CN107484335A - A kind of test pcb board for testing dual density QSFP interfaces - Google Patents

A kind of test pcb board for testing dual density QSFP interfaces Download PDF

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Publication number
CN107484335A
CN107484335A CN201710644753.XA CN201710644753A CN107484335A CN 107484335 A CN107484335 A CN 107484335A CN 201710644753 A CN201710644753 A CN 201710644753A CN 107484335 A CN107484335 A CN 107484335A
Authority
CN
China
Prior art keywords
pcb board
interfaces
plate
dust
fixed
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710644753.XA
Other languages
Chinese (zh)
Inventor
张军萍
俞斌
章国伟
石磊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hangzhou Lerong Wire & Electric Appliance Co Ltd
Original Assignee
Hangzhou Lerong Wire & Electric Appliance Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hangzhou Lerong Wire & Electric Appliance Co Ltd filed Critical Hangzhou Lerong Wire & Electric Appliance Co Ltd
Priority to CN201710644753.XA priority Critical patent/CN107484335A/en
Publication of CN107484335A publication Critical patent/CN107484335A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/14Structural association of two or more printed circuits
    • H05K1/142Arrangements of planar printed circuit boards in the same plane, e.g. auxiliary printed circuit insert mounted in a main printed circuit
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/18Printed circuits structurally associated with non-printed electric components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10007Types of components
    • H05K2201/10189Non-printed connector
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/10Details of components or other objects attached to or integrated in a printed circuit board
    • H05K2201/10227Other objects, e.g. metallic pieces

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The present invention provides a kind of test pcb board for testing dual density QSFP interfaces,Including mounting hole,Expansion link,Fixture block,Fixed plate,Hinge,Dust excluding plate,Dirt-proof boot and notch,The mounting hole is opened on the left of pcb board body interior,The expansion link is fixed on inside mounting hole,The fixture block is fixed on expansion link left side,The design solves the problems, such as that original pcb board is inconvenient to splice,The fixed plate is arranged on pcb board body right side,The hinge is arranged on fixed plate right side,The dust excluding plate is arranged on the upside of fixed plate,The dirt-proof boot is arranged on dust excluding plate front end face,The notch is opened in centre position on the right side of dust excluding plate,The design solves the problems, such as that original pcb board does not have dust reduction capability,The present invention is rational in infrastructure,It is easy to combination to install,It is easy to use,Functional,It is applied widely,Reliability is high.

