CN107293242B - Testing method, manufacturing method, control method and control device of liquid crystal display device - Google Patents

Testing method, manufacturing method, control method and control device of liquid crystal display device Download PDF

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Publication number
CN107293242B
CN107293242B CN201710685997.2A CN201710685997A CN107293242B CN 107293242 B CN107293242 B CN 107293242B CN 201710685997 A CN201710685997 A CN 201710685997A CN 107293242 B CN107293242 B CN 107293242B
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liquid crystal
crystal display
display device
conductive pattern
voltage
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CN107293242A (en
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刘晓龙
王世豪
张永新
王志成
李媛媛
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BOE Technology Group Co Ltd
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BOE Technology Group Co Ltd
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Abstract

The invention provides a testing method, a manufacturing method, a control method and a control device of a liquid crystal display device, and belongs to the technical field of display. The liquid crystal display device comprises a color film substrate and an array substrate, wherein a conductive pattern is arranged on the array substrate, an anti-static layer is arranged on the color film substrate, and the anti-static layer is electrically connected with the conductive pattern, and the test method comprises the following steps: acquiring a corresponding relation between a plurality of groups of optimal voltages input into the conductive pattern and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relations, when the optimal voltages are input into the conductive pattern under the starting-up time of the corresponding liquid crystal display device, the flicker value of the liquid crystal display device is minimum; and establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations. The technical scheme of the invention can solve the problem of image retention caused by direct-current bias voltage.

Description

Testing method, manufacturing method, control method and control device of liquid crystal display device
Technical Field
The invention relates to the technical field of display, in particular to a test method, a manufacture method, a control method and a control device of a liquid crystal display device.
Background
An Advanced super Dimension Switch (ADS) liquid crystal display device generally includes: the liquid crystal display panel comprises a color Film substrate, an array substrate, a liquid crystal layer, frame sealing glue and a printed circuit board, wherein a black matrix and a light resistor are arranged on the color Film substrate, a Thin-Film Transistor (TFT) is arranged on the array substrate, and a spacer is arranged in the liquid crystal layer. In the manufacturing and using processes of the liquid crystal display device, static electricity is generated and accumulated on the color film substrate, when the static electricity is accumulated to a certain degree, an electrostatic field is generated, the electrostatic field can interfere with an electric field of liquid crystal molecules in the liquid crystal panel, and the display picture is abnormal from the side, so that the liquid crystal display device is very important for shielding or eliminating the external static electricity. The prior art eliminates the influence of external static electricity on the liquid crystal display device mainly by the following ways: the anti-static layer is arranged on the outer surface of the color film substrate and is connected with the grounding end on the array substrate by coating conductive silver adhesive, so that the effect of preventing static electricity is achieved.
Afterimage, also called Image Sticking, is a picture that remains still on the screen for a long time, and even if the content of the displayed picture is changed, the trace of the previous still Image can still be seen on the screen.
The reason for the formation of the residual image is mainly caused by the combined action of the ionic impurities in the liquid crystal display screen and the DC bias voltage on the driving. Due to the limitations of pixel structure, process technology, etc., where the ac driving in the pixel region is asymmetric, the voltage portion deviating from the center of symmetry is the dc bias voltage. Due to the existence of ionic impurities, the ionic impurities can be attracted by the DC bias voltage, so that residual DC bias voltage is formed at the place where the AC drive is asymmetric. When switching the next screen, the liquid crystal molecules are affected by the ionic impurities and cannot maintain the required alignment state, thereby forming an afterimage of the previous screen.
The ADS liquid crystal display screen is driven to turn over by a transverse electric field, and the direct-current bias voltage is a longitudinal electric field, so that the problem of image retention caused by the direct-current bias voltage is difficult to solve.
Disclosure of Invention
The invention aims to provide a testing method, a manufacturing method, a control method and a control device of a liquid crystal display device, which can solve the problem of image retention caused by direct-current bias voltage.
To solve the above technical problem, embodiments of the present invention provide the following technical solutions:
on one hand, the testing method of the liquid crystal display device is provided, the liquid crystal display device comprises a color film substrate and an array substrate, a conductive pattern is arranged on the array substrate, an anti-static layer is arranged on the color film substrate, and the anti-static layer is electrically connected with the conductive pattern, and the testing method comprises the following steps:
acquiring a corresponding relation between a plurality of groups of optimal voltages input into the conductive pattern and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relations, when the optimal voltages are input into the conductive pattern under the starting-up time of the corresponding liquid crystal display device, the flicker value of the liquid crystal display device is minimum;
and establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations.
