CN101655627B - Pixel array base plate with touch control function, repair method and plane display thereof - Google Patents
Pixel array base plate with touch control function, repair method and plane display thereof Download PDFInfo
- Publication number
- CN101655627B CN101655627B CN2009101739344A CN200910173934A CN101655627B CN 101655627 B CN101655627 B CN 101655627B CN 2009101739344 A CN2009101739344 A CN 2009101739344A CN 200910173934 A CN200910173934 A CN 200910173934A CN 101655627 B CN101655627 B CN 101655627B
- Authority
- CN
- China
- Prior art keywords
- induction
- conductive structure
- sensing element
- induction electrode
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Landscapes
- Position Input By Displaying (AREA)
Abstract
The invention discloses a pixel array base plate with a touch control function, comprising a plurality of scanning lines, a plurality of data lines, a plurality of pixel structures, a plurality of inductive signal lines and a plurality of groups of inductive structures, wherein each pixel structure is electrically connected with one corresponding scanning line and one corresponding data line; the inductive signal lines are arranged along the data lines; each group of inductive structures comprises an inductive element and a plurality of inductive electrodes; the inductive element is electrically connected with one corresponding inductive signal line and one corresponding scanning line and the inductive electrodes are electrically connected with the inductive element.
Description
Technical field
The invention relates to a kind of display panel, and particularly have the image element array substrates and the method for repairing and mending thereof of touch controllable function and a flat-panel screens with image element array substrates of this touch controllable function relevant for a kind of.
Background technology
In general touch control display panel design, the design concept classification with the touch-control sensing pattern is broadly divided into condenser type, resistance-type, photosensitizing type etc.; With the structural group constituent class, then can be divided into two kinds of external labeling type (Added type) and in-building types (integrated type).In to build electric resistance touch-control panel be to adopt to push the induction part that makes on the substrate that is positioned at contact panel and contact with induction electrode on being positioned at the subtend substrate, use the calculating sensed position.
Yet, in the manufacture process of contact panel, have particle contamination or other factors, cause that unusual short circuit is arranged between induction part and the induction electrode.Usually, influence the normal operation of contact panel, can make the signal of this touch point not read with the induction part that produces unusual short circuit and induction electrode electrical isolation or with the not activation of block (disable) of unusual short circuit for fear of above-mentioned unusual circuit defect.But this kind method can be sacrificed this touch point, and causes touch-control resolution (resolution) to reduce.
Summary of the invention
The present invention provides a kind of image element array substrates with touch controllable function, and its structure can provide flat-panel screens to reach can to repair and can not sacrifice the purpose of touch-control resolution.
The present invention proposes a kind of method for repairing and mending, and it can be repaired above-mentioned image element array substrates with touch controllable function.
The present invention provides a kind of flat-panel screens, the problem that the design of its induction structure can avoid the conventional repair method can cause the touch-control resolution to reduce.
The present invention proposes a kind of image element array substrates with touch controllable function again, and it comprises multi-strip scanning line, many data lines, a plurality of dot structure, many induced signal lines and organizes induction structure more.Each dot structure electrically connects with a corresponding wherein sweep trace and corresponding wherein data line.The induced signal line is along the data line setting.Each group induction structure comprises a sensing element and a plurality of induction electrode, and sensing element electrically connects with a corresponding wherein induced signal line and corresponding wherein sweep trace, and induction electrode and sensing element electrically connect; Each group induction structure also comprises a plurality of preparing structures, and preparing structure and the sensing element of this group in induction structure and corresponding induction electrode electric connection; Each preparing structure comprises: one first conductive structure, and the sensing element of itself and this group induction structure electrically connects; One second conductive structure, a wherein induction electrode of itself and this group induction structure electrically connects, and wherein first conductive structure and second conductive structure are electrically insulated; And a conductive layer, be positioned at the top or the below of first conductive structure and second conductive structure, and conductive layer electrically connects first conductive structure or second conductive structure.
The present invention proposes a kind of flat-panel screens, and it comprises the above-mentioned image element array substrates with touch controllable function, subtend substrate and the display medium between two substrates.The subtend substrate is positioned at the offside of the image element array substrates with touch controllable function, and comprises a plurality of induction parts on the subtend substrate, and at least one induction electrode on corresponding first substrate of each induction part is provided with.
