CN107643614B - Display panel testing method and system - Google Patents
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- CN107643614B CN107643614B CN201710834337.6A CN201710834337A CN107643614B CN 107643614 B CN107643614 B CN 107643614B CN 201710834337 A CN201710834337 A CN 201710834337A CN 107643614 B CN107643614 B CN 107643614B
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Abstract
The invention provides a display panel testing method and a system, wherein the method comprises the following steps: the method comprises the steps that a plurality of leads of a lead area are in short circuit connection through a first conductive component, a first test signal is loaded to the leads, each probe of a second conductive component is electrically connected with one of the leads, a second test signal is loaded to the electrically connected lead, a measuring device accurately identifies a target poor area of a display panel according to a first display image of the display panel when the first test signal is loaded, and the coordinate of the target poor area is determined according to the probe loading the second test signal to the target poor area, so that the detection accuracy of the poor area is improved, and meanwhile the specific position of the poor area can be obtained.
Description
Technical Field
The invention relates to the technical field of liquid crystal display, in particular to a display panel testing method and system.
Background
After the Cutting and involution processes are completed, the liquid crystal display panel needs to be tested (CellTest) to determine whether the defects exist, and then the Module process flow can be entered. In the prior art, the CellTest generally adopts two modes.
One of the methods is a short-circuit method, which requires a short-circuit Bar (Shorting Bar) as shown in fig. 1 to short the lead in the lead region, but this method cannot determine the specific position of the defect, and on the other hand, requires extra cutting (Trimming) after the test to remove the Shorting Bar in fig. 1, which is complicated in process. The other method is a Full Contact method (Full Contact), but this method is prone to false defects due to a positional deviation between the probe and the lead, and the detection accuracy is low.
Therefore, the two detection modes in the prior art both have defects, so that the display panel in the prior art has poor test effect and low detection efficiency.
Disclosure of Invention
The present invention is directed to solving, at least to some extent, one of the technical problems in the related art.
Therefore, the invention provides a display panel testing system, which is used for obtaining the specific position of the bad area while improving the detection accuracy of the bad area, avoiding extra process steps and improving the detection efficiency of the display panel.
The invention provides a display panel testing method.
To achieve the above object, an embodiment of a first aspect of the present invention provides a display panel testing system, including:
the measuring device comprises a first conductive component, a second conductive component, a transmission mechanism fixedly connected with the first conductive component and the second conductive component respectively, and a measuring device connected with the transmission mechanism;
when the first conductive part is driven by the transmission mechanism to be in contact with a lead wire area of the display panel, the first conductive part is in short circuit with a plurality of lead wires of the lead wire area, and first test signals are loaded to the plurality of lead wires;
the second conductive part comprises a plurality of probes, when the second conductive part is driven by the transmission mechanism to be in contact with the lead wire area of the display panel, each probe in the second conductive part is electrically connected with one lead wire in the plurality of lead wires, and a second test signal is loaded to the electrically connected lead wires;
the measuring equipment is used for determining a target poor area of the display panel according to a first display image of the display panel when the first test signal is loaded; and determining the coordinates of the target bad area according to the probe which loads the second test signal to the target bad area.
According to the display panel testing system, the first conducting part is used for short-circuiting the leads of the lead area, the first testing signals are loaded to the leads, each probe in the second conducting part is electrically connected with one lead in the leads, the second testing signals are loaded to the electrically connected leads, the measuring equipment is used for accurately identifying the target poor area of the display panel according to the first display image of the display panel when the first testing signals are loaded, and the coordinates of the target poor area are determined according to the probe which loads the second testing signals to the target poor area, so that the detection accuracy of the poor area can be improved, and meanwhile, the specific position of the poor area can be obtained. In addition, the first conductive part and the second conductive part are fixedly connected to the transmission mechanism and can be driven by the transmission mechanism to be in contact with the lead area of the display panel, so that the additional process step caused by short-circuiting the leads in a Shorting Bar mode in the prior art is avoided.
To achieve the above object, a second aspect of the present invention provides a display panel testing method applied to the display panel testing system of the first aspect, including:
the first conductive member loads a first test signal to a plurality of leads of a lead region of the display panel;
the measuring equipment detects a target bad area of the display panel according to a first display image of the display panel when the first test signal is loaded;
when the target bad area is detected, the second conductive component loads a second test signal to the corresponding lead through the probe;
and determining the coordinates of the target bad area by the measuring equipment according to the probe for loading the second test signal to the target bad area.
