CN107389602A - A kind of spectroscopic system based on DLP technologies - Google Patents
A kind of spectroscopic system based on DLP technologies Download PDFInfo
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- CN107389602A CN107389602A CN201710763502.3A CN201710763502A CN107389602A CN 107389602 A CN107389602 A CN 107389602A CN 201710763502 A CN201710763502 A CN 201710763502A CN 107389602 A CN107389602 A CN 107389602A
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- lens
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- light source
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- photodetector
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- 238000005516 engineering process Methods 0.000 title claims abstract description 12
- 238000012360 testing method Methods 0.000 claims abstract description 17
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 claims description 6
- 229910052738 indium Inorganic materials 0.000 claims description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical group [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 4
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 claims description 3
- YZCKVEUIGOORGS-OUBTZVSYSA-N Deuterium Chemical compound [2H] YZCKVEUIGOORGS-OUBTZVSYSA-N 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052786 argon Inorganic materials 0.000 claims description 3
- 229910052805 deuterium Inorganic materials 0.000 claims description 3
- 229910052736 halogen Inorganic materials 0.000 claims description 3
- 150000002367 halogens Chemical class 0.000 claims description 3
- 229910052743 krypton Inorganic materials 0.000 claims description 3
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 3
- 229910052721 tungsten Inorganic materials 0.000 claims description 3
- 239000010937 tungsten Substances 0.000 claims description 3
- 229910052724 xenon Inorganic materials 0.000 claims description 3
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 claims description 3
- 230000005622 photoelectricity Effects 0.000 claims description 2
- 229910052785 arsenic Inorganic materials 0.000 claims 1
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 3
- 230000009286 beneficial effect Effects 0.000 abstract description 2
- 230000015556 catabolic process Effects 0.000 abstract description 2
- 238000006731 degradation reaction Methods 0.000 abstract description 2
- 230000003595 spectral effect Effects 0.000 description 5
- 101700004678 SLIT3 Proteins 0.000 description 4
- 102100027339 Slit homolog 3 protein Human genes 0.000 description 4
- 238000010276 construction Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 229910000673 Indium arsenide Inorganic materials 0.000 description 2
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 2
- 238000003915 air pollution Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000003556 assay Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Spectrometry And Color Measurement (AREA)
Abstract
The invention discloses a kind of spectroscopic system based on DLP technologies, it is related to optical technical field, the system includes：Light source, lens, slit, collimation lens, optical filter, diaphragm, grating, condenser lens, digital micro-mirror device DMD, collecting lens, photodetector, control terminal；It is in predetermined angle between light source and testing sample, the side face lens that testing sample is irradiated by light source, lens, slit, collimation lens, optical filter, diaphragm, grating, condenser lens, DMD, collecting lens and photodetector are set gradually according to light path order, and control terminal is also electrically connected in photodetector and DMD；The application realizes the measurement to spectrogram by dmd chip and photodetector, because the size of dmd chip and photodetector is all smaller, therefore the structure is advantageous to improve the integrated level of whole system, realizes the miniaturization of spectrometer, while be also beneficial to realize cost degradation.
Description
Technical field
The present invention relates to optical technical field, especially a kind of spectroscopic system based on DLP technologies.
Background technology
Spectrometer is to carry out spectral investigation and structure of matter analysis, utilizes optical dispersion principle and modern advanced electronics technology
The photoelectric instrument of design.Its studied light of basic role measurement (studies material to reflect, absorb, scatter or be stimulated
Fluorescence etc.) spectral characteristic, including the spectral line characteristic such as wavelength, intensity.Spectral technique is widely used in air pollution, water dirt
In the detection of dye, food hygiene, metal industry etc..
With extensive use of the spectral technique in each field, the characteristics of its is simple, quick, people are promoted little by little to be answered
The field assay in kind with various decentralized are generalized to.And the rise of wearable technology in recent years, relevant industries are to miniature light
The demand of spectrometer is more and more stronger.Fig. 1 is refer to, spectrometer common at present is mainly by grating and array CCD (Charge-
Coupled Device, charge coupled cell) form, the size of grating and array CCD is limited to, the size of spectrometer is general at present
All over larger, miniaturization difficult to realize.
The content of the invention
The present inventor is regarding to the issue above and technical need, it is proposed that a kind of spectroscopic system based on DLP technologies, the system
Can be higher with integrated level, the miniaturization of spectroscopic system is advantageously implemented, and cost is relatively low.
