CN107450173B - A Mirau-type wide-field interference microscope objective optical system - Google Patents

A Mirau-type wide-field interference microscope objective optical system Download PDF

Info

Publication number
CN107450173B
CN107450173B CN201710528486.XA CN201710528486A CN107450173B CN 107450173 B CN107450173 B CN 107450173B CN 201710528486 A CN201710528486 A CN 201710528486A CN 107450173 B CN107450173 B CN 107450173B
Authority
CN
China
Prior art keywords
lens
plate
optical system
curvature radius
spherical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201710528486.XA
Other languages
Chinese (zh)
Other versions
CN107450173A (en
Inventor
袁群
别枢佑
高志山
王帅
胡捷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing University of Science and Technology
Original Assignee
Nanjing University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing University of Science and Technology filed Critical Nanjing University of Science and Technology
Priority to CN201710528486.XA priority Critical patent/CN107450173B/en
Publication of CN107450173A publication Critical patent/CN107450173A/en
Application granted granted Critical
Publication of CN107450173B publication Critical patent/CN107450173B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/02Objectives
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2441Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B13/00Optical objectives specially designed for the purposes specified below
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/0004Microscopes specially adapted for specific applications

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Lenses (AREA)

Abstract

The invention discloses a Mirau type wide-field interference microscope objective optical system. The system comprises a first lens, a second lens, a third lens, a fourth lens, a fifth lens, a sixth lens, a seventh lens, an eighth lens, a reference plate and a light splitting plate which are sequentially arranged along the same optical axis; the illumination light passes through the first lens, the second lens, the third lens, the fourth lens and the fourth lens in sequence, the illumination light is divided into two beams at the light splitting plate, one beam is incident on the surface of the reference flat plate and returns, the other beam is incident on the surface of the piece to be detected and returns, the two beams of emission light are overlapped at the light splitting plate and then interfere, and the microscopic characteristics of the piece to be detected are analyzed according to the generated interference fringes. The system has the magnification of 0.5X, the numerical aperture of 0.015, the diameter of an entrance pupil of 12 mm, the focal length of 400 mm, the parfocal distance of 280 mm and the visual field of 48 mm. The optical system has simple structure and good imaging quality, is suitable for a coherent scanning interferometry, and can be used for measuring the three-dimensional morphology of a rough surface.

Description

一种Mirau型宽视场干涉显微物镜光学系统A Mirau-type wide-field interference microscope objective optical system

技术领域technical field

本发明属于显微物镜光学系统设计领域,一种Mirau型宽视场干涉显微物镜光学系统。The invention belongs to the design field of a microscope objective lens optical system, and relates to a Mirau type wide field of view interference microscope objective lens optical system.

背景技术Background technique

干涉显微物镜主要应用于微观表面三维形貌测量中,如工业和科研领域常用的非接触式轮廓仪,就需要配各种倍率的干涉显微物镜来使用。在2/3”CCD时、筒镜为1X时,2.5X的干涉显微物镜的线视场为9.3mm,10X干涉显微物镜的线视场为0.58mm,20X干涉显微物镜的线视场为0.15mm,50X干涉显微物镜的线视场为0.023mm,100X干涉显微物镜的线视场为0.0009mm。通常情况下,放大倍率越低,视场越大,因此,低倍的干涉显微物镜通常具有更大的视场。干涉显微物镜的主要结构有Linnik型,Mirau型和Michelson型三种。Linnik型由于由于需要两个完全相等的分光棱镜,所占空间大,成本高,一般仅用于高倍率的干涉显微物镜。Interference microscope objectives are mainly used in the measurement of three-dimensional topography of microscopic surfaces. For example, non-contact profilers commonly used in industry and scientific research fields need to be equipped with interference microscope objectives of various magnifications. When the CCD is 2/3" and the tube lens is 1X, the line field of view of 2.5X interference microscope objective is 9.3mm, the line field of 10X interference microscope objective is 0.58mm, and the line field of 20X interference microscope objective is 0.58mm. The field is 0.15mm, the line field of view of the 50X interference microscope objective is 0.023mm, and the line field of view of the 100X interference microscope objective is 0.0009mm. Generally, the lower the magnification, the larger the field of view, so the lower magnification The interference microscope objective usually has a larger field of view. The main structure of the interference microscope objective has three types: Linnik type, Mirau type and Michelson type. The Linnik type occupies a large space and costs due to the need for two completely equal beam splitting prisms. High, generally only used for high-magnification interference microscope objectives.

Mirau型在放大倍率低于10X时,由于中心遮拦的存在,阻挡了太多的光,影响成像效果。J.F.Biegen在1988年美国光学学会年会中发表了“New developments in Mirauinterferometry”的演讲,提出了一种解决方案是使用偏振元件去控制通过参考平板表面透明部分的光的传输量,这就是无遮拦Mirau型物镜。但是偏振元件使得设计更复杂,更加难以去补偿色散,同时还会引入由于偏振效应所带来的灵敏性问题。When the magnification of Mirau is lower than 10X, too much light is blocked due to the existence of central occlusion, which affects the imaging effect. J.F.Biegen gave a speech on "New developments in Mirauinterferometry" at the 1988 Optical Society of America Annual Meeting, and proposed a solution to use polarizing elements to control the amount of light transmitted through the transparent part of the reference plate surface, which is unobstructed Mirau-type objectives. But polarizing elements make the design more complicated, make it more difficult to compensate for dispersion, and also introduce sensitivity issues due to polarization effects.

