CN107543991A - For low tension switch and control device harmonic wave jamming immunity tester and test method - Google Patents
For low tension switch and control device harmonic wave jamming immunity tester and test method Download PDFInfo
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- CN107543991A CN107543991A CN201710848436.XA CN201710848436A CN107543991A CN 107543991 A CN107543991 A CN 107543991A CN 201710848436 A CN201710848436 A CN 201710848436A CN 107543991 A CN107543991 A CN 107543991A
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- 238000005259 measurement Methods 0.000 claims abstract description 17
- 238000011084 recovery Methods 0.000 claims abstract description 8
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Abstract
The invention discloses one kind to be used for low tension switch and control device harmonic wave jamming immunity tester and test method, and the experimental rig includes：Voltage acquisition module, for gathering AC sine wave from AC power and being converted into data signal；Control calculator, for receive from the voltage acquisition module as synchronizing signal data signal and voltage signal magnitude is calculated according to the data signal, simulate and recovery voltage waveform and control point be set on the voltage waveform；Full-control type copped wave module, the dominating pair of vertices AC sine wave for being set according to the control calculator carry out copped wave；Pressure regulator, for adjusting the AC power to the output voltage of the copped wave module；Measurement apparatus, for measuring test loop electric current and each harmonic component value；Using the limitation that high, the bulky experiment power supply of cost has been got around for low tension switch and control device harmonic wave jamming immunity tester of said structure, and parameter regulation is convenient.
Description
Technical field
The present invention relates to electrical equipment detection field, more particularly to one kind to be used for low tension switch and control device harmonic wave anti-interference
Spend experimental rig and test method.
Background technology
The standard of harmonic current test Main Basiss is in low voltage switch equipment and control device immunity experiment《GB
14048.2-2008 low voltage switch equipments and control device part 2：Breaker》.F.4 F.4.1 harmonic wave is electric in immunity experiment
Current test, it is therefore an objective to examine low voltage switch equipment and control device to resist the ability of various electric power network harassing and wrecking.
Harmonic current test request in low voltage switch equipment and control device immunity experiment：In test requirements document harmonic current
Under, the duration of false tripping immunity to interference should be 10 times of the drop-away time equivalent to two times of current settings, and (harmonic current has
Valid value maximum reaches 4000A, and the drop-away time scope of two times of current settings is 8 seconds to 270 seconds), wherein the harmonic source in experiment
Electric current is made up of, it is specified that as follows two half-waves equal in magnitude and opposite polarity in each cycle:
(1) the current lead-through time, it was≤21% cycle to half-wave；
(2) peak factor >=2.1 (peak factor is current peak divided by current wave virtual value)；
(3) test current is made up of fundamental wave and 3 times, 5 times and 7 order harmonic components, and harmonic components are at least fundametal compoment
Following ratio:
3 subharmonic ＞ 60%；
5 subharmonic ＞ 14%；
7 subharmonic ＞ 7%.
Harmonic current test mainly has two kinds of testing programs in low voltage switch equipment and control device immunity experiment at present,
One kind is to use programmable power supply is in parallel to be used as experiment power supply, and test loop electric current is improved by pressure regulator and current lifting device, another
Kind is to use multiple magnetic circuit transformer to carry out copped waves as experiment power supply by multiple high-power thyristors in parallel and be met experiment
The harmonic current of standard requirement.Above two scheme has the defects of respective, the former programmable power supply unit price 10W-20W it
Between, and power is relatively low, it is necessary to multiple used in parallel, cost is too high；The latter needs multipath magnetic circuit power supply as experiment power supply, if
Standby cost is high, volume is big, and test site is fixed, flexibility shortcoming, and IGCT is half control type device, and sine wave can be entered
Row band angle is closed a floodgate, but can only voluntarily be turned off by current over-zero, and sine wave can be selected wave band and be only limitted to half-wave final stage, profit
It is very low with rate.
The content of the invention
It is an object of the invention to provide one kind to be used for low tension switch and control device harmonic wave jamming immunity tester, to solve
The financial cost of low tension switch and control device harmonic wave jamming immunity tester is high, volume is big, using flexible is poor and utilization rate
The problem of low.
It is used for low tension switch and the examination of control device harmonic wave immunity to interference according to above-mentioned it is a further object of the present invention to provide one kind
The test method of experiment device, to solve, the financial cost of low tension switch and control device harmonic wave immunity experiment is high, volume is big, makes
The problem of with very flexible and low utilization rate.
