CN107505560B - Energy parameter in chip error injection test adjusts system and method - Google Patents
Energy parameter in chip error injection test adjusts system and method Download PDFInfo
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- CN107505560B CN107505560B CN201710749228.4A CN201710749228A CN107505560B CN 107505560 B CN107505560 B CN 107505560B CN 201710749228 A CN201710749228 A CN 201710749228A CN 107505560 B CN107505560 B CN 107505560B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2881—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to environmental aspects other than temperature, e.g. humidity or vibrations
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
- G01R31/2827—Testing of electronic protection circuits
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Abstract
The present invention discloses the energy parameter adjustment system and method in a kind of injection test of chip error, during error injection attack test, acquire status signal, electromagnetic signal, the power loss signal etc. of chip to be measured, it is whether reasonable according to its status signal, electromagnetic signal, the energy of power loss signal discriminatory analysis injection, based on the analysis results, dynamic adjusts the energy parameter of interference source, and the output energy of interference source is controlled according to energy parameter adjusted；By the test and adjustment process of early period, the relatively reasonable energy parameter information of pre-generatmg is subsequent to carry out test job according to energy parameter information, and during the test, is updated, optimizes to the energy parameter information of pre-generatmg.System and method of the invention, can adjust automatically, optimization energy parameter, test job efficiency is substantially improved, guarantees accuracy, the validity of test result.
Description
Technical field
The invention belongs to chip information security technology area, a kind of be related in chip error injection test energy parameter tune
Whole system and method.
Background technique
The key messages such as in store userspersonal information, account information in chip, once utilization is attacked by criminal,
The information leakage that will be caused in chip, such as leakage of personal information, user name and password leakage, property are lost, and are caused to user
The loss that can not be retrieved.
With the rapid development of electronic technology, chip has been widely used in bank transaction management, medical insurance, public
The fields such as traffic, mobile communication, provide a great convenience for people's lives, at the same time, the information security of chip
As people's extraordinarily focus of attention.
The existing attack method for chip has been not limited solely to attack Encryption Algorithm itself, and occurs very much
For the attack method of Encryption Algorithm and the cryptographic system for realizing Encryption Algorithm.Error injection attack, refers to and sets in crypto chip
By introducing mistake in cryptographic algorithm in standby, encryption device is caused to generate error result, to error result carry out analysis to
Obtain key.The major way of error injection attack is to make it can not normal work by carrying out energy source interference to encryption device
Make.Chip needs to carry out comprehensively and effectively error injection attack test to it, according to test result as important encryption device
It determines potential loophole existing for chip, repairs loophole in time, realize effective security fence.
Currently, chip error injection attack test work in problem is encountered that, due to the technique of chip, circuit knot
Structure is different, cause the disparate modules of different chips or same chip to the susceptibility of energy source (swashing optical, electromagnetic, burr etc.) not
Together, for example, when laser energy is excessive, in fact it could happen that circuit occur latch phenomenon, when laser energy is too small, can not generate mistake and
Reach test purpose, that is, the energy parameter of energy source can not reach ideal test effect, test effect by automatic adjustment
It is obtained entirely with the experience of Test Engineer, not can guarantee the accuracy, comprehensive of test result, and tasted using the simple method of exhaustion
All energy parameters are tried, not only cause testing cost excessive, and inefficiency.
Summary of the invention
In view of the foregoing, the purpose of the present invention is to provide the energy parameter adjustment in a kind of injection test of chip error
System and method, can adjust automatically, optimization energy parameter, test job efficiency is substantially improved, guarantees the accurate of test result
Property, validity.
To achieve the above object, the invention adopts the following technical scheme:
Energy parameter in a kind of injection test of chip error adjusts system, comprising: host computer, electromagnetism acquisition module, function
Acquisition module, energy parameter analysis module, energy parameter control module are consumed,
Host computer analyzes mould for acquiring the status signal of chip to be measured, and by the status signal transmission to energy parameter
Block；
Electromagnetism acquisition module, the electromagnetic signal of the chip to be measured for acquisition, and after handling the electromagnetic signal, it passes
Transport to energy parameter analysis module；
Power consumption collection module, the power loss signal of the chip to be measured for acquisition, and after handling the power loss signal, it passes
Transport to energy parameter analysis module；
Energy parameter analysis module, for status signal based on the received, electromagnetic signal that treated, power loss signal are moved
State adjusts energy parameter, according to energy parameter adjusted, generates energy parameter and controls signal, is transmitted to energy parameter control mould
Block；
Energy parameter control module, for controlling signal, the energy of control interference source output according to energy parameter.
