CN107656386A - Array base palte and restorative procedure and display panel - Google Patents
Array base palte and restorative procedure and display panel Download PDFInfo
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- CN107656386A CN107656386A CN201710773136.XA CN201710773136A CN107656386A CN 107656386 A CN107656386 A CN 107656386A CN 201710773136 A CN201710773136 A CN 201710773136A CN 107656386 A CN107656386 A CN 107656386A
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- cabling
- base palte
- array base
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
Abstract
The embodiment of the present application discloses a kind of array base palte and restorative procedure, display panel, and the array base palte includes：Substrate, the pixel cell being arranged in array on substrate, and data wire arranged in a crossed manner and scan line, wherein, each column pixel cell electrically connects with a data line, and often row pixel cell electrically connects with a scan line；A plurality of repair signal line and a plurality of cabling, by cabling and data wire or scanning line parallel, repair signal line is used to repair the data wire or scan line when data wire or scan line in parallel therewith break down every repair signal line.So as to improve the production yields of array base palte.
Description
Technical field
The application is related to display technology field, more particularly to the restorative procedure of a kind of array base palte and the array base palte, with
And the display panel including the array base palte.
Background technology
With the continuous development of science and technology, electronic equipment is also more and more common, and the fault rate of electronic equipment also increases.
Many cablings can be included in existing display panel, and wherein most cabling can be arranged on display surface
On array base palte in plate.Therefore, the technique for making array base palte is particularly important.But in the mistake of actual fabrication array base palte
Cheng Zhong, because the limitation of technique and material etc. be present, easily the cabling being disposed thereon is broken down.Here cabling is usual
The failure that can occur includes open circuit or short circuit etc..Cabling in array base palte can make influence display panel just after breaking down
Often display, it is therefore desirable to repaired to the cabling to break down.But do not have effective cabling fault restoration means currently,
When cabling failure occurs in array base palte the array base palte would generally be caused to scrap, so as to reduce the production non-defective unit of array base palte
Rate.
The content of the invention
The purpose of the application is to propose a kind of array base palte, and the display panel including the array base palte, to solve
The technical problem that background section above is mentioned.
To achieve the above object, in a first aspect, this application provides a kind of array base palte, including：Substrate, on substrate
The pixel cell being arranged in array, and data wire arranged in a crossed manner and scan line, wherein, each column pixel cell and a number
Electrically connected according to line, often row pixel cell electrically connects with a scan line；A plurality of repair signal line and a plurality of cabling, every is repaired letter
By cabling and data wire or scanning line parallel, repair signal line is used to occur in data wire or scan line in parallel therewith for number line
The data wire or scan line are repaired during failure.
Second aspect, this application provides a kind of display panel, including above-mentioned array base palte.
The third aspect, it is used to repair above-mentioned array base palte this application provides a kind of restorative procedure of array base palte, should
Method includes：Determine that short-circuit first position occurs in the first signal wire, wherein, the first signal wire is the data that short circuit occurs
Line or scan line；The second place in the first signal wire and the 3rd position are fused respectively, wherein, the second place and the 3rd position
It is located at the both sides of first position respectively.
The array base palte and display panel that the application provides, including substrate, the pixel being arranged in array on substrate
Unit, and the data wire electrically connected with each column pixel cell and the scan line electrically connected with every row pixel cell, a plurality of reparation
Signal wire and a plurality of cabling, wherein every repair signal line can be each to repair letter by cabling and data wire or scanning line parallel
Number line can repair the data wire or scan line when data wire or scan line in parallel therewith break down, it is achieved thereby that right
The reparation of data wire and scan line in array base palte, improve the yields of array base palte production.
Brief description of the drawings
By reading the detailed description made to non-limiting example made with reference to the following drawings, the application's is other
Feature, objects and advantages will become more apparent upon：
Fig. 1 shows the structural representation of an embodiment of the array base palte according to the application；
Fig. 2 shows the structural representation of another embodiment of the array base palte according to the application；
Fig. 3 shows a partial structural diagram of the array base palte in Fig. 2；
Fig. 4 shows another partial structural diagram of the array base palte in Fig. 2；
Fig. 5 shows the another partial structural diagram of the array base palte in Fig. 2；
Fig. 6 shows the flow of an embodiment of the restorative procedure of the array base palte according to the application；
Fig. 7 shows the structural representation of an embodiment of the display panel according to the application.