According to the display panel testing method, the first conducting part is in short circuit with the multiple leads in the lead area, the first testing signals are loaded to the multiple leads, each probe in the second conducting part is electrically connected with one lead in the multiple leads, the second testing signals are loaded to the electrically connected leads, the measuring equipment is used for accurately identifying the target poor area of the display panel according to the first display image of the display panel when the first testing signals are loaded, and the coordinates of the target poor area are determined according to the probe which loads the second testing signals to the target poor area, so that the detection accuracy of the poor area can be improved, and meanwhile, the specific position of the poor area can be obtained. In addition, the first conductive part and the second conductive part are fixedly connected to the transmission mechanism and can be driven by the transmission mechanism to be in contact with the lead area of the display panel, so that the additional process step caused by short-circuiting the leads in a Shorting Bar mode in the prior art is avoided.
Additional aspects and advantages of the invention will be set forth in part in the description which follows and, in part, will be obvious from the description, or may be learned by practice of the invention.
Drawings
The foregoing and/or additional aspects and advantages of the present invention will become apparent and readily appreciated from the following description of the embodiments, taken in conjunction with the accompanying drawings of which:
FIG. 1 is a schematic diagram of a prior art shorting bar;
FIG. 2 is a schematic structural diagram of a display panel testing system according to an embodiment of the present invention;
FIG. 3A is a schematic diagram of a first display image;
FIG. 3B is a diagram illustrating a second display image;
FIG. 4A is a perspective view of first conductive component 10 and second conductive component 20;
FIG. 4B is a cross-sectional view of first conductive component 10 and second conductive component 20;
FIG. 4C is a schematic view of a test position for first conductive component 10 and second conductive component 20;
FIG. 5A is one of the schematic views showing the relative positional relationship between the first conductive member 10 and the second conductive member 20;
FIG. 5B is a second schematic view of the relative position of the first conductive member 10 and the second conductive member 20;
FIG. 6 is a flowchart illustrating a method for testing a display panel according to an embodiment of the present invention; and
fig. 7 is a schematic flowchart of another display panel testing method according to an embodiment of the present invention.
Detailed Description
Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings, wherein like or similar reference numerals refer to the same or similar elements or elements having the same or similar function throughout. The embodiments described below with reference to the drawings are illustrative and intended to be illustrative of the invention and are not to be construed as limiting the invention.
A display panel test method and system according to an embodiment of the present invention will be described below with reference to the accompanying drawings.
Fig. 2 is a schematic structural diagram of a display panel testing system according to an embodiment of the present invention.
As shown in fig. 2, the display panel test system includes: the measuring device comprises a first conductive component 10, a second conductive component 20, a transmission mechanism 30 fixedly connected with the first conductive component 10 and the second conductive component 20 respectively, and a measuring device 40 connected with the transmission mechanism 30.
When the first conductive member 10 is driven by the transmission mechanism 30 to contact with the lead area of the display panel, the first conductive member short-circuits the plurality of leads of the lead area, and loads a first test signal to the plurality of leads.
The second conductive member 20 includes a plurality of probes 21, and when the second conductive member 20 is driven by the transmission mechanism 30 to contact with the lead regions of the display panel, each of the probes 21 of the second conductive member is electrically connected to one of the plurality of leads, and loads a second test signal to the electrically connected lead.
A measuring device 40 for determining a target defective region of the display panel based on the first display image of the display panel when the first test signal is loaded; and determining the coordinates of the target bad area according to the probe which loads the second test signal to the target bad area.
Specifically, when the display panel is defective, neither the first test signal nor the second test signal can be applied to the display panel through the lead, so that the display panel presents a line corresponding to a defective area of the display panel. As shown in fig. 3A, the first display image is displayed on the display panel when the first test signal is applied, and as shown in fig. 3B, the second display image is displayed on the display panel when the second test signal is applied.