The present invention proposes a kind of method for repairing and mending with image element array substrates of touch controllable function in addition; This image element array substrates with touch controllable function as stated; And at least one induction electrode in having the image element array substrates of touch controllable function is a defective induction electrode, and said method for repairing and mending comprises be electrically insulated said defective induction electrode and corresponding sensing element.Described each group induction structure more comprises a plurality of preparing structures, and each preparing structure comprises one first conductive structure, the described sensing element electric connection of its and this group induction structure; One second conductive structure, a wherein induction electrode of itself and this group induction structure electrically connects, and wherein said first conductive structure and described second conductive structure are electrically insulated; An and conductive layer; The position above described first conductive structure and described second conductive structure or below; And described conductive layer electrically connects described first conductive structure or described second conductive structure; After be electrically insulated described defective induction electrode and corresponding described sensing element if when finding that the described induction electrode of erroneous judgement is described defective induction electrode; Comprise that more described Hotfix comprises to carrying out a Hotfix at described induction electrode with described preparing structure between the corresponding described sensing element:
Electrically connect described first conductive structure and described second conductive structure.
Based on above-mentioned,, therefore when wherein an induction electrode has circuit defect, can this induction electrode and sensing element be electrically insulated because each induction structure of the present invention is to be made up of a sensing element and a plurality of induction electrode.Even this induction electrode and sensing element are electrically insulated, because of each sensing element and the electric connection of a plurality of induction electrode, so other induction electrodes still can provide normal inductive operation.Thereby contact panel of the present invention and method for repairing and mending can not sacrificed the touch-control resolution.
For letting the above-mentioned feature and advantage of the present invention can be more obviously understandable, the present invention be elaborated as follows below in conjunction with embodiment and accompanying drawing.
Description of drawings
Fig. 1 is the diagrammatic cross-section of contact panel according to an embodiment of the invention;
Fig. 2 is the partial schematic diagram of the image element array substrates of contact panel according to an embodiment of the invention;
Fig. 3 A is the enlarged diagram of the regional A of corresponding diagram 2;
Fig. 3 B is the synoptic diagram of Hotfix;
Fig. 4 A is the diagrammatic cross-section of Fig. 3 A along A-A ' and B-B ';
Fig. 4 B is the diagrammatic cross-section of Fig. 3 B along A-A ' and B-B ';
Fig. 5 is the partial schematic diagram of the image element array substrates of contact panel according to an embodiment of the invention;
Fig. 6 A is the enlarged diagram of the regional A of corresponding diagram 5;
Fig. 6 B is the synoptic diagram of Hotfix;
Fig. 7 A is the diagrammatic cross-section of Fig. 6 A along A-A ' and B-B ';
Fig. 7 B is the diagrammatic cross-section of Fig. 6 B along A-A ' and B-B '.
The main element symbol description:
10: the first substrates
20: the second substrates
30: display medium
100: the pel array layer
101,200: substrate
102: dot structure
103: insulation course
102a: active member
102b: pixel electrode
104: sensing element
106a, 106b: induction electrode
110: induction structure
117,119: conductive structure
117a, 119a: lead extension
117b, 119b: induction electrode extension
120,130: preparing structure
120a, 130a, 120b, 130b: conductive structure
120c, 130c: conductive layer
140: protective seam
190: stack of layers
202: chromatic filter layer
204: electrode layer
206: the induction separation material
208: induction part
210: the main gap thing
G1, G2: gap
G: grid
S, S ': source electrode
D: drain electrode
SL: sweep trace
DL: data line
SSL: induced signal line
H1, H2, h, h1, h2, h3: contact hole
L, L ': lead
O: opening
A: zone
Embodiment
For making the object of the invention, technical scheme and advantage clearer, the embodiment of the invention is further elaborated below in conjunction with Figure of description.At this, illustrative examples of the present invention and explanation thereof are used to explain the present invention, but not as to qualification of the present invention.
Fig. 1 is the diagrammatic cross-section that has the flat-panel screens of touch controllable function according to an embodiment of the invention, and it for example is flat-panel screens such as mobile phone, PDA, digital still camera, navigational system, ATM panel, TV that the flat-panel screens in the present embodiment can be applied in one.Please with reference to Fig. 1, flat-panel screens comprises first substrate 10, second substrate 20 and the display medium 30 between first substrate 10 and second substrate 20.
Particularly, each induction part 208 on above-mentioned second substrate 20 is at least one the induction electrode 106a setting on corresponding first substrate 10.When carrying out touch control operation, induction part 208 can be pressed down and electrically contact with induction electrode 106a generation, and then learns the position of touch-control.Therefore, do not carry out touch control operation when as yet, if unusual short circuit condition is arranged, will influence the normal operation of contact panel between induction part 208 and the induction electrode 106a.Influence the normal operation of contact panel for fear of between induction part 208 and the induction electrode 106a unusual short circuit being arranged, the present invention is to first substrate 10, and just image element array substrates is done special design, specifies as follows.
