CN107764285A - A kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier - Google Patents
A kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier Download PDFInfo
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- CN107764285A CN107764285A CN201710855308.8A CN201710855308A CN107764285A CN 107764285 A CN107764285 A CN 107764285A CN 201710855308 A CN201710855308 A CN 201710855308A CN 107764285 A CN107764285 A CN 107764285A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C25/00—Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/58—Turn-sensitive devices without moving masses
- G01C19/64—Gyrometers using the Sagnac effect, i.e. rotation-induced shifts between counter-rotating electromagnetic beams
- G01C19/72—Gyrometers using the Sagnac effect, i.e. rotation-induced shifts between counter-rotating electromagnetic beams with counter-rotating light beams in a passive ring, e.g. fibre laser gyrometers
Abstract
The invention discloses a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier, for realizing the measurement to the PSRR parameter of photoelectric sensor assembly.The test system is made up of three parts, and respectively noise injection add circuit, photoelectric sensor assembly (PIN FET components) (device under test) and correlation detecting circuit are formed.Wherein, noise injection add circuit is used to inject AC noise in the DC power supply terminal of photoelectric sensor assembly, photoelectric sensor assembly is device to be measured, correlation detecting circuit is located inside lock-in amplifier, for detecting and demodulating photoelectric sensor assembly signal output part with injecting signal amplitude size of the noise with frequency.
Description
Technical field
The present invention relates to a kind of PSRR test system based on Detection of Weak Signals, power supply noise is visited by photoelectricity
It is very faint to survey after component the same frequency noise reached in output end, therefore is detected using lock-in amplifier.Therefore, the test device is more
Particularly, a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier is referred to.
Background technology
Optical fibre gyro is a kind of angular velocity measurement device based on Sagnac effects, is widely used in field of inertia measurement.
The photodetector assembly that internal optical fiber gyro uses at present is PIN-FET components, is turned for carrying out photoelectricity to interference light signal
Change.The component is mainly made up of two parts, and a part is semiconductor PIN photodiode, and another part is FET preamplifiers
Circuit (using Low-noise GaAs FET as input stage).
The fundamental diagram of PIN-FET components is as shown in figure 1, its operation principle is：Apply to photodiode reversely inclined
Pressure, when photodiode is by illumination, and light energy is more than or equal to the band-gap energy of photodiode material, photon release
Energy, electronics are stimulated and produce photo-generated carrier, in the presence of PN junction electric field, eventually form the electricity for flowing through photodiode
Stream.Field-effect transistor (FET) and triode composition transimpedance amplifying circuit, by low current signal caused by photodiode
Amplification, and realize conversion of the electric current to voltage, last output voltage signal.
FET pre-amplification circuits have high input impedance, and preferable matching can be formed with PIN diode, is advantageous to subtract
Small external disturbance and stray capacitance, reduce thermal noise.Optical fibre gyro is with photodiode in photoelectric sensor assembly with being put before FET
Big device is connected using transimpedance, has the characteristics that high sensitivity, signal to noise ratio are high, bandwidth is high.The preposition amplifications of PIN-FET components FET
The circuit first order is field effect transistor amplification circuit.It is that input impedance is high that the first order, which selects the reason for FET, while field-effect
The InGaAs FETs of pipe selection low noise can reduce the noise level of photoelectric sensor assembly.Amplify for common base the second level
Common source-cobasis structure that circuit, the first order and the second level are formed can provide enough amplifier bandwidths.The third level is to penetrate with electricity
Road, output stage can improve the carrying load ability of circuit using emitter follower.Transimpedance one end is penetrated with circuit with the third level
The emitter-base bandgap grading of NPN triode is connected, and the other end is connected with the grid of FET, forms parallel voltage negtive backword circuit.Output end
At the emitter-base bandgap grading of afterbody NPN triode, the resistance of the certain resistance of output end series connection, to eliminate ring and vibration.