目前市面上所生产的低倍的干涉显微物镜主要是Michelson型干涉显微物镜。但是,由于显微物镜放大倍率越小,工作距离越大,在设计小于2X的干涉显微物镜时,Michelson型结构由于分光棱镜和离轴参考光路正交,其所对应的机械结构所占空间太大,并不实用。T.Dresel等人在发表于AO的文章“Three-dimensional sensing of roughsurface by coherence radar”中提出,在视场大于10mm时,Michelson型干涉显微物镜过大的机械结构使其仅可用于特定在干涉仪,且不可灵活得切换其它的物镜,并不可取。The low-magnification interference microscope objectives currently produced on the market are mainly Michelson-type interference microscope objectives. However, since the magnification of the microscope objective is smaller and the working distance is larger, when designing an interference microscope objective less than 2X, the Michelson-type structure occupies space due to the orthogonality between the beam splitter prism and the off-axis reference optical path. too large to be practical. In the article "Three-dimensional sensing of roughsurface by coherence radar" published in AO, T. Dresel et al. proposed that when the field of view is larger than 10mm, the mechanical structure of the Michelson-type interference microscope objective lens is too large, so that it can only be used in specific areas. interferometers, and the inflexibility to switch other objectives is not desirable.

发明内容SUMMARY OF THE INVENTION

本发明的目的在于提供一种结构简单、成像质量好的Mirau型宽视场干涉显微物镜光学系统。The purpose of the present invention is to provide a Mirau type wide field of view interference microscope objective lens optical system with simple structure and good imaging quality.

实现本发明目的的技术解决方案为:一种Mirau型宽视场干涉显微物镜光学系统,包括沿同一光轴从左向右排列的第一透镜、第二透镜、第三透镜、第四透镜、第五透镜、第六透镜、第七透镜、第八透镜、参考板和分光板;The technical solution to achieve the purpose of the present invention is: a Mirau type wide-field interference microscope objective optical system, comprising a first lens, a second lens, a third lens, and a fourth lens arranged from left to right along the same optical axis , the fifth lens, the sixth lens, the seventh lens, the eighth lens, the reference plate and the beam splitter plate;

照明光依次通过第一透镜、第二透镜、第三透镜、第四透镜、第五透镜、第六透镜、第七透镜、第八透镜和参考板,在分光板处被分为两束,一束入射到参考平板表面返回,另一束入射到待测件表面返回,两束发射光在分光板处重合后发生干涉,根据产生的干涉条纹分析待测件的微观特性。The illumination light passes through the first lens, the second lens, the third lens, the fourth lens, the fifth lens, the sixth lens, the seventh lens, the eighth lens and the reference plate in sequence, and is divided into two beams at the beam splitter, one is The beam is incident on the surface of the reference plate and returns, and the other beam is incident on the surface of the DUT and returns. The two emitted beams overlap at the beam splitter and interfere, and the microscopic characteristics of the DUT are analyzed according to the generated interference fringes.

进一步地,所述第一透镜与第二透镜为双胶合透镜,第三透镜与第四透镜为双胶合透镜,第五透镜与第六透镜为双胶合透镜。Further, the first lens and the second lens are doublet lenses, the third lens and the fourth lens are doublet lenses, and the fifth lens and the sixth lens are doublet lenses.