The status signal includes whether that latch, whether normal operation occurs, and the energy parameter analysis module dynamic is adjusted
The method of whole energy parameter is:
Does judge 1: latch occur for chip to be measured? if latch occurs, judge that energy injection is excessive, if latch does not occur,
Carry out judgement 2；
Judge 2: chip to be measured is whether normal operation? it runs if normal, judges that energy injection is smaller, if being operating abnormally, into
Row judges 3；
Do you judge 3: judging that electromagnetic signal or/and power loss signal are abnormal? if signal no exceptions, judges energy
It is smaller；
According to the analysis for judging 1-3 as a result, dynamic adjustment energy parameter, generates energy parameter adjusted.
The interference source is laser, and corresponding energy parameter includes energy size, duration of disturbance, interference time
Number, the interference source are electromagnetic jammer, and corresponding energy parameter includes duration of disturbance, electromagnetic drive voltage, electromagnetism
Drive pulsewidth, interference number；The interference source is burr generator, and corresponding energy parameter includes burr width, burr depth
Degree, burr quantity.
For laser, electromagnetic generator, system further includes carrying the mobile station of chip to be measured, and the host computer acquisition should
The location information is transmitted to the energy parameter analysis module, the energy parameter analysis module by the location information of mobile station
According to the status signal, electromagnetic signal that treated, power loss signal and the location information, dynamic adjust energy parameter.
According to the corresponding energy parameter of chip different location to be measured, the corresponding feelings generated of chip under different-energy parameter are counted
Condition generates energy parameter adjusted according to statistical property dynamic adjustment energy parameter.
The energy parameter method of adjustment realized based on above-mentioned energy parameter adjustment system, comprising:
Acquire status signal, electromagnetic signal, the power loss signal of chip to be measured；
According to the status signal of chip to be measured, electromagnetic signal, power loss signal, the reasonability of energy parameter is judged, and according to
Judging result, dynamic adjust energy parameter, generate energy parameter adjusted；
According to energy parameter adjusted, the output energy of interference source is controlled.
The method of the dynamic adjustment energy parameter is:
Does judge 1: latch occur for chip to be measured? if latch occurs, judge that energy injection is excessive, if latch does not occur,
Carry out judgement 2；
Judge 2: chip to be measured is whether normal operation? it runs if normal, judges that energy injection is smaller, if being operating abnormally, into
Row judges 3；
Do you judge 3: judging that electromagnetic signal or/and power loss signal are abnormal? if signal no exceptions, judges energy
It is smaller；
According to the analysis for judging 1-3 as a result, dynamic adjustment energy parameter, generates energy parameter adjusted.
For electromagnetic jammer, laser, multiple energy note is first carried out respectively to the test point that quantity on chip to be measured is N
Enter, determines the energy parameter upper limit of each test point；
Later, multiple energy injection is carried out respectively to the test point that quantity on chip to be measured is N`, energy parameter is no more than
The energy parameter upper limit, during this, dynamic adjusts energy parameter, generates position-energy parameter and compares information, the position-energy
It includes the position of test point, the corresponding energy parameter upper limit in the position and energy parameter lower limit that parameter, which compares information,；Wherein, N` is big
In N；
It is tested according to the position-energy parameter control information, and during the test to the position-energy parameter pair
It is optimized according to information.
For burr interference unit, multiple energy injection is carried out respectively to the time point to be measured in chip operational process to be measured,
During this, dynamic adjust energy parameter, generate energy parameter range information, the energy parameter range information be include that burr is wide
The three-dimensional information table of degree, burr depth, burr quantity；
It is tested according to the energy parameter range information, and the energy parameter range information is carried out during the test
Optimization.
