CN104122421A - Single chip microcomputer based voltage impact test simulator - Google Patents
Single chip microcomputer based voltage impact test simulator Download PDFInfo
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- CN104122421A CN104122421A CN201410155485.1A CN201410155485A CN104122421A CN 104122421 A CN104122421 A CN 104122421A CN 201410155485 A CN201410155485 A CN 201410155485A CN 104122421 A CN104122421 A CN 104122421A
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Abstract
The invention discloses a single chip microcomputer based voltage impact test simulator which can be applied to electronic products to perform simulation tests of GIB181/GJB181A surge voltage impact tests. The simulator is based on a single chip microcomputer, controls on and off of a peripheral MOS (Metal Oxide Semiconductor) pipe through a time program and accordingly controls application and removal of additional simulation peak voltage to simulate a voltage impact test state. The single chip microcomputer based voltage impact test simulator has the advantages of enabling the electronic products to perform simulation tests of GIB181/GJB181A surge voltage impact tests and being served as a baseline test device for electronic product test conformity.
Description
Technical field
The invention discloses a kind of SCM Based voltge surge test simulator, can be used for electronic product and carry out the simulation test of GJB181/GJB181A surge voltage impulse test.
Background technology
At present, domestic common aircraft electrical supply parameters parameter test board, require to design according to GJB181-86, GJB181A-2003, formed by Peak Voltage Signal Generator and surge voltage signal generator two parts, though have that robotization control is high, self calibration, stable testing, voltage waveform checking show, the feature such as easy to use, meet the resistance to power supply characteristic test of airborne equipment and ground handling equipment, but instrument cost is higher, operation is comparatively complicated.
For making various electronic equipment energy reliably workings, national Specification the environmental baselines that should be able to bear of various electronic equipments.Concerning the most basic power supply, in national military standard (GJB181-86), require air environment can bear certain peak voltage and surge voltage.For peak voltage, though because peak voltage value is high, the time is short, and energy is little, can absorb with inductance filtering or by transient voltage suppressor diode, voltage dependent resistor (VDR).For low pressure surge, can take storing energy, or master control system power supply uprises and pressed the supplementary method of supplying power to of DC-DC by low pressure, electronic device works is paid no attention to disconnected, just can head it off.But for overvoltage surge, require the electronic equipment of use+28V power supply can bear the overvoltage surge of 80V, 50ms in GJB181-86, its voltage is high, and the time is long, therefore realizes difficulty.By theoretical analysis and experiment, propose to adopt the methods such as voltage clamping and switch-type stabilized circuit to solve the thinking of this problem herein.
The present invention mainly for national standard be:
GJB181-86 aircraft electrical supply parameters and the requirement to consumer
GJB181A-2003 aircraft electrical supply parameters.
Summary of the invention
The SCM Based voltge surge test simulator of one that the present invention designs in order to solve the problems of the technologies described above just, can be used for electronic product and carries out the simulation test of GJB181/GJB181A surge voltage impulse test.This simulator, taking single-chip microcomputer as basis, by the break-make of the peripheral metal-oxide-semiconductor of time-program(me) control, is controlled the break-make of peak voltage, analog voltage impulse test state device indirectly.
A kind of SCM Based voltge surge test simulator, described simulator comprises single chip machine controlling circuit, metal-oxide-semiconductor device and auxiliary power supply the electric circuit constitute, wherein U1 is singlechip controller; X1 is quartz crystal oscillator, as system clock reference, V1-V3 diode is output isolation, Q1, Q2 and metal-oxide-semiconductor are as switching tube, wherein single-chip microcomputer is master control core devices, by control module, peripheral components is controlled, single-chip system clock arranges by quartz crystal oscillator, after device power-up, connect as late-class circuit provides power supply by Single-chip Controlling Q1, in the time that test is chosen as direct impulse, single-chip microcomputer is opened Q2 or turn-off by sequential control, make corresponding direct impulse be added in output terminal, complete forward impact voltage test; In the time that test is chosen as negative-going pulse, single-chip microcomputer is opened Q1 or turn-off by sequential control, makes output terminal export corresponding negative-going pulse, completes negative impact voltage test.
