CN107255788B - Power supply on-off impact test method and system and intelligent socket - Google Patents
Power supply on-off impact test method and system and intelligent socket Download PDFInfo
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- CN107255788B CN107255788B CN201710272139.5A CN201710272139A CN107255788B CN 107255788 B CN107255788 B CN 107255788B CN 201710272139 A CN201710272139 A CN 201710272139A CN 107255788 B CN107255788 B CN 107255788B
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- 238000009863 impact test Methods 0.000 title claims description 7
- 238000012360 testing method Methods 0.000 claims abstract description 262
- 238000000034 method Methods 0.000 claims abstract description 33
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- 238000005520 cutting process Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 238000004891 communication Methods 0.000 description 6
- 230000008569 process Effects 0.000 description 6
- 230000008901 benefit Effects 0.000 description 2
- 238000004422 calculation algorithm Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/40—Testing power supplies
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/66—Structural association with built-in electrical component
- H01R13/665—Structural association with built-in electrical component with built-in electronic circuit
- H01R13/6691—Structural association with built-in electrical component with built-in electronic circuit with built-in signalling means
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/66—Structural association with built-in electrical component
- H01R13/70—Structural association with built-in electrical component with built-in switch
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Abstract
The invention discloses a method and a system for testing power on-off impact of a power supply and an intelligent socket, wherein the method comprises the following steps: the test control equipment is connected with the intelligent socket and sends a power-on/power-off signal to the intelligent socket according to a preset test program; the intelligent socket supplies power or cuts off the power of the test equipment connected to the intelligent socket according to the power-on and power-off signal; the test equipment runs the fault display script to obtain a test result according to the fault display script; according to the invention, the test control equipment is connected with the intelligent socket, so that the intelligent socket supplies power or cuts off power to the test equipment according to the test program, a tester can conveniently test the test equipment through the test control equipment, namely an office computer, and the tester can obtain the test result according to the fault display script by running the fault display script through the test equipment, so that the test convenience and the test result accuracy are further improved, and the user experience is improved.
Description
Technical Field
The invention relates to the field of reliability testing of electronic products, in particular to a method and a system for testing power-on and power-off impact of a power supply and an intelligent socket.
Background
With the development of modern society science and technology, people have more and more extensive use of electronic products, and the electronic products are powered by a power supply in work, wherein the power supply is a device for supplying power to electronic equipment, also called a power supply, and provides electric energy required by all parts in the electronic products. The power source of the power supply is mainly from commercial power (220V/50HZ, called AC), and the AC is converted into the required voltage value in the electronic product through various conversion circuits. However, during use, the AC power source is frequently powered up and down, i.e., the power source of the electronic device is powered on and off, and the circuit generates more or less too high pulses as shown in fig. 1 at the moment of powering up and down. Such excessive pulses, if not well protected, can cause varying degrees of damage to the electronic product and ultimately result in loss of functionality.
In the prior art, the method for testing the power-on and power-off impact of the power supply only aims at testing whether the main power supply and the power supply of the main chip of the main power supply have over-high pulse of power-on and power-off before the trial production of the PCB, and if so, the part of the over-high pulse is inhibited. However, the power supplies are often compatible with each other in the design of the PCB, and when the individual power supply does not have too high pulses but the overall function is completely realized, the mutual influence among various circuits will have hidden too high pulses, which cannot be detected in the first time, so that a corresponding power supply on/off impact test needs to be performed after the complete machine is completed. Therefore, how to simply and effectively test the power-on and power-off impact after the complete machine of the electronic equipment is completed is a problem which needs to be solved urgently nowadays.
Disclosure of Invention
The invention aims to provide a method and a system for testing power on-off impact of a power supply and an intelligent socket, so as to provide a simple and effective method for testing the power on-off impact of the power supply of electronic equipment and improve the convenience of testing and the accuracy of a test result.
In order to solve the above technical problem, the present invention provides a method for testing power supply switching on and off impact, comprising:
the test control equipment is connected with the intelligent socket, and sends a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times;
the intelligent socket supplies power or cuts off the power of the test equipment connected to the intelligent socket according to the power-on and power-off signal;
the test equipment runs a fault display script to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
Optionally, the connection between the test control device and the smart socket is established, including:
and the test control equipment is wirelessly connected with the intelligent socket.
Optionally, the test control device establishes a wireless connection with the smart socket, including:
and the test control equipment establishes ZigBee connection with the intelligent socket through a USB gateway.
Optionally, the running of the fault display script by the testing device to obtain the testing result according to the fault display script further includes:
and the test equipment sends the test result to the test control equipment.