Fig. 2 is the partial schematic diagram of the image element array substrates of contact panel according to an embodiment of the invention.Please earlier with reference to Fig. 2, the image element array substrates 10 of the contact panel of present embodiment comprises multi-strip scanning line SL, many data line DL, a plurality of dot structure 102, many induced signal line S SL and organizes induction structure 110 more.
Each dot structure 102 electrically connects with a corresponding wherein sweep trace SL and corresponding wherein data line DL.More detailed, each dot structure 102 comprises active member 102a and the pixel electrode 102b that electrically connects with active member 102a.Active member 102a and pixel electrode 102b see through contact hole h to electrically connect.Active member 102a for example is a membrane transistor, and it comprises grid, source electrode and drain electrode, and grid and sweep trace SL electrically connect, and source electrode electrically connects with data line DL and pixel electrode 102b respectively with drain electrode.Active member 102a can be top grid type membrane transistor or bottom grid film electric crystal.Pixel electrode 102b can be transparent pixels electrode, reflective pixel electrode or semi-penetration, semi-reflective pixel electrode.
In one embodiment, induced signal line SSL panel data line DL is provided with.Induced signal line SSL can define with data line DL simultaneously, so the material of induced signal line S SL can be identical with data line DL, and belongs to same rete with data line DL.
In addition, each group induction structure 110 comprises a sensing element 104 and a plurality of induction electrode 106a, 106b.Be to be that one group of induction structure 110 is that example is explained in the present embodiment with a sensing element 104 and two induction electrode 106a, 106b.But the invention is not restricted to this, in other embodiment, each group induction structure can also be made up of a sensing element and plural induction electrode.
More detailed, sensing element 104 electrically connects with a corresponding wherein induced signal line SSL and corresponding wherein sweep trace SL.Sensing element 104 for example is a membrane transistor, and it comprises grid G, source S and drain D.The grid G of sensing element 104 and sweep trace SL electrically connect.The source S of sensing element 104 or drain D and induced signal line S SL electrically connect.In order to clearly demonstrate, present embodiment graphic is that to electrically connect with the drain D of sensing element and induced signal line SSL be that example is explained.
Induction electrode 106a, induction electrode 106b and sensing element 104 electrically connect.More detailed, the source S of induction electrode 106a, induction electrode 106b and sensing element 104 or drain D electrically connect.In order to clearly demonstrate, present embodiment graphic is that the source S with induction electrode 106a, induction electrode 106b and sensing element 104 is that example is explained.Further, each group induction structure 110 more comprises conductive structure 117, conductive structure 119 and at least one contact hole H1, contact hole H2, in order to electrically connect induction electrode 106a, the source S of induction electrode 106b and sensing element 104.In preferred embodiment, each induction structure 110 comprises a lead L, and lead L is connected with the source S of sensing element 104, and lead L also electrically connects with conductive structure 117,119 and contact hole H1, contact hole H2.Further; Conductive structure 117 mainly is made up of lead extension 117a and induction electrode extension 117b; Lead extension 117a and induction electrode extension 117b overlap, and contact hole H1 electrically connects lead extension 117a and induction electrode extension 117b.Conductor structure 119 mainly is made up of lead extension 119a and induction electrode extension 119b, and lead extension 119a and induction electrode extension 119b overlap, and contact hole H2 electrically connects lead extension 119a and induction electrode extension 119b.Therefore, through lead L, conductive structure 117, conductive structure 119 and contact hole H1, contact hole H2 sensing element 104 and induction electrode 106a, induction electrode 106b are electrically connected.
In addition; According to one embodiment of the invention; Above-mentioned each group induction structure 110 also comprises a plurality of preparing structure 120, preparing structure 130, and preparing structure 120, preparing structure 130 and sensing element 104 and induction electrode 106a, induction electrode 106b electrically connect.