Optical fibre gyro detection circuit is complicated Digital Analog Hybrid Circuits, and its digital circuit and analog circuit use same set of electricity
Source, therefore output of the power supply noise to device can produce large effect.As optical fibre gyro is to small-sized and assembly circuit one
Body direction is developed, and its Power Integrity problem detected in circuit is more prominent.Photoelectric sensor assembly is in optical fibre gyro
Photoelectric conversion section, as the first order device of electric signal transmission, it is the signal source for detecting circuit part that it, which is exported, is to influence
The key factor of FOG detection signal-to-noise ratios, and determine the important step of FOG random walk coefficient indexs.Study photodetection group
Influence of the noise to its output signal has ten to follow-up study optical fibre gyro Detection of Weak Signals anti-interference problem at part power supply
Divide important meaning.
The content of the invention
The technical problem to be solved in the present invention is：Study the photoelectric sensor assembly device suppression energy to power supply noise in itself
Power, a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier is designed, for measuring photodetection group
The AC power rejection ratio of part, to reduce the power supply noise in circuit, optimization circuit structure provides parameter and instructed.
The present invention solve the technical scheme that uses of above-mentioned technical problem for：A kind of photodetection group based on lock-in amplifier
Part PSRR test system, for measuring power supply noise caused by feeder ear by being reflected in photoelectricity after photoelectric sensor assembly
Noise size in probe assembly output signal.The PSRR of photoelectric sensor assembly characterizes photoelectric sensor assembly device sheet
Rejection ability of the body to power supply noise.
The photoelectric sensor assembly PSRR test system based on lock-in amplifier is divided into two parts, makes an uproar respectively
Sound injects add circuit and photoelectric sensor assembly output signal correlation detecting circuit.Wherein noise injection add circuit uses power
Operational amplifier builds alternating voltage and the superimposed add circuit of DC voltage；Photoelectric sensor assembly output signal coherent detection
The correlation detecting circuit that circuit is made up of signal generator, photoelectric sensor assembly and lock-in amplifier.
The sine wave for the specific frequency that signal generator is sent, it is input to the direct current with D.C. regulated power supply in add circuit
Voltage is overlapped, and the signal after superposition is input to the power pin of photoelectric sensor assembly.By photoelectric sensor assembly normal work
When output signal be input to the signal input part of lock-in amplifier, meanwhile, the sine wave that signal generator is sent is input to lock
The reference edge of phase amplifier.The correlation demodulation to output signal is realized inside lock-in amplifier according to Theory of correlation detection, is obtained
Signal amplitude to the AC signal being superimposed with supply voltage with frequency, photoelectric sensor assembly is calculated under fixed frequency
PSRR.
The same additive process circuit or anti-phase addition that the noise injection add circuit can be made up of operational amplifier
Circuit.D. c. voltage signal can be input to fortune caused by ac voltage signal caused by signal generator and D.C. regulated power supply
The normal phase input end of amplifier is calculated, the inverting input of operational amplifier can also be input to, put through what operational amplifier was built
It is superimposed after big add circuit and forms the supply voltage of photoelectric sensor assembly.
The photoelectric sensor assembly belongs to PIN-FET components, is powered by dual power supply.Wherein, for test light electrical resistivity survey
The PSRR of component is surveyed, the power-supplying forms of its positive-negative power pin are divided into three kinds, are respectively：Positive supply pin is using superposition
DC-voltage supply after fixed frequency AC signal, negative supply pin are powered using D.C. regulated power supply；Positive supply pin is adopted
Powered with D.C. regulated power supply, negative supply pin is using the DC-voltage supply after superposition fixed frequency AC signal；Positive and negative electricity
Source capsule pin is using the DC-voltage supply after superposition fixed frequency AC signal.
The photoelectric sensor assembly is PIN-FET components, and the component is mainly made up of two parts, and a part is semiconductor
PIN photodiode, another part are FET preamplifier circuits.The effect of PIN photodiode is to convert optical signal into
Electric signal；The effect of FET preamplifier circuits is that the electric signal after conversion is changed into voltage signal from current signal again to pass through
Exported after amplification.
The lock-in amplifier utilizes Theory of correlation detection to be used to measure in photoelectric sensor assembly output signal and power end
Inject the signal magnitude of noise same frequency.