In addition, the invention also provides a system for testing power supply on-off impact, which comprises:
the test control equipment is used for establishing connection with the intelligent socket and sending a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times;
the intelligent socket is used for supplying power or cutting off power to the test equipment connected to the intelligent socket according to the power-on and power-off signal;
the test equipment is used for operating the fault display script so as to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
Optionally, the test control device includes:
and the wireless connection module is used for establishing wireless connection with the intelligent socket.
Optionally, the wireless connection module includes:
and the ZigBee unit is used for establishing ZigBee connection with the intelligent socket through a USB gateway.
Optionally, the test apparatus includes:
and the sending module is used for sending the test result to the test control equipment.
The present invention also provides an intelligent socket, comprising:
the receiving module is used for establishing connection with the test control equipment and receiving a power-on/power-off signal sent to the intelligent socket by the test control equipment according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times;
the power-on and power-off module is used for supplying power or powering off the test equipment connected to the intelligent socket according to the power-on and power-off signal so as to enable the test equipment to run a fault display script and obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
Optionally, the receiving module includes:
and the ZigBee receiving unit is used for establishing ZigBee connection with the USB gateway of the test control equipment and receiving the power-on/off signal sent by the test control equipment through a ZigBee protocol.
The invention provides a method for testing power on/off impact, which comprises the following steps: the test control equipment is connected with the intelligent socket, and sends a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times; the intelligent socket supplies power or cuts off the power of the test equipment connected to the intelligent socket according to the power-on and power-off signal; the test equipment runs a fault display script to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period;
therefore, the intelligent socket is connected with the intelligent socket through the test control equipment, and the on-off signal is sent to the intelligent socket according to the preset test program, so that the intelligent socket supplies power or cuts off power to the test equipment according to the test program, a tester can conveniently test the test equipment through the test control equipment, namely an office computer, and can obtain a test result according to the running result of the fault display script without manual detection by running the fault display script through the test equipment, thereby further improving the convenience of testing and the accuracy of the test result and improving the user experience. In addition, the invention also provides a system for testing power on-off impact and an intelligent socket, and the system and the intelligent socket also have the beneficial effects.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a diagram showing an over-high pulse in a power-off impact;
FIG. 2 is a flowchart of a method for testing power on/off impact according to an embodiment of the present invention;
FIG. 3 is a flowchart of another method for testing power on/off impact according to an embodiment of the present invention;
FIG. 4 is a schematic flowchart of another method for testing power supply interruption impact according to an embodiment of the present invention;
FIG. 5 is a block diagram of a power on/off impact testing system according to an embodiment of the present invention;
FIG. 6 is a schematic structural diagram of a power supply interruption impact testing system according to an embodiment of the present invention;
fig. 7 is a structural diagram of an intelligent socket according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 2, fig. 2 is a flowchart illustrating a method for testing power supply interruption impact according to an embodiment of the present invention. The method can comprise the following steps:
step 101: the test control equipment is connected with the intelligent socket, and sends a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power off and power supply and the number of power off and power off times.
It can be understood that the test control device may be a computer or a mobile phone used by a tester, that is, a user, and the embodiment is not limited to the selection and the specific structure of the specific device of the test control device, as long as the test control device can run a test program in the device and send a power-on/off signal to the smart socket. The connection between the test control equipment and the intelligent socket can be wired connection, and if the test control equipment is connected with the intelligent socket through a data line, the test control equipment can send a power-on/off signal to the intelligent socket through the data line; the test control device can also be in wireless connection, for example, if the test control device is connected with the intelligent socket in a wireless mode such as WiFi or ZigBee, the test control device can send a power-on/off signal to the intelligent socket in a communication mode such as WiFi or ZigBee. The embodiment also does not limit any specific way for the test control device to establish connection with the smart socket.
It should be noted that the preset test program may be timing switch software which is set by a user or a programmer for controlling the smart socket. For the specific content of the test program, the time interval of the power on and power off of the intelligent socket can be set, namely the power on duration and the power off duration of the intelligent socket on the test equipment, so that the set time can ensure that the functions of the electronic equipment are completely started and the impact of upper and lower electric pulses on a product is maximum, and whether high pulses influencing the running of the equipment exist can be more effectively tested only by holding the time point; the power-on and power-off times of the intelligent socket can be set. The specific content of the test program can be set by the user or the programmer according to the practical scenario and the user requirement, which is not limited in this embodiment. For the specific content of the on-off signal sent by the test control device to the smart socket, that is, the way in which the test control device controls the jacks in the smart socket to supply power or cut off power to the test device, the power supply or cut off power corresponding to the on-off signal can be performed for controlling all the jacks in the smart socket; and the power supply or power cut-off operation corresponding to the power on/off signal can be carried out for controlling the jack corresponding to the power on/off signal in the intelligent socket. As long as the smart socket can be controlled to supply power or cut off power to the test equipment, the specific content of the power-on/off signal is also not limited in any way in this embodiment.
