-LCD defect automatic detection line | |
| CN107643292A (en) | A kind of surface detection apparatus and its method based on liquid-crystalline glasses | |
| CN110286132A (en) | Optical detection method and device for display panel | |
| CN106501951A (en) | A kind of manufacture method of bore hole 3D display device | |
| CN207503282U (en) | Liquid crystal display defect based on binocular vision system distinguishes detection device with dust | |
| KR101129642B1 (en) | Apparatus and method for inspecting LCD cell | |
| CN112200760A (en) | Device and method for measuring and layering depth of defect of liquid crystal module | |
| KR20130003398A (en) | Automated testing system for display device | |
| CN101408520A (en) | Detection method and system for discriminating flaws of inner and outer layers | |
| WO2018171045A1 (en) | Detection method and detection apparatus for display panel | |
| CN108287167A (en) | Liquid-crystalline glasses edge detection method and device | |
| KR102037050B1 (en) | Vision testing system for display device and inspecting method thereof | |
| JP2019158442A (en) | Display panel inspection system and display panel inspection method | |
| CN107843604A (en) | A kind of device and detection method for being used to detect double layer substrate edge defect |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 215129 Rooms 101, 102, 901, 902, Floor 9, Building 11, No. 198, Jialing River Road, High tech Zone, Suzhou City, Jiangsu Province Applicant after: Gaoshi Technology (Suzhou) Co.,Ltd. Address before: 516006 District 75, Zhongkai high tech Industrial Development Zone, Huizhou City, Guangdong Province Applicant before: HUIZHOU GOVION TECHNOLOGY CO.,LTD. |
|
| GR01 | Patent grant | ||
| GR01 | Patent grant |