The advantage of the invention is that：
(1) PSRR test system provided by the invention, the photoelectricity after opto-electronic conversion can effectively be measured
Disturbed condition of the probe assembly by the cycle power source noise of same frequency；
(2) add circuit analog power noise is built using operational amplifier, d. c. voltage signal and alternating voltage is believed
Number it is overlapped, it is simple and easy without using external instrument (such as circuit injector)；
(3) lock-in amplifier measurement signal frequency range is wide, and dynamic range is big, high sensitivity, can detect nV levels
Small-signal, measurement are accurate；
(4) coherent detection process is carried out inside lock-in amplifier, and only demodulation and input signal are the same as the noise of frequency, Ke Yiping
The noise jamming of other frequencies is covered, reliability is high.
Brief description of the drawings
Fig. 1 is PIN-FET component internal circuit structure diagrams；
Fig. 2 is the overall plan schematic diagram of the present invention；
Fig. 3 is that noise injects add circuit schematic diagram；
Fig. 4 is power end AC signal measuring circuit schematic diagram.
In figure：
1- noises inject add circuit 2- photoelectric sensor assembly 3- lock-in amplifiers
4- signal generator 5- power operational amplifier 6- D.C. regulated power supplies
7- second level operational amplifier
Embodiment
For the object, technical solutions and advantages of the present invention are more clearly understood, below in conjunction with specific embodiment, and reference
Accompanying drawing, the present invention is described in more detail.The following examples are only intended to illustrate the technical solution of the present invention more clearly, and
It can not be limited the scope of the invention with this.
First, the overall plan principle of the present invention is broadly described.Overall plan schematic diagram such as Fig. 2 institutes of the present invention
Show.Whole PSRR system is divided into three parts, and Part I is that noise injects add circuit module -1, and Part II is
Photoelectric sensor assembly -2, Part III are correlation detecting circuit (lock-in amplifier -3).Wherein, noise injection add circuit mould
Block -1 is mainly used in the injection of analog power noise, i.e., the AC signal of certain frequency is superimposed on+5V/-5V d. c. voltage signals；
Photoelectric sensor assembly -2 is device under test；Lock-in amplifier -3 is used to demodulate in the output signal of photoelectric sensor assembly -2 and noise
Inject signal amplitude size of the AC signal with frequency of the injection of add circuit -1.
Part I is noise injection circuit in Fig. 2, and wherein alternating message source is signal generator, model
The AFG3102 of Tektronix companies, DC signal source are D.C. regulated power supply, model GWINSTEK GPC-3030DN；
Part II is PIN-FET internal circuit configuration figures, and this is the packaged device of a producer in actual experiment,
Statement need not be remake；
Part III is lock-in amplifier, and an instrument, uses model SR865A.
The connection circuit of three parts is as shown in Fig. 2 the connection of circuit is：Noise injects the defeated of add circuit module -1
Go out to terminate+5V/-5V the power voltage input terminals of photoelectric sensor assembly -2；The output end access lock of photoelectric sensor assembly -2 is mutually put
The signal input part of big device -3 makees input signal；Alternating message source in noise injection add circuit module -1 is signal
In the CH1 passages access noise injection add circuit of device -4, CH2 passages access the reference signal end of lock-in amplifier -3, and will
The CH1 and CH2 of signal generator -4 are arranged to same frequency in-phase mode.
Fig. 3 is the circuit structure diagram that noise injects add circuit -1.The process that d. c. voltage signal is added with AC signal
For：Signal frequency of the signal generator -4 after first order operational amplifier -5 is constant, and amplitude is changed into original twice；The letter
Number with D.C. regulated power supply -6 caused by d. c. voltage signal form to enter with additive process circuit by second level operational amplifier -7
Row superposition, together as the supply voltage of photoelectric sensor assembly -2.
Shown in Figure 3, signal generator -4 is by electric capacity C5It is linked into the just defeated of first power operational amplifier -5
Enter end, centre connection resistance R9Ground connection, the negative input end connecting resistance R of first power operational amplifier -510Ground connection, and in R10With
Feedback resistance R is met between negative input end11To the output end of first power operational amplifier -5.First Power arithmetic amplification
The output terminating resistor R of device -512To the in-phase input end of second power operational amplifier -5, and D.C. regulated power supply -6 produces
Direct current power source voltage through R13The in-phase input end of second power operational amplifier -5 is also connected to afterwards.Second Power arithmetic
The negative input end connecting resistance R of amplifier -514Ground connection, and in R14Feedback resistance R is met between negative input end15To second power
The output end of operational amplifier -5.Finally, the output end of second power operational amplifier -5 is linked into photoelectric sensor assembly -2
+ 5V/-5V power inputs.