Specifically, the method provided in this embodiment may further include other preparation steps, such as a step of powering on the test control device and the smart socket and a step of inserting the test device into the corresponding jack of the smart socket, which is not limited in this embodiment.
Step 102: and the intelligent socket supplies power or cuts off the power of the test equipment connected to the intelligent socket according to the power-on and power-off signal.
The intelligent socket can be a socket which can supply power or cut off power to the test equipment connected in the jacks according to the received power-on and power-off signals.
It can be understood that, for the way that the smart socket supplies or cuts off power to the test equipment connected to the smart socket according to the power-on/off signal, the way can be that all the equipment connected to the smart socket is correspondingly supplied or cut off power according to the power-on/off signal, if a plurality of test equipment are connected to the smart socket, all the test equipment can be tested according to one power-on/off signal; the test equipment connected with the intelligent socket can be correspondingly powered on or powered off according to the on-off signals, for example, the test equipment connected with the jacks corresponding to the on-off signals can be tested according to one on-off signal, and the test equipment connected with one or more jacks corresponding to each on-off signal can be tested according to various on-off signals. The present embodiment is not limited to this.
It should be noted that, as long as the smart jack can achieve the purpose of supplying power or cutting off power to the test equipment connected to the jack according to the received power-on/off signal, the specific structure and composition of the smart jack are not limited in this embodiment.
Step 103: the test equipment runs a fault display script to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
It will be appreciated that the fault display script may be a script run by the test equipment during the test run for recording the operational status of the test equipment during each power down cycle. The specific content of the test display script can be set by the user or the programmer according to the practical scenario and the user requirement, which is not limited in this embodiment.
It should be noted that the test equipment runs the fault display script to record the working state of the test equipment in each power-on and power-off period, so as to avoid the inconvenience of manual detection through an oscilloscope in the prior art and improve the accuracy of the test result. The purpose of this embodiment can also be achieved by a manual detection mode without injecting a fault display script in the test equipment, which is not limited in this embodiment.
Preferably, the test equipment and the test control equipment can be connected, so that the test equipment sends the running result of the fault display script, namely the test result, to the test control equipment, the process that a user automatically derives the running result of the fault display script, namely the test log is saved, and further, the user experience is improved.
Specifically, for the step of obtaining the test result according to the fault display script, a test log can be manually exported for a user, and the test log is analyzed to obtain the test result; or sending the test log to the test control equipment for the test equipment, and analyzing the test log by a user to obtain a test result; and sending the test log to the test control equipment for the test equipment, and analyzing by the test control equipment according to the test log to obtain a test result. The present embodiment does not set any limit to this.
In the embodiment of the invention, the test control equipment is connected with the intelligent socket, and the on-off signal is sent to the intelligent socket according to the preset test program, so that the intelligent socket supplies power or cuts off power to the test equipment according to the test program, a tester can conveniently test the test equipment through the test control equipment, namely an office computer, and the test equipment runs the fault display script, so that the tester can obtain a test result according to the running result of the fault display script without manual detection, the test convenience and the test result accuracy are further improved, and the user experience is improved.
Referring to fig. 3 and 4, fig. 3 is a flowchart illustrating another method for testing power supply interruption impact according to an embodiment of the present invention; fig. 4 is a schematic flowchart of another method for testing power supply interruption impact according to an embodiment of the present invention. The method can comprise the following steps:
step 201: the test control equipment establishes ZigBee connection with the intelligent socket through the USB gateway, and sends a power-on/off signal to the intelligent socket through a ZigBee protocol according to a preset test program.
The USB gateway can be a gateway connected to a USB port of the test control equipment, the test control equipment can establish ZigBee connection with a ZigBee module of the intelligent socket through the ZigBee module in the USB gateway, and the intelligent socket is remotely controlled by the gateway through mutual communication of ZigBee protocols. The ZigBee is also a communication mode for transmitting data by wireless, similar to WiFi, and the protocol has the greatest advantage of short time delay, namely, a receiving end can execute a command of a control signal immediately after the control signal is sent out. The present embodiment does not set any limitation to the specific structure of the USB gateway.
