CN107506664B - Trigger parameter in chip error injection test adjusts system and method - Google Patents
Trigger parameter in chip error injection test adjusts system and method Download PDFInfo
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F21/00—Security arrangements for protecting computers, components thereof, programs or data against unauthorised activity
- G06F21/70—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer
- G06F21/71—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information
- G06F21/72—Protecting specific internal or peripheral components, in which the protection of a component leads to protection of the entire computer to assure secure computing or processing of information in cryptographic circuits
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- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/263—Generation of test inputs, e.g. test vectors, patterns or sequences ; with adaptation of the tested hardware for testability with external testers
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Abstract
The present invention provides the trigger parameter adjustment system and method in a kind of injection test of chip error, in the communication process of host computer and chip to be measured, the energy mark data of chip to be measured are acquired, whether time domain protection is wherein included according to the judgement of energy mark data, if it is not, then using fixed triggering mode；If so, finding the energy mark simple feature before trigger position, if the relative time of energy mark simple feature and trigger position is fixed, trigger signal is exported by the triggered time of the relative time；If the relative time for not finding energy mark simple feature or energy mark simple feature and trigger position is not fixed, characteristic energy mark is set, characteristic energy mark is matched with energy mark to be measured, after matching, determines the triggered time, triggers interference source in the triggered time.The present invention can determine triggering mode according to whether protecting comprising time domain in energy mark data, and adjust automatically trigger parameter, promotes test job efficiency, guarantee accuracy, the validity of test result during the test.
Description
Technical field
The invention belongs to chip information security technology area, a kind of be related in chip error injection test trigger parameter tune
Whole system and method.
Background technique
The key messages such as in store userspersonal information, account information in chip, once utilization is attacked by criminal,
The information leakage that will be caused in chip, such as leakage of personal information, user name and password leakage, property are lost, and are caused to user
The loss that can not be retrieved.
The applicant BeiJing UnionPay Gold Card Science Co., Ltd is dedicated to studying the information security technology of chip, by various
Means of testing tests the safety of chip, provides reliable defence prompt in time for the research and development of chip, provides peace for each big bank
Complete effective chip.For the safety for ensuring chip, the chip error injection for preventing criminal from proposing for present patent application is surveyed
Trigger parameter adjustment system and method in examination proposes that targetedly, further attack method, present patent application request maintain secrecy
It examines, the technology contents of underground present patent application.
With the rapid development of electronic technology, chip has been widely used in bank transaction management, medical insurance, public
The fields such as traffic, mobile communication, provide a great convenience for people's lives, at the same time, the information security of chip
As people's extraordinarily focus of attention.
The existing attack method for chip has been not limited solely to attack Encryption Algorithm itself, and occurs very much
For the attack method of Encryption Algorithm and the cryptographic system for realizing Encryption Algorithm.Error injection attack, refers to and sets in crypto chip
By introducing mistake in cryptographic algorithm in standby, encryption device is caused to generate error result, to error result carry out analysis to
Obtain key.The major way of error injection attack is to make it can not normal work by carrying out energy source interference to encryption device
Make.Chip needs to carry out comprehensively and effectively error injection attack test to it, according to test result as important encryption device
It determines potential loophole existing for chip, repairs loophole in time, realize effective security fence.
Currently, problem is encountered that, being carried out on the basis of sign off in the error injection attack test work of chip
Constant time lag triggering, triggering mode is simply single, and positioning accuracy is lower, and time drift is larger, and accuracy not can guarantee, and causes to survey
The examination time is long, can not generate specific type mistake；And with the development of chip guard technology, can be realized by software and hardware mode
The protection and cover of chip time domain generate the protection of the time domains such as random delay, random clock, using constant time lag triggering mode
It cannot achieve accurately interference triggering test.
Summary of the invention
In view of the foregoing, the purpose of the present invention is to provide the trigger parameter adjustment in a kind of injection test of chip error
System and method can determine triggering mode according to whether protecting comprising time domain in energy mark data, and adjust automatically triggering ginseng
Number, is substantially improved test job efficiency, improves accuracy, the validity of test result.
