CN107345987A - The method and circuit of trans-impedance amplifier gain filler test - Google Patents
The method and circuit of trans-impedance amplifier gain filler test Download PDFInfo
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- CN107345987A CN107345987A CN201710580784.3A CN201710580784A CN107345987A CN 107345987 A CN107345987 A CN 107345987A CN 201710580784 A CN201710580784 A CN 201710580784A CN 107345987 A CN107345987 A CN 107345987A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The invention provides a kind of method of trans-impedance amplifier gain filler test, including trans-impedance amplifier test chip；Trans-impedance amplifier test chip sends an ac current signal into trans-impedance amplifier to be measured, trans-impedance amplifier output AC voltage signal to be measured is converted to a d. c. voltage signal output into trans-impedance amplifier test chip, and d. c. voltage signal is only relevant with trans-impedance amplifier gain；The d. c. voltage signal discreteness of trans-impedance amplifier test chip output is the gain discreteness of trans-impedance amplifier to be measured.According to the above method, present invention also offers a kind of circuit of trans-impedance amplifier gain filler test.It can realize that automatic detection produces using the present invention, reduce production cost, be effectively improved the competitiveness of product in market.
Description
Technical field
The present invention relates to the screening field to trans-impedance amplifier gain, refers specifically to a kind of trans-impedance amplifier gain filler test
Method and circuit.
Background technology
The effect of trans-impedance amplifier is to convert input current signal and be enlarged into voltage signal, is mainly used in photoelectricity and turns
Field, the front end receiver circuit especially in Modern High-Speed optical communication applications are changed, trans-impedance amplifier is most crucial reception machine
Part.
To ensure the good uniformity of the product quality of batch production, performance parameter, the integrated electricity of commercial trans-impedance amplifier
Road product needs to do filler test to all products before product export, screens out the defective products for not meeting index specification.It is different from
Test in laboratory, it is this easy, inexpensive, efficient to the test request testing scheme of IC products in large quantity
Rate, automate simultaneously also high reliability.Commercial high speed trans-impedance amplifier product is one highly important across hindering parameter
Index, therefore ensure that the uniformity of its value is good, it is discrete it is small be very important.The detection method applied in laboratory is first will
After trans-impedance amplifier is packaged into light-receiving secondary module with photodiode, then Network Analyzer is exported by band optical port and carried out accurately
Measurement.The band optical port express network analyzer that the detection method is used is sufficiently expensive, causes the detection method testing cost high；And
The testing scheme of Network Analyzer is complicated, improves detection difficulty, reduces detection efficiency, is unfavorable for producing in enormous quantities.If product
Input is produced in enormous quantities, and scheme used in laboratory is not suitable for the automatic test of batch production then.
The content of the invention
It is an object of the invention to overcome above-mentioned deficiency of the prior art, there is provided a kind of trans-impedance amplifier gain screening is surveyed
The method and circuit of examination.On the one hand a test chip is utilized, test result, test side is just can obtain without excessive external equipment
Case is simply efficient, and cost is cheap；On the other hand automated production can also be realized, production cost is reduced, effectively improves
The competitiveness of product in market.
In order to solve the above-mentioned technical problem, the present invention provides a kind of method of trans-impedance amplifier gain filler test, including
Trans-impedance amplifier test chip；Trans-impedance amplifier test chip sends an ac current signal into trans-impedance amplifier to be measured,
Trans-impedance amplifier output AC voltage signal to be measured is into trans-impedance amplifier test chip；The ac voltage signal is put across resistance
Linear Amplifer, rectification are carried out in big device test chip, is converted into a d. c. voltage signal Vout outputs, gain amplifier A is whole
Stream conversion coefficient is k；D. c. voltage signal Vout calculation formula is
Vout=I*Gain*A*K
Gain is trans-impedance amplifier gain, and I is equal for the amplitude of ac current signal, gain amplifier A, rectification conversion coefficient K
It is only relevant with trans-impedance amplifier gain G ain for default steady state value, d. c. voltage signal Vout；Trans-impedance amplifier test chip
The d. c. voltage signal discreteness of output is the gain discreteness of trans-impedance amplifier to be measured.