The circuit model according to Fig. 3, the amplitude and frequency of noise injection add circuit -1 signals at different levels can be obtained
Relation.
(1) amplifying circuit that first order operational amplifier -5 forms
The electric capacity of operational amplifier positive input and resistance composition high-pass filter in the amplifying circuit, it transmits letter
Number is：
Wherein,For the cut-off frequency of high-pass filter, its amplitude versus frequency characte is：
As w ＞ ＞ wLWhen AC signal now V can be passed through with free of losses1=V2And f1=f2。
According to the concept of operational amplifier " empty short ", and the drifting problem of operational amplifier in itself, each step voltage are not considered
Relation is as follows：
V can be obtained according to operational amplifier " void is disconnected " concept3And V4Relation:
If take R10=R11, then have V4=2V3And f4=f3, the amplifying circuit by the exchange sent from signal generator -4 believe
Number amplitude be exaggerated twice, frequency is constant.The circuit realiration amplification of AC signal of first order operational amplifier composition.
(2) add circuit that second level operational amplifier -7 forms
According to " empty short " of operational amplifier and " void is disconnected " concept, V4、V5、V6、V7And V8Between relation be：
If take R12=R13, R15=R14, then have V8=2V7=2V6=V4+V5, and have f8=f4+f5.Second level operation amplifier
The circuit realiration superposition of AC signal and direct current signal of device composition.
According to above-mentioned principle, the addition amplifying circuit being made up of two-stage calculation amplifier is realized to DC power supply
Analogue noise injects.The purpose of first order operation amplifier circuit is used to improve circuit to reduce the output impedance of AC signal
Carrying load ability.
The power pin of photoelectric sensor assembly -2 is input to using the signal after superposition as supply voltage, signal is occurred
Reference signal of the AC signal caused by device -4 as lock-in amplifier -3, the output signal of photoelectric sensor assembly -2 is as lock phase
The input signal of amplifier -3, demodulate with the AC signal added with the interference signal of frequency, that is, survey in lock-in amplifier -3
Measure the noise size that power supply noise is reflected in by photoelectric sensor assembly -2 in output.
Change the frequency of AC signal caused by signal generator -4, read the demodulation value of lock-in amplifier -3, utilize electricity
The calculation formula of source rejection ratio draws the PSRR of the photoelectric sensor assembly -2 under the dot frequency.Using frequency as horizontal seat
Mark, PSRR are that ordinate carries out line, you can the exchange of photoelectric sensor assembly -2 is obtained in the frequency range of test
Rejection ratio curve.
Wherein, the calculation formula of PSRR is：
It should be noted that due to actual circuit unstability and operational amplifier drift the problems such as, regardless of whether
There are w ＞ ＞ wL, into the voltage V of photoelectric sensor assembly -28All it is not exactly equal to 2V1.Therefore, actual circuit progress phase is being built
When closing detection measurement, the reference signal for being input to the reference edge of lock-in amplifier -3 should be the output of second level operational amplifier -7
End, i.e., reference signal is V8, the frequency for participating in modulation /demodulation is f8.When carrying out the calculating of PSRR, power input
Voltage pulsation should be V8In alternating component be V8'.Approximation is using AC signal caused by signal generator -4 as reference signal, V8
For input signal, V8' the measurement of lock-in amplifier -3 can be used to show that measuring circuit schematic diagram is as shown in Figure 4.Now it is applied to
The PSRR calculation formula of photoelectric sensor assembly -2 is：
Wherein V8' it is in V by lock-in amplifier -38The alternating component of middle extraction, Δ VOUTIt is lock-in amplifier -3 in photoelectricity
The output end of probe assembly -2 demodulates and V8' same frequency signal magnitude.