Technical scheme is as follows：
A kind of spectroscopic system based on DLP technologies, including testing sample, the system include：Light source, lens, slit, collimation
Lens, optical filter, diaphragm, grating, condenser lens, digital micro-mirror device DMD, collecting lens, photodetector, control terminal；
It is in predetermined angle between light source and testing sample, the side face lens that testing sample is irradiated by light source are lens, narrow
Seam, collimation lens, optical filter, diaphragm, grating, condenser lens, DMD, collecting lens and photodetector according to light path order according to
Control terminal is also electrically connected in secondary setting, photodetector and DMD.
Its further technical scheme is that grating is transmission-type grating, and condenser lens is separately positioned on grating with diaphragm
Both sides；
Or grating is reflective gratings, condenser lens is arranged on the same side of grating with diaphragm.
Its further technical scheme is, the groove number of grating is 300,600 or 900 lines/mm, blaze wavelength 1.0,
1.2nd, 1.6 or 2.0 μm, blaze angle is 5-30 °.
Its further technical scheme is that light source includes at least one of halogen tungsten lamp, xenon lamp, deuterium lamp, krypton lamp and argon lamp,
The power of light source is 1-50W.
Its further technical scheme is that light source is used to launch near infrared light, lens, collimation lens, condenser lens and receipts
The surface of collection lens is coated with near-infrared anti-reflection film.
Its further technical scheme is, the width of slit is 10-50 μm, length 1-3mm.
Its further technical scheme is that the transparency range of optical filter is 0.8-3.0 μm.
Its further technical scheme is that photodetector is indium gallium arsenic detector, indium arsenide detector, the pole of silicon photoelectricity two
Pipe and any one in avalanche diode.
Its further technical scheme is that control terminal is used for the spectrogram for generating testing sample, the wavelength model of spectrogram
Enclose for 0.8-3.0 μm, resolution ratio 5-20nm.
The method have the benefit that：
This application discloses a kind of spectroscopic system based on DLP technologies, is realized by dmd chip and photodetector to sample
The measurement of product spectrum, compared to array CCD, the size of dmd chip and photodetector is all smaller, is advantageous to improve whole system
Integrated level, realize the miniaturization of spectrometer so that the size of whole spectrometer is even less than matchbox, while in the application
The cost of dmd chip and photodetector wants low more compared to array CCD, is also beneficial to realize cost degradation.
Brief description of the drawings
Fig. 1 is the system construction drawing of existing spectroscopic system.
Fig. 2 is the first system construction drawing of spectroscopic system disclosed in the present application.
Fig. 3 is the structural representation of dmd chip.
Fig. 4 is second of system construction drawing of spectroscopic system disclosed in the present application.
Embodiment
The embodiment of the present invention is described further below in conjunction with the accompanying drawings.
Fig. 2 is refer to, DLP (Digital Light Processing, digital light are based on it illustrates disclosed in the present application
Processing) technology spectroscopic system system construction drawing, the system is used to generate the spectrogram of testing sample 13, and the system includes light
Source 1, lens 2, slit 3, collimation lens 4, optical filter 5, diaphragm 6, grating 7, condenser lens 8, DMD (Digital
Micromirror Devices, digital micro-mirror device) 9, collecting lens 10, photodetector 11, control terminal 12, DMD9 is
One dmd chip, dmd chip surface is by thousands of miniature planar microscope group into micro mirror array, and its structure is as shown in figure 3, each
Micro mirror can overturn certain angle according to control signal, so as to reflect flashlight.It is with number to control terminal 12
According to the terminal of processing function, the computer of the special-purpose software for generating spectrogram is usually installed.
Be in predetermined angle between light source 1 and testing sample 13, the application is not limited predetermined angle, light source 1 be used for
Testing sample 13 launches near infrared light, and the power for the near infrared light that light source 1 is launched be 1-50W, light source 1 including halogen tungsten lamp, xenon lamp,
At least one of deuterium lamp, krypton lamp and argon lamp.
The side face lens 2 that testing sample 13 is irradiated by light source 1, lens 2, slit 3, collimation lens 4, optical filter 5, light
Door screen 6, grating 7, condenser lens 8, DMD 9, collecting lens 10 and photodetector 11 set gradually that (Fig. 2 shows according to light path order
Go out light path order), control terminal 12 is also electrically connected in photodetector 11 and DMD 9.The application is to each in the system
The distance between individual part is not limited, and the meeting of the distance between part is wanted because of the different of parameters of operating part and to overall dimensions
Ask and change, the distance when actually realizing between all parts generally is debugged to obtain by technical staff.