Embodiment
The application is described in further detail with reference to the accompanying drawings and examples.It is understood that this place is retouched
The specific embodiment stated is used only for explaining related invention, rather than the restriction to the invention.It also should be noted that in order to
Be easy to describe, illustrate only in accompanying drawing to about the related part of invention.
It should be noted that in the case where not conflicting, the feature in embodiment and embodiment in the application can phase
Mutually combination.Describe the application in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
Fig. 1 is refer to, it illustrates the structural representation of an embodiment of the array base palte according to the application.Such as Fig. 1 institutes
Show, the array base palte 100 of the present embodiment includes substrate 101, pixel cell 102, data wire 103, scan line 104, repair signal
Line 105 and cabling 106.
In the present embodiment, above-mentioned array base palte 100 includes multiple pixel cells 102, and each pixel cell 102 is arranged on lining
On bottom 101, and each pixel cell 102 is arranged in array, as shown in Figure 1.Generally, the above-mentioned each pixel cell being arranged in array
102 can include multirow pixel cell 102 and multiple row pixel cell 102.Wherein, each column pixel cell 102 can include multiple
The pixel cell 102 of D1 arrangements in the first direction, the picture that often row pixel cell 102 can arrange including multiple D2 in a second direction
Plain unit 102.Here, first direction D1 intersects with second direction D2, as shown in Figure 1.Array base palte 100 also includes more datas
Line 103 and multi-strip scanning line 104, D1 extends each data wire 103 in the first direction, and each column pixel cell 102 can be with a number
Being electrically connected according to line 103, i.e., each pixel cell 102 in each column pixel cell 102 electrically connects with same data line 103,
As shown in Figure 1.D2 extends above-mentioned each scan line 104 in a second direction, and often row pixel cell 102 can be with a scan line 104
Electrical connection, i.e., each pixel cell 102 often in row pixel cell 102 electrically connects with same scan line 104, such as Fig. 1 institutes
Show.
In the present embodiment, above-mentioned array base palte 100 also includes a plurality of repair signal line 105 and a plurality of cabling 106, such as schemes
Shown in 1, and every repair signal line 105 can be in parallel with data wire 103 or scan line 104.Specifically, each cabling 106 is electrically connected
It is connected between repair signal line 105 and data wire 103 or scan line 104, so that each repair signal line 105 passes through cabling
106 is in parallel with data wire 103 or scan line 104.When driving chip etc. is that each data wire 103 or scan line 104 provide accordingly
During signal, the repair signal line 105 in parallel with data wire 103 or scan line 104 can also obtain the signal.Therefore, data are worked as
When line 103 or scan line 104 break down, the repair signal line 105 in parallel with the data wire 103 or scan line 104 of the failure
Corresponding signal can be conveyed, so as to repair data wire 103 or the scan line 104 that this breaks down.It can be seen that above-mentioned repair signal
Line 105 can avoid the factor data line 103 of array base palte 100 and scan line 104 from breaking down and cause to scrap, and improve array base palte
100 production yields.
In some optional implementations of the present embodiment, above-mentioned a plurality of repair signal line 105 can include a plurality of the
One repair signal line 1051, a plurality of cabling 106 can include a plurality of first cabling 1061, as shown in Figure 1.Each first cabling 1061
It is connected electrically between the repair signal line 1051 of data wire 103 and first, so that every first repair signal line 1051 passes through
First cabling 1061 is in parallel with data wire 103.When data wire 103 breaks down, the data wire with breaking down can be utilized
103 first repair signal lines 1051 in parallel repair the data wire 103.Alternatively, every data line on array base palte 100
103 can have the first repair signal line 1051 in parallel therewith, thereby may be ensured that every data line 103 is breaking down
When can be repaired, improve the repair rate of array base palte.Generally, each data wire 103 can be located at the pixel list of adjacent column
Between member 102, so that each data wire 103 can electrically connect with pixel cell 102 adjacent thereto, as shown in Figure 1.It is appreciated that
, the first repair signal line 1051 in parallel with each data wire 103 can also be arranged on adjacent column pixel cell 102 it
Between, so that data wire 103 can be arranged in parallel with the first repair signal line 1051, in order to which data wire 103 can be with
One repair signal line 1051 is in parallel, as shown in Figure 1.