To achieve these goals, the invention discloses one kind to be used for low tension switch and control device harmonic wave immunity experiment
Device, including：Voltage acquisition module, for gathering AC sine wave from AC power and being converted into data signal；Control meter
Calculate device, be electrically connected with the voltage acquisition module, for receive from the voltage acquisition module as synchronizing signal
Data signal simultaneously calculates voltage signal magnitude according to the data signal, simulates recovery voltage waveform and in the voltage waveform
Upper setting control point；Full-control type copped wave module, it is electrically connected with respectively with the AC power and the control calculator, for root
The dominating pair of vertices AC sine wave set according to the control calculator carries out copped wave, the output end and test sample of the copped wave module
Product are electrically connected with；Pressure regulator, it is electrically connected between the AC power and the copped wave module, for adjusting the alternating current
Output voltage of the source to the copped wave module；Measurement apparatus, it is electrically connected with the test specimen, for measuring test loop electricity
Stream and each harmonic component value.
Compared with prior art, the present invention be used for low tension switch and control device harmonic wave jamming immunity tester got around into
The limitation of this high, bulky experiment power supply, power supply needed for experiment are derived from power network distribution box, using full-control type copped wave module,
Test loop voltage signal is converted into digital quantity using voltage acquisition module to be sent into control calculator, by control calculator meter
Voltage signal magnitude is calculated, recovery voltage waveform is simulated, control point is set on voltage waveform, is reached with this and freely adjusts copped wave mould
The function of the copped wave point of block, the copped wave function to any one section of conventional sinusoidal ripple electric current is realized, it is convenient to adjust test current, peak value
The harmonic component of coefficient, test loop ON time and each harmonic components.
It is preferred that the output end of the copped wave module is electrically connected with by current lifting device and the test specimen, the up-flow
Device is used to the high voltage low current of copped wave module output being converted into low-voltage and high-current to act on the test specimen.
It is preferred that the copped wave module includes IGBT units and the IGBT drivers being electrically connected with the IGBT units.
It is preferred that the IGBT units include the igbt transistor of two two-way inverse parallel connections.
It is preferred that described be used for low tension switch and control device harmonic wave jamming immunity tester also including mono- with the IGBT
The buffer circuit that member is electrically connected with, the overvoltage when buffer circuit is used to absorb the igbt transistor ON/OFF and
Overcurrent.
It is preferred that the buffer circuit include the colelctor electrode for being connected to two igbt transistors and emitting stage it
Between two RC series circuits.
It is preferred that the measurement apparatus is oscillograph.
It is preferred that it is described also include by low tension switch and control device harmonic wave jamming immunity tester with based on the control
The human-computer interaction module that device is electrically connected with is calculated, for showing and setting the copped wave point of the copped wave module.
It is preferred that the human-computer interaction module includes digital display tube and key-press module.
In order to realize above-mentioned another object, the invention discloses one kind to be used for low tension switch and control device as described above
The test method of harmonic wave jamming immunity tester, including：
The output voltage of the pressure regulator is adjusted to minimum, the copped wave point of the copped wave module is set；
Gradually increase the output voltage of the pressure regulator, when measurement apparatus measurement is by the test specimen
When test current reaches test requirements document current value about 1/4-1/6, the waveform of the test current is measured by the measurement apparatus
Whether following three condition is met：
A, it is not more than 4.2ms per half-wave current ON time；
B, whether peak factor is more than or equal to 2.1；
C, whether each harmonic components meet the following value of at least fundametal compoment：3 subharmonic ＞ 60%, 5 subharmonic ＞
14%, 7 subharmonic ＞ 7%；
If three above condition can not be met simultaneously, adjust the copped wave point of the copped wave module, until simultaneously meet with
Upper three regulations；
If current waveform meets three above condition simultaneously, continue to increase the output voltage of the pressure regulator, work as institute
State when the virtual value by the test current in the test specimen that measurement apparatus measures reaches the test requirements document electric current and open
Beginning timing, untill the test specimen is threaded off, this time is the duration of false tripping immunity to interference；
If the above-mentioned duration is more than or equal to 10 times of the drop-away time of two times of current settings, then it is assumed that the examination
Sample is tested to test by harmonic current in immunity experiment；
If the above-mentioned duration is less than 10 times of the drop-away time of two times of current settings, then it is assumed that the test specimen
Do not tested by harmonic current in immunity experiment.