进一步地,所述第一透镜的口径为14毫米,中心厚为2.5毫米,左右两个表面均为球面,左球面曲率半径为27.15毫米,右球面曲率半径为-51.30毫米,采用的玻璃牌号为H-BAK2;第二透镜的口径为14毫米,中心厚为2.0毫米,左右两个表面均为球面,左球面曲率半径为-51.30毫米,右球面曲率半径为327.14毫米,采用的玻璃牌号为H-LAK7A;第三透镜的口径为12毫米,中心厚为2.5毫米,左右两个表面均为球面,左球面曲率半径为-97.36毫米,右球面曲率半径为-12.30毫米,采用的玻璃牌号为H-FK61;第四透镜的口径为12毫米,中心厚为2毫米,左右两个表面均为球面,左球面曲率半径为-12.30毫米,右球面曲率半径为-890.55毫米,采用的玻璃牌号为H-ZLAF76;第五透镜的口径为20毫米,中心厚为3毫米,左右两个表面均为球面,左球面曲率半径为-36.13毫米,右球面曲率半径为21.02毫米,采用的玻璃牌号为F6;第六透镜的口径为20毫米,中心厚为4毫米,左右两个表面均为球面,左球面曲率半径为21.02毫米,右球面曲率半径为90.67毫米,采用的玻璃牌号为H-ZBAF4;第七透镜的口径为54毫米,中心厚为6毫米,左右两个表面均为球面,左球面曲率半径为-88.51毫米,右球面曲率半径为-44.10毫米,采用的玻璃牌号为H-ZK21;第八透镜的口径为58毫米,中心厚为6毫米,左右两个表面均为球面,左球面曲率半径为232.69毫米,右球面曲率半径为-232.69毫米,采用的玻璃牌号为H-ZF5;参考板为一圆形光学平板,其直径为60毫米,厚度为8毫米,采用的玻璃材料为融石英;分光板为一圆形光学平板,其直径为60毫米,厚度为8毫米,采用的玻璃材料为融石英;Further, the diameter of the first lens is 14 mm, the center thickness is 2.5 mm, the left and right surfaces are spherical, the left spherical curvature radius is 27.15 mm, the right spherical curvature radius is -51.30 mm, and the glass grade used is H-BAK2; the diameter of the second lens is 14 mm, the center thickness is 2.0 mm, the left and right surfaces are spherical, the left spherical curvature radius is -51.30 mm, and the right spherical curvature radius is 327.14 mm, the glass used is H -LAK7A; the diameter of the third lens is 12 mm, the center thickness is 2.5 mm, the left and right surfaces are spherical, the left spherical curvature radius is -97.36 mm, and the right spherical curvature radius is -12.30 mm, the glass grade used is H -FK61; the diameter of the fourth lens is 12 mm, the center thickness is 2 mm, the left and right surfaces are spherical, the curvature radius of the left spherical surface is -12.30 mm, and the right spherical curvature radius is -890.55 mm. The glass used is H -ZLAF76; the aperture of the fifth lens is 20 mm, the center thickness is 3 mm, the left and right surfaces are spherical, the left spherical curvature radius is -36.13 mm, the right spherical curvature radius is 21.02 mm, the glass grade used is F6; The diameter of the sixth lens is 20 mm, the center thickness is 4 mm, the left and right surfaces are spherical, the left spherical curvature radius is 21.02 mm, and the right spherical curvature radius is 90.67 mm. The glass used is H-ZBAF4; the seventh lens is H-ZBAF4; The diameter of the lens is 54 mm, the center thickness is 6 mm, the left and right surfaces are spherical, the left spherical curvature radius is -88.51 mm, and the right spherical curvature radius is -44.10 mm. The glass used is H-ZK21; the eighth The diameter of the lens is 58 mm, the center thickness is 6 mm, the left and right surfaces are spherical, the left spherical curvature radius is 232.69 mm, and the right spherical curvature radius is -232.69 mm. The glass used is H-ZF5; the reference plate is A circular optical flat plate with a diameter of 60 mm and a thickness of 8 mm, the glass material used is fused silica; the beam splitter plate is a circular optical flat plate with a diameter of 60 mm and a thickness of 8 mm, and the glass material used is fused silica;

所述第二透镜与第三透镜的空气间隔为40.2毫米,第四透镜与第五透镜的空气间隔为31.04毫米,第六透镜与第七透镜的空气间隔为38.56毫米,第七透镜与第八透镜的空气间隔为0.2毫米,第八透镜与参考板的空气间隔为8毫米,参考板与分光板的空气间隔为58毫米。The air space between the second lens and the third lens is 40.2 mm, the air space between the fourth lens and the fifth lens is 31.04 mm, the air space between the sixth lens and the seventh lens is 38.56 mm, and the air space between the seventh lens and the eighth lens is 38.56 mm. The air space between the lenses is 0.2 mm, the air space between the eighth lens and the reference plate is 8 mm, and the air space between the reference plate and the beam splitter is 58 mm.

进一步地,所述参考板倾斜角度为3°。Further, the inclination angle of the reference plate is 3°.

进一步地,所述参考板上表面镀消偏振分光膜,透射比与反射比为85%∶15%。Further, the surface of the reference plate is coated with a depolarization beam splitting film, and the transmittance and reflectance ratios are 85%:15%.

进一步地,所述参考板位于第八透镜一侧表面的表面粗糙度Ra值优于0.2纳米,位于分光板一侧表面的表面粗糙度Ra值优于0.5纳米。Further, the surface roughness Ra value of the surface of the reference plate on one side of the eighth lens is better than 0.2 nm, and the surface roughness Ra value of the surface on the side of the beam splitter plate is better than 0.5 nm.

进一步地,所述分光板的倾斜角度为1.5°。Further, the inclination angle of the beam splitter plate is 1.5°.

进一步地,所述分光板的表面镀消偏振分光膜,透射比与反射比为50%∶50%。Further, the surface of the beam splitter plate is coated with a depolarization beam splitter film, and the transmittance and reflection ratio are 50%:50%.

进一步地,所述分光板表面的表面粗糙度Ra值优于0.5纳米。Further, the surface roughness Ra value of the surface of the beam splitter plate is better than 0.5 nm.

进一步地,其特征在于,该干涉显微物镜光学系统的数值孔径为0.015,入瞳直径为12毫米,焦距为400毫米,齐焦距离为280毫米,工作距离为58毫米,线视场为48毫米,采用部分通光平板形成了无遮拦Mirau型结构,通过参考板、分光板的倾斜,使不参与干涉的反射光束离轴。Further, it is characterized in that the numerical aperture of the optical system of the interference microscope objective lens is 0.015, the entrance pupil diameter is 12 mm, the focal length is 400 mm, the parfocal distance is 280 mm, the working distance is 58 mm, and the line field of view is 48 mm. mm, using a partially transparent flat plate to form an unobstructed Mirau structure, through the inclination of the reference plate and the beam splitter plate, the reflected beam that does not participate in the interference is off-axis.