Further, the obtaining the correspondence between the optimal voltages of the plurality of sets of input conductive patterns and the power-on duration of the liquid crystal display device includes:
a corresponding relation obtaining step: inputting different voltages to the conductive pattern at a test time point, measuring the flicker value of the liquid crystal display device at the same time, obtaining a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the startup time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the startup time of the liquid crystal display device;
and repeating the corresponding relation obtaining step at different test time points to obtain the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
Further, before the step of obtaining the corresponding relationship, the testing method further includes:
and inputting 0V voltage to the conductive pattern.
The embodiment of the invention also provides a testing device of a liquid crystal display device, the liquid crystal display device comprises a color film substrate and an array substrate, the array substrate is provided with a conductive pattern, the color film substrate is provided with an anti-static layer, the anti-static layer is electrically connected with the conductive pattern, and the testing device comprises:
the acquisition module is used for acquiring the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relation, the flicker value of the liquid crystal display device is minimum when the optimal voltages are input by the conductive patterns under the starting-up time of the corresponding liquid crystal display device;
and the first relation curve establishing module is used for establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations.
Further, the obtaining module comprises:
the corresponding relation obtaining unit is used for inputting different voltages to the conductive pattern at a test time point, simultaneously measuring the flicker value of the liquid crystal display device to obtain a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the starting-up time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the starting-up time of the liquid crystal display device; and repeatedly acquiring the corresponding relation at different test time points, and acquiring the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
Further, the test device further comprises:
and the grounding module is used for inputting 0V voltage to the conductive pattern before the corresponding relation is obtained.
The embodiment of the invention also provides a control method of the liquid crystal display device, which comprises the following steps:
acquiring a first relation curve of the liquid crystal display device by using the testing method;
and determining the voltage input to the conductive pattern at each moment after the liquid crystal display device is started up by using the first relation curve, and inputting the voltage to the conductive pattern at the corresponding moment.
Further, the determining, by using the first relation curve, the voltage input to the conductive pattern at each time after the liquid crystal display device is turned on includes:
and determining the starting-up time of the liquid crystal display device at each moment after the liquid crystal display device is started up, searching the optimal voltage corresponding to the starting-up time by using the first relation curve, and determining the optimal voltage as the voltage which is input to the conductive pattern at any moment.
An embodiment of the present invention further provides a control device for a liquid crystal display device, including:
a first relation curve obtaining module for obtaining the first relation curve of the liquid crystal display device by the testing method
And the processing module is used for determining the voltage input to the conductive pattern at each moment after the liquid crystal display device is started up by using the first relation curve and inputting the voltage to the conductive pattern at the corresponding moment.
Further, the processing module is specifically configured to determine a power-on duration of the liquid crystal display device at each time after the liquid crystal display device is powered on, search for an optimal voltage corresponding to the power-on duration by using the first relationship curve, and determine the optimal voltage as a voltage that is input to the conductive pattern at a certain time.
The embodiment of the invention has the following beneficial effects:
in the scheme, the array substrate of the liquid crystal display device is provided with the conductive pattern connected with the anti-static layer on the color film substrate, an electrostatic field can be established by inputting voltage to the conductive pattern, a first relation curve between the optimal voltage for inputting the conductive pattern and the startup duration of the liquid crystal display device is established through experiments, then the voltage input to the conductive pattern at each moment after the liquid crystal display device is started is determined by using the first relation curve, the voltage is input to the conductive pattern at the corresponding moment, and the direct-current bias voltage in the liquid crystal display device is offset by introducing external static electricity, so that the problem of image sticking caused by the direct-current bias voltage is solved, and the display quality of the liquid crystal display panel is improved.
Drawings
FIG. 1 is a schematic cross-sectional view of a conventional LCD device;
FIG. 2 is a schematic plan view of a conventional LCD device;
FIG. 3 is a schematic flow chart illustrating a testing method of an LCD device according to an embodiment of the present invention;
FIG. 4 is a diagram illustrating a first relationship curve according to an embodiment of the present invention;
FIG. 5 is a diagram illustrating a second relationship curve according to the embodiment of the present invention;
FIG. 6 is a block diagram of a testing apparatus for a liquid crystal display device according to an embodiment of the present invention;
FIG. 7 is a flowchart illustrating a method for controlling a liquid crystal display device according to an embodiment of the present invention;
FIG. 8 is a block diagram of a control device of a liquid crystal display device according to an embodiment of the present invention.