More detailed, preparing structure 120 comprises the first conductive structure 120a, the second conductive structure 120b and conductive layer 120c.The source S of the first conductive structure 120a and sensing element 104 electrically connects.The second conductive structure 120b and induction electrode 106b electrically connect.In the present embodiment, the second conductive structure 120b is by conductive structure 117 and contact hole H2 and electrically connect with induction electrode 106b.Particularly, the first conductive structure 120a and the second conductive structure 120b are electrically insulated each other.Conductive layer 120c position is above the first conductive structure 120a and the second conductive structure 120b, and conductive layer 120a electrically connects the first conductive structure 120a or the second conductive structure 120b.Present embodiment graphic is to electrically connect with the first conductive structure 120a by contact hole h1 with conductive layer 120a, and conductive layer 120c and the second conductive structure 120b are electrically insulated and explain for example.In other embodiment, also can be that the conductive layer 120c and the second conductive structure 120b electrically connect, and conductive layer 120c and the first conductive structure 120a be electrically insulated.
Preparing structure 130 comprises the first conductive structure 130a, the second conductive structure 130b and conductive layer 130c.The source S of the first conductive structure 130a and sensing element 104 electrically connects.The second conductive structure 130b and induction electrode 106a electrically connect.In the present embodiment, the second conductive structure 130b is by conductive structure 119 and contact hole H1 and electrically connect with induction electrode 106a.Particularly, the first conductive structure 130a and the second conductive structure 130b are electrically insulated each other.Conductive layer 130c position is above the first conductive structure 130a and the second conductive structure 130b, and conductive layer 130c electrically connects the first conductive structure 130a or the second conductive structure 130b.Present embodiment graphic is to electrically connect with the first conductive structure 130a by contact hole h2 with conductive layer 130a, and conductive layer 130a and the second conductive structure 130b are electrically insulated and explain for example.In other embodiment, also can be that the conductive layer 130c and the second conductive structure 130b electrically connect, and conductive layer 130c and the first conductive structure 130a be electrically insulated.
In order more to specify preparing structure of the present invention, below further specify with preparing structure 120.Because the design of preparing structure 120 and the design of preparing structure 130 are same or similar, therefore, these those skilled in the art can be known the design of understanding preparing structure 130 by the explanation of following preparing structure 120.
Fig. 3 A is the enlarged diagram of the regional A of corresponding diagram 2, and Fig. 4 A is the diagrammatic cross-section of Fig. 3 A along A-A ' and B-B '.Please be simultaneously with reference to Fig. 3 A and 4A.Preparing structure 120 is arranged on the substrate 101, and has been coated with a layer insulating 103 on the substrate 101.The first conductive structure 120a and the second conductive structure 120b of preparing structure 120 are positioned on the insulation course 103.The first conductive structure 120a and second conductive structure 120b top are coated with layer protective layer 140 in addition, wherein have contact hole h1 in the protective seam 140.In addition, conductive layer 120c is positioned on the protective seam 140, and conductive layer 120c electrically connects by contact hole h1 and the first conductive structure 120a, and conductive layer 120c and the second conductive structure 120b are electrically insulated.Explanation is once more, in other embodiments, also can be that the conductive layer 120c and the first conductive structure 120a are electrically insulated, and conductive layer 120c and the electrical electricity of the second conductive structure 120b connect.In addition, lead L is between protective seam 140 and insulation course 103.
The present invention is when induction electrode has unusual short circuit phenomenon in the purpose of induction structure design preparing structure further, can repair this induction electrode, so that the unlikely normal operation that influences contact panel of the induction electrode of unusual short circuit is arranged.Therefore, when the induction electrode 106a among Fig. 2 or induction electrode 106b have unusual short circuit phenomenon, judge that promptly described induction electrode is the defective induction electrode.Influence the normal operation of contact panel for fear of this defective induction electrode, the present invention can carry out following Hotfix.
For clearly explanation, below explanation is to suppose that induction electrode 106b is that the defective induction electrode is that example is explained.When detecting induction electrode 106b abnormal occurrence takes place, this abnormal occurrence for example is to have foreign matter to cause electrode layer 204 short circuits, the induction electrode 106b of induction electrode 106b and second substrate 20 on the induction electrode 106b and signal wire DL on every side is short-circuited or other may cause the unusual defective of induced signal.The mode that repair this moment promptly is that defective induction electrode 106b and sensing element 104 are electrically insulated.In one embodiment, the mode that defective induction electrode 106b and sensing element 104 is electrically insulated comprises that carrying out a laser blows (LASER cut) program.Fig. 3 B is the synoptic diagram of Hotfix, and Fig. 4 B is the diagrammatic cross-section of Fig. 3 B along A-A ' and B-B '.Please with reference to Fig. 3 B and Fig. 4 B, the mode that defective induction electrode 106b and sensing element 104 are electrically insulated for example is to blow program to carrying out laser in order to the lead L that electrically connects sensing element 104 and induction electrode 106b, makes and forms opening O among the lead L.Thus, defective induction electrode 106b and sensing element 104 open circuit.In other words, the electric signal that produced of this defective induction electrode 106b will can not be delivered to sensing element 104 and induced signal line SSL.