本发明与现有技术相比,其显著优点为:(1)采用了部分通光平板,没有中心遮拦,同时参考板和分光板的倾斜使不参与干涉的反射光束离轴,形成完全的双光束干涉,从而可获得高的条纹对比度;(2)数值孔径为0.015,入瞳直径为12毫米,焦距为400毫米,齐焦距离为280毫米,工作距离为58毫米,线视场为48毫米,成像质量优异,成像质量接近衍射极限;(3)结构简单、使用光学元件少、成本低,适用于相干扫描干涉法,可用于测量粗糙表面的三维形貌。Compared with the prior art, the present invention has the following significant advantages: (1) a partial light-transmitting flat plate is used, and there is no central blocking; at the same time, the inclination of the reference plate and the beam splitter plate makes the reflected beam that does not participate in the interference off-axis, forming a complete dual beam interference, so that high fringe contrast can be obtained; (2) the numerical aperture is 0.015, the entrance pupil diameter is 12 mm, the focal length is 400 mm, the parfocal distance is 280 mm, the working distance is 58 mm, and the line field of view is 48 mm , the imaging quality is excellent, and the imaging quality is close to the diffraction limit; (3) the structure is simple, the use of optical components is low, and the cost is low. It is suitable for coherent scanning interferometry and can be used to measure the three-dimensional topography of rough surfaces.

附图说明Description of drawings

图1为本发明Mirau型宽视场干涉显微物镜光学系统的结构示意图。FIG. 1 is a schematic structural diagram of the optical system of the Mirau type wide-field interference microscope objective lens according to the present invention.

图2为本发明Mirau型宽视场干涉显微物镜光学系统的光路示意图。FIG. 2 is a schematic diagram of the optical path of the optical system of the Mirau type wide-field interference microscope objective lens according to the present invention.

图3为本发明Mirau型宽视场干涉显微物镜光学系统的传递函数曲线图。FIG. 3 is a transfer function curve diagram of the Mirau type wide-field interference microscope objective lens optical system of the present invention.

图4为本发明Mirau型宽视场干涉显微物镜光学系统的波像差曲线图。FIG. 4 is a wave aberration curve diagram of the Mirau type wide-field interference microscope objective lens optical system of the present invention.

图5为本发明Mirau型宽视场干涉显微物镜光学系统的场曲/畸变曲线图。FIG. 5 is a field curvature/distortion curve diagram of the Mirau type wide-field interference microscope objective lens optical system of the present invention.

图6为本发明Mirau型宽视场干涉显微物镜光学系统的垂轴像差曲线图。FIG. 6 is a vertical axis aberration curve diagram of the Mirau type wide-field interference microscope objective lens optical system of the present invention.

具体实施方式Detailed ways

本发明的干涉显微物镜光学系统的放大倍率为0.5X,数值孔径为0.015,入瞳直径为12毫米,焦距为400毫米,齐焦距离为280毫米,视场可达48毫米。本发明的0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜类似于Mirau型,区别在于采用了部分通光平板,没有中心遮拦,同时,参考板和分光板的倾斜使那些不参与干涉的反射光束离轴,形成完全的双光束干涉,从而可获得高的条纹对比度,其光学系统结构简单,成像质量好,适用于相干扫描干涉法,可用于测量粗糙表面的三维形貌。The optical system of the interference microscope objective lens of the invention has a magnification of 0.5X, a numerical aperture of 0.015, an entrance pupil diameter of 12 mm, a focal length of 400 mm, a parfocal distance of 280 mm, and a field of view of 48 mm. The 0.5 times non-polarized and unobstructed Mirau type wide-field interference microscope objective of the present invention is similar to the Mirau type, the difference lies in that a part of the transparent plate is used, and there is no central obstructing. The reflected beam is off-axis to form complete double-beam interference, so that high fringe contrast can be obtained.

如图1所示,本发明Mirau型宽视场干涉显微物镜光学系统,包括沿同一光轴从左向右排列的第一透镜1、第二透镜2、第三透镜3、第四透镜4、第五透镜5、第六透镜6、第七透镜7、第八透镜8、参考板9和分光板10;As shown in FIG. 1 , the Mirau type wide-field interference microscope objective optical system of the present invention includes a first lens 1 , a second lens 2 , a third lens 3 , and a fourth lens 4 arranged from left to right along the same optical axis , the fifth lens 5, the sixth lens 6, the seventh lens 7, the eighth lens 8, the reference plate 9 and the beam splitter plate 10;

照明光依次通过第一透镜1、第二透镜2、第三透镜3、第四透镜4、第五透镜5、第六透镜6、第七透镜7、第八透镜8和参考板9,在分光板10处被分为两束,一束入射到参考平板表面返回,另一束入射到待测件表面返回,两束发射光在分光板10处重合后发生干涉,根据产生的干涉条纹分析待测件的微观特性。The illumination light passes through the first lens 1, the second lens 2, the third lens 3, the fourth lens 4, the fifth lens 5, the sixth lens 6, the seventh lens 7, the eighth lens 8 and the reference plate 9 in sequence, The plate 10 is divided into two beams, one beam is incident on the surface of the reference plate and returns, and the other beam is incident on the surface of the DUT and returns. The two beams of emitted light overlap and interfere at the beam splitter plate 10. Microscopic properties of the test piece.

进一步地,所述第一透镜1与第二透镜2为双胶合透镜,第三透镜3与第四透镜4为双胶合透镜,第五透镜5与第六透镜6为双胶合透镜。Further, the first lens 1 and the second lens 2 are doublet lenses, the third lens 3 and the fourth lens 4 are doublet lenses, and the fifth lens 5 and the sixth lens 6 are doublet lenses.