Reference numerals
1 array substrate
2 color film substrate
3 antistatic layer
4 conductive connecting line
5 conductive pattern
Detailed Description
In order to make the technical problems, technical solutions and advantages to be solved by the embodiments of the present invention clearer, the following detailed description will be given with reference to the accompanying drawings and specific embodiments.
The embodiment of the invention provides a test method, a manufacturing method, a control method and a control device of a liquid crystal display device, aiming at the problem that the image retention problem caused by direct-current bias voltage is difficult to solve in the prior art, and the image retention problem caused by the direct-current bias voltage can be solved.
Fig. 1 and 2 are schematic structural diagrams of a conventional liquid crystal display device, and as shown in fig. 1 and 2, the liquid crystal display device includes a color film substrate 2 and an array substrate 1, a conductive pattern 5 is disposed on the array substrate 1, the conductive pattern 5 is connected to a predetermined ground point, an anti-static layer 3 is disposed on the color film substrate 2, the anti-static layer 3 is generally made of transparent conductive materials such as ITO, and the anti-static layer 3 is connected to the conductive pattern 5 through a conductive connection line 4.
In the prior art, the ADS liquid crystal display screen is driven to turn over by a transverse electric field, and the direct current bias voltage is a longitudinal electric field, so that the problem of image retention caused by the direct current bias voltage is difficult to solve.
If the dc bias voltage inside the liquid crystal display device is to be offset, the voltage introduced into the anti-static layer 3 needs to be opposite in polarity to the dc bias voltage, and in addition, a specific voltage value of the voltage introduced into the anti-static layer 3 needs to be obtained. Unlike the prior art, in order to introduce a voltage to the antistatic layer 3, the present invention does not connect the conductive pattern 5 to the ground at all times, but rather introduces a voltage to the antistatic layer 3 by inputting a voltage to the conductive pattern 5.
To this end, an embodiment of the present invention provides a method for testing a liquid crystal display device, as shown in fig. 1 and fig. 2, where the liquid crystal display device includes a color film substrate 2 and an array substrate 1, a conductive pattern 5 is disposed on the array substrate 1, an anti-static layer 3 is disposed on the color film substrate 2, and the anti-static layer 3 is electrically connected to the conductive pattern 5, as shown in fig. 3, the method includes:
step 101: acquiring a corresponding relation between a plurality of groups of optimal voltages input into the conductive pattern and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relations, when the optimal voltages are input into the conductive pattern under the starting-up time of the corresponding liquid crystal display device, the flicker value of the liquid crystal display device is minimum;
step 102: and establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations.
Further, the obtaining the correspondence between the optimal voltages of the plurality of sets of input conductive patterns and the power-on duration of the liquid crystal display device includes:
a corresponding relation obtaining step: inputting different voltages to the conductive pattern at a test time point, measuring the flicker value of the liquid crystal display device at the same time, obtaining a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the startup time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the startup time of the liquid crystal display device;
and repeating the corresponding relation obtaining step at different test time points to obtain the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
As shown in fig. 4, first, a voltage is input to the conductive pattern at a time point T1, and the magnitude of the voltage is adjusted to obtain a relationship curve S1 (i.e., the second relationship curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; then inputting a voltage to the conductive pattern at a time point T2, and adjusting the voltage to obtain a relation curve S2 (i.e. the second relation curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; inputting a voltage to the conductive pattern at a time point T3, and adjusting the voltage to obtain a relation curve S3 (i.e. the second relation curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; then, the voltage is input to the conductive pattern at the time point T4, the magnitude of the voltage is adjusted, and a relationship curve S4 (i.e., the second relationship curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device is obtained.
Preferably, the testing steps are executed at a plurality of time points within 1 hour from the time when the liquid crystal display device is turned on to the time when the liquid crystal display device is turned on, so as to obtain a plurality of second relation curves. Generally, after the liquid crystal display device is turned on for a long time (for example, 1 hour), the operating state of the liquid crystal display device tends to be stable, and therefore, the total test time can be designed to be 1 hour after the liquid crystal display device is turned on.