The groove number of grating 7 is 300,600 or 900 lines/mm, blaze wavelength 1.0,1.2,1.6 or 2.0 μm, blaze angle
For 5-30 °.Grating 7 is transmission-type grating or reflective gratings, when the type difference of grating 7, all parts in the system
Set location is also different, specifically：When grating 7 is transmission-type grating, rear diffraction light can be transmitted through light on grating 7 for light projection
Grid 7, then condenser lens 8 and diaphragm 6 be separately positioned on the both sides of grating 7, projected after diffraction light transmission according to different angles
On condenser lens 8, as shown in Figure 2.When grating 7 is reflective gratings, rear diffraction light can be in grating 7 on grating 7 for light projection
Surface is reflected, then condenser lens 8 is arranged on the same side of grating 7 with diaphragm 6, is thrown after diffraction light reflection by different angles
It is mapped on condenser lens 8, as shown in Figure 4.
Lens 2, collimation lens 4, the surface of condenser lens 8 and collecting lens 10 are coated with near-infrared anti-reflection film, for this
For any one lens in four lens, the lens are planoconvex spotlight or biconvex lens, and Fig. 2 and Fig. 4 with lens 2 and are focused on
Lens 8 are planoconvex spotlight, collimation lens 4 and collecting lens 10 for exemplified by biconvex lens, the lens are single lens or at least two
Individual lens combination forms, and the curved surface of lens is sphere or aspherical.
The width of slit 3 is 10-50 μm, length 1-3mm.
The transparency range of optical filter 5 is 0.8-3.0 μm.
Photodetector 11 is in indium gallium arsenic detector, indium arsenide detector, silicon photoelectric diode and avalanche diode
Any one.
The operation principle of disclosed system is：
Light source 1 launches the surface of near infrared light testing sample 13, and lens 2 are by 13 irreflexive flashlight of testing sample
Project in slit 3, flashlight is collimated by collimation lens 4, and optical filter 5 filters out the low band light in flashlight, light
6 pairs of flashlights of door screen are projected on grating 7 after carrying out shaping, and diffraction light is projected on condenser lens 8 by different angles, flashlight
Projected successively in DMD 9 different zones by the size distribution of wavelength, the surfaces of DMD 9 are made up of micro mirror array, and each row are micro-
Mirror represents a wavelength, and control terminal 12 inputs control signal to DMD 9, and the control signal is used to drive the micro mirror in DMD 9,
Each row micro mirror is driven successively from the micro mirror array starting point on the surfaces of DMD 9, and the light of wavelength corresponding to each row micro mirror is reflected successively
To collecting lens 10, flashlight is focused on photodetector 11 by collecting lens 10, photodetector 11, which sequentially generates, to be connect
The energy value is simultaneously sent to control system 12 by energy value corresponding to the flashlight received, then control system 12 obtains each ripple successively
Energy value corresponding to long flashlight so as to generate the spectrogram of testing sample, the wave-length coverage of the spectrogram is 0.8-3.0 μm, point
Resolution is 5-20nm.
Above-described is only the preferred embodiment of the present invention, and the invention is not restricted to above example.It is appreciated that this
Other improvement and become that art personnel directly export or associated without departing from the spirit and concept in the present invention
Change, be considered as being included within protection scope of the present invention.
Claims (9)
1. a kind of spectroscopic system based on DLP technologies, including testing sample, it is characterised in that the system includes：Light source, thoroughly
Mirror, slit, collimation lens, optical filter, diaphragm, grating, condenser lens, digital micro-mirror device DMD, collecting lens, photodetection
Device, control terminal；
It is in predetermined angle between the light source and the testing sample, the side face that the testing sample is irradiated by the light source
The lens, the lens, slit, collimation lens, optical filter, diaphragm, grating, condenser lens, DMD, collecting lens and photoelectricity
Detector is set gradually according to light path order, and the control terminal is also electrically connected in the photodetector and the DMD.
2. system according to claim 1, it is characterised in that the grating is transmission-type grating, the condenser lens with
The diaphragm is separately positioned on the both sides of the grating；
Or the grating is reflective gratings, the condenser lens is arranged on the same side of the grating with the diaphragm.
3. system according to claim 1 or 2, it is characterised in that the groove number of the grating be 300,600 or 900 lines/
Mm, blaze wavelength 1.0,1.2,1.6 or 2.0 μm, blaze angle are 5-30 °.
4. system according to claim 1 or 2, it is characterised in that the light source includes halogen tungsten lamp, xenon lamp, deuterium lamp, krypton lamp
At least one of with argon lamp, the power of the light source is 1-50W.
5. system according to claim 1 or 2, it is characterised in that the light source is used to launch near infrared light, described
Mirror, collimation lens, the surface of condenser lens and collecting lens are coated with near-infrared anti-reflection film.