Compared with prior art, in the test method of the present invention, abandoned that traditional cost is high, bulky experiment
Power supply, power supply used is derived from power network distribution box in test loop, and experimentation cost is low, and the restrictive function by place is small；Use full control
Test loop voltage signal is converted into digital quantity using voltage acquisition module and is sent into control by type copped wave module as copped wave equipment
In calculator, voltage signal magnitude is calculated by control calculator, simulates recovery voltage waveform, control is set on voltage waveform
Point, according to test requirements document, the copped wave point of copped wave module is freely adjusted, realize the copped wave work(to any one section of conventional sinusoidal ripple electric current
Can, the convenient harmonic component for adjusting test current, peak factor, test loop ON time and each harmonic components, test process
Regulation to parameter is simple and clear, convenient and swift, saves test period.
Brief description of the drawings
Fig. 1 is the structural principle that the embodiment of the present invention is used for low tension switch and control device harmonic wave jamming immunity tester
Figure.
Fig. 2 is that the embodiment of the present invention is used for low tension switch and the electrical connection of control device harmonic wave jamming immunity tester is former
Reason figure.
Embodiment
To describe technology contents, architectural feature, realization principle and the objects and the effects of the present invention in detail, tie below
Close embodiment and coordinate accompanying drawing to be explained in detail.
The invention discloses one kind to be used for low tension switch and control device harmonic wave jamming immunity tester, such as Fig. 1 and Fig. 2 institutes
Show, including voltage acquisition module 1, control calculator 2, full-control type copped wave module 3, pressure regulator 4 and measurement apparatus 5.Control calculates
Device 2 is electrically connected with voltage acquisition module 1 and copped wave module 3, and in the present embodiment, control calculator 2 is preferably single-chip microcomputer.Electricity
Pressure acquisition module 1 is used to gather AC sine wave from AC power 9 and be converted into data signal to be supplied to as synchronizing signal
Calculator 2 is controlled, in the present embodiment, voltage acquisition module 1 specifically uses voltage transformer 10 (as shown in Figure 2).Alternating current
Source 9 is derived from power network distribution box, has broken away from the constraint of Special test power supply.Control calculator 2 electrically connects with voltage acquisition module 1
Connect, for receive from voltage acquisition module 1 as synchronizing signal data signal and according to the data signal calculate voltage
Signal amplitude, simulate recovery voltage waveform and control point is set on the voltage waveform.Copped wave module 3 respectively with AC power
9 and control calculator 2 be electrically connected with, complete copped wave to AC sine wave under the control of control calculator 2, its output end with
Test specimen 100 is electrically connected with.Pressure regulator 4 is electrically connected between AC power 9 and copped wave module 3, for adjusting alternating current
Output voltage of the source 9 to copped wave module 3.Measurement apparatus 5 is electrically connected with test specimen 100, for measuring test loop electric current
And each harmonic component value, preferably oscillograph.In the present embodiment, test specimen 100 is electronic low pressure circuit breaker, is resisted for harmonic wave
The test object that harmonic current is tested in degree of disturbing experiment.
Compared with prior art, the present invention be used for low tension switch and control device harmonic wave jamming immunity tester got around into
The limitation of this high, bulky experiment power supply, power supply needed for experiment are derived from power network distribution box, using full-control type copped wave module 3,
Test loop voltage signal is converted into digital quantity using voltage acquisition module 1 to be sent into control calculator 2, by control calculator
2 calculate voltage signal magnitude, simulate recovery voltage waveform, control point is set on voltage waveform, reaches freely to adjust with this and cuts
The function of the copped wave point of ripple module 3, realize the copped wave function to any one section of conventional sinusoidal ripple electric current, convenient regulation experiment electricity
Stream, peak factor, the harmonic component of test loop ON time and each harmonic components.
Because the loop current needed in low tension switch and control device harmonic wave immunity experiment is bigger, harmonic current
Virtual value is maximum up to 4000A, is used for low tension switch and another implementation of control device harmonic wave jamming immunity tester in the present invention
In example, the output end of copped wave module 3 is electrically connected with by current lifting device 6 and test specimen 100, and current lifting device 6 is used for copped wave module 3
The high voltage low current of output is converted into low-voltage and high-current and acts on test specimen 100, is not increasing test loop capacity
In the case of, improve test current.
In addition, for the ease of observing and setting copped wave point position, the present invention is used for low tension switch and control device harmonic wave anti-interference
Degree experimental rig is additionally provided with the human-computer interaction module 8 being electrically connected with control calculator 2, in the present embodiment, man-machine interaction
Module 8 includes digital display tube 80 and key-press module 81.