结合表1,所述第一透镜1的口径为14毫米,中心厚为2.5毫米,左右两个表面均为球面,左球面曲率半径为27.15毫米,右球面曲率半径为-51.30毫米,采用的玻璃牌号为H-BAK2;第二透镜2的口径为14毫米,中心厚为2.0毫米,左右两个表面均为球面,左球面曲率半径为-51.30毫米,右球面曲率半径为327.14毫米,采用的玻璃牌号为H-LAK7A;第三透镜3的口径为12毫米,中心厚为2.5毫米,左右两个表面均为球面,左球面曲率半径为-97.36毫米,右球面曲率半径为-12.30毫米,采用的玻璃牌号为H-FK61;第四透镜4的口径为12毫米,中心厚为2毫米,左右两个表面均为球面,左球面曲率半径为-12.30毫米,右球面曲率半径为-890.55毫米,采用的玻璃牌号为H-ZLAF76;第五透镜5的口径为20毫米,中心厚为3毫米,左右两个表面均为球面,左球面曲率半径为-36.13毫米,右球面曲率半径为21.02毫米,采用的玻璃牌号为F6;第六透镜6的口径为20毫米,中心厚为4毫米,左右两个表面均为球面,左球面曲率半径为21.02毫米,右球面曲率半径为90.67毫米,采用的玻璃牌号为H-ZBAF4;第七透镜7的口径为54毫米,中心厚为6毫米,左右两个表面均为球面,左球面曲率半径为-88.51毫米,右球面曲率半径为-44.10毫米,采用的玻璃牌号为H-ZK21;第八透镜8的口径为58毫米,中心厚为6毫米,左右两个表面均为球面,左球面曲率半径为232.69毫米,右球面曲率半径为-232.69毫米,采用的玻璃牌号为H-ZF5;参考板9为一圆形光学平板,其直径为60毫米,厚度为8毫米,采用的玻璃材料为融石英;分光板10为一圆形光学平板,其直径为60毫米,厚度为8毫米,采用的玻璃材料为融石英;Combining with Table 1, the first lens 1 has a diameter of 14 mm, a center thickness of 2.5 mm, both left and right surfaces are spherical, the left spherical curvature radius is 27.15 mm, and the right spherical curvature radius is -51.30 mm. The grade is H-BAK2; the diameter of the second lens 2 is 14 mm, the center thickness is 2.0 mm, the left and right surfaces are spherical, the left spherical curvature radius is -51.30 mm, and the right spherical curvature radius is 327.14 mm. The grade is H-LAK7A; the diameter of the third lens 3 is 12 mm, the center thickness is 2.5 mm, the left and right surfaces are spherical, the left spherical curvature radius is -97.36 mm, and the right spherical curvature radius is -12.30 mm. The glass grade is H-FK61; the diameter of the fourth lens 4 is 12 mm, the center thickness is 2 mm, the left and right surfaces are spherical, the left spherical curvature radius is -12.30 mm, and the right spherical curvature radius is -890.55 mm. The glass grade is H-ZLAF76; the aperture of the fifth lens 5 is 20 mm, the center thickness is 3 mm, the left and right surfaces are spherical, the left spherical curvature radius is -36.13 mm, and the right spherical curvature radius is 21.02 mm. The glass grade is F6; the diameter of the sixth lens 6 is 20 mm, the center thickness is 4 mm, the left and right surfaces are spherical, the left spherical curvature radius is 21.02 mm, and the right spherical curvature radius is 90.67 mm. It is H-ZBAF4; the aperture of the seventh lens 7 is 54 mm, the center thickness is 6 mm, the left and right surfaces are spherical, the left spherical curvature radius is -88.51 mm, and the right spherical curvature radius is -44.10 mm. The grade is H-ZK21; the diameter of the eighth lens 8 is 58 mm, the center thickness is 6 mm, the left and right surfaces are spherical, the left spherical curvature radius is 232.69 mm, and the right spherical curvature radius is -232.69 mm. The grade is H-ZF5; the reference plate 9 is a circular optical flat plate with a diameter of 60 mm and a thickness of 8 mm, and the glass material used is fused silica; the beam splitter plate 10 is a circular optical flat plate with a diameter of 60 mm , the thickness is 8 mm, and the glass material used is fused silica;

所述第二透镜2与第三透镜3的空气间隔为40.2毫米,第四透镜4与第五透镜5的空气间隔为31.04毫米,第六透镜6与第七透镜7的空气间隔为38.56毫米,第七透镜7与第八透镜8的空气间隔为0.2毫米,第八透镜8与参考板9的空气间隔为8毫米,参考板9与分光板10的空气间隔为58毫米。The air space between the second lens 2 and the third lens 3 is 40.2 mm, the air space between the fourth lens 4 and the fifth lens 5 is 31.04 mm, and the air space between the sixth lens 6 and the seventh lens 7 is 38.56 mm, The air interval between the seventh lens 7 and the eighth lens 8 is 0.2 mm, the air interval between the eighth lens 8 and the reference plate 9 is 8 mm, and the air interval between the reference plate 9 and the beam splitter plate 10 is 58 mm.

表1Table 1

Figure BDA0001338891190000051
Figure BDA0001338891190000051

作为一种具体示例,所述参考板9倾斜角度为3°。As a specific example, the inclination angle of the reference plate 9 is 3°.

