CN107356867B - Ampere-second characteristic test system for lightning arrester disconnector - Google Patents

Ampere-second characteristic test system for lightning arrester disconnector Download PDF

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CN107356867B
CN107356867B CN201710575701.1A CN201710575701A CN107356867B CN 107356867 B CN107356867 B CN 107356867B CN 201710575701 A CN201710575701 A CN 201710575701A CN 107356867 B CN107356867 B CN 107356867B
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data
ampere
acquisition card
acquisition
time
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CN107356867A (en
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罗小勇
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WUHAN UNITED ELECTRICAL EQUIPMENT MANUFACTURING CO.,LTD.
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He Zhong Electrical Equipment Manufacturing Co Ltd Of Wuhan City
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272Apparatus, systems or circuits therefor

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  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention relates to an ampere-second characteristic test system, belongs to the field of power equipment, and particularly relates to an ampere-second characteristic test system for a disconnector of a lightning arrester. The method comprises the following steps: the device comprises an impulse voltage generating device and an acquisition card connected with the impulse voltage generating device, wherein the acquisition card is of a type NI-USB 6009, a high level is given out through an IO interface of the acquisition card, an external relay is driven, an effective signal is given to an impulse voltage generator, and the time when the acquisition card starts to record waveforms is earlier than the time when the IO interface gives out the high level.