As can be seen from fig. 4, the flicker value of the liquid crystal display device is related to the voltage inputted to the conductive pattern, and since the flicker value of the liquid crystal display device is related to the afterimage of the liquid crystal display device, the afterimage problem of the liquid crystal display device is also related to the voltage inputted to the conductive pattern, which is considered to be the optimum voltage inputted to the conductive pattern when the flicker value of the liquid crystal display device is the minimum. The optimum voltage of the input conductive pattern at a test time point can be obtained according to the second relation curve, and the starting time of the liquid crystal display device at the time can be determined, so that the corresponding relation between the starting time of the liquid crystal display device and the optimum voltage of the input conductive pattern is established. A set of corresponding relationships can be obtained by using one second relationship curve, a plurality of sets of corresponding relationships can be obtained by using a plurality of sets of second relationship curves, and a first relationship curve between the optimum voltage of the input conductive pattern and the start-up time of the liquid crystal display device as shown in fig. 5 can be established according to the plurality of sets of corresponding relationships, so that the optimum voltage of the input conductive pattern at the present time can be known when the start-up time of the liquid crystal display device is determined.
Further, before the step of obtaining the corresponding relationship, the testing method further includes: and inputting 0V voltage to the conductive pattern. Therefore, static electricity accumulated on the anti-static layer 3 can be guided away, and influence of the static electricity accumulated on the anti-static layer 3 on display of the liquid crystal display device is avoided.
The embodiment of the present invention further provides a testing apparatus of a liquid crystal display device, as shown in fig. 1 and fig. 2, the liquid crystal display device includes a color film substrate 2 and an array substrate 1, a conductive pattern 5 is disposed on the array substrate 1, an anti-static layer 3 is disposed on the color film substrate 2, the anti-static layer 3 is electrically connected to the conductive pattern 5, as shown in fig. 6, the testing apparatus includes:
an obtaining module 21, configured to obtain a correspondence between a plurality of sets of optimal voltages input to the conductive pattern and a power-on duration of the liquid crystal display device, where in each set of correspondence, when the optimal voltage is input to the conductive pattern in a power-on duration of the corresponding liquid crystal display device, a flicker value of the liquid crystal display device is minimum;
a first relation curve establishing module 22, configured to establish a first relation curve between the optimal voltage and the start-up time of the liquid crystal display device according to the multiple sets of corresponding relations.
Further, the obtaining module 21 includes:
the corresponding relation obtaining unit is used for inputting different voltages to the conductive pattern at a test time point, simultaneously measuring the flicker value of the liquid crystal display device to obtain a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the starting-up time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the starting-up time of the liquid crystal display device; and repeatedly acquiring the corresponding relation at different test time points, and acquiring the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
As shown in fig. 4, first, a voltage is input to the conductive pattern at a time point T1, and the magnitude of the voltage is adjusted to obtain a relationship curve S1 (i.e., the second relationship curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; then inputting a voltage to the conductive pattern at a time point T2, and adjusting the voltage to obtain a relation curve S2 (i.e. the second relation curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; inputting a voltage to the conductive pattern at a time point T3, and adjusting the voltage to obtain a relation curve S3 (i.e. the second relation curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device; then, the voltage is input to the conductive pattern at the time point T4, the magnitude of the voltage is adjusted, and a relationship curve S4 (i.e., the second relationship curve) between the voltage of the input conductive pattern and the flicker value of the liquid crystal display device is obtained.
Preferably, the testing steps are executed at a plurality of time points within 1 hour from the time when the liquid crystal display device is turned on to the time when the liquid crystal display device is turned on, so as to obtain a plurality of second relation curves. Generally, after the liquid crystal display device is turned on for a long time (for example, 1 hour), the operating state of the liquid crystal display device tends to be stable, and therefore, the total test time can be designed to be 1 hour after the liquid crystal display device is turned on.
As can be seen from fig. 4, the flicker value of the liquid crystal display device is related to the voltage inputted to the conductive pattern, and since the flicker value of the liquid crystal display device is related to the afterimage of the liquid crystal display device, the afterimage problem of the liquid crystal display device is also related to the voltage inputted to the conductive pattern, which is considered to be the optimum voltage inputted to the conductive pattern when the flicker value of the liquid crystal display device is the minimum. The optimum voltage of the input conductive pattern at a test time point can be obtained according to the second relation curve, and the starting time of the liquid crystal display device at the time can be determined, so that the corresponding relation between the starting time of the liquid crystal display device and the optimum voltage of the input conductive pattern is established. A set of corresponding relationships can be obtained by using one second relationship curve, a plurality of sets of corresponding relationships can be obtained by using a plurality of sets of second relationship curves, and a first relationship curve between the optimum voltage of the input conductive pattern and the start-up time of the liquid crystal display device as shown in fig. 5 can be established according to the plurality of sets of corresponding relationships, so that the optimum voltage of the input conductive pattern at the present time can be known when the start-up time of the liquid crystal display device is determined.