6. system according to claim 1 or 2, it is characterised in that the width of the slit is 10-50 μm, length 1-
3mm。
7. system according to claim 1 or 2, it is characterised in that the transparency range of the optical filter is 0.8-3.0 μm.
8. system according to claim 1 or 2, it is characterised in that the photodetector is indium gallium arsenic detector, arsenic
Any one in indium detector, silicon photoelectric diode and avalanche diode.
9. system according to claim 1 or 2, it is characterised in that the control terminal is used to generate the testing sample
Spectrogram, the wave-length coverage of the spectrogram is 0.8-3.0 μm, resolution ratio 5-20nm.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710763502.3A CN107389602A (en) | 2017-08-30 | 2017-08-30 | A kind of spectroscopic system based on DLP technologies |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710763502.3A CN107389602A (en) | 2017-08-30 | 2017-08-30 | A kind of spectroscopic system based on DLP technologies |
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| Publication Number | Publication Date |
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| CN107389602A true CN107389602A (en) | 2017-11-24 |
Family
ID=60348206
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| CN201710763502.3A Pending CN107389602A (en) | 2017-08-30 | 2017-08-30 | A kind of spectroscopic system based on DLP technologies |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572158A (en) * | 2018-07-11 | 2018-09-25 | 天津博霆光电技术有限公司 | A kind of household superminiature near infrared spectrum tester |
| CN112285076A (en) * | 2020-09-27 | 2021-01-29 | 浙江谱创仪器有限公司 | Integral type aviation kerosene trace water content measuring molecular fluorescence spectrometer based on DLP technology |
| CN112345483A (en) * | 2020-10-29 | 2021-02-09 | 南开大学 | Method for generating near infrared spectrum data based on pattern sequence |
| CN114199379A (en) * | 2021-12-14 | 2022-03-18 | 深圳思凯测试技术有限公司 | Novel spectrometer and light intensity detection method based on DLP technology |
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| EP0498644A1 (en) * | 1991-02-07 | 1992-08-12 | Research Development Corporation Of Japan | High sensitive multi-wavelength spectral analyzer |
| CN103256981A (en) * | 2013-04-18 | 2013-08-21 | 中国科学院长春光学精密机械与物理研究所 | Optical system of miniature cylindrical mirror multi-grating spectrum analysis |
| CN106338491A (en) * | 2016-08-17 | 2017-01-18 | 中国计量大学 | Fake milk powder discriminating unit |
| CN106370642A (en) * | 2016-08-17 | 2017-02-01 | 中国计量大学 | Portable Raman spectrometer specially for detecting foods and drugs |
| CN207181290U (en) * | 2017-08-30 | 2018-04-03 | 无锡迅杰光远科技有限公司 | A kind of spectroscopic system based on DLP technologies |
-
2017
- 2017-08-30 CN CN201710763502.3A patent/CN107389602A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0498644A1 (en) * | 1991-02-07 | 1992-08-12 | Research Development Corporation Of Japan | High sensitive multi-wavelength spectral analyzer |
| CN103256981A (en) * | 2013-04-18 | 2013-08-21 | 中国科学院长春光学精密机械与物理研究所 | Optical system of miniature cylindrical mirror multi-grating spectrum analysis |
| CN106338491A (en) * | 2016-08-17 | 2017-01-18 | 中国计量大学 | Fake milk powder discriminating unit |
| CN106370642A (en) * | 2016-08-17 | 2017-02-01 | 中国计量大学 | Portable Raman spectrometer specially for detecting foods and drugs |
| CN207181290U (en) * | 2017-08-30 | 2018-04-03 | 无锡迅杰光远科技有限公司 | A kind of spectroscopic system based on DLP technologies |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108572158A (en) * | 2018-07-11 | 2018-09-25 | 天津博霆光电技术有限公司 | A kind of household superminiature near infrared spectrum tester |
| CN112285076A (en) * | 2020-09-27 | 2021-01-29 | 浙江谱创仪器有限公司 | Integral type aviation kerosene trace water content measuring molecular fluorescence spectrometer based on DLP technology |
| CN112345483A (en) * | 2020-10-29 | 2021-02-09 | 南开大学 | Method for generating near infrared spectrum data based on pattern sequence |
| CN114199379A (en) * | 2021-12-14 | 2022-03-18 | 深圳思凯测试技术有限公司 | Novel spectrometer and light intensity detection method based on DLP technology |
| CN114199379B (en) * | 2021-12-14 | 2023-11-17 | 深圳思凯测试技术有限公司 | Spectrometer and light intensity detection method based on DLP technology |
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