Present invention also offers a kind of circuit of trans-impedance amplifier gain filler test, is increased using described trans-impedance amplifier
The method of beneficial filler test；Trans-impedance amplifier test chip include first input end, the second input, AC signal output end,
DC voltage output end；Trans-impedance amplifier to be measured includes AC signal input, the first output end, the second output end；Exchange letter
Number output end connection AC signal input；First output end connects first input end, and the second output end connects the second input.
In a preferred embodiment, the AC signal output end sends ac current signal to AC signal and inputted
End, trans-impedance amplifier to be measured is respectively from the first output end, the second output end output AC voltage signal to first input end, second
Input.
In a preferred embodiment, the trans-impedance amplifier test chip includes ac current signal and forms module, straight
Flow voltage signal and form module；
Ac current signal, which forms module, includes reference voltage, fixed value resistance, derailing switch；By reference voltage value divided by definite value
Resistance is worth to current value；Derailing switch switchs according to predeterminated frequency, forms ac current signal；
D. c. voltage signal, which forms module, includes DC-AC conversion device, voltage amplification device；DC-AC conversion device will
The ac voltage signal that first input end, the second input receive is converted to d. c. voltage signal, forms transformation ratio；Voltage is put
Big device amplification conversion coefficient.
In a preferred embodiment, the ac current signal formed module include operational amplifier I3, PMOS M0,
PMOS M1, NMOS tube M2, fixed value resistance R0, clock signal Clock；Operational amplifier I3 inverting input sets benchmark electricity
Pressure；The grid of operational amplifier I3 output end connection PMOS M0 grid and PMOS M1；Operational amplifier I3 positive
One end of input and PMOS M0 drain electrode connection fixed value resistance R0, fixed value resistance R0 other end ground connection；PMOS M0's
Source electrode is connected power supply Vdd with PMOS M1 source electrode；PMOS M1 drain electrode connection PMOS M2 drain electrode, PMOS M2 grid
Pole is controlled by clock signal Clock, and PMOS M2 source electrode is the AC signal output end.
In a preferred embodiment, the operational amplifier I3, PMOS M0, fixed value resistance R0 form feedback circuit；
Fixed value resistance R0 due to feedback circuit clamp down on effect both end voltage it is identical with reference voltage；PMOS M0 is formed with PMOS M1
Current mirror, flow through PMOS M1, PMOS M2 electric current I1 is equal to electric current I0；Electric current I1 from PMOS M1 drain electrode flow to PMOS
Pipe M2 drain electrode；When clock signal Clock sends high level, PMOS M2 conductings, I1 outflow PMOSs M2 source electrode, exchange
Signal output part exports I1；When clock signal Clock sends low level, PMOS M2 is not turned on, AC signal output end without
Output.
In a preferred embodiment, the DC-AC conversion device includes difference amplifier, diode D0, diode
D1, electric capacity C0；The first input end, the second input are two inputs of difference amplifier, and the two of difference amplifier
Individual output end is the first difference output end, the second difference output end and connects diode D0 positive pole, diode D1 respectively
Positive pole；The positive pole of diode D0 negative pole, diode D1 negative pole connection electric capacity C0, electric capacity C0 negative pole ground connection, diode D0,
Diode D1 and electric capacity C0 forms full-wave rectifying circuit；
The voltage amplification device includes NMOS tube M3, NMOS tube M4, resistance R1；NMOS tube M3 grid, NMOS tube M3
Drain electrode, NMOS tube M4 grid be all connected with electric capacity C0 positive pole, NMOS tube M3 source electrode, NMOS tube M4 source grounding,
NMOS tube M4 drain electrode connecting resistance R1 one end and DC voltage output end, resistance R1 another termination power.
In a preferred embodiment, difference AC voltage signal is input to difference from first input end, the second input
Amplifier, then exported by the first difference output end, the second difference output end；When the output of the first difference output end is the positive amplitude of oscillation,
Diode D0 is turned on, current flowing, and difference AC voltage signal charges to electric capacity C0；When the first difference output end exports the negative amplitude of oscillation
When, diode D0 cut-offs, electric capacity C0 does not charge；When the second difference output end exports the positive amplitude of oscillation, diode D1 conductings, electric current stream
Logical, difference AC voltage signal charges to electric capacity C0；When the second difference output end exports the negative amplitude of oscillation, diode D1 cut-offs, electricity
Hold C0 not charge；
When the first difference output end is the positive amplitude of oscillation, the second difference output end is the negative amplitude of oscillation；When the first difference output end is
During the negative amplitude of oscillation, the second difference output end is the positive amplitude of oscillation；Difference AC voltage signal is constantly right by diode D0, diode D1
Electric capacity C0 charges, and forms stable DC current signal；
In a preferred embodiment, NMOS tube M3 and NMOS tube M4 forms a proportional current mirror；Flow through NMOS tube M3
Electric current I2 by proportional current mirror amplification with resistance R1, DC voltage output end output d. c. voltage signal.
