CN107664715A - Cell piece prints silver paste method for testing resistance - Google Patents
Cell piece prints silver paste method for testing resistance Download PDFInfo
- Publication number
- CN107664715A CN107664715A CN201610599384.2A CN201610599384A CN107664715A CN 107664715 A CN107664715 A CN 107664715A CN 201610599384 A CN201610599384 A CN 201610599384A CN 107664715 A CN107664715 A CN 107664715A
- Authority
- CN
- China
- Prior art keywords
- probe
- cell piece
- push
- silver paste
- roots
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
Abstract
A kind of cell piece prints silver paste method for testing resistance, prints silver paste resistance testing device by cell piece and implements, and the device includes test substrate, test probe, slidingtype push-and-pull switch, push rod and microhmmeter connecting wire.The probe six roots of sensation altogether is tested, six roots of sensation test probe is linearly arranged in parallel, and the spacing of six roots of sensation test probe is adapted with the figure line spacing of tested cell piece printing silver paste.Method of testing is by the way that test probe alignment is tested into figure, contact contact with different probe group is controlled using push-and-pull slipping switch, realizes measurement pattern diverse location resistance value, and the reading numerical values on microhmmeter.The present invention is simple in construction, and part is few, detachably, easy care；Testing efficiency is high, small by interference from human factor, and the degree of accuracy is high, and test data stability is high；Easy to operate, a people can individually complete.
Description
Technical field
The present invention relates to photovoltaic technology, prints silver paste method for testing resistance more particularly, to a kind of cell piece.
Background technology
In photovoltaic industry, the research and development of silver paste are the basic of Business survival.How the performance of research and development silver paste is accurately judged,
Analysis and determination R＆D direction, ensure product stability, are inseparable with necessary science method of testing and instrument.
A data can only be measured every time when using microhmmeter direct measurement at present, and measurement every time will realign tested
Grid line, because grid line is meticulous and overmatter, easily error and inefficient during measurement.Special test probe customized
It is higher with test base station equipment cost, and test-purpose is single.
The method of resistance test has at present：
A, manual test, this method of testing waste of human resource is big, and testing efficiency is low, and the testing time is grown
It is poor that tested person personnel influence data stability.
B, measurement probe customized and base station, the method for this survey make examination efficiency increase, but cost of manufacture is expensive,
Equipment limitation is big.
The content of the invention
A kind of purpose of the present invention, exactly in order to solve the above problems, there is provided cell piece printing silver paste resistance test side
Method.
In order to achieve the above object, present invention employs following technical scheme：A kind of cell piece printing silver paste resistance is surveyed
Method for testing, silver paste resistance testing device is printed by cell piece and implemented, the device includes：
Substrate is tested, which is provided with six probe slots, six probe slot uniform intervals are set；
The six roots of sensation tests probe, is separately fixed on test substrate, and six roots of sensation test probe is linearly arranged in parallel, each to visit
Aculeata is connected with six probe slots respectively by wire, spacing and the tested cell piece printing silver of six roots of sensation test probe
The figure line spacing of slurry is adapted；
Slidingtype push-and-pull switch, it is arranged on test substrate and can be slided along test substrate, under slidingtype push-and-pull switch
Face is provided with two contacts for being used to be connected with the wire that probe is drawn, and is provided with two above and is used to pass through wire and micro-ohm
Count the contact of connection；
Push rod, being connected with slidingtype push-and-pull switch can drive slidingtype push-and-pull switch to be slided along test substrate；
Microhmmeter connecting wire, it is connected with contact above slidingtype push-and-pull switch；
The cell piece printing silver paste method for testing resistance comprises the following steps：
First, microhmmeter connecting wire is connected on microhmmeter and regulates range；
2nd, the six roots of sensation is tested into probe to contact with six grid lines one-to-one corresponding on tested silicon chip respectively；
3rd, promote push rod, make two contacts below slidingtype push-and-pull switch respectively with first, second two probes
Conductive contact, measure the resistance value between first, second two probes, and record；
4th, push rod is promoted again, and the electricity between second, third two probes is measured respectively by the similar method of step 3
Resistance, the resistance value between the three, the 4th two probes, the resistance value between the four, the 5th two probes,
5th, the resistance value between the 6th two probe, and record respectively.