A SCM Based voltge surge test simulator as shown in Figure 2, each several part components and parts composition and function are as follows:
U1: singlechip chip, connect computer by programmable device source program is cured to chip internal, when after single-chip microcomputer energising operation, can carry out corresponding control to peripheral circuit;
S1, C3, R1: system reset circuit, single-chip microcomputer has adopted electrification reset mode, when after simulation system switch S 1 closure, then by C3, R1, Single Chip Microcomputer (SCM) system is resetted when powering for single-chip microcomputer.
X1, C1, C2: clock control circuit, by quartz oscillator X1, is clock compensation components and parts for single-chip microcomputer operation provides system clock, C1, C2, can compensate and correct system clock reference, thereby guarantee the accurate of time;
S2: state selecting switch, after system starts, pin that S2 takes over is defaulted as high level, and system program enters direct impulse control program; If S2 closure, takes over pin ground connection by S2 and set to 0, system program enters negative-going pulse control program.
Q1, Q2:MOS pipe circuit, single chip circuit is simulated corresponding trystate by the conducting of programmed control Q1, Q2 with shutoff, after device power-up, connect and provide power supply for late-class circuit by Single-chip Controlling Q1, in the time that test is chosen as direct impulse, single-chip microcomputer is opened Q2 or turn-off by sequential control, makes corresponding direct impulse be added in output terminal, completes forward impact voltage test; In the time that test is chosen as negative-going pulse, single-chip microcomputer is opened Q1 or turn-off by sequential control, makes output terminal export corresponding negative-going pulse, completes negative impact voltage test.
V1, V2, V3: voltage isolation circuit, while work due to simulator as shown in the figure, V1, V2, V3 place circuit voltage difference, need carry out voltage isolation by diode, guarantees the normal operation of whole circuit output end.
Described simulator carries out the simulation test of GJB181/GJB181A surge voltage impulse test for electronic product, this simulator is by the break-make of the peripheral metal-oxide-semiconductor of control module control, the applying and removing of control simulation peak voltage, analog voltage impulse test state, described simulator adopts single-chip microcomputer to carry out programmed control.
By the break-make of the peripheral metal-oxide-semiconductor of control module control, the applying and removing of control simulation peak voltage.
By the amendment of source program was adjusted the test pulse time.
Components and parts optimal parameter is, U1 single-chip microcomputer type selecting is, AT89C2051; X1 crystal oscillator type selecting is, 12M; C1, C2 electric capacity type selecting be, 50V20pF; C3 electric capacity type selecting is, 50V10uF; V1-V3 diode type selecting is, MUR3020; Q1, Q2 and metal-oxide-semiconductor type selecting are IRFPG50.
Beneficial effect
The invention has the beneficial effects as follows a kind of SCM Based voltge surge test simulator, can be used for electronic product and carry out the simulation test of GJB181/GJB181A surge voltage impulse test.This simulator, taking single-chip microcomputer as basis, by the break-make of the peripheral metal-oxide-semiconductor of time-program(me) control, is controlled applying and removing, analog voltage impulse test state of peak voltage.Solve special generator high cost shortcoming.
1. function admirable, with low cost.
Control performance of the present invention is good, and integrated circuit cost is lower.
2. simple circuit, working stability.
It is core devices that the present invention adopts single-chip microcomputer, can make accurate control to peak hour, can meet the requirement of technical indicator.This circuit has higher Ability of Resisting Disturbance simultaneously, work that still can be stable.
3. applied widely
The present invention, has time control circuit, also has independently accessory power supply simultaneously, and groundwork state is not subject to the impact of rear class equipment.This has just widened the occasion of its application greatly.
Brief description of the drawings
The SCM Based voltge surge test simulator of Fig. 1 outside drawing;
The SCM Based voltge surge test simulator of Fig. 2 schematic diagram.
Embodiment
Below in conjunction with drawings and Examples, the present invention is further described.
As shown in Figure 2, a kind of SCM Based voltge surge test simulator, comprises single chip machine controlling circuit, metal-oxide-semiconductor device and auxiliary power supply the electric circuit constitute.Wherein U1 is singlechip controller; X1 is quartz crystal oscillator, and as system clock reference, V1-V3 diode is output isolation, and Q1, Q2MOS pipe are as switching tube.