From above-described embodiment as can be seen that the power supply suppression of the photoelectric sensor assembly provided by the invention based on lock-in amplifier
System realizes the measurement of photoelectric sensor assembly PSRR, compensate for photodetector electricity in databook than test system
The blank of source rejection ratio parameter, quantitatively characterize influence of the power supply noise to photoelectric sensor assembly output end.
What the present invention was not disclosed in detail partly belongs to techniques known.
Although the illustrative embodiment of the present invention is described above, in order to the technology of the art
Personnel understand the present invention, it should be apparent that the invention is not restricted to the scope of embodiment, to the common skill of the art
For art personnel, if various change in the spirit and scope of the present invention that appended claim limits and determines, these
Change is it will be apparent that all utilize the innovation and creation of present inventive concept in the row of protection.
Claims (5)
1. a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier, it is characterised in that including noise
Inject add circuit module, photoelectric sensor assembly and lock-in amplifier；
Noise injection add circuit module simulation power supply noise the injection ,+5V/-5V power supplys electricity of output termination photoelectric sensor assembly
Input is pressed, the signal input part of the output end access lock-in amplifier of photoelectric sensor assembly makees input signal, and noise injection adds
The reference signal end of the output end access lock-in amplifier of signal generator in method circuit module, lock-in amplifier demodulation photoelectricity
AC noise size in the output signal of probe assembly with the AC signal that noise injection add circuit module is injected with frequency, this
Noise is the noise that power supply noise passes through photoelectric sensor assembly.
2. a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier according to claim 1,
Characterized in that, noise injection add circuit includes signal generator, first order operational amplifier, D.C. regulated power supply and second
Level operational amplifier；
Signal generator is alternating message source, outputs signal to first order operational amplifier, after first order operational amplifier
Signal frequency it is constant, amplitude is changed into original twice, and d. c. voltage signal passes through caused by the signal and D.C. regulated power supply
Second level operational amplifier composition is overlapped with additive process circuit, the supply voltage as photoelectric sensor assembly.
3. a kind of photoelectric sensor assembly PSRR test system based on lock-in amplifier according to claim 2,
Characterized in that, described noise injection add circuit is specially：
Signal generator passes through electric capacity C5It is linked into the in-phase input end of first power operational amplifier, centre connection resistance R9
Ground connection, the anti-phase input terminating resistor R of first power operational amplifier10Ground connection, and in R10It is reversed between inverting input
Feed resistance R11To the output end of first power operational amplifier, the output terminating resistor R of first power operational amplifier12
To the in-phase input end of second power operational amplifier, and direct current power source voltage caused by D.C. regulated power supply is through R13Also connect afterwards
It is connected to the in-phase input end of second power operational amplifier, the anti-phase input terminating resistor R of second power operational amplifier14
Ground connection, and in R14Feedback resistance R is met between inverting input15To the output end of second power operational amplifier, second
The output end of power operational amplifier is linked into the+5V/-5V power inputs of photoelectric sensor assembly.
A kind of 4. photoelectric sensor assembly electricity based on lock-in amplifier according to claim 1-3 any one claims
Source rejection ratio test system, it is characterised in that the amplitude of noise injection add circuit signals at different levels and the relation of frequency are specially：
In the amplifying circuit of (1) first power operational amplifier composition：
The electric capacity of operational amplifier in-phase input end and resistance composition high-pass filter in first power operational amplifier, its
Transmission function is：
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Wherein, C5The electric capacity being connected for first order power operational amplifier in-phase input end with signal, R9For electric capacity C5With