It can be understood that, with respect to the method provided in this embodiment, the method may further include the steps of plugging the USB gateway into a computer required for testing, that is, powering on the USB port of the test control device, powering on the smart socket, and the like, which is not limited in this embodiment.
Specifically, a user binds a USB gateway and an intelligent socket in a ZigBee network through timing switch software, namely a test program, and sets power-on and power-off duration time according to own requirements after successful binding, wherein the set time can ensure that the functions of electronic equipment are completely started and the product impact of upper and lower electric pulses is maximum; meanwhile, the number of times of switching on and off the power supply can be set according to the specification requirement of the product, and the number of times of switching on and off the power supply can be determined by the maximum passing current of the product, for example, the number of times of switching on and off the power supply below 10A is more than or equal to 500 times, and the number of times of switching on and off the power supply above 10A is more than or equal to 500 times more than or. The present embodiment does not set any limit to the specific setting content of the time switch software, that is, the test program.
Step 202: the intelligent socket supplies power or cuts off the power to the test equipment connected to the intelligent socket according to the power-on and power-off signal.
Step 202 is similar to step 102, and is not described herein again.
Step 203: and running the fault display script by the test equipment to obtain a test result according to the fault display script and sending the test result to the test control equipment.
It can be understood that, in the step, the process of sending the test result to the test control device by the test device may be a process of sending the test result to the test control device by the test device in a wireless or wired communication manner established with the test control device, so that the process of the user self-exporting the test result is avoided. The specific way of sending the test result to the test control device by the test device may be set by the user or the designer according to the practical scenario or the user requirement, which is not limited in this embodiment.
It should be noted that the test device may send the test result to the test control device in a wireless or wired communication manner, or may send the test result to other devices, which is not limited in this embodiment.
Specifically, as shown in fig. 4, the test control device, that is, the PC end may establish a ZigBee protocol with the smart socket by means of the gateway, and send the power-off signal to the smart socket through the ZigBee protocol according to the timing software, so as to control the smart socket to supply power or cut off power to the test device.
In the embodiment, the test control equipment establishes ZigBee connection with the intelligent socket through the USB gateway, and the intelligent socket is controlled to be powered on or powered off in a ZigBee wireless communication mode, so that a user can more flexibly move an office computer in the test process without influencing other work except the test; the test result is sent to the test control equipment through the test equipment, so that the test result can be automatically output by the script after the test is finished, the process of manually exporting the test result is avoided, and the user experience is further improved.
Referring to fig. 5 and fig. 6, fig. 5 is a structural diagram of a power supply on/off impact testing system according to an embodiment of the present invention; fig. 6 is a schematic structural diagram of a test system for power on/off impact according to an embodiment of the present invention. The system may include:
the test control device 100 is configured to establish a connection with the smart jack 200 and send a power-on/power-off signal to the smart jack 200 according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times;
the smart socket 200 is configured to supply power or cut off power to the test equipment 300 connected to the smart socket 200 according to the power-off signal;
the test equipment 300 is configured to run a fault display script to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
Optionally, the test control apparatus 100 may include:
and the wireless connection module is used for establishing wireless connection with the intelligent socket.
Optionally, the wireless connection module may include:
and the ZigBee unit is used for establishing ZigBee connection with the intelligent socket through a USB gateway.
Optionally, the test apparatus 300 may include:
and the sending module is used for sending the test result to the test control equipment.
Specifically, as shown in fig. 6, the test control device 100, that is, the laptop in the figure, may establish a ZigBee protocol with the smart socket by means of the USB gateway, and send a power-on/off signal to the smart socket 200 through the ZigBee protocol according to a test program (timing software), so as to achieve the purpose of controlling the smart socket 200 to supply power or power off to the test device 300. The test equipment 300 may rely on a fault display script (built-in function detection script) to record the operational status of the test equipment during each power-off cycle.
In this embodiment, the test control device 100 is connected to the smart socket 200, and the power-off signal is sent to the smart socket 200 according to the preset test program, so that the smart socket 200 supplies power to or powers off the test device 300 according to the test program, and a tester can conveniently test the test device 300 through the test control device 100, that is, an office computer, and run the fault display script through the test device 300, so that the tester can obtain a test result according to a running result of the fault display script without manual detection, thereby further improving the convenience of testing and the accuracy of the test result, and improving user experience.