作为一种具体示例,所述参考板9上表面镀消偏振分光膜,透射比与反射比为85%∶15%。As a specific example, the upper surface of the reference plate 9 is coated with a depolarization beam splitter film, and the transmittance to reflectance ratio is 85%:15%.

作为一种具体示例,所述参考板9位于第八透镜8一侧表面的表面粗糙度Ra值优于0.2纳米,位于分光板10一侧表面的表面粗糙度Ra值优于0.5纳米。As a specific example, the surface roughness Ra value of the surface of the reference plate 9 on the side of the eighth lens 8 is better than 0.2 nm, and the surface roughness Ra value of the surface on the side of the beam splitter plate 10 is better than 0.5 nm.

作为一种具体示例,所述分光板10的倾斜角度为1.5°。As a specific example, the inclination angle of the beam splitter plate 10 is 1.5°.

作为一种具体示例,所述分光板10的表面镀消偏振分光膜,透射比与反射比为50%∶50%。As a specific example, the surface of the beam splitter plate 10 is coated with a depolarization beam splitter film, and the transmittance ratio and the reflectance ratio are 50%:50%.

作为一种具体示例,所述分光板10表面的表面粗糙度Ra值优于0.5纳米。As a specific example, the surface roughness Ra value of the surface of the beam splitter plate 10 is better than 0.5 nm.

作为一种具体示例,该干涉显微物镜光学系统的数值孔径为0.015,入瞳直径为12毫米,焦距为400毫米,齐焦距离为280毫米,工作距离为58毫米,线视场为48毫米,采用部分通光平板形成了无遮拦Mirau型结构,通过参考板9、分光板10的倾斜,使不参与干涉的反射光束离轴。As a specific example, the optical system of the interference microscope objective has a numerical aperture of 0.015, an entrance pupil diameter of 12 mm, a focal length of 400 mm, a parfocal distance of 280 mm, a working distance of 58 mm, and a line field of view of 48 mm , a partially transparent flat plate is used to form an unobstructed Mirau structure, and the reflected beam that does not participate in the interference is off-axis through the inclination of the reference plate 9 and the beam splitter plate 10 .

本发明所述光学系统为无限共轭距光学系统,工作时需平行光入射照明。The optical system of the present invention is an optical system with infinite conjugate distance, and parallel light is required for incident illumination during operation.

结合图2,0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统其工作原理是平行光照明,照明光依次通过第一透镜1、第二透镜2、第三透镜3、第四透镜4、第五透镜5、第六透镜6、第七透镜7、第八透镜8和参考板9,在分光板10处被分为两束,一束入射到参考平板表面返回,另一束入射到待测件表面返回,两束光在分光板处重合后发生干涉,根据其产生的干涉条纹,可以分析待测件的微观特性。Combined with Figure 2, the working principle of the 0.5x unpolarized and unobstructed Mirau type wide-field interference microscope objective lens optical system is parallel light illumination, and the illumination light passes through the first lens 1, the second lens 2, the third lens 3, the fourth lens in turn The lens 4, the fifth lens 5, the sixth lens 6, the seventh lens 7, the eighth lens 8 and the reference plate 9 are divided into two beams at the beam splitter plate 10, one beam is incident on the surface of the reference plate and returns, the other beam When it is incident on the surface of the DUT and returns, the two beams of light overlap at the beam splitter and interfere, and the microscopic characteristics of the DUT can be analyzed according to the interference fringes generated.

图3为本发明0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统的传递函数曲线图,如图可以看出传递函数在0视场、0.707视场和全视场,光学传递函数在20线对/毫米时,均大于0.4以上。Fig. 3 is the transfer function curve diagram of the 0.5 times non-polarized unobstructed Mirau type wide field of view interference microscope optical system of the present invention. It can be seen from the figure that the transfer function is in 0 field of view, 0.707 field of view and full field of view. The function is greater than 0.4 when the function is 20 line pairs/mm.

图4为本发明0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统的波像差曲线图,图中可见,波长在486nm~656nm波段范围内,全视场范围内均优于衍射极限。Fig. 4 is the wave aberration curve diagram of the optical system of the 0.5 times non-polarized and unobstructed Mirau type wide-field interference microscope objective lens according to the present invention. It can be seen from the figure that the wavelength is in the range of 486nm to 656nm, and the whole field of view is better than Diffraction limit.

图5为本发明0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统的场曲/畸变曲线图,从图中可见整个系统的最大光学畸变小于0.05%。5 is a field curvature/distortion curve diagram of the 0.5 times unpolarized unobstructed Mirau type wide-field interference microscope objective lens optical system of the present invention, and it can be seen from the figure that the maximum optical distortion of the entire system is less than 0.05%.

图6为本发明0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统的垂轴像差曲线图,图中纵坐标最大值为±50微米,波长在486nm—656nm范围内,各色光曲线形状相似,偏差最大值控制在20微米以内。Fig. 6 is the vertical axis aberration curve diagram of the 0.5 times non-polarized and unobstructed Mirau type wide-field interference microscope objective lens optical system of the present invention, the maximum value of the ordinate in the figure is ±50 microns, the wavelength is in the range of 486nm-656nm, each color The shape of the light curve is similar, and the maximum deviation is controlled within 20 microns.