Description

ampere-second characteristic test system for lightning arrester disconnector
Technical Field
The invention relates to an ampere-second characteristic test system, belongs to the field of power equipment, and particularly relates to an ampere-second characteristic test system for a disconnector of a lightning arrester.
Background
The disconnector for the lightning arrester (disconnector for short) is used as a matched product of the lightning arrester, is connected with the lightning arrester in series for use, and is generally directly installed on the grounding side of the lightning arrester to isolate the lightning arrester from the ground potential. The disconnector can be used to prevent a permanent failure of the system, i.e. when a lightning arrester fails, it can be disconnected from the system and give a visual indication for the maintenance personnel to find and replace the failed arrester as soon as possible.
If the performance and the quality of the disconnector can be effectively guaranteed, the use of the disconnector can greatly reduce the accident potential of the arrester, so that the arrester really achieves maintenance-free performance, and the operation reliability of the system is further improved. However, most manufacturers do not have the conditions for testing the detacher, so that it is difficult to control the production quality of the detacher in the first time.
in view of this, we have attempted to develop a low cost detacher quality inspection system. The national standard for the detection of the disconnector does not exist, and only the general requirements on the electrical performance of the disconnector are provided in the lightning arrester standard. According to a plurality of standards of lightning arresters at home and abroad, the GB7327-2008 puts requirements on the basic electrical performance of the disconnector, and the disconnector mainly focuses on the following two aspects:
(1) Tolerance of the detacher. The disconnector is the same as the lightning arrester, and needs to pass two tests of long-duration current impact and action load, which mainly simulates the working condition that the lightning arrester can endure during normal operation.
(2) The performance of the detacher. When the lightning arrester breaks down, the disconnector has good ampere-second characteristic, namely, can timely, accurately and reliably act to avoid a vicious accident. The ampere-second characteristic test is an important test for verifying the action performance of the detacher. This test is difficult to perform and cannot be performed by most manufacturers.
Therefore, a set of low-cost ampere-second characteristic test system is the main content of the detacher quality detection system. How to realize correct ampere-second characteristic measurement at low cost is a problem to be solved by the invention.
disclosure of Invention
The invention mainly solves the technical problems in the prior art; an ampere-second characteristic test system for a lightning arrester disconnector is provided.
The technical problem of the invention is mainly solved by the following technical scheme:
An ampere-second characteristic testing system for a surge arrester disconnector, comprising: the device comprises an impulse voltage generating device and an acquisition card connected with the impulse voltage generating device, wherein the acquisition card is of a type NI-USB 6009, a high level is given out through an IO interface of the acquisition card, an external relay is driven, an effective signal is given to an impulse voltage generator, and the time when the acquisition card starts to record waveforms is earlier than the time when the IO interface gives out the high level.
Preferably, the second characteristic testing system for the arrester disconnector is characterized in that a while cycle is added in the acquisition process, the time of each step of the cycle is one second, the length of the acquired data is one second, the acquisition module in the VI is placed in the cycle, the data is overlapped and placed in the shift register, and the data in the register is taken out and stored after the cycle is finished.
Preferably, the ampere-second characteristic testing system for the arrester disconnector compares the collected voltage or current with a preset threshold value during each cycle, and automatically stops the test when overvoltage or overcurrent is judged to occur.
Preferably, in each cycle, when the acquisition starts, the acquired waveform data is converted into a TDMS format, the data acquired in each cycle is stored in a corresponding temporary file on the hard disk in a real-time overlapping manner, and after the cycle acquisition ends, the data in the temporary file is stored as another data file, so that the real-time storage of the test data is realized.
Preferably, the ampere-second characteristic testing system for the arrester disconnector adopts a TDMS storage mode to store collected data during each circulation.
Preferably, the ampere-second characteristic testing system for the arrester disconnector further comprises a divider resistor and a piezoresistor which are connected with a sample to be tested, and the acquisition card is connected with the piezoresistor during each circulation.
Preferably, the ampere-second characteristic testing system for the arrester disconnector further comprises a current measuring resistor connected with the sample to be tested in series during each circulation, and the acquisition card is connected with the current measuring resistor.
Therefore, the invention has the following advantages: 1. the method has the advantages of low cost, safe experimental process, simple operation and no special requirements on operators.
Drawings
FIG. 1 is a schematic diagram of the present invention;
FIG. 2 is a work interface diagram of the present invention;
Detailed Description
The technical scheme of the invention is further specifically described by the following embodiments and the accompanying drawings.
Example (b):
The invention is based on Labview program development language, developed by national instruments corporation (NI), and used as a virtual instrument development platform, and integrates the program language, the equipment driver and the functional module in software in a way similar to the way of building a circuit diagram, so that a user can quickly select required contents to program, and the method is very simple, convenient and time-saving.
A set of ampere-second characteristic test system with low cost is the main content of the detacher quality detection system. How to realize correct ampere-second characteristic measurement at low cost is a main problem to be studied by the embodiment.
The ampere-second characteristic test needs to carry out over-voltage or over-current thermal explosion on a sample of the disconnector, and simultaneously, the current-time characteristic of the sample is measured and collected. The general experimental equipment comprises an impulse voltage generating device and an oscilloscope, and a certain voltage dividing device is also needed for reducing the voltage so as to carry out normal measurement. At present, almost no ampere-second characteristic measuring instrument specially aiming at the detacher exists in China. Therefore, the embodiment provides the body type industrial personal computer, and the cheap NI-USB 6009 type acquisition card is used for acquiring data; the impulse voltage is selected from an impulse voltage generating device in the prior art, and the operation and the triggering of the impulse voltage generating device are controlled by connecting a relay through an IO interface of an acquisition card.
The experiment process can be completed only by clicking the mouse, the experiment result is automatically calculated, and the experiment data is automatically stored. The user does not need to be trained, and the test can be completed only by basic electrician knowledge.
In an ampere-second characteristic test system, measurement and control are required to be carried out synchronously. Sending a command to the impulse voltage generating device through a computer, triggering a large current to detonate the disconnector; meanwhile, the data acquisition card acquires voltage and current signals of the detacher and processes data of the result.
According to a general NI measuring platform building mode, trigger signals are involved, a collecting card needs to have a level trigger function or a pulse trigger function, and the waveform recording time of the collecting card needs to be several seconds. However, experiments prove that acquisition cards which want to realize the function are often in the price of ten thousands and do not meet the requirement of low cost. The common USB6009 series acquisition card only has a PFI trigger function, does not have a level trigger, and does not have a pre-trigger function, which may cause the loss of the head of the trigger waveform to affect the result of data processing. Secondly, after the acquisition card is used for recording data for several seconds, the system can perform data conversion after the data is recorded, and software can be blocked for tens of seconds, so that the experimental effect is influenced, and even misoperation of a user can be caused. Without solving the above problem, this measurement system cannot be established.
Through research, we have found a solution.
First, a problem with trigger signals. In a conventional blasting experiment, a required waveform signal is extracted by detecting the level of a surge voltage and pre-triggering in percentage.
the USB6009 has no pre-trigger function, so that the wave head signal before the trigger signal is lost, and the signal is the process of the surge voltage rising from the zero potential to the trigger level,
Where loss of signal can affect subsequent processing results. Then to solve this problem, the external trigger can only be changed to an internal trigger by modifying the trigger mechanism. Namely, the mouse clicks a 'start' button, the acquisition card starts to record waveforms and then data after the waveforms are recorded, and meanwhile, a high level is given out through an IO interface carried by the USB6009 to drive an external relay and give an effective signal to the impulse voltage generator. By this arrangement, a natural delay is created after the start of recording the waveform and before the surge voltage occurs, and this delay can be manually adjusted, thereby avoiding the problem of loss of the wave head signal.
However, such an arrangement also brings with it another problem. As the experimental time is several seconds to tens of seconds, for the acquisition card, under the condition of a certain sampling frequency, the acquisition card has limited memory and cannot support the number of acquisition points with infinite length, and the excessive number of the acquisition points can cause the software to be blocked and even halted. If the time is limited, one acquisition needs to be given a sampling time in advance, which may lead to the death of the experimental process, and the situation that the detacher explodes after a predetermined time, the experimental data is missed, or the detacher explodes after a predetermined time and cannot stop the experiment can occur.
Because the fixed acquisition may have the above disadvantages, we try to change the acquisition mode to continuous loop acquisition, add a while loop in the acquisition process, where the loop step time is one second and the acquisition data length is also one second, place the acquisition module in VI in the loop, and superimpose the data into the shift register, and take out the data in the register for storage after the loop is over. The acquisition program adopting the structure can flexibly realize simple synchronous processing of data, and mainly aims at realizing two purposes. When the overvoltage or the overcurrent is generated, the test can be automatically stopped by comparing the acquired maximum values; and secondly, when the time exceeds the set time and no valid data is generated, the test can be automatically ended and a user is prompted to ground the test circuit. The two functions can be completed by a simple numerical comparison module, and the use of the numerical comparison module is more flexible than that of fixed acquisition.
However, the acquisition method has a problem that after data acquired by while loop is put into the shift register, data volumes are overlapped, the call efficiency of the shift register of Labview to the memory is low, and a crash may be caused when the data volume is large. The data volume in the program is not too large, but along with the superposition of the cycles, the operation of the program is influenced during the last several cycles of one measurement, so that the acquired data is delayed, and the recorded waveform is distorted.
In order to solve the problem, a TDMS storage mode is adopted. The TDMS storage is a data storage module carried in Labview and specially designed for high-speed data acquisition and storage. When the collection is started, the collected waveform data is converted into a TDMS format, the data collected in each cycle are overlapped and stored in a corresponding temporary file on the hard disk in real time, and after the cycle collection is finished, the data in the temporary file is stored into another data file, so that the real-time storage of the test data is realized. Because the TDMS storage mode directly calls CPU and memory resources, and does not need to limit 10M of a system memory by Labview, the storage and processing speed is very high and can reach 100M/s, and almost all PCI, PXI and USB acquisition cards on the market can be compatible.
by means of the TDMS storage transformation, we modify the acquisition cycle as it is (see fig. 2). The software controls the test process, before starting the test, the test environment can be modified, the current intensity is selected, the alarm level is set, and the test overtime time is set. After a start button is clicked, the acquisition cycle starts, and after 1 second of delay, the IO port sends a trigger signal to control the impulse voltage device to discharge. Under normal conditions, the sample of the detacher is blasted, the test voltage and current waveforms are recorded and finished, the test is automatically finished, the test result is automatically processed, and a test report is generated. Under abnormal conditions, if the voltage is out of limit or the test overtime sample is not exploded, the test is automatically stopped. The alarm lamp is lighted, and the alarm ring rings.
The specific embodiments described herein are merely illustrative of the spirit of the invention. Various modifications or additions may be made to the described embodiments or alternatives may be employed by those skilled in the art without departing from the spirit or ambit of the invention as defined in the appended claims.