According to the requirement of the full control characteristic of copped wave module 3, and the consideration for economy and efficiency, in the present embodiment,
Copped wave module 3 is driven using the IGBT units 30 and IGBT drivers 31 for including igbt transistor referring again to Fig. 2, IGBT
Device 31 is electrically connected with control calculator 2, and IGBT units 30 complete the copped wave to sine wave in specified angle ON/OFF,
IGBT units 30 are preferably the igbt transistor of two two-way inverse parallel connections, in order to protect igbt transistor from abnormal current
With the impact of voltage, in another preferred embodiment of the present invention, the buffer circuit being electrically connected with IGBT units 30 is additionally provided with
7, buffer circuit 7 is used to absorb the overvoltage and overcurrent during igbt transistor ON/OFF.The buffer circuit 7 is in this implementation
It is preferably RC series circuits in example, i.e., a RC series connection is provided between the colelctor electrode and emitting stage of two igbt transistors
Circuit, such as the R1/C1 and R2/C2 in Fig. 2, economical and convenient, it is easy to accomplish.
Use the above-mentioned specific experiment process for low tension switch and control device harmonic wave jamming immunity tester for：Carry out
When harmonic current is tested in immunity experiment, the output voltage of pressure regulator 4 is first adjusted to copped wave that is minimum and setting copped wave module 3
Point, it is that the angle of flow of igbt transistor, shut-off angle are set by human-computer interaction module 8 and single-chip microcomputer in the present embodiment
Degree (the current lead-through time, being≤21% cycle to half-wave, i.e., angle of flow is not more than 75.6 ° with shut-off angle interval)；Then
The gradually output voltage of increase pressure regulator 4, by oscilloscope measurement by the test current in test specimen 100, when experiment electricity
When flow valuve reaches test requirements document current value about 1/4-1/6, whether following three conditions are met by oscilloscope measurement current waveform：
A, it is not more than 4.2ms per half-wave current ON time；
B, whether peak factor is more than or equal to 2.1；
C, whether each harmonic components meet the following value of at least fundametal compoment：3 subharmonic ＞ 60%, 5 subharmonic ＞
14%, 7 subharmonic ＞ 7%.
If can not meet above-mentioned tri- conditions of A, B, C simultaneously, harmonic current is not inconsistent standardization requirement, it is necessary to pass through people
Machine interactive module 8 and single-chip microcomputer readjust the angle of flow of igbt transistor, shut-off angle, and regulation process is as follows：
If the 1, being more than 4.2ms per half-wave current ON time, increase the angle of flow of igbt transistor or reduce and close
Angle of rupture degree, until both differences are not more than 75.6 °；
If the 2, peak factor is not more than 2.1, increases the angle of flow of igbt transistor or reduce shut-off angle, reduce
ON time, the virtual value per half-wave current is reduced, half-wave current peak value/virtual value numerical value is more than or equal to 2.1；
If the 3, each harmonic components are unsatisfactory for numerical value as defined in above-mentioned condition C, igbt transistor is increasedd or decreased simultaneously
Angle of flow and shut-off angle, make every half-wave current conducting section integral forward lead or rear move.
According to above adjusting method, until current waveform meets tri- conditions of A, B, C as defined in standard simultaneously.
If current waveform meets three above condition simultaneously, continue to increase the output voltage of pressure regulator 4, when oscillograph is surveyed
The virtual value by the test current in test specimen 100 of amount starts timing when reaching standard requirement, until test specimen 100
Untill dropout, this time is the duration of false tripping immunity to interference.If it is whole that the duration is more than or equal to two times of electric currents
10 times of the drop-away time of definite value, then it is assumed that test specimen 100 is tested by harmonic current in immunity experiment；If this continues
Time is less than 10 times of the drop-away time of two times of current settings, then it is assumed that test specimen 100 does not pass through humorous in immunity experiment
Ripple testing current.
The present invention is described in detail above to be used to low tension switch and control device harmonic wave jamming immunity tester and utilize be somebody's turn to do
The specific method that experimental rig is tested, the limitation of traditional Special test power supply is broken away from, has significantly saved experimentation cost,
Using wholly-controled device igbt transistor as copped wave equipment, loop voltage signal is converted into number using voltage acquisition module 1
Word amount is sent into single-chip microcomputer, is calculated voltage signal magnitude by single-chip microcomputer, is simulated recovery voltage waveform, taken on voltage waveform a little,
Reach the function of the angle of flow for freely adjusting IGBT and shut-off angle with this, realize to any one section of conventional sinusoidal ripple electric current
Copped wave function, the convenient harmonic component for adjusting test current, peak factor, test loop ON time and each harmonic components, separately
Outer testing program uses low-voltage method, and the test voltage (within 5V) in the loop of test specimen 100 is reduced by current lifting device 6, improves
The test current in the loop of test specimen 100, the security of experimental rig is added, reduce the work(that experimental rig obtains from power network
Rate.
