CN113533364A - System and method for detecting edge defects of liquid crystal screen - Google Patents

System and method for detecting edge defects of liquid crystal screen Download PDF

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Publication number
CN113533364A
CN113533364A CN202110636284.3A CN202110636284A CN113533364A CN 113533364 A CN113533364 A CN 113533364A CN 202110636284 A CN202110636284 A CN 202110636284A CN 113533364 A CN113533364 A CN 113533364A
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light source
detector
liquid crystal
detection surface
linear light
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曹琳
陶平
李军
陈馨馨
李伟
田永军
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Beijing Zhaowei Intelligent Equipment Co ltd
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Beijing Zhaowei Intelligent Equipment Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01Arrangements or apparatus for facilitating the optical investigation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513Liquid crystal panels

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Abstract

The invention relates to a system for detecting edge defects of a liquid crystal screen, which comprises: the device comprises a horizontal detection surface, a detector vertically arranged above the detection surface, a first linear light source positioned above the detection surface and a second linear light source positioned below the detection surface, wherein the first linear light source can be rotatably arranged, and the direction of a light beam of the first linear light source is rotated to enable the detector to carry out bright field imaging; the second linear light source can be rotatably arranged, and the light beam of the second linear light source is rotated to face the detector to perform dark field imaging. The invention also provides a method for detecting the edge defect of the liquid crystal screen, which is based on the system for detecting the edge defect of the liquid crystal screen. The invention has reasonable layout of all parts, can detect the transparent edge of the liquid crystal screen and the non-transparent edge of the liquid crystal screen through simple light source design and change, has high accuracy and good stability and greatly improves the detection efficiency.