It should be noted that; Because induction structure of the present invention is to be made up of with a plurality of induction electrode 106a, 106b a sensing element 104; Even therefore after repairing, defective induction electrode 106b and sensing element 104 are electrically insulated, but another induction electrode 106a still can normally carry out touch control operation.Therefore, the present invention can not sacrifice the touch-control resolution because of the existence of defectiveness induction electrode.
In addition; If the abnormal occurrence that induction electrode 106b is taken place for example is that induction electrode 106b and sensing element 104 open circuit, the conductive structure 117 of regional A the inside or lead L film resistance is excessive or blow program and make after induction electrode 106b and sensing element 104 be electrically insulated in carrying out above-mentioned laser; When finding that erroneous judgement induction electrode 106b is the defective induction electrode, the present invention can also further carry out a Hotfix to the preparing structure between induction electrode 106b and sensing element 104 120.Said Hotfix is the first conductive structure 120a and the second conductive structure 120b that electrically connects preparing structure 120.That is to say, electrically connect, sensing element 104 and induction electrode 106b are electrically connected by the first conductive structure 120a that makes preparing structure 120 and the second conductive structure 120b.Please with reference to Fig. 3 B and Fig. 4 B, this Hotfix promptly is that the second conductive structure 120b and conductive layer 120c are carried out a laser welding (LASER welding) program, forms contact hole h3 in the second conductive structure 120b and conductive layer 120c.Thus, just can see through conductive layer 120c and contact hole h1, h3 between the first conductive structure 120a and the second conductive structure 120b and be electrically connected to each other.Because the first conductive structure 120a and sensing element 104 electrically connect; And the second conducting element 120b and induction electrode 106b electrically connect, and therefore by electrically connecting the first conductive structure 120a and the second conductive structure 102b sensing element 104 and induction electrode 106b are electrically connected once again.
The foregoing description is to be that example is explained so that induction electrode 106b is repaired.If when induction electrode 106a had unusual short circuit problem, its method for repairing and mending was with identical to the method for repairing and mending of induction electrode 106b.These those skilled in the art should know the method for repairing and mending of understanding to induction electrode 106a after the method for repairing and mending of understanding induction electrode 106b.In addition, in the present embodiment, the design of preparing structure 120 is to electrically connect with the first conductive structure 120a and conductive layer 120c, and the second conductive structure 120b and conductive layer 120c are electrically insulated.And after carrying out Hotfix, the second conductive structure 120b just electrically connects with conductive layer 120c.So, in other embodiment, the design of preparing structure 120 can also be that the second conductive structure 120b and conductive layer 120c electrically connect, and the first conductive structure 120a and conductive layer 120c are electrically insulated.And after carrying out Hotfix, the first conductive structure 120a just electrically connects with conductive layer 120c.
The embodiment of above-mentioned Fig. 2 is induction electrode 106a, and induction electrode 106b is different retes with the source S of lead L and sensing element 104.In other embodiment, can also the source electrode of induction electrode and lead and sensing element be designed to same rete.As shown in Figure 5, the structure of Fig. 5 and the structural similarity of Fig. 2, difference is the source S of lead L ' and sensing element 104 ' belong to same rete, and the drain D of sensing element 104 and induced signal line S SL belong to same rete.Further, each induction structure 110 more comprises at least one conductive structure 121, conductive structure 123; Conductive structure 121; Conductive structure 123 1 ends connect with the lead L ' of the source electrode D that is connected sensing element 104, and the other end and induction electrode 106a, and induction electrode 106b connects.
In addition, the structure difference of the structure of Fig. 5 and Fig. 2 also comprises preparing structure 120, the design of preparing structure 130.Fig. 6 A is the enlarged diagram of the regional A of corresponding diagram 5, and Fig. 7 A is the diagrammatic cross-section of Fig. 6 A along A-A ' and B-B '.Please be simultaneously with reference to Fig. 6 A and Fig. 7 A.Preparing structure 120 is arranged on the substrate 101, and has been coated with a layer insulating 103 on the substrate 101.The conductive layer 120c of preparing structure 120 is positioned on the insulation course 103.Conductive layer 120c top is coated with layer protective layer 140 in addition, wherein has contact hole h1 in the protective seam 140.The first conductive structure 120a and the second conductive structure 120b are positioned on the protective seam 140, and the first conductive structure 120a is by contact hole h1 conductive layer 120c and electric connection, and the second conductive structure 120b and conductive layer 120c are electrically insulated.Explanation is once more, in other embodiments, also can be that the first conductive structure 120a and conductive layer 120c are electrically insulated, and the second conductive structure 120b and the electrical electricity of conductive layer 120c connect.In addition, lead L is positioned on the protective seam 140.