The distance between the distance between slidingtype push-and-pull switch following two contact two neighboring probe slot is equal.
The present invention makes it compared with prior art, had the following advantages that and special as a result of above technical scheme
Point：
1st, simple in construction, part is few, detachably, easy care.
2nd, testing efficiency is high, and high by the small degree of accuracy of interference from human factor, data stability is high.
3rd, it is easy to operate individually to complete.
Brief description of the drawings
Fig. 1 is the basic structure schematic diagram of the cell piece printing silver paste resistance testing device used in the present invention；
Fig. 2 is tested figure.
Embodiment
The present invention is described in detail below in conjunction with the accompanying drawings.
Referring to Fig. 1, the cell piece printing silver paste resistance testing device used in of the invention, including test substrate 1,
Test probe 2, slidingtype push-and-pull switch 3, push rod 4 and microhmmeter connecting wire 5.
Test substrate 1 is provided with six probe slots 11, and six probe slot uniform intervals are set.
The six roots of sensation is separately fixed on test substrate test probe 2 altogether, and each probe tails pass through wire 6 and probe respectively
Groove 11 is connected.Six roots of sensation test probe is linearly arranged in parallel, and the spacing of six roots of sensation test probe prints with tested cell piece
The figure line spacing of brush silver paste is adapted.
Slidingtype push-and-pull switch 3 is arranged on test substrate and can slided along test substrate, under slidingtype push-and-pull switch
Face is provided with two contacts for being used to be connected with the wire that probe is drawn, and is provided with two above and is used to pass through wire and micro-ohm
Count the contact of connection.The distance between following two contact is equal with the distance between two neighboring probe slot.
Push rod 4 is connected with slidingtype push-and-pull switch can drive slidingtype push-and-pull switch to be slided along test substrate.
Microhmmeter connecting wire 5 is connected with contact above slidingtype push-and-pull switch.
Method of testing using cell piece printing silver paste resistance testing device is first to be connected to microhmmeter connecting wire
On microhmmeter and regulate range；Then by the six roots of sensation test probe respectively with a pair of six grid lines 1 on tested silicon chip
It should contact；Then promote push rod, make two contacts below slidingtype push-and-pull switch respectively with first, second two
The conductive contact of probe, the resistance value (being read from microhmmeter) between first, second two probes is measured, and
Record；Push rod is promoted again, and the resistance between second, third two probes is measured respectively by the similar method of step 3
It is worth, the resistance value between the three, the 4th two probes, the resistance value between the four, the 5th two probes, the 5th,
Resistance value between 6th two probe, and record respectively, complete test.
Fig. 2 is tested figure, and left side figure and right figure are in symmetric relation, when surveying right figure, it is only necessary to
Device direction is rotated 180 °, reversely.
Of the invention real easy to operate, operating personnel only need a people to complete measurement and writing task, greatly reduce
Time of measuring, the quality time is saved with post analysis for accumulation data.
Claims (2)
1. a kind of cell piece prints silver paste method for testing resistance, it is characterised in that prints silver paste electricity by cell piece
Hinder test device to implement, the device includes：
Substrate is tested, which is provided with six probe slots, six probe slot uniform intervals are set；
The six roots of sensation tests probe, is separately fixed on test substrate, and six roots of sensation test probe is linearly arranged in parallel, each to visit
Aculeata is connected with six probe slots respectively by wire, spacing and the tested cell piece printing silver of six roots of sensation test probe
The figure line spacing of slurry is adapted；
Slidingtype push-and-pull switch, it is arranged on test substrate and can be slided along test substrate, under slidingtype push-and-pull switch
Face is provided with two contacts for being used to be connected with the wire that probe is drawn, and is provided with two above and is used to pass through wire and micro-ohm
Count the contact of connection；
Push rod, being connected with slidingtype push-and-pull switch can drive slidingtype push-and-pull switch to be slided along test substrate；
Microhmmeter connecting wire, it is connected with contact above slidingtype push-and-pull switch；
The cell piece printing silver paste method for testing resistance comprises the following steps：
First, microhmmeter connecting wire is connected on microhmmeter and regulates range；
2nd, the six roots of sensation is tested into probe to contact with six grid lines one-to-one corresponding on tested silicon chip respectively；
3rd, promote push rod, make two contacts below slidingtype push-and-pull switch respectively with first, second two probes
Conductive contact, measure the resistance value between first, second two probes, and record；
4th, push rod is promoted again, and the electricity between second, third two probes is measured respectively by the similar method of step 3
Resistance, the resistance value between the three, the 4th two probes, the resistance value between the four, the 5th two probes,
5th, the resistance value between the 6th two probe, and record respectively.
