CN107506664A - Trigger parameter adjustment system and method in chip error injection test - Google Patents
Trigger parameter adjustment system and method in chip error injection test Download PDFInfo
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- CN107506664A CN107506664A CN201710761290.5A CN201710761290A CN107506664A CN 107506664 A CN107506664 A CN 107506664A CN 201710761290 A CN201710761290 A CN 201710761290A CN 107506664 A CN107506664 A CN 107506664A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/72—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information in cryptographic circuits
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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Abstract
The present invention provides the trigger parameter adjustment system and method in a kind of chip error injection test, in the communication process of host computer and chip to be measured, the energy mark data of chip to be measured are gathered, whether are judged wherein comprising time domain protection according to energy mark data, if it is not, then using fixed triggering mode；If so, finding the energy mark simple feature before trigger position, if the relative time of energy mark simple feature and trigger position is fixed, trigger signal is exported by the triggered time of the relative time；If not finding energy mark simple feature or the relative time of energy mark simple feature and trigger position not being fixed, characteristic energy mark is set, characteristic energy mark is matched with energy mark to be measured, after matching, determines the triggered time, interference source is triggered in the triggered time.The present invention can determine triggering mode according to whether being protected in energy mark data comprising time domain, the adjust automatically trigger parameter in test process, lift test job efficiency, ensure accuracy, the validity of test result.
Description
Technical field
The invention belongs to chip information security technology area, the trigger parameter being related in a kind of chip error injection test is adjusted
Whole system and method.
Background technology
The key message such as in store userspersonal information, accounts information in chip, once utilization is attacked by criminal,
The information leakage that will be caused in chip, such as leakage of personal information, user name and password leakage, property are lost, and are caused to user
The loss that can not be retrieved.
The applicant BeiJing UnionPay Gold Card Science Co., Ltd is directed to studying the information security technology of chip, by various
The security of means of testing test chip, the in time research and development for chip provide reliable defence prompting, peace are provided for each big bank
Complete effective chip.To ensure the safety of chip, prevent the chip error injection that criminal proposes for present patent application from surveying
In examination trigger parameter adjustment system and method propose targetedly, further attack method, present patent application request secrecy
Examine, the technology contents of underground present patent application.
With the rapid development of electronic technology, chip has been widely used in bank transaction management, medical insurance, public
The fields such as traffic, mobile communication, it is provided a great convenience for the life of people, at the same time, the information security of chip
As people's extraordinarily focus of attention.
The existing attack method for chip has been not limited solely to attack AES in itself, and occurs a lot
For AES and the attack method for the cryptographic system for realizing AES.Error injection is attacked, and is referred to and is set in crypto chip
By introducing mistake in cryptographic algorithm in standby, cause encryption device to produce error result, error result is carried out analysis so as to
Obtain key.The major way of error injection attack is by carrying out energy source interference to encryption device, making it can not normal work
Make.Chip is as important encryption device, it is necessary to comprehensively and effectively error injection attack test be carried out to it, according to test result
Potential leak existing for chip is determined, repairs leak in time, realizes effective security fence.
At present, chip error injection attack test work in problem is encountered that, carried out on the basis of sign off
Constant time lag triggers, and triggering mode is simply single, and positioning precision is relatively low, and time drift is larger, and accuracy can not ensure, causes to survey
The examination time is long, can not produce particular type mistake；And with the development of chip guard technology, it can be realized by software and hardware mode
The protection of chip time domain produces the protection of the time domains such as random delay, random clock, using constant time lag triggering mode with covering
Accurately interference triggering test can not be realized.
The content of the invention
In view of the foregoing, it is an object of the invention to provide the trigger parameter adjustment in a kind of injection test of chip error
System and method, triggering mode can be determined according to whether being protected in energy mark data comprising time domain, and adjust automatically triggering ginseng
Number, is substantially improved test job efficiency, improves accuracy, the validity of test result.