Compared to prior art, technical scheme possesses following beneficial effect：
The technical program is applied in the batch automatic production test of trans-impedance amplifier chip, is surveyed using trans-impedance amplifier
Examination chip is connected with trans-impedance amplifier to be measured to detect trans-impedance amplifier gain discreteness to be measured.It need to only judge that trans-impedance amplifier is surveyed
Examination chip output d. c. voltage signal discreteness i.e. can determine whether trans-impedance amplifier gain discreteness to be measured, you can realize to across
The fast and stable test screen of impedance amplifier transimpedance gain.Can also be by this detection circuit production into a special test chip.
This detection method and circuit just can obtain test result without excessive external equipment and expensive auxiliary equipment, and testing scheme is simply high
Effect, significantly reduces testing cost；Automated production is realized, is effectively improved the competitiveness of product in market.
Brief description of the drawings
Fig. 1 is the method schematic block diagram of trans-impedance amplifier gain filler test in the preferred embodiment of the present invention；
Fig. 2 is that ac current signal forms mould in trans-impedance amplifier gain filler test circuit in the preferred embodiment of the present invention
The circuit diagram of block；
Fig. 3 is that d. c. voltage signal forms mould in trans-impedance amplifier gain filler test circuit in the preferred embodiment of the present invention
The circuit diagram of block.
Embodiment
Below in conjunction with the drawings and specific embodiments, the present invention will be further described.
A kind of method of trans-impedance amplifier gain filler test, with reference to figure 1, including trans-impedance amplifier test chip (TIA
TEST)；Trans-impedance amplifier test chip sends an ac current signal into trans-impedance amplifier to be measured (TIA), to be measured across resistance
Amplifier output AC voltage signal is into trans-impedance amplifier test chip；The ac voltage signal is tested in trans-impedance amplifier
Linear Amplifer, rectification are carried out in chip, is converted into a d. c. voltage signal Vout outputs, gain amplifier A, rectification conversion system
Number is k；D. c. voltage signal Vout calculation formula is
Vout=I*Gain*A*K
Gain is trans-impedance amplifier gain, and I is equal for the amplitude of ac current signal, gain amplifier A, rectification conversion coefficient K
It is only relevant with trans-impedance amplifier gain G ain for default steady state value, d. c. voltage signal Vout；Trans-impedance amplifier test chip
The d. c. voltage signal discreteness of output is the gain discreteness of trans-impedance amplifier to be measured.
According to the method for above-mentioned trans-impedance amplifier gain filler test, trans-impedance amplifier gain filler test can be designed
Circuit；
Trans-impedance amplifier test chip is connected with trans-impedance amplifier to be measured by each interface, is specially：Trans-impedance amplifier
Test chip includes first input end INP, the second input INN, AC signal output end Iout, DC voltage output end；Treat
Surveying trans-impedance amplifier includes AC signal input Iin, the first output end vo utp, the second output end vo utn；AC signal is defeated
Go out to hold Iout connection AC signal inputs Iin；First output end vo utp connection first input end INP, the second output end
Voutn the second inputs of connection INN.
AC signal output end Iout sends ac current signal to exchange signal input part Lin, trans-impedance amplifier to be measured
Respectively from the first output end vo utp, the second output end vo utn output AC voltages signal to first input end INP, the second input
Hold INN.
There are multiple functional modules inside trans-impedance amplifier test chip, including ac current signal forms module, direct current
Signal is pressed to form module；
Ac current signal, which forms module, includes reference voltage, fixed value resistance, derailing switch；In trans-impedance amplifier test chip
Portion provides reference voltage, and current value is worth to reference voltage value divided by fixed value resistance；Derailing switch switchs according to predeterminated frequency, shape
Into ac current signal；
D. c. voltage signal, which forms module, includes DC-AC conversion device, voltage amplification device；DC-AC conversion device will
The ac voltage signal that first input end INP, the second input INN are received is converted to d. c. voltage signal Vout, forms conversion
Coefficient；Voltage amplification device amplifies conversion coefficient.