Description

A kind of test pcb board for testing dual density QSFP interfaces
Technical field
The present invention is a kind of test pcb board for testing dual density QSFP interfaces, belongs to machine components equipment technical field.
Background technology
PCB, also known as printed circuit board (PCB), are the suppliers of electronic component electrical connection, and its development has 100 History for many years, it is mainly designed to layout design, and the major advantage using circuit board is to greatly reduce wiring and assembling Mistake, improve the gentle productive labor rate of Automated water, according to the wiring board number of plies can be divided into single sided board, dual platen, four laminates, Six laminates and other multilayer circuit boards.
In the prior art, for existing pcb board without the device of splicing, two pieces of pcb boards are not convenient enough in assembling, existing Pcb board is fitted without dust-proof device, and pcb board can be polluted in use for a long time by dust, reduces pcb board service life, existing Some pcb board functions are more single, are badly in need of a kind of test pcb board for testing dual density QSFP interfaces now to solve above-mentioned appearance The problem of.
The content of the invention
In view of the deficienciess of the prior art, it is an object of the present invention to provide a kind of test for testing dual density QSFP interfaces Pcb board, to solve the problems mentioned in the above background technology, the present invention are rational in infrastructure, are easy to combination to install, easy to use, work( Energy property is strong, applied widely, and reliability is high.
To achieve these goals, the present invention is to realize by the following technical solutions:One kind test dual density QSFP The test pcb board of interface, including QSFP interfaces, splicing body, pcb board body, signal wire, SMA interfaces and dust-proof mechanism, institute QSFP interfaces are stated on the downside of pcb board body upper surface, the splicing body is arranged on the left of pcb board body, the signal Line is fixed on the upside of SMA interfaces, and the SMA interfaces are arranged on pcb board body upper surface centre position, the dust-proof mechanism installation In pcb board body right side, the splicing body includes mounting hole, expansion link and fixture block, and the mounting hole is opened in pcb board On the left of body interior, the expansion link is fixed on inside mounting hole, and the fixture block is fixed on expansion link left side, the dust-proof machine Structure includes fixed plate, hinge, dust excluding plate, dirt-proof boot and notch, and the fixed plate is arranged on pcb board body right side, described Hinge is arranged on fixed plate right side, and the dust excluding plate is arranged on the upside of fixed plate, and the dirt-proof boot is arranged on dust-proof front edge of board Face, the notch are opened in centre position on the right side of dust excluding plate.
Further, the pcb board body interior is provided with signalling channel, and the signalling channel is provided with 16, and 16 Individual signalling channel specification is identical.
Further, the SMA interfaces are provided with 16, and 16 SMA interface specifications are identical.
Further, the splicing body is provided with two groups, and two spelling connection mechanism specifications are identical.
Further, the pcb board body right side is provided with neck, and the fixture block is fixed by neck and pcb board body Connection.
Further, the hinge is provided with two, and two hinge specifications are identical, the dust excluding plate by two hinges with Fixed plate is rotatablely connected.
Beneficial effects of the present invention:The test pcb board of a kind of test dual density QSFP interfaces of the present invention, because the present invention adds Adding mounting hole, expansion link and fixture block, this is designed to two pieces of pcb boards being stitched together, and convenient use personnel, which assemble, to be used, Operating efficiency is improved, solves the problems, such as that original pcb board is inconvenient to splice, improves the property easy to use of the present invention.
Because the present invention with the addition of fixed plate, hinge, dust excluding plate, dirt-proof boot and notch, this is designed to effectively reduce ash Pollution of the dirt to pcb board, the cleannes of pcb board are maintained, solve the problems, such as that original pcb board does not have dust reduction capability, improve The service life of the present invention.
Because signalling channel is provided with 16, SMA interfaces are provided with 16, and the design improves the transmission speed of signal of the present invention Degree, because hinge is provided with two, the design facilitates staff to rotate dust excluding plate, and the present invention is rational in infrastructure, is easy to combine Installation, easy to use, functional is applied widely, and reliability is high.
Brief description of the drawings
The detailed description made by reading with reference to the following drawings to non-limiting example, further feature of the invention, Objects and advantages will become more apparent upon:
Fig. 1 is a kind of structural representation for the test pcb board for testing dual density QSFP interfaces of the present invention;
Fig. 2 is the structural representation of splicing body in a kind of test pcb board for testing dual density QSFP interfaces of the present invention;