When induction electrode has unusual short circuit phenomenon, can repair this induction electrode, so that the unlikely normal operation that influences contact panel of the induction electrode of unusual short circuit is arranged.Therefore, when the induction electrode 106a among Fig. 5 or induction electrode 106b have unusual short circuit phenomenon, judge that promptly described induction electrode is the defective induction electrode.Influence the normal operation of contact panel for fear of this defective induction electrode, the present invention can carry out following Hotfix.
For clearly explanation, below explanation is to suppose that induction electrode 106b is that the defective induction electrode is that example is explained.When detecting induction electrode 106b unusual short circuit phenomenon is arranged, the mode that repair this moment promptly is that defective induction electrode 106b and sensing element 104 are electrically insulated.In one embodiment, the mode that defective induction electrode 106b and sensing element 104 is electrically insulated comprises that carrying out a laser blows (LASER cut) program.Fig. 6 B is the synoptic diagram of Hotfix, and Fig. 7 B is the diagrammatic cross-section of Fig. 6 B along A-A ' and B-B '.Please with reference to Fig. 6 B and Fig. 7 B, the mode that defective induction electrode 106b and sensing element 104 are electrically insulated for example is to blow program to carrying out laser in order to the lead L that electrically connects sensing element 104 and induction electrode 106b, in lead L, to form opening O.Thus, defective induction electrode 106b does not promptly have the relation of electric connection with sensing element 104.In other words, the electric signal that produced of this defective induction electrode 106b will can not be delivered to sensing element 104 and read with induced signal line SSL.
It should be noted that; Because induction structure of the present invention is by a sensing element 104 and a plurality of induction electrode 106a; Induction electrode 106b constitutes; Even therefore through repairing induction electrode 106b and sensing element 104 are electrically insulated, right induction electrode 106a still can normally carry out touch control operation.Therefore, the present invention can not sacrifice the touch-control resolution because of the existence of defectiveness induction electrode.
In addition; Above-mentioned laser blows program so that after induction electrode 106b and sensing element 104 are electrically insulated in carrying out; If when finding that erroneous judgement induction electrode 106b is the defective induction electrode, the present invention can further carry out a Hotfix to the preparing structure between induction electrode 106b and sensing element 104 120.Said Hotfix is the first conductive structure 120a and the second conductive structure 120b that electrically connects preparing structure 120.That is to say, electrically connect, sensing element 104 and induction electrode 106b are electrically connected by the first conductive structure 120a that makes preparing structure 120 and the second conductive structure 120b.Please with reference to Fig. 6 B and Fig. 7 B, this Hotfix promptly is that the conductive layer 120c and the second conductive structure 120b are carried out a laser welding (LASER welding) program, between the second conductive structure 120b and conductive layer 120c, to form contact hole h3.Thus, just can see through conductive layer 120c and contact hole h1, contact hole h3 between the first conductive structure 120a and the second conductive structure 120b and be electrically connected to each other.Because the first conductive structure 120a and sensing element 104 electrically connect; And the second conducting element 120b and induction electrode 106b electrically connect, and therefore by electrically connecting the first conductive structure 120a and the second conductive structure 102b sensing element 104 and induction electrode 106b are electrically connected once again.
The embodiment of above-mentioned Fig. 5 is the source S with sensing element 104 ' with lead L ' and induction electrode 106a, 106b is same rete, and the drain D of sensing element 104 and induced signal line SSL are that same rete is that example is explained.In other embodiment, can also make drain D, the source S of sensing element 104 ', induced signal line SSL, lead L ' and induction electrode 106a, 106b is all same rete.
Based on above-mentioned,, therefore when wherein an induction electrode has circuit defect, can this induction electrode and sensing element be electrically insulated because each induction structure of the present invention is to be made up of a sensing element and a plurality of induction electrode.Even this induction electrode and sensing element are electrically insulated, because of each sensing element and the electric connection of a plurality of induction electrode, so other induction electrodes still can provide normal inductive operation.Thereby contact panel of the present invention and method for repairing and mending can not sacrificed the touch-control resolution.In addition, when the preparing structure that the present invention designed can remedy erroneous judgement defective induction electrode, can make misjudged induction electrode can recover normal inductive operation again.