In some optional implementations of the present embodiment, above-mentioned a plurality of repair signal line 105 can also include a plurality of
Second repair signal line 1052, and a plurality of cabling 106 can include a plurality of second cabling 1062, as shown in Figure 1.Each second cabling
1062 are connected electrically between the repair signal line 1052 of scan line 104 and second, so that every second repair signal line 1052
It is in parallel with scan line 104 by the second cabling 1062.When scan line 104 breaks down, it can utilize and be swept with what is broken down
Retouch the second repair signal line 1052 in parallel of line 104 and repair the scan line 104.Alternatively, every scanning on array base palte 100
Line 104 can have the second repair signal line 1052 in parallel therewith, thereby may be ensured that event is occurring for every scan line 104
It can be repaired during barrier, further increasing the repair rate of array base palte.Generally, each scan line 104 can be located at adjacent
Between capable pixel cell 102, so that each scan line 104 can electrically connect with pixel cell 102 adjacent thereto, it is possible to understand that
, the second repair signal line 1052 in parallel with each scan line 104 can also be arranged on adjacent lines pixel cell 102 it
Between, so that scan line 104 can be arranged in parallel with the second repair signal line 1052, in order to which scan line 104 can be with
Two repair signal line 1052 is in parallel, as shown in Figure 1.
In the present embodiment in some optional implementations, for any data line 103, there may be a plurality of first cabling
1061 electrically connect with the data wire 103, as shown in figure 1, each data wire 103 can pass through corresponding first cabling 1061 and first
Repair signal line 1051 is in parallel.Also, for any scan line 104, there may be a plurality of second cabling 1062 and the scan line
104 electrical connections, each scan line 104 can be in parallel with the second repair signal line 1052 by corresponding second cabling 1062.Driving
Chip etc. can be that data wire 103 provides data-signal, so that each data wire 103 can export data-signal to therewith
The pixel cell 102 of electrical connection.When each data wire 103 receives data-signal, in parallel with each data wire 103 first repairs
Signal wire 1051 can also receive corresponding data-signal, it is seen then that if data wire 103 breaks down, the first repair signal
Line 1051 can replace the data wire outputting data signals of faulty component, so as to realize the reparation of the failure to data wire 103.Together
Sample, driving chip etc. can be that scan line 104 provides scanning signal, so that each scan line 104 can be by scanning signal
Export to the pixel cell 102 being electrically connected.It is in parallel with each scan line 104 when each scan line 104 receives scanning signal
The second repair signal line 1052 can also receive corresponding scanning signal, it is seen then that if scan line 104 breaks down,
Two repair signal lines 1052 can replace the data wire output scanning signal of faulty component, so as to realize the event to scan line 104
Barrier is repaired.
In some optional implementations of the present embodiment, above-mentioned array base palte 100 can also include viewing area 108 and non-
The non-display area 109 of viewing area 109, wherein array base palte is around viewing area 108, as shown in figure 1, above-mentioned each data wire 103, sweeping
Retouch line 104 and repair signal line 105 is respectively positioned on viewing area 108.
The array base palte that above-described embodiment of the application provides, including the pixel being arranged in array on substrate, position substrate
Unit, and the data wire electrically connected with each column pixel cell and the scan line electrically connected with every row pixel cell, a plurality of reparation
Signal wire and a plurality of cabling, wherein every repair signal line passes through cabling and data wire or scanning line parallel, each repair signal line
The data wire or scan line can be repaired when data wire or scan line in parallel therewith break down, it is achieved thereby that to array
The reparation of data wire and scan line in substrate, improve the yields of array base palte production.
Please continue to refer to Fig. 2, it illustrates the structural representation of another embodiment of the array base palte according to the application.Such as
Shown in Fig. 2, the array base palte 200 of this implementation is repaiied including substrate 201, pixel cell 202, data wire 203, scan line 204, first
Complex signal line 2051, the second repair signal line 2052, the first cabling 2061 and the second cabling 2062.