To achieve the above object, the present invention uses following technical scheme：
A kind of trigger parameter adjustment system in chip error injection test, including：Host computer, energy mark acquisition module,
Trigger parameter analysis module,
Energy mark acquisition module, for gathering the energy mark data of chip to be measured, and by energy mark data transfer to upper
Machine, trigger parameter analysis module；
Host computer, according to the energy mark data of acquisition, judge wherein to protect comprising time domain, sent out to trigger parameter analysis module
Send triggered time control data；
Trigger parameter analysis module, according to energy mark data, triggered time control data, triggered in the specific triggered time
Interference source.
Host computer judges wherein to protect comprising time domain, to the trigger parameter analysis module according to the energy mark data
The triggered time control data for including including time domain protection information is sent, the trigger parameter analysis module is according to the triggered time
Control data, the energy mark simple feature before default trigger position is found, if finding energy mark simple feature and the energy
The relative time of mark simple feature to trigger position is fixed value, then using the relative time as the triggered time, in the triggered time
Trigger interference source；If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed,
Characteristic energy mark is then set, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in this
Triggered time triggers interference source.
Host computer judges that not including time domain wherein protects, and determines the triggered time, touched to described according to the energy mark data
Hair Parameter analysis module, which is sent, includes triggered time and the triggered time control data not comprising time domain protection information, the triggering
Parameter analysis module triggers interference source according to the triggered time control data in the triggered time.
The energy mark simple feature can be the wave regions that peak value is more than particular value, can be that peak value is more than particular value
Wave regions edge, can be the random waveform with specific width, can be in particular level region, energy mark it is equal
Value or peak value are more than the wave regions of particular value, can be two peak regions with specific interval.
The characteristic energy mark is matched with energy mark data by correlation calculations.
The trigger parameter method of adjustment realized based on above-mentioned trigger parameter adjustment system, including：
Gather the energy mark data of chip to be measured；
According to energy mark data, judge wherein to protect comprising time domain；
The energy mark simple feature before default trigger position is found,
If finding energy mark simple feature and the relative time of the energy mark simple feature to trigger position being fixed value,
Using the relative time as the triggered time, interference source is triggered in the triggered time；
If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, set
Determine characteristic energy mark, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in the triggering
Time triggered interference source.
The trigger parameter method of adjustment, in addition to：If not including time domain in the energy mark data to protect, touched using fixed
Originating party formula.
If not finding energy mark simple feature or the relative position of energy mark simple feature and trigger position not being fixed, build
Vertical triggered time template, it is related to triggering that the triggered time template includes the characteristic energy mark, template amendment relevance threshold
Property threshold value, the characteristic energy mark is matched with the energy mark data, if matching result is more than the triggering correlation threshold
Value, determines the characteristic energy mark position to the time of trigger position, as the triggered time.
According to the energy mark data binding test result, the triggered time template is adjusted, including：
According to the characteristic energy mark and the matching result of energy mark data, if matching result is more than the template amendment phase
Closing property threshold value, characteristic energy mark characteristic energy mark corresponding with energy mark data is subjected to average computation, after being updated
Characteristic energy mark；
Using learning by rote, the template amendment relevance threshold and triggering relevance threshold are adjusted.
The method of the adjustment template amendment relevance threshold and triggering relevance threshold is：
Setting triggering probability=triggering times/triggering number of attempt, if triggering probability is less than 50%, it is related to reduce triggering
Property threshold value；If triggering probability is more than 95%, triggering relevance threshold is improved；
Template amendment probability=template times of revision/triggering number of attempt is set, if template amendment probability is less than 60%,
Reduce template amendment relevance threshold；If template amendment probability is more than 80%, template amendment relevance threshold is improved；
Set template amendment relevance threshold and be more than triggering relevance threshold.
It is an advantage of the invention that：
1st, system and method for the invention, it can be protected according to time domain whether is included in energy mark data, be defined as fixing
Or elastic triggering mode, test job efficiency is lifted, improves the accuracy of test result；
2nd, system and method for the invention, can be in test process, adjust automatically trigger parameter, further improves test
As a result accuracy, validity.
Brief description of the drawings
Fig. 1 is the block diagram of system of the present invention.