Description

System and method for detecting edge defects of liquid crystal screen
Technical Field
The invention belongs to the technical field of mechanical automatic appearance detection, and particularly relates to a system and a method for detecting edge defects of a liquid crystal screen.
Background
In the liquid crystal display industry, the demand of many advanced screen manufacturers with larger production scale, such as the kyoto, the temab microelectronics, etc., for the liquid crystal quality inspection is increasing day by day. Similarly, in the manufacturing process of semiconductors such as liquid crystal screens, the yield loss of screen edges of many advanced manufacturers is 10% to 50% higher than that of the area with the best yield on average, so that timely detecting the defects of the liquid crystal screen edges is of great importance to improve the product quality and maintain the enterprise competitiveness.
At present, the traditional method for detecting the edge defect of the liquid crystal screen is a manual detection method or a digital image processing detection method. The manual detection mode is simple and can be flexibly arranged; digital image processing detection modes, such as a Sobel operator, a Laplacian operator and a Canny operator, can form a basic auxiliary visual angle, and are favorable for improving the detection accuracy.
However, the manual detection method and the machine detection method with low automation degree have some disadvantages. The manual detection mode depends on the self condition of a detection person, and the eye fatigue can directly cause the accuracy of human eyes to be reduced, so that the low working efficiency is influenced; the premise of the digital image processing and detecting mode is that an excellent image with clear edges and prominent defect contrast can enable various operators to play the capacity of the excellent image, so that the digital image processing and detecting mode has larger use limitation.
Therefore, a system and a method for detecting edge defects of a liquid crystal display are needed to solve the above technical problems.
Disclosure of Invention
The invention provides a system for detecting the edge defect of a liquid crystal screen, which aims to solve the technical problems of insufficient detection stability, time and labor waste and complex structure of the conventional detection system.
The technical scheme for solving the technical problems is as follows:
a system for detecting edge defects of a liquid crystal screen, comprising: a horizontal detection surface, a detector vertically arranged above the detection surface, a first linear light source positioned above the detection surface and a second linear light source positioned below the detection surface,
the first linear light source can be rotatably arranged, and the light beam of the first linear light source is rotated to face the detector to carry out bright field imaging; the second linear light source can be rotatably arranged, and the light beam of the second linear light source is rotated to face the detector to perform dark field imaging.
The invention has the beneficial effects that:
(1) the invention has reasonable layout of all parts, can detect the transparent edge of the liquid crystal screen and the non-transparent edge of the liquid crystal screen through simple light source design and change, has high accuracy and good stability, and greatly improves the detection efficiency;
(2) the invention can collect images through the detector, saves time and labor, reduces the labor intensity of workers and is also beneficial to enterprises to save the operation cost.
On the basis of the technical scheme, the invention can be further improved as follows.
Further, the detector comprises a linear array scanning camera and an optical imaging lens, and the linear array scanning camera is positioned above the detection surface; the optical imaging lens is positioned between the linear array scanning camera and the detection surface and is connected with the linear array scanning camera.
The beneficial effect of adopting the further scheme is that: the linear array camera adopts a CCD linear array scanning camera to scan and detect the edge area of the screen, and can collect the information of each line; the optical imaging lens can enable the edge information of the screen to be imaged on a CCD of the line scanning camera, and is simple in structure and convenient to manufacture.
Further, the line scanning camera is a 2K line scanning camera or a 4K line scanning camera.
The beneficial effect of adopting the further scheme is that: under a certain visual range, the 2K image linear array scanning camera is quite fine and smooth, can meet the requirement of image collection, and has low manufacturing cost; the 4K image linear scanning camera can display more contents and is efficient to use in a specific scene.
Further, an image acquisition card is arranged in the linear array scanning camera.
The beneficial effect of adopting the further scheme is that: the image acquisition card is used for transmitting signals, and can acquire and transmit image signals of the linear array scanning camera to a computer, so that remote operation and recording are realized, and the system is convenient and efficient.
Furthermore, the detector also comprises an angle adjusting platform, and the rotatable end of the angle adjusting platform is fixedly connected with the side wall of the linear array scanning camera.
The beneficial effect of adopting the further scheme is that: the angle adjusting table is used for adjusting the orientation of an optical hole of the linear scanning camera, and is helpful for collecting images of a dark field and images of a bright field.
Furthermore, the detector also comprises an XY fine tuning platform, and the connecting end of the XY fine tuning platform is fixedly connected with the side wall of the linear array scanning camera.
The beneficial effect of adopting the further scheme is that: and the XY fine tuning platform is used for fine tuning the orientation of the linear array scanning camera so that the linear array scanning camera can be aligned to the edge part to be measured of the detection surface.
The device further comprises a transferring module, wherein the transferring module is positioned below the detection surface and used for moving or rotating the detection surface.
The beneficial effect of adopting the further scheme is that: the transfer module is used for moving or rotating the detection surface, so that the detector can conveniently detect different edges on the liquid crystal screen.
The invention also provides a method for detecting the edge defect of the liquid crystal screen, which can solve the technical problems that the detection conditions of the existing detection method are limited, the transparent edge and the opaque edge of the glass cannot be distinguished, and the application is limited.
A method for detecting edge defects of a liquid crystal screen comprises the following steps:
horizontally arranging a liquid crystal screen and forming a detection surface;
arranging a detector above the edge of the detection surface, wherein an optical hole of the detector faces to the part to be detected at the edge of the detection surface;
arranging a first linear light source above the detection surface, rotating the light beam direction of the first linear light source to enable the detector to carry out bright field imaging, and then collecting a bright field image through the detector;
and arranging a second linear light source below the detection plane, rotating the light beam of the second linear light source to enable the detector to carry out dark field imaging, and collecting dark field images through the detector.
The beneficial effect of adopting the further scheme is that:
(1) the invention can detect different characteristics of the edge of the liquid crystal screen, and adjust the angle of the first line light source by using the first line light source on the lower side of the screen sample aiming at the transparent edge, so that the detector obtains a bright field image, and the scratch and the crack are obviously visible; aiming at the opaque edge, a second line light source of the line on the upper side of the screen sample is used, the angle of the second line light source is adjusted, so that a dark field image is obtained by the detector, at the moment, edge breakage, corner breakage and cracks are obvious visible, and the detection efficiency is greatly improved;
(2) the invention has low requirement on environment such as dust and the like, has better environmental adaptability, and has the advantages of high accuracy and good stability.
Further, rotating the first linear light source to enable the included angle between the light beam direction of the first linear light source and the light hole direction of the detector to be Z1Z is the same as1Satisfies the relationship: 20 DEG ≦ Z1≦30°;
Rotating the second linear light source to make the included angle between the light beam direction of the second linear light source and the light hole direction of the detector be Z2Z is the same as2Satisfies the relationship: 5 DEG ≦ Z2≦10°。
The beneficial effect of adopting the further scheme is that: dark field imaging can be realized by adjusting an included angle between the direction of the light beam of the first line light source and the direction of the light hole of the detector; by adjusting the included angle between the light beam direction of the second line light source and the light hole direction of the detector, bright field imaging can be realized.