Though the present invention discloses as above with embodiment; Right its is not in order to limit the present invention; Has common knowledge the knowledgeable in the technical field under any; Do not breaking away from the spirit and scope of the present invention, when doing a little change and retouching, so protection scope of the present invention is as the criterion when looking accompanying the claim person of defining.
Claims (11)
1. the image element array substrates with touch controllable function is characterized in that, described image element array substrates comprises:
Multi-strip scanning line and many data lines;
A plurality of dot structures, each dot structure electrically connects with a corresponding wherein sweep trace and corresponding wherein data line;
Many induced signal lines, it is along described data line setting;
Many group induction structures, each group induction structure comprises:
One sensing element, it electrically connects with a corresponding wherein induced signal line and corresponding wherein sweep trace; And
A plurality of induction electrodes electrically connect with described sensing element;
Described each group induction structure also comprises a plurality of preparing structures, and described preparing structure and the described sensing element of this group in induction structure and corresponding described induction electrode electric connection;
Described each preparing structure comprises:
One first conductive structure, the described sensing element of itself and this group induction structure electrically connects;
One second conductive structure, a wherein induction electrode of itself and this group induction structure electrically connects, and wherein said first conductive structure and described second conductive structure are electrically insulated; And
One conductive layer be positioned at the top or the below of described first conductive structure and described second conductive structure, and described conductive layer electrically connects described first conductive structure or described second conductive structure.
2. the image element array substrates that touch controllable function is arranged as claimed in claim 1; It is characterized in that; In described each group induction structure, described sensing element comprises a grid, one source pole and a drain electrode, and described grid electrically connects with corresponding described sweep trace; Described source electrode and those induction electrodes electrically connect; Described drain electrode electrically connects with corresponding described induced signal line, and perhaps described drain electrode and those induction electrodes electrically connect, and described source electrode electrically connects with corresponding described induced signal line.
3. the image element array substrates that touch controllable function is arranged as claimed in claim 2 is characterized in that, described each group induction structure comprises one the 3rd conductive structure and at least one contact hole, in order to electrically connect the described source electrode or the drain electrode of described sensing element.
4. the image element array substrates that touch controllable function is arranged as claimed in claim 2 is characterized in that, described each group induction structure comprises one the 4th conductive structure, belongs to same rete with the described source electrode and the described drain electrode of described sensing element.
5. the image element array substrates that touch controllable function is arranged as claimed in claim 4 is characterized in that, described preparing structure sees through described second conductive structure and described sensing element electrically connects.
6. the image element array substrates that touch controllable function is arranged as claimed in claim 2 is characterized in that, the source electrode of described sensing element or drain electrode are to belong to same rete with corresponding described induced signal line.
7. the image element array substrates that touch controllable function is arranged as claimed in claim 2 is characterized in that, described induction electrode sees through described conductive layer and described source electrode or drain electrode and electrically connects.
8. a flat-panel screens is characterized in that, described flat-panel screens comprises:
One image element array substrates with touch controllable function as claimed in claim 1;
One subtend substrate is positioned at the offside of described image element array substrates, comprises a plurality of induction parts on the wherein said subtend substrate, at least one the described induction electrode setting on the corresponding described image element array substrates of each induction part; And
One display medium is between described image element array substrates and described subtend substrate.
9. method for repairing and mending with image element array substrates of touch controllable function; Said image element array substrates according to claim 1; And at least one described induction electrode in described image element array substrates is a defective induction electrode, it is characterized in that, described method for repairing and mending comprises:
Described defective induction electrode and corresponding described sensing element are electrically insulated;
Described each group induction structure more comprises a plurality of preparing structures, and each preparing structure comprises one first conductive structure, the described sensing element electric connection of its and this group induction structure; One second conductive structure, a wherein induction electrode of itself and this group induction structure electrically connects, and wherein said first conductive structure and described second conductive structure are electrically insulated; And a conductive layer, the position above described first conductive structure and described second conductive structure or below, and described conductive layer electrically connects described first conductive structure or described second conductive structure,
After be electrically insulated described defective induction electrode and corresponding described sensing element if when finding that the described induction electrode of erroneous judgement is described defective induction electrode; Comprise that more described Hotfix comprises to carrying out a Hotfix at described induction electrode with described preparing structure between the corresponding described sensing element:
Electrically connect described first conductive structure and described second conductive structure.