The above disclosed right model for being only the preferred embodiments of the present invention, the present invention can not being limited with this certainly
Enclose, therefore the equivalent variations made according to scope of the present invention patent, still fall within the scope that the present invention is covered.
Claims (10)
1. one kind is used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that including：
Voltage acquisition module, for gathering AC sine wave from AC power and being converted into data signal；
Calculator is controlled, is electrically connected with the voltage acquisition module, for receiving the conduct from the voltage acquisition module
The data signal of synchronizing signal simultaneously calculates voltage signal magnitude according to the data signal, simulates recovery voltage waveform and in institute
State and control point is set on voltage waveform；
Full-control type copped wave module, it is electrically connected with respectively with the AC power and the control calculator, for according to the control
The dominating pair of vertices AC sine wave that calculator processed is set carries out copped wave, and the output end of the copped wave module electrically connects with test specimen
Connect；
Pressure regulator, it is electrically connected between the AC power and the copped wave module, for adjusting the AC power to institute
State the output voltage of copped wave module；
Measurement apparatus, it is electrically connected with the test specimen, for measuring test loop electric current and each harmonic component value.
2. according to claim 1 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The output end of the copped wave module is electrically connected with by current lifting device and the test specimen, and the current lifting device is used for the copped wave
The high voltage low current of module output is converted into low-voltage and high-current to act on the test specimen.
3. according to claim 1 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The copped wave module includes IGBT units and the IGBT drivers being electrically connected with the IGBT units.
4. according to claim 3 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The IGBT units include the igbt transistor of two two-way inverse parallel connections.
5. according to claim 4 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
Also include the buffer circuit being electrically connected with the IGBT units, the buffer circuit is led for absorbing the igbt transistor
Overvoltage and overcurrent during logical/shut-off.
6. according to claim 5 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The buffer circuit includes the two RC series connection being connected between the colelctor electrode and emitting stage of two igbt transistors
Circuit.
7. according to claim 1 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The measurement apparatus is oscillograph.
8. according to claim 1 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
Also include the human-computer interaction module being electrically connected with the control calculator, for showing and setting the copped wave of the copped wave module
Point.
9. according to claim 8 be used for low tension switch and control device harmonic wave jamming immunity tester, it is characterised in that
The human-computer interaction module includes digital display tube and key-press module.
10. it is used for low tension switch and control device harmonic wave jamming immunity tester according to any one of claim 1 to 9
Test method, it is characterised in that including：
The output voltage of the pressure regulator is adjusted to minimum, the copped wave point of the copped wave module is set；
Gradually increase the output voltage of the pressure regulator, pass through the experiment in the test specimen when measurement apparatus measurement
When electric current reaches test requirements document current value about 1/4-1/6, by the measurement apparatus measure the test current waveform whether
Meet following three conditions：
A, it is not more than 4.2ms per half-wave current ON time；
B, whether peak factor is more than or equal to 2.1；
C, whether each harmonic components meet the following value of at least fundametal compoment：3 subharmonic ＞ 60%, 5 subharmonic ＞ 14%, 7
Subharmonic ＞ 7%；
If three above condition can not be met simultaneously, the copped wave point of the copped wave module is adjusted, meets the above three until simultaneously
Individual regulation；
If current waveform meets three above condition simultaneously, continue to increase the output voltage of the pressure regulator, when the survey
The virtual value by the test current in the test specimen of amount measurement device starts to count when reaching the test requirements document electric current
When, untill the test specimen is threaded off, this time is the duration of false tripping immunity to interference；
If the above-mentioned duration is more than or equal to 10 times of the drop-away time of two times of current settings, then it is assumed that the test sample
Product are tested by harmonic current in immunity experiment；
If the above-mentioned duration is less than 10 times of the drop-away time of two times of current settings, then it is assumed that the test specimen is not logical
Harmonic current in immunity experiment is crossed to test.
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112014727A (en) * | 2020-07-15 | 2020-12-01 | 南方电网科学研究院有限责任公司 | Testing device for harmonic current switching capacity of tap switch |
| CN112946548A (en) * | 2019-12-10 | 2021-06-11 | 四川兴华福科技有限公司 | Charger calibration method, calibration system and charger |
| CN114966385A (en) * | 2022-05-09 | 2022-08-30 | 浙江方圆电气设备检测有限公司 | Method for controlling various test currents |
| CN117538640A (en) * | 2023-11-07 | 2024-02-09 | 苏州逐晨科技有限公司 | Test device and method for voltage mutation immunity test |
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