Referring to fig. 7, fig. 7 is a structural diagram of an intelligent socket according to an embodiment of the present invention. The smart socket may include:
the test system comprises a receiving module 10, a test control device and a control module, wherein the receiving module is used for establishing connection with the test control device and receiving a power-on/power-off signal sent by the test control device to an intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times;
the power-on and power-off module 20 is used for supplying power or powering off the test equipment connected to the intelligent socket according to the power-on and power-off signal so as to enable the test equipment to run a fault display script and obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
Optionally, the receiving module 10 may include:
and the ZigBee receiving unit is used for establishing ZigBee connection with the USB gateway of the test control equipment and receiving the power-on/off signal sent by the test control equipment through a ZigBee protocol.
In this embodiment, the receiving module 10 is connected to the test control device, and receives the power-off signal sent by the test control device to the smart socket according to the preset test program, so that the smart socket supplies or cuts off power to the test device according to the test program, and the tester can conveniently test the test device through the test control device, that is, the office computer, and the power-off module 20 supplies or cuts off power to the test device connected to the smart socket according to the power-off signal, so that the test device runs the fault display script, and obtains the test result according to the fault display script, so that the tester can obtain the test result according to the running result of the fault display script without manual detection, thereby further improving the convenience of testing and the accuracy of the test result, the user experience is improved.
The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The steps of a method or algorithm described in connection with the embodiments disclosed herein may be embodied directly in hardware, in a software module executed by a processor, or in a combination of the two. A software module may reside in Random Access Memory (RAM), memory, Read Only Memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, a removable disk, a CD-ROM, or any other form of storage medium known in the art.
The method, the system and the intelligent socket for testing the power on/off impact provided by the invention are described in detail above. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present invention.
Claims (5)
1. A method for testing power supply on-off impact is characterized by comprising the following steps:
the test control equipment is connected with the intelligent socket, and sends a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times; the duration is the time for ensuring that the functions of the electronic equipment are completely started and ensuring that the upper electric pulse and the lower electric pulse impact the test equipment to the maximum; the test control equipment establishes ZigBee connection with the intelligent socket through a USB gateway;
the intelligent socket supplies power or cuts off the power of the test equipment connected to the intelligent socket according to the power-on and power-off signal;
the test equipment runs a fault display script to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period.
2. The method for testing power on/off impact according to claim 1, wherein after the test equipment runs a fault display script to obtain a test result according to the fault display script, the method further comprises:
and the test equipment sends the test result to the test control equipment.
3. A system for testing power-on and power-off impact, comprising:
the test control equipment is used for establishing connection with the intelligent socket and sending a power-on/power-off signal to the intelligent socket according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times; the duration is the time for ensuring that the functions of the electronic equipment are completely started and ensuring that the upper electric pulse and the lower electric pulse impact the test equipment to the maximum;
the intelligent socket is used for supplying or cutting off power to the test equipment connected to the intelligent socket according to the power-on/off signal;
the test equipment is used for operating the fault display script so as to obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period;
the test control apparatus includes:
the wireless connection module is used for establishing wireless connection with the intelligent socket;
the wireless connection module comprises:
and the ZigBee unit is used for establishing ZigBee connection with the intelligent socket through a USB gateway.
4. A power on-off impact test system as claimed in claim 3, wherein the test device comprises:
and the sending module is used for sending the test result to the test control equipment.
5. A smart jack, comprising:
the receiving module is used for establishing connection with the test control equipment and receiving a power-on/power-off signal sent to the intelligent socket by the test control equipment according to a preset test program; wherein the test program comprises the duration of power failure and power supply and the power failure times; the duration is the time for ensuring that the functions of the electronic equipment are completely started and ensuring that the upper electric pulse and the lower electric pulse impact the test equipment to the maximum;
the power-on and power-off module is used for supplying power or powering off the test equipment connected to the intelligent socket according to the power-on and power-off signal so as to enable the test equipment to run a fault display script and obtain a test result according to the fault display script; the fault display script is used for recording the working state of the test equipment in each power-on and power-off period;
the receiving module comprises:
and the ZigBee receiving unit is used for establishing ZigBee connection with the USB gateway of the test control equipment and receiving the power-on/off signal sent by the test control equipment through a ZigBee protocol.
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| CN201710272139.5A CN107255788B (en) | 2017-04-18 | 2017-04-18 | Power supply on-off impact test method and system and intelligent socket |
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| CN111447111B (en) * | 2020-03-24 | 2023-08-15 | 上海闻泰信息技术有限公司 | Method and system for testing instantaneous power failure of intelligent equipment |
| CN111966543B (en) * | 2020-07-10 | 2023-01-10 | 苏州浪潮智能科技有限公司 | System and method for testing stability of storage OSES system |
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