CN104569518A - Trans-impedance amplifier mass production test signal source - Google Patents
Trans-impedance amplifier mass production test signal source Download PDFInfo
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- CN104569518A CN104569518A CN201410852949.4A CN201410852949A CN104569518A CN 104569518 A CN104569518 A CN 104569518A CN 201410852949 A CN201410852949 A CN 201410852949A CN 104569518 A CN104569518 A CN 104569518A
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Abstract
The invention provides a trans-impedance amplifier mass production test signal source which generates high-speed alternating current signals used for mass production tests of a trans-impedance amplifier. The signal source comprises an oscillator circuit outputting high-speed clock signals, a bias current generation circuit outputting a first current with fixed bias, and a modulation circuit, wherein the two input ends of the modulation circuit are connected with the output end of the oscillator circuit and the output end of the bias current generation circuit respectively. The first current is modulated through the high-speed clock signals, and the high-speed alternating current signals are output. The trans-impedance amplifier mass production test signal source can be built in a trans-impedance amplifier circuit and provides signal input of high-speed alternating currents required by the mass production tests, and meanwhile stability and deviation situations of a chip manufacturing technology can be monitored and controlled. The circuits have the advantages that influences on a main signal channel are small, implementation is easy, occupied chip area is small, and extra power consumption is not consumed.
Description
Technical field
The present invention relates to a kind of test signal source, particularly for signal source that the volume production of trans-impedance amplifier is tested.
Background technology
Trans-impedance amplifier (Trans-Impedance Amplifier, TIA) is the important component part of optical communication field receiving end, and its performance determines the sensitivity of whole receiving loop.
TIA generally supplies in nude film mode, independently TO-CAN receiving unit (ROSA) or transceiver optical assembly (BOSA) is packaged into, so the volume production test of TIA chip can only carry out the test of wafer (WAFER) rank by special encapsulation manufacturer.
TIA circuit needs signal to be processed to be the AC signal of great dynamic range.But current main flow testing apparatus is not equipped with high speed alternator driven current mode signal source, so when carrying out volume production test, be difficult to carry out alternating-current measurement.Therefore some manufacturer abandons alternating-current measurement, in volume production test process, only carry out DC test, thus causes the coverage rate of chip testing greatly to reduce.Some manufacturer, in order to ensure test coverage, buys the special test signal source of customization, but higher owing to customizing the cost of testing apparatus, thus causes the testing cost substantially increasing chip.
Summary of the invention
The present invention, in order to solve the problems of the technologies described above, reduces the cost of TIA volume production test, improves test coverage, provides a kind of trans-impedance amplifier volume production testing source, comprising: pierce circuit, its clock signal; Bias current generative circuit, it exports first electric current with fixed bias; Modulation circuit, two input end is connected respectively to the output terminal of described pierce circuit and described bias current generative circuit, and it modulates described first electric current by described clock signal, and exports AC signal.
Further, described modulation circuit comprises the first NMOS tube, and its drain electrode is connected to the output terminal of described bias current generative circuit, and its grid is connected to the output terminal of described pierce circuit, and its source electrode is connected to the output terminal of described modulation circuit.The source electrode of described first NMOS tube is connected to the output terminal of described modulation circuit by the first resistance.
Preferably, described modulation circuit also comprises the second NMOS tube, its grid is connected to the output terminal of described pierce circuit by phase inverter, its drain electrode is connected to the output terminal of described bias current generative circuit, and its source electrode is by the 3rd NMOS tube ground connection of the second resistance of being connected in series and diode connecting-type.
Preferably, described pierce circuit has Enable Pin, and described Enable Pin is configured to, and keeps floating state, connect high level when volume production is tested when non-volume production test.This signal source also comprises level and suppresses circuit, it comprises first node, described first node is connected to accessory power supply by the 4th PMOS and by the 5th NMOS tube ground connection, the grid of described 4th PMOS and the 5th NMOS tube is all connected to accessory power supply, wherein, described first node is connected with the Enable Pin of described pierce circuit.
Further, described bias current generative circuit comprises the 6th and the 7th PMOS be connected in series, the source electrode of described 6th PMOS is connected to accessory power supply, the drain electrode of described 7th PMOS is connected to the output terminal of described bias current generative circuit, described 6th is connected the first and second bias voltages respectively with the grid of the 7th PMOS, and described first bias voltage is greater than described second bias voltage.
Further, described pierce circuit is CMOS ring oscillator circuit.
Trans-impedance amplifier volume production testing source of the present invention, can in build in trans-impedance amplifier circuit, the signal input providing volume production to test the high speed exchange current needed, simultaneously can also the degree of stability of monitoring chip manufacturing process and drift condition.This circuit has main signal path impact little, and be easy to realize, chip occupying area is little, does not consume the advantages such as extra power consumption.
Accompanying drawing explanation
Fig. 1 is the electrical block diagram of trans-impedance amplifier volume production testing source of the present invention;
Fig. 2 is the electrical block diagram of an embodiment of trans-impedance amplifier volume production testing source of the present invention;
Fig. 3 is the electrical block diagram of another embodiment of trans-impedance amplifier volume production testing source of the present invention;
Fig. 4 is the electrical block diagram of the bias current generative circuit in Fig. 1;
Fig. 5 is the electrical block diagram of the pierce circuit in Fig. 1.