As can be seen from a comparison of the first display image and the second display image, the defective region appearing in the first display image is smaller than the defective region appearing in the second display image. This is because the second test signal applied to the probe 21 of the second conductive member 20 is likely to be misaligned (Pin Miss) due to the small size of the lead and the probe 21 when the second test signal is applied to obtain the second display image, and thus the probe 21 does not apply the second test signal to the lead, and thus the false failure occurs. In fig. 3B, this is the case for the defective area corresponding to the second line. However, since the first conductive member 10 is short-circuited all the leads, there is no such misalignment, and therefore, the defect identified by the first conductive member 10 is regarded as a true defect, that is, the aforementioned target defect region, and accordingly, a false defect represented in the second display image is recognized, and the accuracy of detecting the defect region is improved.
In this embodiment, the second conductive member 20 includes a plurality of probes 21, each probe 21 corresponds to a coordinate position in the second display image, and a user can read and obtain a position of the probe 21 corresponding to the target defective region by stopping the cursor at a position corresponding to the target defective region, so as to obtain a position coordinate of the defective region according to a lead connected to the probe 21.
Further, on the basis of the above embodiment, in the present embodiment, the first conductive member 10 and the second conductive member 20 are located on the same surface of the transmission mechanism 30 and are disposed oppositely. Thereby enabling the transmission mechanism 30 to synchronously move the first conductive member 10 and the second conductive member 20.
In order to clearly illustrate the structures of first conductive member 10 and second conductive member 20, fig. 4A is a perspective view of first conductive member 10 and second conductive member 20, while the present embodiment provides a cross-sectional view of first conductive member 10 and second conductive member 20 as shown in fig. 4B for illustrating the relative positional relationship therebetween.
As shown in fig. 4B, the first conductive member 10 includes a first contact surface for contacting the lead pad.
The probe 21 in the second conductive member 20 includes a second contact surface 22 for contacting the lead pad, and the second contact surface 22 protrudes from the first contact surface 12, so that when the second contact surface 22 contacts the lead pad as shown in fig. 4C, there is a gap between the first contact surface 12 and the lead pad.
Specifically, first, the transmission mechanism 30 synchronously drives the first conductive component 10 and the second conductive component 20 to move in a direction close to the lead area, so that both the first conductive component 10 and the second conductive component 20 are in contact with the lead area, and as shown in fig. 5A, the second contact surface 22 and the first contact surface 12 are at the same level. In the state shown in fig. 5A, the first conductive member 10 loads the lead with a first test signal.
Furthermore, before the second conductive component 20 applies the second test signal to the corresponding lead through the probe 21, the transmission mechanism 30 synchronously drives the first conductive component 10 and the second conductive component 20 to move in the direction away from the lead area, so that the second conductive component 20 is in contact with the lead area, and a gap exists between the first conductive component 10 and the lead area. As shown in fig. 5B, the second contact surface 22 and the first contact surface 12 are not in the same horizontal plane, but have a height difference of, for example, 50 μm. In the state shown in fig. 5B, the second conductive member 20 loads the lead with the second test signal.
In this embodiment, the second contact surface 22 protrudes from the first contact surface 12, and when the second test signal is applied, only the second contact surface 22 contacts the lead pad, so that the second test signal can be applied only by the second conductive member 20. When the first test signal is loaded, the first conductive part 10 and the second conductive part 20 are both in contact with the lead area, the first test signal can be loaded by the first conductive part 10 and the second conductive part 20 at the same time, and the situation that a small number of leads are not loaded with the first test signal due to dust is avoided. Specifically, when the first test signal is applied to the first conductive member 10 and the second conductive member 20 at the same time, even if the first test signal cannot be applied due to the dust particles clamped between the first contact surface 11 and the leads, the leads may be applied with the first test signal through the probe 21 of the second conductive member 20, so that it is ensured that each lead in the lead area may be applied with the first test signal, and the measured target defective area is a true defect, that is, a defect caused by a defect of the product itself.
According to the display panel testing system, the first conducting part 10 is used for short-circuiting a plurality of leads of the lead area, the first testing signals are loaded on the plurality of leads, each probe 21 in the second conducting part 20 is electrically connected with one lead in the plurality of leads, the second testing signals are loaded on the electrically connected leads, the measuring equipment 40 is used for accurately identifying the target poor area of the display panel according to the first display image of the display panel when the first testing signals are loaded, and the coordinates of the target poor area are determined according to the probe 21 which loads the second testing signals on the target poor area, so that the detection accuracy of the poor area can be improved, and meanwhile, the specific position of the poor area can be obtained. In addition, because the first conductive component 10 and the second conductive component 20 are fixedly connected to the transmission mechanism 30, they can be driven by the transmission mechanism 30 to contact with the lead area of the display panel, thereby avoiding the additional process step introduced by Shorting the leads in the Shorting Bar manner in the prior art.