In more detail, with reference to figure 2, ac current signal, which forms module, includes operational amplifier I3, PMOS M0, PMOS
M1, NMOS tube M2, fixed value resistance R0, clock signal Clock；Operational amplifier I3 inverting input sets reference voltage；Fortune
Calculate the grid of amplifier I3 output end connection PMOS M0 grid and PMOS M1；Operational amplifier I3 normal phase input end
With PMOS M0 drain electrode connection fixed value resistance R0 one end, fixed value resistance R0 other end ground connection；PMOS M0 source electrode with
PMOS M1 source electrode connection power supply Vdd；PMOS M1 drain electrode connection PMOS M2 drain electrode, PMOS M2 grid by when
Clock signal Clock is controlled, and PMOS M2 source electrode is the AC signal output end.
Specifically, operational amplifier I3, PMOS M0, fixed value resistance R0 form feedback circuit；Fixed value resistance R0 due to
Feedback circuit clamp down on effect both end voltage it is identical with reference voltage；PMOS M0 and PMOS M1 forms current mirror, flows through
PMOS M1, PMOS M2 electric current I1 are equal to electric current I0；Electric current I1 flow to PMOS M2 drain electrode from PMOS M1 drain electrode；
When clock signal Clock sends high level, PMOS M2 conductings, I1 outflow PMOSs M2 source electrode, AC signal output end
Export I1；When clock signal Clock sends low level, PMOS M2 is not turned on, and AC signal output end is without output.Thus
The ac current signal of a determination clock frequency can be produced, the amplitude of ac current signal is by reference voltage value divided by definite value
Resistance R0's is worth to.
Alternating voltage letter is converted into AC signal output end Iout output ac current signal to trans-impedance amplifiers to be measured
Output to trans-impedance amplifier test chip, forms module by the DC voltage in trans-impedance amplifier test chip and changed again after number
Exported into d. c. voltage signal Vout.
First, ac voltage signal is converted into d. c. voltage signal Vout, it is necessary to use DC-AC conversion device.
With reference to figure 3, DC-AC conversion device includes difference amplifier I4, diode D0, diode D1, electric capacity C0；It is described
First input end INP, the second input INN are two inputs of difference amplifier, two output ends of difference amplifier
Diode D0 positive pole, diode D1 are connected for the first difference output end OUTP, the second difference output end OUTN and respectively
Positive pole；The positive pole of diode D0 negative pole, diode D1 negative pole connection electric capacity C0, electric capacity C0 negative pole ground connection, diode D0,
Diode D1 and electric capacity C0 forms full-wave rectifying circuit；
Secondly, ac voltage signal needs to be amplified again after being converted to d. c. voltage signal Vout, could be formed final
D. c. voltage signal Vout output.
With reference to figure 3, voltage amplification device includes NMOS tube M3, NMOS tube M4, resistance R1；NMOS tube M3 grid, NMOS
Pipe M3 drain electrode, NMOS tube M4 grid are all connected with electric capacity C0 positive pole, and NMOS tube M3 source electrode, NMOS tube M4 source electrode connect
Ground, NMOS tube M4 drain electrode connecting resistance R1 one end and DC voltage output end, resistance R1 another termination power.