In the present embodiment, above-mentioned array base palte 200 includes multiple pixel cells 202, a plurality of data lines 203 and a plurality of swept
Line 204 is retouched, and each pixel cell 202, data wire 203 and scan line 204 are set on the substrate 201, as shown in Figure 2.Each pixel
Unit 202 is arranged in array, and each data wire 203 and each scan line 204 are arranged in a crossed manner.The pixel cell 202 being arranged in array wraps
Multirow pixel cell 202 and multiple row pixel cell 202 are included, and each column pixel cell 202 electrically connects with a data line 203, often
Row pixel cell 202 electrically connects with a scan line 204.
In the present embodiment, above-mentioned each first repair signal line 2051 is arranged between the pixel cell 202 of adjacent column, and
Each first repair signal line 2051 is parallel with data wire 203.Above-mentioned each first cabling 2061 is connected electrically in the first repair signal line
Between 2051 and data wire 203, so that each first repair signal line 2051 can pass through the first cabling 2061 and data wire
203 is in parallel.It should be noted that the first cabling 2061 electrically connected with any data line 203 can with the electricity of the data wire 203
Each pixel cell 202 of connection corresponds, i.e. in the first direction dl between adjacent the first cabling of any two 2061 only
Electrically connected in the presence of a pixel cell 202 with the data wire 203.When the data wire between the first cabling of any two 2061
, it is necessary to sacrifice the pixel cell between two neighboring first cabling 2061 during the 203 generations such as failure of open circuit or open circuit
202, therefore, the first cabling 2061 electrically connected with any data line 203 and each pixel cell electrically connected with the data wire 203
202 correspond, and can reduce the quantity for sacrificing pixel cell 202 as far as possible.
Above-mentioned each second repair signal line 2052 is arranged between the pixel cell 202 of adjacent lines, and each second repairs letter
Number line 2052 is parallel with scan line 204.Above-mentioned each second cabling 2062 is connected electrically in the second repair signal line 2052 and scan line
Between 204, so that each second repair signal line 2052 can be in parallel with scan line 204 by the second cabling 2062.Need
Illustrate, the second cabling 2062 electrically connected with any scan line 204 can be with each pixel for being electrically connected with the scan line 204
Unit 202 corresponds, i.e. only exists a pixel between adjacent the second cabling of any two 2062 in a second direction d 2
Unit 202 electrically connects with the scan line 204.When the scan line 204 between the second cabling of any two 2062 occurs for example
, it is necessary to sacrifice the pixel cell 202 between two neighboring second cabling 2062 during the failure of open circuit or open circuit, therefore, with
A pair of the second cabling 2062 that any scan line 203 electrically connects and each pixel cell 202 1 for being electrically connected with the scan line 204
Should, the quantity for sacrificing pixel cell 202 can be reduced as far as possible..
In the present embodiment, when open circuit fault occurs for data wire 203 in above-mentioned array base palte 200, as shown in Fig. 2
In order to can clearly be seen that the open circuit of data wire 203 and repair situation, here in enlarged drawing 2 in dotted line frame 210
Partial structurtes, form partial enlargement structural representation as shown in Figure 3.When open circuit fault occurs for data wire 203, the generation
When the first breakpoint A be present in the data wire 203 of open circuit, the data wire of generation open circuit is divided into the first subdata by the first breakpoint A
The subdata line 2032 of line 2031 and second, as shown in Figure 3.Driving chip etc. is to the pixel cell electrically connected with the data wire 203
During 202 outputting data signals, data-signal flow through successively the second subdata line 2032, the first cabling 2061 in dotted line circle 212,
The first repair signal line 2051 in parallel with the data wire 203, the first cabling 2061 and the first subdata line in dotted line circle 211
2031, as indicated by the arrows in fig. 3, data letter is provided so as to be embodied as the pixel cell 202 electrically connected with the data wire 203
Number.It can be seen that the first repair signal line 2051 in parallel with each data wire 203 can be with the open circuit fault of repair data line 203.