Embodiment
Below in conjunction with the drawings and specific embodiments, trans-impedance amplifier volume production testing source of the present invention is described in further detail, but not as a limitation of the invention.
With reference to Fig. 1, it is the electrical block diagram of trans-impedance amplifier volume production testing source of the present invention.Trans-impedance amplifier volume production testing source of the present invention, for producing high speed AC signal in the volume production test of trans-impedance amplifier, it comprises: export the pierce circuit 200 of high-speed clock signal Clk, export bias current generative circuit 100 and the modulation circuit 300 with the first electric current I 1 of fixed bias.Wherein, two input ends of modulation circuit 300 are connected respectively to the output terminal of pierce circuit 200 and bias current generative circuit 100, for receiving high-speed clock signal Clk and the first electric current I 1, this pierce circuit 200 high-speed clock signal Clk modulates the first electric current I 1, exports high speed AC signal I2.
This high speed exchange current I2 can be used for the volume production test of TIA, and it is admitted to TIA circuit when volume production is tested, and TIA circuit makes AC signal change alternating voltage signal into.Input alternating signal can impel TIA main circuit node to overturn, and greatly improves the test coverage of chip.Timeliness coverage manufacturing defect, avoids defective product to come into the market.
The mode that the present invention modulates a constant current source by built-in pierce circuit produces high speed exchange current, as the input signal source of TIA volume production test, be easy to realize, and chip occupying area is little, while raising volume production test coverage, reduces volume production testing cost.
With reference to Fig. 2, it is the electrical block diagram of an embodiment of trans-impedance amplifier volume production testing source of the present invention.In this embodiment, modulation circuit 300 comprises the first NMOS tube M1, its drain electrode is connected to the output terminal of bias current generative circuit 100 for receiving the first electric current I 1, its grid is connected to the output terminal of pierce circuit 200 for receiving high-speed clock signal Clk, its source electrode is connected to the output terminal of modulation circuit 300, exports high speed AC signal I2.In order to reduce the stray capacitance of metal-oxide-semiconductor M1 to the impact of the input end of TIA circuit 400, metal-oxide-semiconductor M1 is avoided to introduce extra load capacitance at the input end of TIA circuit 400, preferably, the source electrode of this first NMOS tube M1 is connected to the output terminal of modulation circuit 300 by the first resistance R1.
With reference to Fig. 3, it is the electrical block diagram of another embodiment of trans-impedance amplifier volume production testing source of the present invention.In this embodiment, modulation circuit 300 not only comprises the first branch road be made up of the first NMOS tube M1 and the first resistance R1, also comprise the second branch road, this second branch road comprises the second NMOS tube M2, its grid is connected to the output terminal of pierce circuit 200 by phase inverter, its drain electrode is connected to the output terminal of bias current generative circuit 100, and its source electrode is by the 3rd NMOS tube M3 ground connection of the second resistance R2 of being connected in series and diode connecting-type.
In this embodiment, the input of the clock signal of modulation circuit 300 have employed difference modes, to reduce the impact of clock signal on AC signal, thus improves the burr of the AC signal exported, improves the integrality of output signal.
As shown in Figure 2, pierce circuit 200 has Enable Pin En, and described Enable Pin is configured to, and keeps floating state, connect high level when volume production is tested when non-volume production test.That is, when volume production is tested, only input high level need be held at PAD1.
In order to ensure that this signal source does not work when TIA circuit 400 normally works, needing this Enable Pin En to be connected to a level and suppressing circuit 500.As shown in Figure 3, level suppresses circuit 500 to comprise first node A, this first node A is connected to accessory power supply VDD by the 4th PMOS M4, and by the 5th NMOS tube M5 ground connection, the grid of the 4th PMOS M4 and the 5th NMOS tube M5 is all connected to accessory power supply VDD.The Enable Pin En of pierce circuit 200 is connected to the first node A of level suppression circuit 500.Therefore, when TIA circuit 400 normally works, PAD1 holds not input high level, and Enable Pin En is pulled down to low level by the 5th NMOS tube; When needing the volume production test carrying out TIA circuit 400, only input high level need be held to get final product enables oscillator circuit 200 at PAD1.
Due to setting and the use of the Enable Pin of pierce circuit, this signal source is not worked under non-volume production test pattern, thus reduce its impact on main signal path, and do not produce unnecessary power consumption.
The circuit structure of bias current generative circuit 100 and pierce circuit 200 respectively can with reference to Fig. 4 and Fig. 5.Wherein, bias current generative circuit 100 comprises the 6th PMOS M6 and the 7th PMOS M7 that are connected in series, the source electrode of the 6th PMOS M6 is connected to accessory power supply VDD, the drain electrode of the 7th PMOS M7 exports the first electric current I 1, their grid connects the first bias voltage Vbp and the second bias voltage Vbc respectively, wherein, the first bias voltage Vbp is slightly larger than the second bias voltage Vbc.Pierce circuit 200 is preferably CMOS ring oscillator circuit, and it comprises the phase inverter of multiple cascade.It should be noted that, because Fig. 5 is the schematic diagram of pierce circuit, therefore its Enable Pin En is not shown in Figure 5.