Specifically, difference AC voltage signal is input to differential amplification from first input end INP, the second input INN
Device, then exported by the first difference output end OUTP, the second difference output end OUTN；When the first difference output end OUTP outputs is just
During the amplitude of oscillation, diode D0 conductings, current flowing, difference AC voltage signal is to electric capacity C0 chargings；When the first difference output end
When the amplitude of oscillation is born in OUTP outputs, diode D0 cut-offs, electric capacity C0 does not charge；When the second difference output end OUTN exports the positive amplitude of oscillation,
Diode D1 is turned on, current flowing, and difference AC voltage signal charges to electric capacity C0；When the second difference output end OUTN outputs are negative
During the amplitude of oscillation, diode D1 cut-offs, electric capacity C0 does not charge；
Again because when the first difference output end OUTP is the positive amplitude of oscillation, the second difference output end OUTN is the negative amplitude of oscillation；When
When one difference output end OUTP is the negative amplitude of oscillation, the second difference output end OUTN is the positive amplitude of oscillation；
So difference AC voltage signal is constantly charged by diode D0, diode D1 to electric capacity C0, formed stable
DC current signal；
NMOS tube M3 and NMOS tube M4 forms a proportional current mirror；Ac voltage signal is converted to DC current signal
Afterwards, the electric current I2 for flowing through NMOS tube M3 acts on by the amplification of proportional current mirror with resistance R1, DC voltage output end output direct current
Voltage signal.
In summary, direct voltage output signal Vout is calculated as：
Vout=I*Gain*A*K
I=Vbg/Rset
Wherein, Vbg is the reference voltage of trans-impedance amplifier test chip inner setting, and Rset is fixed value resistance R0 resistance
Value, gain amplifier A, rectification conversion coefficient K, reference voltage V bg, fixed value resistance R0 resistances Rset are default steady state value, institute
It is only relevant with the d. c. voltage signal Vout of d. c. voltage signal output end output with the gain discreteness of trans-impedance amplifier to be measured.
D. c. voltage signal Vout discreteness is trans-impedance amplifier gain discreteness to be measured.
The foregoing is only a preferred embodiment of the present invention, but the present invention design concept be not limited thereto,
Any one skilled in the art the invention discloses technical scope in, using this design to the present invention carry out it is non-
Substantial change, belong to invade the behavior of the scope of the present invention.
Claims (9)
- A kind of 1. method of trans-impedance amplifier gain filler test, it is characterised in that including trans-impedance amplifier test chip；Across resistance Amplifier test chip sends an ac current signal into trans-impedance amplifier to be measured, and trans-impedance amplifier to be measured exports alternating current Signal is pressed into trans-impedance amplifier test chip；The ac voltage signal is linearly put in trans-impedance amplifier test chip Greatly, rectification, a d. c. voltage signal Vout outputs are converted into, gain amplifier A, rectification conversion coefficient is k；DC voltage is believed Number Vout calculation formula isVout=I*Gain*A*KGain is trans-impedance amplifier gain, and I is pre- for the amplitude of ac current signal, gain amplifier A, rectification conversion coefficient K If steady state value, d. c. voltage signal Vout is only relevant with trans-impedance amplifier gain G ain；Trans-impedance amplifier test chip exports D. c. voltage signal discreteness be trans-impedance amplifier to be measured gain discreteness.
- A kind of 2. circuit of trans-impedance amplifier gain filler test, it is characterised in that employ described in claim 1 across resistance The method of amplifier gain filler test；Trans-impedance amplifier test chip includes first input end, the second input, AC signal Output end, DC voltage output end；Trans-impedance amplifier to be measured includes AC signal input, the first output end, the second output end； AC signal output end connects AC signal input；First output end connects first input end, the second output end connection second Input.
- 3. the circuit of trans-impedance amplifier gain filler test according to claim 2, it is characterised in that the AC signal Output end sends ac current signal to exchanging signal input part, and trans-impedance amplifier to be measured is respectively from the first output end, second defeated Go out to hold output AC voltage signal to first input end, the second input.
- 4. the circuit of trans-impedance amplifier gain filler test according to claim 3, it is characterised in that described to amplify across resistance Device test chip includes ac current signal and forms module, d. c. voltage signal formation module；Ac current signal, which forms module, includes reference voltage, fixed value resistance, derailing switch；By reference voltage value divided by fixed value resistance It is worth to current value；Derailing switch switchs according to predeterminated frequency, forms ac current signal；D. c. voltage signal, which forms module, includes DC-AC conversion device, voltage amplification device；DC-AC conversion device is by first The ac voltage signal that input, the second input receive is converted to d. c. voltage signal, forms transformation ratio；Voltage amplification fills Put big conversion coefficient.