Fig. 3 is the structural representation of dust-proof mechanism in a kind of test pcb board for testing dual density QSFP interfaces of the present invention;
In figure:1-QSFP interfaces, 2- splicing bodies, 3-PCB plates body, 4- signal wires, 5-SMA interfaces, 6- dust-proof mechanisms, 21- Mounting hole, 22- expansion links, 23- fixture blocks, 61- fixed plates, 62- hinges, 63- dust excluding plates, 64- dirt-proof boots, 65- notches.
Embodiment
To be easy to understand the technical means, the inventive features, the objects and the advantages of the present invention, with reference to Embodiment, the present invention is expanded on further.
Fig. 1-Fig. 3 is referred to, the present invention provides a kind of technical scheme:A kind of test PCB for testing dual density QSFP interfaces Plate, including QSFP interfaces 1, splicing body 2, pcb board body 3, signal wire 4, SMA interfaces 5 and dust-proof mechanism 6, QSFP interfaces 1 On the downside of the upper surface of pcb board body 3, splicing body 2 is arranged on the left side of pcb board body 3, and signal wire 4 is fixed on SMA interfaces 5 upsides, SMA interfaces 5 are arranged on the upper surface centre position of pcb board body 3, and dust-proof mechanism 6 is arranged on the right side of pcb board body 3.
Splicing body 2 includes mounting hole 21, expansion link 22 and fixture block 23, and mounting hole 21 is opened in inside pcb board body 3 Left side, expansion link 22 are fixed on inside mounting hole 21, and fixture block 23 is fixed on the left side of expansion link 22, and this is designed to two pieces Pcb board body 3 is stitched together, and convenient use personnel, which assemble, to be used, and improves operating efficiency, solving original pcb board is inconvenient to spell The problem of connecing.
Dust-proof mechanism 6 includes fixed plate 61, hinge 62, dust excluding plate 63, dirt-proof boot 64 and notch 65, and fixed plate 61 is installed In the right side of pcb board body 3, hinge 62 is arranged on the right side of fixed plate 61, and dust excluding plate 63 is arranged on the upside of fixed plate 61, dust-proof Set 64 is arranged on the front end face of dust excluding plate 63, and notch 65 is opened in the right side centre position of dust excluding plate 63, and this is designed to effectively reduce Pollution of the dust to pcb board, the cleannes of pcb board are maintained, solve the problems, such as that original pcb board does not have dust reduction capability.
The inside of pcb board body 3 is provided with signalling channel, and signalling channel is provided with 16, and 16 signalling channel specification phases Together, SMA interfaces 5 are provided with 16, and 16 specifications of SMA interfaces 5 are identical, and splicing body 2 is provided with two groups, and two spellings pick The specification of structure 2 is identical, and the right side of pcb board body 3 is provided with neck, and fixture block 23 is fixedly connected by neck with pcb board body 3, hinge 62 are provided with two, and two specifications of hinge 62 are identical, and dust excluding plate 63 is rotatablely connected by two hinges 62 with fixed plate 61.
Embodiment:Staff is needing to splice two pieces of pcb board bodies 3 in use, by pulling fixture block 23, Fixture block 23 drives expansion link 22 protruding, then inserts fixture block 23 in the neck on the right side of pcb board body 3, realizes to two pieces The assembling splicing of pcb board body 3, improve the property easy to use of the present invention.
Staff is pulled upwardly dust excluding plate 63, dust excluding plate when testing dual density QSFP interfaces 1 using pcb board body 3 63 are rotated by two hinges 62, realize that dirt-proof boot 64 and SMA interfaces 5 depart from, and convenient use personnel are by data wire and SMA interfaces 5 connections, after use, dust excluding plate 63 is fallen, and the dirt-proof boot 64 of the front end face of dust excluding plate 63 is just enclosed on SMA interfaces 5, Dust-proof effect is played, ensure that will not enter dust in SMA interfaces 5, improve the service life of the present invention.
The general principle and principal character and advantages of the present invention of the present invention has been shown and described above, for this area skill For art personnel, it is clear that the invention is not restricted to the details of above-mentioned one exemplary embodiment, and without departing substantially from the present invention spirit or In the case of essential characteristic, the present invention can be realized in other specific forms.Which point therefore, no matter from the point of view of, all should incite somebody to action Embodiment regards exemplary as, and be it is nonrestrictive, the scope of the present invention by appended claims rather than on state Bright restriction, it is intended that all changes fallen in the implication and scope of the equivalency of claim are included in the present invention It is interior.Any reference in claim should not be considered as to the involved claim of limitation.
Moreover, it will be appreciated that although the present specification is described in terms of embodiments, not each embodiment is only wrapped Containing an independent technical scheme, this narrating mode of specification is only that those skilled in the art should for clarity Using specification as an entirety, the technical solutions in the various embodiments may also be suitably combined, forms those skilled in the art It is appreciated that other embodiment.