Further, the test device further comprises:
and the grounding module is used for inputting 0V voltage to the conductive pattern 5 before the corresponding relation is obtained. Therefore, static electricity accumulated on the anti-static layer 3 can be guided away, and influence of the static electricity accumulated on the anti-static layer 3 on display of the liquid crystal display device is avoided.
An embodiment of the present invention further provides a control method of a liquid crystal display device, as shown in fig. 1 and fig. 2, the liquid crystal display device includes a color film substrate 2 and an array substrate 1, a conductive pattern 5 is disposed on the array substrate 1, an anti-static layer 3 is disposed on the color film substrate 2, and the anti-static layer 3 is electrically connected to the conductive pattern 5, as shown in fig. 7, the control method includes:
step 201: acquiring a first relation curve of the liquid crystal display device by using the testing method;
step 202: and determining the voltage input to the conductive pattern at each moment after the liquid crystal display device is started up by using the first relation curve, and inputting the voltage to the conductive pattern at the corresponding moment.
Experiments show that the afterimage is serious when the voltage in the same direction as the dc bias voltage is increased, and the afterimage is effectively reduced when the reverse voltage is increased, so that the polarity of the voltage input to the conductive pattern is opposite to the polarity of the dc bias voltage inside the liquid crystal display device.
In the embodiment, a first relation curve between the optimal voltage of the input conductive pattern and the startup duration of the liquid crystal display device is firstly obtained, then the voltage input to the conductive pattern at each moment after the liquid crystal display device is started is determined by using the first relation curve, the voltage is input to the conductive pattern at the corresponding moment, and the direct current bias voltage in the liquid crystal display device is offset by introducing external static electricity, so that the image sticking problem caused by the direct current bias voltage is solved, and the display quality of the liquid crystal display panel is improved.
Further, the determining, by using the first relation curve, the voltage input to the conductive pattern at each time after the liquid crystal display device is turned on includes:
and determining the starting-up time of the liquid crystal display device at each moment after the liquid crystal display device is started up, searching the optimal voltage corresponding to the starting-up time by using the first relation curve, and determining the optimal voltage as the voltage which is input to the conductive pattern at any moment.
An embodiment of the present invention further provides a control device of a liquid crystal display device, as shown in fig. 1 and fig. 2, the liquid crystal display device includes a color film substrate 2 and an array substrate 1, a conductive pattern 5 is disposed on the array substrate 1, an anti-static layer 3 is disposed on the color film substrate 2, the anti-static layer 3 is electrically connected to the conductive pattern 5, as shown in fig. 8, the control device includes:
a first relation curve obtaining module 41, configured to obtain the first relation curve of the liquid crystal display device by using the testing method as described above
And the processing module 42 is configured to determine, by using the first relation curve, a voltage input to the conductive pattern at each time after the liquid crystal display device is turned on, and input the voltage to the conductive pattern at a corresponding time.
Experiments show that the afterimage is serious when the voltage in the same direction as the dc bias voltage is increased, and the afterimage is effectively reduced when the reverse voltage is increased, so that the polarity of the voltage input to the conductive pattern is opposite to the polarity of the dc bias voltage inside the liquid crystal display device.
In the embodiment, a first relation curve between the optimal voltage of the input conductive pattern and the startup duration of the liquid crystal display device is firstly obtained, then the voltage input to the conductive pattern at each moment after the liquid crystal display device is started is determined by using the first relation curve, the voltage is input to the conductive pattern at the corresponding moment, and the direct current bias voltage in the liquid crystal display device is offset by introducing external static electricity, so that the image sticking problem caused by the direct current bias voltage is solved, and the display quality of the liquid crystal display panel is improved.
Further, the processing module 42 is specifically configured to determine a power-on duration of the liquid crystal display device at each time after the liquid crystal display device is powered on, search for an optimal voltage corresponding to the power-on duration by using the first relationship curve, and determine the optimal voltage as a voltage that is input to the conductive pattern at any time.