To achieve the above object, the invention adopts the following technical scheme:
Trigger parameter in a kind of injection test of chip error adjusts system, comprising: host computer, energy mark acquisition module,
Trigger parameter analysis module,
Energy mark acquisition module for acquiring the energy mark data of chip to be measured, and energy mark data is transmitted to upper
Machine, trigger parameter analysis module；
Host computer, according to the energy mark data of acquisition, judgement is wherein protected comprising time domain, is sent out to trigger parameter analysis module
The triggered time is sent to control data；
Trigger parameter analysis module controls data according to energy mark data, triggered time, triggers in the specific triggered time
Interference source.
Host computer is wherein protected comprising time domain according to the energy mark data, judgement, Xiang Suoshu trigger parameter analysis module
Transmission includes the triggered time control data comprising time domain protection information, and the trigger parameter analysis module is according to the triggered time
Data are controlled, the energy mark simple feature before preset trigger position are found, if finding energy mark simple feature and the energy
The relative time of mark simple feature to trigger position is fixed value, then using the relative time as the triggered time, in the triggered time
Trigger interference source；If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed,
Characteristic energy mark is then set, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in this
Triggered time triggers interference source.
According to the energy mark data, judgement does not include time domain wherein and protects host computer, the triggered time is determined, to the touching
Sending out Parameter analysis module and sending includes controlling data, the triggering in triggered time and the triggered time not comprising time domain protection information
Parameter analysis module controls data according to the triggered time, triggers interference source in the triggered time.
The energy mark simple feature can be the wave regions that peak value is greater than particular value, can be peak value greater than particular value
Wave regions edge, can be the random waveform with specific width, can be in particular level region, energy mark it is equal
Value or peak value are greater than the wave regions of particular value, can be two peak regions with specific interval.
The characteristic energy mark is matched with energy mark data by correlation calculations.
The trigger parameter method of adjustment realized based on above-mentioned trigger parameter adjustment system, comprising:
Acquire the energy mark data of chip to be measured；
According to energy mark data, judgement is wherein protected comprising time domain；
The energy mark simple feature before preset trigger position is found,
If finding energy mark simple feature and the relative time of the energy mark simple feature to trigger position being fixed value,
Using the relative time as the triggered time, interference source is triggered in the triggered time；
If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, set
Determine characteristic energy mark, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in the triggering
Time trigger interference source.
The trigger parameter method of adjustment, further includes: protect if not including time domain in the energy mark data, touched using fixed
Originating party formula.
If the relative position for not finding energy mark simple feature or energy mark simple feature and trigger position is not fixed, build
Vertical triggered time template, the triggered time template include that the characteristic energy mark, template amendment relevance threshold are related to triggering
Property threshold value, the characteristic energy mark is matched with the energy mark data, if matching result be greater than the triggering correlation threshold
Value, determine characteristic energy mark position to trigger position time, as the triggered time.
According to the energy mark data binding test as a result, being adjusted to the triggered time template, comprising:
According to the matching result of the characteristic energy mark and energy mark data, if matching result is greater than the template and corrects phase
Characteristic energy mark is carried out average computation with characteristic energy mark corresponding in energy mark data, obtained updated by closing property threshold value
Characteristic energy mark；
Using learning by rote, the template amendment relevance threshold and triggering relevance threshold are adjusted.
The adjustment template amendment relevance threshold is with the method for triggering relevance threshold:
Setting triggering probability=triggering times/triggering number of attempt, if it is related to reduce triggering less than 50% for triggering probability
Property threshold value；If triggering probability is greater than 95%, triggering relevance threshold is improved；
Set template correct probability=template times of revision/triggering number of attempt, if template correct probability less than 60%,
It reduces template and corrects relevance threshold；If template, which corrects probability, is greater than 80%, template amendment relevance threshold is improved；
It sets template amendment relevance threshold and is greater than triggering relevance threshold.
The invention has the advantages that
1, whether system and method for the invention can be determined as fixing according to including that time domain is protected in energy mark data
Or elastic triggering mode, test job efficiency is promoted, the accuracy of test result is improved；
2, system and method for the invention, can during the test, and adjust automatically trigger parameter further increases test
As a result accuracy, validity.