Because when volume production is tested, the frequency of the alternating voltage signal of TIA circuit 400 output is identical with the frequency of the clock signal C lk that pierce circuit 200 exports, therefore, the drift situation of manufacturing process can be monitored by the output signal detecting PAD2 end.
Trans-impedance amplifier volume production testing source of the present invention, can in build in trans-impedance amplifier circuit, the signal input providing volume production to test the high speed exchange current needed, simultaneously can also the degree of stability of monitoring chip manufacturing process and drift condition.This circuit has main signal path impact little, and be easy to realize, chip occupying area is little, does not consume the advantages such as extra power consumption.
Above embodiment is only illustrative embodiments of the present invention, can not be used for limiting the present invention, and protection scope of the present invention is defined by the claims.Those skilled in the art can in essence of the present invention and protection domain, and make various amendment or equivalent replacement to the present invention, these are revised or be equal to replacement and also should be considered as dropping in protection scope of the present invention.
Claims (8)
1. a trans-impedance amplifier volume production testing source, comprising:
Pierce circuit, its clock signal;
Bias current generative circuit, it exports first electric current with fixed bias;
Modulation circuit, two input end is connected respectively to the output terminal of described pierce circuit and described bias current generative circuit, and it modulates described first electric current by described clock signal, and exports AC signal.
2. trans-impedance amplifier volume production testing source according to claim 1, it is characterized in that, described modulation circuit comprises the first NMOS tube, its drain electrode is connected to the output terminal of described bias current generative circuit, its grid is connected to the output terminal of described pierce circuit, and its source electrode is connected to the output terminal of described modulation circuit.
3. trans-impedance amplifier volume production testing source according to claim 2, is characterized in that, the source electrode of described first NMOS tube is connected to the output terminal of described modulation circuit by the first resistance.
4. trans-impedance amplifier volume production testing source according to claim 3, it is characterized in that, described modulation circuit also comprises the second NMOS tube, its grid is connected to the output terminal of described pierce circuit by phase inverter, its drain electrode is connected to the output terminal of described bias current generative circuit, and its source electrode is by the 3rd NMOS tube ground connection of the second resistance of being connected in series and diode connecting-type.
5. trans-impedance amplifier volume production testing source according to claim 1, it is characterized in that, described pierce circuit has Enable Pin, and described Enable Pin is configured to, and keeps floating state, connect high level when volume production is tested when non-volume production test.
6. trans-impedance amplifier volume production testing source according to claim 5, it is characterized in that, this signal source also comprises level and suppresses circuit, it comprises first node, described first node is connected to accessory power supply by the 4th PMOS and by the 5th NMOS tube ground connection, the grid of described 4th PMOS and the 5th NMOS tube is all connected to accessory power supply, and wherein, described first node is connected with the Enable Pin of described pierce circuit.
7. trans-impedance amplifier volume production testing source according to claim 1, it is characterized in that, described bias current generative circuit comprises the 6th and the 7th PMOS be connected in series, the source electrode of described 6th PMOS is connected to accessory power supply, the drain electrode of described 7th PMOS is connected to the output terminal of described bias current generative circuit, described 6th is connected the first and second bias voltages respectively with the grid of the 7th PMOS, and described first bias voltage is greater than described second bias voltage.
8. trans-impedance amplifier volume production testing source according to claim 1, is characterized in that, described pierce circuit is CMOS ring oscillator circuit.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410852949.4A CN104569518A (en) | 2014-12-26 | 2014-12-26 | Trans-impedance amplifier mass production test signal source |
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| CN201410852949.4A CN104569518A (en) | 2014-12-26 | 2014-12-26 | Trans-impedance amplifier mass production test signal source |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN106940404A (en) * | 2017-03-10 | 2017-07-11 | 厦门优迅高速芯片有限公司 | A kind of circuit of the Gain Automatic measurement of built-in trans-impedance amplifier |
| CN107345987A (en) * | 2017-07-17 | 2017-11-14 | 厦门优迅高速芯片有限公司 | The method and circuit of trans-impedance amplifier gain filler test |
| CN111426902A (en) * | 2020-05-08 | 2020-07-17 | 成都迪谱光电科技有限公司 | Material mixing distinguishing method of BOSA device |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107345987A (en) * | 2017-07-17 | 2017-11-14 | 厦门优迅高速芯片有限公司 | The method and circuit of trans-impedance amplifier gain filler test |
| CN107345987B (en) * | 2017-07-17 | 2023-07-21 | 厦门优迅高速芯片有限公司 | Method and circuit for gain screening test of transimpedance amplifier |
| CN111426902A (en) * | 2020-05-08 | 2020-07-17 | 成都迪谱光电科技有限公司 | Material mixing distinguishing method of BOSA device |
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