Fig. 2 is the method flow schematic diagram of the present invention.
Fig. 3 is the energy mark data waveform schematic diagram for including random delay.
Fig. 4 is the embodiment schematic diagram of the energy mark simple feature of the present invention.
Embodiment
Below in conjunction with drawings and examples, the present invention is described in further detail.
As shown in figure 1, the trigger parameter adjustment system in chip error injection test disclosed by the invention, including：It is upper
Machine, chip to be measured, energy mark acquisition module, trigger parameter analysis module, time delay module, trigger module, interference source etc..
Interference source, for exporting energy, error injection attack test is carried out to chip to be measured；Interference source include laser,
Electromagnetic pulse, voltage pulse, radioactive ray etc..
Trigger module, according to the trigger signal of time delay module, triggering interference source is allowed to export the interference signal of particular energy.
Time delay module, the Trig control signal that trigger parameter analysis module is sent is received, is sent by specific delay time
Trigger signal is to trigger module.
Energy mark acquisition module, for gathering the energy mark data in chip running to be measured, including power loss signal, electricity
Magnetic signal and optical signal, and by the energy mark data transfer of collection to host computer and trigger parameter analysis module.Energy mark gathers
Module includes power loss signal collection submodule, electromagnetic signal acquisition submodule, light signal collection submodule, wherein, power loss signal
Gathering submodule includes power loss signal amplifying circuit, power loss signal filter circuit, the first analog to digital conversion circuit, the work(of chip to be measured
Consume signal output part through power loss signal amplifying circuit, power loss signal filter circuit, the first analog to digital conversion circuit processing after, transmit to
Host computer and trigger parameter analysis module；Electromagnetic signal acquisition submodule includes electromagnetic signal amplifying circuit, electromagnetic signal filters
Circuit, the second analog to digital conversion circuit, the electromagnetic signal output end of chip to be measured filter through electromagnetic signal amplifying circuit, electromagnetic signal
After circuit, the processing of the second analog to digital conversion circuit, transmit to host computer and trigger parameter analysis module；Light signal collection submodule bag
Light signal amplification circuit, optical signal filtering circuit, the 3rd analog to digital conversion circuit are included, the light signal output end of chip to be measured is believed through light
After number amplifying circuit, optical signal filtering circuit, the processing of the 3rd analog to digital conversion circuit, transmit to host computer and trigger parameter analysis mould
Block.
Host computer by communication module (module that data are connected can be established with chip, such as follow 7816,14443, SWP,
The module of the communication protocols such as UART, USB) it is connected with chip to be measured progress data, host computer sends data and control to chip to be measured
System instruction, chip to be measured perform corresponding operation (e.g., carrying out encryption and decryption operation to data) according to the control instruction of host computer, led to
Believe module by the communication data transfer between the host computer of collection and chip to be measured to trigger parameter analysis module.
Host computer obtains the energy mark data of chip to be measured by energy mark acquisition module, according to energy mark data, analysis
Judge, wherein whether comprising the protection of the time domains such as random delay, random clock, if not comprising time domain protection, to determine the triggered time, and
Trigger parameter analysis module is sent to by the triggered time and not comprising time domain protection information；If being protected comprising time domain, when will include
Domain protection information is sent to trigger parameter analysis module.
Trigger parameter analysis module, receive the triggered time control that communication data, the host computer that communication module is sent are sent
Data (including triggered time and protect information not comprising time domain or include time domain protection information), receive energy mark collection mould
The energy mark data that block is sent, Trig control signal is sent to time delay module according to triggered time control data.Specifically：
If triggered time control data is the triggered time and protects information not comprising time domain, it is judged as fixing triggering mode,
The sign off moment is determined according to communication data, the Trig control signal for including the triggered time, delay are sent to time delay module
Module sends trigger signal by the triggered time according to the Trig control signal to trigger module.