The principle for the second breakpoint B repaired by the second repair signal line 2052 in scan line 204 is detailed below.For
The open circuit of scan line 204 can be clearly seen and repair situation, partial structurtes in enlarged drawing 2 in dotted line frame 220, are formed here
Partial enlargement structural representation as shown in Figure 4.When open circuit fault occurs for scan line 204, deposited in the breaking scan line 204
In the second breakpoint B, the scan line 204 of generation open circuit is divided into the first sub- of scan line 2041 and second by the second breakpoint B and swept
Line 2042 is retouched, as shown in Figure 4.Driving chip etc. exports scanning signal to the pixel cell 202 electrically connected with the scan line 204
When, scanning signal flows through the second sub- scan line 2042, the second cabling 2062 in dotted line circle 222 and the scan line 204 simultaneously successively
The second repair signal line 2052, the second cabling 2062 and the first sub- scan line 2041 in dotted line circle 221 of connection, in Fig. 3
Shown in arrow, so as to which the pixel cell 202 for being embodied as electrically connecting with the scan line 204 provides scanning signal.It can be seen that with each scanning
The second repair signal line 2052 in parallel of line 204 can repair the open circuit fault of scan line 204.
In some optional implementations of the present embodiment, with prolonging for the repair signal line 2051 of data wire 203 and first
It is identical to stretch direction, each second cabling 2062 D1 can also extend in the first direction.In array base palte 200, each second cabling
2062 are not set generally with the repair signal line 2051 of data wire 203 and first with layer, for example, each second cabling 2062 can be set
Conductive layer where scan line 204, the first repair signal line 2051 can be arranged on the conductive layer where data wire 203.And
And the transmission of the repair signal line 2051 of data wire 203 and first is data-signal, what each second cabling 2062 transmitted is scanning letter
Number.Therefore, in order to avoid signal interference be present between the second cabling 2062 and the repair signal line 2051 of data wire 203 or first,
Orthographic projection of above-mentioned each second cabling 2062 to substrate 201 does not overlap with orthographic projection of the data wire 203 to substrate 201, and each
Orthographic projection of orthographic projection of two cablings 2062 to substrate 201 not with each first repair signal line 2051 overlaps, as shown in Figure 2.From
And the display effect of display panel can be ensured.
In some optional implementations of the present embodiment, a plurality of public electrode can also be included in array base palte 200
Signal wire, each common electrode signal line can be arranged in a crossed manner with data wire.Each common electrode signal line exports public to array base palte
Common voltage signal.Each first cabling 2061 and common signal line can be extended with D2 in a second direction, the extension side with scan line 204
To identical.In array base palte 200, each first cabling 2061 can not be with scan line 204, the second repair signal line 2052 and public affairs
Common electrode signal wire is set with layer, for example, the first cabling 2061 can be arranged on the conductive layer where data wire 203, second repaiies
Complex signal line 2052 and common electrode signal line can be arranged on the conductive layer where scan line 204.Also, also, scan line
204 and second repair signal line 2052 transmits is scanning signal, what each first cabling 2062 transmitted is data wire, public electrode
Signal wire transmission is public voltage signal.Therefore, in order to avoid the second cabling 2062 and the repair signal of data wire 203 or first
Signal interference between line 2051 be present, orthographic projection of above-mentioned each first cabling 2061 to substrate 201 not with scan line 204, public
The orthographic projection of electrode signal line and the second repair signal line 2052 to substrate 201 overlaps.It thereby may be ensured that the institute of array base palte 200
Display panel display effect.
The array base palte that above-described embodiment of the application provides, the first repair signal line therein can be sent out with repair data line
Raw open circuit fault, the second repair signal line can repair the open circuit fault of scan line, so as to avoid array base palte because there is number
Cause the array base palte to scrap during according to line or scan line failure, improve the yields of array base palte production.
Please continue to refer to Fig. 6, it illustrates the flow of an embodiment of the restorative procedure of the array base palte according to the application.
When the data wire in the array base palte in the various embodiments described above or scan line occur short-circuit, the array base palte of the present embodiment is repaiied
Compound method 300 can be used for repairing the array base palte that short trouble occurs.As shown in fig. 6, the restorative procedure 300 of the array base palte
It may include steps of：
Step 301, determine that the first position of short circuit occurs in the first signal wire.