To clearly illustrate the display panel testing system provided in the foregoing embodiment, an embodiment of the present invention provides a display panel testing method, fig. 6 is a schematic flow chart of the display panel testing method provided in the embodiment of the present invention, and as shown in fig. 6, the display panel testing method includes the following steps:
As one possible implementation, the second conductive member applies the first test signal to the plurality of leads while the first conductive member applies the first test signal to the plurality of leads of the lead region of the display panel.
Specifically, a transmission mechanism synchronously drives the first conductive component and the second conductive component to move along a direction close to the lead area, so that the first conductive component and the second conductive component are both in contact with the lead area. When the first conductive part and the second conductive part are loaded with the first test signal simultaneously, even if the situation that the first test signal cannot be loaded occurs due to the fact that dust particles are clamped between the first contact surface and the lead, the lead can be loaded with the first test signal through the probe of the second conductive part, and therefore it is guaranteed that each lead in the lead area can be loaded with the first test signal, and the measured target bad area is real bad, namely the bad due to the defects of the product.
Specifically, if the first test signal is loaded, the first display image includes an area that is not displayed according to the first test signal, and the measurement device determines that the display panel includes the target defective area.
Wherein each probe of the second conductive component is loaded with the same second test signal; alternatively, adjacent probes of the second wire member are loaded with a second test signal of opposite polarity. Generally speaking, in order to avoid passivation of the liquid crystal, a method of applying a second test signal with opposite polarity to adjacent probes of the second lead member is generally adopted, but whichever of the above two methods is adopted has no influence on the test result in the present embodiment.
Specifically, the transmission mechanism synchronously drives the first conductive component and the second conductive component to move along the direction far away from the lead area, so that the second conductive component is in contact with the lead area, and a gap exists between the first conductive component and the lead area.
Specifically, in order to determine a probe for loading a second test signal to a target poor area, a measurement device obtains a second display image of the display panel when the second test signal is loaded, and if the second display image includes an area which is not displayed according to the second test signal, the measurement device determines an area to be selected of the display panel according to the area which is not displayed according to the second test signal. And the measuring equipment compares the first display image with the second display image to determine the target poor area from the to-be-selected area, and then queries to obtain a probe for loading the second test signal to the target poor area.
As a possible implementation manner, when the measurement device queries the probe that loads the second test signal to the target defective region in step 601, the steps shown in fig. 7 may be specifically adopted, and fig. 7 is a schematic flow chart of another display panel test method provided in the embodiment of the present invention, as shown in fig. 7:
Therefore, the user can inquire the position of the target bad area only by moving the cursor position, the operation is simple and convenient, and meanwhile, the position of the target bad area can be read accurately by the mode, so that the display panel can be maintained conveniently in the later period.
In this embodiment, the first conductive component is used to short-circuit the plurality of leads in the lead area, and load the first test signal to the plurality of leads, and then each probe in the second conductive component is electrically connected to one of the plurality of leads, and load the second test signal to the electrically connected lead, and the measurement device is used to identify the target defective area of the display panel more accurately according to the first display image of the display panel when the first test signal is loaded, and determine the coordinates of the target defective area according to the probe loading the second test signal to the target defective area, so that the specific position of the defective area can be obtained while the detection accuracy of the defective area is improved. In addition, the first conductive part and the second conductive part are fixedly connected to the transmission mechanism and can be driven by the transmission mechanism to be in contact with the lead area of the display panel, so that the additional process step caused by short-circuiting the leads in a Shorting Bar mode in the prior art is avoided.
It should be noted that the foregoing explanation of the embodiment of the display panel testing system is also applicable to the display panel testing method of the embodiment, and is not repeated herein.
In order to implement the above embodiments, the present invention further provides a testing apparatus, including: a processor, and a memory for storing processor-executable instructions.
Wherein the processor is configured to:
the first conductive member loads a first test signal to a plurality of leads of a lead region of the display panel;
the measuring equipment detects a target bad area of the display panel according to a first display image of the display panel when the first test signal is loaded;
when the target bad area is detected, the second conductive component loads a second test signal to the corresponding lead through the probe;
and determining the coordinates of the target bad area by the measuring equipment according to the probe for loading the second test signal to the target bad area.