Further, the distance between the first linear light source and the detection surface is L1Said L is1Satisfies the relationship: l is 50mm ≦ L1≦ 70 mm; the distance between the second linear light source and the detection surface is L2Said L is2Satisfies the relationship: l is less than or equal to 25mm ≦ L2≦35mm。
The beneficial effect of adopting the further scheme is that: the distance between the first line light source and the detection surface is adjusted, so that the dark field imaging effect is improved; the distance between the second line light source and the detection surface is adjusted, so that the bright field imaging effect is improved.
Drawings
FIG. 1 is a schematic diagram of the system of the present invention;
FIG. 2 is a schematic diagram of a test structure for transparent edge according to the present invention;
FIG. 3 is a dark field image collected for a transparent edge according to the present invention;
FIG. 4 is a schematic diagram of the test structure for opaque borders according to the present invention;
FIG. 5 is a bright field image collected for an opaque border according to the present invention.
In the drawings, the components represented by the respective reference numerals are listed below:
1. detecting a surface;
2. a detector; 21. a line scan camera; 22. an optical imaging lens; 23. an angle adjusting table; 24. an XY fine tuning platform;
3. a transfer module;
4. a first line light source;
5. a second line light source.
Detailed Description
The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.
In the description of the present invention, it is to be understood that the terms "central," "longitudinal," "lateral," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like are used in the orientation or positional relationship indicated in the drawings, which are merely for convenience in describing the invention and to simplify the description, and are not intended to indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and are therefore not to be construed as limiting the invention. Furthermore, the terms "first", "second", etc. are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first," "second," etc. may explicitly or implicitly include one or more of that feature. In the description of the invention, the meaning of "a plurality" is two or more unless otherwise specified.
In the description of the invention, it is to be noted that, unless otherwise explicitly specified or limited, the terms "mounted", "connected" and "connected" are to be construed broadly, e.g. as being fixed or detachable or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meaning of the above terms in the creation of the present invention can be understood by those of ordinary skill in the art through specific situations.
The invention is further illustrated with reference to the accompanying figures 1 to 5:
in a first mode
The present invention provides a system for detecting edge defects of a liquid crystal display, as shown in fig. 1, comprising: a horizontal detection surface 1, a detector 2 arranged vertically above the detection surface 1, a first linear light source 4 above the detection surface 1 and a second linear light source 5 below the detection surface 1, wherein,
the first linear light source 4 can be rotatably arranged, and the light beam of the first linear light source 4 is rotated to face the detector 2 for bright field imaging; the second linear light source 5 can be rotatably arranged, and the light beam of the second linear light source 5 is rotated to make the detector 2 perform dark field imaging;
the detector 2 comprises a linear array scanning camera 21 and an optical imaging lens 22, wherein the linear array scanning camera 21 is positioned above the detection surface 1; the optical imaging lens 22 is located between the line scan camera 21 and the detection surface 1, and the optical imaging lens 22 is connected with the line scan camera 21.
The mode can solve the technical problems of insufficient detection stability, time and labor waste and complex structure of the conventional detection system.
The method has reasonable layout of all parts, can detect edge breakage, cracks, scratches and burrs of the edge of the liquid crystal screen through simple light source design and change, has high accuracy and good stability, and greatly improves the detection efficiency; the detector 2 can collect images, time and labor are saved, the labor intensity of workers is reduced, and enterprises can save operating cost.
In addition, the line camera adopts the CCD line scanning camera 21 to scan and detect the edge area of the screen, and can collect the information of each line; the optical imaging lens 22 can image the edge information of the screen on the CCD of the line scanning camera, and has simple structure and convenient manufacture
It can be understood that the detector 2 of the present embodiment may have more modifications, specifically:
further, the line scan camera 21 is a 2K line scan camera 21 or a 4K line scan camera 21. Further, the line scan camera 21 of the present embodiment is a 2K line scan camera 21.
Therefore, under a certain visual range, the 2K image linear array scanning camera 21 is quite fine and smooth, can meet the requirement of image collection, and has low manufacturing cost; the 4K image line scan camera 21 can display more contents and is more efficient for a specific scene.
Further, an image acquisition card is arranged in the linear array scanning camera 21.
Thus, the image acquisition card is used for transmitting signals, and can acquire and transmit image signals of the linear array scanning camera 21 to a computer, so that remote operation and recording are realized, and the system is convenient and efficient.
Further, the detector 2 further comprises an angle adjusting table 23, and a rotatable end of the angle adjusting table 23 is fixedly connected with a side wall of the linear array scanning camera 21.
In this way, the angle adjustment stage 23 is used to adjust the orientation of the aperture of the line scan camera 21, helping to collect images of the dark field and images of the bright field.
Further, the detector 2 further comprises an XY fine adjustment platform 24, and a connection end of the XY fine adjustment platform 24 is fixedly connected with a side wall of the linear array scanning camera 21.
In this way, the XY fine adjustment stage 24 is used to finely adjust the orientation of the line scan camera 21 so that the line scan camera 21 can be aligned with the edge portion to be measured of the detection surface 1.
It can also be understood that, for the sake of convenience of detection, the present method may further add some auxiliary components, specifically:
further, the device also comprises a transferring module 3, wherein the transferring module 3 is positioned below the detection surface 1 and is used for moving or rotating the detection surface 1.
Thus, the transfer module 3 is used for moving or rotating the detection surface 1, and the detector 2 is convenient to detect different edges on the liquid crystal screen.
In addition, the present invention further provides a method for detecting edge defects of a liquid crystal display, comprising the steps of:
horizontally arranging a liquid crystal screen and forming a detection surface 1;
a detector 2 is arranged above the edge of the detection surface 1, the light hole of the detector 2 faces to the part to be measured at the edge of the detection surface 1, wherein,
the detector 2 comprises a linear array scanning camera 21 with an image acquisition card, an optical imaging lens 22, an angle adjusting platform 23 and an XY fine adjustment platform 24;
according to the precision test requirement, a linear array scanning camera 21 with 2K image quality is selected; in order to cooperate with the linear scanning camera 21, an optical imaging lens 22 of 2.8/40 of Schneider is selected, the optical imaging lens 22 meeting the working distance requirement is selected, and the extension ring and the working distance of the optical imaging lens 22 are calculated as the following table 1:
TABLE 1
Figure BDA0003105855070000081
Selecting an opaque edge of a liquid crystal screen, as shown in fig. 2, arranging a first linear light source 4 above the detection surface 1, rotating the first linear light source 4 to enable an included angle between the light beam direction of the first linear light source 4 and the light hole direction of the detector 2 to be 25 degrees, enabling the distance between the first linear light source 4 and the opaque edge to be 60mm, and enabling the acquired image to be a bright field image, wherein the image is as shown in fig. 3, and both scratches and cracks can be acquired;
selecting a transparent edge of a liquid crystal screen, as shown in fig. 4, arranging a first line light source 4 above the detection surface 1, rotating a second line light source 5 to enable an included angle between the direction of a light beam of the second line light source 5 and the direction of an optical aperture of the detector 2 to be 5 °, wherein the distance between the first line light source 4 and the opaque edge is 30mm, the acquired image is a dark field image, and the image is as shown in fig. 5, wherein all edges, corners and cracks can be acquired.
The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims (10)