The present invention's process test of many times and application obtain components and parts optimal parameter and are:
U1 single-chip microcomputer type selecting is: AT89C2051
X1 crystal oscillator type selecting is: 12M
C1, C2 electric capacity type selecting are: 50V20pF
C3 electric capacity type selecting is: 50V10uF
V1-V3 diode type selecting is: MUR3020
Q1, Q2MOS pipe type selecting are: IRFPG50
Be below GJB181/GJB181A test simulator source program:
Patent of the present invention is not limited to above-mentioned preferred forms, and other any or akin products identical with the present invention that anyone draws under enlightenment of the present invention, within all dropping on protection scope of the present invention.
Claims (5)
1. a SCM Based voltge surge test simulator, is characterized in that: described simulator mainly comprises single chip machine controlling circuit, metal-oxide-semiconductor device and auxiliary power supply the electric circuit constitute, and wherein U1 is singlechip controller; X1 is quartz crystal oscillator, as system clock reference, V1, V2 and V3 diode are output isolation, Q1, Q2 and metal-oxide-semiconductor are as switching tube, wherein single-chip microcomputer is master control core devices, by control module, peripheral components is controlled, single-chip system clock arranges by quartz crystal oscillator, after device power-up, connect as late-class circuit provides power supply by Single-chip Controlling Q1, in the time that test is chosen as direct impulse, single-chip microcomputer is opened Q2 or turn-off by sequential control, make corresponding direct impulse be added in output terminal, complete forward impact voltage test; In the time that test is chosen as negative-going pulse, single-chip microcomputer is opened Q1 or turn-off by sequential control, make output terminal export corresponding negative-going pulse, complete negative impact voltage test, wherein, described U1 is singlechip chip, connects computer source program is cured to chip internal by programmable device, when after single-chip microcomputer energising operation, can carry out corresponding control to peripheral circuit; S1, C3 and R1 are system reset circuit, single-chip microcomputer has adopted electrification reset mode, when after simulation system switch S 1 closure, when power supply for single-chip microcomputer again, by C3, R1, Single Chip Microcomputer (SCM) system is resetted, X1, C1 and C2: clock control circuit, by quartz oscillator X1, for single-chip microcomputer operation provides system clock, C1, C2 are clock compensation components and parts, system clock reference is compensated and corrected, thereby guarantee the accurate of time; S2: state selecting switch, after system starts, pin that S2 takes over is defaulted as high level, and system program enters direct impulse control program; If S2 closure, takes over pin ground connection by S2 and set to 0, system program enters negative-going pulse control program; Q1, Q2 and metal-oxide-semiconductor circuit, single chip circuit is simulated corresponding trystate by the conducting of programmed control Q1, Q2 with shutoff, after device power-up, connect and provide power supply for late-class circuit by Single-chip Controlling Q1, in the time that test is chosen as direct impulse, single-chip microcomputer is opened Q2 or turn-off by sequential control, makes corresponding direct impulse be added in output terminal, completes forward impact voltage test; In the time that test is chosen as negative-going pulse, single-chip microcomputer is opened Q1 or turn-off by sequential control, makes output terminal export corresponding negative-going pulse, completes negative impact voltage test; V1, V2 and V3: voltage isolation circuit, while work due to simulator, V1, V2 are different with V3 place circuit voltage, need carry out voltage isolation by diode, guarantee the normal operation of whole circuit output end.
2. simulator according to claim 1, it is characterized in that: described simulator carries out the simulation test of GJB181/GJB181A surge voltage impulse test for electronic product, this simulator is by the break-make of the peripheral metal-oxide-semiconductor of control module control, the applying and removing of control simulation peak voltage, analog voltage impulse test state, described simulator adopts single-chip microcomputer to carry out programmed control.
3. simulator according to claim 1, is characterized in that: by the break-make of the peripheral metal-oxide-semiconductor of control module control, and the applying and removing of control simulation peak voltage.