10. method for repairing and mending as claimed in claim 9 is characterized in that, the described described defective induction electrode that is electrically insulated comprises that with corresponding described sensing element use one laser blows.
11. method for repairing and mending as claimed in claim 9; It is characterized in that the method system of described first conductive structure of described electric connection and described second conductive structure is by the described conductive layer of laser welding and described first conductive structure or described conductive layer of laser welding and described second conductive structure.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101739344A CN101655627B (en) | 2009-09-17 | 2009-09-17 | Pixel array base plate with touch control function, repair method and plane display thereof |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101739344A CN101655627B (en) | 2009-09-17 | 2009-09-17 | Pixel array base plate with touch control function, repair method and plane display thereof |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101655627A CN101655627A (en) | 2010-02-24 |
| CN101655627B true CN101655627B (en) | 2012-07-04 |
Family
ID=41709972
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN2009101739344A Expired - Fee Related CN101655627B (en) | 2009-09-17 | 2009-09-17 | Pixel array base plate with touch control function, repair method and plane display thereof |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN101655627B (en) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101840285B (en) * | 2010-05-04 | 2012-07-04 | 友达光电股份有限公司 | Touch control device, touch control display panel and repairing method thereof |
| CN101887184B (en) * | 2010-07-02 | 2011-11-16 | 友达光电股份有限公司 | Pixel array and display panel comprising same |
| TWM454587U (en) * | 2012-09-14 | 2013-06-01 | Inv Element Inc | With use of a metal line is connected to the touch sensing layer electrode embedded touch display panel system |
| CN104461147B (en) * | 2014-12-12 | 2017-05-17 | 深圳市华星光电技术有限公司 | Display panel and method for repairing same |
| CN106817451B (en) | 2017-02-23 | 2020-02-18 | 京东方科技集团股份有限公司 | Mobile terminal touch display structure, manufacturing method thereof and mobile terminal |
| TWI639107B (en) * | 2017-12-18 | 2018-10-21 | 友達光電股份有限公司 | Touch array substrate |
| CN109164928A (en) * | 2018-06-29 | 2019-01-08 | 武汉华星光电技术有限公司 | Touch-control display panel and its driving method, touch control display apparatus |
-
2009
- 2009-09-17 CN CN2009101739344A patent/CN101655627B/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| CN101655627A (en) | 2010-02-24 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101655627B (en) | Pixel array base plate with touch control function, repair method and plane display thereof | |
| US11563071B2 (en) | Display panel, manufacturing method and detecting method thereof, and display device | |
| CN101295717B (en) | Thin-film transistor panel and its production method | |
| KR100338830B1 (en) | Collective substrate of active-matrix substrates, manufacturing method thereof and inspecting method thereof | |
| CN102012593B (en) | array substrate of liquid crystal display device | |
| CN104461147B (en) | Display panel and method for repairing same | |
| CN109752421A (en) | Display panel and display device | |
| CN102122478B (en) | Display, detection system and detection method for junction impedance thereof | |
| CN110416270B (en) | OLED display panel, detection method thereof and display device | |
| CN101216643A (en) | LCD device array substrate, its mending method and LCD device | |
| TW201205172A (en) | Display panel and method of repairing signal lines thereof | |
| JP2007226176A (en) | Thin-film transistor array substrate and electronic ink display device | |
| CN106023865A (en) | Screen module, electronic equipment and micro-crack detection method for screen module | |
| CN107656386A (en) | Array substrate, repairing method and display panel | |
| CN102262469A (en) | Touch sensing panel, touch sensing display panel and manufacturing method of touch sensing panel | |
| US20060050194A1 (en) | Display substrate and method of manufacturing the same | |
| CN101673017B (en) | Active component array substrate and manufacturing method thereof | |
| CN108873529B (en) | Array substrate, repairing method thereof and display panel | |
| CN108920009B (en) | Touch display screen, display device and repairing method thereof | |
| US11169648B2 (en) | Touch electrode, touch display panel, and touch display device | |
| CN101846828B (en) | Active component array substrate and liquid crystal display panel | |
| CN112382207B (en) | Pixel array substrate | |
| CN205787501U (en) | Liquid crystal display panel and display device | |
| CN101309550B (en) | Circuit board and electronic device applying the same | |
| CN104485337A (en) | Thin film transistor array substrate and preparation method of thin film transistor array substrate |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20120704 Termination date: 20200917 |
|
| CF01 | Termination of patent right due to non-payment of annual fee |