The connected grounding resistance of operational amplifier in-phase input end, A C5And R9The transmission function of the high-pass filter of composition, V2For
One-level power operational amplifier homophase input terminal voltage, V1For signal occur caused by alternating voltage,For high pass
The cut-off frequency of wave filter, its amplitude versus frequency characte are：
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As w ＞ ＞ wLWhen AC signal free of losses pass through now V1=V2And f1=f2；
According to the concept of operational amplifier " empty short ", and the drifting problem of operational amplifier in itself, voltage relationships at different levels are not considered
It is as follows：
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Wherein, V3For first order power operational amplifier anti-phase input terminal voltage, f3For the frequency values of signal at this, f2For first
The frequency values of level power operational amplifier homophase input end signal；
V is obtained according to operational amplifier " void is disconnected " concept3And V4Relation：
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Wherein, V4For the output end voltage of first order power operational amplifier, R10For the grounding resistance of inverting input, R11To put
Feedback resistance greatly between device inverting input and output end, if taking R10=R11, then have V4=2V3And f4=f3, the amplifying circuit
The amplitude of the AC signal sent from signal generator is exaggerated twice, frequency is constant；
(2) in the add circuit of second level operational amplifier composition：
According to " empty short " of operational amplifier and " void is disconnected " concept, V4、V5、V6、V7And V8Between relation be：
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<mi>R</mi>
<mn>15</mn>
</msub>
</mfrac>
<mo>+</mo>
<mfrac>
<mrow>
<mn>0</mn>
<mo>-</mo>
<msub>
<mi>V</mi>
<mn>7</mn>
</msub>
</mrow>
<msub>
<mi>R</mi>
<mn>14</mn>
</msub>
</mfrac>
<mo>=</mo>
<mn>0</mn>
</mrow>
</mtd>
</mtr>
</mtable>
</mfenced>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>5</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, V5The direct current supply voltage of add circuit, V are injected for noise6For second level power operational amplifier normal phase input end
Voltage, V7Second level power operational amplifier anti-phase input terminal voltage, R12For first order power operational amplifier output end and the
The connected resistance of secondary power operational amplifier in-phase input end, R13It is same for DC power supply and secondary power operational amplifier
The connected resistance of phase input, R14For the grounding resistance of second level power operational amplifier inverting input, R15It is anti-for amplifier
Feedback resistance between phase input and output end；If take R12=R13, R15=R14, then have V8=2V7=2V6=V4+V5, and have
f8=f4+f5, second level operational amplifier realizes the superposition of AC signal and direct current signal；
The addition amplifying circuit being made up of two-stage calculation amplifier realizes the analogue noise injection to DC power supply.
A kind of 5. photoelectric sensor assembly electricity based on lock-in amplifier according to claim 2-4 any one claims
Source rejection ratio test system, it is characterised in that change the frequency of AC signal caused by signal generator, read lock-in amplifier
Demodulation value, the PSRR of the photoelectric sensor assembly under the dot frequency is drawn using the calculation formula of PSRR,
Using frequency as abscissa, PSRR is that ordinate carries out line, and photoelectric sensor assembly is obtained in the frequency range of test
Exchange rejection ratio curve；
The PSRR calculation formula of photoelectric sensor assembly is：
<mrow>
<mi>P</mi>
<mi>S</mi>
<mi>R</mi>
<mi>R</mi>
<mo>=</mo>
<mn>20</mn>
<mi>lg</mi>
<mfrac>
<mrow>
<msub>
<mi>&Delta;V</mi>
<mrow>
<mi>I</mi>
<mi>N</mi>
</mrow>
</msub>
</mrow>
<mrow>
<msub>
<mi>&Delta;V</mi>
<mrow>
<mi>O</mi>
<mi>U</mi>
<mi>T</mi>
</mrow>
</msub>
</mrow>
</mfrac>
<mo>=</mo>
<mn>20</mn>
<mi>lg</mi>
<mfrac>
<mrow>
<msup>
<msub>
<mi>V</mi>
<mn>8</mn>
</msub>
<mo>&prime;</mo>
</msup>
</mrow>
<mrow>
<msub>
<mi>&Delta;V</mi>
<mrow>
<mi>O</mi>
<mi>U</mi>
<mi>T</mi>
</mrow>
</msub>
</mrow>
</mfrac>
<mo>-</mo>
<mo>-</mo>
<mo>-</mo>
<mrow>
<mo>(</mo>
<mn>7</mn>
<mo>)</mo>
</mrow>
</mrow>
Wherein, Δ VINFor voltage pulsation caused by photoelectric sensor assembly power input, tested in the PSRR of photoelectric sensor assembly
Middle corresponding V8', V8' it is in V by lock-in amplifier8The alternating component of middle extraction, Δ VOUTIt is lock-in amplifier in photodetection group
The output end of part demodulates and V8' same frequency signal magnitude.
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| CN107764285B (en) | 2021-02-02 |
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