In the present embodiment, the location of short circuit of the first signal wire in array base palte, the short-circuit position can be detected first
Put as first position, and above-mentioned first signal wire can be the data wire or scan line that short circuit occurs in array base palte.
Step 302, the second place in the first signal wire and the 3rd position are fused respectively.
In the present embodiment, determine after short-circuit first position occurs, can continue first on the first signal wire
The second place and the 3rd position are determined on signal wire.Here, the second place and the 3rd position can be located at first position respectively
Both sides.Finally, the second place in the first signal wire and the 3rd position are fused using laser etc..So that the first signal
Signal in line can be occurred by bypassing short dot therein with first signal wire repair signal line arranged side by side so as to repair
The data wire or scan line of short circuit, improve the production yields of array base palte.
In some optional implementations of the present embodiment, between above-mentioned first position and the second place be not present with it is upper
The cabling of the first signal wire electrical connection is stated, and is also not present between first position and the 3rd position and is electrically connected with first signal wire
Cabling, so as to the length for reducing the first signal wire between the second place and the 3rd position as far as possible.It is appreciated that work as
After the second place and the 3rd position are blown, it cannot be used for passing with the first signal wire between the second place and the 3rd position
Defeated signal, therefore, pixel cell cisco unity malfunction is electrically connected with the signal wire of part first.The reduction second place as far as possible and
The length of the first signal wire between 3rd position can reduce the quantity that pixel cell is sacrificed in array base palte as far as possible, improve battle array
The production yields of row substrate.
Here by taking array base palte 200 as shown in Figure 2 as an example, when data wire 203 wherein be present short circuit occurs, in utilization
State array base palte restorative procedure 300 repair the array base palte 200 specific steps can be as follows：
In array base palte 200, short-circuit first position is at point C in data wire, as shown in Fig. 2 so as to cause the number
The 202 normal outputting data signals of pixel cell being connected electrically according to line 203 without normal direction.It is possible, firstly, in generation short circuit
Data wire in determine first position C.Here, to cause the reason for short circuit to have a variety of, for example, when being arranged on pixel cell
Source electrode in thin film transistor (TFT) and grid electrical connection in 202, can cause the data wire electrically connected with the pixel cell 202
203 occur short circuit.
When occur short circuit data wire 203 on first position C is being determined after, continue thereon determine second place D and
3rd position E, as shown in figures 2 and 5, can then laser etc. be utilized to melt second place D and the 3rd on the data wire 203
E is put, so as to which the part between the second place D and the 3rd position E in the data wire 203 is disconnected.Driving chip etc. to
During 202 outputting data signals of pixel cell electrically connected with the data wire 203 of generation short circuit, data-signal can flow through the 3rd
The first cabling 2061 in position E, dotted line circle 232, the first repair signal line 2051 in parallel with the data wire 203, dotted line circle
The first cabling 2061 and second place D in 231, as illustrated by arrows 5.It can be seen that in parallel with the data wire 203 first
Repair signal line 2051 can repair the short trouble of the data wire 203.Fig. 5 shows the local knot of the dotted line frame 230 in Fig. 2
Structure enlarged drawing.
The restorative procedure 300 for the array base palte that above-described embodiment of the application provides, by occur short circuit data wire or
Determine that short-circuit first position occurs in scan line, be then positioned at first really in the data wire of short circuit or scan line occurs
The second place and the 3rd position of the data wire or scan line are sent out in 3rd position of position both sides and the second place, finally melting,
The second place and the 3rd position are electrically connected into repair signal line corresponding with data wire or scan line that short circuit occurs, so as to realize
To the data wire of short circuit or the reparation of scan line occurs, the production yields of array base palte is improved.
Finally, the embodiment of the present application provides a kind of display panel 400, as shown in fig. 7, comprises the array in above-described embodiment
Substrate 410, and the 26S Proteasome Structure and Function of the array base palte 410 in display panel 400 is same as the previously described embodiments, it is no longer superfluous here
State.Display panel 400 in this implementation can be liquid crystal display panel, and now the display panel 400 is except that can include array
Outside substrate 410, color membrane substrates 420 can also be included；Or above-mentioned display panel 400 can also be organic electroluminescence display panel
Or electronic paper display panel etc., now the display panel 400, can also be including lid in addition to it can include array base palte 410
Plate 420.For the type of above-mentioned display panel 400, do not limit uniquely here.It will be appreciated by persons skilled in the art that
Above-mentioned display panel can also be applied to prepare various display devices, such as mobile phone, computer, TV, wearable intelligent equipment, electronics
Reader etc., will not enumerate here.