1. A system for detecting edge defects of a liquid crystal screen, comprising: a horizontal detection surface (1), a detector (2) vertically arranged above the detection surface (1), a first line light source (4) positioned above the detection surface (1) and a second line light source (5) positioned below the detection surface (1), wherein,
the first linear light source (4) can be rotatably arranged, and the light beam of the first linear light source (4) is rotated to face the detector (2) to carry out bright field imaging; the second linear light source (5) can be rotatably arranged, and the light beam of the second linear light source (5) is rotated to face the detector (2) to perform dark field imaging.
2. The system for detecting edge defects of liquid crystal screens according to claim 1, characterized in that the detector (2) comprises a line scan camera (21) and an optical imaging lens (22), the line scan camera (21) being located above the detection surface (1); the optical imaging lens (22) is located between the linear array scanning camera (21) and the detection surface (1), and the optical imaging lens (22) is connected with the linear array scanning camera (21).
3. The system for detecting edge defects of liquid crystal screens according to claim 2, characterized in that the line scan camera (21) is a 2K line scan camera (21) or a 4K line scan camera (21).
4. The system for detecting the edge defects of the liquid crystal screen according to claim 2, wherein an image acquisition card is arranged in the line scanning camera (21).
5. The system for detecting the edge defects of the liquid crystal screen according to claim 2, wherein the detector (2) further comprises an angle adjusting table (23), and a rotatable end of the angle adjusting table (23) is fixedly connected with a side wall of the line scanning camera (21).
6. The system for detecting the edge defects of the liquid crystal screen according to claim 2, wherein the detector (2) further comprises an XY fine-tuning platform (24), and a connecting end of the XY fine-tuning platform (24) is fixedly connected with a side wall of the line scanning camera (21).
7. The system for detecting the edge defect of the liquid crystal screen according to any one of claims 1 to 6, further comprising a transferring module (3), wherein the transferring module (3) is located below the detection surface (1) and is used for moving or rotating the detection surface (1).
8. A method for detecting edge defects of a liquid crystal screen is characterized by comprising the following steps:
horizontally arranging a liquid crystal screen and forming a detection surface (1);
arranging a detector (2) above the edge of a detection surface (1), wherein an optical hole of the detector (2) faces to a part to be detected at the edge of the detection surface (1);
arranging a first linear light source (4) above the detection surface (1), rotating the light beam direction of the first linear light source (4) to enable the detector (2) to carry out bright field imaging, and then collecting a bright field image through the detector (2);
and arranging a second linear light source (5) below the detection plane (1), rotating the light beam of the second linear light source (5) to enable the detector (2) to carry out dark field imaging, and collecting dark field images through the detector (2).
9. System for detecting edge defects of liquid crystal screens according to claim 8, characterized in that the angle between the direction of the beam of the first line source (4) and the direction of the aperture of the detector (2) is Z1Z is the same as1Satisfies the relationship: 20 DEG ≦ Z1≦ 30 °; the included angle between the light beam direction of the second linear light source (5) and the light hole direction of the detector (2) is Z2Z is the same as2Satisfies the relationship: 5 DEG ≦ Z2≦10°。
10. System for detecting edge defects of liquid crystal screens according to claim 8, characterized in that the distance between the first line light source (4) and the detection surface (1) is L1Said L is1Satisfies the relationship: l is 50mm ≦ L1≦ 70 mm; the distance between the second linear light source (5) and the detection surface (1) is L2Said L is2Satisfies the relationship: l is less than or equal to 25mm ≦ L2≦35mm。
CN202110636284.3A 2021-06-08 2021-06-08 System and method for detecting edge defects of liquid crystal screen Pending CN113533364A (en)