2. cell piece according to claim 1 prints silver paste method for testing resistance, it is characterised in that：Slide
The distance between the distance between formula push-and-pull switch following two contact two neighboring probe slot is equal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610599384.2A CN107664715A (en) | 2016-07-27 | 2016-07-27 | Cell piece prints silver paste method for testing resistance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610599384.2A CN107664715A (en) | 2016-07-27 | 2016-07-27 | Cell piece prints silver paste method for testing resistance |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107664715A true CN107664715A (en) | 2018-02-06 |
Family
ID=61115069
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610599384.2A Pending CN107664715A (en) | 2016-07-27 | 2016-07-27 | Cell piece prints silver paste method for testing resistance |
Country Status (1)
| Country | Link |
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| CN (1) | CN107664715A (en) |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2833602Y (en) * | 2005-10-14 | 2006-11-01 | 广辉电子股份有限公司 | Probe measuring card |
| CN101135701A (en) * | 2006-08-29 | 2008-03-05 | 旺矽科技股份有限公司 | Vertical type high frequency probe card |
| CN101173960A (en) * | 2006-10-20 | 2008-05-07 | 台湾积体电路制造股份有限公司 | Universal array type probe card design for semiconductor device testing |
| CN101344551A (en) * | 2007-07-10 | 2009-01-14 | 台湾积体电路制造股份有限公司 | Semi-conductor test structure |
| CN103604994A (en) * | 2013-12-16 | 2014-02-26 | 苏州大学 | Test method of electrode impedances of electrochemical power supply and electrochemical energy storage device and apparatus thereof |
| CN104254781A (en) * | 2012-03-07 | 2014-12-31 | 爱德万测试公司 | Transferring electronic probe assemblies to space transformers |
| CN104793026A (en) * | 2014-01-20 | 2015-07-22 | 旺矽科技股份有限公司 | Supporting structure applied to probe testing device and manufacturing method thereof |
| CN205193138U (en) * | 2015-11-30 | 2016-04-27 | 广州广电计量检测股份有限公司 | Voltage drop testing arrangement |
| CN205333737U (en) * | 2016-01-08 | 2016-06-22 | 宁波智锐新材料有限公司 | Surface resistance measuring device of antistatic coating |
-
2016
- 2016-07-27 CN CN201610599384.2A patent/CN107664715A/en active Pending
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2833602Y (en) * | 2005-10-14 | 2006-11-01 | 广辉电子股份有限公司 | Probe measuring card |
| CN101135701A (en) * | 2006-08-29 | 2008-03-05 | 旺矽科技股份有限公司 | Vertical type high frequency probe card |
| CN101173960A (en) * | 2006-10-20 | 2008-05-07 | 台湾积体电路制造股份有限公司 | Universal array type probe card design for semiconductor device testing |
| CN101344551A (en) * | 2007-07-10 | 2009-01-14 | 台湾积体电路制造股份有限公司 | Semi-conductor test structure |
| CN104254781A (en) * | 2012-03-07 | 2014-12-31 | 爱德万测试公司 | Transferring electronic probe assemblies to space transformers |
| CN103604994A (en) * | 2013-12-16 | 2014-02-26 | 苏州大学 | Test method of electrode impedances of electrochemical power supply and electrochemical energy storage device and apparatus thereof |
| CN104793026A (en) * | 2014-01-20 | 2015-07-22 | 旺矽科技股份有限公司 | Supporting structure applied to probe testing device and manufacturing method thereof |
| CN205193138U (en) * | 2015-11-30 | 2016-04-27 | 广州广电计量检测股份有限公司 | Voltage drop testing arrangement |
| CN205333737U (en) * | 2016-01-08 | 2016-06-22 | 宁波智锐新材料有限公司 | Surface resistance measuring device of antistatic coating |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20180206 |
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| RJ01 | Rejection of invention patent application after publication |