本发明0.5倍非偏振无遮拦Mirau型宽视场干涉显微物镜光学系统可在可见光波段(486nm~656nm)范围内工作,其数值孔径为0.015,入瞳直径为12毫米,焦距为400毫米,齐焦距离为280毫米,工作距离为58毫米,线视场为48毫米,成像质量优异,成像质量接近衍射极限。The 0.5 times non-polarized and unobstructed Mirau type wide-field interference microscope objective lens optical system of the invention can work in the visible light band (486nm-656nm), the numerical aperture is 0.015, the entrance pupil diameter is 12 mm, and the focal length is 400 mm. The parfocal distance is 280mm, the working distance is 58mm, the line field of view is 48mm, and the imaging quality is excellent, and the imaging quality is close to the diffraction limit.

Claims (8)

1. The Mirau type wide-field interference microscope objective optical system is characterized by comprising a first lens (1), a second lens (2), a third lens (3), a fourth lens (4), a fifth lens (5), a sixth lens (6), a seventh lens (7), an eighth lens (8), a reference plate (9) and a beam splitter plate (10) which are arranged from left to right along the same optical axis;
the illumination light sequentially passes through a first lens (1), a second lens (2), a third lens (3), a fourth lens (4), a fifth lens (5), a sixth lens (6), a seventh lens (7), an eighth lens (8) and a reference plate (9), the illumination light is divided into two beams at a beam splitter plate (10), one beam is incident on the surface of the reference plate and returns, the other beam is incident on the surface of the piece to be measured and returns, the two beams of emission light are overlapped at the beam splitter plate (10) and then interfere with each other, and the microscopic characteristics of the piece to be measured are analyzed according to the generated interference fringes;
the aperture of the first lens (1) is 14 mm, the center thickness is 2.5 mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is 27.15 mm, the curvature radius of the right spherical surface is-51.30 mm, and the adopted glass brand is H-BAK 2; the aperture of the second lens (2) is 14 mm, the center thickness is 2.0 mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is-51.30 mm, the curvature radius of the right spherical surface is 327.14 mm, and the adopted glass brand is H-LAK 7A; the aperture of the third lens (3) is 12 mm, the center thickness is 2.5 mm, the left surface and the right surface are both spherical surfaces, the radius of curvature of the left spherical surface is-97.36 mm, the radius of curvature of the right spherical surface is-12.30 mm, and the adopted glass brand is H-FK 61; the aperture of the fourth lens (4) is 12 mm, the center thickness is 2 mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is-12.30 mm, the curvature radius of the right spherical surface is-890.55 mm, and the adopted glass brand is H-ZLAF 76; the aperture of the fifth lens (5) is 20 mm, the center thickness is 3mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is-36.13 mm, the curvature radius of the right spherical surface is 21.02 mm, and the adopted glass brand is F6; the aperture of the sixth lens (6) is 20 mm, the center thickness is 4 mm, the left surface and the right surface are both spherical surfaces, the radius of curvature of the left spherical surface is 21.02 mm, the radius of curvature of the right spherical surface is 90.67 mm, and the adopted glass brand is H-ZBAF 4; the aperture of the seventh lens (7) is 54 mm, the center thickness is 6 mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is-88.51 mm, the curvature radius of the right spherical surface is-44.10 mm, and the adopted glass brand is H-ZK 21; the caliber of the eighth lens (8) is 58mm, the center thickness is 6 mm, the left surface and the right surface are both spherical surfaces, the curvature radius of the left spherical surface is 232.69 mm, the curvature radius of the right spherical surface is-232.69 mm, and the adopted glass brand is H-ZF 5; the reference plate (9) is a circular optical flat plate, the diameter of the reference plate is 60 mm, the thickness of the reference plate is 8mm, and the adopted glass material is fused quartz; the light splitting plate (10) is a circular optical flat plate, the diameter of the light splitting plate is 60 mm, the thickness of the light splitting plate is 8mm, and the adopted glass material is fused quartz;
the air space between the second lens (2) and the third lens (3) is 40.2 mm, the air space between the fourth lens (4) and the fifth lens (5) is 31.04 mm, the air space between the sixth lens (6) and the seventh lens (7) is 38.56 mm, the air space between the seventh lens (7) and the eighth lens (8) is 0.2 mm, the air space between the eighth lens (8) and the reference plate (9) is 8mm, and the air space between the reference plate (9) and the beam splitter plate (10) is 58 mm;
the first lens (1) and the second lens (2) are double-cemented lenses, the third lens (3) and the fourth lens (4) are double-cemented lenses, and the fifth lens (5) and the sixth lens (6) are double-cemented lenses.
2. Mirau-type wide-field interference microscope objective optical system according to claim 1, characterized in that the reference plate (9) is tilted at an angle of 3 °.
3. The Mirau wide-field interference microscope objective optical system according to claim 1, wherein the reference plate (9) is coated with a depolarizing beam splitting film on the upper surface, and the transmission ratio and the reflection ratio are 85% to 15%.
4. Mirau-type wide-field interference microscope objective optical system according to claim 1, characterized in that the reference plate (9) has a surface roughness Ra value of better than 0.2 nm on the side of the eighth lens (8) and a surface roughness Ra value of better than 0.5 nm on the side of the beam splitter plate (10).
5. Mirau-type wide-field interference microscope objective optical system according to claim 1, characterized in that the inclination angle of the beam splitter plate (10) is 1.5 °.
6. The Mirau wide-field interference microscope objective optical system according to claim 1, wherein the surface of the beam splitter plate (10) is plated with a depolarizing beam splitter film, and the transmission ratio and the reflection ratio are 50% to 50%.
7. Mirau-type wide-field interference microscope objective optical system according to claim 1, characterized in that the surface roughness Ra value of the surface of the beam splitter plate (10) is better than 0.5 nm.
8. Mirau-type wide-field interference microobjective optical system according to any of the preceding claims, characterized in that the interference microobjective optical system has a numerical aperture of 0.015, an entrance pupil diameter of 12 mm, a focal length of 400 mm, a parfocal distance of 280 mm, a working distance of 58mm, and a line field of view of 48 mm, and uses a partially transparent flat plate to form an unblanked Mirau-type structure, and the reflected light beams not participating in interference are off-axis by the inclination of the reference plate (9) and the splitting plate (10).
CN201710528486.XA 2017-07-01 2017-07-01 A Mirau-type wide-field interference microscope objective optical system Active CN107450173B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201710528486.XA CN107450173B (en) 2017-07-01 2017-07-01 A Mirau-type wide-field interference microscope objective optical system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201710528486.XA CN107450173B (en) 2017-07-01 2017-07-01 A Mirau-type wide-field interference microscope objective optical system