In order to implement the above embodiments, the present invention also proposes a computer-readable storage medium, in which instructions are executed by a processor, so that the processor can execute a display panel testing method, the method comprising:
the first conductive member loads a first test signal to a plurality of leads of a lead region of the display panel;
the measuring equipment detects a target bad area of the display panel according to a first display image of the display panel when the first test signal is loaded;
when the target bad area is detected, the second conductive component loads a second test signal to the corresponding lead through the probe;
and determining the coordinates of the target bad area by the measuring equipment according to the probe for loading the second test signal to the target bad area.
In the description herein, references to the description of the term "one embodiment," "some embodiments," "an example," "a specific example," or "some examples," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, the schematic representations of the terms used above are not necessarily intended to refer to the same embodiment or example. Furthermore, the particular features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples. Furthermore, various embodiments or examples and features of different embodiments or examples described in this specification can be combined and combined by one skilled in the art without contradiction.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In the description of the present invention, "a plurality" means at least two, e.g., two, three, etc., unless specifically limited otherwise.
Any process or method descriptions in flow charts or otherwise described herein may be understood as representing modules, segments, or portions of code which include one or more executable instructions for implementing steps of a custom logic function or process, and alternate implementations are included within the scope of the preferred embodiment of the present invention in which functions may be executed out of order from that shown or discussed, including substantially concurrently or in reverse order, depending on the functionality involved, as would be understood by those reasonably skilled in the art of the present invention.
The logic and/or steps represented in the flowcharts or otherwise described herein, e.g., an ordered listing of executable instructions that can be considered to implement logical functions, can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, processor-containing system, or other system that can fetch the instructions from the instruction execution system, apparatus, or device and execute the instructions. For the purposes of this description, a "computer-readable medium" can be any means that can contain, store, communicate, propagate, or transport the program for use by or in connection with the instruction execution system, apparatus, or device. More specific examples (a non-exhaustive list) of the computer-readable medium would include the following: an electrical connection (electronic device) having one or more wires, a portable computer diskette (magnetic device), a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disc read-only memory (CDROM). Additionally, the computer-readable medium could even be paper or another suitable medium upon which the program is printed, as the program can be electronically captured, via for instance optical scanning of the paper or other medium, then compiled, interpreted or otherwise processed in a suitable manner if necessary, and then stored in a computer memory.
It should be understood that portions of the present invention may be implemented in hardware, software, firmware, or a combination thereof. In the above embodiments, the various steps or methods may be implemented in software or firmware stored in memory and executed by a suitable instruction execution system. If implemented in hardware, as in another embodiment, any one or combination of the following techniques, which are known in the art, may be used: a discrete logic circuit having a logic gate circuit for implementing a logic function on a data signal, an application specific integrated circuit having an appropriate combinational logic gate circuit, a Programmable Gate Array (PGA), a Field Programmable Gate Array (FPGA), or the like.
It will be understood by those skilled in the art that all or part of the steps carried by the method for implementing the above embodiments may be implemented by hardware related to instructions of a program, which may be stored in a computer readable storage medium, and when the program is executed, the program includes one or a combination of the steps of the method embodiments.
In addition, functional units in the embodiments of the present invention may be integrated into one processing module, or each unit may exist alone physically, or two or more units are integrated into one module. The integrated module can be realized in a hardware mode, and can also be realized in a software functional module mode. The integrated module, if implemented in the form of a software functional module and sold or used as a stand-alone product, may also be stored in a computer readable storage medium.
The storage medium mentioned above may be a read-only memory, a magnetic or optical disk, etc. Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention, and that variations, modifications, substitutions and alterations can be made to the above embodiments by those of ordinary skill in the art within the scope of the present invention.
Claims (10)
1. A display panel testing system, comprising: the measuring device comprises a first conductive component, a second conductive component, a transmission mechanism fixedly connected with the first conductive component and the second conductive component respectively, and a measuring device connected with the transmission mechanism;
when the first conductive part is driven by the transmission mechanism to be in contact with a lead wire area of the display panel, the first conductive part is in short circuit with a plurality of lead wires of the lead wire area, and first test signals are loaded to the plurality of lead wires;
the second conductive part comprises a plurality of probes, when the second conductive part is driven by the transmission mechanism to be in contact with the lead wire area of the display panel, each probe in the second conductive part is electrically connected with one lead wire in the plurality of lead wires, and a second test signal is loaded to the electrically connected lead wires;
the measuring equipment is used for determining a target poor area of the display panel according to a first display image of the display panel when the first test signal is loaded; and determining the coordinates of the target bad area according to the probe which loads the second test signal to the target bad area.