Detailed description of the invention
Fig. 1 is the system composition block diagram of the invention.
Fig. 2 is method flow schematic diagram of the invention.
Fig. 3 is the energy mark data waveform schematic diagram comprising random delay.
Fig. 4 is the embodiment schematic diagram of energy mark simple feature of the invention.
Specific embodiment
Below in conjunction with drawings and examples, the present invention is described in further detail.
As shown in Figure 1, the trigger parameter in chip error injection test disclosed by the invention adjusts system, comprising: upper
Machine, chip to be measured, energy mark acquisition module, trigger parameter analysis module, time delay module, trigger module, interference source etc..
Interference source carries out error injection attack test to chip to be measured for exporting energy；Interference source include laser,
Electromagnetic pulse, voltage pulse, radioactive ray etc..
Trigger module triggers interference source and is allowed to export the interference signal of particular energy according to the trigger signal of time delay module.
Time delay module receives the Trig control signal that trigger parameter analysis module is sent, sends by specific delay time
Trigger signal is to trigger module.
Energy mark acquisition module, for acquiring the energy mark data in chip operational process to be measured, including power loss signal, electricity
Magnetic signal and optical signal, and the energy mark data of acquisition are transmitted to host computer and trigger parameter analysis module.The acquisition of energy mark
Module includes power loss signal acquisition submodule, electromagnetic signal acquisition submodule, light signal collection submodule, wherein power loss signal
Acquiring submodule includes power loss signal amplifying circuit, power loss signal filter circuit, the first analog to digital conversion circuit, the function of chip to be measured
Signal output end is consumed after power loss signal amplifying circuit, power loss signal filter circuit, the processing of the first analog to digital conversion circuit, is transmitted to
Host computer and trigger parameter analysis module；Electromagnetic signal acquisition submodule includes electromagnetic signal amplifying circuit, electromagnetic signal filtering
The electromagnetic signal output end of circuit, the second analog to digital conversion circuit, chip to be measured is filtered through electromagnetic signal amplifying circuit, electromagnetic signal
After circuit, the processing of the second analog to digital conversion circuit, it is transmitted to host computer and trigger parameter analysis module；Light signal collection submodule packet
Light signal amplification circuit, optical signal filtering circuit, third analog to digital conversion circuit are included, the light signal output end of chip to be measured is believed through light
After number amplifying circuit, optical signal filtering circuit, the processing of third analog to digital conversion circuit, it is transmitted to host computer and trigger parameter analyzes mould
Block.
Host computer by communication module (module of data connection can be established with chip, such as follow 7816,14443, SWP,
The module of the communication protocols such as UART, USB) with chip to be measured data connection is carried out, host computer sends data and control to chip to be measured
System instruction, chip to be measured execute corresponding operation (e.g., carrying out encryption and decryption operation to data) according to the control instruction of host computer, lead to
Believe module by the communication data transfer between the host computer of acquisition and chip to be measured to trigger parameter analysis module.
Host computer obtains the energy mark data of chip to be measured by energy mark acquisition module, according to energy mark data, analysis
Whether judgement wherein comprising the protection of the time domains such as random delay, random clock, protects if not including time domain, determines the triggered time, and
Trigger parameter analysis module is sent to by the triggered time and not comprising time domain protection information；If being protected comprising time domain, when will include
Domain protection information is sent to trigger parameter analysis module.
Trigger parameter analysis module receives the triggered time control that communication data, the host computer that communication module is sent are sent
Data (including the triggered time and do not include time domain protection information or include time domain protect information), receive energy mark acquire mould
The energy mark data that block is sent control data according to the triggered time and send Trig control signal to time delay module.Specifically:
It is the triggered time and does not include time domain protection information if the triggered time controls data, is judged as fixed triggering mode,
The sign off moment is determined according to communication data, sends the Trig control signal including the triggered time, delay to time delay module
Module sends trigger signal to trigger module according to the Trig control signal, by the triggered time.