If triggered time control data is to protect information comprising time domain, it is judged as elastic triggering mode, it is predetermined attempts searching
Trigger position before energy mark simple feature, if finding energy mark simple feature and the energy mark simple feature is to trigger bit
The relative time put is fixed value, then using the relative time between the two as the triggered time, being sent to time delay module includes the triggering
The Trig control signal of time；If do not find energy mark simple feature or energy mark simple feature to trigger position it is relative when
Between do not fix, then establish triggered time template, the triggered time template includes characteristic energy mark, by this feature energy mark with it is to be measured
Energy mark data are matched, and after the match is successful, determine the triggered time, and the triggering for including the triggered time is sent to time delay module
Control signal, time delay module send trigger signal by the triggered time according to the Trig control signal to trigger module.
As shown in Fig. 2 the trigger parameter method of adjustment realized based on above-mentioned trigger parameter adjustment system, including：
S1：Host computer and chip communication to be measured, gather communication data, the energy mark data of chip to be measured；
S2：According to the energy mark data of collection, whether judge wherein comprising the protection of the time domains such as random delay, random clock；
Determination methods are：
It is starting by fixed energies mark data waveform feature (being typically defined by the sign off moment), gathers some energy
Mark data waveform, using a wherein energy mark data waveform as reference data, therefrom pre-selected toggle area, by the trigger region
Domain carries out correlation calculations with other every energy mark data waveform respectively, obtain on every energy mark data waveform with the triggering
Area coherence highest position, if on the time point of correlation highest position correspondence and reference data energy mark data waveform
Mutually should toggle area position time point it is consistent, judge in this energy mark data waveform do not include random delay, it is random when
Clock；On the contrary, then comprising random delay, random clock, as shown in figure 3, the correlation highest waveform position (energy divided in square frame
Measure mark wave regions), corresponding time of origin is inconsistent in three (first is reference data) energy mark data waveforms, sentences
Random delay, random clock (that is, the chip to be measured protects comprising time domain) are included in disconnected energy mark data.
S3：According to judged result, triggering mode is determined；
Specifically：
If 1) do not include time domain in energy mark data to protect, it is defined as fixing triggering mode.
The sign off moment is determined according to communication data, determines the triggered time, when including the triggering to time delay module transmission
Between Trig control signal, time delay module sends trigger signal to tactile according to the Trig control signal after the triggered time
Send out module.The sign off moment refers to that host computer sends the finish time of control instruction to chip to be measured, from the finish time
Start to think that host computer performs specific arithmetic operation according to control instruction, certain operations are performed (as added in chip to be measured
Decryption, transmission intermediate data etc.) during, in triggered time (such as 5 seconds), mistake is carried out to chip to be measured by triggering interference source
Injection test.
If 2) protected in energy mark data comprising time domain, it is defined as elastic triggering mode.
The pre-selected trigger position (such as encryption and decryption computing, transmission intermediate data) from energy mark data, in trigger position
The energy mark simple feature with certain feature is determined before, according to energy mark simple feature and the relative position of trigger position,
It is divided into following two processing modes：
A, the relative time of energy mark simple feature to trigger position is fixed value.
As shown in figure 4, energy mark simple feature, which can be peak value, is more than the wave regions of particular value (such as boxed area institute
Show), it can be edge of the peak value more than the wave regions of particular value, can have the random waveform of specific width (such as upward
Spike width be more than 1.5ms), can be in particular level region, energy mark average or peak value be more than particular value waveform
Region, can be that there are two peak regions of specific interval etc..
Attempt to find the energy mark simple feature before trigger position, if energy mark simple feature is to the relative of trigger position
Time is fixed value, it is determined that go out the correspondence position of the energy mark simple feature on energy mark data waveform to be measured, it is then determined that
The energy mark simple feature as the triggered time, is sent when including the triggering to the time of trigger position to time delay module
Between Trig control signal, time delay module sent to trigger module by the triggered time and triggered according to the Trig control signal
Signal.
B, the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed.
Triggered time template is established, the triggered time template includes characteristic energy mark, template amendment relevance threshold and touched
Send out relevance threshold.This feature energy mark is the selected one section certain trigger region before trigger position (e.g., according to analysis
The wave regions of the execution certain operations of determination).