- 5. the circuit of trans-impedance amplifier gain filler test according to claim 4, it is characterised in that the alternating current Signal, which forms module, includes operational amplifier I3, PMOS M0, PMOS M1, NMOS tube M2, fixed value resistance R0, clock signal Clock；Operational amplifier I3 inverting input sets reference voltage；Operational amplifier I3 output end connection PMOS M0's The grid of grid and PMOS M1；Operational amplifier I3 normal phase input end is with PMOS M0 drain electrode connection fixed value resistance R0's One end, fixed value resistance R0 other end ground connection；PMOS M0 source electrode is connected power supply Vdd with PMOS M1 source electrode；PMOS M1 drain electrode connection PMOS M2 drain electrode, PMOS M2 grid are controlled by clock signal Clock, and PMOS M2 source electrode is The AC signal output end.
- 6. the circuit of trans-impedance amplifier gain filler test according to claim 5, it is characterised in that the operation amplifier Device I3, PMOS M0, fixed value resistance R0 form feedback circuit；Fixed value resistance R0 clamps down on effect both end voltage due to feedback circuit It is identical with reference voltage；PMOS M0 and PMOS M1 forms current mirror, flows through PMOS M1, PMOS M2 electric current I1 is equal to Electric current I0；Electric current I1 flow to PMOS M2 drain electrode from PMOS M1 drain electrode；When clock signal Clock sends high level, PMOS M2 is turned on, I1 outflow PMOSs M2 source electrode, AC signal output end output I1；When clock signal Clock send it is low During level, PMOS M2 is not turned on, and AC signal output end is without output.
- 7. the circuit of trans-impedance amplifier gain filler test according to claim 4, it is characterised in that the alternating current-direct current turns Changing device includes difference amplifier, diode D0, diode D1, electric capacity C0；The first input end, the second input are as poor Be divided to two inputs of amplifier, two output ends of difference amplifier are the first difference output end, the second difference output end simultaneously And diode D0 positive pole, diode D1 positive pole are connected respectively；Diode D0 negative pole, diode D1 negative pole connection electric capacity C0 positive pole, electric capacity C0 negative pole ground connection, diode D0, diode D1 and electric capacity C0 form full-wave rectifying circuit；The voltage amplification device includes NMOS tube M3, NMOS tube M4, resistance R1；The leakage of NMOS tube M3 grid, NMOS tube M3 Pole, NMOS tube M4 grid are all connected with electric capacity C0 positive pole, NMOS tube M3 source electrode, NMOS tube M4 source grounding, NMOS Pipe M4 drain electrode connecting resistance R1 one end and DC voltage output end, resistance R1 another termination power.
- 8. the circuit of trans-impedance amplifier gain filler test according to claim 7, it is characterised in that difference AC voltage Signal is input to difference amplifier from first input end, the second input, then by the first difference output end, the second difference output end Output；When the output of the first difference output end is the positive amplitude of oscillation, diode D0 conductings, current flowing, difference AC voltage signal pair Electric capacity C0 charges；When the first difference output end exports the negative amplitude of oscillation, diode D0 cut-offs, electric capacity C0 does not charge；When the second difference When output end exports the positive amplitude of oscillation, diode D1 conductings, current flowing, difference AC voltage signal is to electric capacity C0 chargings；When second When the amplitude of oscillation is born in difference output end output, diode D1 cut-offs, electric capacity C0 does not charge；When the first difference output end is the positive amplitude of oscillation, the second difference output end is the negative amplitude of oscillation；When the first difference output end is negative pendulum During width, the second difference output end is the positive amplitude of oscillation；Difference AC voltage signal is by diode D0, diode D1 constantly to electric capacity C0 charges, and forms stable DC current signal.