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Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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TW201727221A (en) * 2016-01-25 2017-08-01 Easy Field Corp Wafer edge measuring module comprising a linear scanning camera and a light source module group
CN107356608A (en) * 2017-07-21 2017-11-17 中国工程物理研究院激光聚变研究中心 The quick dark field detection method of heavy caliber fused quartz optical component surface microdefect
CN210119453U (en) * 2019-03-27 2020-02-28 爱丁堡(南京)光电设备有限公司 Detection apparatus for smooth surface defect
WO2020191967A1 (en) * 2019-03-27 2020-10-01 爱丁堡(南京)光电设备有限公司 Detection method for smooth surface defects and detection device therefor

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103217435A (en) * 2012-01-19 2013-07-24 昆山思拓机器有限公司 Medical support detection device
TW201727221A (en) * 2016-01-25 2017-08-01 Easy Field Corp Wafer edge measuring module comprising a linear scanning camera and a light source module group
CN206223686U (en) * 2016-11-25 2017-06-06 北京兆维电子(集团)有限责任公司 A kind of LCD open defects detecting system
CN107356608A (en) * 2017-07-21 2017-11-17 中国工程物理研究院激光聚变研究中心 The quick dark field detection method of heavy caliber fused quartz optical component surface microdefect
CN210119453U (en) * 2019-03-27 2020-02-28 爱丁堡(南京)光电设备有限公司 Detection apparatus for smooth surface defect
WO2020191967A1 (en) * 2019-03-27 2020-10-01 爱丁堡(南京)光电设备有限公司 Detection method for smooth surface defects and detection device therefor

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