The judgement 3 further include: if signal is abnormal, carry out judgement 4；
Judge 4: whether electromagnetic signal or/and the amplitude of variation of power loss signal are more than the outlier threshold of setting, if being less than
Outlier threshold judges that energy injection is smaller, if being more than outlier threshold, judges that energy injection is bigger；
According to the analysis for judging 4 as a result, dynamic adjusts the outlier threshold.
The invention has the advantages that
1, energy parameter of the invention adjusts system and method, can adjust automatically, optimize the range of energy parameter, substantially
Test job efficiency is promoted, test automation level is improved, reduces testing cost；
2, energy parameter of the invention adjusts system and method, and the subjective factors of tester is avoided to influence completely, protects
Demonstrate,prove objectivity, accuracy, the validity of test result；
3, energy parameter of the invention adjusts system and method, determines energy parameter approximate range by first coarse scan
Afterwards, it is further carried out fine scanning, test accuracy is improved, can be avoided the multiplicating energy injection of large energy to core
Piece damages.
Detailed description of the invention
Fig. 1 is the system composition block diagram of the invention.
Fig. 2 is the flow diagram of dynamic adjustment energy parameter of the invention.
Fig. 3 is the flow diagram of dynamic adjustment energy parameter of the invention, and interference source is laser, electromagnetic jammer.
Fig. 4 is flow chart of the method for the present invention, and interference source is laser, electromagnetic jammer.
Fig. 5 is flow chart of the method for the present invention, and interference source is burr generator.
Specific embodiment
Below in conjunction with drawings and examples, the present invention is described in further detail.
As shown in Figure 1, the energy parameter in chip error injection test disclosed by the invention adjusts system, comprising: upper
Machine, chip to be measured, electromagnetism acquisition module, power consumption collection module, energy parameter analysis module, energy parameter control module, interference
Source etc..
Interference source carries out error injection attack test to chip to be measured for exporting energy；Interference source include laser,
Electromagnetic jammer, burr generator etc..
Host computer by communication module (module of data connection can be established with chip, such as follow 7816,14443, SWP,
The module of the communication protocols such as UART, USB) and chip to be measured progress data connection, the status signal of chip to be measured can be obtained, the shape
State signal includes whether to occur latch, whether normal operation etc.；The status signal transmission for the chip to be measured that host computer will acquire is extremely
Energy parameter analysis module.
The electromagnetic signal of chip to be measured is transmitted to energy parameter analysis module after the processing of electromagnetism acquisition module.Electromagnetism acquisition
Module includes electromagnetic signal amplifying circuit, electromagnetic signal filter circuit, the first analog to digital conversion circuit, the electromagnetic signal of chip to be measured
Output end is transmitted to energy ginseng after electromagnetic signal amplifying circuit, electromagnetic signal filter circuit, the processing of the first analog to digital conversion circuit
Number analysis module.
The power loss signal of chip to be measured is transmitted to energy parameter analysis module after power consumption collection module is handled.Power consumption acquisition
Module includes power loss signal amplifying circuit, power loss signal filter circuit, the second analog to digital conversion circuit, the power loss signal of chip to be measured
Output end is transmitted to energy ginseng after power loss signal amplifying circuit, power loss signal filter circuit, the processing of the second analog to digital conversion circuit
Number analysis module.
Energy parameter analysis module, according to status signal, electromagnetic signal, the power loss signal of the chip to be measured of acquisition, dynamic
Energy parameter is adjusted, and according to energy parameter adjusted, is exported to energy parameter control module for controlling energy parameter
Energy parameter controls signal.
Energy parameter control module, energy parameter controls signal based on the received, controls the energy parameter of interference source, so that
The energy of interference source output can carry out effective energy injection to chip to be measured.
As shown in Fig. 2, the method for the energy parameter analysis module dynamic adjustment energy parameter is: interference source exports energy
Energy injection is carried out to chip to be measured, host computer is by the status signal transmission of chip to be measured to energy parameter analysis module, electromagnetism
The electromagnetic signal of treated chip to be measured, power loss signal are transmitted to energy parameter respectively by acquisition module and power consumption collection module
Analysis module；Energy parameter analysis module makes the following judgment according to the status signal of chip to be measured, electromagnetic signal, power loss signal
Analysis:
Does judge 1: latch occur for chip to be measured? if latch occurs, judge that energy injection is excessive, if latch does not occur,
Carry out judgement 2；
Judge 2: chip to be measured is whether normal operation? it runs if normal, judges that energy injection is smaller, if being operating abnormally, into
Row judges 3；
Do you judge 3: judging that electromagnetic signal or/and power loss signal are abnormal? if signal no exceptions, judges energy
It is smaller, if signal is abnormal, carry out judgement 4；
According to the analysis for judging 1-3 as a result, dynamic adjustment energy parameter, generates energy parameter adjusted.