Claims (6)

1. An ampere-second characteristic testing system for a surge arrester disconnector, comprising: the device comprises an impulse voltage generating device and an acquisition card connected with the impulse voltage generating device, and is characterized in that the acquisition card is an acquisition card with the model of NI-USB 6009, a high level is given out through an IO interface carried by the acquisition card, an external relay is driven, an effective signal is given to an impulse voltage generator, and the time when the acquisition card starts to record waveforms is earlier than the time when the IO interface gives out the high level;
Adding a while loop in the acquisition process, wherein the time of each step of the loop is one second, the length of the acquired data is one second, putting an acquisition module in a virtual instrument program in the loop, superposing the data and putting the data into a shift register, and taking out and storing the data in the register after the loop is finished.
2. The ampere-second characteristic test system for a lightning arrester disconnector according to claim 1, wherein the collected voltage or current is compared with a preset threshold value at each cycle, and the test is automatically stopped when it is judged that the overvoltage or overcurrent occurs.
3. The ampere-second characteristic testing system for the arrester disconnector according to claim 1, wherein the collected waveform data is converted into a TDMS format at the beginning of collection, the collected data in each cycle is stored in a corresponding temporary file on the hard disk in a real-time overlapping manner, and after the collection of the cycle is finished, the data in the temporary file is stored in another data file to realize the real-time storage of the test data.
4. The ampere-second characteristic testing system for the arrester disconnector according to claim 1, wherein the acquired data is stored by a TDMS storage mode.
5. The ampere-second characteristic testing system for the arrester disconnector according to claim 1, further comprising a voltage dividing resistor and a voltage measuring resistor connected to a sample to be tested, wherein the acquisition card is connected to the voltage measuring resistor.
6. the ampere-second characteristic testing system for the arrester disconnector according to claim 1, further comprising a current measuring resistor connected in series with a sample to be tested, wherein the acquisition card is connected with the current measuring resistor.
CN201710575701.1A 2017-07-14 2017-07-14 Ampere-second characteristic test system for lightning arrester disconnector Active CN107356867B (en)

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CN113433442A (en) * 2021-06-01 2021-09-24 广东电网有限责任公司广州供电局 Detacher protection characteristic experimental device

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CN102236057A (en) * 2011-01-14 2011-11-09 广东电网公司电力科学研究院 Method for testing release device supporting lightning arrester
CN202256536U (en) * 2011-10-18 2012-05-30 成都兴业雷安电子有限公司 Surge protective device (SPD) prospective short-circuit current thermal stability and thermal tripping integral test table
CN102508085A (en) * 2011-11-30 2012-06-20 上海交通大学 Full-automatic SPD (Surge Protective Device) thermal stabilizer based on FPGA (Field Programmable Gate Array) control and a testing method thereof
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