- 9. the circuit of trans-impedance amplifier gain filler test according to claim 8, it is characterised in that NMOS tube M3 with NMOS tube M4 forms a proportional current mirror；The electric current I2 for flowing through NMOS tube M3 passes through the amplification of proportional current mirror and resistance R1, directly Flow voltage output end output d. c. voltage signal.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710580784.3A CN107345987B (en) | 2017-07-17 | 2017-07-17 | Method and circuit for gain screening test of transimpedance amplifier |
| PCT/CN2018/077380 WO2019015325A1 (en) | 2017-07-17 | 2018-02-27 | Transimpedance amplifier gain screening test method and circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710580784.3A CN107345987B (en) | 2017-07-17 | 2017-07-17 | Method and circuit for gain screening test of transimpedance amplifier |
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| CN107345987B CN107345987B (en) | 2023-07-21 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109061236A (en) * | 2018-07-25 | 2018-12-21 | 天地融电子（天津）有限公司 | A kind of equipment for testing charging chip |
| WO2019015325A1 (en) * | 2017-07-17 | 2019-01-24 | 厦门优迅高速芯片有限公司 | Transimpedance amplifier gain screening test method and circuit |
| CN111426902A (en) * | 2020-05-08 | 2020-07-17 | 成都迪谱光电科技有限公司 | Material mixing distinguishing method of BOSA device |
Families Citing this family (4)
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Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101216528A (en) * | 2008-01-15 | 2008-07-09 | 中国科学院上海微系统与信息技术研究所 | On-chip test method for microwave power amplifier chip and its test system |
| CN103516425A (en) * | 2013-09-24 | 2014-01-15 | 苏州火花云通讯科技有限公司 | Method used for measuring trans-impedance gain of trans-impedance amplifier |
| US20150048882A1 (en) * | 2013-08-19 | 2015-02-19 | Texas Instruments Deutschland Gmbh | Apparatus and method for testing of successful operation of transimpedance amplifiers |
| CN104569518A (en) * | 2014-12-26 | 2015-04-29 | 上海贝岭股份有限公司 | Trans-impedance amplifier mass production test signal source |
| WO2016179964A1 (en) * | 2015-05-08 | 2016-11-17 | 中兴通讯股份有限公司 | Detection circuit and detection method for high-side current |
| CN106940404A (en) * | 2017-03-10 | 2017-07-11 | 厦门优迅高速芯片有限公司 | A kind of circuit of the Gain Automatic measurement of built-in trans-impedance amplifier |
| CN207133360U (en) * | 2017-07-17 | 2018-03-23 | 厦门优迅高速芯片有限公司 | The circuit of trans-impedance amplifier gain filler test |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN203811692U (en) * | 2013-09-06 | 2014-09-03 | 苏州火花云通讯科技有限公司 | Measurement device |
| CN107345987B (en) * | 2017-07-17 | 2023-07-21 | 厦门优迅高速芯片有限公司 | Method and circuit for gain screening test of transimpedance amplifier |
-
2017
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Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101216528A (en) * | 2008-01-15 | 2008-07-09 | 中国科学院上海微系统与信息技术研究所 | On-chip test method for microwave power amplifier chip and its test system |
| US20150048882A1 (en) * | 2013-08-19 | 2015-02-19 | Texas Instruments Deutschland Gmbh | Apparatus and method for testing of successful operation of transimpedance amplifiers |
| CN103516425A (en) * | 2013-09-24 | 2014-01-15 | 苏州火花云通讯科技有限公司 | Method used for measuring trans-impedance gain of trans-impedance amplifier |
| CN104569518A (en) * | 2014-12-26 | 2015-04-29 | 上海贝岭股份有限公司 | Trans-impedance amplifier mass production test signal source |
| WO2016179964A1 (en) * | 2015-05-08 | 2016-11-17 | 中兴通讯股份有限公司 | Detection circuit and detection method for high-side current |
| CN106940404A (en) * | 2017-03-10 | 2017-07-11 | 厦门优迅高速芯片有限公司 | A kind of circuit of the Gain Automatic measurement of built-in trans-impedance amplifier |
| CN207133360U (en) * | 2017-07-17 | 2018-03-23 | 厦门优迅高速芯片有限公司 | The circuit of trans-impedance amplifier gain filler test |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019015325A1 (en) * | 2017-07-17 | 2019-01-24 | 厦门优迅高速芯片有限公司 | Transimpedance amplifier gain screening test method and circuit |
| CN109061236A (en) * | 2018-07-25 | 2018-12-21 | 天地融电子（天津）有限公司 | A kind of equipment for testing charging chip |
| CN111426902A (en) * | 2020-05-08 | 2020-07-17 | 成都迪谱光电科技有限公司 | Material mixing distinguishing method of BOSA device |
| CN111426902B (en) * | 2020-05-08 | 2022-01-28 | 成都蓉博通信技术有限公司 | Material mixing distinguishing method of BOSA device |
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| WO2019015325A1 (en) | 2019-01-24 |
| CN107345987B (en) | 2023-07-21 |
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