Judge 4: whether electromagnetic signal or/and the amplitude of variation of power loss signal are more than the outlier threshold of setting, if being less than
Outlier threshold judges that energy injection is smaller, if being more than outlier threshold, judges that energy injection is bigger.
According to the analysis for judging 4 as a result, dynamic adjustment outlier threshold.
Energy parameter analysis module exports energy parameter control according to energy parameter adjusted, to energy parameter control module
Signal processed, energy parameter control module control signal according to energy parameter, and the trigger signal of interference source is controlled by trigger module
(generating interference for triggering interference source), controls the parameters of interference source output signal, by energy adjustment module to carry out
Test process next time.
According to the difference of interference source, energy parameter adjustment system and method for the invention is refined as follows:
It can for the influence that test interference source generates chip different location for interference sources such as laser, electromagnetic jammers
Further chip to be measured is placed in a mobile station, in test process, mobile station is mobile, so that interference source is to chip to be measured
Different location carries out energy injection, and during this, host computer obtains the position signal of the status signal of chip to be measured, mobile station,
And status signal, position signal are sent to energy parameter analysis module；Energy parameter analysis module receives the electricity of chip to be measured
Magnetic signal, power loss signal, status signal and mobile station position signal, as shown in figure 3, successively carry out aforementioned judgement 1-3, according to
Judge the analysis of 1-3 as a result, dynamically recording chip current location and energy parameter corresponding informance, and according to chip different location
Corresponding energy parameter counts the corresponding the case where generating of chip under different-energy parameter, according to statistical property dynamic adjustment energy
Parameter generates energy parameter adjusted.For laser, corresponding energy parameter includes that duration of disturbance, energy are big
Small, interference number；For electromagnetic jammer, corresponding energy parameter includes duration of disturbance, electromagnetic drive voltage, electromagnetism
Drive pulsewidth, interference number etc..
For burr generator, according to the dynamic adjustment energy parameter of method shown in Fig. 2, corresponding energy parameter includes hair
Pierce width, burr depth, burr quantity.
The energy parameter method of adjustment realized based on above system, comprising:
As shown in figure 4, are first carried out by coarse scan and carries out fine scanning again for the interference sources such as laser, electromagnetic jammer,
Pre-generatmg position-energy parameter compares information, then carries out follow-up test according still further to the position of generation-energy parameter control information
It works, in test process, further energy parameter is optimized.Specifically,
Pass through control mobile station mobile carry out coarse scan, that is, first to individual test positions of chip to be measured (for example,
From chip upper left corner the to the lower right corner, the equidistant N number of point of scanning) energy injection is carried out, each test position carries out multiple energy note
Enter；In multiple energy injection process, dynamic adjusts energy parameter, determines the corresponding energy parameter upper limit of each test position；
Later, within the chip range of coarse scan, by the mobile carry out fine scanning for controlling mobile station, that is, right
Multiple test positions (for example, from chip upper left corner the to the lower right corner, N` point of equidistant scanning, N` > 8N) of chip to be measured carry out
Energy injection, energy parameter are no more than the energy parameter upper limit that coarse scan determines, multiple test positions cover each of chip
Module, with the energy tolerance level and sensitivity of the modules of determination chip to be measured, each test position carries out multiple energy
Injection；In multiple energy injection process, process dynamics adjust energy parameter according to Fig.3, generate position-energy parameter control
Information, the position-energy parameter control information includes test point coordinate (x, y), the corresponding energy parameter upper limit of the test point, energy
Measure parameter lower limit etc..
Then, information is compareed according to the position of generation-energy parameter, carries out subsequent test process, in test process, into
One step compares information according to the electromagnetic signal of chip to be measured, power loss signal, status signal, position signal, to position-energy parameter
It is updated, advanced optimizes testing scheme.