Claims (6)

1. a kind of test pcb board for testing dual density QSFP interfaces, including QSFP interfaces, splicing body, pcb board body, signal Line, SMA interfaces and dust-proof mechanism, it is characterised in that:The QSFP interfaces are arranged on the downside of pcb board upper surface, the splicing Mechanism is arranged on the left of pcb board body, and the signal wire is fixed on the upside of SMA interfaces, and the SMA interfaces are arranged on pcb board sheet Body upper surface centre position, the dust-proof mechanism are arranged on pcb board body right side;The splicing body includes mounting hole, stretched Contracting bar and fixture block, the mounting hole are opened on the left of pcb board body interior, and the expansion link is fixed on inside mounting hole, institute State fixture block and be fixed on expansion link left side;The dust-proof mechanism includes fixed plate, hinge, dust excluding plate, dirt-proof boot and notch, institute State fixed plate and be arranged on pcb board body right side, the hinge is arranged on fixed plate right side, and the dust excluding plate, which is arranged on, to be fixed On the upside of plate, the dirt-proof boot is arranged on dust excluding plate front end face, and the notch is opened in centre position on the right side of dust excluding plate.
A kind of 2. test pcb board for testing dual density QSFP interfaces according to claim 1, it is characterised in that:The PCB Plate body interior is provided with signalling channel, and the signalling channel is provided with 16, and 16 signalling channel specifications are identical.
A kind of 3. test pcb board for testing dual density QSFP interfaces according to claim 1, it is characterised in that:The SMA Interface is provided with 16, and 16 SMA interface specifications are identical.
A kind of 4. test pcb board for testing dual density QSFP interfaces according to claim 1, it is characterised in that:The spelling Connection mechanism is provided with two groups, and two spelling connection mechanism specifications are identical.
A kind of 5. test pcb board for testing dual density QSFP interfaces according to claim 1, it is characterised in that:The PCB Plate body right side is provided with neck, and the fixture block is fixedly connected by neck with pcb board.
A kind of 6. test pcb board for testing dual density QSFP interfaces according to claim 1, it is characterised in that:The conjunction Page is provided with two, and two hinge specifications are identical, and the dust excluding plate is rotatablely connected by two hinges and fixed plate.
CN201710644753.XA 2017-08-01 2017-08-01 A kind of test pcb board for testing dual density QSFP interfaces Pending CN107484335A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710644753.XA CN107484335A (en) 2017-08-01 2017-08-01 A kind of test pcb board for testing dual density QSFP interfaces

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710644753.XA CN107484335A (en) 2017-08-01 2017-08-01 A kind of test pcb board for testing dual density QSFP interfaces

Publications (1)

Publication Number Publication Date
CN107484335A true CN107484335A (en) 2017-12-15

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710644753.XA Pending CN107484335A (en) 2017-08-01 2017-08-01 A kind of test pcb board for testing dual density QSFP interfaces

Country Status (1)

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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3013851B1 (en) * 1998-12-28 2000-02-28 日本電気株式会社 Dust-proof structure of communication equipment
CN201403274Y (en) * 2009-03-24 2010-02-10 深圳市四方电气技术有限公司 Dustproof structure of electronic device
CN202634959U (en) * 2011-11-29 2012-12-26 厦门普罗太克科技有限公司 Novel dustproof anti-interference box body for UPS device circuit boards
CN103120036B (en) * 2010-09-20 2015-09-02 财路Mk株式会社 Spliced tellite
CN105592656A (en) * 2014-10-24 2016-05-18 天津市能信科技有限公司 Dust shield

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3013851B1 (en) * 1998-12-28 2000-02-28 日本電気株式会社 Dust-proof structure of communication equipment
CN201403274Y (en) * 2009-03-24 2010-02-10 深圳市四方电气技术有限公司 Dustproof structure of electronic device
CN103120036B (en) * 2010-09-20 2015-09-02 财路Mk株式会社 Spliced tellite
CN202634959U (en) * 2011-11-29 2012-12-26 厦门普罗太克科技有限公司 Novel dustproof anti-interference box body for UPS device circuit boards
CN105592656A (en) * 2014-10-24 2016-05-18 天津市能信科技有限公司 Dust shield

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Application publication date: 20171215

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