Characteristic energy mark is matched with energy mark data waveform to be measured first, utilizes characteristic energy mark and energy to be measured
Mark data waveform carries out correlation calculations, if correlativity calculation result is more than the triggering relevance threshold of setting, it is determined that to be measured
The position of character pair energy mark on energy mark data waveform, it is then determined that time of the characteristic energy mark position to trigger position,
As the triggered time, the Trig control signal for including the triggered time is sent to time delay module, time delay module touches according to this
Control signal is sent out, trigger signal is sent to trigger module by the triggered time.
In this case, it is necessary to according to the energy mark data binding test result to be measured of collection, to triggered time template
Parameters are modified adjustment, specifically include：
1) characteristic energy mark is adjusted
According to the correlativity calculation result of characteristic energy mark and energy mark data waveform to be measured, if correlativity calculation result is big
In the template amendment relevance threshold of setting, then need to be modified characteristic energy mark, by characteristic energy mark and energy to be measured
Corresponding characteristic energy mark carries out average computation, the characteristic energy mark after being updated, to reduce noise shadow on mark data waveform
Ring.
2) method for utilizing rote learning, adjustment template amendment relevance threshold and triggering relevance threshold
A, definition once runs particular code and attempted for once triggering, triggers probability=triggering times/triggering number of attempt.
If triggering probability is less than 50%, triggering relevance threshold is reduced；If triggering probability is more than 95%, it is related to improve triggering
Property threshold value.
B, template amendment probability=template times of revision/triggering number of attempt.If template amendment probability is less than 60%,
Reduce template amendment relevance threshold；If template amendment probability is more than 80%, template amendment relevance threshold is improved.
C, template amendment relevance threshold is set greater than triggering relevance threshold, prevents false triggering from causing characteristic energy mark
Occur compared with serious mistake.
Above-mentioned correlation calculations, if characteristic energy mark will not change, using Pearson correlation coefficient computational methods；
If characteristic energy mark can change and (compress or stretch along time shaft), use based on the elastic right of dynamic time warping method
Neat algorithm, its specific implementation refer to document《Improving Differential Power Analysis by Elastic
Alignment》、《FastDTW：Toward Accurate Dynamic Time Warping in Linear Time and
Space》Deng.
Trigger parameter adjustment system and method in chip error provided by the invention injection test, host computer with it is to be measured
In the communication process of chip, the energy mark data of chip to be measured are gathered, judge wherein whether include time domain according to energy mark data
Protection, if being protected not comprising time domain, using fixed triggering mode, i.e., after host computer is sent completely control instruction, in treating
Survey during chip execution certain operations, interference source is triggered in the specific triggered time, error injection is carried out to chip to be measured；If
Protected comprising time domain, the energy mark simple feature before trigger position is found, if the phase of energy mark simple feature and trigger position
Time is fixed, then exports trigger signal by the triggered time of the relative time；If energy mark simple feature or energy are not found
The relative time of mark simple feature and trigger position is not fixed, then characteristic energy mark is set, by characteristic energy mark and energy to be measured
Mark is matched, and after matching, determines the triggered time, and interference source is triggered in the triggered time.The system and method for the present invention, can
Triggering mode is determined according to whether being protected in energy mark data comprising time domain, and the adjust automatically trigger parameter in test process,
Test job efficiency can be substantially improved, ensure accuracy, the validity of test result.
The technical principle described above for being presently preferred embodiments of the present invention and its being used, for those skilled in the art
For, without departing from the spirit and scope of the present invention, any equivalent change based on the basis of technical solution of the present invention
Change, the simply obvious change such as replacement, belong within the scope of the present invention.
Claims (10)
1. the trigger parameter adjustment system in chip error injection test, it is characterised in that including：Host computer, the collection of energy mark
Module, trigger parameter analysis module,
Energy mark acquisition module, for gathering the energy mark data of chip to be measured, and by energy mark data transfer to host computer, touch
Send out Parameter analysis module；
Host computer, according to the energy mark data of acquisition, judge wherein to protect comprising time domain, send and touch to trigger parameter analysis module
Send out time control data；
Trigger parameter analysis module, according to energy mark data, triggered time control data, trigger and disturb in the specific triggered time
Source.