If it is to protect information comprising time domain that the triggered time, which controls data, it is judged as elastic triggering mode, attempts to find predetermined
Trigger position before energy mark simple feature, if finding energy mark simple feature and the energy mark simple feature is to trigger bit
The relative time set is fixed value, then using the relative time between the two as the triggered time, sending to time delay module includes the triggering
The Trig control signal of time；If do not find energy mark simple feature or energy mark simple feature to trigger position it is opposite when
Between be not fixed, then establish triggered time template, which includes characteristic energy mark, by this feature energy mark with it is to be measured
Energy mark data are matched, and after successful match, determine the triggered time, send the triggering including the triggered time to time delay module
Signal is controlled, time delay module sends trigger signal to trigger module according to the Trig control signal, by the triggered time.
As shown in Fig. 2, the trigger parameter method of adjustment realized based on above-mentioned trigger parameter adjustment system, comprising:
S1: host computer and chip communication to be measured acquire communication data, the energy mark data of chip to be measured；
S2: according to the energy mark data of acquisition, whether judgement wherein includes the protection of the time domains such as random delay, random clock；
Judgment method are as follows:
Fixed energies mark data waveform feature (generally with the sign off moment) of being subject to is starting, acquires several energy
Mark data waveform, using a wherein energy mark data waveform as reference data, therefrom pre-selected trigger area, by the trigger region
Domain carries out correlation calculations with other every energy mark data waveform respectively, obtain on every energy mark data waveform with the triggering
The highest position of area coherence, if on the highest position of correlation corresponding time point and reference data energy mark data waveform
Mutually should trigger area position time point it is consistent, judge in this energy mark data waveform do not include random delay, it is random when
Clock；On the contrary, including then random delay, random clock, as shown in figure 3, the correlation highest waveform position (energy divided in box
Measure mark wave regions), corresponding time of origin is inconsistent in three (first is reference data) energy mark data waveforms, sentences
Include random delay, random clock (that is, the chip to be measured is protected comprising time domain) in disconnected energy mark data.
S3: according to judging result, triggering mode is determined；
Specifically:
If 1) do not include time domain in energy mark data to protect, it is determined as fixed triggering mode.
The sign off moment is determined according to communication data, determines the triggered time, when sending to time delay module including the triggering
Between Trig control signal, time delay module sends trigger signal to touching according to the Trig control signal after the triggered time
Send out module.The sign off moment refers to that host computer sends the finish time of control instruction to chip to be measured, from the finish time
Start to think that host computer executes specific arithmetic operation according to control instruction, executes certain operations (as added in chip to be measured
Decryption, transmission intermediate data etc.) during, in triggered time (such as 5 seconds), mistake is carried out to chip to be measured by triggering interference source
Injection test.
If 2) protect in energy mark data comprising time domain, it is determined as elastic triggering mode.
The pre-selected trigger position (such as encryption and decryption operation, transmission intermediate data) from energy mark data, in trigger position
The energy mark simple feature with certain feature is determined before, according to the relative position of energy mark simple feature and trigger position,
It is divided into following two processing mode:
A, the relative time of energy mark simple feature to trigger position is fixed value.
As shown in figure 4, energy mark simple feature can be wave regions of the peak value greater than particular value (such as boxed area institute
Show), it can be edge of the peak value greater than the wave regions of particular value, can be the random waveform with specific width (as upwards
Spike width be greater than 1.5ms), can be in particular level region, energy mark mean value or peak value are greater than the waveform of particular value
Region can be two peak regions etc. with specific interval.
It attempts to find the energy mark simple feature before trigger position, if energy mark simple feature is to the opposite of trigger position
Time is fixed value, it is determined that then the corresponding position for going out the energy mark simple feature on energy mark data waveform to be measured determines
The energy mark simple feature to trigger position time, as the triggered time, to time delay module send include the triggering when
Between Trig control signal, time delay module sent to trigger module by the triggered time and triggered according to the Trig control signal
Signal.
B, the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed.
Triggered time template is established, which includes characteristic energy mark, template amendment relevance threshold and touching
Send out relevance threshold.This feature energy mark is the selected one section certain trigger region before trigger position (e.g., according to analysis
The wave regions of determining execution certain operations).