Unless defined otherwise, technical or scientific terms used herein shall have the ordinary meaning as understood by one of ordinary skill in the art to which this invention belongs. The use of "first," "second," and similar terms in this disclosure is not intended to indicate any order, quantity, or importance, but rather is used to distinguish one element from another. The word "comprising" or "comprises", and the like, means that the element or item listed before the word covers the element or item listed after the word and its equivalents, but does not exclude other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
While the foregoing is directed to the preferred embodiment of the present invention, it will be understood by those skilled in the art that various changes and modifications may be made without departing from the spirit and scope of the invention as defined in the appended claims.

Claims (8)

1. The testing method of the liquid crystal display device is characterized by comprising the following steps of:
acquiring a corresponding relation between a plurality of groups of optimal voltages input into the conductive pattern and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relations, when the optimal voltages are input into the conductive pattern under the starting-up time of the corresponding liquid crystal display device, the flicker value of the liquid crystal display device is minimum;
establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations;
before obtaining the corresponding relationship between the optimal voltages input into the conductive patterns and the startup duration of the liquid crystal display device, the test method further comprises the following steps:
and inputting 0V voltage to the conductive pattern.
2. The method according to claim 1, wherein the obtaining the correspondence between the optimum voltages for inputting the plurality of sets of the conductive patterns and the power-on time of the liquid crystal display device comprises:
a corresponding relation obtaining step: inputting different voltages to the conductive pattern at a test time point, measuring the flicker value of the liquid crystal display device at the same time, obtaining a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the startup time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the startup time of the liquid crystal display device;
and repeating the corresponding relation obtaining step at different test time points to obtain the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
3. The utility model provides a testing arrangement of liquid crystal display device, liquid crystal display device includes various membrane base plate and array substrate, be provided with the conducting pattern on the array substrate, be provided with antistatic backing on the various membrane base plate, antistatic backing with the conducting pattern electricity is connected, its characterized in that, testing arrangement includes:
the acquisition module is used for acquiring the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device, wherein in each group of corresponding relation, the flicker value of the liquid crystal display device is minimum when the optimal voltages are input by the conductive patterns under the starting-up time of the corresponding liquid crystal display device;
the first relation curve establishing module is used for establishing a first relation curve between the optimal voltage and the starting-up time of the liquid crystal display device according to the plurality of groups of corresponding relations;
and the grounding module is used for inputting 0V voltage to the conductive pattern before the corresponding relation is obtained.
4. The apparatus for testing a liquid crystal display device according to claim 3, wherein the obtaining module comprises:
the corresponding relation obtaining unit is used for inputting different voltages to the conductive pattern at a test time point, simultaneously measuring the flicker value of the liquid crystal display device to obtain a second relation curve between the flicker value of the liquid crystal display device and the voltage input by the conductive pattern at the test time point, determining the starting-up time of the liquid crystal display device and the optimal voltage input by the conductive pattern when the flicker value of the liquid crystal display device is minimum at the test time point according to the second relation curve, and obtaining the corresponding relation between the optimal voltage input by the conductive pattern and the starting-up time of the liquid crystal display device; and repeatedly acquiring the corresponding relation at different test time points, and acquiring the corresponding relation between the optimal voltages of the multiple groups of input conductive patterns and the starting-up time of the liquid crystal display device.
5. A method for controlling a liquid crystal display device, comprising:
acquiring a first relation curve of the liquid crystal display device by using the test method according to any one of claims 1-2;
and determining the voltage input to the conductive pattern at each moment after the liquid crystal display device is started up by using the first relation curve, and inputting the voltage to the conductive pattern at the corresponding moment.
6. The method according to claim 5, wherein the determining the voltage input to the conductive pattern at each time after the liquid crystal display device is turned on using the first relationship curve comprises:
and determining the starting-up time of the liquid crystal display device at each moment after the liquid crystal display device is started up, searching the optimal voltage corresponding to the starting-up time by using the first relation curve, and determining the optimal voltage as the voltage which is input to the conductive pattern at any moment.
7. A control device for a liquid crystal display device, comprising:
a first relation curve obtaining module for obtaining a first relation curve of the liquid crystal display device by using the test method according to any one of claims 1 to 2
And the processing module is used for determining the voltage input to the conductive pattern at each moment after the liquid crystal display device is started up by using the first relation curve and inputting the voltage to the conductive pattern at the corresponding moment.
8. The control device of the liquid crystal display device according to claim 7,
the processing module is specifically configured to determine a power-on duration of the liquid crystal display device at each time after the liquid crystal display device is powered on, search for an optimal voltage corresponding to the power-on duration by using the first relationship curve, and determine the optimal voltage as a voltage input to the conductive pattern at a certain time.
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