4. simulator according to claim 1, is characterized in that: by the amendment of source program was adjusted the test pulse time.
5. simulator according to claim 1, is characterized in that: components and parts optimal parameter is:
U1 single-chip microcomputer type selecting is, AT89C2051; X1 crystal oscillator type selecting is, 12M; C1, C2 electric capacity type selecting be, 50V 20pF; C3 electric capacity type selecting is, 50V 10uF; V1-V3 diode type selecting is, MUR3020; Q1, Q2 and metal-oxide-semiconductor type selecting are IRFPG50.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201410155485.1A CN104122421A (en) | 2014-04-17 | 2014-04-17 | Single chip microcomputer based voltage impact test simulator |
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| CN201410155485.1A CN104122421A (en) | 2014-04-17 | 2014-04-17 | Single chip microcomputer based voltage impact test simulator |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106646041A (en) * | 2016-12-08 | 2017-05-10 | 中国北方发动机研究所(天津) | Engine start initial engaging surge voltage simulation method |
| CN106771904A (en) * | 2016-11-30 | 2017-05-31 | 中国电力科学研究院 | A kind of system and method for carrying out impact test to controllable arrester in extra-high voltage environment based on sequential |
| CN107255788A (en) * | 2017-04-18 | 2017-10-17 | 广东浪潮大数据研究有限公司 | A kind of power supply cut-offs the method for testing, system and smart jack of surge |
| CN113253088A (en) * | 2021-06-25 | 2021-08-13 | 上海瞻芯电子科技有限公司 | Transistor gate oxide testing device and system |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030020418A1 (en) * | 2001-07-24 | 2003-01-30 | Chao-Cheng Lu | Ultra-high voltage impulse generator |
| CN102062833A (en) * | 2010-12-03 | 2011-05-18 | 北京统合万方科技有限公司 | Programmable airplane power supply characteristic comprehensive test apparatus |
| CN102707121A (en) * | 2012-06-14 | 2012-10-03 | 美的集团有限公司 | Voltage surge detection circuit |
| CN103033725A (en) * | 2012-12-04 | 2013-04-10 | 国网智能电网研究院 | Impact voltage applying time control system and method thereof |
| CN103248339A (en) * | 2013-04-24 | 2013-08-14 | 深圳市中电华星电子技术有限公司 | High energy surge rectangular-wave signal generation circuit |
-
2014
- 2014-04-17 CN CN201410155485.1A patent/CN104122421A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20030020418A1 (en) * | 2001-07-24 | 2003-01-30 | Chao-Cheng Lu | Ultra-high voltage impulse generator |
| CN102062833A (en) * | 2010-12-03 | 2011-05-18 | 北京统合万方科技有限公司 | Programmable airplane power supply characteristic comprehensive test apparatus |
| CN102707121A (en) * | 2012-06-14 | 2012-10-03 | 美的集团有限公司 | Voltage surge detection circuit |
| CN103033725A (en) * | 2012-12-04 | 2013-04-10 | 国网智能电网研究院 | Impact voltage applying time control system and method thereof |
| CN103248339A (en) * | 2013-04-24 | 2013-08-14 | 深圳市中电华星电子技术有限公司 | High energy surge rectangular-wave signal generation circuit |
Non-Patent Citations (1)
| Title |
|---|
| 王林、郭玉琦、史延东: "飞机供电参数测试系统设计", 《测控技术》 * |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771904A (en) * | 2016-11-30 | 2017-05-31 | 中国电力科学研究院 | A kind of system and method for carrying out impact test to controllable arrester in extra-high voltage environment based on sequential |
| CN106646041A (en) * | 2016-12-08 | 2017-05-10 | 中国北方发动机研究所(天津) | Engine start initial engaging surge voltage simulation method |
| CN107255788A (en) * | 2017-04-18 | 2017-10-17 | 广东浪潮大数据研究有限公司 | A kind of power supply cut-offs the method for testing, system and smart jack of surge |
| CN113253088A (en) * | 2021-06-25 | 2021-08-13 | 上海瞻芯电子科技有限公司 | Transistor gate oxide testing device and system |
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Application publication date: 20141029 |