2. the trigger parameter adjustment system in chip error injection test according to claim 1, it is characterised in that upper
Machine judges wherein to protect comprising time domain according to the energy mark data, sent to the trigger parameter analysis module include comprising
Time domain protects the triggered time control data of information, and the trigger parameter analysis module is sought according to the triggered time control data
The energy mark simple feature looked for before default trigger position, if finding energy mark simple feature and the energy mark simple feature arrives
The relative time of trigger position is fixed value, then using the relative time as the triggered time, interference source is triggered in the triggered time；If
The relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, then sets characteristic energy
Mark, this feature energy mark is matched with energy mark data, after matching, determines the triggered time, it is dry in triggered time triggering
Disturb source.
3. the trigger parameter adjustment system in chip error injection test according to claim 2, it is characterised in that upper
Machine judges that not including time domain wherein protects, and determines the triggered time, mould is analyzed to the trigger parameter according to the energy mark data
Block, which is sent, includes triggered time and the triggered time control data not comprising time domain protection information, the trigger parameter analysis module
According to the triggered time control data, interference source is triggered in the triggered time.
4. the trigger parameter adjustment system in chip error injection test according to claim 2, it is characterised in that described
Energy mark simple feature can be the wave regions that peak value is more than particular value, can be the wave regions that peak value is more than particular value
Edge, can be the random waveform with specific width, can be in particular level region, energy mark average or peak value be more than
The wave regions of particular value, can be two peak regions with specific interval.
5. the trigger parameter adjustment system in chip error injection test according to claim 4, it is characterised in that described
Characteristic energy mark is matched with energy mark data by correlation calculations.
6. the trigger parameter method of adjustment that system is realized is adjusted based on trigger parameter described in any one in claim 1-5, its
It is characterised by, including：
Gather the energy mark data of chip to be measured；
According to energy mark data, judge wherein to protect comprising time domain；
The energy mark simple feature before default trigger position is found,
If find energy mark simple feature and the relative time of the energy mark simple feature to trigger position is fixed value, with this
Relative time is the triggered time, and interference source is triggered in the triggered time；
If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, setting is special
Energy mark is levied, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in the triggered time
Trigger interference source.
7. trigger parameter method of adjustment according to claim 6, it is characterised in that also include：If the energy mark data
In do not include time domain and protect, using fixed triggering mode.
8. trigger parameter method of adjustment according to claim 6, it is characterised in that if do not find energy mark simple feature or
It is that the relative position of energy mark simple feature and trigger position is not fixed, establishes triggered time template, the triggered time template bag
The characteristic energy mark, template amendment relevance threshold and triggering relevance threshold are included, by the characteristic energy mark and the energy
Amount mark data are matched, if matching result is more than the triggering relevance threshold, determine the characteristic energy mark position to triggering
The time of position, as the triggered time.
9. trigger parameter method of adjustment according to claim 8, it is characterised in that combined and surveyed according to the energy mark data
Test result, the triggered time template is adjusted, including：
According to the characteristic energy mark and the matching result of energy mark data, if matching result is more than the template amendment correlation
Threshold value, characteristic energy mark characteristic energy mark corresponding with energy mark data is subjected to average computation, the feature after being updated
Energy mark；
Using learning by rote, the template amendment relevance threshold and triggering relevance threshold are adjusted.
10. trigger parameter method of adjustment according to claim 8, it is characterised in that the adjustment template amendment phase
Close property threshold value and triggering relevance threshold method be：
Setting triggering probability=triggering times/triggering number of attempt, if triggering probability is less than 50%, reduce triggering correlation threshold
Value；If triggering probability is more than 95%, triggering relevance threshold is improved；
Template amendment probability=template times of revision/triggering number of attempt is set, if template amendment probability is less than 60%, is reduced
Template amendment relevance threshold；If template amendment probability is more than 80%, template amendment relevance threshold is improved；
Set template amendment relevance threshold and be more than triggering relevance threshold.
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