Above description is only the preferred embodiment of the application and the explanation to institute's application technology principle.People in the art
Member should be appreciated that invention scope involved in the application, however it is not limited to the technology that the particular combination of above-mentioned technical characteristic forms
Scheme, while should also cover in the case where not departing from the inventive concept, carried out by above-mentioned technical characteristic or its equivalent feature
The other technical schemes for being combined and being formed.Such as features described above has similar work(with (but not limited to) disclosed herein
The technical scheme that the technical characteristic of energy is replaced mutually and formed.
Claims (12)
- A kind of 1. array base palte, it is characterised in that including：Substrate, the pixel cell being arranged in array on the substrate, and data wire arranged in a crossed manner and scan line, its In, pixel cell described in each column electrically connects with a data line, and the pixel cell of often going electrically connects with a scan line；A plurality of repair signal line and a plurality of cabling, the every repair signal line pass through the cabling and the data wire or described Line parallel is scanned, the repair signal line is used to repair the institute when the data wire or scan line in parallel therewith break down State data wire or scan line.
- 2. array base palte according to claim 1, it is characterised in that a plurality of repair signal line is repaiied including a plurality of first Complex signal line, a plurality of cabling include a plurality of first cabling, and the every first repair signal line passes through first cabling With the data line parallel.
- 3. array base palte according to claim 2, it is characterised in that a plurality of repair signal line is repaiied including a plurality of second Complex signal line, a plurality of cabling include a plurality of second cabling, and the every second repair signal line passes through second cabling With the scanning line parallel.
- 4. array base palte according to claim 2, it is characterised in that the data line bit in adjacent column pixel cell it Between, and the first repair signal line is located between the pixel cell of adjacent column, the first repair signal line and the data Line is parallel.
- 5. array base palte according to claim 3, it is characterised in that the scan line be located at adjacent lines pixel cell it Between, and the second repair signal line is located between the pixel cell of adjacent lines, the second repair signal line and the scanning Line is parallel.
- 6. array base palte according to claim 4, it is characterised in that each described electrically connected with any data wire One cabling and each pixel cell electrically connected with data wire this described correspond；Each data wire passes through each first cabling being electrically connected and the first repair signal line parallel.
- 7. array base palte according to claim 5, it is characterised in that the second cabling electrically connected with any scan line Corresponded with each pixel cell electrically connected with scan line this described；Each scan line passes through each second cabling being electrically connected and the second repair signal line parallel.
- 8. array base palte according to claim 3, it is characterised in that orthographic projection of each second cabling to the substrate Do not overlapped to the substrate orthographic projection with the data wire, and orthographic projection of each second cabling to the substrate with it is each described The orthographic projection of first repair signal line does not overlap.
- 9. array base palte according to claim 3, it is characterised in that the array base palte also includes a plurality of and data Line common electrode signal line arranged in a crossed manner, each common electrode signal line are used for outputting common voltage signal；Orthographic projection of each first cabling to the substrate and the scan line, common electrode signal line and the second repair signal Orthographic projection of the line to the substrate does not overlap.
- 10. a kind of display panel, it is characterised in that including the array base palte as described in one of claim 1-9.
- A kind of 11. restorative procedure of array base palte, for repairing the array base palte as described in one of claim 1-9, its feature It is, including：Determine that short-circuit first position occurs in the first signal wire, wherein, first signal wire is the data that short circuit occurs Line or scan line；The second place in first signal wire and the 3rd position are fused respectively, wherein, the second place and described the Three positions are located at the both sides of the first position respectively.
- 12. restorative procedure according to claim 11, it is characterised in that between the first position and the second place In the absence of the cabling electrically connected with first signal wire；And between the first position and the 3rd position be not present with The cabling of the first signal wire electrical connection.
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