As shown in figure 5, for burr generator, it is advanced to test the influence that it generates chip difference runing time point
Row coarse scan, i.e., first to individual testing time points (for example, crypto-operation time constant duration is divided into M time point)
Burr injection is carried out, each testing time point carries out multiple burr injection；In multiple burr injection process, dynamic adjusts energy ginseng
Number determines the corresponding energy parameter range of each testing time point, generates energy parameter range information, energy parameter range letter
Breath is the three-dimensional information table for including burr width, burr depth, burr quantity, and the value of each single item is (a, b, c) in table, wherein a
For burr width value, b is burr depth value, and c is burr quantitative value.
Then, according to the energy parameter range information of generation, subsequent test process is carried out, in test process, further
According to the electromagnetic signal of chip to be measured, power loss signal, status signal, energy parameter range information is updated, it is further excellent
Change testing scheme.
Energy parameter in chip error injection test of the invention adjusts system and method, by attacking in error injection
In test process, status signal, electromagnetic signal, power loss signal of chip to be measured etc. are acquired, is believed according to its status signal, electromagnetism
Number, power loss signal discriminatory analysis injection energy it is whether reasonable, based on the analysis results, dynamic adjust interference source energy parameter,
And the output energy of interference source is controlled according to energy parameter adjusted；By the test of early period and adjustment process, pre-generatmg compared with
It is subsequent to carry out test job according to energy parameter information for reasonable energy parameter information, and during the test, to pre-generatmg
Energy parameter information be updated, optimize, test job efficiency can be substantially improved, guarantee test result accuracy, effectively
Property.
The above is presently preferred embodiments of the present invention and its technical principle used, for those skilled in the art
For, without departing from the spirit and scope of the present invention, any equivalent change based on the basis of technical solution of the present invention
Change, simple replacement etc. is obvious changes, all fall within the protection scope of the present invention.
Claims (10)
1. the energy parameter in chip error injection test adjusts system characterized by comprising host computer, electromagnetism acquire mould
Block, power consumption collection module, energy parameter analysis module, energy parameter control module,
Host computer, for acquiring the status signal of chip to be measured, and by the status signal transmission to energy parameter analysis module；
Electromagnetism acquisition module is transmitted to energy for acquiring the electromagnetic signal of chip to be measured, and after handling the electromagnetic signal
Measure Parameter analysis module；
Power consumption collection module is transmitted to energy for acquiring the power loss signal of chip to be measured, and after handling the power loss signal
Measure Parameter analysis module；
Energy parameter analysis module, for status signal based on the received, electromagnetic signal that treated, power loss signal, dynamic is adjusted
Whole energy parameter generates energy parameter and controls signal, be transmitted to energy parameter control module according to energy parameter adjusted；
Energy parameter control module, for controlling signal, the energy of control interference source output according to energy parameter.
2. the energy parameter in chip error injection test according to claim 1 adjusts system, which is characterized in that described
Status signal includes whether that latch, whether normal operation occurs, the energy parameter analysis module dynamic adjustment energy parameter
Method is:
Does judge 1: latch occur for chip to be measured? if latch occurs, judge that energy injection is excessive, if latch does not occur, carries out
Judge 2；
Judge 2: chip to be measured is whether normal operation? it runs if normal, judges that energy injection is smaller, if being operating abnormally, sentenced
Disconnected 3；
Do you judge 3: judging that electromagnetic signal or/and power loss signal are abnormal? if signal no exceptions, judge that energy omits
It is small；
According to the analysis for judging 1-3 as a result, dynamic adjustment energy parameter, generates energy parameter adjusted.
3. the energy parameter in chip error injection test according to claim 2 adjusts system, which is characterized in that described
Interference source is laser, and corresponding energy parameter includes energy size, duration of disturbance, interference number；Or it is described dry
Disturb source be electromagnetic jammer, corresponding energy parameter include duration of disturbance, electromagnetic drive voltage, electromagnetic drive pulsewidth,
Interfere number；Or the interference source is burr generator, corresponding energy parameter includes burr width, burr depth, hair
Pierce quantity.