2. The display panel test system according to claim 1,
the transmission mechanism is used for synchronously driving the first conductive part and the second conductive part to move;
the first conductive member includes a first contact surface for contacting the lead pad;
the probe in the second conductive component comprises a second contact surface used for being in contact with the lead pad, and the second contact surface protrudes out of the first contact surface, so that when the second contact surface is in contact with the lead pad, a gap exists between the first contact surface and the lead pad.
3. The display panel test system according to claim 1,
the first conductive part and the second conductive part are positioned on the same surface of the transmission mechanism and are oppositely arranged.
4. A display panel testing method applied to the display panel testing system according to any one of claims 1 to 3, comprising the steps of:
the first conductive component loads a first test signal to a plurality of leads of a lead area of the display panel;
the measuring equipment detects a target bad area of the display panel according to a first display image of the display panel when the first test signal is loaded;
when the target bad area is detected, the second conductive component loads a second test signal to the corresponding lead through the probe;
and determining the coordinates of the target bad area by the measuring equipment according to the probe for loading the second test signal to the target bad area.
5. The method according to claim 4, wherein the detecting, by the measuring device, a target defective region of the display panel based on a first display image of the display panel when the first test signal is applied comprises:
and if the first test signal is loaded, the first display image comprises an area which is not displayed according to the first test signal, and the measurement equipment determines that the display panel comprises the target bad area.
6. The method for testing a display panel according to claim 4, wherein after the second conductive member applies the second test signal to the corresponding lead through the probe, the method further comprises:
the measuring equipment acquires a second display image of the display panel when the second test signal is loaded;
if the second display image comprises an area which is not displayed according to the second test signal, the measuring equipment determines a to-be-selected area of the display panel according to the area which is not displayed according to the second test signal;
the measuring equipment compares the first display image with the second display image to determine the target poor area from the area to be selected;
and the measuring equipment inquires to obtain a probe for loading the second test signal to the target bad area.
7. The method for testing a display panel according to claim 6, wherein the querying of the measuring device for a probe loading the second test signal to the target defective region comprises:
the measuring equipment displays a test interface, and the second display image is displayed on the test interface;
the measuring equipment acquires a cursor position determined by a user; the cursor position is obtained when the user moves the cursor in the test interface and stops the cursor at the position corresponding to the target bad area;
and inquiring to obtain a probe for loading the second test signal to the target bad area according to the cursor position.
8. The method for testing a display panel according to any one of claims 4 to 7, further comprising:
when the first conductive member applies a first test signal to a plurality of leads of a lead region of a display panel, the second conductive member applies the first test signal to the plurality of leads.
9. The method for testing a display panel according to claim 8, wherein before the second conductive member applies the first test signal to the plurality of leads, the method further comprises:
the transmission mechanism synchronously drives the first conductive component and the second conductive component to move along the direction close to the lead area, so that the first conductive component and the second conductive component are both in contact with the lead area;
before the second conductive component loads the second test signal to the corresponding lead through the probe, the method further comprises the following steps:
the transmission mechanism synchronously drives the first conductive component and the second conductive component to move in a direction away from the lead area, so that the second conductive component is in contact with the lead area, and a gap exists between the first conductive component and the lead area.
10. The display panel testing method according to any one of claims 4 to 7,
each probe of the second conductive part is loaded with the same second test signal;
alternatively, adjacent probes of the second wire member are loaded with a second test signal of opposite polarity.
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| CN101364022A (en) * | 2008-09-12 | 2009-02-11 | 昆山龙腾光电有限公司 | Array substrate and defect detecting method thereof |
| CN104656292A (en) * | 2015-03-17 | 2015-05-27 | 京东方科技集团股份有限公司 | Array substrate and manufacturing method thereof, display panel and testing method thereof, and display device |
| CN106782248A (en) * | 2017-01-12 | 2017-05-31 | 京东方科技集团股份有限公司 | A kind of display panel testing and the method for display panel detection |
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| CN107643614A (en) | 2018-01-30 |
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