Characteristic energy mark is matched with energy mark data waveform to be measured first, utilizes characteristic energy mark and energy to be measured
Mark data waveform carries out correlation calculations, if correlativity calculation result is greater than the triggering relevance threshold of setting, it is determined that be measured
The position of character pair energy mark on energy mark data waveform, then determine characteristic energy mark position to trigger position time,
As the triggered time, the Trig control signal including the triggered time is sent to time delay module, time delay module is according to the touching
Hair control signal sends trigger signal to trigger module by the triggered time.
In this case, it needs according to the energy mark data binding test to be measured of acquisition as a result, to triggered time template
Parameters are modified adjustment, specifically include:
1) characteristic energy mark is adjusted
According to the correlativity calculation result of characteristic energy mark and energy mark data waveform to be measured, if correlativity calculation result is big
Relevance threshold is corrected in the template of setting, then needs to be modified characteristic energy mark, by characteristic energy mark and energy to be measured
Corresponding characteristic energy mark carries out average computation on mark data waveform, updated characteristic energy mark is obtained, to reduce noise shadow
It rings.
2) method for utilizing rote learning, adjustment template amendment relevance threshold and triggering relevance threshold
A, the primary operation particular code of definition is that primary triggering is attempted, and triggers probability=triggering times/triggering number of attempt.
If triggering probability less than 50%, triggering relevance threshold is reduced；If triggering probability is greater than 95%, it is related to improve triggering
Property threshold value.
B, template corrects probability=template times of revision/triggering number of attempt.If template correct probability less than 60%,
It reduces template and corrects relevance threshold；If template, which corrects probability, is greater than 80%, template amendment relevance threshold is improved.
C, template amendment relevance threshold is set greater than triggering relevance threshold, prevents false triggering from leading to characteristic energy mark
Occur compared with serious mistake.
Above-mentioned correlation calculations use Pearson correlation coefficient calculation method if characteristic energy mark will not change；
If characteristic energy mark can change and (compress or stretch along time shaft), right using the elasticity based on dynamic time warping method
Neat algorithm, specific implementation can refer to document " Improving Differential Power Analysis by Elastic
Alignment ", " FastDTW:Toward Accurate Dynamic Time Warping in Linear Time and
Space " etc..
Trigger parameter in chip error provided by the invention injection test adjusts system and method, host computer with it is to be measured
In the communication process of chip, the energy mark data of chip to be measured are acquired, whether include wherein time domain according to the judgement of energy mark data
Protection is protected if not including time domain, using fixed triggering mode, i.e., after host computer is sent completely control instruction, in
It surveys during chip execution certain operations, triggers interference source in the specific triggered time, error injection is carried out to chip to be measured；If
It is protected comprising time domain, the energy mark simple feature before trigger position is found, if the phase of energy mark simple feature and trigger position
Time is fixed, then exports trigger signal by the triggered time of the relative time；If not finding energy mark simple feature or energy
The relative time of mark simple feature and trigger position is not fixed, then sets characteristic energy mark, by characteristic energy mark and energy to be measured
Mark is matched, and after matching, determines the triggered time, triggers interference source in the triggered time.System and method of the invention, can
Triggering mode is determined according to whether protecting comprising time domain in energy mark data, and adjust automatically trigger parameter during the test,
Test job efficiency can be substantially improved, guarantee accuracy, the validity of test result.
The above is presently preferred embodiments of the present invention and its technical principle used, for those skilled in the art
For, without departing from the spirit and scope of the present invention, any equivalent change based on the basis of technical solution of the present invention
Change, simple replacement etc. is obvious changes, all fall within the protection scope of the present invention.
Claims (10)
1. the trigger parameter in chip error injection test adjusts system characterized by comprising host computer, the acquisition of energy mark
Module, trigger parameter analysis module,
Energy mark acquisition module is transmitted to host computer, touching for acquiring the energy mark data of chip to be measured, and by energy mark data
Send out Parameter analysis module；
Host computer, according to the energy mark data of acquisition, whether judgement wherein protects comprising time domain, sends out to trigger parameter analysis module
The triggered time is sent to control data；
Trigger parameter analysis module controls data according to energy mark data, triggered time, triggers and interfere in the specific triggered time
Source.
2. the trigger parameter in chip error injection test according to claim 1 adjusts system, which is characterized in that upper
Machine is according to the energy mark data, and when judgement is wherein protected comprising time domain, it includes packet that Xiang Suoshu trigger parameter analysis module, which is sent,
The triggered time of the protection information containing time domain controls data, and the trigger parameter analysis module controls data according to the triggered time,
The energy mark simple feature before preset trigger position is found, if finding energy mark simple feature and the energy mark simple feature
Relative time to trigger position is fixed value, then using the relative time as the triggered time, triggers interference source in the triggered time；
If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, feature energy is set
Mark is measured, this feature energy mark is matched with energy mark data, after matching, determines the triggered time, is triggered in the triggered time
Interference source.
3. the trigger parameter in chip error injection test according to claim 2 adjusts system, which is characterized in that upper
Machine is according to the energy mark data, when judgement does not include time domain protection wherein, determines triggered time, the analysis of Xiang Suoshu trigger parameter
It includes controlling data in triggered time and the triggered time not comprising time domain protection information that module, which is sent, and the trigger parameter analyzes mould
Root tuber controls data according to the triggered time, triggers interference source in the triggered time.
4. the trigger parameter in chip error injection test according to claim 2 adjusts system, which is characterized in that described
Energy mark simple feature is the edge for the wave regions that peak value is greater than particular value greater than the wave regions or peak value of particular value,
Or the random waveform with specific width, or it is greater than particular value in particular level region self-energy mark mean value or peak value
Wave regions, or two with specific interval peak regions.
5. the trigger parameter in chip error injection test according to claim 4 adjusts system, which is characterized in that described
Characteristic energy mark is matched with energy mark data by correlation calculations.
6. based on the trigger parameter method of adjustment that the adjustment system of trigger parameter described in any one of claim 1-5 is realized,
It is characterized in that, comprising:
Acquire the energy mark data of chip to be measured；
According to energy mark data, whether judgement wherein protects comprising time domain；
When in the energy mark data including time domain protection, the energy mark simple feature before preset trigger position is found,
If finding energy mark simple feature and the relative time of the energy mark simple feature to trigger position being fixed value, with this
Relative time is the triggered time, triggers interference source in the triggered time；
If the relative time for not finding energy mark simple feature or energy mark simple feature to trigger position is not fixed, spy is set
Energy mark is levied, this feature energy mark is matched with energy mark data, after matching, the triggered time is determined, in the triggered time
Trigger interference source.
7. trigger parameter method of adjustment according to claim 6, which is characterized in that further include: if the energy mark data
In do not include time domain and protect, using fixed triggering mode.
8. trigger parameter method of adjustment according to claim 6, which is characterized in that if do not find energy mark simple feature or
It is that the relative position of energy mark simple feature and trigger position is not fixed, establishes triggered time template, the triggered time template packet
The characteristic energy mark, template amendment relevance threshold and triggering relevance threshold are included, by the characteristic energy mark and the energy
Amount mark data are matched, if matching result is greater than the triggering relevance threshold, determine characteristic energy mark position to triggering
The time of position, as the triggered time.
9. trigger parameter method of adjustment according to claim 8, which is characterized in that combined and surveyed according to the energy mark data
Test result is adjusted the triggered time template, comprising:
According to the matching result of the characteristic energy mark and energy mark data, if matching result is greater than the template and corrects correlation
Characteristic energy mark is carried out average computation with characteristic energy mark corresponding in energy mark data, obtains updated feature by threshold value
Energy mark；
Using learning by rote, the template amendment relevance threshold and triggering relevance threshold are adjusted.
10. trigger parameter method of adjustment according to claim 8, which is characterized in that adjust the template amendment correlation
The method of threshold value and triggering relevance threshold is:
Setting triggering probability=triggering times/triggering number of attempt, if triggering probability less than 50%, reduces triggering correlation threshold
Value；If triggering probability is greater than 95%, triggering relevance threshold is improved；
It sets template and corrects probability=template times of revision/triggering number of attempt, if template corrects probability less than 60%, reduce
Template corrects relevance threshold；If template, which corrects probability, is greater than 80%, template amendment relevance threshold is improved；
It sets template amendment relevance threshold and is greater than triggering relevance threshold.
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