4. the energy parameter in chip error injection test according to claim 3 adjusts system, which is characterized in that for
Laser, electromagnetic jammer, system further include carrying the mobile station of chip to be measured, and the host computer acquires the position of the mobile station
The location information is transmitted to the energy parameter analysis module by information, and the energy parameter analysis module is according to the state
Signal, electromagnetic signal that treated, power loss signal and the location information, dynamic adjust energy parameter.
5. the energy parameter in chip error injection test according to claim 4 adjusts system, which is characterized in that according to
The corresponding energy parameter of chip different location to be measured counts the corresponding the case where generating of chip under different-energy parameter, according to statistics
Characteristic dynamic adjustment energy parameter, generates energy parameter adjusted.
6. the energy parameter method of adjustment realized based on the energy parameter adjustment system described in claim 5, which is characterized in that packet
It includes:
Acquire status signal, electromagnetic signal, the power loss signal of chip to be measured；
According to the status signal of chip to be measured, electromagnetic signal, power loss signal, the reasonability of energy parameter is judged, and according to judgement
As a result, dynamic adjustment energy parameter, generates energy parameter adjusted；
According to energy parameter adjusted, the output energy of interference source is controlled.
7. energy parameter method of adjustment according to claim 6, which is characterized in that the side of the dynamic adjustment energy parameter
Method is:
Does judge 1: latch occur for chip to be measured? if latch occurs, judge that energy injection is excessive, if latch does not occur, carries out
Judge 2；
Judge 2: chip to be measured is whether normal operation? it runs if normal, judges that energy injection is smaller, if being operating abnormally, sentenced
Disconnected 3；
Do you judge 3: judging that electromagnetic signal or/and power loss signal are abnormal? if signal no exceptions, judge that energy omits
It is small；
According to the analysis for judging 1-3 as a result, dynamic adjustment energy parameter, generates energy parameter adjusted.
8. energy parameter method of adjustment according to claim 7, which is characterized in that
For electromagnetic jammer, laser, multiple energy injection is first carried out respectively to the test point that quantity on chip to be measured is N,
Determine the energy parameter upper limit of each test point；
Later, multiple energy injection is carried out respectively to the test point that quantity on chip to be measured is N`, energy parameter is no more than energy
Parameter upper limit, during this, dynamic adjusts energy parameter, generates position-energy parameter and compares information, the position-energy parameter
Compareing information includes the position of test point, the corresponding energy parameter upper limit in the position and energy parameter lower limit；Wherein, N` is greater than N；
It is tested according to the position-energy parameter control information, and during the test to the position-energy parameter control letter
Breath optimizes.
9. energy parameter method of adjustment according to claim 7, which is characterized in that
For burr generator, multiple energy injection is carried out respectively to the time point to be measured in chip operational process to be measured, this mistake
Cheng Zhong, dynamic adjust energy parameter, generate energy parameter range information, the energy parameter range information be include burr width,
The three-dimensional information table of burr depth, burr quantity；
It is tested, and the energy parameter range information is carried out during the test excellent according to the energy parameter range information
Change.
10. energy parameter method of adjustment according to claim 7, which is characterized in that the judgement 3 further include: if signal
It is abnormal, carries out judgement 4；
Judge 4: whether electromagnetic signal or/and the amplitude of variation of power loss signal are more than the outlier threshold of setting, if being less than exception
Threshold value judges that energy injection is smaller, if being more than outlier threshold, judges that energy injection is bigger；
According to the analysis for judging 4 as a result, dynamic adjusts the outlier threshold.
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| WO2021196094A1 (en) * | 2020-04-01 | 2021-10-07 | 深圳市汇顶科技股份有限公司 | Circuit and chip for detecting voltage-based attack |
| CN111337820A (en) * | 2020-04-24 | 2020-06-26 | 江西联智集成电路有限公司 | Digital chip scan chain test method, device, equipment and medium |
| CN114465822B (en) * | 2022-04-08 | 2022-07-22 | 北京网藤科技有限公司 | Automatic generation method and system for attack vector of PLC (programmable logic controller) |
| CN116359708B (en) * | 2023-03-31 | 2024-05-17 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Chip safety test circuit, method and equipment |
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