Publications (2)

Publication Number Publication Date
CN107450173A CN107450173A (en) 2017-12-08
CN107450173B true CN107450173B (en) 2020-06-09

Family

ID=60487670

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710528486.XA Active CN107450173B (en) 2017-07-01 2017-07-01 A Mirau-type wide-field interference microscope objective optical system

Country Status (1)

Country Link
CN (1) CN107450173B (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110596878B (en) * 2019-10-14 2021-11-16 南京大学 Double-lens microscope system with ultra-short focal length
CN114923435B (en) * 2022-04-29 2024-06-07 南京理工大学 Cylindrical micro-interference device for measuring phase tomography information of micro-column optical components
CN115031623A (en) * 2022-05-12 2022-09-09 中国电子科技集团公司第十一研究所 A white light interference microscope objective
CN119148371B (en) * 2024-08-21 2025-05-30 江苏信息职业技术学院 Large scanning field large image space numerical aperture interference objective lens for flying spot scanning interferometer

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI447351B (en) * 2009-02-24 2014-08-01 Univ Nat Taipei Technology Orthogonal-polarization mirau interferometry and beam-splitting module and interferometric system using the same
JP5087186B1 (en) * 2009-06-19 2012-11-28 ザイゴ コーポレーション Iso-optical path interferometer
CN202794687U (en) * 2012-07-25 2013-03-13 陶纯堪 Mirau-type object lens, interference microscope using the same and measurement system
CN103792648B (en) * 2013-10-10 2016-06-08 中国科学院上海光学精密机械研究所 Interfere microcobjective optical system
CN104280867B (en) * 2014-10-29 2016-06-15 南京恒磊光学技术研究有限公司 A kind of microscope objective

Also Published As

Publication number Publication date
CN107450173A (en) 2017-12-08

Similar Documents

Publication Publication Date Title
CN107450173B (en) A Mirau-type wide-field interference microscope objective optical system
TWI431243B (en) An optical assembly for use in an interferometer, an interferometry system, and an interferometry method
CN107401982B (en) Non-contact measurement method of lens center thickness based on low coherent light interferometry
CN103090787B (en) Based on the confocal micro-measurement device of measured surface fluorescence excitation
CN109059762B (en) A kind of Fresnel zone plate Spectral Confocal measurement method
CN107796330B (en) A kind of white light interference measuring three-dimensional morphology optical system
CN102589463A (en) Two-dimensional and three-dimensional integrated imaging measurement system
US11231269B2 (en) Arrangement and method for robust single-shot interferometry
CN101799279B (en) Optical fiber point diffraction phase shift interferometry method of surface shape of large relative aperture sphere
CN107490851B (en) Optical detection device and method for left and right zoom system of operating microscope
CN112556991A (en) Lens refractive index measuring device and measuring method thereof
CN103063158A (en) Surface shape measurement method for sphere end surface conical lens
CN103792648B (en) Interfere microcobjective optical system
US20200191551A1 (en) Device for measuring the parameters of phase elements and optical fiber dispersion and a method of measuring the parameters of phase elements and optical fiber dispersion
CN210863101U (en) Lens refractive index measuring device
CN111208633A (en) An Optimization Method of Characteristic Parameters of Dispersive Confocal Microscope
Liao et al. Off-axis co-optical path large-range line scanning chromatic confocal sensor
CN106370129B (en) 5 times of Michaelsons interfere microcobjective optical system
GB602459A (en) Improvements in or relating to interferometric testing apparatus
CN113295386B (en) Optical lens detection system and detection method
CN109580183B (en) Large-numerical-aperture microscope wave aberration measurement system and measurement method
CN106772418A (en) The adjusting method of interferometer zero path difference in a kind of ORVIS velocity-measuring systems
CN112816188A (en) GRIN lens optimal object image distance measuring system
Qiu et al. Laser confocal interference multi-parameter measurement method for spherical lens
CN112539920A (en) Method and device for measuring high reflectivity of laser optical element

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant